Iec ts 62370 2017

ELECTROACOUSTICS – 1.1 This Tec nical Sp cification sp cifies req irements for in truments that me s re sou d inten ity u in p irs of pres ure sen in micro hones with resp ct to their im

IEC TS 62370

Editio 1.1 2 17-0

Electroacoustics – Instruments for the measurement of sound intensity –

Electromagnetic and electrostatic compatibi ity requirements and test

THIS PUBLICA TION IS COPYRIGHT PROTECTED

Copyright © 2 17 IEC, Ge e a, Switzerla d

Al rig ts re erv d Unle s oth rwis s e ifie , n p rt of this p blc tio ma b re ro u e or uti z d in a y form

or b a y me n , ele tro ic or me h nic l in lu in p oto o yin a d microfim, with ut p rmis io in writin from

eith r IEC or IEC's memb r Natio al Commite in th c u try of th re u ster If y u h v a y q e tio s a o t IEC

c p rig t or h v a e q iry a o t o tainin a ditio al rig ts to this p blc tio , ple s c nta t th a dre s b low or

y ur lo al IEC memb r Natio al Commite for furth r informatio

Th Intern tio al Ele trote h ic l Commis io (IEC) is th le din glo al org niz tio th t pre are a d p bls e

Intern tio al Sta d rd for al ele tric l ele tro ic a d relate te h olo ie

A bo t IE p blc tio s

Th te h ic l c nte t of IEC p blc tio s is k pt u d r c n ta t re iew b th IEC Ple s ma e s re th t y u h v th

late t e itio ,a c rig n a or a ame dme t mig t h v b e p bls e

IE Catalogue - webstore ie c h/ catalogue

Th sta d-alo e a plca tio f or c n ultin th e tir e

biblo r ap ic l informa tio o IEC Inter natio al Sta d r ds,

Te h ic l Sp cifica tio s, Te h ic l Re or ts a d oth r

d c me ts Av aia le for PC, Ma OS, An r oid Ta lets a d

iPa

IE p blc tio s s arch - w w w.ie ch/ se rch u

Th a v an e s ar ch e a le to fin IEC p blc tio s b a

v ar i ty of c te a (r efer en e n mb r , tex t, te h ica l

c mmite ,…) It als giv es infor ma tio o pr oje ts, r epla e

a d with r awn p blc tio s

IE Just Pu lshed - webstore ie ch/ justp blshe d

Sta u to da te o al n w IEC p blc tio s Ju t Pu ls e

d tais al n w p blca tio s r ele s d Av aia le o ln a d

als o c a mo th b emai

Th wo d's le din o ln dictio ar y of ele tr onic a d

ele tr i al terms c ntainin 2 0 0 terms a d d finitio s in

En ls a d Fr en h, with e uiv ale t terms in 16 a ditio al

la g a e Als k nown a th Inter natio al Ele tr ote h ic l

Vo a ular y (IEV) o ln

6 0 0 ele tr ote h ic l termin lo y e tr i s in En ls a d

Fr en h ex tr acte fr om th Terms a d Definitio s cla s of

IEC p blca tio s is u d sin e 2 0 Some e tr i s h v e b e

c le te fr om e r lier p blc tio s of IEC TC 3 , 7 , 8 a d

CIS R

IE Customer Servic Cente - webstore ie ch/ cs

If y u wis to giv e u y our fe d a k o this p blc tio or

n e fur th r a sista c , plea se c nta t th Cu tomer Ser v ic

Ce tr e: c c@ie c

IEC TS 62370

Editio 1.1 2 17-0

Electroacoustics – Instruments for the measurement of sound intensity –

Electromagnetic and electrostatic compatibi ity requirements and test

procedures

INT ERNAT IONAL

ELECT ROT ECHNICAL

IEC TS 62370

Editio 1.1 2 17-0

Electroacoustics – Instruments for the measurement of sound intensity –

Electromagnetic and electrostatic compatibi ity requirements and test

CONTENTS

FOREWORD 3

1 Sco e 5

2 Normative referen es 5

3 Terms an definition 6

4 Electromag etic an electrostatic comp tibi ty req irements 6

4.1 General 6

4 2 Emis ion l mits

7 4.3 Electrostatic dis harges 7

4.4 Immu ity to p wer- an radio- req en y field an con u ted disturb n es 7

5 Test proced res 9

5.1 General

9 5.2 Emis ion me s rements 9

5.3 Tests for electrostatic dis harge 10 5.4 Tests for immu ity to p wer- an radio- req en y field an con u ted disturb n es 10 6 Information to b in lu ed in the in tru tion man al 1

