In this chapter, you will learn about: carrier transport in semiconductors, diffusion of carriers, diffusion processes, diffusion and recombination, continuity equations, einstein relation.
Trang 1Dr. Nasim Zafar Electronics 1 EEE 231 – BS Electrical Engineering
Fall Semester – 2012
COMSATS Institute of Information Technology
Virtual campus Islamabad
Trang 2Kwangwoon
University Semiconductor Devices.
Carrier Transport in Semiconductors
Lecture No: 5
v Diffusion of Carriers
v Diffusion Processes
v Diffusion and Recombination
v Continuity Equations
v Einstein Relation
Nasim Zafar
Trang 3
Introduction:
Ø When excess carriers are created nonuniformly in a semiconductor,
a “concentration gradient” results due to this nonuniformity of the carrier
densities in the sample. This concentration gradient, for electrons and holes, will cause a net motion of the charge carriers from the regions of high density to the regions of low carrier density. This type of carrier motion is called Diffusion and represents an important charge transport process in semiconductors.
Ø Thus, the charge carriers in a semiconductor diffuse, due to the concentration gradient by random thermal motion and under going scattering from:
Ø The lattice vibrations and
Ø Ionized Impurity atoms.
Trang 4Introduction:
carriers are
created non
uniformly in a
semiconductor,
due to this non
uniformity of the
carrier densities in
the sample. This
concentration
gradient, for
electrons and holes, will cause a net
motion of the
charge carriers
from the regions of high density to the
regions of low
carrier density.
carrier motion is
and represents an
important charge
transport process in semiconductors.
Trang 5Introduction:
v Thus, the charge carriers in a semiconductor diffuse, due to
the concentration gradient by random thermal motion and under going scattering from:
v The lattice vibrations and
Trang 6How can we produce a concentration gradient in a semiconductor?
Ø By making a semiconductor or metal contact.
Ø. By illuminating a portion of the semiconductor with light, (next slide).
Ø. As the carriers diffuse, a diffusion current flows. The force behind the diffusion current is due to the dn random thermal motion of the carriers.1 dP
Trang 7Current mechanisms
Drift Current Diffusion Current
1
P nkT
kT
dx kT dx
=
=
=
photons
Contact with a metal
Trang 8Ø By shining light, electronhole pairs can be produced when the photon energy>Eg.
Ø The increased number of electronhole pairs will move toward the lower concentration region, until they reach their equilibrium values.
Ø So there is a net number of the charge carriers crossing per unit area per unit time, which is called flux.
Ø Units: [Flux] = m2 – S1
Trang 9
Diffusion Flux : Fick’s first law
Diffusion Flux ∞ Concentration Gradient dn/dx
n
dn Flux D
dx
= −
[Flux] = m2 – S1 D = vth l , [ D] = m2/S
v D measures the ease of carrier diffusion in response to a concentration gradient
v D limited by vibrations of lattice atoms and ionized dopant impurities
Trang 10v For Electrons:
Fn = Dn dn/dx
v For Holes:
Fp = Dp dp/dx
Dn = electron diffusion coefficient
Dp = hole diffusion coefficient
Trang 11Ø Einstein relation relates the two independent current mechanicms of
mobility µ with diffusion D.
µ n = q τ n/mn*
Dn = kT τ n/mn*
½ m*v2 = ½ kT
Dn = v2 τ n = l2/ τ n
Trang 12p n
D
Constant value at a fixed temperature
2 2
/
sec sec
J K K
−
25
kT
mV at room temperature
Trang 13Diffusion current density = charge x carrier flux
Trang 14Ø Diffusion Current within a semiconductor consists of:
i. hole component and
ii. electron component
Ø Total Current flowing in a semiconductor is the sum of:
i. drift current and
ii. diffusion current:
Trang 15[ ]
[ ]
2 1
2
2 ,
,
th
n p
The current densities for electrons and holes
ν
− −
= −
= − − � � =
= + − � � = −
Trang 16When both electric field and the concentration gradient are present, the total current density, for the electron, is given as:
total n p
dn
dx
dp
dx
µ µ
= +
Trang 18Ø Current flowing in a semiconductor consists of drift and
diffusion components:
Ø Mobility and Conductivity are highly temperature dependent.
Ø Generation and Recombination processes were discussed.
dx
dp qD
dx
dn qD
E qn
E qp
Jtot p n n p
Trang 19Resistivity formula
x
n qD
qn J
J
J
x
p qD
qp J
J
J
d d
d
d )
(
n diff
| n drift
| n n
p diff
| p drift
| p p
E E
J = Jn + Jp
n p
1
qn qp
E p n
q J
J
x
p qD
J x
n qD
J
d
d and
d
d
p diff
| p n
diff
|
n
Drift current density
Diffusion current density
Total hole and electron current density
Total current density
Summary