Iec 61048 2015

3.3 rate minimum temperature temp rature, in degre s Celsiu , of an p rt of the s rf ace of the ca acitor b low whic the ca acitor mu t not b energized 3.4 dis h rge re istor resistor co

Auxi iaries for lamps – Capacit ors for use in t ubular fluorescent and ot her

Apparei s aux il aires pour lampes – Condensat eurs dest inés à êt re ut il sés dans

les circuit s de lampes t ubulaires à fluorescence et aut res lampes à décharge –

Prescript ions générales et de sécurit é

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or b a y me n , ele tr onic or me h nic l in lu in p oto o yin a d microfim, with ut p rmis io in wr itin from

eith r IEC or IEC's memb r Natio al Commite in th c u tr y of th re u ste If y u h v a y q e tio s a o t IEC

c p r i ht or h v a e q ir y a o t o tainin a ditio al ri hts to this p blc tio , ple s c nta t th a dre s b low or

y ur lo al IEC memb r Natio al Commite for ur th r informatio

Dr oits d r eprod ctio ré er vé Sa f in ic tio c ntraire, a c n p rtie d c te p blc tio n p ut êtr e repr od ite

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q e tio s s r le c p r i ht d l EC o si v u d sir ez o te ir d s droits s p léme tair es s r c te p blc tio , uti s z

le c ord n é s ci-a r ès o c nta te le Comité n tio al d l EC d v tr ep y d résid n e

Th Intern tio al Ele trote h ic l Commis io (IEC) is th le din glo al or ga iz tio th t pr ep res a d p bls e

Internatio al Sta d r ds for al ele tri al ele tr onic a d relate te h olo ie

Abo t IEC p blc tio s

Th te h ic l c nte t of IEC p blc tio s is k pt u d r c n ta t r eview b th IEC Ple s ma e s re th t y u h v th

late t e itio ,a c rr ig n a or a ame dme t mig t h v b e p bls e

IEC Cat alo ue - webst ore.e ch/ cat alo ue

Th st an -alo e a plc t io for c n ultin th e tire

biblo ra hic l informat io o IEC Intern tio al Sta d rd ,

Te h ic l Sp cific tio s, Te h ic l R ep rts a d oth r

d c me ts A v aia le for P , Ma OS, A ndroid Ta let s a d

iPa

IEC p blc t i ns s arch - www ie ch/ se rch u

Th a v an e s arc e a le to fin IEC p blc tio s b a

v ariet y of crit eria (efere c n mb r, te t, t ec nic l

c mmitt e,…) It als giv es informatio o projec t s, re la e

a d with rawn p blc tio s

IEC Just P blshed - webst ore.e ch/ just pu lshed

St ay u to d te o al n w IEC p blc t io s Ju t Pu ls e

d t ais al n w p blc t io s rele s d A v aia le o ln a d

als o c a mo t h b emai

Ele t ro edia - www ele t ro edia.org

Th world's le din o ln dic t io ary of elec t ro ic a d

ele t ric l t erms c nt ainin more th n 3 0 0 terms a d

d finitio s in En ls a d Fre c , wit h e uiv ale t t erms in 15

a ditio al la g a e Als k nown a t he Int ern t io al

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More t ha 6 0 0 ele t rot ec nic l termin lo y e t rie in

En ls a d Fre c e tra t ed fom t he Terms a d Definitio s

cla s of IEC p blc t io s is u d sin e 2 0 Some e t rie

h v e b e c le t ed fom e rler p blc tio s of IEC TC 3 ,

7 ,8 a d CISPR

IEC Cust omer Servic Cent re - webst ore.ec ch/ csc

If y ou wis to giv e u your fe d a k o t his p blc tio or

n e furt her a sista c , ple s c nta t t he Cu tomer Serv ic

Ce t re:c c@ie c

A pro os de l'IEC

L Commis io Ele trote h iq e Inter natio ale (IEC) e t la premièr e orga is tio mo diale q i éla or e et p ble d s

Norme internatio ale p ur to t c q i a trait à léle tri ité,à léle tr oniq e et a x te h olo ie a p r enté s

A pro os de p blc t i ns IEC

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Cat alo ue IEC - webst ore.e ch/ cat alo ue

Applc t io a t on me p ur c n ult er t ou le re s ig eme t s

biblo ra hiq e s r le Norme intern t io ale ,

Sp cific t io s t ec niq e , R ap ort s te h iq e et a tre

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A ndroid et iPa

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e uti s nt difére t s crit ère (n méro d référe c , t exte,

c mit é d’ét ud s,…) Ele d n e a s i d s informatio s s r le

projets et le p blc t io s remplac ée o retiré s

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Pu ls e d tai e le n uv ele p blc t io s p ru s

Dis o ible e lg e et a s i u e fois p r mois p r emai

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L premier dic t io n ire e lg e d terme éle t ro iq e et

éle triq e I c ntie t plu d 3 0 0 terme et d finit io s e

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15 la g e a ditio n le Eg leme t a p lé Vo a ulaire

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Plu d 6 0 0 e t ré s t ermin lo iq e élec t rot ec niq e , e

a glais et e fa ç is, e traite d s art icle Terme et

Définit io s d s p blc tio s IEC p ru s d p is 2 0 Plu

c rt ain s e tré s a térie re e t rait es d s p blc tio s d s

CE 3 , 7 , 8 et CISPR d l EC

Serv ic Clent s - w ebst ore.e c h/ cs

Si vou d sire n u d n er d s c mme taire s r c tt e

p blc t io o si v ou av ez d s q e t io s c nt ac t ez-n u :

c c@iec c

Auxi iaries for lamps – Capacit ors for use in t ubular fluorescent and ot her

Apparei s auxi iaires pour lampes – Condensat eurs dest iné à êt re ut il sé dans

les circuit s de lampes t ubulaires à fluorescence et aut re lampes à décharge –

Prescript ions générales et de sécurit é

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At te tion! V eui ez vou a s rer q e vou a ez o te u c t te publc t ion via u distribute r a ré

c olour

inside

Co r i t Inter natio l Eletr ote nicl Com isio

IEC 61 048

Editio 2.1 2 15-0

Auxi iaries for lamps – Capacit ors for use in t ubular fluorescent and ot her

Apparei s aux il aires pour lampes – Condensat eurs dest inés à êt re ut il sés dans

les circuit s de lampes t ubulaires à fluorescence et aut res lampes à décharge –

Prescript ions générales et de sécurit é

+AMD1:2 15 CSV  IEC 2 15

FOREWORD 4

INTRODUCTION 6

1 Sco e 7

2 Normative referen es 7

3 Terms an def i ition 8

4 General req irements 9

5 General notes on tests 9

6 Markin 10 6.1 Req ired markin 10 6.2 Ad itional information 10 6.3 Dura i ty an legibi ty of markin 10 7 Termination 10 8 Cre p ge distan es an cle ran es 1

9 Voltage ratin 12 10 Fu es 12 1 Dis harge resistors 13 12 Testin seq en e 13 13 Se l n an he tin test 13 13.1 Se l n an he tin test for typ A ca acitors 13 13.2 Se l n an he tin test for typ B ca acitors 14 14 Hig -voltage test 14 14.1 Hig -voltage test b twe n terminals 14 14.2 Hig -voltage test b twe n terminals an case 14 15 Resistan e to ad erse o eratin con ition 15 15.1 Humidity test with voltage a pl ed 15 15.2 Cur ent (dis harge) test 16 16 Resistan e to he t, fire an trac in 16 17 Self -he ln test 17 18 Destru tion test 18 18.1 Test A 18 18.2 Test B 21