An ex A (informative) Radio- req en y emis ion l mits 12

Bibl ogra h 13

Ta le A.1 – Limits for radiated disturb n e of Clas B information tec nolog

eq ipment (ITE) at a me s rin distan e of 10 m 12

Ta le A.2 – Limits for con u ted disturb n e at the main p rts of Clas B ITE 12

INTERNATIONAL ELECTROTECHNICAL COMMISSION

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio f or sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (P S) a d Guid s (h re f ter ref ere to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n n

-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio f or Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th f ormal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio f rom al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th f orm of re omme d tio s for intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eforts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible f or th wa in whic th y are u e or f or a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtif i atio b die pro id c nf ormity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtif i atio b die

6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s f or a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or f or c sts (in lu in le al fe s) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s ble f or th c re t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible f or id ntif yin a y or al s c p te t rig ts

DISCLAIMER

This Con ol d te version is not a off icial IEC Sta dard a d ha be n prepare f or

us r conv nie c Only the c r e t v rsion of the sta dard a d its ame dme t(s)

are to be con idere the of ficial doc me ts

This Consol date v rsion of IEC T 6 3 0 be rs the e ition n mber 1.1 It consists of

the f irst e ition (2 0 -0 ) [doc me ts 2 /5 0/DTS a d 2 /5 4A/RVC] a d its ame dme t

1 (2 17-0 ) [doc me ts 2 /916/DTS a d 2 /9 9/RVDTS] The te hnic l conte t is

ide tic l to the ba e e ition a d its ame dme t

In this Re l ne v rsion, a v rtic l l n in the margin s ows wh re the te h ic l conte t

is modifie by ame dme t 1 Additions are in gre n te t, deletions are in strik through

re te t A s parate Final version with al c a ge a c pte is a ai able in this

The main tas of IEC tec nical commite s is to pre are International Stan ard In

ex e tional circ mstan es, a tec nical commit e may pro ose the publ cation of a tec nical

sp cification when

• the req ired s p ort can ot b o tained for the publ cation of an International Stan ard,

despite re e ted eforts, or

• the s bject is sti u der tec nical develo ment or where, for an other re son, there is the

future but no immediate p s ibi ty of an agre ment on an International Stan ard

Tec nical sp cification are s bject to review within thre years of publ cation to decide

whether they can b tran formed into International Stan ard

IEC 6 3 0, whic is a tec nical sp cification, has b en pre ared by IEC tec nical

commit e 2 : Electro cou tic

This publcation has b en draf ed in ac ordan e with the ISO/IEC Directives, Part 2

The commite has decided that the contents of the b se publ cation an its amen ment wi

remain u c an ed u ti the sta i ty date in icated on the IEC we site u der

"ht p:/ we store.iec.c " in the data related to the sp cific publ cation At this date, the

ELECTROACOUSTICS –

1.1 This Tec nical Sp cification sp cifies req irements for in truments that me s re sou d

inten ity u in p irs of pres ure sen in micro hones with resp ct to their immu ity to p

wer-an radio- req en y field an to electrostatic dis harge, an the p rmit ed radio- req en y

emis ion , together with test proced res to verify conforman e Sou d inten ity me s rin

in truments are avaia le in man diferent config ration an may b p wered by b teries or

from external p wer s p ly s stems The tec nical req irements in this Tec nical

Sp cification a ply to al config ration of in truments for the me s rement of sou d

inten ity

1.2 The electromag etic an electrostatic comp tibi ty req irements are eq al y a plca le

for sou d inten ity me s rin in truments u ed in residential, commercial an l g t in u trial

en ironments, or in u trial sites The req irements of this Tec nical Sp cification are

ad itional to those contained in IEC 610 3 an do not alter an of the sp cification

contained therein The req irements do not a ply retrosp ctively to sou d inten ity me s rin

in truments complyin with IEC 610 3 prior to the publ cation of this Tec nical Sp cification

