Iec 61000 4 31 2016

Figure 2 – Ex mple of volta e spe trum of a broa ba d te t sign lme s re with a 12 kHz re olution ba dwidth 6 Test e uipment a d level set ing proc dures 6.1 Te t ge erator The test gene

Elect romagnetic compat ibi ity (EMC) –

Part 4- 31: Test ing and measurement t echniques – A C mains port s broadband

conduct ed dist urbance immunity t est

Partie 4- 31: Techniques d'essai et de mesure – Essai d'immunité aux

pert urbat ions conduit es à large bande sur les accès d'al ment ation secteur en

courant alt ernatif

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Electromagnetic compatibi it y (EMC) –

Part 4- 31: Testing and measurement techniques – A C mains port s broadband

conduct ed disturbance immunity t est

Partie 4- 31: Techniques d'essai et de mesure – Essai d'immunit é aux

pert urbat ions conduit es à large bande sur les accès d'al ment at ion sect eur en

courant alt ernat if

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CONTENTS

FOREWORD 5

INTRODUCTION 7

1 Sco e an o ject 8

2 Normative ref eren es 8

3 Terms an def i ition 8

4 General 10 5 Test levels 1

6 Test eq ipment an level set in proced res 13 6.1 Test generator 13 6.2 Coupl n an decoupl n devices 14 6.2.1 General 14 6.2.2 CDND f or the p rt u der test 15 6.2.3 Coupl n /decoupl n network (CDNs) for ca les that are not u der test 15 6.3 Verif i ation of the test s stems 17 6.3.1 General 17 6.3.2 Verif i ation proced re of test generator f latnes 17 6.3.3 Verif i ation proced re of the in ertion los of the CDND u in tran former j g 18 6.3.4 In ertion los of the injection coupl n s stem 20 6.4 Test level setin proced re 21

6.4.1 General 21

6.4.2 Set in of the output level at the EUT p rt of the CDND 21

7 Test set-up an injection method 2

7.1 Test set-up 2

7.2 EUT comprised of a sin le u it 2

7.3 EUT comprised of several u its 2

7.4 CDN an CDND termination a pl cation 2

8 Test proced re 2

9 Evaluation of the test res lts 27 10 Test re ort 2

An ex A (informative) Me s rement u certainty of the p wer sp ctral den ity test level 2

A.1 General 2

A.2 Un ertainty bu gets for test method 2

A.2.1 General s mb ls 29 A.2.2 Def i ition of the me s ran 2

A.2.3 MU contributors of the me s ran 2

A.2.4 Input q antities an calc lation examples for exp n ed u certainty 3

A.3 Expres ion of the calc lated me s rement u certainty an its a plcation 31

An ex B (informative) Rationale for the selection of the prefer ed bro db n source – Inf ormation on test sig al generation 33 B.1 General 3

B.2 Prin iples of b n -l mited bro db n sig al generation 3

B.2.1 General 3

B.2.2 (True) ran om noise generation 3

B.2.3 Pseu o- an om noise seq en e 3

B.2.4 Impulse 3

B.2.5 OFDM s heme 4

B.3 Selection of the pref er ed bro db n source 4

Bibl ogra h 4

Fig re 1 – Immu ity test to bro db n con u ted disturb n es 1

Fig re 2 – Example of voltage sp ctrum of a bro db n test sig al me s red with a 12 kHz resolution b n width 13 Fig re 3 – Prin iple of the test generator 14 Fig re 4 – Example of simplf ied diagram for the circ it of CDND 15 Fig re 5 – Example of coupl n an decoupl n network f or p wer p rts other than AC main 16 Fig re 6 – Test set-up regardin test generator f latnes an typical test sig al 18 Fig re 7 – Typical circ it diagram of the tran f ormer j g s owin 5 Ω side an 10 Ω side of the tran former an 2 pc 0,1 µF coupl n ca acitors 18 Fig re 8 – Tran former jg sp cifi ation 2

Fig re 9 – Example of the set-up ge metry to verif y the in ertion los of the injection coupl n s stem 2

Fig re 10 – Set-up for the evaluation of the total in ertion los of the injection coupl n s stem 21

Fig re 1 – Set-up for level setin 2

Fig re 12 – Example of test set-up f or an EUT comprised of a sin le u it ( o view) 2

Fig re 13 – Example of a test set-up f or an EUT comprised of several u its ( o view) 2

Fig re 14 – Immu ity test to a 2-p rt EUT (when only CDNDs can b u ed) 2

Fig re A.1 – Example of in uen es up n the p wer sp ctral den ity test level u in a CDND 3

Fig re B.1 – White noise source 34 Fig re B.2 – Prin iple of b n -l mited bro db n sig al generation with an arbitrary waveform generator 3

Fig re B.3 – Sig al sp ctrum of a b n -l mited pseu o- an om noise sig al (me s red with a 12 kHz resolution b n width) 3

Fig re B.4 – Extract of the b n -l mited pseu o noise sig al in time domain (me s red with an os i os o e) 3

Fig re B.5 – Sig al sp ctrum of the b n -lmited pseu o noise sig al without an anti -al as f ilter 3

Fig re B.6 – Extract of the sig al sp ctrum of a b n -l mited pseu o noise sig al (me s red with a 2 0 Hz resolution b n width) 3

Fig re B.7 – Sig al sp ctrum of a b n -l mited impulse sig al (me s red with a 12 kHz resolution b n width) 3

Fig re B.8 – Extract of the b n -l mited impulse sig al in time domain (me s red with an os i os o e) 3

Fig re B.9 – Extract of the sig al sp ctrum of a b n -l mited impulse sig al (me s red with a 2 0 Hz resolution b n width) 4

Fig re B.10 – Sig al sp ctrum of an OFDM sig al (me s red with a 12 kHz resolution b n width) 41

Fig re B.1 – Extract of the sig al sp ctrum of an OFDM sig al (me s red with a 2 0 Hz resolution b n width) 41

Fig re B.12 – Sig al sp ctrum of an OFDM sig al with an ampl tu e ste at 3 MHz

(me s red with a 12 kHz resolution b n width) 4

Ta le 1 – Test levels 12

Ta le 2 – Characteristic of the test generator 14

Ta le 3 – Sp cif i ation of the main p rameters of the CDND f or c r ent ≤ 16 A 15

Ta le 4 – Usage of CDNs 16

Ta le A.1 – CDND level setin proces 31

Ta le B.1 – Comp rison of white noise sig al generation method 4

INTERNATIONAL ELECTROTECHNICAL COMMISSION

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

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intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cif i atio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re fter refere to a “IEC

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a re me t b twe n th two org niz tio s

