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Tiêu đề Electromagnetic Compatibility (EMC) – Transfer Impedance and Screening Attenuation of Feeds through and Electromagnetic Gaps – Double Coaxial Test Method
Trường học International Electrotechnical Commission
Chuyên ngành Electrical and Electronic Standards
Thể loại Standards Document
Năm xuất bản 2015
Thành phố Geneva
Định dạng
Số trang 32
Dung lượng 1,18 MB

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10 Fig re 5 – Cros -section of the test fixture with an electromag etic gas et... 2 Fig re C.2 – Eq ivalent circ its of the double co xial test set-up... META LLIC COMMUNICA TION CA BLE

Trang 1

IEC 621 53- 4- 1 0

Editio 2.0 2 15-1

Met al ic communicat ion cable t est met hods –

Part 4- 10: Elect romagnet ic compat ibi ity (EMC) – Transfer impedance and

screening at t enuat ion of feed- t hroughs and elect romagnet ic gask et s – Double

coax ial t est met hod

Trang 2

THIS PUBLICATION IS COPYRIGHT PROTECTED

Copyr ight © 2 15 IEC, Ge e a, Switzer la d

Al rig ts r es r ve Unle s oth rwis s e ifi d, n p rt of this p blc tio ma b r epr od c d or uti z d in a y form

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y ur lo al IEC memb r Natio al Commite for ur th r informatio

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If y ou wis to giv e u your fe d a k o t his p blc tio or

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Trang 3

IEC 621 53- 4- 1 0

Edit io 2.0 2 15-1

Met al ic communicat ion cable t est met hods –

Part 4- 10: Elect romagnet ic compat ibi ity (EMC) – Transfer impedance and

screening at t enuat ion of feed- t hroughs and elect romagnet ic gask et s – Double

coax ial t est met hod

Trang 4

FOREWORD 4

1 Sco e 6

2 Normative ref eren es 6

3 Terms an def i ition 6

4 Prin iple of the test method 9

5 Proced re 12 5.1 Eq ipment 12 5.2 Dy amic ran e 12 5.3 Verification of the test set-up 12 5.4 Sample pre aration 12 6 Me s rement 1

2 6.1 General 12 6.2 Scre nin at en ation 12 6.3 Tran f er imp dan e 12 7 Expres ion of res lts 1

3 7.1 Tran f er imp dan e 13 7.2 Scre nin at en ation 13 7.3 Req irements 13 An ex A (inf ormative) Bac grou d for the me s rement of the s ieldin ef fectivenes of e d-throu h an electromag etic gas ets 14 A.1 General 14 A.2 The retical model of the test proced re 15 A.3 Per ormin me s rements 16 A.3.1 Characteristic impedan e u iformity of the test fixture 16 A.3.2 Me s rin EMI-gas ets by u in a NWA 16 A.3.3 Pictures an me s rement res lts 17 An ex B (inf ormative) Ref eren e device f or verification me s rement 2

B.1 General 2

B.2 Desig of the referen e device 2

B.3 Verification me s rement res lt 2

An ex C (inf ormative) Imp ct of grou d lo ps on low f req en y me s rements 2

C.1 General 2

C.2 Analy is of the test set-up 2

Biblogra h 2

Fig re 1 – A two-p rt 7

Fig re 2 – Eq ivalent circ it of the test set-up an definition of Z 7

Fig re 3 – Cros -section of a typical f eed-throu h config ration 10 Fig re 4 – Cros -section of the test f i ture with a con ector 10 Fig re 5 – Cros -section of the test fixture with an electromag etic gas et 1

Fig re A.1 – Cros -section of a typical fe d-throu h config ration 14

Fig re A.2 – Cros -section of the test f i ture with a con ector 15

Fig re A.3 – Eq ivalent circ it of the test setup with the s u t admitan e y of the

f eed-throu h 15

Trang 5

Fig re A.4 – TDR ste resp n e at input-p rt of test fixture 16

Fig re A.5 – View of the test fixture con ected to a network analy er 18

Fig re A.6 – To view of the test fixture 18

Fig re A.7 – Detai ed view of the contact are 18

Fig re A.8 – Detai ed view of the ca tivation f or the con u tive O- in test 19

Fig re A.9 – Isolation of the network analy er 2

Fig re A.10 – Isolation of the test f i ture when c aracterizin an ide l s ort (metal plate) 2

Fig re A.1 – Me s red o erational s re nin tran mis ion when c aracterizing a typical cond ctive O- in 21

Fig re A.12 – Tran fer imp dan e Z of a typical con u tive O- in 21

Fig re A.13 – Scre nin at en ation a of a typical con u tive O- in 2

Fig re B.1 – Referen e device, e.g resistors soldered onto a PCB 2

Fig re B.2 – Typical verification me s rement res lt 2

Fig re C.1 – Double co xial test set-up 2

Fig re C.2 – Eq ivalent circ its of the double co xial test set-up 2

Fig re C.3 – Res lts o tained with (gre n) an without f er ites on the test le d (blue) 2

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INTERNATIONAL ELECTROTECHNICAL COMMISSION

_

Part 4-10: Electromagnetic compatibi ity (EMC) – Transfer impedance

and screening at enuation of feed- hroughs and electromagnetic

gaskets – Double coaxial test method

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

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th later

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p te t rig ts IEC s al n t b h ld re p n ible f or id ntif yin a y or al s c p te t rig ts

International Stan ard IEC 6 15 -4-10 has b en pre ared by IEC tec nical commit e 4 :

Ca les, wires, waveg ides, R.F con ectors, R.F an microwave p s ive comp nents an

ac es ories

This secon edition can els an re laces the f irst edition publ s ed in 2 0 It con titutes a

tec nical revision

The main tec nical c an es with regard to the previou edition are as f ol ows:

– ad ition of a new clau e that des rib s a proced re f or verification of the me s rement

set-up an further inf ormation regardin sample pre aration;

– ad ition of a new An ex that des rib s how to improve me s rement certainty in the very

low f eq en y are

The text of this standard is b sed on the f ol owin doc ments:

Trang 7

FDIS Re ort o v tin

Ful inf ormation on the votin f or the a proval of this stan ard can b foun in the re ort on

votin in icated in the a ove ta le

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts of the IEC 6 15 series, u der the general title: Metal l ic c mmu ic t ion

c ble t est methods, can b f ou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

• recon rmed,

• with rawn,

• re laced by a revised edition, or

A bi n ual version of this publcation may b is ued at a later date

IMPORTANT – The 'colour inside' logo on the cov r pa e of this publ c tion in ic te

that it contains colours whic are consid re to be us f ul f or the cor e t

understa din of its conte ts Us rs s ould th ref ore print this doc me t using a

colour printer

Trang 8

META LLIC COMMUNICA TION CA BLE TEST METHODS –

Part 4-10: Electromagnetic compatibi ity (EMC) – Transfer impedance

and screening at enuation of feed- hroughs and electromagnetic

gaskets – Double coaxial test method

This p rt of IEC 6 15 detai s a co xial method s ita le f or determinin the tran fer

imp dan e an /or s re nin aten ation of f eed-throu h an electromag etic gas ets

The s ielded s re nin aten ation test set-up ac ordin to IEC 6 15 -4-4 ( riaxial method)

has b en modif ied to take into ac ou t the p rtic larities of fe d-throu h an gas ets

A wide dy amic an f req en y range can b a pled to test even s p r s re ned

f eed-throu h an gas ets with normal in trumentation fom low f req en ies up to the l mit of

defined tran versal waves in the co xial circ its at a proximately 4 GHz

The f ol owin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a ples For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

operational (Betriebs) s at ering parameter

21S

q otient of the ref lected s uare ro t of p wer wave fed into the referen e imp dan e of the

output of the two-p rt an the u reflected s uare ro t of the p wer wave con umed at the

input of the two-p rt

EX MPLE (s e Fig re 1

Trang 9

A

U

1Z1

IEC

Key

E

1, E

1, Z

2

imp d n e at in ut a d o tp t, re p ctiv ly

U

1, U

12

0i1r2

EU

VV

b twe n the primary an secon ary circ it

EX MPLE Th tra sf er imp d n e of a ele tric ly s ort s re n is d f i e a th q otie t of th o e circ it

o

o, l

T

IU

(1)

Trang 10

1log2

T

10T

Z

Z

(2)

3.3

operational (Betriebs) at e uation

the q otient of the u ref lected s uare ro t of p wer wave fed into the referen e imp dan e of

the input of the two-p rt an the s uare ro t of the p wer wave con umed by the lo d of the

two-p rt expres ed in dB an radian

logarithmic ratio of the in ident (u reflected) s uare ro t of p wer wave fed into the nominal

imp dan e of the primary circ it of the test set-up an the p riodic maximum values of the

s uare ro t of p wer wave

r2V

, macoupled into the secon ary circ it of the test set-up when

10s

Ω

15

lo2En

Min

Ω

15

lo2

En1

lo2

Ω

15

lo2En

lo2

ZA

ZS

ZV

V

a

×+

=

=

×+

×

=

=

×+

15 Ω is th sta d rdiz d imp d n e of th s c n ary (o ter” or disturb d) circ it

Th s re nin ate u tio , e pre s d in dB of a ele tric ly s ort d vic is:

T

10s

Ω50

log2

ZZ

15 Ω≈ ×Z , th n

T

10s

32

Ω

15

log2

Za

×

×

T10s

Ω5

log2

Trang 11

3.5

de ic und r te t

DUT

con ector’s b d or s re n, inten ed to b mou ted to a s ieldin or s re nin wal (or b x),

or an electromag etic gas et

3.6

tria ial te t method

method for me s rin the tran fer imp dan e an s re nin at en ation of p s ive

tran mis ion comp nents lke ca les an con ectors in an triaxial ar an ement

Note 1 to e try: Primariy u e for c mp n nts with elo g te dime sio s a d th refore distrib te c u ln o er

th tra sfer imp d n e alo g th c mp n nts

Se als IEC T 6 15 -4-

3.7

double coa ial te t method

method for me s rin the tran f er imp dan e an s re nin at en ation of p s ive

tran mis ion comp nents lke con ector f eed-throu h an electro mag etical gas ets in an

cas aded ar an ement

Note 1 to e try: Primariy u e f or s ort c mp n nts with c n e trate tra sf er imp d n e

Se als IEC T 6 15 -4-

4 Principle of the test method

Fig re 3 s ows a typical fe d-throu h con tru tion where a co xial con ection is brou ht into

a s re ned hou in to a printed circ it b ard Imp rtant are the co xial con ector b d ’s an

electromag etic gas et’s rel a le con ection to the s re nin or s ieldin b x

The electromag etic tig tnes of a con ector b d ’s mou tin or a gas et is me s red as

tran fer imp dan e an /or s re nin aten ation

The test set-up con ists of two RF-tig t co xial s stems se arated by a metal c wal to whic

the DUT is mou ted The fe d-throu h test set-up is s own in Fig re 4 The gas et test

set-up is s own in Fig re 5 Here the gas et is pres ed b twe n two metal c plates

The nominal impedan es of b th sides of the co xial fixture s ould b the same as that of the

test eq ipment The generator side is caled the primary circ it or in er circ it an the

receiver side is cal ed the secon ary circ it or outer circ it

The set-up is the same for me s rin the tran fer imp dan e an the s re nin aten ation

An ex A gives a the retical model of the test set-up Useful inf ormation con ernin the triaxial

me s rement tec niq e is given in [3]

Trang 12

Printe circ it b ard

Figure 3 – Cros -s ction of a typic l f ee - hroug config ration

Trang 13

Primary circ it Se o d ry c irc it

s p ort (met al)

In te t rig d sig , c re s al b ta e th t th disturbin c r e t in th primary circ it c n ot c u e u wa te

tra sitio v lta e in th me s rin s c n ary circ it Se arate v lta e a d c re t “c nta ts” are a mu t

On s o ld n t e d in a situ tio wh re tra sitio or c nta t re ista c s of th te t rig influ n e th te t re ults

Sp cial c re s al b ta e to d sig th mo ntin of th te t plate b twe n th primary a d s c n ary circ its or

s stems Fig re 5 s ows h w to a oid brin in th tra sitio re ista c b twe n th mo ntin plate a d primary

circ it into th disturbin v lta e me s reme t circ it forme b th s c n ary circ it of th te t s stem

It is imp rta t th t th c u le v lta e is me s re with ut a y disturbin e tra c u ln v lta e n t c min fom

th g s et u d r te t (c mp re with Fig re 4)

Figure 5 – Cros -s ction of the te t fixture with a ele troma netic ga k t

Trang 14

5 Procedure

5.1 Equipme t

The test fixture set-up is s own in Fig res 3, 4 an 5 an con ists of the f olowin :

– a double co xial test fixture where the sides are se arated by metal c wal /wal s f or

mou tin of the DUT (Fig re 4) (fe d-throu h) or the gas et pres ed b twe n two plates,

the f irst one b lon ing to the centre con u tor an primary circ it an the secon one to

the outer con u tor an secondary circ it, Fig re 5;

– the RF-tig t double co xial, test fixture whic s ould have pref era ly a diameter s c that

the c aracteristic imp dan e to the outer tub is 5 Ω resp ctively the nominal imp dan e

of the network analy er or generator an receiver;

– a sig al generator with the same c aracteristic imp dan e as the test f i ture with the

mou ted DUT or an imp dan e matc in ada ter, completed with a p wer amplfier if

neces ary f or very hig s re nin at en ation;

– a receiver with a cal brated ste aten ator or a network analy er (NWA)