NOT 1 Compla c with this Te h ic l Sp cific tio d e n t in ure th t th s u d inte sity me s rin s stem

is immu e tointerfere c from al ele troma n tic s urc s

NOT 2 Th s re uireme ts are th first atempt at d finin ele troma n tic a d ele tro tatic c mp tibi ty

re uireme ts for s u d inte sity me s rin s stems Re uireme ts c n b c a g d later wh n wid r e p rie c

h s b e g in d if fo n n c s ary

The fol owin referen ed doc ments are in isp n a le for the a pl cation of this doc ment

For dated referen es, only the edition cited a pl es For u dated referen es, the latest edition

of the referen ed doc ment (in lu in an amen ments) a pl es

IEC 610 0-4-2, Ele ctromag netc c ompatbi ty (EMC) – Part 4: Te stn and mea ureme nt

te c hnique s – Secto 2: Ele c tro statc discharg e immu niy test

IEC 610 0-4-3:2 0 , Electromag ne tic comp atb il y (EMC) – Part 4-3: Te stn and mea ure

-me t te c hniqu e s – R adiated, radio-fre u ency, ele ctromag netc field immu niy test

Amen ment 1 (2 0 )

mea ure me t te c hniqu es – Emis io n and immuniy te stn in transv rse ele ctro mag etc

IEC 610 0-6-1:19 7, Electromagnetc comp atbil y (EMC) – Part 6: Ge ne ric standards –

Se cto n 1: Immu niy fo r re side tal, c ommercial and lg ht industrial e nviro nme ts

IEC 610 0-6-2:19 9, Ele ctromag netc comp atb il y (EMC) – Part 6-2: Ge ne ric standards –

Immuniy fo r industrial e viro nme nts

CISPR/IEC 610 0-6-3:199 , Ele ctromag etc c omp atbi ty (EMC) – Part 6: G ene ric standards

IEC 610 3, Ele ctroa oustc – Instru me ts for th mea ureme t of so u nd inte siy –

Mea ure me t wih pairs of p re ssure se nsin micro pho nes

CISPR 2 :2 0 , Info rmato n te chn lo gy e qu ipme t – Radio disturb ance characte ristc –

Limis and meth ds ofme asureme t

3 Terms a d definitions

For the purp se of this doc ment, the fol owin definition a ply in ad ition to those sp cified

in IEC 610 0-4-2, IEC 610 0-4-3, IEC 610 0-6-1, IEC 610 0-6-2 an CISPR 610 0-6-3

3.1

refere c orie tation (of a s un inte sity me s ring s stem)

orientation of a sou d inten ity me s rin s stem with resp ct to the prin ip l direction of an

emit er or receiver of radio freq en y field

3.2

group X s u d inte sity me s ring s stem

self contained in trument whic in lu es sou d inten ity me s rin faci ties ac ordin to this

Tec nical Sp cification an whic sp cifies internal b tery p wer for the normal mode of

o eration, req irin no external con ection to other a paratu to o erate the in trument

3.3

group Y s u d inte sity me s ring s stem

self contained in trument whic in lu es sou d inten ity me s rin faci ties ac ordin to this

Tec nical Sp cification an whic sp cifies con ection to a publ c p wer s p ly s stem for

the normal mode of o eration, req irin no external con ection to other a p ratu to o erate

the in trument

3.4

group Z s u d inte sity me s ring s stem

in trument that in lu es sou d inten ity me s rin faci ties ac ordin to this Tec nical

Sp cification req irin two or more items of eq ipment to b con ected together by some

me n for the normal mode of o eration, with o eration either from b teries or from a publc

p wer s p ly

4 Ele tromagnetic and electrostatic compatibi ity re uirements

4.1.1 This clau e sp cifies req irements for sou d inten ity me s rin s stems with resp ct

to their immu ity to p wer- an radio- req en y electromag etic field an to electrostatic

dis harge, an the p rmited radio- req en y emis ion , together with Clau e 5 whic

sp cifies test proced res to demon trate conforman e to the sp cification of this Tec nical

Sp cification Sou d inten ity me s rin s stems are avai a le in man dif erent

config ration an may b p wered by b t eries or from external p wer s p ly s stems

For conforman e with these req irements, a pro e an a proces in s stem s al b tested

together, an the s stem this comprises s al b sp cified with al neces ary ca les an

ac es ories The tec nical req irements in this clau e are for thre sou d inten ity me s rin

s stem config ration : first, Group X, for self contained in truments that are desig ed

primari y for b tery o eration; secon , Group Y, for self contained in truments that

in orp rate sou d inten ity me s rin faci ties ac ordin to this Tec nical Sp cification an

that are o erated from publ c p wer s p ly s stems; third, Group Z, for sou d inten ity

me s rin s stems that are formed by intercon ection of two or more items of eq ipment ( or

