Iec 61000 4 10 2016

This p rt is an international stan ard whic gives immu ity req irements an test proced res related to "damp d os i atory mag etic field"... ELECTROMAGNETIC COMPATIBILITY EMC – Part 4-10:

Elect romagnetic compat ibi ity (EMC) –

Part 4- 10: Test ing and measurement t echniques – Damped osci latory magnetic

field immunity t est

Partie 4- 10: Techniques d'essai et de mesure – Essai d'immunité du champ

magnétique osci lat oire amort i

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Electromagnetic compatibi it y (EMC) –

Part 4- 10: Testing and measurement techniques – Damped osci latory magnet ic

field immunity test

Partie 4- 10: Techniques d'essai et de mesure – Essai d'immunit é du champ

magnét ique osci latoire amort i

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CONTENTS

FOREWORD 5

INTRODUCTION 7

1 Sco e an o ject 8

2 Normative ref eren es 8

3 Terms, def i ition an a breviated terms 9

3.1 Terms an def i ition 9

3.2 Ab reviation 10 4 General 10 5 Test levels 10 6 Test in trumentation 11 6.1 General 1

6.2 Damp d os i atory wave generator 1

6.2.1 General 1

6.2.2 Perf orman e c aracteristic of the generator con ected to the stan ard in u tion coi 12 6.3 Stan ard in u tion coi 14 6.4 Cal bration of the test s stem 14 7 Test setup 15 7.1 Test eq ipment 15 7.2 Verif i ation of the test in trumentation 15 7.3 Test setup for ta le-to EUT 16 7.4 Test setup for f lo r stan in EUT 16 7.5 Test setup for damp d os i atory f ield a pl ed in-situ 18 8 Test proced re 18 8.1 General 18 8.2 L b ratory ref eren e con ition 18 8.2.1 Cl matic con ition 18 8.2.2 Electromag etic con ition 18 8.3 Exec tion of the test 19 9 Evaluation of test res lts 19 10 Test re ort 2

An ex A (informative) Inf ormation on the field distribution of stan ard in u tion coi s 21

A.1 General 21

A.2 Determination of the coi f actor 21

A.2.1 General 21

A.2.2 Coi factor calc lation 21

A.3 1 m × 1 m stan ard in u tion coi 2

A.4 1 m × 2,6 m stan ard in u tion coi with ref eren e grou d plane 2

A.5 1 m × 2,6 m stan ard in u tion coi without referen e grou d plane 2

An ex B (informative) Selection of the test levels 2

An ex C (informative) Damp d os i atory mag etic field f req en y 2

An ex D (informative) Me s rement u certainty (MU) con ideration 2

D.1 General 2

D.2 L gen 2

D.3 Un ertainty contributors to the p ak c r ent an to the damp d os i atory

mag etic f ield me s rement u certainty 2

D.4 Un ertainty of p ak c r ent an damp d os i atory mag etic f ield calbration 3

D.4.1 General 3

D.4.2 Pe k c r ent 30 D.4.3 Further MU contribution to ampl tu e an time me s rements 3

D.4.4 Rise time of the ste resp n e an b n width of the freq en y resp n e of the me s rin s stem 3

D.4.5 Impulse p ak distortion d e to the lmited b n width of the me s rin s stem 3

D.5 Ap l cation of u certainties in the damp d os i atory wave generator compl an e criterion 3

An ex E (informative) 3D n merical simulation 3

E.1 General 3

E.2 Simulation 3

E.3 Comments 3

Bibl ogra h 41

Fig re 1 – Simpl f ied s hematic circ it of the test generator f or damp d os i atory mag etic f ield 12 Fig re 2 – Wavef orm of s ort-circ it c r ent in the stan ard coi s 13 Fig re 3 – Wavef orm of s ort-circ it c r ent s owin the re etition time T re 13 Fig re 4 – Example of a c r ent me s rement of stan ard in u tion cois 14 Fig re 5 – Example of test setup f or ta le-to eq ipment 16 Fig re 6 – Example of test setup f or flo r stan in eq ipment s owin the horizontal orthogonal plane 17 Fig re 7 – Example of test setup f or flo r stan in eq ipment s owin the vertical orthogonal plane 17 Fig re 8 – Example of test setup u in the proximity method 18 Fig re A.1 – Rectan ular in u tion coi with sides a + b an c 22 Fig re A.2 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-y plane f or the 1 m × 1 m in u tion coi 2

Fig re A.3 – + dB an – dB isol nes f or the mag etic f ield stren th (mag itu e) in the x-z plane f or the 1 m × 1 m in u tion coi 2

Fig re A.4 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-z plane f or the 1 m × 2,6 m in u tion coi with ref eren e grou d plane 2

Fig re A.5 – + dB an – dB isol nes f or the mag etic f ield stren th (mag itu e) in the x-y plane f or the 1 m × 2,6 m in u tion coi with ref eren e grou d plane 2

Fig re A.6 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-y plane f or the 1 m × 2,6 m in u tion coi without ref eren e grou d plane 2

Fig re A.7 – + dB an – dB isol nes f or the mag etic f ield stren th (mag itu e) in the x-z plane f or the 1 m × 2,6 m in u tion coi without ref eren e grou d plane 2

Fig re E.1 – Cur ent with p riod of 1 µs an H-f ield in the center of the 1 m × 1 m stan ard in u tion coi 3

Fig re E.2 – Hx–f ield alon the side of 1 m × 1 m stan ard in u tion coi in A/m 3

Fig re E.3 – Hx–f ield in direction x p rp n ic lar to the plane of the 1 m × 1 m stan ard in u tion coi 3

Fig re E.4 – Hx–f ield alon the side in dB f or 1 m × 1 m stan ard in u tion coi 3

Fig re E.5 – Hx–f ield alon the diagonal in dB f or the 1 m × 1 m stan ard in u tion coi 3

Fig re E.6 – Hx–f ield plot on y-z plane f or the 1 m × 1 m stan ard in u tion coi 3

Fig re E.7 – Hx-field plot on x-y plane f or the 1 m × 1 m stan ard in u tion coi 3

Fig re E.8 – Hx–f ield alon the vertical mid le l ne in dB f or the 1 m × 2,6 m stan ard

in u tion coi 3

Fig re E.9 – Hx–f ield 2D– lot on y-z plane for the 1 m × 2,6 m stan ard in u tion coi 4