18.3 Non-self -he l n ca acitors 2

An ex A (normative) Test voltage 2

An ex B (normative) Temp rature adju tment of test en los re 3

An ex C (normative) Test for conf ormity of man facture 31

An ex D (informative) Guide to calc latin eq ipment set in s f or tests in s bclau es 15.2 an 18.1.3 3

An ex E (normative) Ad itional req irements f or bui t-in ca acitors havin an in ulation eq ivalent to double or reinforced in ulation 3

An ex F (inf ormative) Inf ormation for luminaire desig 3

Bibl ogra h 3

+AMD1:2 15 CSV  IEC 2 15

Fig re 1 – AC con itionin circ it 2

Fig re 2 – DC con itionin circ it 2

Fig re 3 – Self -he l n bre k own test eq ipment 2

Fig re 4 – Voltage an c r ent waveform f or the tests in 15.2 an 18.1.3 2

Fig re 5 – Typical test circ it f or the tests in 15.2 an 18.1.3 2

Fig re 6 – Summary of test proced re 2

Ta le 1 – Minimum cre p ge distan es an cle ran es 12

Ta le 2 – Voltage an test d ration for en uran e test, f irst test seq en e 18

Ta le 3 – Voltage an test d ration for en uran e test, secon test seq en e 19

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic field To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cif i atio s (P S) a d Guid s (h re fter ref ere to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n n

-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio f or Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio fom al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th f orm of re omme d tio s f or intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eff orts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible f or th wa in whic th y are u e or f or a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u if ormity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtific tio b die pro id c nf ormity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtif i atio b die

6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s f or a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or for c sts (in lu in le al fe s) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s blefor th c re t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible f or id ntif yin a y or al s c p te t rig ts

DISCLAIMER

This Con ol d te version is not a of f icial IEC Sta dard a d ha be n prepare f or

us r conv nie c Only the c r e t v rsion of the sta dard a d its ame dme t(s)

are to be con idere the of f icial doc me ts

This Consol date v rsion of IEC 610 8 be rs th e ition number 2.1 It con ists of th

s cond e ition (2 0 -0 ) [doc me ts 3 C/7 0/FDIS a d 3 C/7 6/RVD] a d its

ame dme t 1 (2 15-0 ) [doc me ts 3 C/1 5 /FDIS a d 3 C/1 6 /RVD] Th te h ic l

conte t is ide tic l to th ba e e ition a d its ame dme t

In this Re l ne v rsion, a v rtic l l n in th margin s ows where the te hnic l conte t

is modif ie by ame dme t 1 Ad itions a d deletions are displa e in re , with

deletions being struc through A s parate Fin l v rsion with al c a ge a c pte is

a ai able in this publ c tion

+AMD1:2 15 CSV  IEC 2 15

This International Stan ard has b en pre ared by s bcommit e 3 C: Au i aries for lamps, of

IEC tec nical commit e 3 : L mps an related eq ipment

This publcation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

In this stan ard, the fol owin print typ s are u ed:

– req irements pro er: in roman typ ;

– test sp cific t io s: in it al ic type;

– n te : in smaler roma ty e

The commit e has decided that the contents of the b se publ cation an its amen ment wi

remain u c an ed u ti the sta i ty date in icated on the IEC we site u der

"ht p:/ we store.iec.c " in the data related to the sp cific publ cation At this date, the

IMPORTANT – Th 'colour in ide' logo on the cover pa e of this publ c tion indic te

that it contains colours whic are consid re to be us f ul f or th cor e t

understa din of its conte ts Us rs s ould theref ore print this doc me t usin a

colour printer

+AMD1:2 15 CSV  IEC 2 15

This International Stan ard covers general an safety req irements f or certain ca acitors f or

u e in tubular f l ores ent an other dis harge lamp circ its

Perorman e req irements f or these ca acitors are the s bject of IEC 610 9

NOT Saf ety re uireme ts e s re th t ele tric l e uipme t c n tru te in a c rd n e with th s re uireme ts,

d e n t e d n er th s fety of p rs n , d me tic a imals or pro erty wh n pro erly in tale a d maintain d a d

u e in a plc tio s for whic it wa inte d d

This International Standard states the req irements for b th self he ln an non-self -he ln

contin ou ly rated a.c ca acitors of up to an in lu in 2,5 kVAr, an not les than 0,1 µF,

havin a rated voltage not ex e din 1 0 0 V, whic are inten ed for u e in dis harge lamp

circ its o eratin at 5 Hz or 6 Hz an at altitu es up to 3 0 0 m

NOT Th s lamp a d a s ciate b la ts are c v re b IEC 6 0 1, IEC 6 9 1, IEC 6 18 , IEC 6 19 ,

IEC 6 6 2, a d IEC 61 6 a d b IEC 613 7-2-8 a d IEC 613 7-2-9, re p ctiv ly

It covers ca acitors inten ed for con ection in s u t or in series with the lamp circ it or an

eff ective combination of these

It covers only impreg ated or u impreg ated ca acitors, havin a dielectric of p p r, plastic

f ilm or a combination of b th, either metal zed or with metal f oi electrodes

This stan ard do s not cover radio-interf eren e s p res or ca acitors the req irements f or

whic are f ou d in IEC 6 3 4-14

Tests given in this stan ard are typ tests Req irements for testin in ivid al ca acitors

d rin prod ction are not in lu ed

The f ol owin referen ed doc ments are in isp n a le for the a pl cation of this doc ment

For dated ref eren es, only the edition cited a pl es For u dated referen es, the latest edition

of the ref eren ed doc ment (in lu in an amen ments) a pl es

IEC 6 2 9 (al p rts), L w-v l ta e fuses

IEC 6 5 9:19 9, De re s of protect ion provid ed b e closures (IP Cod e)

IEC 6 5 8-1, L min ires – P art 1: Ge eral re uireme ts a d tests

IEC 6 6 5-2-1 , Fire h z rd testin – Part 2-1 : Gl owing/h t-wire b sed test meth ds –

Gl ow-wire fl amma ility test met hod for e d -prod ucts

IEC 6 6 5-1 -5, Fire h z rd test ing – Part 1 -5:Test flames – Ne d l e fl ame method –

Ap arat us, c nfirmatory t est ara g me t a d g ida c

IEC 610 9:19 1, Ca a itors for use in tubul ar fl uoresc nt a d ot her d isc arg lamp circ its –

P erorma c re uireme ts

ISO 4 4 -4:2 0 , Pa er, b ard, p lps a d related terms – Vo a ulary – Pa er a d b ard

grad es a d c nvert ed prod ucts

temp rature, in degre s Celsiu , whic mu t not b ex e ded by the hotest p rt of the

ca acitor s r ace d rin o eration

NOT Th intern l lo s s in a c p citor, th u h smal re ult in th s rf ac temp rature b in a o e ambie t air

temp rature a d d e alowa c f or this s o ld b ma e

3.3

rate minimum temperature

temp rature, in degre s Celsiu , of an p rt of the s rf ace of the ca acitor b low whic the

ca acitor mu t not b energized

3.4

dis h rge re istor

resistor con ected acros the terminals of a ca acitor to red ce s oc hazard f rom the

c arge stored in the ca acitor

3.5

ta ge t of los a gle

ta d

p wer los of the ca acitor divided by the re ctive p wer of the ca acitor at a sin soidal

voltage of rated feq en y

3.6

s lf -he l ng

proces by whic the electrical pro erties of the ca acitor, after a local bre k own of the

dielectric, are ra idly an es ential y restored to the values b f ore the bre k own