4.1.2 The electromag etic an electrostatic comp tibi ty req irements are eq al y

a pl ca le for sou d inten ity me s rin s stems u ed in residential, commercial an l g t

in u trial en ironments, or in u trial sites The req irements of this clau e are ad itional to

those contained in IEC 610 3 an do not alter an of the sp cification for sou d inten ity

me s rin s stems or p rts there f contained therein

4.2 Emis ion l mits

4.2.1 The up er l mits on radio- req en y emis ion from any a p ratu are defined for

comp tibi ty with many dif erent stan ard with the l mits laid down in Ta le 1 of

CISPR 610 0-6-3:19 6, formin the b sic req irements for sou d inten ity me s ring

s stems in groups X, Y or Z These are s mmarized in An ex A

4.2.2 Sou d inten ity me s rin s stems in groups Y or Z p wered from a publ c p wer

s p ly s stem s al also comply with the l mits for disturb n e to the publ c s p ly s stem

sp cified in CISPR 2 for Clas B eq ipment For sou d inten ity me s rin s stems, the

req irements are s mmarized in An ex A

4.2.3 The in tru tion man al s al state the config ration of, the mode of o eration of, an the

con ectin devices (if an ) to, the in trument that prod ce the gre test radio- req en y

emis ion

4.3 Ele trostatic dis harge

4.3.1 Sou d inten ity me s rin s stems in groups X, Y or Z s al with tan electrostatic

dis harges of sp cified mag itu es The req irements are those sp cified in 1.4 of Ta le 1 in

IEC 610 0-6-1:19 7 an are s mmarized as folows:

– contact dis harges up to 4 kV an air dis harges up to 8 kV with b th p sitive an

negative voltages The p larity of the electrostatic voltage is with resp ct to e rth grou d

4.3.2 Clau e 5 of IEC 610 0-6-1 sp cifies p rforman e criterion B d rin an afer

electrostatic dis harge tests, given as fol ows:

"The a p ratu s al contin e to o erate as inten ed af er the test No degradation of

p rforman e or los of fu ction is alowed b low a p rforman e level specified by the

man facturer, when the a p ratu is u ed as inten ed The p rforman e level may b

re laced by a p rmis ible los of p rforman e Durin the test, degradation of p rforman e is

however al owed No c an e of actual o eratin state or stored data is alowed If the

minimum p rforman e level or the p rmis ible p rforman e los is not sp cified by the

man facturer, either of these may b derived from the prod ct des ription an doc mentation

an what the u er may re sona ly exp ct from the a p ratu if u ed as inten ed"

The term “a p ratu ” me n any sou d inten ity me s rin s stem conformin to this

Tec nical Sp cification

NOT An e ample of a p rmis ible lo s of p rforma c c uld b th dis la of th a p ratu b c min

u re d ble d rin th e e utio of dis h rg s, b t returnin to ful o eratio folowin c mpletio of th

dis h rg s

4.3.3 Afer e c an every electrostatic dis harge test is complete, the sou d inten ity

me s rin s stem s al b ful y o erational an in a config ration identical to that esta l s ed

b fore the start of the electrostatic dis harge tests Previou ly stored data (if an ) s al

remain un han ed

4.4 Immu ity to power- a d ra io-fre ue c fields a d c n ucte disturba c s

4.4.1 Sou d inten ity me s rin s stems in groups X, Y an Z s al ex ibit a minimum

degre of immu ity over a ran e of p wer- an radio- freq en ies an field stren th The

in IEC 610 0-6-2:19 9 with minor amen ments These amen ments exten the ran e of

radio- req en y field to cover from 2 MHz to 1 0 0 MHz, an in re se the field stren th for

the p wer freq en y field to 8 A/m The req irements can b s mmarised as fol ows:

– freq en y ran e from 2 MHz to 1 0 0 MHz Ro t me n-s uare electric field stren th up

to an in lu in 10 V/m (u mod lated) with 8 % sin soidal ampl tu e mod lation at

1 kHz,

– u iform ro t me n-s uare alternatin mag etic field of 8 A/m stren th at 5 Hz or 6 Hz