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p te t rig ts IEC s al n t b h ld re p n ible f or id ntifyin a y or al s c p te t rig ts

International Stan ard IEC 610 0-4-31 has b en pre ared by s bcommit e 7 B: Hig

-f req en y phenomena, of IEC tec nical commit e 7 : Electromag etic comp tibi ty

This stan ard f orms Part 4-31 of the IEC 610 0 series It has the statu of a b sic EMC

publ cation in ac ordan e with IEC Guide 10

The text of this stan ard is b sed on the fol owin doc ments:

Ful inf ormation on the votin f or the a proval of this stan ard can b f ou d in the re ort on

votin in icated in the a ove ta le

A l st of al p rts in the IEC 610 0 series, publ s ed u der the general title Ele troma n tic

c mp tibility (EMC), can b fou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cif i publ cation At this date, the publ cation wi b

• recon rmed,

• with rawn,

• re laced by a revised edition, or

IMPORTANT – The 'colour in ide' logo on the cov r pa e of this publ c tion indic te

that it contains colours whic are consid re to be u ef ul f or the cor e t

understa ding of its conte ts Us rs s ould theref ore print this doc me t using a

colour printer

Des ription of the en ironment

Clas ifi ation of the en ironment

Mitigation method an devices

Part 6: Ge eric sta dards

Part 9: Mis el a eous

Eac p rt is f urther s bdivided into several p rts, publs ed either as International Stan ard

or as Tec nical Sp cifi ation or Tec nical Re orts, some of whic have alre d b en

publ s ed as section Others wi b publs ed with the p rt n mb r f ol owed by a das an a

secon n mb r identif ying the s bdivision (example: IEC 610 0-6-1)

This p rt is an International Stan ard whic gives immu ity req irements an test proced re

related to con u ted bro db n disturb n es

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-31: Testing and measurement techniques –

AC mains ports broadband conducted disturbance immunity test

1 Sc pe and obje t

This p rt of IEC 610 0 relates to the con u ted immu ity of electrical an electronic

eq ipment to electromag etic disturb n es comin f rom inten ed an /or u inten ed

bro db n sig al sources in the freq en y ran e 15 kHz up to 8 MHz

The o ject of this stan ard is to esta ls a common ref eren e to evaluate the immu ity of

electrical an electronic eq ipment when s bjected to con u ted disturb n es cau ed by

inten ed an /or u inten ed bro db n sig al sources on AC main p rts The test method

doc mented in this stan ard des rib s a con istent method to as es the immu ity of an

eq ipment or s stem again t a def i ed phenomenon

Eq ipment not havin at le st one AC main p rt is ex lu ed The p wer p rts not inten ed

to b con ected to AC main distribution network are not con idered as “AC main p rts”

an theref ore are ex lu ed

This stan ard is a pl ca le only to sin le phase eq ipment havin rated input c r ent ≤ 16 A;

the a pl cation of the bro db n disturb n e to multiple phase eq ipment and/or eq ipment

with rated input c r ent > 16 A is u der con ideration

NOT As d s rib d in IEC Guid 10 , this sta d rd is a b sic EMC p blc tio for u e b pro u t c mmite s of

th IEC As als state in Guid 10 , th IEC pro u t c mmite s are re p n ible for d terminin wh th r this

immu ity te t sta d rd is to b a ple or n t, a d if a ple , th y are re p n ible f or d terminin th a pro riate

te t le els a d p rorma c criteria TC 7 a d its s b-c mmite s are pre are to c -o erate with pro u t

c mmite s in th e alu tio of th v lu of p rtic lar immu ity te ts for th ir pro u ts

The f olowin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a pl es For

u dated ref eren es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 0-161, Intern tio al Ele trotec nic l Vo a ulary (IEV) – P art 161: Electroma n tic

c mp tibility (a ailable at www.electro edia.org)

IEC 610 0-4-6:2 13, Ele troma n tic c mp tib ity (EMC) – P art 4-6: Te ting a d

me s reme t tec niq e – I mmu ity to c nducted d isturb n e , induc d b rad io-fe u n y

electrical network simulatin the imp dan e of the h man b dy u der average o erational

con ition b twe n a han -held electrical a plan e an e rth

[SOURCE: IEC 6 0 0-161:19 0, 161-0 -2 , modif ied – A note to entry has b en ad ed.

3.2

a xi ary e uipme t

AE

eq ipment neces ary to provide the eq ipment u der test (EUT) with the sig als req ired f or

normal o eration an eq ipment to verif y the p rforman e of the EUT

electrical circ it for tran f er in energ from one circ it to another with a defi ed imp dan e

Note 1 to e try: Co pln a d d c u ln d vic s c n b inte rate into o e b x (c u ln /d c u ln n twork

electrical circ it in orp ratin the fun tion of b th the coupl n an decoupl n network that

injects the sig al primari y in dif ferential mode

3.7

de oupl n network

de oupl n de ic

electrical circ it for preventin test sig als a pled to the EUT f rom af fectin other devices,

eq ipment or s stems that are not u der test

me s re, in a one- or two-p rt network, of the degre of u wanted tran verse (s mmetric

mode) sig al prod ced at the terminals of the network d e to the presen e of a lon itu inal

(as mmetric mode) sig al on the con ectin le d

Note 1 to e try: LCL is a ratio e pre s d in dB

[SOURCE: ITU-T O.9:19 9, 4.1, modif ied – The def i ition has b en re hrased an the

p rentheses have b en ad ed

generator ca a le of generatin the req ired test sig al

Note 1 to e try: Th g n rator ma in lu e th folowin : white n is s urc , mo ulatio s urc , ate u tors,

bro d a d p wer amplfier a d fiters

The source of disturb n e covered by this stan ard is b sical y an inten ed an /or

u inten ed con u ted bro db n disturb n e s p rimp sed on the main lne to the AC

main p rt of the EUT

For example, the sig als generated by PLT s stems are intentional y-generated bro db n

disturb n es, where s other electrical an electronic eq ipment con ected to the AC main

network may emit u intentional bro db n disturb n es

NOT Power ln tele ommu ic tio s (PLT) is als k own a bro d a d p wer ln (B L) a d a p wer ln

c mmu ic tio (PLC)

Even when the bro db n sig al is inten ed to b dif ferential, the u b lan e of the main

con erts p rt of it into a common mode sig al To take this phenomenon into ac ou t, the

disturb n e sig al is injected throu h a coupln /decoupl n network f or dif f erential mode

coupl n (CDND) havin a lon itu inal con ersion los (LCL) simiar to a typical main

distribution network (se Fig re 1)

The c aracteristic of the CDND are given in 6.2

CD D c u ln a d d c u ln n twork f or inje tio of th te t sig al primariy in difere tial mo e