Fig re E.10 – Hx–f ield 2D– lot on x-y plane at z = 0,5 m for the 1 m × 2,6 m stan ard

in u tion coi 4

Ta le 1 – Test levels 1

Ta le 2 – Pe k c r ent sp cif i ation of the test s stem 15

Ta le 3 – Waveform sp cifi ation of the test s stem 15

Ta le D.1 – Example of u certainty bu get for the p ak of the damp d os i atory

c r ent impulse (I

p) 31

Ta le D.2 – α f actor (se eq ation (D.6) of dif ferent u idirectional impulse resp n es

cor esp n in to the same b n width of the s stem B 3

Ta le D.3 – β f actor (eq ation (D.12) of the damp d os i atory waveform 34

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1:2 0 This edition con titutes a tec nical revision

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edition:

a) new An ex A on in u tion coi f ield distribution;

b) new An ex D on me s rement u certainty;

c) new An ex E f or n merical simulation ;

d) cal bration u in c r ent me s rement has b en ad res ed in this edition

The text of this stan ard is b sed on the fol owin doc ments:

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Des ription of the en ironment

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Mitigation method an devices

Part 6: Ge eric sta dards

Part 9: Mis el a eous

Eac p rt is f urther s bdivided into several p rts, publ s ed either as international stan ard

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n mb r identif yin the s bdivision (example: IEC 610 0-6-1)

This p rt is an international stan ard whic gives immu ity req irements an test proced res

related to "damp d os i atory mag etic field"

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-10: Testing and measurement techniques –

Damped osci latory magnetic f ield immunity test

1 Scope and object

This p rt of IEC 610 0 sp cif ies the immu ity req irements, test method , an ran e of

recommen ed test levels for eq ipment s bjected to damp d os i atory mag etic

disturb n es related to medium voltage an hig voltage s b-station

The test defi ed in this stan ard is a pl ed to eq ipment whic is inten ed to b in tal ed in

location where the phenomenon as sp cif ied in Clau e 4 wi b en ou tered

This stan ard do s not sp cif y disturb n es d e to ca acitive or in u tive coupl n in ca les

or other p rts of the f ield in tal ation IEC 610 0-4-18, whic de ls with con u ted

disturb n es, covers these asp cts

The o ject of this stan ard is to esta l s a common an re rod cible b sis f or evaluatin the

p rf orman e of electrical an electronic eq ipment for medium voltage an hig voltage s

b-station when s bjected to damp d os i atory mag etic f ield

The test is mainly a plca le to electronic eq ipment to b in tal ed in H.V s b-station

Power plants, switc ge r in tal ation , smart grid s stems may also b a pl ca le to this

stan ard an may b con idered by prod ct commit e s

NOT As d s rib d in IEC Guid 10 , this is a b sic EMC p blc tio f or u e b pro u t c mmite s of th IEC

As als state in Guid 10 , th IEC pro u t c mmite s are re p n ible for d terminin wh th r this immu ity

te t sta d rd is a ple or n t, a d if a ple , th y are re p n ible for d terminin th a pro riate te t le els a d

p rorma c criteria TC 7 a d its s b-c mmite s are pre are to c -o erate with pro u t c mmite s in th

e alu tio of th v lu of p rtic lar immu ity te t le els f or th ir pro u ts

This stan ard def i es:

– a ran e of test levels;

– test eq ipment;

– test setups;

– test proced res

2 Normative ref erenc s

The f olowin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a pl es For

u dated ref eren es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 0 (al p rts), I ntern tio al Electrotec nic l Vo a ulary (IEV) (avaia le at

www.electro edia.org)

3 Terms, def initions and abbreviated terms

set of o eration whic esta ls es, by ref eren e to stan ard , the relation hip whic exists,

u der sp cified con ition , b twe n an in ication an a res lt of a me s rement

Note 1 to e try: This term is b s d o th "u c rtainty" a pro c

Note 2 to e try: Th relatio s ip b twe n th in ic tio s a d th re ults of me s reme t c n b e pre s d, in

prin iple, b a c lbratio dia ram

[SOURCE: IEC 6 0 0-31 :2 01, 31 -01-0 ]

3.1.2

dampe os i atory wa e ge erator

generator del verin a damp d os i ation whose f req en y can b set to 10 kHz or 1 MHz

an whose dampin time con tant is f i e p riod

3.1.3

immunity

a i ty of a device, eq ipment or s stem to p rform without degradation in the presen e of an

electromag etic disturb n e

[SOURCE: IEC 6 0 0-161:19 0, 161-01-2 ]

3.1.4

ind ction coi

con u tor lo p of defi ed s a e an dimen ion , in whic a c r ent f lows, generatin a

mag etic f ield of def i ed u if ormity in a def i ed volume

3.1.5

ind ction coi f actor

ratio b twe n the mag etic f ield stren th generated by an in u tion coi of given dimen ion

an the cor esp n in c r ent value

Note 1 to e try: Th f i ld is th t me s re at th c ntre of th c i pla e, with ut th EUT

3.1.6

proximity method

method of a pl cation of the mag etic f ield to the EUT, where a smal in u tion coi is moved

alon the side of the EUT in order to detect p rtic larly sen itive are s

3.1.7

ref ere c groun

p rt of the Earth con idered as con u tive, the electrical p tential of whic is con entional y

taken as zero, b in outside the zone of in uen e of an e rthin (grou din ) ar an ement

[SOURCE: IEC 6 0 0-19 :19 8, 19 -01-01]

3.1.8

set of interde en ent elements con tituted to ac ieve a given o jective by p rformin a

sp cif ied fun tion

Note 1 to e try: Th s stemis c n id re to b s p rate f rom th e viro me t a d oth r e tern l s stems b a

ima in ry s ra e whic c ts th ln s b twe n th m a d th c n id re s stem Thro g th s ln s, th s stem

is af fe te b th e viro me t, is a te u o b th e tern l s stems, or a ts its lf o th e viro me t or th

e tern l s stems

3.1.9

tra sie t, adjective an nou

p rtainin to or desig atin a phenomenon or a q antity whic varies b twe n two

con ec tive ste d states d rin a time interval s ort comp red to the time s ale of interest

[SOURCE: IEC 6 0 0-161:19 0, 161-0 -01]

3.1.10

v rific tion

set of o eration whic is u ed to c ec the test eq ipment s stem (e.g the test generator

an its intercon ectin ca les) to demon trate that the test s stem is f un tionin

Note 1 to e try: Th meth d u e for v rif i atio ma b difere t fomth s u e for c lbratio