4.4.2 For sou d inten ity me s rin s stems in groups Y or Z that are con ected to a publ c

p wer s p ly, the in truments s al also conform to ad itional req irements These

req irements are given in Ta le 4 of IEC 610 0-6-2:19 9

4.4.3 For sou d inten ity me s rin s stems in group Z, an where an intercon ectin

ca le b twe n an two p rts of the s stem (ex lu in an ca le b twe n the pro e an the

proces or) ex e d 3 m in len th, the in truments s al also conform to the req irements of

Ta le 2 in IEC 610 0-6-2:19 9

4.4.4 For al groups of sou d inten ity me s rin s stems, the immu ity of an in trument to

p wer an radio- req en y field s al b demon trated by placin the pro e in a k own

sou d field whi st maintainin b th the pro e an the proces or in a ne r-u iform p wer or

radio- req en y field The sou d field s al con ist of a pure sin soidal tone of 9 5 Hz

simulatin a sou d field with a sou d inten ity level of 7 dB ± 0,5 dB an a pres ure

inten ity (PI) in icator of 5 dB The PI in icator display the dif eren e b twe n the sou d

inten ity an sou d pres ure levels in an actual sou d field This source may b a pl ed to

the micro hones in any way that do s not alter the s s e tibi ty of the pro e or the source to

p wer an radio- req en y emis ion The sou d inten ity me s rin s stem s al b

p sitioned in the referen e orientation relative to the source of radio- req en y emis ion as

sp cified in the in tru tion man al The pro e s al b p sitioned close to the proces or u it

as defined for the referen e orientation an fit ed with a spacer of not more than 2 mm

len th Ex es ca le s al b folded b c on itself in a fig re of eig t config ration with an

even n mb r of fold of eq al len th, typical y 2 0 mm lon , an al p rts sec red closely

together at e c en of the fold , an in their centre

NOT A n n-c n u tiv sta din wa e tu e ma b a me n of cre tin this field

4.4.5 Durin testin , the sou d inten ity me s rin s stem s al b set for the normal mode

of o eration as des rib d in the in tru tion man al It s al b turned on, p wered by its

prefer ed s p ly, an set to re d sou d pres ure level The level ran e control s al b set (if

a pl ca le) to a ran e where overlo d oc urs b twe n 9 dB an 1 0 dB

4.4.6 When the p wer- req en y or radio- req en y field as sp cified in 4.4.1 is a pl ed, the

in ication of the sou d inten ity me s rin s stem s al not c an e by more than ±1 dB for a

Clas 1 s stem or ±2 dB for a Clas 2 s stem

4.4.7 When testin the ad itional req irements in 4.4.2 an 4.4.3, the s s e tibi ty of the

sou d inten ity me s rin s stem s al not c an e by more than ±1 dB for a Clas 1 s stem

or ±2 dB for a Clas 2 s stem when these tests are a pled No p wer- or radio- requen y

field is a pl ed d rin the testin for conforman e to these ad itional req irements

4.4.8 The in tru tion man al s al state the config ration, the mode of o eration an the

con ectin devices (if an ) that prod ce the minimum immu ity to p wer- an radio- requen y

5 Te t proce ure

5.1.1 The tests des rib d in this s bclau e s al b car ied out u les the p rtic lar

config ration of the sou d inten ity me s rin s stem ren ers them ina pro riate, in whic

case eq ivalent tests s ould b s bstituted if eq ivalen e to these tests can b

demon trated Unles stated otherwise, these tests a ply to sou d inten ity me s rin

s stems in groups X, Y, an Z

5.1.2 Durin testin , the sou d inten ity me s rin s stem u der test s al b set in the

config ration for the normal mode of o eration as des rib d in the in tru tion man al The

in trument s al b turned on, p wered by its prefer ed source of s p ly, an set to re d the

1 kHz octave or third-octave b n

5.1.3 Ful detai s of eq ipment req ired to p rform the tests an the method of exec tin

them are mostly contained in other stan ard with the ad itional req irements for sou d

inten ity me s rin s stems sp cified in this clau e Other stan ard l sted in Clau e 2 s al

b refer ed to for al relevant tests

5.2 Emis ion me s reme ts

5.2.1 The in trument u der test s al b config red an set ac ordin to the sp cification in

the in tru tion man al to prod ce the gre test emis ion in the freq en y ran e b in

in estigated

5.2.2 Me s rements of emis ion s al b p rformed as des rib d in Clau es 6 an 10 of

CISPR 2 :2 0 Al res lts from me s rements of radiated emis ion s al conform to the

req irements for en los re p rts given in 4.2.1

5.2.3 The in trument u der test s al initial y b tested in the referen e orientation with the

pro e ca le ar an ed as in 4.4.4 if a pro riate

5.2.4 Maintainin the config ration of 5.2.3, the in trument u der test s al b tested for

emis ion in at le st one other plane, e c orthogonal to the referen e orientation, within the

l mits of s ita le p sitionin for the me s rin s stem employed

5.2.5 An fixtures an fit in s u ed to maintain the p sition of the in trument u der test

(in lu in the pro e an an ca les if a pro riate) s al b s c as to have no sig ificant

influen e on the me s rement of an emis ion from the in trument

5.2.6 If the in trument u der test is fit ed with a con ection device that al ows interface or

intercon ection ca les to b at ac ed to it, then al tests of emis ion s al b car ied out with

ca les con ected to al avai a le con ection devices Al ca les s al b lef u terminated an

b ar an ed as des rib d in Clau e 8 of CISPR 2 :2 0 , u les the man facturer of the

sou d inten ity me s rin s stem also s p l es the device con ected to the sou d inten ity

me s rin s stem by this ca le, in whic case al items s al b tested together

5.2.7 Where several con ection may b made to the same con ectin device, emis ion

s al b me s red only with the config ration that prod ces the greatest emis ion Other

config ration emitin simi ar or lower levels of emis ion may b in lu ed in the in tru tion

man al in a l st of compl ant config ration without further testin , provided the tested

config ration ful y conforms with the lmits of 4.2

5.2.8 For sou d inten ity me s rin s stems in groups Y an Z con ected to a publ c p wer

s p ly, disturb n es con u ted to the publ c p wer s p ly s al b me s red as des rib d in

CISPR 2 and s al conform to the req irements of Clau e 5 of this Tec nical Sp cification

5.3 Te ts for ele trostatic dis harge

5.3.1 Eq ipment req ired an method of testin are des rib d in IEC 610 0-4-2

5.3.2 If the in trument u der test is fited with con ection devices that are not req ired as

p rt of the config ration for the normal mode of o eration, then no ca les s al b fited

d rin the electrostatic-dis harge test Dis harges s al not b made to pin on con ectors

that are reces ed b hin the s rface of either the con ector or the sou d inten ity me s rin

s stem

5.3.3 An s p orts or other items u ed to maintain the p sition of the in trument u der test

d rin testin s al not o s ure an p rt of sou d inten ity me s rin s stem req ired for

ac es for static dis harge, nor s al they af ect the testin of the sou d inten ity me s rin

s stem

5.3.4 Contact an air dis harges of al req ired p larities an voltages s al b a pl ed

10 times e c to al a pro riate p rts of the in trument u der test

NOT Care s o ld b ta e to e s re th t th s u d inte sity me s rin s stem u d r te t is fuly dis h rg d

from a y efe ts of e c te t b fore re e tin th a plc tio of a dis h rg

5.3.5 If the in tru tion man al sp cifies a temp rary p rforman e degradation or los of

fu ction af er the electrostatic dis harge tests, this degradation or los of fu ction s al not

al ow an red ced o eration, c an e of config ration or cor uption or los of an stored data

5.4 Te ts for immunity to power- a d ra io-fre u nc fields a d c ndu te

disturba c s

5.4.1 The eq ipment req ired an the test method ne ded to test for radio- req en y field

are des rib d in IEC 610 0-4-3 An alternative test method u in Tran verse Electromag etic

(TEM) waveg ides may b employed for immu ity testin The req irements that s al b

IEC 610 0-4-2 :2 10 defines method of implementin the testin The p rforman e

req irements for the in trument u der test are u c an ed in lu in the ran e of freq en ies

tested an ste size

5.4.2 Testin s al first b made in the referen e orientation with an pro e ca les ar an ed

as des rib d in 4.4.4 The sig al from the acou tic source des rib d in 4.4.4 s al b a pl ed