CD c u ln a d d c u ln n twork a pre crib d in IEC 610 0-4-6

Figure 1 – Immunity te t to broa ba d con ucte disturba c s

With the EUT con ected to the CDND, a p wer at en ator (A2 in Fig re 1) of 3 dB or larger

s al b in erted b twe n the test generator an the CDND, u les it can b s own that the

voltage stan in wave ratio (VSWR) d e to the mismatc b twe n the test generator an the

CDND is ≤ 2

5 Test lev ls

The level of the bro db n test sig al to b a pled to the AC p wer p rts u der test over the

selected freq en y ran e of interest is def i ed by its p wer sp ctral den ity (PSD) expres ed

in dBm/Hz and s al b selected from column 2 of Ta le 1

For con enien e, the test levels are also given for the whole f req en y ran e f rom 15 kHz to

8 MHz in eq ivalent voltage sp ctrum expres ed in dB (µV) 10 kHz (se column 3 of

Ta le 1), an in total forward p wer expres ed in dBm (se column 4 of Ta le 1)

These values were derived in a 5 Ω s stem u in Formula (1) an ne d to b recalc lated if

a dif f erent or red ced f req en y ran e is selected f or the test

For more detai s regardin the verif i ation of test levels se also Fig re 1

Table 1 – Te t le els

Frequ nc ran e 15 kHz to 8 MHz

Level P wer spe tral density E uivalent v ltage

spe trum density

T tal forward p wer

An example of a bro db n test sig al is s own in Fig re 2

In p rtic lar cases of intentional bro db n disturb n es, prod ct commite s may sp cif y a

s ita le lmited freq en y ran e f or testing the EUT

The total forward p wer f or a given p wer sp ctral den ity an selected f req en y ran e can

b calc lated u in Formula (1)

)

Hz1log(

10

st art

st op

SDFT

ff

PP

is the lower f req en y of the test freq en y b n , in Hz

The set in proced re of the test levels at the EUT p rt of the coupl n device (CDND) is

des rib d in 6.4

Figure 2 – Ex mple of volta e spe trum of a broa ba d te t sign l

me s re with a 12 kHz re olution ba dwidth

6 Test e uipment a d level set ing proc dures

6.1 Te t ge erator

The test generator (se Fig re 3) in lu es al the neces ary eq ipment an to provide a

bro db n input to the CDND that cau es the req ired test sig al to b a pled to the EUT

with the req ired level, freq en y ran e, mod lation, etc

A typical ar an ement comprises the f ol owin items whic may b se arate or integrated into

one or more test in truments:

• a white noise source, G1, ca a le of generatin a bro db n sig al over the f req en y

b n of interest The p rameters can b set by man al control or programma le control

(e.g freq en y b n , ampl tu e) For more detai s, se An ex B

• a pulse mod lation ca a i ty of 1 Hz an 2 Hz (5 % d ty c cle);

• a varia le at en ator, A1, ( ypical y f rom 0 dB to 4 dB) to control the output level of the

generated disturbin source, an whic is o tional;

• an RF switc , S1, by whic the disturbin bro db n sig al can b switc ed on an of f

when evaluatin the immu ity of the EUT S1 may b in lu ed in G1 an is o tional;

• a bro db n p wer ampl fier, PA, whic may b neces ary to ampl f y the sig al if the

output p wer of the G1 is in uf f icient;

• a low-p s f ilter (LPF), an /or a hig -p s filter (HPF), whic may b neces ary to avoid

interf eren e cau ed by (hig er order or s b-) harmonic with some typ s of EUT, f or

example RF receivers When req ired, they s al b in erted b twe n the output of the

bro db n p wer ampl f ier, PA, an the coupl n device (CDND)

The c aracteristic of the test generator are given in Ta le 2

IEC

109

876

54

32

10

0

0

10 23456789

Table 2 – Chara teristic of th te t ge erator

Out ofban co tributio below 15 kHz

This c ntrib tio is n t sig ific nt

If a pro u t c mmite s le ts a d dic te fe u n y ra g diff ere t f rom 15 kHz to 8 MHz, th n th

fe u n y lmits for o t-ofb n c ntrib tio s o ld b a ju te a c rdin ly For e ample, th o t-ofb n

c ntrib tio to th te t sig al at th o tp t of th te t g n rator s o ld b re u e b at le st 2 dB at

Coupln devices s al b u ed to a ply the bro db n test sig al over the freq en y ran e of

interest, with a defi ed common mode an dif ferential mode imp dan e at the EUT p rt u der

test

Decoupln devices s al b u ed to prevent the other devices, eq ipment an s stems that

are not u der test f rom b in disturb d by the test sig al

The coupln an decoupl n devices can b combined into one b x (a coupln /decoupl n

network) or can con ist of several p rts The pref er ed coupl n an decoupl n devices are

CDNDs f or AC p rts an CDNs for al other p rts, this is to en ure re rod cibi ty of the test

an protection of the AE

Coupln an decoupln devices s al b u ed for the f ol owin two purp ses:

• CDNDs s al b u ed for the purp se of a plyin the bro db n test sig al into the AC

main p rt u der test of the EUT an , where a pl ca le, f or decoupl n or terminatin the

AC ca les not u der test

• CDNs s al b u ed f or the purp se of decoupl n or terminatin al other ca les (other

than AC ca les) not u der test

6.2.2 CDND for th port under test

A CDND combines the coupl n an decoupl n f un tion in one b x an is u ed to inject the

bro db n test sig al into the AC main p rt of the EUT The CDND s al have a lon itu inal

con ersion los (LCL) of 16 dB in order to inject the common mode sig al as wel as the

dif ferential mode sig al simultane u ly Ta le 3 an Fig re 4 s ow the b sic req irements for

CDND an an example of a simpl f ied diagram, resp ctively

Table 3 – Spe ific tion of th main parameters of th CDND f or c r e t ≤ 16 A

L n itudinal co versio los (EUT p rt)

These network comprise the coupl n an decoupln circ its in one b x An example of a

coupl n an decoupl n network for the u e on p wer p rts (other than AC main ) is given in

Fig re 5 Ta le 4 s mmarizes the u age of the dif ferent typ s of CDNs as outl ned in

IEC 610 0-4-6:2 13, An ex D The CDNs selected s al not u d ly af f ect the fun tional

sig als Con traints on s c ef fects may b sp cif ied in the prod ct stan ard

The CDNs u ed in 6.2.3 f or decoupl n circ its or f or def i in the common mode imp dan e

of the EUT s al b as sp cif ied in IEC 610 0-4-6

Table 4 – Us ge of CDNs

Power p rts (oth r th n A main )