Note 2 to e try: For th p rp s s of this b sic EMCsta d rd this d f i itio is dif fere t f rom th d f i itio giv n in

Damp d os i atory mag etic f ield are generated by the switc in of H.V bu -b rs by

isolators or dis on ectors The mag etic f ield to whic eq ipment is s bjected can in uen e

the rel a le o eration of eq ipment an s stems

The f ol owin tests are inten ed to demon trate the immu ity of eq ipment when s bjected

to damp d os i atory mag etic f ield related to the sp cif i location an in tal ation con ition

of the eq ipment (e.g proximity of eq ipment to the disturb n e source)

The wave s a e of the test f ield cor esp n s to a damp d os i atory wave (se Fig re 2)

The c aracteristic are given in 6.2.2

Inf ormation on the os i ation freq en y is given in An ex C

5 Test levels

The prefer ed ran e of test levels is given in Ta le 1

The test levels s al b selected ac ordin to the in tal ation con ition Clas es of

in tal ation are given in An ex B

6 Test instrumentation

The test s stem comprises the damp d os i atory wave generator an the in u tion coi f or a

ta le-to test setup an , in ad ition, an RGP for a f lo r stan in test setup

U: Hig v lta e s urc R

c: Ch rgin re istor

Figure 1 – Simpl fie s hematic circ it of the te t ge erator

for dampe os i latory ma netic f ield

6.2.2 Perf orma c c ara teristic of the g nerator con e te to the sta d rd

Re etition rate 1/T

re(se Fig re 3) 4 /s ± 10 % f or 10 kHz an 4 0/s ± 10 % f or

1 MHz

Os i ation f req en y is def i ed as the reciprocal of the p riod of the f irst an third zero

cros in s af ter the initial p ak This p riod is s own as T in Fig re 2

T = 1 µs ( MHz) or 10 µs (0,1 MHz)

Fig re 2 – Wa ef orm of s ort circ it c r e t in the sta dard coi s

Figure 3 – Wa eform of s ort circ it c r e t s owing the repetition time T

rep

The formula of the ide l wavef orm of Fig re 2, I

DOS(t ), is as folows:

( )

e

tttt

KHi

KtI

htt

hh

tt

n

tt

eKH

1

12

21

1Pk

an the p rameters f or the os i ation p riod T = 10 µs are:

6.3 Sta dard ind ction coi

For the two sin le-turn stan ard cois of 1 m x 1 m an 1 m x 2,6 m, the f ield distribution is

k own an s own in An ex A Therefore, no f ield verif i ation or f ield calbration is neces ary;

the c r ent me s rement as s own in Fig re 4 is s f f icient

Figure 4 – Ex mple of a c r e t me s reme t of sta dard indu tion coi s

The in u tion coi s al b made of co p r, aluminium or an cond ctive non-mag etic

material, of s c cros -section an mec anical ar an ement as to f aci tate its sta le

The output c r ent s al b verif ied with the generator con ected to the stan ard in u tion

coi sp cified in 6.3 The con ection s al b re l zed by twisted con u tors or a co xial ca le

of up to 3 m len th an a s ita le cros -section

The sp cif i ation given in Ta le 3 are not a pl ca le for cal bration p rf ormed at test level 5

with the 1 m × 2,6 m stan ard in u tion coi con ected In this case, the cal bration s al b

p rformed by only u in the 1 m × 1 m stan ard in u tion coi

The fol owin sp cifi ation given in Ta le 2 an Ta le 3 s al b verified

Table 2 – Pe k c r e t spe ific tions of the te t sy tem

NOT 2 Th c lc late v lu is 15 ; h we er, th re is c r e tly n

c mmercial g n rator a aia le

Table 3 – Wav form spe ific tion of the te t s stem

PKIPKID

PKIPKID

PKIPKID

PKIPKID

r

÷

=

< 5 %

The cal bration s al b p rformed at al levels whic are u ed by la oratories

The cal bration s al b car ied out with a c r ent pro e an os i os o e or other eq ivalent

me s rement in trumentation with a 10 MHz minimum b n width

7 Test setup

7.1 Te t e uipme t

The fol owin eq ipment is p rt of the test setup:

– eq ipment u der test (EUT);

– au i ary eq ipment (AE) when req ired;

– ca les (of sp cif ied typ an len th);

– damp d os i atory wave generator;

– stan ard in u tion coi ;

– RGP in case of testin f lo r stan in eq ipment

7.2 Verif ic tion of the te t instrume tation

The purp se of verifi ation is to en ure that the test setup is o eratin cor ectly The test

setup in lu es:

– the in u tion coi ;

– the intercon ection ca les of the test eq ipment

To verif y that the s stem is f un tionin cor ectly, the fol owin sig al s ould b c ec ed:

– impulse present at the stan ard in u tion coi terminals

It is s f f icient to verif y that the impulse is present at an level by u in s ita le me s rin

eq ipment (e.g c r ent pro e, os i os o e)

NOT Te t la oratorie c n d fin a intern l c ntrol refere c v lu a sig e to this v rif i atio pro e ure

7.3 Te t s tup f or table- op EUT

Ta le-to EUTs s al b placed on a non-con u tive ta le The 1 m × 1 m stan ard in u tion

coi may b u ed for testin EUTs with dimen ion up to 0,6 m × 0,6 m × 0,5 m (L × W × H)

The 1 m × 2,6 m stan ard in u tion coi may b u ed f or testin EUTs with dimen ion up to

0,6 m × 0,6 m × 2 m (L × W × H)

The in u tion coi s al b p sitioned in thre orthogonal orientation

When an EUT do s not f it into the in u tion coi of 1 m x 2,6 m, the proximity method (se

7.4) s al b a pl ed

It is not neces ary to maximize the imp ct of ca les d rin this test The proximity of the

ca les to the in u tion coi can imp ct the res lts so the ca les s al b routed to minimize

this imp ct The minimized ca l n dimen ion s al b in orp rated into the determination of

the maximum size of an EUT that can b tested

An RGP is not req ired b low the EUT (se Fig re 5 b low) The in u tion coi s al b ke t

at le st 0,5 m f rom any con u tin s rfaces, for example the wal s an f lo r of a s ielded

en los re

Figure 5 – Ex mple of te t s tup f or table- op e uipme t

7.4 Te t s tup f or floor sta ding EUT

The stan ard in u tion coi for testin f lo r stan in eq ipment (e.g rac s) has a rectan ular

s a e of 1 m × 2,6 m where one s ort side may b the RGP f or large sized eq ipment (se