3.7

type te t

test or series of tests, made on a typ test sample f or the purp se of c ec in compl an e of

the desig of a given prod ct with the req irements of the relevant sp cification

3.8

type te t s mple

sample con istin of one or more simiar u its s bmited by the man f acturer or the

resp n ible ven or for the purp se of a typ test

self he l n ca acitor u ed in series lg tin circ its or a self he l n p ral el ca acitor,

containin an inter upter device

+AMD1:2 15 CSV  IEC 2 15

4 Ge eral requirements

Ca acitors s al b so desig ed that in normal u e they fu ction safely an cau e no dan er

to p rson or s r ou din s

Al exp sed metal p rts s al b con tru ted of non- er ou material or s al b protected

again t ru tin Visible ru t s al not oc ur The test of Clau e 15 wi s ow whether the

ca acitor is s ff i iently protected again t ru t

Tests for c e k ing the me h nic l ro ust nes are u der c nsideration

Compl ian e wit h t he re uireme ts of Clauses 4 to 1 is c e k ed b me sureme t, insp ct io

a d b c r ying o t a t he tests spe ified in this stand ard

NOT In Ja a a a ditio al c p citor ty e is p rmite , d tais of whic are to b f ou d in JIS C 4 0 In lu io

of th re uireme ts f or th s c p citors in this sta d rd is u d r c n id ratio

5 Ge eral notes on tests

Tests a c rd ing t o t his st and ard are type tests, (An e C ex cl ud ed)

NOT Th re uireme ts a d tolera c s p rmite b this sta d rd are relate to te tin of a ty e te t s mple

s bmite f or th t p rp s Compla c of th ty e te t s mple d e n t e s re c mpla c of th wh le

pro u tio of a ma uf acturer with this s f ety sta d rd Co f ormity of pro u tio is th re p n ibi ty of th

ma uf acturer a d in lu e ro tin te ts a d q alty a s ra c in a ditio to ty e te tin

Ca a itors sh ll b su je ted to the t ests d et ail d in Clause 12

Unl es oth rwise sp cified , tests sh l b c ried o t at a temp rature of (2 0 ± 5) ° C , using

wh re a pro riate a volt ag so rc as d et ail d in An e A

Test temp ratures sp cified in p rtic lar cl auses sh l l b su je t to a tol era c of ± °C,

u l es otherwise stat ed

Unl es otherwise sp cified , t he type sh ll b d eemed to c mply wit h a y o e cl ause or

su clause if n t more th n o e failure o c rs in th test of that cl ause or su cla se I fthre

or more fa ures o c r, t he typ sh l l b rejected If two failures o c r in a y o e test , that

test, a d a y pre ed in t ests whic ma h ve infl ue c d the t est results, sh l l b re e t ed o

th same q a t ity of c p citors a d ifa y further fail ures o c r, th typ sh ll b rejected

NOT A re e t te t ma b p rmite o ly o c in a s rie of te ts a c rdin to th re uireme ts of this

sta d rd A re e t te t is n t p rmite in th d stru tio te t, Cla s 18, in th c s of a c ta tro hic faiure

For a ra g of c p cit ors ofth same c nstru tion, rat ed v l tag a d cros -se t io al sh p ,

e c gro p refer ed to in Cl ause 12 sh l l c ntain as n arly as p s ibl e e u l n mb rs of

c p cit ors of th high st c p citan e a d the lowest c p cit an e in that ra g

More ver, the ma ufa t urer sh l l pro ide d at a o th rat io of c p cita c p r are outer t ot al

sura e of t he c ntainer of e c c p cita c valu in the ra g Th c p cit or with t he

ma imum c p citan e p r u it sura e are sh ll also b t est ed if t his ratio exce ds t hat of

th max imum c p cit an e valu in th ra g b 10 % or gre ter Simil rly, t he c p cit or wit h

th minimum c p cita c p r u it are sh ll also b t ested if the rat io is l es t ha that of the

minimum c p cit an e v lue in the ra g b 10 % or gre t er

"Are " d en tes tot al o t er sura e are of c p citor en l osure ign ring sma protrusions,

terminals a d fixing stud s

With t his pro ed ure the t ests q alify a intermed iate v lues of c p cita c in th ra g

+AMD1:2 15 CSV  IEC 2 15

NOT 1 Th "s me c n tru tio " is th t whic is d clare b th ma uf acturer to b th s me diele tric material

th s me diele tric thic n s , th s me ty e of c s (metal or pla tic), th s me g n ric f amiy of fi er

or impre n tin lq id, th s me ty e of s f ety d vic a d th s me ty e of metal z tio (e.g.zin or aluminium)

NOT 2 "Cro s-s ctio al s a e" me n : ro n , re ta g lar, o al etc

6 Marking

6.1 Re uire markin

Ca acitors s al b legibly marked as fol ows:

a) name or trade mark of the man f acturer or resp n ible ven or;

b) man facturer's catalog e n mb r an /or model referen e;

c) rated ca acitan e an toleran e;

d) rated voltage;

e) when a dis harge resistor is fited, the s mbol ;

This s mb l s al not a p ar on ca acitors b arin the selfhe l n s mb l

NOT This ty e of c p citor is n t inte d d to b c n e te a ro s th main s p ly

k) typ A or B as a pl ca le

6.2 Additional inf ormation

a) Declaration of value of dis harge resistor, if fit ed

b) Declaration whether the ca acitor do s not contain s bstan es whic are lq id at

(

c+ 10) °C

6.3 Durabi ity a d le ibi ity of marking

Markin s al b d ra le an legible

Complian e is c e k d b insp ct ion a d b trying to remove t he mark ing b ru bing light ly,

for 15 s e c , with o e pie e of clot h so ked with water a d a ot her wit h p trole m spirit

Th marking sh l b le ible after the t est

NOT Th p trole m s irit u e s o ld c n ist of a s lv nt h x n with a c nte t of aromatic of ma imum

0,1 v lume p rc nta e, a k uri-b ta ol v lu of 2 , a initial b i n p int of a pro imately 6 °C, a dry-p int of

a pro imately 6 °C a d a d n ity of a pro imately 0,6 g/cm³

7 Terminations

7.1 Termination s al b provided by me n of either ca les ( ai s) or terminals (s rew,

s rewles , solder tag or the l ke) Termination s al b ca a le of ac e tin the size an

n mb r of con u tors a pro riate to the ratin an a pl cation of the ca acitor Ca les ( ais)

s al b s ita le f or the ratin of the ca acitor, but in no case s al they b smal er than

0,5 mm² an their in ulation s al b a pro riate to the ca acitor rated voltage an

+AMD1:2 15 CSV  IEC 2 15

Screw terminals s al comply with section 14 of IEC 6 5 8-1

Screwles terminals s al comply with section 15 of IEC 6 5 8-1

7.2 The ca acitor case, if of metal, s al either b fit ed with an e rthin terminal or b

ca a le of b in e rthed (or con ected to other metal p rts, if an , of the luminaire) by

clampin or by an a pro riate f i in brac et The p rt of the case to whic s c a clamp is

f it ed or the f i ing brac et at ac ed s al b f re f om p int or other non-con u tin coverin

in order to en ure the maintenan e of go d electrical contact

Compl ian e is c e k d b insp ctio a d the fol l owing test:

A c re t of at least 10 A, derived fom a so rc wit h a n -l oad vol tag n t ex ce d ing 12 V,

sh l l b p s ed b twe n th e rthing termin l or e rt hing c nta t a d e c of t he a c s ibl e

met al p rts in turn Th v l ta e dro b twe n t he c se a d the cl amping me ns or fixing

bra k et sh l l b me sured a d the resist an e c lc l at ed fom the c re t a d th volt ag

dro

I n n c se sh l t he resista c exce d 0,5 Ω

The req irements of the previou p ragra h do not a ply to metal-cased ca acitors

completely covered in an in ulatin material, b cau e these are tested ac ordin to 14.2

The cre p ge distan es over external s r aces of terminal in ulation an the cle ran es

b twe n the exterior p rts of terminal con ection or b twe n s c l ve p rts an the metal

case of the ca acitor, if an , s al b not les than the minimum values given in Ta le 1