NOT Th g n rator a d th re eiv r ma b in lu e in a n twork a aly er

5.2 Dy amic ra ge

The d namic ran e (noise f lo r) of the test setup s al b tested by re lacin the DUT by a

sol d metal c plate

5.3 Verif ic tion of the te t s t up

In order to verify the pro er f un tion of the a pl ed in trumentation an the calc lation of the

tran fer imp dan e ac ordin to 7.1, it is recommen ed to do a verification me s rement by

u e of a ref eren e device with k own c aracteristic An example desig of s c a device is

given in An ex B

5.4 Sample preparation

The f eed-throu h con ector or gas et s al b mou ted into the fixture ac ordin to the

man facturer’s in tru tion The sp cif i ation of the a pl ed contact zones is of p rtic lar

interest sin e this def i es the contact resistan e as an integral p rt of the tran fer imp dan e

of the DUT Deviatin test f i ture contact c aracteristic wi res lt in variation of the

me s red tran f er imp dan e an s re nin aten ation, resp ctively

A with the f eed-throug con ector mou ted to the plate or the

gas et in erted is me s red an recorded v feq en y

The o erational at en ation of the fe d-throu h or gas et is then:

ZAAA

6.2 Scre ning at e uation

Se 3.4

6.3 Tra sf er impe a c

Se 3.2

Trang 15

7 Expres ion of results

7.1 Tra sf er impe a c

2o

T

oB21o

A

Z

Z

ZHZS

Z is the nominal c aracteristic imp dan e of the primary an secon ary circ its, eq al to

the imp dan e of the generator an receiver

NOT Co trary to th me s reme t of th tra sf er imp d n e of c ble s re n , th tra sfer imp d n e of th

c n e tor is n t relate to le gth

7.2 Scre ning at e uation

The s re nin aten ation

s

a has to b normal zed to the agre d stan ard con ition where

the imp dan e of the “outer world” or secon ary circ it is

SZ

= 15 Ω:

oS

10B21

s

15Z

log

10

Min.En

ZA

a

=

×+

the me s red values in dB (se 7.1);

o

Z is the c aracteristic imp dan e of the fixture in Ω

NOT At f re u n ie hig er th n th lmit of th ele tric ly s ort f ee -thro g th me s reme t, re ults wi b

simiar to s re nin ate u tio me s reme t of a lo gtra smis io ln

7.3 Re uireme ts

The res lts of the tran fer imp dan e an /or the s re nin at en ation s al comply with the

value in icated in a relevant sp cification

Trang 16

Annex A

(inf or mative)

Background for the measurement of the shielding effectiveness

of feed- hroughs and electromagnetic gaskets

A ref eren e f or the me s rement of the s ieldin or s re nin eff ectivenes of fe d-throu h

an electromag etic gas ets is given in [1] The f ol owin is an ex erpt of the main is ues of

this p p r as wel as ad itional information regardin the practical me s rement, the detai s

of DUT ca tivation an the o tained res lts

The pro er fu ction of modern commu ication eq ipment is stron ly in uen ed by the pro er

EMI s ieldin of electrical comp nents Fe d-throu h can contribute sig ificantly to the

overal EMI level of commu ication eq ipment A cros -section of the typical config ration of

a fe d-throu h is s own in Fig re A.1 The con ector b dy is soldered onto the circ it b ard

an th s electrical y con ected to the grou d p tential of the electrical circ itry

At hig er f req en ies, the p tential of the circ it b ard’s grou d plane is u ual y not eq al to

that of the s ieldin b x A contact sprin s ort-circ its this p tential diferen e If the contact

sprin were not present in the setup of Fig re A.1, ex es ive radiation of electromag etic

waves alon the ca le’s outer con u tor would b the res lt

Figure A.1 – Cros -s ction of a typic l fe d- hroug conf iguration

It is u ual y a very time-con umin tas to evaluate the s ieldin or s re nin ef fectivenes of

a f eed-throu h in a test config ration as is recommen ed in CISPR 2 [4] The me s rement

setups that are des rib d therein are general y b sed on some kin of f re sp ce

me s rement, whic req ires an anec oic c amb r

The introd ction of wel -defined electrical y con u tin b u daries in a test f i ture would

gre tly simpl fy the me s rement proced re

This is p s ible by a pl cation of a co xial test setup A cros -section view of the test fixture

is s own in Fig re A.2 The section to the left of Fig re A.2 re resents the in er of a

comp nent A sig al is f ed to the outer con u tor of the con ector u der test by me n of the

co xial l ne’s in er con u tor The amou t of RF-le kage that can b detected on the

o p site side of the s ieldin wal is pic ed up by the centre con u tor of the co xial l ne to

the rig t In the case of a two-p rt o erational s at erin (S

21

p rameter or o erational

f orward tran fer f un tion me s rement, where the two p rts of the network analy er are

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