5.4.3 Tests for immu ity to radio- req en y field may b p rformed at dis rete freq en ies

with in rements of up to 4 % for freq en ies les than 5 0 MHz an up to 2 % for al other

freq en ies Dwel time at e c freq en y s al b a pro riate to the sou d inten ity

me s rin s stem u der test Testin at a l mited n mb r of dis rete freq en ies do s not

negate the ne d to me t the req irements of 4.4 at al freq en ies within the sp cified ran e

Testin at 1% in rements may b req ired to satisfy other stan ard req irements

5.4.4 If the in trument u der test is fit ed with an con ection device that al ows interface or

intercon ection ca les to b atac ed to it, then al tests for immu ity to p wer- an radi

o-freq en y field s al b p rformed with ca les con ected to al avai a le con ection devices

Al ca les s al b lef u terminated an s al b ar an ed as des rib d in Clau e 8 of

CISPR 2 :2 0 u les the s p l er of the sou d inten ity me s rin s stem also s p l es the

device con ected to the sou d inten ity me s rin s stem by this ca le, in whic case al

items s al b tested together

5.4.5 Where several con ection may b made to the same con ectin device, tests s al b

p rformed only with the config ration sp cified in the in tru tion man al as prod cin

minimum immu ity Other config ration that are eq al y or more immu e may b in lu ed in

the in tru tion man al in a lst of conformin config ration without further testin , provided

5.4.6 Power- req en y testin s al b at 5 Hz or 6 Hz The acou tic source of 4.4.4 an

an connection to the sou d inten ity me s rin s stem s al b made in a man er that has

no influen e on the p wer freq en y field

5.4.7 Maintainin the config ration of 5.4.2 an 5.4.4, the in trument u der test s al b

tested in at le st one other plane, e c orthogonal to the referen e orientation, within the

l mits of s ita le p sitionin for the radio- req en y tran mit in s stem employed

5.4.8 Durin testin , the in trument u der test s al remain ful y o erational an in the same

config ration as it was b fore testin commen ed

5.4.9 For sou d inten ity me s rin s stems in groups Y an Z o eratin from a publ c

p wer s p ly, tests s al b p rformed to demon trate conforman e to the ad itional

sp cification given in 4.4.2

5.4.10 For sou d inten ity me s rin s stems in group Z u in or sp cifyin intercon ectin

ca les (other than the pro e ca le) lon er than 3 m an a proved by the man facturer, tests

s al b p rformed to demon trate conforman e to the ad itional sp cification given in 4.4.3

6 Information to be included in the instruction manual

The in tru tion man al s al contain the fol owin :

a) the config ration for the referen e orientation an method of sec rin the micro hone

ca le, if a pro riate

b) the a proved ca les an ac es ories as req ired for the tests of 5.2.6 an 5.4.4;

c) the config ration for the normal mode of o eration;

d) an sp cified degradation in p rforman e or los of fu ctional ty fol owin the a pl cation

of electrostatic dis harges;

e) the set in an config ration within a normal method of op ration for gre test radi

o-freq en y emis ion ;

f the mode of o eration, within a normal method of o eration, an con ectin devices that

prod ce minimum immu ity to p wer- an radio- req en y field

Annex A

(informativ )

Radio-frequency emission l mits

Table A.1 – Limits for ra iate disturba c of Cla s B information te hn log

e uipme t (ITE) at a me s ring dista c of 10 m

Freq enc rang

NOT 1 Th lower lmit a ple at th tra sitio fre u n y

NOT 2 Ad itio al pro isio s ma b re uire for c s s wh re interfere c o c rs

NOT Th c ara teristic of a q a i-p a re eiv r are s e ifie in 4.2 of CIS R 16-1-1:2 0 Th refere c le el

for q a i-p a sig als is 1 µ /m

For sou d inten ity me s rin s stems p wered from a publ c s p ly, the req irements given

in Ta le A.2 s al also b fulfi ed

Table A.2 – Limits for c n ucte disturba c at the mains ports of Cla s B ITE

Freq enc rang

NOT 1 Th lower lmit a ple at th tra sitio fre u n ie

NOT 2 Th lmit d cre s s ln arly with th lo arithm of th fre u n y in th ra g

0,15 MHz to 0,5 MHz

Bibl ography

CISPR 16-1-1:2 0 , Spe c ific ato n fo r radio disturb ance and immuniy mea urin app aratus

and meth ds – Part 1-1: Radio disturb anc e and immu niy mea urin ap aratus – Mea urin

ap aratus

_ _ _ _ _ _