These minimum distan es s al a ply to the terminals with or without the external wirin

con ected

They are not inten ed to a ply to internal distan es an cle ran es

Compl ian e is c e k d b me sureme t

s rews or d vic s for fixin c v rs

or fixin th c p citors to its s p ort

4 (2) a

3 b

3 (2) a

4 (2) a

3 b

6

5

6

3 b

5

6

3 b

Th v lu s in bra k ts a ply to cre p g dista c s a d cle ra c s prote te a ain t p lutio

For p rma e tly s ale -of f or c mp u d-f ile e clo ure , cre p g dista c s a dcle ra c s are n t c e k d

b

For gla s or oth r in ulatio with e uiv le t tra kin q altie

The contribution to the cre p ge distan es of an gro ve les than 1 mm wide s al b lmited

to its width

An air ga of les than 1 mm s al b ig ored in computin the total air p th

Cre p ge distan es are distan es in air, me s red alon the s race of in ulatin material

9 Voltage rating

Ca a itors sh l l b c p bl e of wit hstand in for prolon ed p riods a vol tag n t exce d ing

1 0 % ofth ir rated vol ta e within the t emp rat ure ratings

Compl ian e is c e k d b the t est giv n in Cla se 14

NOT This re uireme t is inte d d to c v r v riatio s in v lta e d e to s p ly flu tu tio s

Where an internal c r ent f use is fit ed, it s al b adeq ately protected, en losed an

in ulated so as to prevent f las over to, or contact with, a metal container in normal service in

the event of the o eration of the fu e

Compl ian e is c e k d b insp ctio a d b the tests given in 14.2 a d 16

NOT In e ta ls in th d sig of a y intern l f us , th p s ibi ty of s ort circ its o c rin e tern l to th

c p citor s o ld b ta e into a c u t

+AMD1:2 15 CSV  IEC 2 15

11 Discharge resistors

Ca acitors may have a dis harge resistor p rmanently con ected acros their terminals If

f it ed, this dis harge resistor s al have a value s c that it wi dis harge the ca acitor f rom

the p ak of the a.c voltage a pl ed to it, to a voltage not ex e din 5 V, within 1 min

Al owan e s al b made f or a voltage whic is 10 % a ove its rated value

The man facturer s al declare the resistor value an toleran e

Compl ian e is c e k d b me sureme t

NOT 1 Within th o eral lamp circ it, it is e s ntial th t a dis h rg p th b pro id d for a y c p citor It is

re omme d d th t this s o ld b b me n of a re istor inte ral with th c p citor, b t oth r ara g me ts are

p s ible

NOT 2 In c rtain c s s, for e ample lumin ire c n e te b plu s, a dis h rg to 5 V within 1 min ma n t b

a c pta le, s e s b la s 8.2.7 of IEC 6 5 8-

12 Testing sequence

A total of 50 sel f-h aling c p citors or 2 n n-self-h al ing c p citors are tak en a d d ivid ed

into gro ps as ind ic t ed b l ow

NOT For c p citors a o e 1 kV r, th q a titie f or te tin c n b a re d b twe n ma ufa turer a d te tin

a th rity

Th fol lowing initial t ests are a p ed t o a th c p citors in the ord er given:

a) se ling a d h at ing tes if re uired , in a c rd an e wit h Clause 13;

b) hig -volt ag test b twee terminals in a c rd an e wit h 14.1;

c) hig -volt ag test b twee terminals a d c ntain r in a c rda c wit h 14.2

Th first gro p of10 c p cit ors is su jected t o a series of t ests t hat are d esig ed to c e k th

a ility of th c p citor design to withst and adverse o erat in c nd itions Details of t hese t ests

are described in Cl ause 15 In ad d ition, t ests to c e k resistan e t o h at a d fire are c ried

o t in a c rd an e with Clause 16

Th se o d gro p of 4 self-h al ing c p citors sh l l provid e t he sampl es for the t ests of

Clauses 17 a d 18 Te c p citors are su mitted to t he self-h al ing test a d n su se u nt

test in Th remaind er are used for the d estru tio tes

13 Seal ng a d he ting test

13.1 Se l ng a d h ating te t f or type A c pa itors

Ca acitors containin s bstan es whic are l q id at (

c+ 10) °C s al b adeq ately se led

an have adeq ate resistan e to he tin

Compl ian e is c e k d b the fo owin t est

Th u e ergized c p citors are pl ac d in a o e in th p sitio most c ndu t iv to the

leak ag of impre n nt or fill ing material a d h at ed t hro g o t to 10 °C a o e t heir rated

ma imum t emp rature (t

c) Th y are maintained at t his temp rature for 1 h

L ak ag of impre na t or fill ing material sh l l n t o c r during t his tes Th c p cit or sh l l

n t b c me o e -circ it ed d uring this tes

NOT This te t d e n t a ply to a y c p citor wh re th ma ufa turer d clare th t th c p citor d e n t

c ntain s b ta c s whic are lq id at ( + 10) °C

+AMD1:2 15 CSV  IEC 2 15

13.2 Se l ng a d h ating te t f or type B c pa itors

The se l n of the ca acitors is a req irement for the safety device with overpres ure This

test s al b car ied out as a ran om test an a typ -test

Ca acitors whose f il ers have a dro pin p int a ove t

c

an ca acitors without fi ers s al b

tested as fol ows:

After t he c p cit ors h v b e de re sed the sh l l b plac d in a ves el whic c n b

h rmetic l l se led a d whic is fil l ed wit h l iquid u to su h a l evel th t th l iquid sura e is at

least 10 mm a ove the test-piec

Th l iquid is, for e ampl e, de as ed wat er at 2 °C Th liquid sh ll b at ro m t emp rat ure

After t he ves el h s b e closed it sh l l b evac ated wit hin 1 min to 16 mb r a d t his

v c um sh l l b maint ained for at le st 1 min Th t est sp cime s are observed t hro g a

window in the test v s el L ak ag p ints in the c p citor c ntainer are ind ic ted b rising air

b b les

In this test it sh l l b n ted t hat some d esigns h v h ll ows o tside t he se l of t he c p citor

Air b b l es whic rise fom th se o ter c vities at the start of t he test sh l n t b t ak n into

a c u t I fn c s ary, t he test sh l b le gthe ed for t hese c p cit ors

During t he test n b b l es sh l l b visibl e

14 High-voltage test

Ca acitors s al with tan hig voltages

Compl ian e is c e k d b the t ests of 14.1 a d 14.2

14.1 High-volta e te t betwe n terminals

Non-self -he l n ca acitors s al with tan , at ro m temp rature, an a.c test voltage of

In Ja an an North America, selfhe l n ca acitors s al with tan , at ro m temp rature, an

a.c test voltage of 1,7 U

n

a pl ed b twe n terminals f or a p riod of 10 s

For self -he l n ca acitors, selfhe l n bre k own (cle rin s) are al owed d rin the test

Initial y, not more than half the test voltage is a pled, f ol owin whic it s al b raised

grad al y to the f ul value

14.2 High-volta e te t betwe n terminals a d c s

Eac ca acitor s al with tan at 5 Hz or 6 Hz, as a pro riate, the f ol owin a.c test

voltage for a p riod of 1 min

Up to an in lu in 2 0 V 2 0 0 V r.m.s

+AMD1:2 15 CSV  IEC 2 15

Initial y not more than half the test voltage is a pl ed, fol owin whic it is raised grad al y to

the ful value

For ca acitors havin cases of in ulatin material, the test voltage is a pl ed b twe n the

terminals an a metal foi in close contact with the s race of the case, with a cle ran e of not

les than 4 mm b twe n metal f oi an terminals

15 Resistance to a verse operating conditions

The ca acitor s al have adeq ate resistan e to ad erse o eratin con ition

Compl ian e is c e k d b the t ests of 15.1 a d 15.2

Ca acitors are req ired to me t a h midity test with voltage a pl ed, f olowed by a c r ent

