Iec 61000 4 9 2016

CWG Combination wave generator EFT/B Electrical fast tran ientburst ESD Electrostatic dis harge The fol owin tests are inten ed to demon trate the immu ity of eq ipment when s bjected to

Elect romagnetic compat ibi ity (EMC) –

Part 4- 9: Test ing and measurement t echniques – Impulse magnetic field

immunit y test

Partie 4- 9: Techniques d'essai et de mesure – Essai d'immunit é au champ

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Electromagnetic compatibi it y (EMC) –

Part 4- 9: Test ing and measurement t echniques – Impulse magnet ic field

immunity t est

Partie 4- 9: Techniques d'essai et de mesure – Essai d'immunit é au champ

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CONTENTS

FOREWORD 5

INTRODUCTION 7

1 Sco e an o ject 8

2 Normative ref eren es 8

3 Terms, def i ition an a breviated terms 9

3.1 Terms an def i ition 9

3.2 Ab reviated terms 10 4 General 1

5 Test levels 1

6 Test in trumentation 12 6.1 General 12 6.2 Combination wave generator 12 6.2.1 General 12 6.2.2 Perf orman e c aracteristic of the generator 13 6.2.3 Cal bration of the generator 13 6.3 In u tion coi 14 6.3.1 Field distribution 14 6.3.2 Characteristic of the stan ard in u tion cois of 1 m × 1 m an 1 m × 2,6 m 14 6.4 Cal bration of the test s stem 14 7 Test setup 15 7.1 Test eq ipment 15 7.2 Verif i ation of the test in trumentation 16 7.3 Test setup for impulse mag etic f ield a pl ed to a ta le-to EUT 16 7.4 Test setup for impulse mag etic f ield a pl ed to a f lo r stan in EUT 17 7.5 Test setup for impulse mag etic f ield a pl ed in-situ 18 8 Test proced re 19 8.1 General 19 8.2 L b ratory ref eren e con ition 19 8.2.1 Cl matic con ition 19 8.2.2 Electromag etic con ition 19 8.3 Exec tion of the test 19 9 Evaluation of test res lts 2

10 Test re ort 2

An ex A (informative) Characteristic of non stan ard in u tion coi s 2

A.1 General 2

A.2 Determination of the coi f actor 2

A.2.1 General 2

A.2.2 Coi factor me s rement 2

A.2.3 Coi factor calc lation 23 A.3 Mag etic f ield me s rement 23 A.4 Verif i ation of non stan ard in u tion coi s 2

An ex B (informative) Inf ormation on the field distribution of stan ard in u tion coi s 2

B.1 General 2

B.3 1 m × 2,6 m in u tion coi with ref eren e grou d plane 2

B.4 1 m × 2,6 m in u tion coi without referen e grou d plane 2

An ex C (informative) Selection of the test levels 2

An ex D (informative) Me s rement u certainty (MU) con ideration 31

D.1 General 31

D.2 L gen 31

D.3 Un ertainty contributors to the s rge c r ent an to the s rge mag etic f ield me s rement u certainty 3

D.4 Un ertainty of s rge c r ent an s rge mag etic field cal bration 3

D.4.1 General 3

D.4.2 Front time of the s rge c r ent 3

D.4.3 Pe k of the s rge c r ent an mag etic field 3

D.4.4 Duration of the c r ent impulse 3

D.4.5 Further MU contribution to time me s rements 3

D.4.6 Rise time distortion d e to the lmited b n width of the me s rin s stem 3

D.4.7 Impulse p ak an width distortion d e to the l mited b n width of the me s rin s stem 3

D.5 Ap l cation of u certainties in the s rge generator compl an e criterion 3

An ex E (informative) Mathematical model n of s rge c r ent waveforms 3

E.1 General 3

E.2 Normal zed time domain c r ent s rge (8/2 µs) 3

An ex F (informative) Characteristic u in two stan ard in u tion coi s 4

F.1 General 4

F.2 Partic lar req irements for cal bration 4

F.3 Field distribution of the double in u tion coi ar an ement 4

An ex G (informative) 3D n merical simulation 4

G.1 General 4

G.2 Simulation 4

G.3 Comments 4

Bibl ogra h 5

Fig re 1 – Simpl f ied circ it diagram of the combination wave generator 12 Fig re 2 – Wavef orm of s ort-circ it c r ent (8/2 µs) at the output of the generator with the 18 µ ca acitor in series 13 Fig re 3 – Example of a c r ent me s rement of stan ard in u tion cois 14 Fig re 4 – Example of test setup f or ta le-to eq ipment s owin the vertical orthogonal plane 17 Fig re 5 – Example of test setup f or flo r stan in eq ipment s owin the horizontal orthogonal plane 17 Fig re 6 – Example of test setup f or flo r stan in eq ipment s owin the vertical orthogonal plane 18 Fig re 7 – Example of test setup u in the proximity method 18 Fig re A.1 – Rectan ular in u tion coi with sides a + b an c 23 Fig re A.2 – Example of verif i ation setup for non stan ard in u tion cois 2

Fig re B.1 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-y plane f or the 1 m × 1 m in u tion coi 2

Fig re B.2 – + dB an – dB isol nes f or the mag etic f ield stren th (mag itu e) in

the x-z plane f or the 1 m × 1 m in u tion coi 2

Fig re B.3 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-z plane f or the 1 m × 2,6 m in u tion coi with ref eren e grou d plane 2

Fig re B.4 – + dB an -3 dB isol nes f or the mag etic field stren th (mag itu e) in the x-y plane f or the 1 m × 2,6 m in u tion coi with ref eren e grou d plane 2

Fig re B.5 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-y plane f or the 1 m × 2,6 m in u tion coi without ref eren e grou d plane 2

Fig re B.6 – + dB an – dB isol nes f or the mag etic f ield stren th (mag itu e) in the x-z plane f or the 1 m × 2,6 m in u tion coi without ref eren e grou d plane 2

Fig re E.1 – Normal zed c r ent s rge (8/2 µs): Width time resp n e T w 4

Fig re E.2 – Normal zed c r ent s rge (8/2 µs): Rise time resp n e T r 4

Fig re E.3 – Cur ent s rge (8/2 µs): Sp ctral resp n e with ∆f= 10 kHz 41

Fig re F.1 – Example of a test s stem u in double stan ard in u tion coi s 4

Fig re F.2 – + dB isol ne f or the mag etic field stren th (mag itu e) in the x-y plane f or the double in u tion coi ar an ement (0,8 m sp ced) 4

Fig re F.3 – + dB an – dB isolnes f or the mag etic f ield stren th (mag itu e) in the x-z plane f or the double in u tion coi ar an ement (0,8 m sp ced) 4

Fig re G.1 – Cur ent an H-f ield in the centre of the 1 m × 1 m in u tion coi 4

Fig re G.2 – Hx-f ield alon the side of 1 m × 1 m in u tion coi in A/m 4

Fig re G.3 – Hx-field in direction x p rp n ic lar to the plane of the 1 m × 1 m in u tion coi 4

Fig re G.4 – Hx-field alon the side in dB f or the 1 m × 1 m in u tion coi 4

Fig re G.5 – Hx-field alon the diagonal in dB f or the 1 m × 1 m in u tion coi 4

Fig re G.6 – Hx-field plot on y-z plane f or the 1 m × 1 m in u tion coi 4

Fig re G.7 – Hx-field plot on x-y plane f or the 1 m × 1 m in u tion coi 4

Fig re G.8 – Hx-field alon the vertical mid le lne in dB f or the 1 m × 2,6 m in u tion coi 4 Fig re G.9 – Hx-field 2D plot on y-z plane for the 1 m × 2,6 m in u tion coi 5

Fig re G.10 – Hx-f ield 2D plot on x-y plane at z = 0,5 m for the 1 m × 2,6 m in u tion coi 5

Fig re G.1 – Helmholtz setup: Hx-field an 2D plot f or two 1 m × 1 m in u tion coi s, 0,6 m sp ced 51

Fig re G.12 – Helmholtz setup: Hx-field an 2D plot f or two 1 m × 1 m in u tion coi s, 0,8 m sp ced 5

Ta le 1 – Test levels 1

Ta le 2 – Def i ition of the wavef orm p rameters 8/2 µs 13 Ta le 3 – Sp cif i ation of the wavef orm time p rameters of the test s stem 15 Ta le 4 – Sp cif i ation of the wavef orm p ak c r ent of the test s stem 15 Ta le D.1 – Example of u certainty bu get for s rge c r ent f ront time (T f ) 3

Ta le D.2 – Example of u certainty bu get for the p ak of s rge c r ent (I P ) 3

Ta le D.3 – Example of u certainty bu get for c r ent impulse width (T d ) 3

Ta le D.4 – α f actor (se eq ation (D.10) of dif f erent u idirectional impulse resp n es cor esp n in to the same b n width of s stem B 3

Ta le D.5 – β f actor (eq ation (D.14) of the stan ard c r ent s rge waveform 3

Ta le F.1 – Sp cif i ation of the wavef orm p ak c r ent of this test s stem 4

INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 4-9: Testing and measurement techniques –

Impulse magnetic field immunity test

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

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th later

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6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

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p te t rig ts IEC s al n t b h ld re p n ible f or id ntifyin a y or al s c p te t rig ts

International Stan ard IEC 610 0-4-9 has b en pre ared by s bcommite 7 B: Hig

f req en y phenomena, of IEC tec nical commite 7 : Electromag etic comp tibi ty

It f orms Part 4-9 of the IEC 610 0 series It has the statu of a b sic EMC publ cation in

ac ordan e with IEC Guide 10

This secon edition can els an re laces the f irst edition publs ed in 19 3 an Amen ment

1:2 0 This edition con titutes a tec nical revision

This edition in lu es the f ol owin sig if i ant tec nical c an es with resp ct to the previou

edition:

a) new An ex B on in u tion coi f ield distribution;

b) new An ex D on me s rement u certainty;

c) new An ex E on mathematical model n of s rge waveform;

d) new An ex F on c aracteristic u in two stan ard in u tion cois;

Ful inf ormation on the votin f or the a proval of this stan ard can b f ou d in the re ort on

votin in icated in the a ove ta le

This publcation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 610 0 series, publ s ed u der the general title Ele troma n tic

c mp tibility (EMC), can b fou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cifi publ cation At this date, the publ cation wi b

• recon rmed,

• with rawn,

• re laced by a revised edition, or

IMPORTANT – The 'colour in ide' logo on the cov r pa e of this publ c tion indic te

that it contains colours whic are consid re to be u ef ul f or the cor e t

understa ding of its conte ts Us rs s ould theref ore print this doc me t using a

colour printer

Des ription of the en ironment

Clas ifi ation of the en ironment

Mitigation method an devices

Part 6: Ge eric sta dards

Part 9: Mis el a eous

Eac p rt is f urther s bdivided into several p rts, publ s ed either as international stan ard

or as tec nical sp cif i ation or tec nical re orts, some of whic have alre d b en publs ed

as section Others wi b publs ed with the p rt n mb r folowed by a das an a secon

n mb r identif yin the s bdivision (example: IEC 610 0-6-1)

This p rt is an international stan ard whic gives immu ity req irements an test proced res

related to "pulse mag etic field"

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-9: Testing and measurement techniques –

Impulse magnetic f ield immunity test

1 Sc pe and obje t

This p rt of IEC 610 0 sp cif ies the immu ity req irements, test method , an ran e of

recommen ed test levels for eq ipment s bjected to impulse mag etic disturb n es mainly

en ou tered in:

– in u trial in tal ation ,

– p wer plants,

– rai way in tal ation ,

– medium voltage an hig voltage s b-station

The a pl ca i ty of this stan ard to eq ipment in tal ed in dif f erent location is determined by

the presen e of the phenomenon, as sp cif ied in Clau e 4

This stan ard do s not con ider disturb n es d e to ca acitive or in u tive coupln in ca les

or other p rts of the f ield in tal ation Other IEC stan ard de l n with con u ted

disturb n es cover these asp cts

The o ject of this stan ard is to esta l s a common referen e f or evaluatin the immu ity of

electrical an electronic eq ipment when s bjected to impulse mag etic f ield The test

method doc mented in this p rt of IEC 610 0 des rib s a con istent method to as es the

immu ity of an eq ipment or s stem again t a def i ed phenomenon

NOT As d s rib d in IEC Guid 10 , this is a b sic EMC p blc tio f or u e b pro u t c mmite s of th IEC

As als state in Guid 10 , th IEC pro u t c mmite s are re p n ible for d terminin wh th r this immu ity

te t sta d rd is a ple or n t, a d if a ple , th y are re p n ible for d terminin th a pro riate te t le els a d

p rorma c criteria TC 7 a d its s b-c mmite s are pre are to c -o erate with pro u t c mmite s in th

e alu tio of th v lu of p rtic lar immu ity te t le els f or th ir pro u ts

This stan ard def i es:

– a ran e of test levels;

– test eq ipment;

– test setups;

– test proced res

The tas of the des rib d la oratory test is to f i d the re ction of the eq ipment u der test

(EUT) u der sp cif ied o erational con ition to impulse mag etic f ield cau ed by switc in

an l g tnin ef f ects

The f olowin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a pl es For

u dated ref eren es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 0 (al p rts), I ntern tio al Electrotec nic l Vo a ulary (IEV) (avaia le at

3 Terms, def initions and a bre iated terms

set of o eration whic esta ls es, by referen e to stan ard , the relation hip whic exists,

u der sp cified con ition , b twe n an in ication an a res lt of a me s rement

Note 1 to e try: This term is b s d o th "u c rtainty" a pro c

Note 2 to e try: Th relatio s ip b twe n th in ic tio s a d th re ults of me s reme t c n b e pre s d, in

prin iple, b a c lbratio dia ram

Note 1 to e try: This d f i itio is a bre iate fom th e uiv le t d finitio in IEC 610 0-4-5

Note 2 to e try: This n te a ple toth Fre c la g a e o ly

3.1.3

duration

T

d

<s rge c r ent f or 8/2 µs> virtual p rameter def i ed as the time interval b twe n the in tant

at whic the s rge c r ent rises to 0,5 of its p ak value, an then fal s to 0,5 of its p ak value

(T

w), multipl ed by 1,18

a i ty of a device, eq ipment or s stem to p rf orm without degradation in the presen e of an

electromag etic disturb n e

[SOURCE: IEC 6 0 0-161:19 0, 161-01-2 ]

3.1.6

indu tion coi

con u tor lo p of defi ed s a e an dimen ion , in whic a c r ent f lows, generatin a

mag etic f ield of def i ed u if ormity in a def i ed volume

method of a pl cation of the mag etic f ield to the EUT, where a smal in u tion coi is moved

alon the side of the EUT in order to detect p rtic larly sen itive are s

3.1.9

ref ere c groun pla e

flat con u tive s rface whose p tential is u ed as a common ref eren e

tran ient wave of electrical c r ent, voltage or p wer pro agatin alon a lne or a circ it an

c aracterized by a ra id in re se f olowed by a slower decre se

3.1.12

set of interde en ent elements con tituted to ac ieve a given o jective by p rformin a

sp cif ied fun tion

Note 1 to e try: Th s stemis c n id re to b s p rate f rom th e viro me t a d oth r e tern l s stems b a

ima in ry s ra e whic c ts th ln s b twe n th m a d th c n id re s stem Thro g th s ln s, th s stem

is af fe te b th e viro me t, is a te u o b th e tern l s stems, or a ts its lf o th e viro me t or th

e tern l s stems

3.1.13

tra sie t, adjective an nou

p rtainin to or desig atin a phenomenon or a q antity whic varies b twe n two

con ec tive ste d states d rin a time interval s ort comp red to the time s ale of interest

[SOURCE: IEC 6 0 0-161:19 0, 161-0 -01]

3.1.14

v rif ic tion

set of o eration whic is u ed to c ec the test eq ipment s stem (e.g the test generator

an its intercon ectin ca les) to demon trate that the test s stem is f un tionin

Note 1 to e try: Th meth d u e for v rif i atio ma b difere t fomth s u e for c lbratio

Note 2 to e try: For th p rp s s of this b sic EMCsta d rd this d f i itio is dif fere t f rom th d f i itio giv n in

CWG Combination wave generator

EFT/B Electrical fast tran ientburst

ESD Electrostatic dis harge

The fol owin tests are inten ed to demon trate the immu ity of eq ipment when s bjected to

impulse mag etic f ield related to the sp cif i location an in tal ation con ition of the

eq ipment (e.g proximity of eq ipment to the disturb n e source)

Pulse mag etic field are generated by l g tnin strikes on buidin s an other metal

stru tures in lu in a rial masts, e rth con u tors an e rth network an by initial f ault

tran ients in low, medium an hig voltage electrical s stems

In hig voltage s b-station , an impulse mag etic field may also b generated by the

switc in of hig voltage bu -b rs an l nes by circ it bre kers

The test is mainly a pl ca le to electronic eq ipment to b in tal ed in electrical generation

an distribution plants as wel as in their control centres It is not relevant f or distribution

network eq ipment (e.g tran formers, p wer l nes)

Prod ct commit e s may con ider other a plcation

s al b s e if i d in th d dic te e uipme t s e ific tio

The test levels s al b selected ac ordin to the in tal ation con ition Clas es of

in tal ation are given in An ex C

6 Test instrumentation

The test s stem comprises the combination wave generator an the in u tion coi for a ta l

e-to test setup an , in ad ition, an RGP for a f lo r stan in test setup

6.2 Combination wa e ge erator

For this a plcation, the combination wave generator is u ed as a c r ent source

NOT Th c mbin tio wa e g n rator s e ifie in this sta d rd h s id ntic l wa e s a e d finitio s to th o e

giv n inIEC 610 0-4-5

Therefore only the 8/2 µs waveform is relevant The combination wave generator s al b

a le to del ver the req ired impulse c r ent to the in u tion coi s sp cified in 6.3

The waveform is sp cif ied as a s ort-circ it c r ent an theref ore s al b meas red without

the in u tion coi con ected

This generator is inten ed to generate a s rge havin :

S2, R

m, L

r

care selected so that the generator del vers an 8/2 µs

Intern l or e tern l 18 µ c p citor

Figure 1 – Simpl f ie circ it dia ram of the combination wa e g nerator

6.2.2 Perf orma c c ara teristic of th ge erator

phase angle of the a.c l ne voltage to the EUT

with a toleran e of ± 10°

Short-circ it p ak output c r ent 10 A to 1 0 0 A or the req ired test level

divided by the coi f actor

Wavef orm of the s rge c r ent se Ta le 2 an Fig re 2

Short-circ it p ak output c r ent toleran e ± 10 %

Table 2 – Def initions of the wa ef orm parameters 8/2 µs

NOT 1 Th v lu 1,2 is th re ipro al of th difere c b twe n th 0,9 a d 0,1 thre h ld

NOT 2 Th v lu 1,18 is d riv d fom empiric l d ta

Figure 2 – Wa ef orm of s ort circ it c r e t (8/2 µ )

at th output of the ge erator with the 18 µF c pa itor in s rie

6.2.3 Cal bration of th ge erator

If a c r ent tran former (pro e) is u ed to me s re s ort-circ it c r ent, it s ould b selected

so that saturation of the mag etic core do s not take place The lower (-3 dB) corner

f req en y of the pro e s ould b les than 10 Hz The cal bration s al b car ied out with a

c r ent pro e an os i os o e or other eq ivalent me s rement in trumentation with a

b n width of not les than 1 MHz The cal bration s al b p rf ormed for al test levels, whic

are a pl ed for testin

IEC

I

t T

The c aracteristic of the generator s al b me s red throu h an external ca acitor of 18 µ

in series with the output, u der s ort-circ it con ition If the 18 µ ca acitor is implemented

in the generator, no external 18 µ cap citor is req ired for cal bration

Al p rf orman e c aracteristic stated in 6.2.2, with the ex e tion of phase s if tin , s al b

met at the output of the generator

6.3 Ind ction coi

6.3.1 Field distribution

For the two sin le-turn stan ard cois of 1 m × 1 m an 1 m × 2,6 m, the f ield distribution is

k own an s own in An ex B Therefore, no f ield verif i ation or f ield calbration is neces ary;

the c r ent me s rement as s own in Fig re 3 is s f f icient

Figure 3 – Ex mple of a c r e t me s reme t of sta d rd indu tion coi s

Other coi s of dif ferent dimen ion may b u ed for an EUT whic do s not f it in ide either of

the two stan ard cois In these cases, the f ield distribution s al b determined by

me s rement or calc lation (se An ex A)

6.3.2 Chara teristic of the sta d rd indu tion coi s of 1 m × 1 m a d 1 m × 2,6 m

The stan ard in u tion coi s al b made of co p r, aluminium or an con u tive non

-mag etic material, of s c cros -section an mec anical ar an ement as to f aci tate its

sta le p sitionin d rin the tests

The toleran e of the stan ard coi s is ±1 cm, me s red b twe n the centre l nes (centre of

the cros -section) The c aracteristic of in u tion coi s with resp ct to the mag etic f ield

distribution are given in An ex B

6.4 Cal bration of th te t s stem

The es ential c aracteristic of the test s stem s al b calbrated by a c r ent me s rement

(se Fig re 3)

The output c r ent s al b verif ied with the generator con ected to the stan ard in u tion

coi sp cif ied in 6.2.1 for al a pl ca le test levels In order to comply with the sp cifi ation

given in Ta le 3 an Ta le 4, an external ca acitor (e.g 18 µ ) in series may b req ired

The ca acitor may b in orp rated in the generator The con ection s al b re lzed by

twisted con u tors or a co xial ca le of up to 3 m len th an of s ita le cros -section

The fol owin sp cifi ation given in Ta le 3 an Ta le 4 s al b verified

Table 3 – Spe if ic tions of the wa eform time parameters of the te t s stem

8,0+

8,0+

"X" c n b a y le el a o e, b low or in b twe n th oth rs Th le el s al

b s e if i d in th d dic te e uipme t s e ific tio

If a c r ent tran former (pro e) is u ed to me s re s ort-circ it c r ent it s ould b selected

so that saturation of the mag etic core do s not take place The lower (-3 dB) corner

f req en y of the pro e s ould b les than 10 Hz The cal bration s al b car ied out with a

c r ent pro e an os i os o e or other eq ivalent me s rement in trumentation with a

b n width of not les than 1 MHz

7.1 Te t e uipme t

The fol owin eq ipment is p rt of the test setup:

– eq ipment u der test (EUT);

– au i ary eq ipment (AE) when req ired;

– ca les (of sp cif ied typ an len th);

– combination wave generator (CWG) with an internal/external (e.g 18 µ ) ca acitor;

– in u tion coi ;

– ref eren e grou d plane in case of testin f lo r stan in eq ipment

7.2 Verific tion of th te t in trume tation

The purp se of verifi ation is to en ure that the test setup is o eratin cor ectly The test

setup in lu es:

– the combination wave generator;

– the in u tion coi ;

– the intercon ection ca les of the test eq ipment

To verif y that the s stem is f un tionin cor ectly, the fol owin sig al s ould b c ec ed:

– s rge impulse present at the in u tion coi terminals

It is s f ficient to verif y that the s rge is present at an level by u in s ita le me s rin

eq ipment (e.g c r ent pro e, os i os o e)

NOT Te t la oratorie c n d fin a intern lc ntrol refere c v lu a sig e to this v rif i atio pro e ure

7.3 Te t s tup f or impuls ma n tic f ield appl e to a table- o EUT

Ta le-to EUTs s al b placed on a non-con u tive ta le The 1 m × 1 m in u tion coi may

b u ed for testin EUTs with dimen ion up to 0,6 m × 0,6 m × 0,5 m (L × W × H) The

1 m × 2,6 m in u tion coi may b u ed f or testin EUTs with dimen ion up to

0,6 m × 0,6 m × 2 m (L × W × H)

The in u tion coi s al b p sitioned in thre orthogonal orientation

When an EUT do s not f it into the in u tion coi of 1 m × 2,6 m, either the proximity method

(se 7.4) can b u ed or larger in u tion coi s may b con tru ted to s it the dimen ion of

the EUT for dif ferent f ield orientation of the mag etic f ield

NOT If it is impra tic l to c n tru t c is f or v ry larg e uipme t, th pro imity meth d is th o ly s ita le te t

meth d

It is not neces ary to maximize the imp ct of ca les d rin this test The proximity of the

ca les to the lo p anten a can imp ct the res lts so the ca les s al b routed to minimize

this imp ct The minimized ca l n dimen ion s al b in orp rated into the determination of

the maximum size of EUT that can b tested

An RGP is not req ired b low the EUT (se Fig re 4 b low) The in u tion coi s al b ke t

at le st 0,5 m f rom an con u tin s rfaces, for example the wal s an f lo r of a s ielded

en los re

Figure 4 – Ex mple of te t s tup f or table- o e uipme t

s owing the v rtic l orthogonal pla e

7.4 Te t s tup f or impuls ma n tic field appl e to a flo r sta ding EUT

The in u tion coi of stan ard dimen ion f or testin f lo r stan in eq ipment (e.g rac s) has

a rectan ular s a e of 1 m × 2,6 m with one s ort side whic may b the RGP f or large sized

eq ipment The 1 m × 1 m in u tion coi can b u ed f or f lo r stan in eq ipment with the

maximum dimen ion of 0,6 m × 0,6 m

The RGP s al have a minimum thic nes of 0,6 mm an a minimum size of 1 m × 1 m The

EUT s al b in ulated from the RGP

Figure 5 – Ex mple of te t s tup f or floor sta ding e uipme t

s owin the horizontal orthogonal pla e

For flo r stan in eq ipment (e.g ca inets) where the to of the EUT is gre ter than 0,7 m

from the RGP, more than one p sition s al b tested The distan e b twe n the p sition

s al b (0,5 ± 0,0 ) m Fig re 5 in icates that thre p sition have to b tested In an case,

the in u tion coi s own in Fig re 5 s al not b placed b low 0,5 m Fig re 6 s ows an

example for testin with a vertical orthogonal plane

Fig re 6 – Ex mple of te t s tup f or floor sta ding e uipme t

s owing the v rtic l orthogonal pla e

The test volume of the rectan ular coi is 0,6 m × 0,6 m × 2 m (L × W × H)

When an EUT do s not f it into the rectan ular coi of 1 m × 2,6 m, either the proximity method

(se Fig re 7 an 7.5 f or more detai ed information) can b u ed or larger in u tion coi s may

b con tru ted to s it the dimen ion of the EUT f or a dif ferent f ield orientation of the

mag etic f ield (se An ex A)

If it is impractical to con tru t coi s for very large eq ipment, the proximity method is the only

s ita le test method Prod ct commite s may select either the proximity method or u e a

s ita le coi

It is not neces ary to maximize the imp ct of ca les d rin this test The proximity of the

ca les to the lo p anten a can imp ct the res lts so the ca les s al b routed to minimize

this imp ct The minimized ca l n dimen ion s al b in orp rated into the determination of

the maximum size of EUT that can b tested

Figure 7 – Example of te t s tup usin th proximity method

7.5 Te t s tup f or impuls ma n tic field appl e in-situ

In-situ testin is general y the only practical test method avai a le for large mac inery or

simi ar eq ipment Durin in-situ testin , an RGP is normal y not avai a le Theref ore the

proximity method may b the only practical test method without the RGP in place Fig re 7

gives an example f or a test setup f or in-situ testin The 1 m × 1 m stan ard in u tion coi

s al b u ed when examinin EUTs u in the proximity method Furthermore it is neces ary

that the stan ard in u tion coi is isolated from the EUT The distan e b twe n the stan ard

in u tion coi an the EUT s al b (10 ± 1) cm

NOT Th dista c h s b e d f i e to e s re th s me field stre gth a in th c ntre of th sta d rd in u tio

c i

Testin of ta le to eq ipment ac ordin to 7.3 may also b p rformed but this is not the

prefera le test method

The test proced re in lu es:

– the verif i ation of the test in trumentation ac ordin to 7.2;

– the esta l s ment of the la oratory ref eren e con ition ;

– the con rmation of the cor ect o eration of the EUT;

– the exec tion of the test;

– the evaluation of the test res lts (se Clau e 9)

8.2 Laboratory ref ere c con itions

8.2.1 Cl matic con itions

Unles otherwise sp cified in generic, prod ct f ami y or prod ct stan ard , the cl matic

con ition in the la oratory s al b within an l mits sp cif ied f or the o eration of the EUT

an the test eq ipment by their resp ctive man facturers

Tests s al not b p rf ormed if the relative h midity is so hig as to cau e con en ation on

the EUT or the test eq ipment

8.2.2 Ele troma n tic condition

The electromag etic con ition of the la oratory s al b s c as to g arante the cor ect

o eration of the EUT so as not to in uen e the test res lts

• n mb r of impulses (f or e c orthogonal orientation):

n mb r of impulses u les otherwise sp cified by the relevant stan ard:

– f or d.c p wered EUT, f i e p sitive an fi e negative impulses;

– f or sin le-phase a.c p wered EUT, 2 p sitive an 2 negative impulses without

phase s n hronization;

– f or thre -phase a.c p wered EUT, 2 p sitive an 2 negative impulses without phase

s n hronization;

• impulse re etition rate not les than one impulse p r min te (prod ct commit e s may

sp cif y this re etition rate);

• re resentative o eratin con ition of the EUT;

• thre orthogonal orientation of the mag etic f ield in case of ta le-to eq ipment;

• thre orientation of the mag etic f ield in case of f lo r stan in eq ipment;

• location of the in u tion coi relative to the EUT ( est p ints)

For most prod cts, phase s n hronization may not b a pro riate; theref ore prod ct

commite s s ould decide on the ne d of phase s n hronization f or their prod cts

NOT 1 Th a plc tio of te ts with difere t p a e a gle ma b more critic l for e uipme t with in erter

te h olo y

NOT 2 Sp cial s f ety c n id ratio s ma b n e e wh n u in th g n rator’s C N o tp t

9 Ev luation of test results

The test res lts s al b clas if ied in terms of the los of fun tion or degradation of

p rforman e of the eq ipment u der test, relative to a p rf orman e level def i ed by its

man facturer or the req estor of the test, or agre d b twe n the man facturer an the

purc aser of the prod ct The recommen ed clas ifi ation is as f ol ows:

a) normal p rf orman e within l mits sp cif ied by the man facturer, req estor or purc aser;

b) temp rary los of fun tion or degradation of p rf orman e whic ce ses af ter the

disturb n e ce ses, an from whic the eq ipment u der test recovers its normal

p rforman e, without o erator intervention;

c) temp rary los of f un tion or degradation of p rf orman e, the cor ection of whic req ires

o erator intervention;

d) los of fun tion or degradation of p rforman e whic is not recovera le, owin to damage

to hardware or sof tware, or los of data

The man f acturer’s sp cifi ation may def i e eff ects on the EUT whic may b con idered

in ig if i ant, an theref ore ac e ta le

This clas if i ation may b u ed as a g ide in formulatin p rf orman e criteria, by commit e s

resp n ible f or generic, prod ct an prod ct-f ami y stan ard , or as a f ramework f or the

agre ment on p rforman e criteria b twe n the man facturer an the purc aser, f or example

where no s ita le generic, prod ct or prod ct-famiy stan ard exists

Eq ipment s al not b come dan erou or u safe as a res lt of the a pl cation of the tests

10 Test re ort

The test re ort s al contain al the inf ormation neces ary to re rod ce the test In p rtic lar,

the fol owin s al b recorded:

– the items sp cif ied in the test plan req ired by Clau e 8 of this stan ard;

– identif i ation of the EUT an an as ociated eq ipment, f or example, bran name, prod ct

typ , serial n mb r;

– identif i ation of the test eq ipment, for example, bran name, prod ct typ , serial n mb r;

– an sp cial en ironmental con ition in whic the test was p rf ormed, f or example,

s ielded en los re;

– an sp cif i con ition neces ary to ena le the test to b p rf ormed;

– p rforman e level defi ed by the man facturer, req estor or purc aser;

– p rf orman e criterion sp cif ied in the generic, prod ct or prod ct-fami y stan ard;

– an ef f ects on the EUT o served d rin or af ter the a pl cation of the test disturb n e,

an the d ration f or whic these ef fects p rsist;

– the rationale f or the p s /f ai decision (b sed on the p rf orman e criterion sp cif ied in the

generic, prod ct or prod ct-fami y stan ard, or agre d b twe n the man facturer an

the purc aser);

– an sp cif i con ition of u e, f or example ca le len th or typ , s ieldin or grou din , or

EUT o eratin con ition , whic are req ired to ac ieve compl an e;

– the in u tion coi s selected f or the tests;

– the p sition an orientation of the in u tion coi relative to EUT

Annex A

(inf ormativ )

Characteristics of non standard induction coi s

When an EUT do s not f it into stan ard in u tion coi s, either the proximity method may b

u ed or non stan ard in u tion coi s may b u ed Non stan ard coi s are con tru ted to

ac ommodate the dimen ion of the EUT f or the dif ferent orientation of the mag etic f ield

Note that larger in u tion coi s give re e ta le res lts, but it may not b practical to con tru t

very large cois The maximum dimen ion of non stan ard in u tion coi s are determined by

whether the wavef orm req irements of the 1 m × 2,6 m coi can b ac ieved The proximity

method may give u eful but not neces ari y re rod cible res lts

NOT Du to th p s ible larg dime sio s of EUTs, th c is c n b ma e of "C" or "T" cro s-s ctio al s a e in

ord r to h v s ficie t me h nic l rigidity

A.2 Determination of the coi f actor

The in u tion coi f actor s al b determined by me s rement or calc lation The coi f actor is

u ed to calc late the c r ent in the in u tion coi to o tain the req ired mag etic f ield stren th

in the centre of the in u tion coi

A.2.2 Coi f actor me s reme t

A.2.2.1 Ge eral

In order to comp re the test res lts f rom dif ferent cois, the in u tion coi f actor s al b

me s red in a f re sp ce con ition without an EUT

A mag etic f ield sen or of adeq ate sen itivity s al b u ed to me s re the mag etic f ield

stren th H generated by the in u tion coi

The f ield sen or s ould b p sitioned at the centre of the in u tion coi an with s ita le

orientation to detect the maximum value of the f ield The c r ent I in the in u tion coi s al b

me s red an adju ted to o tain a f ield stren th within the me s rement ran e of the

mag etic f ield sen or The coi f actor, k

CF, is o tained as k

CF

= H/I

A.2.2.2 Coi f actor me s reme t f or table- o e uipme t

The f ol owin proced re s ould b car ied out:

The in u tion coi s al b p sitioned at a minimum of 1 m from con u tive or mag etic

stru tures In ulatin material may b u ed to s p ort the in u tion coi The in u tion coi is

con ected to an a.c source The me s rement can b car ied out at an f req en y (e.g

5 Hz or 6 Hz)

A.2.2.3 Coi f actor me s reme t f or flo r sta ding e uipme t

The folowin proced re s ould b car ied out:

The in u tion coi s ould b p sitioned on the RGP, whic may form one side of the coi

Ex e t f or the RGP, al other con u tive or mag etic stru tures s al b at le st 1 m f rom the

coi In ulatin material may b u ed to s p ort the in u tion coi The in u tion coi s al b

con ected to an a.c source The me s rement s al b car ied out at p wer f req en y

A.2.3 Coi f actor c lc lation

The coi factor can b calc lated from the ge metrical dimen ion of the in u tion coi F r a

sin le-turn, rectan ular in u tion coi havin sides a + b an c (se Fig re A.1), the coi factor

+

++

=

=

2

22

2CF

2/

//4

2/

//4

41)(

)(

cb

bccb

ca

acca

IPH

Pk

π

(A.1)

where H(P) is the mag etic f ield at p int P an I is the in u tion coi c r ent Eq ation (A.1) is

val d, when the largest dimen ion of the cros -section of the coi in u tor is smal comp red

to the s ortest side of the in u tion coi For a s uare in u tion coi with side c an if P is at

the centre of the coi , then a = b = c/2 If P is at the centre of a rectan ular coi , then a = b If

the RGP is the b tom side of the coi , then eq ation (A.1) is sti val d takin into ac ou t the

image of the actual (ph sical) coi In this case, if P is at the centre of the ph sical coi, then

the k

CF

of the coi f ormed by the ph sical coi plu its image is given by eq ation (A.1) with b

= 3 × a

Figure A.1 – Re ta gular induction coi with side a + b a d c

A.3 Ma netic f ield measurement

The f ield me s rement mentioned in A.2.2.1 is also a pl ca le for large non stan ard

in u tion coi s The me s rement of the mag etic f ield may b done with a me s rement

s stem comprisin cal brated sen ors, f or example a "Hal ef f ect" or multi-turn lo p sen ors

with a diameter of at le st one order of mag itu e smaler than the in u tion coi an a p wer

f req en y nar ow b n in trument The maximum EUT volume is l mited by the + dB isol ne

A.4 Verif ication of non sta dard induction coi s

The me s rement may b car ied out by injectin the p wer f req en y c r ent into the

in u tion coi an me s rin the mag etic f ield u in sen ors placed at the ge metrical

centre of the coi as s own in Fig re A.2

Fig re A.2 – Ex mple of v rif ic tion s tup f or non sta dard ind ction coi s

The in u tion coi f actor can b calc lated from eq ation (A.1) if the largest cros -section

dimen ion of the coi in u tor is not more than 0,0 of the s ortest side of the coi

If one side of the coi is the RGP, an ad itional source of u certainty is the f i ite size of the

RGP This can b evaluated throu h the relative deviation b twe n the coi f actors calc lated

as umin the presen e an a sen e of an in nite size RGP

Annex B

(inf ormativ )

Inf ormation on the f ield distribution of standard induction coi s

An ex B gives information on the maximum size of an EUT an its location in the stan ard

in u tion coi s The maximum EUT volume is l mited by the + dB isol ne in the x-y plane an

by the ± dB isol nes in the x-z plane

The in u tan e f or the sin le turn stan ard 1 m × 1 m coi is a proximately 2,5 µH an f or the

1 m × 2,6 m stan ard coi is a proximately 6 µH

For the f ield computation the f i ite cros -section of the lo p con u tors are neglected ( hin

Figure B.1 – + dB isol n f or the ma netic f ield stre gth (ma nitu e)

in the x-y pla e f or the 1 m × 1 m ind ction coi

Figure B.2 – + dB a d – dB isol ne f or th ma n tic field stre gth (ma nitud )

in the x-z pla e for th 1 m × 1 m induction coi

B.3 1 m × 2,6 m induction coi with ref erenc ground plane

The + dB an -3 dB isol nes for the mag etic field stren th (mag itu e) are s own in

Fig re B.3 f or the x-z plane an in Fig re B.4 for the x-y plane The maximum EUT size is

NOT Th –3 dB is ln is n t s own b c u e it is o tsid th lo p.

Fig re B.3 – + dB isol ne f or the ma netic f ield stre gth (ma nitude) in the x-z pla e

f or the 1 m × 2,6 m induction coi with ref ere c ground pla e

Figure B.4 – + dB a d -3 dB isol ne for the ma netic f ield stre gth (ma nitude) in the

x-y pla e f or the 1 m × 2,6 m in uction coi with ref ere c ground pla e

Ma imum EUT siz

(width × h ig t = 0,6 m × 2,0m)

x-z pla e + dB

B.4 1 m × 2,6 m induction coi without ref ere ce ground plane

The + dB an – dB isol nes f or the mag etic field stren th (mag itu e) are s own in

Fig re B.5 for the x-y plane an in Fig re B.6 for the x-z plane The maximum EUT size is

width × len th × heig t = 0,6 m × 0,6 m × 2 m

NOT Th –3 dB is ln is n t s own b c u e it is o tsid th lo p

Figure B.5 – + dB isol ne f or the ma netic field stre gth (ma nitude) in the x-y pla e

f or the 1 m × 2,6 m in uction coi without ref ere c ground pla e

Figure B.6 – + dB a d – dB isol ne f or th ma n tic f ield stre gth (ma nitud )

in the x-z pla e for the 1 m × 2,6 m in uction coi without ref ere c grou d pla e

Annex C

(inf ormativ )

Selection of the test levels

Test levels s al b selected in ac ordan e with the electromag etic en ironment in whic the

eq ipment con erned is inten ed to b u ed, takin into ac ou t most re l stic in tal ation

con ition

Recommen ation for test levels are given in Clau e 5 The actual selection of test levels

s ould take into ac ou t

– the electromag etic en ironment;

– the p tential proximity of impulse mag etic f ield disturb n es sources to the eq ipment

con erned;

– the in tal ation con ition typical y to b exp cted f or an in tal ation in the electromag etic

en ironment u der con ideration;

– the ne d an amou t of comp tibi ty margin , i.e the margin b twe n the maximum

disturb n e level an con idered immu ity level

An a pro riate test level f or eq ipment de en s on the electromag etic en ironment in whic

eq ipment is inten ed to b u ed Based on common in talation practices whic are

re resentative f or the electromag etic en ironment con erned, a g ide f or the selection of

test levels f or impulse mag etic f ield testin may b the f ol owin :

Clas 1: Electromag etic en ironment with p rtic lar mitigation me s res employed in

order to al ow electromag etic phenomena to oc ur to a certain extent only (e.g

phenomenon do s not oc ur, phenomenon oc urs with a relatively low ampl tu e

only, etc.)

Control ed electromag etic en ironment: where sen itive devices are plan ed to

b u ed (e.g electron micros o es, cathode ray tub s, etc.)

The test is not a pl ca le to eq ipment inten ed to b u ed in this clas of

en ironment

Clas 2: Electromag etic en ironment re resentative f or residential are s

The test is not a pl ca le to eq ipment inten ed to b u ed in this clas of

en ironment b cau e the location con erned are not s bjected to the in uen e

of switc in phenomena in medium-voltage an hig -voltage s bstation

Clas 3: Electromag etic en ironment re resentative for of f ice/commercial are s

L cation of this clas of en ironment are c aracterized by a p tential proximity to

medium-voltage an hig -voltage switc ge r or to con u tors car yin

cor espon in tran ients A computer ro m in the vicinity of a s b-station mig t

b a re resentative for s c location

Clas 4: Electromag etic en ironment re resentative for in u trial are s

L cation of this clas of en ironment are c aracterized by the presen e of

medium-voltage or hig -voltage s bstation an of con u tors car yin tran ient

f ault c r ents Control ro ms of s b-station an f ield with hig -c r ent

eq ipmentin tal ation mig t b re resentatives f or s c location

Clas 5: Hars electromag etic en ironment whic can b c aracterized by the f olowin

at ributes: con u tors, bu -b rs or M.V.or H.V Iines car yin ten of kA

Switc yard are s of he v in u trial plants, M.V/H.V s b-station an p wer

station mig t b re resentatives f or location with s c an electromag etic

en ironment

Clas X: Sp cial electromag etic en ironment

The minor or major electromag etic se aration of interf eren e sources from

eq ipment circ its, ca les, l nes, etc an the q al ty of the in talation may

req ire the u e of hig er or lower test levels than those des rib d a ove This

may ne d a case-by-case as es ment

It s ould b noted that the l nes of eq ipment (e.g ca l n , bu b rs, overhe d l nes)

as ociated to electromag etic en ironments with hig er test levels can p netrate into

location b in as ig ed to an en ironment with lower test levels In s c cases a

re-as es ment of the later location with resp ct to the s ita le test levels s ould b car ied out

The a ove selection of test levels in terms of electromag etic en ironments s ould b u ed

as a g ide only There mig t b cases where a location mig t b as ig ed to one of the

a ove typ s of electromag etic en ironments but d e to the f eatures of the eq ipment

con erned or other circ mstan es a dif f erent test level than that as ociated to that typ of

electromag etic en ironment mig t b more a pro riate Cor esp n in as es ment s ould

b done by the p rties in olved (e.g prod ct commit e s)

Annex D

(inf ormativ )

Measurement uncertainty (MU) considerations

The compl an e of the re l zed disturb n e q antity with the disturb n e q antity sp cified by

this stan ard is u ual y con rmed throu h a set of me s rements (e.g me s rement of the

rise time of a c r ent impulse with an os i os o e by u in a c r ent pro e) The res lt of

e c me s rement in lu es a certain amou t of me s rement u certainty (MU) d e to the

imp rf ection of the me s rin in trumentation as wel as to the lac of re e ta i ty of the

me s ran itself The evaluation of MU is done here ac ordin to the prin iples an method

des rib d in IEC TR 610 0-1-6

In order to evaluate MU it is neces ary to:

a) identif y the sources of u certainty, related b th to the me s rin in trumentation an to

the me s ran ,

b) identif y the f un tional relation hip (me s rement model) b twe n the in uen e (input

q antities an the me s red (output q antity,

c) o tain an estimate an stan ard u certainty of the input q antities,

d) o tain an estimate of the interval containin , with a hig level of con den e, the true value

of the me s ran

These estimates an u certainties, derived for a p rtic lar disturb n e q antity, do not

des rib the degre of agre ment b twe n the simulated electromag etic phenomenon, as

defi ed in the b sic stan ard , an the re l electromag etic phenomenon in the world outside

the la oratory

Sin e the eff ect of the p rameters of the disturb n e q antity on the EUT is a priori u k own

an in most cases the EUT s ows a nonl ne r b havior, a sin le estimate an u certainty

n mb rs can ot b def i ed for the disturb n e q antity Therefore e c of the p rameters of

the disturb n e q antity wi b ac omp nied by the cor esp n in estimate an u certainty

This yield to more than one u certainty bu get

iu

i(y), u

cy), U(y) a d y are e plain d in

IEC TR 610 0- -6

D.3 Uncertainty contributors to the surge cur e t and to the surge magnetic

f ield measureme t uncertainty

The f ol owin l st s ows the contributors u ed to as es b th the me s rin in trumentation

an test setup in uen es:

• s a e of the impulse resp n e of the me s rin s stem

• os i os o e horizontal axis me s rement er or

• os i os o e vertical axis me s rement er or

• cal bration of os i os o e an me s rin s stem

• coi factor of the in u tion coi

D.4 Uncertainty of surge cur ent and surge magnetic f ield cal bration

D.4.1 Ge eral

In the case of the mag etic f ield test, the disturb n e q antities are the s rge c r ent

generated by the test generator an injected into the coi terminals an the s rge mag etic

f ield a pled to the EUT As dis u sed in Clau e D.1, an u certainty bu get f or e c

me s red p rameter of the disturb n e q antity is req ired The p rameters of these

disturb n e q antities are I

P, T

f

d, for the s rge c r ent, an H

P

f or the s rge mag etic

f ield It is as umed that the mag etic field generated by the in u tion coi is pro ortional to

the c r ent flowin into its terminals, the con tant of pro ortional ty b in the coi f actor k

CF

Therefore the s rge mag etic field has the same front time an width as the s rge c r ent,

an the p ak of the mag etic f ield is o tained as H

The a pro c ado ted here to evaluate impulse MU is des rib d in D.4.6 an D.4.7 Ta les

D.1, D.2, an D.3 give examples of u certainty bu gets for the s rge p rameters The ta les

in lu e the input q antities that are con idered most sig if i ant f or these examples, the

detai s (n merical values, typ of pro a i ty den ity f un tion, etc.) of e c contributor to MU

an the res lts of the calc lation req ired f or determinin e c u certainty bu get

%

10

%9f

2,

where

BTα

=

MS

(D.2)

an :

2 ,8 75 0,0 0 2 µs/kHz 0,0 53 µs

u

c(y) = √ u

i(y)2

o tained as umin a sampl n freq en y of 10 MS/s an a trace interp lation ca a i ty of

the s o e ( rian ular pro a i ty den ity f un tion) Were this not the case, a rectan ular

pro a i ty den ity f un tion s ould b as umed Only the contributor to MU d e to the

sampl n rate is con idered here, for ad itional contributors se D.4.5 The re din s are

: is the calc lated rise time of the ste resp n e of the me s rin s stem The co f f icient

α (se Clau e D.2), dep n s on the s a e of the impulse resp n e of the me s rin s stem

The ran e 3 0 ± 4 is re resentative of a wide clas of s stems, e c havin a dif ferent

s a e of the impulse resp n e (se D.4.6 an Ta le D.4) The b n width B of the me s rin

s stem can b exp rimental y o tained (direct me s rement of the b n width) or calc lated

f rom the b n width B

i

of e c element of the me s rement s stem (es ential y a c r ent

pro e, a ca le an a s o e) by u in the fol owin eq ation:

10%

d e to the me s rin in trumentation, the layout of the

me s rement setup an the s rge generator itself It is determined exp rimental y This is a

typ A evaluation b sed on the f ormula of the exp rimental stan ard deviation s(q

k) of a

sample of n re e ted me s rements q

where q is the arithmetic me n of the q

jvalues An er or b u d s(q

k) = 2 n (1 stan ard

deviation of a normal pro a i ty den ity f un tion) an an estimate of 0 n are as umed

D.4.3 Pe k of the s rge c r e t a d ma netic f ield

The me s ran is the p ak of the s rge c r ent injected into the coi an calc lated by u in

the fun tional relation hip

2

TPR

p

11

=

B

VR

RV

I

β

δδ

β is the co f f icient whose value is (14,8 ± 1,6) kHz

Table D.2 – Ex mple of u c rtainty bu get f or the pe k of s rge c r e t (I )

Symb l Estimate Unit

i(y)2

: is the voltage p ak re din at the output of the c r ent pro e The er or b u d is

o tained as umin that the s o e has an 8-bit vertical resolution with an interp lation

ca a i ty ( rian ular pro a i ty den ity f un tion)

R

T

: is the tran fer resistan e of the c r ent s u t or pro e An estimated value of 0,0 1 Ω an

an er or b u d of 5 % (rectan ular pro a i ty den ity fun tion) are as umed

δR: q antif ies the non- e e ta i ty of the me s rement setup, layout an in trumentation It

is a typ A evaluation q antif ied by the exp rimental stan ard deviation of a sample of

re e ted me s rements of the p ak c r ent It is expres ed in relative terms an an estimate

of 0 % an an er or b u d of 3 % (1 stan ard deviation) are as umed

δV: q antifies the ampl tu e me s rement inac urac of the s o e at DC A 2 % er or b u d

of a rectan ular pro a i ty den ity f un tion an an estimate of 0 are as umed

β: is a co f f icient whic de en s on the s a e of b th the impulse resp n e of the me s rin

s stem an the stan ard impulse wavef orm in the neig b rho d of the p ak (se D.4.7) The

interval (14,8 ± 1,6) kHz is re resentative of a wide clas of s stems, e c havin a dif ferent

s a e of the impulse resp n e

B: se D.4.2 same me nin an same values b th for the estimate an er or b u d

The u certainty of the p ak of the s rge mag etic f ield is o tained f rom the fun tional

CF

is the coi factor as me s red or calc lated as des rib d

in the stan ard Theref ore, if the calc lated k

CF

is 0,9 (e.g in the case of a s uare in u tion

coi whose side is 1 m) an its exp n ed u certainty is 5 %, then the b st estimate of H

Pis

1,0 kA/m an its exp n ed u certainty is 9,9 % (se Ta le D.2)

%,5d

1

18,1

BR

TT

Symb l Estimate Unit

iy) Unit

i(y)2

of the s rge c r ent The er or b u d is o tained as umin a sampln freq en y of 10 MS/s

( he same as in D.4.2) an a trace interp lation ca a i ty of the s o e ( rian ular pro a i ty

den ity f un tion) Were this not the case, a rectan ular pro a i ty den ity f un tion s ould b

as umed Only the contributor to MU d e to the sampl n rate is con idered here For

ad itional contributors se D.4.5 The re din s are as umed to b T

5 %,R

time dif feren e me s rement d e

to the me s rin in trumentation, the layout of the me s rement setup an the test generator

itself It is determined exp rimentaly This is a typ A evaluation q antif ied by the

exp rimental stan ard deviation of a sample of re e ted me s rements An er or b u d

s(q

k) = 15 n (1 stan ard deviation of a normal pro a i ty den ity f un tion) an an estimate

of 0 n are as umed

β: se D.4.3, same me nin an same values b th for the estimate an er or b u d

B: se D.4.2, same me nin an same values b th for the estimate an er or b u d

D.4.5 Further MU contributions to time me s reme ts

Time ba e er or a d j t er: the os i os o e sp cif i ation may b taken as er or b u d of

rectan ular pro a i ty den ity f un tion Us al y these contribution are negl gible

Vertic l re olution: the contribution de en s on the vertical ampl tu e resolution ∆A an on

the slo e of the trace d A/d t The u certainty is related to the half width of the resolution an is

(∆A/2) (dA/d t ) If trace interp lation is p rf ormed (se the os i os o e man al) a trian ular

pro a i ty den ity f un tion is u ed, otherwise a rectan ular pro a i ty den ity f un tion is

u ed This contribution may not b negl gible, when |dA/d t| < (∆A/T

i), where T

i

is the sampl n

interval of the s o e

DC of f set: The d.c of fset of the s o e contributes to the voltage p ak me s rement

u certainty, if the p ak is me s red from the nominal d.c zero l ne of the s o e This

contribution can b ig ored, if the re dout sof tware of the s o e me s res the p ak f rom the

pulse b se l ne

D.4.6 Ris time distortion due to the l mite ba dwidth of th me s ring s stem

The distortion of the rise-time is evaluated throu h the u ual rule of combination of the ri

se-times, whic is vald when two non-interactin s stems are cas aded an their ste

resp n es monotonical y in re se, i.e

2

MS2

rrd

TT

time of the ste resp n e of the me s rin s stem It is imp rtant to o serve that the

derivation of eq ation (D.7) is b sed on the f ol owin def i ition of the rise time

T

0π

∫

∞

=

00s

(D.9)

Eq ation (D.8) is e sier to han le, f rom the mathematical p int of view, than the u ual one

10 % to 9 % rise times are u ual y combined throu h eq ation (D.7) With the – dB

b n width of the s stem, the two defi ition le d to comp ra le rise times If we def i e

then we f i d that the α values derived f rom the two def i ition of rise-time do not dif fer very

mu h The values of α , cor esp n in to dif ferent s a es of the impulse resp n e h t , are

given in Ta le D.4 It is evident f rom Ta le D.4, that it is not p s ible to identif y a u iq e

value of

α

b cau e

α

de end b th on the ado ted defi ition of the rise time (e.g b sed on

thres old or on eq ation (D.7) an on the s a e of the impulse resp n e of the me s rin

s stem A re sona le estimate of α can b o tained as the arithmetic me n b twe n the

Further, it can b as umed that, if no information is avai a le a out the me s rin

s stem a art f rom its b n width, an value of α b twe n 3 1 × 10

−

an 3 9 × 10

−

is

eq al y pro a le Dif f erently stated, α is as umed to b a ran om varia le havin a

rectan ular pro a i ty den ity fun tion with lower an up er b u d of 3 1 × 10

−

an

3 9 × 10

−

, resp ctively The stan ard u certainty of α q antif ies b th: a) the in if feren e to

the mathematical model ado ted f or the def i ition of the rise-time, an b) the in if feren e to

the s a e of the impulse resp n e of the s stem

Table D.4 – α f actor (s e e u tion (D.10) of dif f ere t unidire tional impuls re pons s

cor e pondin to th s me ba dwidth of s stem B

Valu s of α are multipled by 10

at the output of the me s rin s stem is given by the

con olution integral

dthVtV

0in

o t

ttt

A⋅ = , where A is the d.c aten ation of the me s rin s stem The

input waveform can b a proximated by its Taylor series exp n ion arou d the time in tant t

3

pp

in

2

pp

in

pin

tttV

Vt

Further

pin

<

′

tV

, b cau e the con avity p ints downward (maximum), an ( )

0

pin

>

′

tV

, b cau e, f or

the stan ard waveforms of interest here, the rise time is lower than the fal time Substitutin

eq ation (D.12) into eq ation (D.1 ) an af ter simpl f i ation , val d when the b n width of the

me s rin s stem is large with resp ct to the b n width of the input sig al (so that the p wer

series terms whose order is gre ter than two are negl gible), we o tain

πα

Note that the p rameter β de en s on the secon derivative of the stan ard input waveform

an on the p rameter α def i ed an derived in D.4.6 Sin e the mathematical expres ion f or

the stan ard s rge wavef orms are given in An ex E of this stan ard, the value of β can b

n merical y calc lated an is re orted in Ta le D.5

The estimate of the distortion of the input impulse width

wT

is simply o tained con iderin

that the are of the output impulse is that of the input impulse divided by the d.c aten ation

A Therefore

w dpdW

p

TAVT

(D.15)

where

w dT

is the output impulse width Hen e

W

2W

pp

D.5 Appl c tion of uncertainties in the surge generator compl ance criterion

General y, in order to b con dent that the c r ent an the mag etic f ield s rges are within

their sp cif i ation , the cal bration res lts s ould b within the sp cif ied l mits of this stan ard

( oleran es are not red ced by MU)

Further g idan e is given in IEC TR 610 0-1-6:2 12, Clau e 6