Fig re 7) The 1 m × 1 m in u tion coi can b u ed f or f lo r stan in eq ipment with the

The RGP s al have a minimum thic nes of 0,6 mm an a minimum size of 1 m × 1 m The

EUT s al b in ulated from the RGP

Fig re 6 – Ex mple of te t s tup f or f loor sta ding e uipme t

s owin th horizontal orthogonal pla e

For flo r stan in eq ipment (e.g ca inets) where the to of the EUT is gre ter than 0,7 m

f rom the RGP, more than one p sition s al b tested In an case, the in u tion coi s own in

Fig re 6 s al not b placed b low 0,5 m Fig re 7 s ows an example f or testin with a

vertical orthogonal plane

Fig re 7 – Ex mple of te t s tup f or f loor sta ding e uipme t

s owing the v rtic l orthogonal pla e

The test volume of the rectan ular coi is 0,6 m × 0,6 m × 2 m (L × W × H)

When an EUT do s not f it into the rectan ular coi of 1 m × 2,6 m, the proximity method (se

Fig re 8 an 7.5 for more detai ed inf ormation) s al b a pl ed

It is not neces ary to maximize the imp ct of ca les d rin this test The proximity of the

ca les to the in u tion coi can imp ct the res lts so the ca les s al b routed to minimize

this imp ct The minimized ca l n dimen ion s al b in orp rated into the determination of

the maximum size of the EUT that can b tested

Figure 8 – Ex mple of te t s tup using th proximity method

7.5 Te t s tup f or dampe os i latory field ap l e in-situ

In-situ testin is general y the only practical test method avai a le for large mac inery or

simi ar eq ipment Durin in-situ testin , an RGP is normal y not avai a le Theref ore the

proximity method is the only practical test method without the RGP in place Fig re 8 gives an

example f or a test setup for in-situ testin The 1 m × 1 m stan ard in u tion coi s ould b

u ed when examinin EUTs u in the proximity method Further, it is neces ary that the

stan ard in u tion coi is isolated from the EUT The distan e b twe n the stan ard in u tion

– the verif i ation of the test in trumentation ac ordin to 7.2;

– the esta l s ment of the la oratory ref eren e con ition ;

– the con rmation of the cor ect o eration of the EUT;

– the exec tion of the test;

– the evaluation of the test res lts (se Clau e 9)

8.2 Laboratory ref ere c conditions

8.2.1 Cl matic condition

Unles otherwise sp cified in generic, prod ct-fami y or prod ct stan ard , the cl matic

con ition in the la oratory s al b within an l mits sp cif ied f or the o eration of the EUT

an the test eq ipment by their resp ctive man facturers

Tests s al not b p rf ormed if the relative h midity is so hig as to cau e con en ation on

the EUT or the test eq ipment

8.2.2 Ele troma netic conditions

The electromag etic con ition of the la oratory s al b s c as to g arante the cor ect

o eration of the EUT so as not to in uen e the test res lts

• os i ation freq en ies;

• re resentative o eratin con ition of the EUT;

• orientation of the f ield;

• n mb r of test p ints;

• location of the stan ard in u tion coi relative to the EUT ( est p ints);

• selection an ju tif i ation of test p ints (recommen ed are are s of EUT s s e tible to

damp d os i atory mag etic f ield )

Testin an cal bration s al b p rf ormed b sed on the wavef orm sp cif ied in Fig re 2 an

Fig re 3

NOT Pro u t c mmite s c n a ply lo g r te t d ratio s, if a pro riate f or th ir pro u ts

The test d ration s al b a pl ed only one time for e c orientation

9 Evaluation of test results

The test res lts s al b clas if ied in terms of the los of fun tion or degradation of

p rforman e of the eq ipment u der test, relative to a p rf orman e level def i ed by its

man facturer or the req estor of the test, or agre d b twe n the man facturer an the

purc aser of the prod ct The recommen ed clas ifi ation is as f ol ows:

a) normal p rf orman e within l mits sp cif ied by the man facturer, req estor or purc aser;

b) temp rary los of fun tion or degradation of p rf orman e whic ce ses af ter the

disturb n e ce ses, an from whic the eq ipment u der test recovers its normal

p rforman e, without o erator intervention;

c) temp rary los of f un tion or degradation of p rforman e, the cor ection of whic req ires

o erator intervention;

d) los of fun tion or degradation of p rforman e whic is not recovera le, owin to damage

to hardware or sof tware, or los of data

The man f acturer’s sp cifi ation may def i e eff ects on the EUT whic may b con idered

in ig if i ant, an theref ore ac e ta le

This clas if i ation may b u ed as a g ide in formulatin p rf orman e criteria, by commit e s

resp n ible f or generic, prod ct an prod ct-f ami y stan ard , or as a f ramework f or the

agre ment on p rforman e criteria b twe n the man facturer an the purc aser, f or example

where no s ita le generic, prod ct or prod ct-famiy stan ard exists

Eq ipment s al not b come dan erou or u safe as a res lt of the a pl cation of the tests

10 Test report

The test re ort s al contain al the inf ormation neces ary to re rod ce the test In p rtic lar,

the fol owin s al b recorded:

– the items sp cif ied in the test plan req ired by 8.3;

– identif i ation of the EUT an an as ociated equipment, f or example, bran name, prod ct

typ , serial n mb r;

– identif i ation of the test eq ipment, for example, bran name, prod ct typ , serial n mb r;

– an sp cial en ironmental con ition in whic the test was p rf ormed, f or example,

s ielded en los re;

– an sp cif i con ition neces ary to ena le the test to b p rf ormed;

– the p rf orman e level def i ed by the man facturer, req estor or purc aser;

– the p rf orman e criterion sp cified in the generic, prod ct or prod ct-f ami y stan ard;

– an ef f ects on the EUT o served d rin or af ter the a pl cation of the test disturb n e,

an the d ration f or whic these ef fects p rsist;

– the rationale f or the p s /f ai decision (b sed on the p rf orman e criterion sp cif ied in the

generic, prod ct or prod ct-fami y stan ard, or agre d b twe n the man f acturer an

the purc aser);

– an sp cif i con ition of u e, for example ca le len th or typ , s ieldin or grou din , or

EUT o eratin con ition , whic are req ired to ac ieve compl an e;

– the in u tion coi s selected for the tests;

– the p sition an orientation of the in u tion coi relative to EUT

Annex A

(inf ormativ )

Inf ormation on the f ield distribution of standard induction coi s

An ex A gives information on the maximum size of an EUT an its location in the stan ard

in u tion coi s The f ield is con idered s f ficiently u iform if the mag itude of the mag etic

f ield stren th is within ± dB of the field stren th in the centre of the in u tion coi

For the f ield computation the f i ite cros -section of the lo p con u tors are neglected ( hin

wire a proximation)

A.2 Determination of the coi f actor

The in u tion coi f actor s ould b determined by calc lation The coi factor is u ed to

calc late the c r ent in the in u tion coi to o tain the req ired mag etic f ield stren th in the

centre of the in u tion coi

A.2.2 Coi f actor c lc lation

The coi factor can b calc lated from the ge metrical dimen ion of the in u tion coi F r a

sin le-turn, rectan ular in u tion coi havin sides a + b an c (se Fig re A.1), the coi factor

+

++

=

=

22

22

CF

2/

//4

2/

//4

41)(

)(

cb

bccb

ca

acca

IPH

Pk

π

(A.1)

where H(P) is the mag etic f ield at p int P an I is the in u tion coi c r ent Eq ation (A.1) is

val d, when the largest dimen ion of the cros -section of the coi con u tor is smal comp red

to the s ortest side of the in u tion coi For a s uare in u tion coi with side c an if P is at

the centre of the coi , then a = b = c/2 If P is at the centre of a rectan ular coi , then a = b If

the RGP is the b tom side of the coi , then eq ation (A.1) is sti val d, takin into ac ou t the

image of the actual (ph sical) coi In this case, if P is at the centre of the ph sical coi, then

the k

CF

of the coi f ormed by the ph sical coi plu its image is given by eq ation (A.1) with b

= 3 × a

Figure A.1 – Re ta gular induction coi with side a + b a d c

A.3 1 m × 1 m standard induction c i

The + dB an – dB isol nes f or the mag etic field stren th (mag itu e) are s own in

Fig re A.2 f or the x-y plane an in Fig re A.3 f or the x-z plane The maximum EUT size is

width × len th × heig t = 0,6 m × 0,6 m × 0,5 m

NOT Th –3 dB is ln is n t s own b c u e it is o tsid th lo p

Figure A.2 – + dB isol n f or the ma netic f ield stre gth (ma nitu e)

in the x-y pla e f or the 1 m × 1 m ind ction coi

Figure A.3 – + dB a d – dB isol ne f or th ma n tic field stre gth (ma nitud )

in the x-z pla e for th 1 m × 1 m induction coi

A.4 1 m × 2,6 m standard induction c i with ref erence ground pla e

The + dB an -3 dB isol nes f or the mag etic f ield stren th (mag itu e) are s own

in Fig re A.4 f or the x-z plane an in Fig re A.5 f or the x-y plane The maximum EUT size is

width × len th × heig t = 0,6 m × 0,6 m × 2 m

For the calc lation of the ± 3 dB isol nes the size of the referen e grou d plane is con idered

as in nite

NOT Th –3 dB is ln is n t s own b c u e it is o tsid th lo p

Fig re A.4 – + dB isol ne f or the ma netic field stre gth (ma nitude) in the x-z pla e

f or the 1 m × 2,6 m induction coi with ref ere c groun pla e

Ma imum EUT siz

(width × h ig t = 0,6 m × 2,0m)

x-z pla e + dB

Figure A.5 – + dB a d – dB isol ne f or th ma n tic field stre gth (ma nitud )

in the x-y pla e for the 1 m × 2,6 m ind ction coi with ref ere c ground pla e

A.5 1 m × 2,6 m standard induction c i without ref erence ground plane

The + dB an – dB isol nes f or the mag etic f ield stren th (mag itu e) are s own

in Fig re A.6 f or the x-y plane an in Fig re A.7 f or the x-z plane The maximum EUT size is

width × len th × heig t = 0,6 m × 0,6 m × 2 m

NOT Th –3 dB is ln is n t s own b c u e it is o tsid th lo p

Figure A.6 – + dB isol ne f or the ma netic field stre gth (ma nitude) in the x-y pla e

f or the 1 m × 2,6 m in uction coi without ref ere c ground pla e

Figure A.7 – + dB a d – dB isol ne f or th ma netic field stre gth (ma nitud )

in the x-z pla e f or th 1 m × 2,6 m ind ction coi without ref ere c ground pla e

Annex B

(inf ormativ )

Selection of the test levels

Test levels s al b selected in ac ordan e with the electromag etic en ironment in whic the

eq ipment con erned is inten ed to b u ed takin into ac ou t most re l stic in tal ation

con ition

Recommen ation for test levels are given in Clau e 5 The actual selection of test levels

s ould take into ac ou t

– the electromag etic en ironment;

– the p tential proximity of damp d os i atory mag etic f ield disturb n es sources to the

eq ipment con erned;

– the in tal ation con ition typical y to b exp cted for an in tal ation in the electromag etic

en ironment u der con ideration;

– the ne d an amou t of comp tibi ty margin , i.e the margin b twe n the maximum

disturb n e level an con idered immu ity level

An a pro riate test level f or eq ipment de en s on the electromag etic en ironment in whic

eq ipment is inten ed to b u ed Based on common in talation practices whic are

re resentative for the electromag etic en ironment con erned, a g ide f or the selection of

test levels f or damp d os i atory mag etic f ield testin may b the f olowin :

Clas 1: Electromag etic en ironment with p rtic lar mitigation me s res employed in

order to al ow electromag etic phenomena to oc ur to a certain extent only (e.g

phenomenon do s not oc ur, phenomenon oc urs with a relatively low ampl tu e

only, etc.)

Control ed electromag etic en ironment: where sen itive devices are plan ed to

b u ed (e.g electron micros o es, cathode ray tub s, etc.)

The test is not a pl ca le to eq ipment inten ed to b u ed in this clas of

en ironment

Clas 2: Electromag etic en ironment re resentative for residential are s

The test is not a pl ca le to eq ipment inten ed to b u ed in this clas of

en ironment b cau e the location con erned are not s bjected to the in uen e

of switc in phenomena in medium- an hig -voltage s bstation

Clas 3: Electromag etic en ironment re resentative for of f ice/commercial are s

L cation of this clas of en ironment are c aracterized by a p tential proximity to

medium-voltage an hig -voltage switc ge r or to con u tors car yin

cor esp n in tran ients A computer ro m in the vicinity of a s b-station mig t

b a re resentative for s c location

Clas 4: Electromag etic en ironment re resentative f or in u trial are s

L cation of this clas of en ironment are c aracterized by the presen e of

medium- or hig -voltage s bstation an of con u tors car yin tran ient fault

eq ipmentin tal ation mig t b re resentatives f or s c location

Clas 5: Hars electromag etic en ironment whic can b c aracterized by the f olowin

at ributes: con u tors, bu -b rs or M.V.or H.V Iines car yin ten of kA

Switc yard are s of he v in u trial plants, M.V/H.V s b-station an p wer

station mig t b re resentatives f or location with s c an electromag etic

en ironment

Clas X: Sp cial electromag etic en ironment

The minor or major electromag etic se aration of interf eren e sources from

eq ipment circ its, ca les, l nes, etc an the q al ty of the in talation may

req ire the u e of hig er or lower test levels than those des rib d a ove This

may ne d a case-by-case as es ment

It s ould b noted that the l nes of eq ipment (e.g ca l n , bu b rs, overhe d l nes)

as ociated to electromag etic en ironments with hig er test levels can p netrate into

location b in as ig ed to an en ironment with lower test levels In s c cases a

re-as es ment of the later location with resp ct to the s ita le test levels s ould b car ied out

The a ove selection of test levels in terms of electromag etic en ironments s ould b u ed

as a g ide only There mig t b cases where a location mig t b as ig ed to one of the

a ove typ s of electromag etic en ironments but d e to the f eatures of the eq ipment

con erned or other circ mstan es a dif f erent test level than that as ociated to that typ of

electromag etic en ironment mig t b more a pro riate Cor esp n in as es ment s ould

b done by the p rties in olved (e.g prod ct commit e s)

Annex C

(inf ormativ )

Damped osci latory magnetic f ield frequency

The phenomenon is typical of the switc in of isolators in H.V s b-station , an p rtic larly

in H.V bu -b rs

The o enin an closin o eration of H.V isolators gives rise to s arp front-wave tran ients,

with time of the order of ten of n These phenomena are smo thed by the overal

ca acitan e of the stru tures of H.V eq ipment as they pro agate

The voltage f ront-wave has an evolution that in lu es ref lection d e to the mismatc in of

the c aracteristic imp dan e of the H.V circ its in olved In this resp ct, the res ltin

tran ient voltage an c r ent in H.V bu -b rs are c aracterized by a f un amental os i ation

f req en y that de en s on the len th of the circ it an on the pro agation time

The tran ient c r ent p ak value that generates the mag etic f ield def i ed in this stan ard is

directly related to the p ak voltage on the bu -b rs an their c aracteristic imp dan e; the

voltage is a out twice the phase p ak value of the H.V s stem, an the c r ent (determined

also by the c aracteristic imp dan e of s c circ its) is a out 2 kA p ak

The freq en y of os i ation is determined by the len th of the H.V an by the self -in u tan e

of H.V circ its (1 µH/m), the series ca acity of the circ it-bre ker in the of f-state (5 0 p ),

the con entrated ca acity of ca acitive voltage tran f ormers (some nF), of c r ent

tran f ormers (3 0 p ) an of H.V s p orts (2 p e c )

The os i ation f req en y ran es from a out 10 kHz to a f ew MHz de en in on the

in uen e of the p rameter mentioned an the len th of the bu -b rs, whic may vary f rom

ten of meters to h n red of meters (4 0 m may oc ur)

In this resp ct the os i ation freq en y of 1 MHz may b con idered re resentative of most

situation , but 10 kHz has b en con idered a pro riate f or big H.V s b-station

The re etition freq en y is varia le an , provided the other con ition are the same, is a

f un tion of the distan e b twe n the switc in contacts: that is, with closed contacts, there is

the maximum re etition f req en y, whie for distan es b tween the contacts at the l mit of

extin tion of the arc, the minimum re etition f req en y in resp ct of e c phase is twice the

p wer freq en y (10 /s f or 5 Hz an 12 /s for 6 Hz H.V s stems), but at these freq en ies

the maximum mag etic f ield stren th oc urs

The re etition rates selected f or the 0,1 MHz an 1 MHz test f ield re resent therefore a

compromise, takin into ac ou t the dif f erent d ration of the phenomena, the

re resentativity of the dif f erent f req en ies an the pro lems related to the p wer of the test

generator

Annex D

(inf ormativ )

Measurement uncertainty (MU) considerations

The compl an e of the re l zed disturb n e q antity with the disturb n e q antity sp cified by

this stan ard is u ualy con rmed throu h a set of me s rements (e.g me s rement of the

p ak of a damp d os i atory c r ent impulse with an os i os o e by u in a c r ent pro e)

The res lt of e c me s rement in lu es a certain amou t of me s rement u certainty (MU)

d e to the imp rf ection of the me s rin in trumentation as wel as to the lac of re e ta i ty

of the me s ran itself The evaluation of MU is done here ac ordin to the prin iples an

method des rib d in IEC TR 610 0-1-6

In order to evaluate MU it is neces ary to:

a) identif y the sources of u certainty, related b th to the me s rin in trumentation an to

the me s ran ,

b) identif y the f un tional relation hip (me s rement model) b twe n the in uen e (input

q antities an the me s red (output q antity,

c) o tain an estimate an stan ard u certainty of the input q antities,

d) o tain an estimate of the interval containin , with a hig level of con den e, the true

value of the me s ran

Further detai s are given in IEC TR 610 0-1-6

These estimates an u certainties, derived for a p rtic lar disturb n e q antity, do not

des rib the degre of agre ment b twe n the simulated electromag etic phenomenon, as

defi ed in the b sic stan ard, an the re l electromag etic phenomenon in the world outside

the la oratory

Sin e the eff ect of the p rameters of the disturb n e q antity on the EUT is a priori u k own

an in most cases the EUT s ows a nonl ne r b haviour, a sin le estimate an u certainty

n mb rs can ot b def i ed f or the disturb n e q antity Therefore e c of the p rameters of

the disturb n e q antity wi b ac omp nied by the cor esp n in estimate an u certainty

This yield to more than one u certainty bu get

iu

i(y), u

cy), U(y) a d y are e plain d in IEC TR

610 0- -6

D.3 Unc rtainty contributors to the pea cur ent a d to the damped

osci latory magnetic f ield me sureme t unc rtainty

The fol owin l st s ows the contributors u ed to as es b th the me s rin in trumentation

an test setup in uen es:

• re din of p ak value

• b n width of the me s rin s stem

• s a e of the impulse resp n e of the me s rin s stem

• os i os o e horizontal axis me s rement er or

• os i os o e vertical axis me s rement er or

• cal bration of os i os o e an me s rin s stem

• coi f actor of the in u tion coi

D.4 Unc rtainty of pe k cur e t and d mpe os i latory ma n tic f ield

cal bration

In the case of the mag etic f ield test, the disturb n e q antities are the damp d os i atory

c r ent generated by the test generator an injected into the coi terminals an the damp d

os i atory mag etic f ield a pl ed to the EUT As dis u sed in Clau e D.1, an u certainty

bu get f or e c me s red p rameter of the disturb n e q antity is req ired The p rameters

of these disturb n e q antities are I

P

f or the impulse c r ent an H

P

for the impulse mag etic

f ield It is as umed that the mag etic field generated by the in u tion coi is pro ortional to

the c r ent flowin into its terminals, the con tant of pro ortional ty b in the coi factor k

CF

Therefore the impulse mag etic f ield has the same waves a e as the impulse c r ent an the

p ak of the mag etic f ield is o tained as H

Ad itional p rameters c aracterize the disturb n e, i.e the freq en y of os i ation an

dampin However the evaluation of the me s rement u certainty of these p rameters,

althou h req ired, is les deman in than that of impulse p ak Therefore at ention is foc sed

here on me s rement u certainty of the p ak of the impulse

The a pro c ado ted here to evaluate the impulse MU is des rib d in D.4.4 an D.4.5

Ta le D.1 gives an example of the u certainty bu get f or the p ak c r ent impulse The ta le

in lu es the input q antities that are con idered most sig if i ant for this example, the detais

(n merical values, typ of pro a i ty den ity f un tion, etc.) of e c contributor to MU an the

res lts of the calc lation req ired for determinin the u certainty bu get

p

11

=

B

VR

RV

I

β

δδ

The damp d os i atory c r ent impulse os i ation f req en y f

0

= 1 MHz is as umed for the

f ol owin example of u certainty bu get

Table D.1 – Ex mple of un ertainty bud et for the pe k of

u

cy) = √ u

i(y)2

: is the voltage p ak re din at the output of a c r ent pro e or acros a c r ent s u t

The er or b u d is o tained as umin that the s o e has an 8-bit vertical resolution with

interp lation ca a i ty ( rian ular pro a i ty den ity f un tion) If the interp lation ca a i ty is

not avai a le or not active, then the rectan ular pro a i ty den ity fun tion is u ed

R

T

: is the tran fer imp dan e (or sen itivity) of the c r ent s u t or pro e An estimated value

of 0,0 1 Ω an an er or b u d of 5 % (rectan ular pro a i ty den ity fun tion) are as umed

δR: q antif ies the non- e e ta i ty of the me s rement setup, layout an in trumentation

This is a typ A evaluation b sed on the f ormula of the exp rimental stan ard deviation s(q

k)

of a sample of n re e ted me s rements q

qq

nqs

1

2

11

(D.2)

where q is the arithmetic me n of the q

jvalues δR is expres ed in relative terms, an an

estimate of 0 % an an er or b u d of 3 % (1 stan ard deviation) are as umed

δV: q antif ies the ampl tu e me s rement inac urac of the s o e at d.c δV is expres ed in

relative terms A 2 % er or b u d of a rectan ular pro a i ty den ity f un tion an an estimate

of 0 % are as umed

β: is a co f ficient whic de en s on the s a e of b th the impulse resp n e of the me s rin

s stem an the stan ard impulse wavef orm in the neig b rho d of the p ak (se D.4.5) The

interval (6 8 ± 71) kHz is re resentative of a wide clas of s stems, e c havin a dif ferent

s a e of the impulse resp n e

B: the b n width B of the me s rin s stem can b exp rimental y o tained (direct

me s rement of the b n width) or calc lated f rom the b n width B

i

of e c element of the

me s rement s stem (es ential y a c r ent pro e or s u t, a ca le an a s o e) by u in the

f ol owin eq ation:

.11

1

2

22

is 0,9 (e.g in th c s of a s u re in u tio lo p wh s sid

is 1 m) a d its e p n e u c rtainty is 5 % th n th b st e timate of H

P

is 10 A/m a d its e p n e u c rtainty

is 9,9 % (s e Ta le D.1

D.4.3 Furth r MU contribution to ampl tude a d time me s reme ts

The f ol owin contribution may also have an imp ct on the MU bu get:

DC of f set: The d.c of f set of the s o e contributes to the voltage p ak me s rement

u certainty, if the p ak is me s red f rom the nominal d.c zero l ne of the s o e This

contribution can b ig ored, if the re dout sof tware of the s o e me s res the p ak f rom the

pulse b se lne

Time ba e er or a d j t er: The os i os o e sp cif i ation may b taken as er or b u d of

rectan ular pro a i ty den ity f un tion Us al y these contribution are negl gible

Vertic l re olution: The contribution de en s on the vertical ampl tu e resolution ∆A an on

the slo e of the trace d A/d t The u certainty is related to the half width of the resolution an is

(∆A/2) (dA/d t ) If trace interp lation is p rf ormed (se the os i os o e man al) a trian ular

pro a i ty den ity f un tion is u ed, otherwise a rectan ular pro a i ty den ity f un tion is

u ed This contribution may not b neglgible when |d A/d t| < (∆A/T

i), where T

MS

T

sπ

s

is the delay time given by

(t)dtthT

∫

∞

=

00s

(D.5)

Eq ation (D.4) is e sier to han le, f rom the mathematical p int of view, than the u ual one

10 % to 9 % rise time defi ition is u ual y ado ted Given the – dB b n width of the s stem

the two defi ition le d to comp ra le rise times In e d, if we def i e

Ta le D.2 It is evident f rom Ta le D.2 that it is not p s ible to identif y a u iq e value of α

sin e α de en s b th on the ado ted def i ition of the rise time (e.g b sed on thres old or

on eq ation (D.4) an on the s a e of the impulse resp n e of the me s rin s stem A

re sona le estimate of

αcan b o tained as the arithmetic me n b twe n the minimum

Further, it can b as umed that, if no information is avai a le a out the me s rin s stem

a art from its b n width, an value of α b twe n 3 1 × 10

−

an 3 9 × 10

−

is eq al y

pro a le Dif f erently stated, α is as umed to b a ran om varia le havin a rectang lar

pro a i ty den ity f un tion with lower an up er b u d 3 1 × 10

−

an 3 9 × 10

−

,

resp ctively The stan ard u certainty of α q antif ies b th: a) the in if f eren e to the

mathematical model ado ted f or the def i ition of the rise-time, an b) the in if feren e to the

s a e of the impulse resp n e of the s stem

Table D.2 – α f actor (s e e uation (D.6) of dif f ere t u idire tional impuls re pon e

cor e ponding to the s me ba dwidth of the s stem B

D.4.5 Impuls pe k distortion due to the l mite ba dwidth of th me s ring s stem

The distorted impulse waveform V ()

o t

at the output of the me s rin s stem is given by the

con olution integral

dthVtV

0in

o t

ttt

A⋅ = , where A is the d.c aten ation of the me s rin s stem The

input waveform can b a proximated by its Taylor series exp n ion a out the time in tant t

3

pp

in

2

pp

in

pin

tttV

VtV

Further

pin

<

′ tV

,

b cau e the con avity p ints downward (maximum), an

pin

>

′

tV

, b cau e, f or the stan ard

waveforms of interest here, the rise time is lower than the fal time Substitutin eq ation D.8

into eq ation D.7 an after simplf i ation , val d when the b n width of the me s rin s stem

is large with resp ct to the b n width of the input sig al (so that the p wer series terms

whose order is gre ter than two are negl gible), we o tain

πα

Note that the p rameter β de en s on the secon derivative of the stan ard input waveform

an on the p rameter α def i ed an derived in D.4.4 A simple mathematical expres ion for

the stan ard damp d os i atory wavef orm, u eful f or u certainty calc lation, is given by

eVtV

t

02

pin

sin00

ωω

π

ζω

analytical y derived from eq ation (D.10) an (D.1 ) as

0f

The value of β, as o tained from eq ation (D.12), is re orted in Ta le D.3

Table D.3 – β f actor (e uation (D.12) of th dampe os i atory wa ef orm

n gle te

NOT 2 Th v lu s of β o tain d b u in e u tio (D.12) a d re orte in Ta le D.3 d n t a pre ia ly dif fer

fom th o e o tain d thro g c mp tatio fom th math matic l wa ef orm d f i e in this sta d rd

NOT 3 Dampin ζ c n b o tain d b me s rin th ratio ρ > 1 b twe n th ampltu e of o e ma imum (or

For a c mpla t wa eform, ζ is in th ra g 0,0 to 0,0

D.5 Appl c tion of uncertainties in the damped osci latory wave ge erator

compl anc criterion

General y, in order to b con dent that the c r ent an the mag etic f ield os i atory

tran ients are within their sp cif i ation , the calbration res lts s ould b within the sp cif ied

l mits of this stan ard ( oleran es are not red ced by MU)

Further g idan e is given in IEC TR 610 0-1-6:2 12, Clau e 6

Annex E

(inf ormativ )

3D numerical simulations

In An ex E some other inf ormation is re orted con ernin the H-field distribution in ide an

outside the cois f or testin by u in 3D n merical simulation in the time domain (d namic

res lts) an f req en y domain (2D-n merical plot of the H-f ield) as exten ion of the 2D plots

of An ex A (static res lts)

E.2 Simulations

The simulation of Fig res E.1 to E.10 are p rf ormed as fol ows:

• The cois are ex ited by an ide l c r ent source (se the s mb l "p rt") havin the

mathematical waveform as def i ed in the text of this stan ard an normal zed at 1 A

• Two extreme s a e con u tors of the coi are con idered: rectan ular of size 10 cm × 1

cm (re orted in An ex E) an rou d wire of 1 mm radiu (res lts not re orted f or brevity)

• Def ault mes cel s are u ed to sp ed up the computation for the plots of Fig res E.2 an

E.3; for the other f i ures o timized mes cel s are u ed f or b ter ac urac

• H-f ield ampl tu e is in icated as Hx

i

where x in icates that the con idered H-f ield

comp nent is p ral el to the x-axis whi e the s bs ript i cor esp n s to the H-field pro e

p sition f rom the lo p centre to the last far away p sition

• The 2D H-field plots are calc lated at 1 MHz f req en y an 0 dB ref ers to 1 A/m

From the simulation , the fol owin con ideration arise:

• The computed H-f ield waveform has the same s a e as that of the coi c r ent source

• Very l tle dif f eren e can b noted when comp rin computed H-f ield wavef orms with two

extreme con u tor s a es f or the same coi size

• In the centre of the coi s, the in u tion coi factors are 0,9 m

-resp ctively

f or s uare an rectan ular coi s, whic practical y do not de en on the s a e of the coi

con u tor

• It is con rmed also by tran ient simulation that the variation of the H-field is les than

+ dB for the are s s own in An ex A

• It is s own an q antif ied that the H-f ield in re ses ra idly when the pro e u ed for

H-f ield computation a pro c es the con u tors of the coi

• The H-f ield value outside the lo p is a out 2 dB to 4 dB (1/10 to 1/10 ) lower than the

f ield at the center of the lo p This s ould b taken into ac ou t when car yin out the

proximity test method

NOT Th ampltu e of th Hx-ield in id th lo p is n g tiv d e to th c o e pro e dire tio s.

Figure E.1 – Cur e t with period of 1 µ a d H-f ield in the c nter

of the 1 m × 1 m sta dard in uction coi

Figure E.2 – Hx f ield along the sid of 1 m × 1 m sta dard induction coi in A/m

IEC

Dista c (m) –3

Figure E.3 – Hx f ield in dire tion x perpe dic lar to th pla e

of the 1 m × 1 m sta dard in uction coi

Figure E.4 – Hx field along th side in dB f or 1 m × 1 m sta dard induction coi

Figure E.5 – Hx f ield along the dia on l in dB for the 1 m × 1 m sta dard ind ction coi

Figure E.6 – Hx f ield plot on y-z pla e for th 1 m × 1 m sta d rd indu tion coi