(dis harge) test This is to demon trate rela i ty of o eration u der damp con ition an on

"dirty" main s p l es that can s bject the ca acitor to c r ent s rges d e to non-sin soidal

wave forms

If the cap citor desig has a self contained fu e element internal y fit ed, the f use element

may b s ort-circ ited for the purp se of the tests des rib d in 15.1 an 15.2 The

man f acturer s al cle rly sp cify whic samples have b en pre ared in this way Ca acitor

desig s whic have f use wire directly con ected to the ca acitor win in s al not b modified

f or these tests

Ten ca acitors are s bjected to the test des rib d in 15.1, f ol owed by the test des rib d

in 15.2

15.1 Humidity te t with volta e appl e

Te c p citors sh l l b me sured for c p citan e a d t an e t of los a gle at a fe u n y

of 1 kHz

For t he p rp se ofthis tes leads or terminals sh l l n t exce d 3 mm in len t h

Th t est c binet sh l b c p bl e of maintaining the t emp rat ure at (4 ± 2)°C, a d the

relativ h mid ity b twe n 9 % a d 95 % in t he re ion where t he c p citors are pl ac d Th

air in the c binet sh ll b circ l at ed a d the c binet sh l l b so d esig ed th t mist or water

dro l ets c n ot fa o the c p citors

Th test sampl es are plac d i n the h mid ity c bin t a d c n e ted to a a.c su ply A

n

sh l l b a pl ied to al the samples after the h mid ity c nd it ions h ve b e

re c ed

Th voltag a d h mid ity is maintain d for a p riod of 2 0 h

At t he e d of th test p riod t he c p citors sh ll b p rmitted t o re over at ro m temp rature

for a p riod of 1 h to 2 h, aft er whic t he foll owing c nditio s ofc mpl ian e are c e k d :

– c a g of c p cit an e sh ll b les t ha 1 %;

– ta g nt of los a gl e c a g sh l l b les t ha 50 % wh n me sured at 1 k Hz;

– n fa ures are p rmitted

+AMD1:2 15 CSV  IEC 2 15

15.2 Cur e t (dis harge) te t

The same 10 ca acitors that have completed the test of 15.1 s al b in ivid al y s bjected to

a c r ent test at ro m temp rature The test s al b maintained for 15 min at the folowin

con ition u in an a pro riate dis harge circ it

– Durin the test, the RMS c r ent s ould b 1,5 A/µF or 16 A, whic ever is the les , an the

p ak -to-p ak voltage 6 0V ± 10 %

The relevant voltage an c r ent wavef orm are given in Fig re 4

A typical circ it f or cre tin the req ired test con ition is given in Fig re 5

Alternative circ it ar an ements may b u ed, provided that the req ired wavef orms are

prod ced

A g ide for calc latin eq ipment setin s f or tests is given in An ex D

Co dit io s of c mplian e are c e k ed usin t he fin l me sureme t after t he t est of 15.1 as

th initial me sureme t for the test of 15.2

At ro m temp rature the samples s al me t the fol owin req irements:

– c an e of ca acitan e s al b les than 1 %;

– tan ent of los an le c an e s al b les than 5 % when me s red at 1 kHz;

– no fai ures are permited

In ad ition, al ca acitors are req ired to me t a hig -voltage test b twe n terminals an case

as given in 14.2

16 Resistance to heat, f ire a d tracking

16.1 External p rts of in ulatin material retainin terminals in p sition, s al b s f ficiently

resistant to he t

For materials ot her t ha c ramic, c mplian e is c e k ed b su je tin th p rts t o the b ll

-pres ure test in a c rda c wit h IEC 6 59 -1, Se tion 13

16.2 External p rts of in ulatin material retainin terminals in p sition an other p rts of

in ulatin material providin protection again t electric s oc , s al b resistant to flame an

ig ition

For materials other tha c ramic, c mplian e is c e k ed b t he tests of 16.2.1 or 16.2.2 as

a pro riate

16.2.1 Ex tern l p rts of insul ating material provid in prot ect ion a ainst electric sh c sh ll

b su jected t o th glow-wire t est in a c rd an e with IEC 6 6 5-2-1 , su ject t o the fo owing

det ails:

– th t est sample is o e sp cime ;

+AMD1:2 15 CSV  IEC 2 15

– the temp rature of t he tip ofth glow-wire is 650 °C;

– a y flame or glowin ofthe sp cime sh l ex ting ish within 3 s ofwithdrawing the gl ow

-wire a d a y fl amin dro s sh l l n t ig ite a piec of fiv -layer t is u -p p r, sp cified

in 4.187 ofISO 4 4 -4, spre d o t h rizo ta y 2 0 mm ± 5 mm b l ow t he test sp cime

Th ma ufa turer sh l l d eclare whether the test sh l l b c r ied o t o a c mpl et e c p cit or

or o t he ind ivid ual c mp n nts forming the h using a d su p ed sp ciall b the

ma ufa t urer for this tes

16.2.2 Parts of insulat ing mat erial retaining termin ls in p sit ion sh l l b su je ted to the

n ed le fl ame test in a c rda c with IEC 6 6 5-1 -5, su je t to t he fol l owing deta s:

– the test sampl e is o e sp cime ;

– the test sp cime is a c mpl ete c mp n n If it is n c s ary to tak e away p rts of th

c p citor to p rorm the t es c re must b t ak n to e sure that t he test c nd it io s are n t

signific nt ly d iffere t fom th se o c rin in n rmal use;

– the test fl ame is a p ed t o the c ntre of the sura e to b t est ed;

– th d uratio ofa p c tion is 10 s;

– a y self-sust aining flame sh ll e ting ish within 3 s of remo al ofthe g s fl ame a d a y

fl amin dro s sh l l n t ignite a piec of five-l ay r t is u -p p r, sp cified in 4.187 of

I SO 4 4 -4, spre d o t h rizo tall 2 0 mm ± 5 mm b l ow th t est sp cime

16.3 Tra kin te t

Outer in ulatin p rts of ca acitors for u e in luminaires, other than ordinary luminaires,

whic retain l ve p rts in p sition or are in contact with s c p rts, s al b of material

resistant to trac in

NOT Ca a itors n t c mplyin with this re uireme t wh n b in te te c n o ly b a pro e for u e in ordin ry

lumin ire

Compl ian e is c e k ed b c rying o t the tra k ing test sp cified in I EC 6 59 -1, Se t io 13,

o rel evant p rts

17 Self -heal ng test

Ca acitors marked with the s mbol (se 6.1 i) s al b self he l n )

Compl ian e is c e k d b the fo owin t est

The man facturer s al sp cify whether the ca acitors req ire to b precon itioned by the

en uran e test of 18.1.1

Th c p cit ors sh ll b su jected to a a.c v l ta e of 1,25 U

nwhic is incre sed at a rate of

n t more tha 2 0 V/min u til five cl earings h ve o c red sinc the b ginning of th t est or

u t il th volt ag h s re c ed 3,5 U

n (A hig er voltag ma b sp cified b the ma ufa turer.)

Th v l ta e sh l l b d ecre sed to 0,8 times t he valu at whic the fift h clearin o c rs or 0,8

times 2,15 U

n whic ever is l ower a d maintained for 10 s

On ad d it ion l cl earin in e c c p cit or is p rmitted during this p riod

A t otal of 25 or more cl earings (self-h a n bre kd owns) sh l l b o tain d fom t he 10

c p citors tested b t ifa y c p cit or sh ws more tha five clearin s, o ly five sh l l b used

in c lc l at ing t he tot al

+AMD1:2 15 CSV  IEC 2 15

If in uf ficient cle rin s are ac ieved, in con ultation with the man f acturer, the maximum

voltage may b in re sed an the same ca acitors retested

An ad itional cle rin s s al b ad ed to the previou total, s bject to the maximum n mb r

at ributed to an one ca acitor b in five

The ca acitors s al b de med to have p s ed the test if the c an e of ca acitan e

me s red b f ore an after the test is not gre ter than 0,5 %

If 2 cle rin s do not oc ur, the typ s al b rejected

No f urther tests s al b a pl ed to ca acitors whic have b en tested for selfhe l n

NOT Self -h aln bre k own d rin th te t ma b d te te b a o ci o c p or b a o stic or hig

f re u n y te t meth d (s e Fig re 3)

18 Destruction test

Ca acitors s al have adeq ate resistan e again t destru tive fai ure

Self -he l n ca acitors s al b tested in ac ordan e with either of the test proced res in 18.1

an 18.2 A s mmary of the test proced res is given in Fig re 4 F r p ral el l g tin

ca acitors, the man f acturer s al sp cify whic test route to fol ow, test A or test B Non-self

he l n ca acitors s al b tested in ac ordan e with 18.3

18.1 Te t A

This test proced re is inten ed for paral el l g tin ca acitors not neces ari y relyin on the

o eration of a pres ure inter upter device, i.e typ A ca acitors

18.1.1 En ura c te t

Twe ty-o e sampl es are tested in a c rda c wit h the re uireme ts ofIEC 610 9, Cl ause 8,

th v lt ag a d time b ing sele t ed fom Ta le 2:

Table 2 – Volta e a d te t duration for e dura c te t, first te t s qu nc

Voltage

(U

n)

Compl ian e sh ll b c e k d b the re uireme ts of IEC 610 9, su cl ause 8.6

NOT If a re d b twe n th ma ufa turer a d th te t h u e this te t ma b c rie o t b th ma ufa turer

u d r th s p rvisio of th te t h u e

18.1.2 Twe ty samples that h v met the re uireme ts of 18.1.1 are wra p d in t is u

p p r c mplying wit h 4.187 of ISO 4 4 -4 a d su je ted to t he fol l owing ad d it ion l t est

re uireme ts

Maximum rated temp rature (t )

+AMD1:2 15 CSV  IEC 2 15

Volt ag a d t ime sh l l b c ose b the ma ufa turer fom Ta le 3

Th test v lt ag sh l l b a re d b twee t he test h use a d t he ma ufa turer

H owever, th initial v lue sh ll n t b high r tha 1,3 × U

Wh re t he t otal c re t d rawn b a t he 2 c p citors h s n t d ecre sed to 50 % oft he init ial

v lu , the ma ufa turer ma sp cify a lo g r test t ime t o d estro c p citan e Th t est t ime

sh l l n t exce d 2 50 h Th test is c n lud ed if th c re t drawn b t he 2 c p cit ors h s

de re sed t o 50% or les of the init ial v lu

Th c p citors are wra p d cl osely with t is u p p r c mplyin with 4.187 of ISO 4 4 -4 a d

mo nted in a o e or t est c binet at room t emp rat ure

I f, at t he e d of t he sp cified t ime, the c r e t d ecre se h s n t b e a hieved, t he

c p cit ors are c e k d to se h w ma y h ve b c me o e circ it (ino erat ive) Th

remainin c pa it ors are tested o e at a time in t he foll owing ord er: o e at ro m temp rature,

th n xt at a t emp rat ure of (t

c + 10)°C, a d so o , as sp cified in 18.1.2.1 Th test is

c mpl ete whe t he tot al of 10 ino eratives h s b e o tained

Compl ian e is c e k ed b the re uireme ts of 18.1.4 On failure is p rmitted for a), b)

a d d) N o fail ures are p rmitted for c)

18.1.2.1 Preparation f or conditioning

This pro ed ure is o ly to b c ried o t if th tot al c re t drawn b th 2 c p cit ors h s n t

decre sed to 50%or l es of t he initial v l ue as sp cified in 18.1.2

Th c p cit ors are wra p d closely with tis u p p r c mplyin with 4.187 of ISO 4 4 -4 a d

mo nt ed in a o e or t est c binet at ro m t emp rat ure

Th c p citors are c n e t ed ind ivid ua y a d su c s ively t o a d.c c nd itio in circ it as

sh wn in F igure 2, where t he varia l e d.c so rc is c p ble of su plying a c r e t of 50 mA

Th c nd itionin pro edure is as fo ows:

a) usin th circ it ill ustrated in Figure 2 a d wit h t he switch in p sition 1, the d.c su ply is

ad just ed so t hat h v l t met er re ds 10 U

n

;

b) usin th circ it i ustrated in Fig re 2 a d with th switc in p sitio 2, th v ria le resistor R

is adjusted so th t th ammeter re ds 5 0 mA;

+AMD1:2 15 CSV  IEC 2 15

c) usin the circ it il l ustrat ed in Figure 2 t he switch is moved to p sit ion 3, a d sh rt ly

afterwards the re d ing wil l as ume a st able p sition Th voltag of t he d.c so rc sh l l

th n b red uc d t o z ro;

d) as so n as p s ibl e, a d with the c p citor at the same temp rature, a a.c vol tag of

1,3 U

n

is a pl ied t o the c p cit or for a p riod of 5 min using the circ it of F ig re 1 A

blown fuse indic tes a sh rt-circ it A c re t of les th n 10 % of th expe ted re d ing of

a ammet er ind ic tes a o e circ it

18.1.2.2 Conditions for id ntifyin whether a c pa itor ha be ome inoperativ

Durin the proced re of 18.1.2.1 d) the ca acitor is monitored to se if the f ol owin

req irements are met If they are met, then the ca acitors s al b al owed to co l to ro m

temp rature an are tested to se that they meet the req irements of 18.1.2.3

If the f ol owin req irements are not met, then the whole proced re of 18.1.2.1 is re e ted

If the c r ent throu h any ca acitor fal s to les than 10 % of the value whic would b

exp cted f rom the rated ca acitan e an the test voltage ap l ed, this wi b d e to one of

the fol owin re son :

a) the ca acitor has b come s ort-circ ited an the fu e has blown;

b) the ca acitor has b come o en-circ ited or has lost most of its ca acitan e;

c) the f use has blown without the ca acitor b in s ort-circ ited, d e to c an ed electrical

con ition in the ca acitor

By re lacin the fu e twice (b th of whic have to o erate) it wi b esta l s ed that the

ca acitor is sta le an me ts the con ition a) or c) a ove Con ition b) can b detected by

the ammeter, in Fig re 1, s owin very low or no c r ent The ca acitor havin b come

ino erative s al then b removed f rom the oven, al owed to co l to ro m temp rature, an

tested to se if it me ts the req irements of 18.1.4

18.1.2.3 Conditions of compl a c for c pa itors ha ing be ome inoperativ

Eac ca acitor havin b come ino erative s al me t the req irements of 18.1.4

Th ma ufa turer sh l l pre are t he samples b atta hing wire of suficie t cros -se tion l

are to wit hstand the hig r.m.s c re t

Before c rying o t the hig r.m.s c re t tes th pre ared sampl es sh l l b subjected to

th test of Cl ause 17 Th sampl es sh l the b wra p d wit h t is u p p r c mplyin with

=

2c

Co ditio s of c mpl ian e are to b in a c rd an e with 18.1.4 c)

The relevant voltage an c r ent waveform are given in Fig re 4

A typical circ it f or cre tin the req ired test con ition is given in Fig re 5

Alternative circ it ar an ements may b u ed, provided that the req ired wavef orms are

prod ced

A g ide for calc latin eq ipment setin s f or tests is given in An ex D

18.1.4 Con itions of compl a c

Eac c p cit or sh l me t the fol l owing re uireme ts:

a) esc ping l iquid mat erials ma wet the o ter sura e of the c p citor, b t n t fa away in

dro s;

b) intern l lv p rts sh l n t b ac c es ible to th sta dard test fing er (se Fig u re 1 ofIEC 60529)

c) b rning or sc rc ing of the t is u p p r shal n t b e ident, sin e t his wo ld ind ic te that

fl ames or fiery p rt icles h d b e emitt ed fom t he o e ings;

d) th c p citor sh ll withst and the t est of 14.2, the t est v lta e b ing redu ed b 50 V

18.2 Te t B

This test o tion is inten ed for self he ln ca acitors u ed in series l g tin circ its an self

he l n p ral el ca acitors in lu in a pres ure inter upter device, i.e typ B ca acitors It

demon trates that the inter upter device fu ction rel a ly

Testin the b haviour of a ca acitor on destru tion is inten ed to demon trate that a typ of

ca acitor wi f ai without harmful con eq en es, e.g ig ition or mec anical damage to

neig b urin p rts

Ca acitors of typ B s al b so designed that their destru tion is fol owed by s ort-circ itin

or inter uption of the circ it

The test is car ied out on ca acitors whic have p s ed the initial tests detai ed in items a)

to c) of Clau e 12 In ad ition, the ca acitan e s al b me s red b fore the test (se

Clau e 6 of IEC 610 9)

18.2.1 Te t spe ime s

Th foll owing t est sh l b c ried o t o 20 c p citors whic are o erativ at t he c mpletio

of t he e dura c test d escribed in IEC 610 9 a d 2 ofth "n w" samples th t h ve n t b e

thro g the pre o d itioning

+AMD1:2 15 CSV  IEC 2 15

18.2.2 Te t ar a g me t

Th c p cit ors sh ll b stil l cl osely wra p d in tis u p p r a d sh ll b mo nted in a o e

I n series wit h e c c p citor there is a t ime-lag fuse c mplyin wit h t he ele tric l

c ara teristics sp cified in IEC 6 2 9 Th rating of the fuse sh l b 2 A or 10 t imes th

rated c re t ofthe c p cit or t o whic it is c n e ted, whic e er is gre ter

Th c p cit ors are c n e ted t o a hig -p wer a.c su ply c p bl e ofp s ing a fa lt c re t of

3 0 A or 10 t imes the rated c r e t ofthe hig est rated c re t oft he fuse in use in the t est

18.2.3.1 Preparation for conditioning

Th c p citors sh ll b wra p d closely with tis u p p r c mplying with 4.187 of ISO 4 4 -4

a d mo nt ed in a test c bin t

To pre are the test sampl es, t he sh l l b lo d ed with th ir rated volt ag U

n for 2 h at

temp rature (t

c + 10) °C No o e circ it or sh rt-circ it sh l o c r in the c p citor Th n

2 c p cit ors whic h v p s ed the e d ura c test of Cl ause 8 of IEC 610 9, sh l l b

exposed to a hig ly resist ive d.c v l ta e so rc (

ma

< 50 mA) in the t est o en at t he

temp rature (t

c + 10) °C, wit h incre sing v lt ag u til bre k d own o c rs Th 2 "n w"

c p cit ors sh l l b tested at ro m temp rature as the pre ond itio ed c p cit ors

NOT Th s ort c n itio in with th rate v lta e (2 h/U

n/t +10) is e id n e f or th o eratio of th c p citors

18.2.3.2 Destruction of the c pa itors

I mmed iat ely aft er pre arat ion, the c pa it ors sh l l b l oad ed with a v ltag of 1,25 U

n a.c

whil e th d c c ndit ioning temp rature is maintained

Eac test sample, after a lo d ing p riod of 2 h, ma , in a c rda c wit h details provided b

th ma ufa turer, b c n e ted to a v ltag of 10 U

n

u t il bre kd own will o c r

Th c re t in this c se sh l l b limit ed t o les t ha 50 mA L ad in sh l l b terminated wh n

the d c v ltag bre ks d own

Su se u ntly, t he v lt ag of1,25 U

n

a.c sh l l b a p ed to th c p cit ors

This pro edure ma b re e ted at interv ls of 4 h u til d estru tion ofthe 4 test samples

o c rs whe the vol tag of 1,25 U

n

is a pl ied Th destru tion of th c p citors sh l l n t

o c r at t he d.c c nd it ionin

NOT Th c p citors wi b s bje te to a d.c a d a.c v lta e altern tiv ly u ti faiure o c rs

18.2.3.3 Condition of ide tifying a c pa itor ha ing be ome inoperativ

I n th c se of self-h al ing c p citors, the c nstru tiv me sures to e sure interu t ing sh l l

h v b e o erat ed

+AMD1:2 15 CSV  IEC 2 15

This c n b det ected b the ammet er, in Figure 1, sh win n c r e t Wh n t he c p cit or

h s b c me ino erativ , it sh l l b remo ed fom t he oven, all owed to c ol to ro m

temp rature, a d t est ed to se if it me ts the re uireme ts of 18.2.3.4 a d 18.2.3.5

18.2.3.4 Condition of compl a c

Eac c p citor sh l me t the fol lowing re uireme ts:

a) esc ping liquid mat erials ma wet th o ter sura e of t he c p citor, b t n t fa away in

dro s;

b) th c p citor sh l l n t h v b rst a d th c se ofthe c p citor sh l l n t h v mel ted ;

c) b rning or sc rc ing oft he t is u p p r sh l n t b e id ent, sin e t his wo ld ind ic te th t

fl ames or fiery p rticl es h d b e emitted fom the o e ings

18.2.3.5 Te ting s f ety in the fai e state

Eac c p citor b c ming ino erat ive sh l p s the foll owing tes

a) H igh-volt ag test b twe n t he terminals at a v lt ag of2,0 U

n

a d at ro m t emp rat ure

for a p riod of1 min N o fl ash-over sh l l o c r at the p int of interu tion

I n c se ofd ou t, t he ma ufa turer sh l l d emo strate that the c nst ru tive me sures to

e sure int eru tion of t he c re t have o erated

b) Th c p citors sh l l withsta d the high-v l ta e test b twee th terminals a d the c se in

a c rd an e with 14.2

NOT After th d stru tio te t, a hig -v lta e te t b twe n th termin ls is c rie o t to o tain e id n e of

inter u tio In a ditio a hig -v lta ete t b twe n c s a d termin l is ma e for s fety

18.2.3.6 Ev luation of the te t

Al l c p cit ors b c ming ino erat iv sh l l fulfil the re uireme ts of 18.2.3.4 b) a d c)

Ifo e ofth test sp cime s do s n t satisfy th c riteria a c rdin to 18.2.3.4 a) a d 18.2.3.5 a)

a d b), th test ma b re e ted o c o a furth r 40 samples Howe er, al th c p citors sh l

p s th re e t test

Ifmore th n o e c p citor do s n t satisfy th criteria a c rdin to 18.2.3.4 a) a d 18.2.3.5 a)

a d b), the test sh l l b re arded as h ving fa ed

18.3 Non-s lf -he l n c pa itors

Th test is c r ied o t o 10 c p citors, a ofwhic h v p s ed t he initial tests det ail ed in

it ems a) to c) of Cla se 12

18.3.1 Preparation for conditioning

Te c p citors whic are o erativ at t he c mpl et ion ofthe c nditio ing in 18.3 a d are st ill

cl osely wra p d in tis u -p p r are mo nted in a oven

Th c p cit ors are c n e ted ind ivid ua y a d su c s iv ly to a v ria l e d.c v l ta e so rc

wit h a resistan e in series t o l imit t he c re t t o a ma imum of 3 mA, as sh wn in Figure 2

A high-p wer a.c so rc a d time-lag fuses sh l l b a ail abl e as d escrib d i n 18.2.2,

c n e ted as sh wn in Figure 1

Th c p cit ors are h ated thro g o t to a temp rature of (t

c+ 10) °C a d ind ividu l l bro e

down using a stead ily in re sing d.c volt ag so rc wh re t he bre kdown c re t d oes n t

exce d 3 mA

+AMD1:2 15 CSV  IEC 2 15

Bre k d own will b ind ic ted b the v lt met er re d ing dro pin to efe tiv ly 0 V

The test proce d as fol ows

a) For c p cit ors mark d with the symb l

An a.c v lt ag of1,3 U

n

is a p ed for a p riod of 8 h using the circ it of Figure 1 ex ce t

th t t here is a c ok e or resist or in series with the sh rt-circ it ed c p citor Th imp da c

ofth c o e or resistor is su h that wit h 1,3 U

n

a p ed to the circ it, the c re t fl owing

thro g the circ it is limited t o 1,5 times the rated v lu (1,5 U

n

ω C ) of the c p citor

b) For a other c p citors

As so n as p s ible aft er bre k down, a d with t he c p citor at the same temp rature, a

a.c v l ta e of1,3 U

n

is a pli d to th c p citor for a p riod of5 min using the circ it of

Figure 1

18.3.2 Conditions f or ide tifyin whether a c pa itor ha be ome inoperativ

After c o n , all ino eratives sh l l me t the re uireme ts of 18.2.2 a d a) to d) of 18.1.4

Op rativ c p citors sh ll b re e t test ed a c rd ing to the whole pro ed ure of 18.3.1

Further re e t tests are mad e u til a c p citors are in p rat iv

3 Ultra o ic micro h n ; s n itivity: 8 p /b r; n tural fe u n y: 6 kHz

4 Divid r a d pre mplf i r; ma in ut s n itivity ≥ 1 mV r.m.s in ut re ista c ≈ 6 kΩ

+AMD1:2 15 CSV  IEC 2 15

0 U

CI

dd

g t e

c ntrol +

• Varia le thre p a e tra sf ormer inte d d for a o tp t v lta e ra gin f rom 0 V to 4 0 V

• Gra tz dio e re tif yin brid e

• 1 f ast dio eD

F( 5 0 V, 5 A)

• 1 a ju ta le air in u ta c L

o(p a c re t 7 0 A)

• 1 slg tly in u tiv re istiv lo d (FP= 8) with ta din 5 A u d r 0,5 Vs v lta e

Varia le tra sformer alows a ju tme t of v lta e a ple to c p citors) u d r te t; c re t is a ju te th n s to

o, C

owith:

ooo

o

CLT

11

Figure 5 – Typic l te t circ it f or the te ts in 15.2 a d 18.1.3

+AMD1:2 15 CSV  IEC 2 15

Annex A

(nor mative)

Test voltage

Voltage tests s al b car ied out with either an a.c or a d.c source as sp cified in the

relevant clau es The source s al b adeq ate to maintain, over an sp cif ied test p riod,

the test voltage req ired, s bject to a toleran e of ± ,5 %

AC voltage tests s al b made u in a 5 Hz or 6 Hz f eq en y, as a pro riate, the voltage

wavef orm of whic s al b s ff i iently f re fom harmonic as to en ure that, when a pl ed to

the ca acitor, the res ltin c r ent s al not ex e d the value cor esp n in to a sin soidal

voltage waveform by more than 10 %

If desired, dis harge resistors may b dis on ected d rin voltage tests b twe n terminals

+AMD1:2 15 CSV  IEC 2 15

Annex B

(nor mative)

Temperature adjustment of test enclosure

The ca acitors are mou ted in an en los re in whic the temp rature of the air is con tant

within a toleran e of ± °C

The air in the en los re is contin ou ly agitated, but not so vigorou ly as to cau e u d e

co l n of the ca acitors The ca acitors u der test s al not b s bjected to direct radiation

f rom an he tin elements in the c amb r The sen itive element of the thermostat reg latin

the air temp rature of the c amb r s al b wel within the stre m of he ted circ latin air

NOT He tin to th air ma ta e pla e in a s p rate e clo ure, f rom whic th air c n b a mite to th te t

e clo ure thro g a v lv alowin g o distrib tio of h atin air o er th c p citors

The ca acitors are mou ted in a p sition most con u tive to the le kage of impreg ant or

f il n material The distan e b twe n c l n rical ca acitors s al b not les than their

diameter, an the distan e b twe n rectan ular ca acitors s al b not les than twice the

s orter side of their b se

The temp rature sen itive element of a temp rature recordin in trument is at ac ed half way

up the side of the case of the ca acitor with the lowest value of tan ent of los an le

The thermostat is set at 15 °C b low test temp rature, an ca acitors s al then b energized

(se An ex A) Durin the f irst 14 h, the dif feren e b twe n test temp rature an the

in ication of the temp rature recordin in trument is noted, an adju tments are made to

en ure the temp rature of e c ca acitor case is at test temp rature (

0

5+

−

°C)

The test is then contin ed to the en of the a pro riate time without further adju tment of the

thermostat, the time b in me s red f rom the f irst energization of the ca acitors

The man facturer is req ired to car y out dai y p riodic tests on ca acitors in ac ordan e with

the test of 15.2 but without the test of 15.1

C.2 Conf ormity of production testing

Al prod ction ca acitors are tested ac ordin to the f olowin req irements

a) Hig -voltage test b twe n terminals in ac ordan e with 14.1, but f or a minimum p riod of

2 s

b) Hig -voltage test b twe n terminals an case of 2 0 0 V r.m.s or (2 U

n + 1 0 0) V,

whic ever is the gre ter, f or a minimum p riod of 2 s

NOT – This te t is n t n c s ary if th c p citor c s is ma e e tirely of in ulatin material

c) Ca acitan e an tan ent of los an le at a minimum f req en y of 1 kHz

The l mit of los an le u ed by the man f acturer is declared up n req est

NOT A minimum fe u n y of kHz is c o e to pro id a b ter in ic tio of p te tial f aults th t c uld

re ult in field f aiure

It is recommended that the man facturer also car ies out a tan ent of los an le test on the

ca acitor elements b fore as embly This is to avoid the eff ect of variation in resistan e an

u certainty of me s rement cau ed by the ca acitor wirin an con tru tion

More ver, as sampl n , it is recommen ed to c ec the dis harge resistan e value to en ure

that the req irements of Clau e 1 are met

rmsA

D.1.2 Calc lation for a giv n c pa ita c v lue (C)

CI

T

tV

I

dd

2

Cp

2

T

62

IECU

μV2

d

d

=

tV

,1

rmsA

I=

max 16 A

A52

1551

T

,,

2 ,5 > 16 then I = 16 A

A

3 52

15

dd

CI

μH69

15

2

6 02

3 56

15

1622

×

=

EF

+AMD1:2 15 CSV  IEC 2 15

D.2 Test a cording to clause 18.1.3 high r.m.s cur e t test

D.2.1 Input data

(A μF)d

tV

d

rmsA

D.2.2 Calc lation

IC

T

tV

CI

dd

C

×

=

6C

=

ECfI

U

2

CT

f

22

Cp

f= 10 kHz

μV

15

dd

=

tV

3

rmsA

I=

A4

153

T

=

×

=I

V5

μH

176

15

2 52

+AMD1:2 15 CSV  IEC 2 15

+AMD1:2 15 CSV  IEC 2 15

+AMD1:2 15 CSV  IEC 2 15