Iec 61069 1 2016

ba ic control s stem b sic dis rete control s stem BDCS an /or b sic proces control s stem BPCS 3.1.12 ba ic dis rete control s stem BDCS s stem whic resp n s to input sig als from the m

Industrial-process measurement, control and automation – Evaluation of sy stem

properties for the purpose of sy stem assessment –

Part 1: T erminology and basic concepts

des propriétés d'un sy stème en vue de son évaluation –

Partie 1: T erminologie et principes de base

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Industrial-process measurement, control and automation – Evaluation of sy stem

properties for the purpose of sy stem assessment –

Part 1: T erminology and basic concepts

des propriétés d'un sy stème en vue de son évaluation –

Partie 1: T erminologie et principes de base

Warnin ! Mak e s re th t y ou o tain d this publc tion from a a thorize distributor

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insid

CONTENTS

FOREWORD 4

INTRODUCTION 6

1 Sco e 8

2 Normative referen es 8

3 Terms, definition , a breviated terms, acron ms, con ention an s mb ls 9

3.1 Terms an definition 9

3.2 Ab reviated terms, acron ms, con ention an s mb ls 16 3.3 Explanation of terms with regard to BCS con e ts 17 4 Basis of an as es me t 18 5 As es ment con ideration 19 5.1 Basic c ntrol system (BCS) 19 5.1.1 Overview 19 5.1.2 Proces / mac ine interface fu ctions 2

5.1.3 Data proces in fu ction 2

5.1.4 Commu ication fu ction 21

5.1.5 Human interface fu ction 21

5.1.6 External s stem interface fu ction 21

5.2 Sy tem pro erties 21

5.2.1 Ov rview 21

5.2.2 Functional ty 21

5.2.3 Performance 21

5.2.4 Dep n abi ty 21

5.2.5 Op ra i ty 2

5.2.6 Sy tem safety 2

5.2.7 Other s stem pro erties 2

5.3 Influen in factors 2

An ex A (informative) Examples of Influen in factors (information from IEC TS 6 6 3-1) 2

A.1 General 2

A.2 influen in factors 2

A.2.1 In tal ation en ironment 2

A.2.2 Cor osive an erosive influen es 2

A.2.3 Integration of s b-s stems 2

A.2.4 Earth con ection 2

A.2.5 Power s p ly 2

A.2.6 Cl matic con ition 30 A.2.7 EMC req irements 31

A.2.8 Mec anical vibration 4

Bibl ogra h 4

Fig re 1 – General layout of IEC 610 9 7

Fig re 2 – Relation hip of terms with regard to SRD an SSD 17 Fig re 3 – Relation amon fu ction, mod le an element 18 Fig re 4 – Model of b sic control s stems 2

Fig re 6 – Sources of influen in factors 2

Ta le 1 – Influen in factors examples 2

Ta le A.1 – Con entration of gas an va our contaminants (in cm 3 /m 3 ) 2

Ta le A.2 – Aerosol contaminants 26 Ta le A.3 – Cl matic con ition p rameters an severities for clas es of location 31

Ta le A.4 – Test levels for RF field 3

Ta le A.5 – Test levels for electrical fast tran ientburst 3

Ta le A.6 – Test levels for s rge protection 3

Ta le A.7 – Test levels for RF in u ed disturb n es 3

Ta le A.8 – Test levels for p wer freq en y mag etic field 38 Ta le A.9 – Test levels for pulse mag etic field 3

Ta le A.10 – Test levels for damp d os i atory mag etic field 3

Ta le A.1 – Test levels for voltage dips 4

Ta le A.12 – Test levels for s ort inter uption 4

INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 1: Terminology and basic concepts

1) Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org nizatio for sta d rdizatio c mprisin

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p te t rig ts IEC sh l n t b h ld resp nsible for id ntifyin a y or al su h p te t rig ts

International Stan ard IEC 610 9-1 has b en pre ared by s bcommite 6 A: Sy tem

asp cts, of IEC tec nical commite 6 : In u trial-proces me s rement, control an

automation

This secon edition can els an re laces the first edition publ s ed in 19 1 This edition

con titutes a tec nical revision

This edition in lu es the fol owin sig ificant tec nical c an es with resp ct to the previou

edition:

a) Re rganization of the material of IEC 610 9-1:19 1 to ma e the overal set of stan ard

more organized an con istent;

b) IEC TS 6 6 3-1:2 14 has b en in orp rated into this edition

The text of this stan ard is b sed on the fol owin doc ments:

Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on

votin in icated in the a ove ta le

This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 610 9 series, publ s ed u der the general title Industrialp roces

me sureme nt, co trol a d au tomato – Ev luato ofsystem p rop ertes for th p u rp ose of

system as es me t, can b fou d on the IEC we site

The commit e has decided that the contents of this publcation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/ we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

• reconfirmed,

• with rawn,

• re laced by a revised edition, or

• amen ed

IMPORTANT – Th 'colour in ide' logo on the cov r pa e of this publ c tion indic te

that it contains colours whic are consid re to be us ful for the cor e t

understa ding of its conte ts Us rs s ould therefore print this doc me t usin a

colour printer

INTRODUCTION

IEC 610 9 de ls with the method whic s ould b u ed to as es s stem pro erties of a

b sic control s stem (BCS) IEC 610 9 con ists of the folowin p rts:

Part 1: Terminolog an b sic con e ts

Part 2: As es ment methodolog

Part 3: As es ment of s stem fu ctional ty

Part 4: As es ment of s stem p rforman e

Part 5: As es ment of s stem de en a i ty

Part 6: As es ment of s stem o era i ty

Part 7: As es ment of s stem safety

Part 8: As es ment of other s stem pro erties

As es ment of a s stem is the ju gement, b sed on eviden e, of the s ita i ty of the s stem

for a sp cific mis ion or clas of mis ion

To o tain total eviden e would req ire complete evaluation ( or example u der al influen in

factors) of al s stem pro erties relevant to the sp cific mis ion or clas of mis ion

Sin e this is rarely practical, the rationale on whic an as es ment of a s stem s ould b

b sed is:

– the identification of the imp rtan e of e c of the relevant s stem pro erties;

– the plan in for evaluation of the relevant s stem pro erties with a cost ef ective

dedication of ef ort to the variou s stem pro erties

In con u tin an as es ment of a s stem, it is cru ial to b ar in min the ne d to gain a

maximum in re se in confiden e in the s ita i ty of a s stem within practical cost an time

con traints

An as es ment can only b car ied out if a mis ion has b en stated (or given), or if an

mis ion can b h p thesized In the a sen e of a mis ion, no as es ment can b made;

however, examination of the s stem to gather an organize data for a later as es ment done

by others is p s ible In s c cases, the stan ard can b u ed as a g ide for plan in an

evaluation an it provides method for p rformin evaluation , sin e evaluation are an

integral p rt of as es ment

In pre arin the as es ment, it can b dis overed that the definition of the s stem is to

nar ow For example, a faci ty with two or more revision of the control s stems s arin

resources, e.g a network, s ould con ider is ues of co-existen e an inter-o era i ty In this

case, the s stem to b in estigated s ould not b l mited to the “new” BCS; it s ould in lu e

b th That is, it s ould c an e the b u daries of the s stem to in lu e enou h of the other

s stem to ad res these con ern

The p rt stru ture an the relation hip amon the p rts of IEC 610 9 are s own in Fig re 1