L, N a d P are main termin l c n e tio s

Figure 5 – Ex mple of coupl n a d de oupl n network

f or power ports oth r tha AC main

6.2.3.2 CDNs f or p wer s pply l n s oth r tha AC main

Coupln /decoupl n network s c as CDN-M1, CDN-M2 an CDN-M3 as pres rib d in

IEC 610 0-4-6 s al b u ed for al p wer s p ly con ection ex e t the AC main p rts

N

L

6.2.3.4 Coupl ng a d de oupl ng f or uns re ne unbala c d l ne

For coupl n an decoupl n sig als to an u s re ned ca le with u b lan ed l nes, a s ita le

CDN-X as defi ed in IEC 610 0-4-6 can b u ed, f or example CDN-AF2 for two wires or

The decoupl n network general y comprises several in u tors to cre te an maintain a hig

imp dan e value over the testin freq en y ran e This in u tan e determined by the fer ite

material u ed s al b at le st 2 0 µH at 15 kHz

The re ctan e s al remain hig , ≥ 2 0 Ω up to 2 MHz an ≥ 15 Ω a ove 2 MHz The

in u tan e can b ac ieved either by havin a n mb r of win in s on f er ite toroid or by

u in a n mber of fer ite toroid over the ca le (u ual y as a clamp-on tub )

NOT Th s e if i atio f or clamp is giv n in IEC 610 0-4-6

The CDNs can b u ed as decoupln network with the RF input p rt lef t u lo ded When

CDNs are u ed in this way, they s al me t the req irements of IEC 610 0-4-6

6.3 Verif ic tion of the te t s stems

The test s stem (in lu in the test generator an the CDND) s al have the ca a i ty to a ply

a con tant an flat bro db n test sig al to the AC main p rt of the EUT over the test

freq en y ran e

The c aracteristic of the test generator an the CDND are des rib d in 6.1 an 6.2.2 an

p rameters are given in Ta les 2 an 3 resp ctively

The verif i ation of the f latnes an level set in of the bro db n test sig al a pl ca le to the

EUT are des rib d in 6.3.2 to 6.4

6.3.2 Verif ic tion proc d re of te t ge erator f latne s

The bro db n sig al provided by the test generator to the CDND s al satisf y the f latnes

req irement of ± 3dB over the test freq en y ran e

The verif i ation of the sig al flatnes over the test freq en y ran e s al b p rformed u in

a sp ctrum analy er an me s red in a resolution b n width of (10 ± 3 ) kHz

The me s rement set-up is i u trated in Fig re 6 ), an the typical output test generator

sig al is i u trated in Fig re 6 )

NOT Informatio o te t sig al g n ratio is giv n in An e B

Sp c t rum

a aly zerTest g n rat or

At t en at or

(o t io )

IEC

Th o tio alate u tor is s le te to pre e t o erlo d or d ma e of th s e trum a aly er

Figure 6 ) – Set Up for the verific tio of the output broad an sig al of te t generator

+ 3 dB

- 3 dB

Freq enc yTest req enc y ran e

IEC

Figure 6b) – Typic l spe trum of the output broad an sig al of te t generator

Figure 6 – Te t s t up re arding te t g nerator flatne s a d typic l te t signal

6.3.3 Verific tion proc d re of the ins rtion los of the CDND using tra sf ormer j g

Tran f ormer jg s al b u ed to verif y the s mmetrical sig al level coupled b twe n l ne an

neutral an the c aracteristic of the injection coupln s stem (whic in p rt in lu es the

CDND) When a test sig al is injected into the RF input p rt of a CDND, the tran f ormer jg is

u ed to verify the s mmetrical sig al level coupled b twe n L an N

These tran f ormer j g con ert the input imp dan e from an as mmetrical 5 Ω inputoutput

into a s mmetrical 10 Ω inputoutput over the whole a plca le test f req en y ran e An

example of a circ it for the tran f ormer j g is s own in Fig re 7

Figure 7 – Typic l circ it dia ram of th tra sformer j g s owing 5 Ω side

a d 10 Ω side of the tra sf ormer a d 2 pc 0,1 µ coupl n c pa itors

The in ertion los of the tran former j g s al b me s red ac ordin to the prin iple given in

Fig res 8 ) to 8c) Thre in e en ent me s rements s al b p rformed in order to

determine the in ertion los of e c tran f ormer j g as wel as the CDND

First, the vector network analy er (VNA) s al b cal brated at the ca le en s u in a ful

2-p rt throu h-o en-s ort-matc (TOSM) cal bration The VNA may b re laced by a sig al

generator an a receiver, if a VNA is not avai a le Then, the me s rements ac ordin to the

prin iple given in Fig res 8 ) to 8c) s al b p rformed ( he AC main p rt of the CDND is

dif ferential y terminated with 10 Ω) The in ertion los of the tran former jg an the CDND

is calc lated as f ol ows:

Tran f ormer j g 1: A

1

= 0,5 × (A

12 + A

13 –A

2)

2

= 0,5 × (A

12 +A

2–A

13)

3

= 0,5 × (A

13 + A

2–A

12)

CDNDTransformer

Figure 8 ) – Ins rtio los me s rement s tup of the transformer jig me s rement A2

Figure 8 – Tra sf ormer j g spe if ic tion

The in ertion los of the tran f ormer jg s al b les than 1 dB over the a pl ca le freq en y

ran e The f latnes of the in ertion los of the CDND s al not ex e d ± 1 dB Typical values

f or the in ertion los of the CDND are in the ran e of 2 dB to 4 dB

6.3.4 Ins rtion los of the inje tion coupl ng s stem

In order to verif y the in ertion los of the injection coupl n s stem, the test set-up as s own

IEC

Figure 9 – Ex mple of th s t up g ometry to v rify

the ins rtion los of the inje tion coupl ng s stem

The ref eren e grou d plane s al exten at le st 0,2 m b yon the p rimeter of the set-up.

The heig t of the in ulation s p ort u der the tran f ormer jg is adju ted to minimize the

ca le len th b twe n the tran former j g an the CDND

The flatnes of the in ertion los of the injection coupln s stem (comprisin the co xial

ca les, the at en ator, the CDND an the tran f ormer j g) u ed f or testin s al b verified

u in a vector network analy er (VNA) as i u trated in Fig re 10, an s al b within

± 3,0 dB

NOT Th V A c n b re la e b a sig al g n rator a d a re eiv r

CDNDTra sformer

Figure 10 – Set up f or the e aluation of the total ins rtion

los of th inje tion coupl n s stem

6.4 Te t le el s t ing proc dure

For the cor ect setin of the level of bro db n sig al injected by the test generator at the RF

input p rt of the CDND, the proced re in 6.4.2 s al b a pl ed It is as umed that the test

generator, the CDND an the tran former j g comply with the req irements of 6.2 an 6.3

6.4.2 Set in of th output le el at the EUT port of the CDND

The set-up u ed to adju t the output p wer of the bro db n sig al to the req ired level f or

testin is given in Fig re 1

The test generator s al b con ected to the RF input p rt of the CDND The EUT p rt of the

CDND s al b con ected throu h the tran f ormer j g to the me s rin eq ipment havin a

5 Ω input imp dan e The AC main p rt of the CDND s al b lo ded with a secon

tran former j g, terminated with 5 Ω

The bro db n test sig al p wer me s rement s ould prefera ly b p rf ormed u in a

thermocouple typ p wer meter Other p wer meter typ s may b u ed, if their s ita i ty

(esp cial y l ne rity) is proven

Usin the des rib d set-up an the f olowin me s rement proced re, the test generator s al

b adju ted to yield the fol owin re din on the me s rin eq ipment

The ste s to b fol owed are:

a) The target total f orward p wer is calc lated u in Formula (1) in Clau e 5, ac ordin to a

selected test level of Ta le 1 an f or the freq en y ran e of interest f or testin the EUT

b) The output of the test generator s al b adju ted to get a total f orward p wer re din

me s red by the p wer meter at the output of the tran former j g con ected to the EUT

p rt of the CDND as determined in ste a) (se Fig re 1 ) The generator set in s

req ired to ac ieve that test level s al b recorded an s al b u ed for testin the EUT

Co x ial c able u e for

The EUT s al b placed on an in ulatin s p ort of (0,1 ± 0,0 ) m heig t a ove a ref eren e

grou d plane A non-con u tive rol er/caster in the ran e of (0,1 ± 0,0 ) m a ove the

ref eren e grou d plane can re lace the in ulatin s p ort Al ca les exitin the EUT s al b

s p orted at a heig t of at le st 3 mm a ove the ref eren e grou d plane

If the eq ipment is desig ed to b mou ted in a p nel, rac or ca inet, then it s al b tested

in this con g ration When a me n is req ired to s p ort the test sample, s c s p ort s al

b con tru ted of a non-metal c, non-con u tin material

The ca le at ac ed to the AC main p rt u der test of the EUT s al b con ected to the

CDND EUT p rt f or a plyin the bro db n test sig al In case of multiple AC main p rt,

e c ca le s al b con ected to a CDND Al other ca les s al b con ected to CDNs

an /or decoupl n devices They s al b located b twe n 0,1 m an 0,3 m from the EUT

(distan e L in this stan ard) This distan e is to b me s red horizontal y f rom the projection

of the EUT onto the referen e grou d plane to the CDND, CDNs an /or decoupl n devices

Se Fig re 13 f or ad itional ref eren e

NOT Dista c L is n t n c s ariy th s me o al sid s of th EUT, b t is b twe n 0,1 m a d 0,3 m

7.2 EUT compris d of a single unit

The EUT s al b placed on an in ulatin s p ort a ove the referen e grou d plane For

ta le-to eq ipment, the ref eren e grou d plane may b placed on a ta le (se Fig re 12)

Only one CDN or CDND s al b terminated (se 7.4)

The coupl n an decoupl n devices s al b placed on the ref eren e grou d plane, makin

direct contact with it, at a distan e of 0,1 m to 0,3 m from the EUT The ca les b twe n the

coupl n an decoupln devices an the EUT s al b as s ort as p s ible an s al not b

bu dled or wra p d They s al be placed or s p orted at a heig t of at le st 0,0 m a ove

the referen e grou d plane If the EUT is provided with other e rth terminals, they s al , when

al owed, b con ected to the referen e grou d plane throu h the coupl n an decoupl n

network CDN-M1

If the EUT is provided with a keyb ard or han -held ac es ory, then the artif i ial han s al

b placed on this keyb ard or wra p d arou d the ac es ory an con ected to the ref eren e

grou d plane

The au i ary eq ipment (AE) req ired f or the def i ed o eration of the EUT ac ordin to the

sp cif i ation of the prod ct commit e (commu ication eq ipment, modem, etc.), as wel as

the au i ary eq ipment neces ary f or en urin an data tran fer an as es ment of the

f un tion , s al b con ected to the EUT throu h coupl n an /or decoupl n devices At le st

one of e c typ of ph sical p rts s ould b con ected to a ca le, an decoupled as

A2 o tio al p wer ate u tor

Th EUT cle ra c fom a y metal c o je ts oth r th n th te t e uipme t s al b at le st 0,5 m Only o e of th

CD s n t u e for inje tio s al b termin te with 5 Ω pro idin o ly o e return p th Al oth r C Ns s al b

c nfig re a d c u ln n twork

Figure 12 – Ex mple of te t s t up f or a EUT compris d of a single unit ( op view)

7.3 EUT compris d of s v ral units

Eq ipment comprised of several u its, whic are intercon ected, s al b tested u in one of

the f ol owin method

• Pref er ed method: Eac s b-u it s al b tre ted an tested se arately as a u iq e EUT

(se 7.2), con iderin al the others u its as AE CDNs or decoupl n network s al b

placed on the ca les con ected to the s b-u its con idered as the EUT The AC main

p rts of al s b-u its s al b tested se arately

• Alternative method: Sub-u its that are alway con ected together by s ort ca les, i.e

≤ 1 m, an that are p rt of the eq ipment to b tested can b con idered as a u iq e EUT

These intercon ected ca les are then regarded as internal ca les of the s stem Se

Fig re 13

The u its b in p rt of s c an EUT s al b placed as close as p s ible to e c other

without makin contact, al on the in ulatin s p ort The intercon ectin ca les of these

u its s al also b placed on the in ulatin s p ort

The EUT cle ran e f rom an metal c o stacles other than the test eq ipment s al b at le st

A2 o tio al p wer ate u tor

Th EUT cle ra c fom a y metal c o je ts oth r th n th te t e uipme t s al b at le st 0,5 m Only o e of th

CD s n t u e for inje tio s al b termin te with 5 Ω, pro idin o ly o e return p th Al oth r C Ns s al b

7.4 CDN a d CDND termination appl c tion

Only one of the CDNs or CDNDs that are con ected via ca les to p rts not u der test s al b

terminated with 5 Ω Al other ca les con ectin u tested p rts s al b decoupled u in a

CDN an /or decoupl n devices (se IEC 610 0-4-6)

The CDN or CDND to b terminated s al b c osen ac ordin to the f ol owin priority:

1) CDND u ed f or con ection to AC main p rt (not u der test ;

2) CDN-M1 u ed for con ection of the e rth terminal;