Figure 1 – Ge eral la out of IEC 610 9

Some example as es ment items are integrated in An ex A

IEC

Part 1: T rmin logy an basic co ce t s

Part 2: As es me t met ho ology

Part s 3 t o 8: As ses me t of each s yst em pro ert y

• Ge eric re uireme t of proce ure of as es me t

‐ Overview, ap roa h an p ases

‐ Re uireme t s for ea h p ase

‐ Ge eral d scriptio of ev luatio tech iq es

• Basics of as es me t sp cific to ea h pro ery

‐ Pro er ies an in u ncin factor

• As es me t meth d for ea h pro ery

• Ev luatio tech iq esfor ea h pro ery

IEC 6 0 9: Indust rial-proces measurement , cont oland automat ion –

Evaluat ion of systemproper ies f or the purpose of systemas es ment

INDUSTRIAL-PROCESS MEASUREMENT, CONTROL AND AUTOMATION –

FOR THE PURPOSE OF SYSTEM ASSESSMENT –

Part 1: Terminology and basic concepts

This p rt of IEC 610 9 defines the terminolog an outl nes b sic con e ts in the as es ment

of a b sic proces control s stem (BPCS) an a b sic dis rete control s stem (BDCS) These

two general s stem typ s cover the are s of dis rete, b tc an contin ou a pl cation In

IEC 610 9 these two, BPCS an BDCS, together are refer ed to as "b sic control s stem(s)",

A BCS with a safety integrity level (SIL) or p rformin an safety in trumented fu ction (SIF)

is not covered by IEC 610 9, where SIL is defined by IEC 615 8-4 an SIF is defined by

IEC 6151 -1

This p rt of IEC 610 9 is inten ed for the u ers an man facturers of s stems, an also for

those who are resp n ible for car yin out as es ments as an in e en ent p rty

The folowin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 610 0-4-2, Ele ctroma n tc com patb il y (EMC) – Part 4-2: Testn a d me asureme t

tech iqu e s – Electrostatc dis h rg immu niy test

IEC 610 0-6-4:2 0 , Ele ctroma n tc comp atb il y (EMC) – Part 6-4: G en ric sta dards –

Emis io sta dard for industrial e viro me ts

IEC 610 0-6-4:2 0 /AMD1:2 10

IEC 615 8-4:2 10, Functo al safety of electrical/electro ic/programmab le ele ctro ic saf

ety-re lated systems – Part 4: D efini o s a d ab b re iato s (se htp:/www.iec.c / u ctionalsafety)

IEC 6151 -1:2 0 , Functo al safety – Safety instru me ted systems for th p roces industry

s ector – Part 1: Framework, defini o s, system, h rdware a d software re u ireme ts

3 Terms, definitions, abbreviated terms, acronyms, conventions and s mbols

3.1 Terms a d definitions

For the purp se of this doc ment, the fol owin terms an definition a ply

3.1.1

a c ra y

closenes of agre ment b twe n the res lt of a me s rement / output an the (con entional)

true value of the q antity b in me s red / calc lated

3.1.2

assessme t, <of a s stem>

proces of ju gement, b sed on eviden e, s ita i ty of a s stem, for a sp cific mis ion or

clas of mis ion

[SOURCE: ISO 15 13:2 0 , 3.3, modified – “comp ten y again t pres rib d stan ard of

p rforman e” re laced with “, b sed on eviden e, s ita i ty of a s stem, for a sp cific

[SOURCE: ISO/IEC Guide 2:2 0 , 4.5, modified – The term itself has b en modified (ad ition

of "as es ment") an ad ition of the word “of as es ment” at the en of the definition]

doc mented plan of co rdinated set of as es ment activities, not neces ari y interde en ent,

that contin e over a p riod of time an are desig ed to con u t the as es ment

a i ty of an item to b in a state to p rform a req ired fu ction u der given con ition at a

given in tant or over a given time interval, as umin that the req ired external resources are

provided

[SOURCE: IEC 6 0 0-19 :2 15, 19 -01-2 , modified – The definition has b en exten ed]

ba ic control s stem

b sic dis rete control s stem (BDCS) an /or b sic proces control s stem (BPCS)

3.1.12

ba ic dis rete control s stem

BDCS

s stem whic resp n s to input sig als from the mac ine(s), its( heir) as ociated eq ipment,

other programma le s stems an /or an o erator an generates output sig als cau in the

mac ine(s) an its( heir) as ociated eq ipment to o erate in the desired man er but whic

do s not p rform an fu ctional safety fu ction with a claimed SIL ≥ 1, re lzin the

mis ion(s) an task(s)

[SOURCE: IEC 6151 -1:2 0 , 3.2.3, modified – In the term, "proces " re laced by "dis rete"

an acron m cor ected to “BDCS” In the definition, “ he proces , its as ociated equipment”

an “safety in trumented fu ction ” re laced with “ he mac ine(s), its ( heir) as ociated

eq ipment” an “ u ctional safety fu ction ”, resp ctively

3.1.13

ba ic proc s control s stem

BPCS

s stem whic resp n s to input sig als from the proces , its as ociated eq ipment, other

programma le s stems an /or an o erator an generates output sig als cau in the proces

an its as ociated eq ipment to o erate in the desired man er

[SOURCE: IEC 6151 -1:2 0 , 3.2.3]

3.1.14

c pa ity

n mb r of information tran lation whic the s stem is a le to exec te without negatively

imp ctin an other s stem ca a i ties

Note 1 to e try: Ca a ity ma b e.g

1) q a tity of informatio tra slatio s, of some ty e within a d fin p rio of time or

2) q a tity of informatio tra slatio s, of some ty e or

3) q a tity of informatio tra slatio s or

extent to whic the s stem provides fu ction to p rform in u trial-proces me s rement an

control tasks

3.1.18

configurabi ty

extent to whic the s stem faci tates selection, set in up an ar an ement of its mod les to

p rform the given tasks

3.1.19

cre ibi ty

extent to whic a s stem is a le to recog ize an sig al the state of the s stem an to

with tan in or ect inputs or u authorized ac es

finite ran e of values of the input varia le within whic a variation of the input varia le do s

not prod ce an me s ra le c an e in the output varia le

Note 1 to e try: Wh n this ty e of c ara teristic is inte tio al it is sometimes c le a n utral zo e

[SOURCE: IEC 6 0 0-3 1:2 13, 3 1-4 -15]

3.1.2

depe d bi ty

extent to whic a s stem can b reled up n to p rform ex lu ively an cor ectly a task u der

given con ition at a given in tant of time or over a given time interval, as umin that the

req ired external resources are provided

3.1.2

ef icie c

extent to whic the o eratin me n provided by the s stem minimise o erator time an efort

req ired in u in the s stem to ac ompl s his tasks within stated con traints

3.1.2

eleme t

p rt of s stem providin a sin le fu ction that is in ivisible an can b in ivid al y con idered

an tested, comprised of hardware an /or sofware

3.1.2

e aluation, < f a s stem pro erty>

s stematic determination of the extent to whic a s stem pro erty me ts its sp cified criteria

[SOURCE: ISO/IEC 12 0 :2 0 , 4.12, modified – Sp cific u e of the term ( < f a s stem>”)

ad ed an “an entity” re laced with “a s stem pro erty”]

phenomenon re resented by a c aracteristic c rve whic has a bran h, cal ed as en in

bran h, for in re sin values of the input varia le, an a diferent bran h, cal ed des en in

bran h, for decre sin values of the input varia le

information tra slation

con ersion or con eyan e of information enterin the s stem or mod le at its b u dary into

derived information exitin the s stem or mod le at its b u dary

Note 1 to e try: Informatio tra slatio is a view of a fu ctio whic re rese ts a p rtic lar asp ct of th fu ctio

3.1.3

information tra slation fun tion

fu ction whic exec tes information tran lation

_ _ _ _

inte rity

as uran e provided by a s stem that the tasks wi b p rformed cor ectly, u les notice is

given of an state of the s stem whic could le d to the contrary

a i ty of a s stem u der given con ition of u e, to b retained in, or restored to, a state in

whic it can p rform a req ired fu ction, when maintenan e is p rformed u der given

con ition an u in stated proced res an resources

3.1.4

me s reme t

proces of exp rimental y o tainin one or more q antity values that can re sona ly b

at ributed to a q antity

Note 1 to e try: Me sureme t d es n t a ply to n min l pro erties

Note 2 to e try: Me sureme t imples c mp riso of q a tities, in lu in c u tin of e tities

Note 3 to e try: Th Fre c word "mesure" h s se eral me nin s in e ery a Fre c la g a e It is for this

re so th t th Fre c word "mesura e" h s b e intro u e to d scrib th a t of me sureme t Ne erth les ,

th Fre c word "mesure" o c rs ma y times in formin terms, folowin c r e t usa e, a d with ut ambig ity

Ex mples are: u ité d mesure (u it of me sureme t, méth d d mesure (me sureme t meth d), instrume t d

mesure (me sureme t instrume t This d es n t me n th t th use of th Fre c word "mesura e" in pla e of

"mesure" in su h termsis n t p rmis ible wh n a v nta e us

[SOURCE: ISO/IEC Guide 9 :2 0 , 2.1, modified – Note 3 to entry modified

mathematical or ph sical re resentation of a s stem or a proces , b sed with s ficient

precision up n known laws, identification or sp cified s p osition

operabi ity

extent to whic the o eratin me n provided by the s stem are eficient, intuitive,

tran p rent an ro u t to ac ompls the o erators’ tasks

3.1.4

operatin con ition

con ition pres rib d for evaluatin the p rforman e of a me s rin in trument or me s rin

s stem or for comp rison of me s rement res lts with influen in factors in place

[SOURCE: ISO/IEC Guide 9 :2 0 , 4.1 , modified – Term modified (" eferen e" removed

from term) an Notes 1 an 2 to entry removed

rel abi ity

a i ty of an item to p rform a req ired fu ction u der given con ition for a given time

interval

[SOURCE: IEC 6 0 0-19 :2 15, 19 -01-2 ]

3.1.51

repe tabi ty er or

alge raic diferen e b twe n the extreme values o tained by a n mb r of con ec tive

me s rements of the output over a s ort p riod of time for the same value of the input u der

the same o eratin con ition , a pro c in from the same direction, for ful ran e traverses

Note 1 to e try: Re e ta i ty eror is usu ly e pres e in p rc nta e of sp n a d d es n t in lu e h steresis

time interval b twe n the initiation of an information tran lation an the in tant when the

as ociated resp n e is made avaia le u der defined con ition

ro ustn s

extent to whic the s stem cor ectly interprets an resp n s to o erator action p rformed,

u in u ambig ou method an proced res, an removes ambig ities by providin

Note 1 to e try: Th d finitio of “safety” in c mbin tio with oth r words ma gra u ly (as in “pro u t safety”,

“ma hin ry safety”) or c mpletely (as in “work rs safety”, “safety b lt” or “fu ctio al safety”) c a g For th use of

th word safety, se ISO/IEC Guid 51:2 14, Cla se 4 [ISO/IEC Guid 2, S ta dardiz to a d related ac tivi es –

G en ral v c ab ulary]

Note 2 to e try: In sta d rdizatio th safety of pro u ts, pro es es a d servic s is g n raly c nsid re with a

view to a hie in th o timum b la c of a n mb r of fa tors, in lu in n n-e h ic l fa tors su h as h ma

b h vio r, th t wi elmin te a oid ble risks of h rm to p rso s a d g o s to a a c pta le d gre

dis rete level (one out of a p s ible four), cor esp n in to a ran e of safety integrity values,

where safety integrity level 4 has the hig est level of safety integrity an safety integrity

level 1 has the lowest

Note 1 to e try: Th targ t faiure me sures (se IEC 615 8-4:2 10, 3.5.17) for th fo r safety inte rity le els are

sp cifie inTa les 2 a d 3 of IEC 615 8-1:2 10

Note 2 to e try: Safety inte rity le els are use for sp cifyin th safety inte rity re uireme ts of th safety

fu ctio s to b alo ate to th E/E/P safety-relate systems

Note 3 to e try: A safety inte rity le el (SIL) is n t a pro erty of a system, su system, eleme t or c mp n nt

Th c re t interpretatio of th p rase “SIL n safety-relate system” (wh re n is 1, 2, 3 or 4) is th t th system is

p te tialy c p ble of su p rtin safety fu ctio s with a safety inte rity le el u to n

[SOURCE: IEC 615 8-4:2 10, 3.5.8]

3.1.5

s c rity

fre dom from u ac e ta le risk to the ph sical u its con idered from the outside

Note 1 to e try: In ma y oth r la g a es th n En lsh th re is o ly o e word for safety a d se urity

Note 2 to e try: Se urity in th c nte t of this d c me t is a g n ral term e c mp s in p ysic l se urity,

informatio se urity, c b r se urity a d oth rs

[SOURCE: IEC 6 0 0-3 1-0 :2 13, 3 1-5 -0 , modified – Note 2 to entry ad ed

[SOURCE: IEC 8 0 5-1:2 01, 3.4.5, modified – "s stem" ad ed to term.

3.1.6

s stem pro erty

defined p rameter s ita le for the des ription an dif erentiation of BCS(s)

[SOURCE: ISO/IEC Guide 7 -2:2 0 , 2.18, modified — "s stem" ad ed to term, “prod cts”

re laced with “BCS(s)” an notes to entry removed

extent to whic the s stem itself as a ph sical entity wi not imp se a hazard

Note 1 to e try: System safety d es n t in lu e th safety of th pro es or e uipme t u d r c ntrol

Note 2 to e try: System safety d es n t in lu e fu ctio al safety

extent to whic the o erating me n provided by the s stem a p rently places the o erator in

direct contact with his tasks

3.2 Ab re iate terms, a ron ms, conv ntions a d s mbols

This l stin en omp s es terms, acron ms, con ention an s mb ls u ed in IEC 610 9-1

throu h IEC 610 9-8

BCS b sic control s stem

BDCS b sic dis rete control s stem

BPCS b sic proces control s stem

CRT Cathode Ray Tub

EDI Electronic Data Interc an e

E/E/PE electrical/electronic/programma le electronic

GPS Glo al p sitionin s stem

I/O Input an Output

IEC International Electrotec nical Commite

ISO International Organization for Stan ardization

PID Pro ortional-Integral-Derivative

QA Qual ty As uran e

QM Qual ty Management

SAT Site Ac e tan e Test

SIL safety integrity level

SRD s stem req irements doc ment

SSD s stem sp cification doc ment

TCP/IP Tran mis ion Control Protocol / Internet Protocol

ZVEI German Electrical an Electronic Man facturers' As ociation

3.3 Expla ation of terms with re ard to BCS con epts

Fig re 2 provides a pictorial re resentation of the relation hip b twe n the Sy tem

Req irements Doc ment (SRD) an the Sy tem Sp cification Doc ment (SSD) of the BCS

The hierarc y of ca a i ty of b th the req irements an re l zation is s own

Fig re 2 also s ows ma pin s of lower level req irements an how they are re l zed in the

s stem

The SRD des rib s the mis ion an ne d of the BCS from the target a pl cation stan p int

The SSD des rib s the implementation b sed on the ne d as des rib d in the SRD

Fig re 2 – Relations ip of terms with re ard to SRD a d SSD

Sy tem Spe ific tio Doc ment

Figure 3 – Relation among function, module a d eleme t

4 Ba is of an assessment

The purp se of the as es ment of a s stem is to determine q al tatively an /or q antitatively

the ca a i ty of the s stem to ac ompl s a sp cific mis ion

As es ment of a s stem is ju gement, b sed on eviden e, of s ita i ty of relevant s stem

pro erties for a sp cific mis ion or clas of mis ion

To o tain total eviden e would req ire complete (i.e u der al influen in factors) evaluation

of al s stem pro erties of relevan e to the sp cific mis ion or clas of mis ion

Sin e total eviden e is rarely practical, an as es ment of a s stem ne d :

– to identify the critical ty of the relevant s stem pro erties to ac ompl s the mis io ;

– to plan for evaluation of the relevant s stem pro erties with a cost ef ective d dication

of ef ort to the variou s stem pro erties

In con u tin the as es ment of a s stem, it is cru ial to b ar in min the ne d to gain a

maximum in re se in confiden e in the s ita i ty of a s stem within practical cost an time

con traints

To ac ompl s a mis ion, a s stem is exp cted to b ca a le of p rformin the tasks

neces ary to s p ort the mis ion, s c as reg latin pres ures or flows, o timizin re ctor

con ition , etc

The s stem is exp cted to provide the fu ction to ena le these tasks to b p rformed Su h

fu ction are, for example, those for me s rin flows, storin data an displayin information

These fu ction are implemented in mod les an elements An element can b a piece of

hardware, an orifice plate, an analog e to digital con ertor, or a piece of sofware p rformin

a flow calc lation, storin a picture-image, etc BCSs p rform the tasks req ired, u in th

avai a le fu ction , mod les, an elements in variou co fig ratio s This c aracteristic of

the s stem ma es it dific lt to s nthesize the ca a i ty of a s stem to fulfi a sp cific task

by evaluatin the c aracteristic of the in ivid al constitue t fu ction , mod les, an

When con u tin the as es ment of a s stem, other a pro riate stan ard an g ides s ould

b a pl ed where these are avaia le

To faci tate the as es ment of a s stem, the s stem pro erties s ould b segregated into

related groups sp cified in this p rt of IEC 610 9 This is esp cial y u eful in those cases

where not al asp cts ne d to b , or can b , evaluated The b u daries of the s stem to b

as es ed s al b cle rly defined an the con ition at these b u daries s ould b sp cified

These con ition can influen e the b haviour of the s stem

The s o e of the as es ment of a s stem largely de en s on the mis ion an b u daries of

the s stem, the influen in factors an the o jective of the as es ment

The s o e of the as es ment can b con eniently s mmarized in the form of a matrix, l stin

on one axis the s stem pro erties an on the other axis the influen in factors to b

con idered This matrix can b u ed to note whic of the influen in factors is to b

con idered for e c s stem pro erty

NOT Oth r re o nise as es me ts are a aia le a d c re tly use for systems in lu in BCS oth r th n th

proto ol giv n in IEC610 9 IEC 6 3 0-3-1 c n b c nsulte for a lst of meth d lo ies

5 As essme t c nsiderations

5.1 Basic control system (BCS)

5.1.1 Ov rview

A s stem ac ompl s es its mis ion by me n of the interaction of its mod les, with fu ction

of e c mod le These mod les are either central zed in one location or decentral zed in

several location

The ca a i ty of a s stem to ac ompls the mis ion can ot b as es ed by s nthesizin the

data o tained from evaluation of the pro erties of the in ivid al mod les an elements only

However these evaluation can provide u eful an p rha s neces ary inputs to the

as es ment of a s stem

Man of the s stem pro erties are derived from the interaction of the mod les

In stru turin the s stem, a fu ctional model provides a u eful to l to identify an clas ify the

variou fu ction an s bfu ction of the s stem to b evaluated for the as es ment

In a general zed fu ctional model of a s stem the fol owin fu ction can b identified

(se Fig re 4):

– Proces /mac ine interface functio s;

– data proces in functio s;

– commu ication functio s;

– h man interface fu ctio s;

– external s stem interface fu ction

Fig re 4 – Model of ba ic control s stems

Eac in ivid al fu ction may b distributed b twe n distin tly diferent mod les

It is p s ible to re l ocate d namical y e c mod le to p rform a distin t dif erent fu ction at

another moment in time

For example, a control fu ction can b resident in or s ared b twe n:

– a mod le with its own data ac uisition an re l time tren in cap bi ty;

– a mod le for proces control with se arate mod les for data acquisition an data output,

tran fer in data to e c other via a commu ication network; or

– an external computer for proces control tasks, ma in u e of a BCS to p rform data

ac uisition, data output an h ma interface tasks

The fu ctional model faci tates a cle r des ription of the b u daries of the s stem to b

as es ed an serves to identify the elements whic are within the s o e of as es ment

The fu ctional model also s ows the relation hip b twe n the elements, an it s p orts the

formulation of method to as es the efectivenes of the fu ction within the s stem

5.1.2 Proc s / machine interfa e fun tions

The proces / mac ine interface fu ction receive sig als from the proces / mac ine or their

as ociated eq ipment, an sen output sig als to the proces / mac ine or their as ociated

eq ipment

5.1.3 Data proc s ing fun tion

The data proces in fu ction can b u ed for contin ou control, b tc control, dis rete

control, re ortin , arc ivin an /or tren in , etc They act to proces an tran form

information provided by the proces /mac ine interface fu ction

The data proces in fu ction can b dedicated to in ivid al tasks or they can s p ort a

combination of tasks req ired to ac ieve the s stem mis ion

5.1.4 Communic tion fun tion

The commu ication fu ction provide the commu ication b twe n mod les an elements

The fu ction can b distributed over the s stem b in implemented as dedicated hardware

an sofware in e c mod le

5.1.5 Huma interfa e functions

The h man interface fu ction provide o erators, en ine rs, tec nologists, maintenan e

p rson el an management p rson el with ac es to the BCS The fu ction can b resident

in a sp cific element or distributed b twe n several elements

5.1.6 Extern l s stem interfa e functions

The external s stem interface fu ction ac es an con ert data avai a le in the external

s stem into a s stem sp cific protocol an format an vice versa

The external s stem interface fu ction ac es an con ert data avai a le from/ o the

external s stem into a s stem sp cific protocol an format an vice versa

The as es ment s al in lu e evaluation of req irements sp cified by the national an

international stan ard an reg lation where a pl ca le

The evaluation method of a s stem pro erty an the criteria for its ju gement de en mu h

on the inten ed mis ion of the s stem to b evaluated

Fig re 5 – Sy tem pro ertie

5.2.2 Functional ty

Fu ctionalty is a s stem pro erty whic in icates the extent to whic the s stem provides,

an faci tates as embly of, fu ction to p rform tasks req ired by the s stem mis ion

5.2.3 Performanc

Performan e is a s stem pro erty whic in icates the precision an sp ed with whic the

s stem exec tes its tasks u der defined con ition

5.2.4 Dependabi ity

De en a i ty is a s stem pro erty whic in icates the extent to whic the s stem can b

IEC

System pro erties

5.2.5 Operabi ity

Op ra i ty is a s stem pro erty whic in icates the extent to whic the o eratin me n

provided by the s stem are ef icient, intuitive, tran p rent an ro u t to ac ompl s the

o erators’ tasks

5.2.6 Sy tem s fety

Sy tem safety is a s stem pro erty whic is a me s re of the extent to whic the s stem is

fre of hazard

5.2.7 Other s stem propertie

Other s stem pro erties are those not ad res ed in IEC 610 9-3 throu h IEC 610 9-7

Se IEC 610 9-8 for des ription of other s stem pro erties

Examples of other s stem pro erties in lu e the fol owin :

– q alty as uran e, etc

– s stem s p ort provided by the ven or an by the u er, doc mentation, trainin , sp re

p rts, etc

– comp tibi ty of hardware an sofware, commu ication , etc

– ph sical pro erties s c as he t dis ip tion, weig t, etc

Eac other s stem pro erty l sted a ove may b divided into a n mb r of related

c aracteristic

5.3 Influe cing fa tors

Prior to the evaluation of the s stem pro erties, it is neces ary to define the ran e of

o eratin con ition whic the s stem is to with tan d rin its mis ion p riod

The influen in factors are group d by their sources (se Fig re 6):

– the s stem mis ions / tasks imp sed on the s stem;

– the p rson el interfacin with the s stem;

– the proces /mac ine connected to the s stem;

– the infrastru tures servin the s stem;

– the en ironment in whic the s stem is placed;

– the external s stems con ected to the s stem

Figure 6 – Sourc s of influ ncing fa tors

For e c of the sources given a ove, there are a n mb r of influen in factors of whic

Table 1 – Influe cing fa tors e ample

Mis io s / Tasks • Nature ( e.g c ntin o s, b tc , discrete)

• Sc p (e.g sin le,multiple)

• Mo e of o eratio (e.g start u , sh t d wn, n rmal emerg n y)

• Mo e of su ervisio (e.g.c ntin o s, semi-c ntin o s, u ma n d)

• Materials in th pro es

Infrastru tures

• Time of o eratio (e.g e p cte lfe, d ty time)

• Extreme clmatic c n itio s (e.g water immersio , saln water, c rosiv

su sta c s, d st

• Me h nic l c n itio s (e.g p ysic l sp c , mo ntin meth d, me h nic l forc

(e.g sh c , vibratio , a c leratio )

• Ele troma n tic interfere c (e.g ele trostatic disc arg , ra io-re u n y

ele troma n tic field)

• Me h nic l forc (e.g sh c , vibratio , a c leratio )

• Biolo ic l h zard (e.g v rmin infestatio , fu gi)

Extern l systems

• Comma ds (a th rize , u a th rize , false)

• Interfere c (ele tric l n ise)

• Extern lse urity thre ts

Ap rt from the a ove-mentioned external influen in factors, the b haviour of the s stem is

also afected by:

– faults or er ors existin in or arisin within the s stem itself; and

– the s stem’s l mitatio s a d c aracteristic , e.g l ce sing, instal atio , o erating

g id l n s, etc

These b haviours are de lt with u der the s stem pro erties of de en a i ty an other

s stem pro erties

It is rarely cost efective to as es the efect of al influen in factors

Therefore a ju gement as to the de th of evaluation neces ary s al b made This ju gement

s ould ta e into con ideration the exp cted sen itivity of the s stem to the variou influen in

factors, the critical ty of the s stem mis ion, an the resources avaia le for the

as es ment.An ex A des rib s some examples of influen e factor

Annex A

(informativ )

Examples of Influencing factors (information from IEC TS 62603-1)

An ex A provides some examples a out Influen in factors related to this p rt of IEC 610 9

whic were extracted from IEC T 6 6 3-1

The clas ification of values of pro erties des rib d in this doc ment are only examples

A.2 influencing factors

A.2.1 Instal ation e vironme t

This c a ter des rib s the general c aracteristic of the en ironment in whic the BPCS an

its comp nents are in tal ed

The o eratin con ition for the BPCS comp nents are divided into four main categories,

ac ordin to the clas ification made by the IEC 6 6 4 series of stan ard :

• the cl matic con ition of the location in whic the comp nents are in taled (i.e

temperature, h midity, etc.);

• the p wer s p ly to whic the comp nents are con ected: electrical specification of the

p wer s p ly an the EMC req irements in terms of immu ity an emis ion;

• mec anical influen es to whic the comp nents are exp sed d rin their o eration (i.e

vibration, s ock, etc.);

• cor osive an erosive influen es to whic the comp nents are exp sed d rin their

o eration (i.e san , gases, cor osive l q id , etc.)

A.2.2 Cor osiv a d erosiv influe ce

A.2.2.1 Ge eral

There is a bro d distribution of contaminant con entration an re ctivity levels existin

within in u tries u in proces me s rement an control eq ipment Some en ironments are

severely cor osive whi e others are mi dly cor osive Th s, as re orted in IEC 6 6 4-4, there

are four diferent clas es of en ironment ac ordin to the contaminant severity levels:

– Clas 1: in u trial cle n air: an en ironment s f iciently wel control ed that cor osion is

not a factor in determinin eq ipment rel a i ty,

– Clas 2: moderate contamination: an en ironment in whic the efects of cor osion are

me s ra le an may b a factor in determinin eq ipment rela i ty,

– Clas 3: he v contamination: an en ironment in whic there is a hig pro a i ty that

cor osive at ack wi oc ur These hars levels s ould prompt further evaluation res ltin

in en ironmental controls or sp cialy desig ed an p ck ged eq ipment,

– Clas 4: sp cial: an en ironment in whic the levels of contaminants are hig er than in al

the other clas es

A.2.2.2 Ga e a d v pours

The clas es in Ta le A.1 recog ize that average con entration and p a values s al b th

Chemical agents (e.g SO2 or HF) may vary gre tly in their re ctivity rate over a ½ h p riod.

Therefore, the relation hip of p a value to average value may vary with e c contaminant

The clas ification of en ironment by category s ould b determined by the hig est clas if

average an p a values are not in the same category

Table A.1 – Con e tration of ga a d v pour contamin nts (in cm

3

/m3

Aerosols are l q id car ied in gas or air in the form of smal dro lets generatin mists Two

common examples of a rosols are clas ified “oi s in air an “se salt mists”

For oi s in air, the clas es are defined as re orted in Ta le A.2

Table A.2 – Aerosol contamina ts

Cla s 1 Cla s 2 Cla s 3 Cla s 4

Ois (µg/k -dry air) < 5 < 5 < 5 0 > 5 0

For se salt mists the clas es are defined as l sted b low:

• Clas 1: location ne r se co sts more than 0,5 km away from the se

• Clas 2: on the se co st (les than 0,5 km away)

• Clas 3: of -s ore in talation

A.2.2.4 Sol d s bsta c s

There is no p s ibi ty to clas ify the en ironments ac ordin to the levels of sol d s bstan es

that are afectin the in talation For s c a re son, the way to define the contamination of

the en ironment by me n of sol d s bstan e is to an wer a l st of q estion :

• nature of sol d s bstan es in the en ironment whic could afect the in truments an

• freq en y of oc ur en e: i.e contin ou , oc asional, u u ual, etc.

• average p rticle size: i.e < 3 µm, b twe n 3 µm an 3 µm, more than 0,3 mm, etc

• con entration in mg/kg of dry air: this a pl es only to airb rne sol d p rticles

A.2.2.5 Liquids

There is no p s ibi ty to clas ify the en ironments ac ordin to the levels of l q id

s bstan es that are af ectin the in tal ation For s c a re son, the way to define the

contamination of the en ironment by me n of lq id s bstan es is to an wer a l st of

q estion :

• nature of lq id s bstan es in the en ironment whic could afect the in truments an

BPCS comp nents;

• freq en y of oc ur en e: i.e contin ou , oc asional, u u ual, etc

• electrical con u tivity

A.2.3 Inte ration of s b-s stems

Integration of s bs stems ne d a proced re for combinin se arately develo ed mod les of

comp nents so that they work together as a u iq e s stem A s bs stem is a set of

comp nents that o erates as a p rt of a s stem an that is ca a le of p rformin a sp cific

task within a s stem A s bs stem could b an existin s stem, whic me n that an alre d

in tal ed an o eratin s stem s ould b in lu ed in a new (larger) s stem

Another o tion is that a s bs stem has b en provided by other s p l ers an man factures

(i.e third p rty s bs stem)

A.2.4 Earth conne tion

IEC TS 61 4 defines thre clas es of e rth con ection for electrical devices or control

p nels These clas es are related to the typ of protection again t electric s ocks that is

req ired, as re orted b low:

• Clas I these a pl an es s al have their c as is con ected to electrical e rth (grou d) by

an e rth con u tor A fault in the a pl an e whic cau es a l ve con u tor to contact the

casin wi cau e a c r ent flow in the e rth con u tor The c r ent s ould trip either an

over c r ent device or a resid al c r ent circ it bre k r, whic wi c t of the s p ly of

electricity to the a pl an e

• Clas I a Clas 2 or double in ulated electrical a pl an e is desig ed in s c a way that

it do s not req ire (an s al not have) a safety con ection to electrical e rth (grou d)

• Clas I : desig ed to b s p l ed from a safety extra low voltage (SELV) p wer source

The voltage from a SELV s p ly is low enou h that u der normal con ition a p rson can

safely come into contact with it without risk of electric s ock The extra safety fe tures

bui t into Clas 1 an Clas 2 a pl an es are therefore not req ired

A.2.5 Power s pply

A.2.5.1 AC power s p ly

A.2.5.1.1 Ge eral

The values of the nominal voltages of the p wer s p ly are in ac ordan e with the

req irements of IEC 6 0 8 The al owed freq en ies are 5 Hz an 6 Hz an the nominal

voltages a plca le to PCSs are:

• 12 /2 0 V for sin le phase s stems (6 Hz),

• 2 0/4 0 V for thre phase s stems (5 Hz),

The AC p wer s p ly c aracteristic are: voltage, freq en y, harmonic distortion an

switc in time b twe n the p wer s p ly an the b ck-up p wer s p ly For e c

c aracteristic a set of dif erent clas es is defined, ac ordin to IEC 6 6 4-2

A.2.5.1.2 AC power volta e cla s s

Power voltages are clas ified in ac ordan e with the p rcentage of variation of the voltage

from its nominal value Four clas es are defined:

• Clas AC1: ± 1 % V

n m,

• Clas AC2: ± 10 % V

n m,

• Clas AC3: from 10 % V

n m

to -15 % V

n m,

• Clas AC4: from 15 % V

n m

to -2 % V

n m

A sp cial clas exists for the cases where the p wer s p ly voltages are not in lu ed in the

req irements of the a ove l sted clas es

A sp cial clas exists for the cases where the p wer s p ly freq en y is not in lu ed in the

req irements of the a ove l sted clas es

A.2.5.1.4 Harmonic conte t

The total harmonic distortion is defined as the p rcentage of the s uare ro t of the s m of

s uare the harmonic voltages divided by the fu damental p wer s p ly freq en y voltage

(r.m.s.), as re orted in the fol owin Formula

N

h

hh

VV

THD

1

10

22

is the RMS value of the fu damental voltage comp nent

Four clas es are defined:

• H1: harmonic content is les than 2 %,

• H2: harmonic content is les than 5 %,

• H3: harmonic content is les than 10 %,

• H4: harmonic content is les than 2 %

A sp cial clas exists for al the cases where the harmonic content is not in lu ed in the

A.2.5.1.5 Switc ing time

For a s stem with an au i ary or b ck-up p wer s p ly, switc in time is the time interval

b twe n the deviation of voltage in the primary s p ly that initiates switc in , an the

restoration of normal voltage by the au i ary s p ly Af er the switc in time, the voltage has

to b within the l mit values for the sp cified clas of p wer The value of deviation req ired to

initiate switc in is, in general, a c aracteristic of the switc in s stem

Five clas es for the switc in time are defined:

The DC p wer s p ly c aracteristic are: voltage, rip le an switc in time b twe n the

p wer s p ly faiure an an au i ary p wer s p ly ta in over For e c c aracteristic a set

of diferent clas es is defined, ac ordin to IEC 6 6 4-2

A.2.5.2.2 DC power volta e cla s s

DC p wer voltages are clas ified by their p rcent variation of the voltage from the nominal

value Four clas es are defined:

• DC1: ±1 % V

n m,

• DC2: from 10 % V

n m

to -15 % V

n m,

• DC3: from 15 % V

n m

to -2 % V

n m,

• DC4: from 3 % V

n m

to -2 % V

n m

A sp cial clas exists for al the cases where the voltage variation are not in lu ed in the

a ove l sted clas es

A.2.5.2.3 DC power volta e rip le cla s s

Rip le voltage is defined as the p rcentage of the p a - o-p a value of the total AC

comp nent of the p wer s p ly voltage to the me s red (average) p wer s p ly voltage, as

me s red at rated lo d Four clas es are defined:

• DC1: rip le voltage les than 0,2 %,

• DC2: rip le voltage les than 1 %,

• DC3: rip le voltage les than 5 %,

• DC4: rip le voltage les than 15 %

A sp cial clas exists for al the cases where the p wer s p ly rip le is not in lu ed in the

A.2.5.2.4 Switc ing time

For a s stem with an au i ary or b ck-up p wer s p ly, switc in time is the time interval

b twe n the deviation of voltage in the primary s p ly whic initiates switc in , an the

restoration of normal voltage by the au i ary s p ly Af er the switc in time, the voltage has

to b within the lmit values for the sp cified clas of p wer

Five clas es for the switc in time are defined:

A.2.6 Cl matic conditions

Con idered cl matic con ition are air temp rature, h midity an b rometric pres ure in the

sp cific location where the s stem an its comp nents are in tal ed L cation clas es are

clas ified into four severity levels that define the exp cted cl matic con ition of the site

L cation clas es a ply for o eration, storage an tran p rtation Sp cific clas es may a ply

for storage an tran p rtation as stated in IEC 6 7 1-3-1 an in IEC 6 7 1-3-2

L cation clas es are:

• Clas A: we ther-protected location , air-con itioned location In these location b th air

temp rature an h midity are controled within sp cified l mits;

• Clas B: we ther-protected location , he ted an /or co led en losed location In these

location only air temp rature is control ed within sp cified l mits;

• Clas C: we ther-protected location , s eltered an /or u he ted en losed location In

these location neither air temp rature nor h midity is control ed an eq ipment is

protected again t direct exp s re to s c cl matic elements as direct solar radiation,

rainfal , ful win pres ure, etc

• Clas D: non we ther-protected location , outdo r location In these location neither air

temp rature nor h midity are control ed an the eq ipment is exp sed to atmospheric

con ition s c as direct solar radiation, rainfal , ful win pres ure, etc

Ta le A.3 is extracted from IEC 6 6 4-1, an re orts the lmit values of the cl matic con ition

for e c location clas

Table A.3 – Cl matic condition parameters a d s v ritie for cla s s of loc tion

(3K1)

/

Axb)

/

/ B1

(3K2)

/ B2

/

/ C1

Hig a solute

h midity

g/m3

8d)

8d)

8d)

8d)

8d)

8d)

8d)

8d)

7 kPa for hig altitu e a d/or tra sp rtatio

For e c location clas A,B,C or D, several levels are defined (i.e B1, B2, C1, C2, etc.)

ac ordin to diferent values of the en ironmental p rameters definin the clas of location

A.2.7 EMC re uireme ts

A.2.7.1 Ge eral

The req irements for immu ity an emis ion levels regardin electromag etic comp tibi ty

(EMC) are refer ed to electrical eq ipment o eratin with a voltage level lower than

1 0 0 V(alter natin c r rent or 1 5 0 V (direct c r ent

A.2.7.2 Immunity

A.2.7.2.1 Ge eral

The general p rforman e criteria for the evaluation of the immu ity of the devices are as

• Clas A: normal o eration, within the sp cification l mits, d rin the exp s re to the EM

disturb n e;

• Clas B: d rin the EM exp s re temp rary degradation, or los of fu ction or

p rforman e whic is self recoverin ;

• Clas C: d rin the EM exp s re temp rary degradation, or los of fu ction or

p rforman e whic req ires o erator intervention or s stem reset

The p rforman e criteria s ould b a pl ed to e c sin le disturb n e to whic the device can

b exp sed The l mit values for every disturb n e are re orted in A.2.7.2.2 to A.2.7.2.10

The immu ity req irements for a generic a pl cation are given in IEC 613 6-1:2 12, Ta le 1

Partic lar immu ity req irements for eq ipment inten ed for u e in in u trial location are

given in IEC 613 6-1:2 12, Ta le 2

A.2.7.2.2 Ele trostatic dis harg (ESD)

Se IEC 610 0-4-2:2 0 for ESD immu ity testin req irements

A.2.7.2.3 Ra iate ra io-fre ue c ele troma netic field

IEC 610 0-4-3 defines five clas es of en ironments, as l sted b low:

• Clas 1: low-level electromag etic radiation en ironment L vels typical for local

radio/ elevision station located at more than 1 km, an tran miters/receivers with low

p wer;

• Clas 2: moderate electromag etic radiation en ironment L w p wer p rta le

tran ceivers ( ypical y les than 1 W ratin ) are in u e, but with restriction on u e in close

proximity to the eq ipment ( ypical commercial en ironment ;

• Clas 3: severe electromag etic radiation en ironment Porta le tran ceivers (2 W ratin

or more) are in u e relatively close to the eq ipment but not les than 1 m Hig p wer

bro d ast tran miters are in close proximity to the eq ipment an ISM eq ipment may b

located close by ( ypical in u trial en ironment ;

• Clas 4: p rta le tran ceivers are in u e within les than 1 m of the eq ipment Other

sources of sig ificant interferen e may b within 1 m of the eq ipment;

• Clas x: x is an o en level whic mig t b negotiated an sp cified in the prod ct

stan ard or eq ipment sp cification

The in talation clas es are related to the test levels, whic give a q antitative me s re of the

stres to whic the device is exp sed (se Ta le A.4)

Table A.4 – Te t le els for RF fields

A.2.7.2.4 Ele tric l Fast Tra sie t/Burst immunity te t

IEC 610 0-4-4 defines five clas es of en ironment, as l sted b low:

• The in tal ation is c aracterized by the fol owin atributes:

– s p res ion of al EFT/B in the switc ed p wer s p ly an control circ its;

– se aration b twe n p wer s p ly lnes (AC an DC) an control an me s rement

circ its comin from other en ironments b lon in to hig er severity levels;

– s ielded p wer s p ly ca les with the s re n e rthed at b th en s on the referen e

e rthin of the in tal ation, an p wer s p ly protection by fi terin

• A computer ro m may b re resentative of this en ironment

• The a plca i ty of this level to testin of eq ipment is l mited to the p wer s p ly circ its

for typ tests, an to the e rthin circ its an eq ipment ca inets for p st in tal ation

tests

• Clas 2: protected en ironment

• The in tal ation is c aracterized by the fol owin atributes:

– p rtial s p res ion of EFT/B in the p wer s p ly an control circ its whic are

switc ed only by relay (no contactors);

– p or se aration of the in u trial circ its b lon in to the in u trial en ironment from

other circ its as ociated with en ironments of hig er severity levels;

– ph sical se aration of u s ielded p wer s p ly an control ca les from sig al an

commu ication ca les

• The control ro m or terminal ro m of in u trial an electrical plants may b re resentative

of this en ironment

• Clas 3: typical in u trial en ironment

• The in tal ation is c aracterized by the fol owin at ributes:

– no s p res ion of EFT/B in the p wer s p ly an control circ its whic are switc ed

only by relay (no contactors);

– p or se aration of the in u trial circ its from other circ its as ociated with

en ironments of hig er severity levels;

– dedicated ca les for p wer s p ly, control, sig al an commu ication l nes;

– p or se aration b twe n p wer s p ly, control, sig al an commu ication ca les;

– avai a i ty of e rthin s stem re resented by either con u tive pip s or earth

con u tors in the ca le tray con ected to the protective e rth s stem

• He v in u trial proces es may b re resentative of this en ironment

• Clas 4: severe in u trial en ironment

• The in tal ation is c aracterized by the fol owin at ributes:

– no s p res ion of EFT/B in the p wer s p ly an control an p wer circ its whic are

switc ed by relay an contactors;

– no se aration of the in u trial circ its b lon in to the severe in u trial en ironment

from other circ its as ociated with en ironments of hig er severity levels;

– no se aration b twe n p wer s p ly, control, sig al an commu ication ca les;

– u e of multicore ca les in common for control an sig al l nes

• The outdo r are of in u trial proces eq ipment where no sp cific in tal ation practice

has b en ado ted, p wer plants, the relay ro ms of o en-air H.V s bstation an gas

in ulated s bstation of up to 5 0 kV o eratin voltage (with typical in tal ation practice)

may b re resentative of this en ironment

• Clas 5: sp cial situation to b analy ed

• The minor or major electromag etic se aration of disturb n e sources from eq ipment

circ its, ca les, lnes etc an the q al ty of the in tal ation may req ire the u e of a

hig er or lower en ironmental level than those des rib d a ove It s ould b noted that

eq ipment l nes of a hig er en ironmental level can p netrate a lower severity

Ta le A.5 re orts the in tal ation clas es an the cor esp n in test levels, whic give a

q antitative me s re of the stres the device is exp sed to:

Table A.5 – Te t le els for ele tric l fa t tra sie t/burst

Open circ it output te t volta e an repetitio rate of th impuls s

Use of 5 kHz re etitio rates is tra itio al; h we er, 10 kHz is closer to re lty Pro u t c mmite s sh uld

d termin whic fre u n ies are rele a t for sp cific pro u ts or pro u t ty es

With some pro u ts, th re ma b n cle r distin tio b twe n p wer p rts a d I/O p rts, in whic c se it is u

to pro u t c mmite s to ma e this d termin tio for test p rp ses

a)

"X" is a o e le el Th le el h s to b sp cifie in th d dic te e uipme t sp cific tio

A.2.7.2.5 Surge

IEC 610 0-4-5 defines seven clas es of en ironment, as lsted b low:

• Clas 0: wel -protected electrical en ironment, ofen within a sp cial ro m

– Al in omin ca les are provided with overvoltage (primary an secon ary) protection

The u its of the electronic eq ipment are intercon ected by a wel desig ed grou din

s stem, whic is not sig ificantly influen ed by the p wer in tal ation or l g tnin The

electronic eq ipment has a dedicated p wer s p ly (se Ta le A.6) Surge voltage

may not ex e d 2 V

• Clas 1: p rtly protected electrical en ironment

– Al in omin ca les to the ro m are provided with overvoltage (primary) protection The

u its of the eq ipment are wel -intercon ected by a grou d con ection network, whic

is not sig ificantly influen ed by the p wer in tal ation or l g tnin The electronic

eq ipment has its p wer s p ly completely se arated from the other eq ipment

Switc in o eration can generate interferen e voltages within the ro m Surge

voltage may not ex e d 5 0 V

• Clas 2: electrical en ironment where the ca les are wel -se arated, even at s ort ru s

– The in talation is grou ded via a se arate con ection to the grou din s stem of the

p wer in tal ation whic can b s bjected to interferen e voltages generated by the

in tal ation itself or by l g tnin The p wer s p ly to the electronic eq ipment is

se arated from other circ its, u ual y by a dedicated tran former for the main p wer

s p ly Non-protected circ its are present in the in tal ation, but wel -se arated an in

restricted n mb rs Surge voltages may not ex e d 1 kV

• Clas 3: electrical en ironment where p wer an sig al ca les ru in p ral el

– The in tal ation is grou ded to the common grou din s stem of the p wer in tal ation

whic can b s bjected to interferen e voltages generated by the in tal ation itself or

by l g tnin Cur ent d e to grou d faults, switc in o eration an l g tnin in the

p wer in tal ation may generate interferen e voltages with relatively hig ampl tu es in

the grou din s stem Protected electronic eq ipment an les sen itive electric

eq ipment are con ected to the same p wer s p ly network The intercon ection

ca les can b p rtly outdo r ca les, but close to the grou din network

Un up res ed in u tive lo d are present in the in tal ation an u ual y there is no

se aration of the diferent field ca les Surge may not ex e d 2 kV

• Clas 4: Electrical en ironment where the intercon ection are ru nin as outdo r ca les

alon with p wer ca les, an ca les are u ed for b th electronic an electric circ its

– The in tal ation is con ected to the grou din s stem of the p wer in talation whic

can be s bjected to interferen e voltages generated by the in tal ation itself or by

l g tnin Cur ents in the kA ran e d e to grou d faults, switc in o eration an

l g tnin in the p wer s p ly in tal ation may generate interferen e voltages with

relatively hig ampl tu es in the grou din s stem The p wer s p ly network can b

the same for b th the electronic an the other electrical eq ipment The

intercon ection ca les are ru as outdo r ca les, even to the hig -voltage eq ipment

A sp cial case of this en ironment is when the electronic eq ipment is con ected to

the telecommu ication network within a den ely p pulated are There is no

s stematical y con tru ted grou din network outside the electronic eq ipment, an

the grou din s stem con ists only of pip s, ca les, etc Surge voltage may not

ex e d 4 kV

• Clas 5: Electrical en ironment for electronic eq ipment con ected to telecommu ication

ca les an overhe d p wer l nes in a non-den ely p pulated are

– Al these ca les and lnes are provided with overvoltage (primary) protection Outside

the electronic eq ipment there is no widespre d grou din s stem (exp sed plant

The interferen e voltages d e to grou d faults (c r ents up to 10 kA) an lg tnin

(c r ents up to 10 kA) can b extremely hig The req irements of this clas are

covered by the test level 4

• Clas x: Sp cial con ition sp cified in the prod ct sp cification

The in tal ation clas es are related to the test levels re orted in Ta le A.6, whic give a

q antitative me s re of the stres to whic the device is exp sed

Table A.6 – Te t le els for s rge prote tion

1,0 e)

2,0 b)e)

1,0c)

2,0b)c)

4,0b)e)

2,0 e)

4,0b)e)

2,0c)

4,0b)c)

A.2.7.2.6 Con ucte disturba c s ind c d by ra io-fre ue c fields

IEC 610 0-4-6 defines four clas es of en ironment, as lsted b low:

• Clas 1: L w-level electromag etic radiation en ironment Typical level where

radio/ elevision station are located at a distan e of more than 1 km an typical level for

low-p wer tran ceivers

• Clas 2: Moderate electromag etic radiation en ironment L w-p wer p rta le

tran ceivers ( ypical y les than 1 W ratin ) are in u e, but with restriction on u e in close

proximity to the eq ipment ( ypical commercial en ironment

• Clas 3: Severe electromag etic radiation en ironment Porta le tran ceivers (2 W an

more) are in u e relatively close to the eq ipment but at a distan e not les than 1 m

Hig -p wered bro d ast tran miters are in close proximity to the eq ipment an ISM

eq ipment may b located close by ( ypical in u trial en ironment

• Clas x: x is an o en level whic may b negotiated an sp cified in the dedicated

eq ipment sp cification or eq ipment stan ard

Ta le A.7 re orts the in tal ation clas es an the cor esp n in test levels that re resent a

q antitative me s re of the stres to whic the device is exp sed:

Table A.7 – Te t le els for RF induc d disturba c s

Sp cial

a)

X is a o e le el

A.2.7.2.7 Power fre ue c ma n tic field

IEC 610 0-4-8 defines six clas es of en ironment, as lsted b low:

a) Clas 1: En ironmental level where sen itive device u in electron b am can b u ed

Monitors, electron micros o e, etc are re resentative of these devices

b) Clas 2: Wel protected en ironment

– The en ironment is c aracterized by the fol owin atributes:

i) a sen e of electrical eq ipment l k p wer tran formers that may give rise to

le k ge flu es;

i ) are s not s bjected to the influen e of H.V bu -b rs

– Hou ehold, ofice, hospital protected are s far away from e rth protection cond ctors,

are s of in u trial in talation an H.V s b-station may b re resentative of this

en ironment

c) Clas 3: Protected en ironment

– The en ironment is c aracterized by the fol owin atributes:

i) electrical eq ipment an ca les that may give rise to le k ge flu es or mag etic

field;

i ) proximity of e rth con u tors of protection s stems;

i ) M.V circ its an H.V bu -b rs far away (a few h n red metres) from eq ipment

con erned

– Commercial are s, control bui din , field of not he v in u trial plants, computer ro m

of H.V s b-station may b re resentative of this en ironment

d) Clas 4: Typical in u trial en ironment

– The en ironment is c aracterized by the fol owin atributes:

i) s ort bran h p wer l nes as bu -b rs, etc

i ) hig p wer electrical eq ipment that may give rise to le k ge flu es;

i ) grou d con u tors of protection s stem;

iv) M.V circ its an H.V bu -b rs at relative distan e (a few ten of metres) from

eq ipment con erned

– Field of he v in u trial an p wer plants an the control ro m of H.V s b-station

may b re resentative of this en ironment

e) Clas 5: Severe in u trial en ironment

– The en ironment is c aracterized by the fol owin atributes:

i) con u tors, bu -b rs or M.V H.V l nes car yin ten of kA;

i ) proximity of M.V an H.V bu -b rs;

iv) proximity of hig p wer electrical eq ipment

– Switc yard are s of he v in u trial plants, M.V H.V an p wer station may b

re resentative of this en ironment

f Clas x: Sp cial en ironment

The in tal ation clas es are related to the test levels defined in Ta le A.8, whic give a

q antitative me s re of the stres to whic the device is exp sed

Table A.8 – Te t le els for power fre ue c ma n tic fields

sp cial

a)

“X” is a o e le el This le el c n b giv n in th pro u t sp cific tio

A.2.7.2.8 Puls ma n tic field

IEC 610 0-4-9 defines six clas es of en ironment, but only four are a pl ca le to in u trial

a pl cation The u eful clas es are l sted b low:

a) Clas 3: Protected en ironment

– The en ironment is c aracterized by the proximity of e rth con u tors of lg tnin

protection s stems an metal c stru tures Commercial are s, control bui din , field of

not he v in u trial plants provided with l g tnin protection s stem or metal c

stru tures in the proximity, computer ro m of H.V s b-station may by re resentative

of this en ironment

b) Clas 4: Typical in u trial en ironment

– The en ironment is c aracterized by the down con u tors of the lghtnin protection

s stem or stru tures Field of he v in u trial an p wer plants an the control ro m

of H.V s b-station may b re resentative of this en ironment

c) Clas 5: Severe in u trial en ironment

– The en ironment is c aracterized by the fol owin atributes:

i) con u tors, bu -b rs or M.V H.V l nes car yin ten of kA;

i ) grou d con u tors of the l g tnin protection s stem or hig stru tures l k the l ne

towers car yin the whole lg tnin c r ent

– Switc yard are s of he v in u trial plants, M.V H.V an p wer station may b

re resentative of this en ironment

d) Clas x: Sp cial en ironment

The in tal ation clas es are related to the test levels re orted in Ta le A.9, whic give a

q antitative me s re of the stres the device is exp sed to