3) CDN-Sn (n = 1,2,3…): If the EUT has several CDN-Sn p rts, the p rt whic is closest to

the p rt selected f or injection (s ortest ge metrical distan e) s al b u ed;

4) CDN-M2 u ed for con ection to DC main p rt;

5) Other CDNs con ected to the p rt whic is the closest to the p rt selected f or injection

(s ortest ge metrical distan e)

– If the AE is directly con ected to the EUT (e.g no decoupl n on the con ection

b twe n them as s own in Fig re 14 ) , then it is to b placed on the in ulatin

s p ort (0,1 ± 0,0 ) m a ove the ref eren e groun plane an grou ded via a

terminated CDN

– If the AE is con ected to the EUT via a CDN, then its ar an ement is not generaly

critical an it can b con ected to the ref eren e grou d plane in ac ordan e with the

man facturer’s in tal ation req irements

– If the EUT has only one p rt (i.e one AC main p rt , that p rt is con ected to the

CDND u ed f or injection

– If the EUT has two p rts an only one CDND can b con ected to the EUT, the other

p rt s al b con ected to an AE that has one of its other p rts con ected to a CDND

(AC main p rt or a CDN terminated with 5 Ω in ac ordan e with the a

ove-mentioned priority (se Fig re 14 ) Al other con ection of the AE s al b

decoupled If an AE con ected to the EUT s ows an er or d rin the test, a decoupl n

device (prefera ly a terminated EM clamp) s ould b con ected b twe n the EUT an

the AE (se Fig re 14 )

– If the EUT has more than two p rts an only one CDND can b con ected to the EUT,

it s al b tested as des rib d for two p rts but al other EUT p rts s al b decoupled

If an AE con ected to the EUT s ows an er or d rin the test, a decoupl n device

(prefera ly a terminated EM clamp) s ould b con ected b twe n EUT an AE, as

mentioned a ove

A E

C ND

E TT

C ND

Test g n rat or

h ≥ 3 mL

The testin s al b p rformed ac ordin to a test plan.

Atempts s ould b made to ful y exercise the EUT d rin testin , an to f ul y inter ogate al

exercise modes selected f or s s e tibi ty

Prel minary in estigation on al testin asp cts an the u e of a sp cial exercisin program

may b req ired

The EUT s al b tested u der its inten ed o eratin an cl matic con ition

L cal interf eren e reg lation s al b ad ered to with resp ct to the radiation f rom the test

set-up If the radiated energ ex e d the p rmited level, a s ielded en los re s al b u ed

NOT Ge eraly, this te t c n b p rorme with ut u in a s ield d e clo ure This is b c u e th disturb n e

le els a ple a d th g ometry of th s t-u s are n t lk ly to ra iate a hig amo nt of e erg , e p cialy at th

lower fe u n ie

The test s al b p rformed with the test generator providin the test sig al to the RF input

p rt of the CDND con ected to the AC main network Al other con ected p rts not u der

test s al b tre ted as des rib d in 7.4

An LPF an /or a HPF may b req ired at the output of the test generator to prevent (hig er

order or s b-) harmonic f rom disturbin the EUT The b n sto c aracteristic of the LPF

s al b s f f icient to s p res the harmonic so that they do not af fect the res lts These

f ilters s al b in place with the test generator when setin the test level

The bro db n test sig al s al b a pl ed to the EUT ac ordin to the test level selected in

the freq en y ran e of interest an u in the total f orward p wer esta l s ed by the test level

set in proced re given in 6.4.2 The pulse mod lation selected by the prod ct commit e is

a pl ed to the test sig al d rin the dwel time Pulse mod lation is inten ed to simulate the

keyin b haviour of a disturb n e sig al The dwel time for a pl cation of the bro db n

immu ity test sig al s al not b les than the time neces ary f or the EUT to b exercised an

to resp n an s al in no case b les than 6 s

9 Ev luation of the test results

The test res lts s al b clas if ied in terms of the los of fun tion or degradation of

p rforman e of the eq ipment u der test, relative to a p rf orman e level def i ed by its

man facturer or the req estor of the test or by agre ment b twe n the man facturer an the

purc aser of the prod ct The recommen ed clas ifi ation is as f ol ows:

a) normal p rf orman e within l mits sp cif ied by the man facturer, req estor or purc aser;

b) temp rary los of fun tion or degradation of p rf orman e whic ce ses af ter the

disturb n e ce ses, an from whic the eq ipment u der test recovers its normal

p rforman e, without o erator intervention;

c) temp rary los of f un tion or degradation of p rforman e, the cor ection of whic req ires

o erator intervention;

d) los of fun tion or degradation of p rforman e whic is not recovera le, owin to damage

to hardware or sof tware, or los of data

The man facturer's sp cifi ation may def i e eff ects on the EUT whic may b con idered

in ig if i ant, an theref ore ac e ta le

This clas if i ation may b u ed as a g ide in formulatin p rf orman e criteria, by commit e s

resp n ible f or generic, prod ct an prod ct-f ami y stan ard , or as a f ramework f or the

agre ment on p rforman e criteria b twe n the man facturer an the purc aser, f or example

where no s ita le generic, prod ct or prod ct-famiy stan ard exists

10 Test re ort

The test re ort s al contain al the inf ormation neces ary to re rod ce the test In p rtic lar,

the fol owin s al b recorded:

• identif i ation of the EUT an an as ociated eq ipment, f or example bran name, prod ct

typ , serial n mb r;

• re resentative o eratin con ition of the EUT;

• whether the EUT is tested as a sin le or multiple u it;

• the typ s of intercon ectin ca les, in lu in their len th, an the interface p rt of the

EUT to whic they were con ected;

• an sp cif i con ition for u e, f or example ca le len th or typ , s ieldin or grou din ,

or EUT o eratin con ition , whic are req ired to ac ieve complan e;

• the recovery time of the EUT if neces ary;

• the typ of test f aci ty u ed an the p sition of the EUT, AE(s) an coupl n an

decoupln devices;

• identif i ation of the test eq ipment, for example bran name, prod ct typ , serial n mb r;

• the coupl n an decoupl n devices u ed on e c ca le;

• f or e c injection p rt, in icate whic decoupln devices were terminated in 5 Ω;

• a des ription of the EUT exercisin method;

• an sp cif i con ition neces ary to ena le the test to b p rf ormed;

• the frequen y ran e of a pl cation of the test;

• the rate of dwel time;

• the a pl ed test level;

• the p rf orman e level def i ed by the man facturer, req estor or purc aser;

• the p rf orman e criteria that have b en a pled;

• an ef fects on the EUT o served d rin or af ter a pl cation of the test disturb n e an the

d ration for whic these ef f ects p rsist;

• the rationale f or the p s /f ai decision (b sed on the p rf orman e criterion sp cif ied in the

generic, prod ct or prod ct-f ami y stan ard, or agre d b twe n the man f acturer an the

purc aser)

Annex A

(inf ormativ )

Measurement uncertainty of the power

spectral density test level

An ex A gives information related to me s rement u certainty (MU) of the p wer sp ctral

den ity generated by the test in trumentation ac ordin to the p rtic lar ne d of the test

method contained in the main b d of the stan ard Further information a out MU can b

f ou d in [1, 2 an 3]

1

An ex A f oc ses on the u certainties f or level setin as an example an s ows how an

u certainty bu get can b pre ared b sed b th up n the me s rement in trumentation

u certainty an the p wer sp ctral den ity test level set in proced re des rib d in 6.4

The s bject of An ex A is the evaluation of MU of the injected p wer set in the case of 10 Ω

EUT imp dan e, as req ired by the test level setin proced re in 6.4 The analy is of non

-re rod cibi ty is ues, related to tests made by dif f erent la oratories on the same EUT are not

in the s o e of An ex A

A.2 Uncertainty budgets f or test methods

A.2.1 Ge eral s mbols

The general s mb ls that a p ar in Ta le A.1 an l sted b low are a s bset of those def i ed

y is the res lt of a me s rement, ( he estimate of the me s ran ), cor ected for al

recog ized sig if i ant s stematic ef fects;

u

c

(y) is the (combined) stan ard u certainty of y;

U(y) is the exp n ed u certainty of y;

k is the coverage f actor

A.2.2 Def inition of the me s ra d

The me s ran is the p wer sp ctral den ity SD as def i ed in Clau e 5 an s p l ed to a

10 Ω lo d throu h the EUT p rt of the CDND

A.2.3 MU contributors of th me s ra d

The f ol owin in uen e diagram in Fig re A.1 gives examples of in uen e q antities up n the

p wer sp ctral den ity test level It s ould b u dersto d that the diagram is not ex au tive

The most imp rtant contributors f rom the in uen e diagram have b en selected f or the

u certainty bu get calc lation example s own in Ta le A.1 At le st these contributors l sted

in Ta le A.1 s al b u ed f or the calc lation of MU in order to o tain comp ra le bu gets f or

dif ferent test sites or la oratories It is noted that a la oratory may in lu e ad itional

contributors (for example, Typ A) in the calc lation of the MU, on the b sis of its p rtic lar

circ mstan es

Figure A.1 – Ex mple of inf lue c s upon th power

spe tral de sity te t le el u ing a CDND

A.2.4 Input q a titie a d c lc lation e ample for e pa de unc rtainty

The examples b low as ume the same in trumentation u ed in the p wer sp ctral den ity

level set in proced re is u ed f or generatin the p wer sp ctral den ity test level ( he

me s rement set-up for the p wer sp ctral den ity level setin is that de icted in Fig re 1 ),

ex e t f or the me s rin in trument ( hermocouple p wer meter plu tran f ormer j g), whic

is a sent d rin the test

Therefore the level of the p wer sp ctral den ity generated d rin the test wi b af f ected by

the same u certainty that af fects the p wer sp ctral den ity generated in the level set in

proces The contribution to me s rement u certainty d e to non- e e ta i ty (e.g cau ed

by drif t of the me s rin in trumentation) is taken into ac ou t

Ta le A.1 gives an example of an u certainty bu get for p wer sp ctral den ity level setin

The model f un tion f or the CDND p wer sp ctral den ity SD generated in the level setin pro

ces (al q antities in logarithmic u its) is:

SD = PM

r– IL – ∆B + PM

c l+ FL

G+ FL + R

is the cor ection f or flatnes of the test generator (6.3.2);

FL is the cor ection f or f latnes of the test in trumentation c ain b twe n the test

Unit c

iu

i(y)

Unitu

i(y)2

2,0

Combin d u c rt aint y u(y)=√Σu

i(y)2

It is the re din of the thermocouple p wer meter The u certainty of the re din is

d e to the resolution of the display an in ta i ty of the re din itself

IL It is the in ertion los of the tran f ormer j g as me s red ac ordin to the proced re

des rib d in clau e 6.3.3 The me s rement u certainty of IL is originated f rom the

inac urac of the network analy er an f rom the common mode c r ent circ latin in

the me s rement set-up Flatnes of IL is ac ou ted by the term FL (se b low)

∆B It is the f req en y b n oc upied by the test sig al The u certainty of this term is

originated from the f req en y inac urac of the test generator

PM

c l

It is the cal bration f actor of the p wer meter Its u certainty is re orted in the

cal bration certif i ate of p wer meter It is recommen ed that cal bration u certainty,

non-lne rity, an drif t are taken into ac ou t when calc latin the combined

u certainty of this term It is as umed that the cal bration f actor remain es ential y

con tant within the test f req en y b n If cal bration factor variation within the test

f req en y b n can ot b neglected, the cor esp n in u certainty contribution wi

b calc lated an in orp rated

FL

G

It is the cor ection f or the f latnes of the test generator (se 6.3.2) Its exp cted

value is 0 dB, an its up er an lower l mits can b o tained from me s rement or

sp cif i ation, if avai a le

FL It is the cor ection f or the f latnes of the test in trumentation c ain b twe n the test

generator output p rt an the EUT p rt of the CDND Its exp cted value is 0 dB, an

its up er an lower l mits can b o tained from the in ertion los me s rement

des rib d in 6.3.4

R It is the cor ection f or non- e e ta i ty of the me s rement set-up an test

in trumentation Its exp cted value is 0 dB an its stan ard deviation is evaluated

throu h several an in e en ent re etition of the level set in proces Re etition

s ould b con eived so that the main cau es of non- e e ta i ty are detected, s c

as en ironmental c an es ( emp rature an h midity), ca le con ectors, drif t of

electronic in trumentation, dif f erent o erators, an dif f erent layout

A.3 Expression of the calculated measurement uncertainty a d its appl c tion

MU is calc lated in logarithmic u its to make it homogene u with the u certainty

contribution to p wer sp ctral den ity test level u certainty (e.g p wer meter ampl tu e

sp cif i ation an ada ter in ertion los calbration) u ual y expres ed in dB Hen e, the b st

estimate s al also b expres ed in logarithmic u its (e.g dBm/Hz)

The p wer sp ctral den ity s al b re orted in terms of the b st estimate an its exp n ed

u certainty

An example of the presentation of me s rement u certainty is given in the example b low:

In logarithmic u its:

SD = – 9,3 dBm/Hz ± 2,8 dB

This cor esp n s, in l ne r s ale, to:

SD = 1 ,7 nW/Hz + (3 %) – (4 %)

The calc lated MU may b u ed f or a variety of purp ses, for example as in icated by

prod ct stan ard or for la oratory ac reditation It is not inten ed that the res lt of this

calc lation b u ed f or adju tin the test level that is a pl ed to EUTs d rin the test proces

Annex B

(inf ormativ )

Rationale f or the selection of the pref er ed broadband source –

Inf ormation on test signal generation

This stan ard def i es a b n -l mited bro db n sig al as test sig al Ban -l mited bro db n

sig als can b generated in dif f erent way In cases where the immu ity to sig als prod ced

by switc ed-mode p wer s p les an simi ar a pl an es is evaluated, an impulsive sig al

may b adeq ate For commu ication s stems (e.g p werl ne commu ication) as disturb n e

source, an orthogonal f req en y-division multiplexin (OFDM) s heme se ms to b more

a pro riate In the f req en y domain (without takin the phase an le into con ideration), the

sig als lo k q ite simi ar, but in the time domain they dif f er sig if i antly An ex B gives some

g idan e on the re lzation of b n -l mited bro db n sig als an explain wh a (ph sical)

ran om noise sig al is selected as pref er ed sig al Furthermore, the material may b helpful

in cases where sp cif i EMC pro lems ne d to b evaluated on the b sis of sig als more

re resentative of the re l disturb n e source

B.2 Principles of band-l mited broadband signal generation

B.2.1 Ge eral

The examples given here are not ex au tive, but explain the prin iples of bro db n sig al

generation

Thre b sic prin iples for b n -l mited bro db n sig al generation can b distin uis ed:

• u e of a wide b n sig al generator an l mitation of the f req en y b n by an at ac ed

b n p s f ilter (ph sical noise, pseu o noise);

• u e of an impulse generator with an a pro riate pulse s a e;

• generation of a sig al whic intentional y contain only f req en ies within a certain

f req en y b n (OFDM s heme)

B.2.2 (True) ra dom nois ge eration

True ran om noise generation makes u e of a white noise source (e.g s ot noise in a

semicon u tor diode) For b n l mitation, a b n p s f ilter restricts the sp ctral content of

the noise generator output to the req ired f req en y b n (se Fig res B.1a) an B.1b) The

f ilter c aracteristic determine the cre ted sig al sp ctrum Hig order f ilters ne d to b

re l zed in order to f ulf il the req irements f or the slo es at the l mitin freq en y ed es

Figure B.1a) − Principle of tru ran om n is generatio

Th b n width/fiter c ara teristic d p n o th re uireme ts for th slo e giv n in th main b d of this

sta d rd

Figure B.1b) − E ample of a ban -lmited ran om n is sig al

Figure B.1 – White nois sourc

B.2.3 Ps udo-ra dom nois s qu nc

The true ran om noise source can b re laced by a ran om n mb r seq en e uplo ded into

the memory of an arbitrary wavef orm generator (AWG) To al ow an e sier implementation of

the b n f ilter the sample seq en e can b precon itioned Th s, only an anti-alas f ilter is

ph sical y ne ded at the AWG output (se Fig re B.2) The desig of this f ilter is not as

deman in as for the true ran om noise generation, when a s ff iciently large sampl n

f req en y of the AWG is selected The ed e f req en y of the anti-al as f ilter is u ual y half of

the sampl n freq en y

IEC Nois s urc Ba d a s f ilter

Figure B.2 – Principle of ba d-l mite broa ba d sign l

ge eration with a arbitrary wa ef orm ge erator

L t s(t ) b the seq en e of ran om n mb rs This sig al is freq en y in e en ent (at le st in

a f req en y interval up to half of the sampln f req en y) an can b expres ed in the

f req en y domain as S(ω) The f ilterin can b made in the f req en y domain by multiplyin

S(ω) with a filter c aracteristic H

F(ω) A rectan ular f un tion H

n(ω) in the freq en y domain:

)(

n

nH

ωω

ω

(B.1)

cor esp n s to the fun tion h

n(t ) in the time domain:

)sinc ()

h

nn

x

)sin(

1

→H

1(ω)

an the up er b rder freq en y f

2(→ω

2

→H

2ω) is:

)()()(

12

ωω

sinc ()

(

11

22

tt

th

ω

π

ω

(B.5)

The a pl cation of the f ilter to the ran om n mb r seq en e in the f req en y domain

cor esp n s to a multipl cation In the time domain, it b comes a con olution o eration:

)()()

If this seq en e g( ) is lo ded into the memory of an AWG, the cor esp n in sp ctrum is the

sp ctrum def i ed in the main p rt of the stan ard

(AWG)

Fig re B.3 s ows the sp ctrum me s red with a me s rement receiver (AV detector, 12 kHz

resolution b n width, f req en y ste 5 kHz) for a sig al generated with an AWG with the

Figure B.3 – Signal spe trum of a ba d-l mite ps udo-ra dom nois sign l

(me s re with a 12 kHz re olution ba dwidth)

An extract of the output in the time domain is s own in Fig re B.4

IEC

0

0

1023456789

Figure B.4 – Extra t of the ba d-l mite ps udo nois signal

in time domain (me s re with a os i los ope)

It has to b con idered that some of the AWGs avai a le on the market do not have a bui t-in

anti-al as filter In that case, mir or freq en ies wi s ow up at the hig er f req en y en of

the sp ctrum (se Fig re B.5) To avoid these sp ctral comp nents, an external anti-al as

–0,2 –0,3

IEC

2 0

0 0

1023456789

There is another dif f eren e to the ph sical y prod ced noise sig al des rib d in B.2.2 Sin e

the len th of the sampl n seq en e is f i ite, ran om p riod s ould contain more than

(2

15

-1) samples, an the same seq en e s ould b s c es ively re e ted by the generator in

order to prod ce a contin ou sig al Mathematicaly, this can b des rib d by con olution of

the sampl n sig al with a f i ite len th an a comb sig al In the f requen y domain, this

me n a multiplcation b twe n the sig al sp ctrum o tained for the sin le seq en e an a

f req en y comb, whic yield a comb sp ctrum The comb freq en y cor esp n s to the

len th of the seq en e With a seq en e len th of 5 0 µs, a comb with a freq en y sp cin

of 2 kHz wi oc ur (se Fig re B.6)

Figure B.6 – Extra t of the signal spe trum of a ba d-l mite

ps udo nois sig al (me s re with a 2 0 Hz re olution ba dwidth)

B.2.4 Impuls

Another way to prod ce a bro db n sig al is the direct u e of the sin -impulse (se

Eq ation (B.5) The sp ctrum o tained with the p rameters: