14 2 Abnormal o eration an fault con ition for switc es... The text of this stan ard is b sed on the fol owin doc ments: Ful information on the votin for the a proval of this stan ard ca
Trang 1Switches for appl ances –
Part 1-1: Requirements for mechanical switches
Inter upteurs pour apparei s –
Trang 2THIS PUBLICATION IS COPYRIGHT PROT CTED
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Trang 3Switches for appl ances –
Part 1-1: Requirements for mechanical switches
Inter upteurs pour apparei s –
Warnin ! Mak e s re th t y ou o tain d this publc tion from a a thorize distributor
Ate tion! Ve i ez v ou a s rer qu v ou av ez o te u c te publc tion via u distribute r a ré
Trang 4CONTENTS
FOREWORD 3
1 Sco e 5
2 Normative referen es 5
3 Terms an definition 5
4 General req irements 5
5 General information on tests 5
6 Ratin 7
7 Clas ification 7
8 Markin an doc mentation 7
9 Protection again t electric s ock 7
10 Provision for e rthin 7
1 Terminals an termination 7
12 Con tru tion 7
13 Mec anism 7
14 Protection again t in res of sol d foreig o jects, in res of water an h mid con ition 7
15 In ulation resistan e an dielectric stren th 7
16 He tin 7
17 En uran e 7
17.1 General req irements 8
17.2 Electrical en uran e tests 8
17.3 Thermal con ition 10 17.4 Actuatin con ition 10 17.5 Typ of test con ition (TC) 12 17.6 Evaluation of compl an e 13 17.6.1 Functo al comp lia ce (TE1) 13 17.6.2 Th rmal compla ce (TE2) 13 17.6.3 Insulatn compla ce (TE3) 13 18 Mec anical stren th 13 19 Screws, c r ent car yin p rts an con ection 14 2 Cle ran es, cre p ge distan es, sol d in ulation an co tin s of rigid printed b ard as embles 14 21 Fire hazard 14 2 Resistan e to ru tin 14 2 Abnormal o eration an fault con ition for switc es 14 2 Comp nents for switc es 14 2 EMC req irements 14 Ta le 101 – Test sp cimen 6
Ta le 10 – Test lo d for electrical en uran e tests for a.c circ its 9
Ta le 10 – Test lo d for electrical en uran e tests for d.c circ its 10
Ta le 10 – Switc o eratin con ition 11
Trang 5INTERNATIONAL ELECTROTECHNICAL COMMISSION
Part 1-1: Requirements for mechanical switches
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International Stan ard IEC 610 8-1-1 has b en pre ared by s bcommit e 2 J: Switc es for
a pl an es, of IEC tec nical commitee 2 : Electrical ac es ories
The text of this stan ard is b sed on the fol owin doc ments:
Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on
votin in icated in the a ove ta le
This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2
A l st of al p rts in the IEC 610 8 series, publ s ed u der the general title Swiche s for
Trang 6This p rt of IEC 610 8 is to b u ed in conju ction with IEC 610 8-1(2 16).
This Part 1-1 s p lements or modifies the cor esp n in clau es in IEC 610 8-1, so as to
con ert that publ cation into the IEC stan ard: Re u ireme ts forme ch nical swich s
When a p rtic lar s bclau e of Part 1 is not mentioned in this Part 1-1, that s bclau e a pl es
as far as re sona le Where this stan ard states “ad ition”, “modification” or “re lacement”,
the relevant text of Part 1 is to b ada ted ac ordin ly
In this stan ard:
1) the fol owin print typ s are u ed:
– req irements pro er: in roman typ ;
– test sp ecificato s: in ialc typ e;
– n tes/e pla atory maters: in smal roma ty e
2) s bclau es, notes, fig res an ta les whic are ad itional to those in Part 1 are n mb red
startin from 101 An exes whic are ad itional to those in Part 1 are letered AA, BB, etc
The commite has decided that the contents of this publcation wi remain u c an ed u ti
the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data
related to the sp cific publ cation At this date, the publ cation wi b
• reconfirmed,
• with rawn,
• re laced by a revised edition, or
• amen ed
Trang 7This p rt of IEC 610 8 a pl es to mec anical switc in devices an s al b u ed in
conju ction with the req irements of IEC 610 8-1
NOT Ad itio al re uireme ts for p rtic lar switc es ma b fo n in th rele a t p rt 2 of IEC 610 8
Ta le 101 provides information on:
– The minimum n mb r of sp cimen ne ded for e c test
– The minimum n mb r of total sp cimen , when a plca le tests are ad ed, ne ded for
e c evaluation
– Ad itional sp cimen that may b req ired as a res lt of ad itional electrical ratin ,
u iq e con tru tion or damage/bre k ge d rin testin
Trang 8Table 101 – Te t spe ime s
spe imens for e c te t
a)Note
9 Prote tio a ainst ele tric sh c
10 Pro isio for e rthin
14.3 to 15 Prote tio a ainst h mid c n itio s
Insulatio resista c a d diele tric stre gth
Ea h ele tric l ratin su mite to th testin of Cla ses 16 a d 17 re uires a a ditio al 3 sp cime s (su h
as ratin i = sp cime s, ratin i = a ditio al3 sp cime s)
c)
Th sp cime ma b use for more th n 1 test, if c mulativ stres as a result of se u ntial testin is
a oid d Wh na sp cime is d ma e a n w sp cime sh l b use for th n xt test
d)
In g n ral 1 sp cime for in res of sold foreig o je ts (d st, a d 1 sp cime for in res of water
Sp cific IP ratin s (su h as IP 5 , IP6 a d prote tio a ainst water) re uire a sp cial e closure to b
pro id d with th switc sp cime in ord r to c mplete th testin
e)
Th same test sp cime s are use to c mplete th testin of 14.3 a d 15 Th tests are c mplete in
imme iatese u n e
f
He tin a c rdin to Cla se 16 a d e d ra c a c rdin to Cla se 17 is re omme d d to b teste o th
samesp cime s If d clare ,difere t sp cime s ma b use wh n n te o th test re ord
Me h nic l switc es in g n ral d n t re uire EMC testin , h we er in th e e t th me h nic l switc h s
ele tro ic circ itry re uirin EMC, a ditio al sp cime s ma b re uire a c rdin to th EMC test pro ram
a d switc c nstru tio
l)
Ab ormal o eratio a d fa lt c n itio s are g n raly d stru tiv , ty ic ly th switc c n ot b re aire
a d re se for th n xt fa lt Sp cialy pre are sp cime s (su h as with wires sold re to th intern l
circ it ma b n c s ary in ord r to c mplete th testin Th total n mb r of sp cime s d p n s o th
switc c nstru tio , for d tais se Cla se 2
m)
This test is p rt ofa se u n e, a d a n w set of 3 sp cime s sh l n t b use e c pt as p rmite b 5.1
Trang 1017.1 Ge eral re uireme ts
17.1.1 Switc es s al with tan without ex es ive we r or other harmful ef ect the
electrical, thermal an mec anical stres es that oc ur in normal u e
17.1.2 Th se u e nce of te sts to b e completed o th same 3 sp e cime s is as folows:
– TC3: a te st at high sp e ed spe cified in 17.5.3; this test o ly a p lies to swich s wih more
th n o e p ole, a d wh re th ty e of co n cto is ofp olariy re versal
– TC2: a te st at slow sp eed sp ecified in 17.5.2,
– TC1: a incre se d-v lage test at ac elerated sp eed as sp ecified in 17.5.1; this test doe s
n t a p ly to swich s clas ifie d ac ordin to 7.2.9;
– TC9: a lock d-rotor test as spe cified in 17.5.5 at ac elerated sp ee d; this te st o ly ap ple s
to swich s clas ified ac ordin to 7.2.9;
– TC4: a te st at ac elerated sp eed as sp cified in 17.5.4;
folowed b y th re u ireme ts of17.6
NOT Th difere t ty es of tests are sp cifie in 17.5
17.1.3 Wh n re uiredb y Clause 13, th folowin test, TC10 , is co ducte d o a difere t set
of 3 sp e cim ens:
– TC10: a test at very slow sp ed as sp cified in 17.5.6; this test only a pl es to switc es
ac ordin to the req irements of 13.1
Th ma u facture r ma ch ose to complete TC10 in th se u ence of 17.1.2 in place of TC2
Compla ce is ch cke d b y 17.6.1 (TE1) a d 17.6.3 (TE3)
17.2 Ele tric l e dura c te ts
The switc s al b lo ded as sp cified in Ta le 10 an /or Ta le 10 an con ected in
ac ordan e with the circ it as given in 610 8-1:2 16, Ta le 2
a) Whe re, in IEC 61058-1:2016, Tab le 2, a auxi ary swich (A) is sym b olzed in th test
circu it, th te sts for th two ON-p osi o s of th sp ecime (S) are p erforme d o two
sep arate sets ofte st samples Th co n cto to th test lo d to b e p e rformed forth two
tests is sym b olzed in IEC 61058-1:2016, Tab le 2 b y a auxi ary swich A
b) Mu ltwa swich s are lo ded ac ordin to 61058-1:20 16, Tab le 1 Th lo d forth oth r
swich p osi o s is th t resu ltn from th lo ds ne ces ary to achie ve th co di o s
sp ecified ab ov
c) For circuits ac ordin to 7.2.7 for sp ecific lamp lo d, th co ne cto a d test lo d are as
sp cified b y th ma ufacturer usin th ma imum oc urrin inrush cu rre t at ro m
temp ratu re Fora sp e cific lamp lo d, i is re comme ded th t th sp ecime b e o erated
wih lo ds th t are used in th field rathe r th n wih sy th tc lo ds Forced co ln of th
spe cific lamp lo d ma b e a p lied in orde r to e sure cold re sista ce fore ch op eratn
cycle a d sh rte th te st tme
d) No electrical lo d is ap p lied durin th e ndura ce tests for swiche s clas ified to 7.2.6
wih a ratn of2 mA or les
Trang 11Table 10 – Te t loa s for ele tric l e dura c te ts for a.c circ its
Su sta tialy resistiv (clas ifie in 7.2.1) Ma in a d
≥ ,9
Circ it for sp cific lo d of motor with a lo k d rotor
a d with a p wer fa tor n t les th n 0,6
Th sp cifie ma in c n itio s are maintain d for a p rio b twe n 5 ms a d 10 ms, a d are th n
re u e b a a xi ary switc to th sp cifie bre kin c n itio s
For me h nic l switc es th test c re t ma b re u e to I-R b intro u in a resistor in th circ it Sh rt
interu tio s of th test c re t d rin th re u tio to I-R n t e c e in a p rio of 5 ms to 10 ms are
p rmite
A ty ic l meth d of a hie in thisis sh wn inFig re 16
c)
Resistors a d in u tors are n t c n e te in p ralel e c pt th t if a y air-c re in u tor is use , a resistor
ta in a pro imately 1 % of th c re t thro g th in u tor is c n e te in p ralel with it Iro -c re
in u tors ma b use pro id d th t th c re t h s a su sta tial sin -wa e form For thre -p ase tests,
thre -c re in u torsare use
d)
In th c se wh re th tests are p rforme with tu gste fiame t lamp b lbs, th folowin test c n itio s
a ply:
– th ratio X = 16 or X = 10 sh l b a hie e ;
– th c ld resista c of th lamps sh l b e sure for e c o eratin c cle;
– th resista c of c n e tio s withinth lo d circ it ( or e ample lampso k ts) sh l b c nsta t
– th pro er fu ctio of th lamps p rformin th lo d set sh l b e sure for e c o eratin c cle
Trang 12Table 10 – Te t loa s for ele tric l e d ra c te ts for d.c circ its
– th c ld resista c of th lamps sh l b e sure for e c o eratin c cle;
– th resista c of c n e tio s withinth lo d circ it ( or e ample lampso k ts) sh l b c nsta t
– th pro er fu ctio of th lamps p rformin th lo d set sh l b e sure for e c o eratin c cle
17.3 Thermal condition
17.3.1 For switc es ac ordin to 7.3.2, d rin the tests in 17.5.4 (TC4) al p rts are
exp sed to temp ratures as fol ows:
– For the first half of the test p riod at maximum air temp rature (T + /0) °C
– For the secon half of the test p riod at 2 °C ± 10 °C or at the minimum air temp rature
(T 0/ 5) °C if T is les than 0 °C
17.3.2 For switc es ac ordin to 7.3.3, d rin the tests in 17.5.4 (TC4), those p rts that are
declared for u e at 0 °C to 5 °C s al b exp sed to a temp rature within this ran e for the
complete test p riod
– For the first half of the test p riod, the air temp rature of the remain er of the switc s al ,
b maintained at the maximum air temp rature (T + /0) °C
– For the secon half of the test p riod the tests are car ied out at 2 °C ± 10 °C or at the
minimum air temp rature (T 0/ 5) °C if T is les than 0 °C
17.3.3 For switc es ac ordin to 7.3.1, d rin the tests in 17.5.4 (TC4), the switc s al b
exp sed to an air temp rature of 2 °C ± 10 °C
17.4 Actuating condition
17.4.1 The switc es are o erated by me n of their actuatin memb r either man al y or by
an a pro riate a p ratu whic is ar an ed to simulate normal actuation
Th op eratn sp e ed forth op eratn cycle s sh l b e as folows:
For th te sts of mech nical swiche s:
a) for v ry slow sp e d:
– ap p ro imate ly 1 /s for rotary actuato ;
Trang 13b ) for slow sp eed:
– ap p ro imately 9°s for rotary actuato s at a a gle ofop erato ≤4 °;
– ap p ro imate ly 18°s for rotary actu ato s at a a gle of o e rato >4 °;
– ap p ro imately 2 mm/s to 2 mm/s for ln ar actu ato s
c) for high sp eed, th actuato mem b er sh l b e actuated b y h nd as fast as p os ib le or
usin th ac elerated sp eed
d) for ac elerated sp eed:
– ap p ro imately 4 °s for rotary actu ato s at a a gle of op erato
17.4.3 Du rin th te stng, care is ta e th t th te st a p aratus driv s th actu atn memb er,
wih u t impe din th designe dmo eme ts of th swich
17.4.4 Du rin th ac elerated sp e d te st
a) care sh l b e ta e to e sure th t th te st ap paratus alows th actuatn memb er to
op erate free ly, so th t th re is n interfere ce wih th n rmal acto of th me ch nism;
b ) for swiche s designe d for a rotary actuato whe re th mo eme t is n t lmied in eih r
directo , thre -quarters ofth total numb e r of op eratn cycles in e ch test sh l b e made
in a clockwise directo , a d o e-quarterin a a t clockwise directo ;
c) for swich s which are de signed forrotary actuato in o e directo o ly, th test sh l b e
p rformedin th designe d directo , pro ided th t i is n t p os ib le to rotate th actuatn
memb erin th re verse directo usin th torques n ces ary foractuato in th designed
directo ;
d) ad i o al lub ricato sh l n t b e ap pled durin th se tests;
e) th forces ap ple d to th e d stop s of th actu atn memb ers sh al n t e xce ed th
declared v lu e s (if a y) for rotary a d ln ar actu ato Th declare d fu ll tra el of th
actuatn memb er(if a y) sh l b e a p lied du rin th se tests
17.4.5 So far as the desig al ows, switc es are o erated with the fol owin con ition :
Table 10 – Switc operating conditions
Re uire v ry slow sp e TC10 Minimum 2 Minimum 6 To alow arcin at th ma e a d bre k
Trang 14For switc es with more than one lo d ( hrow), e c o eratin in the test circ it s c as
Ta le 2 test codes 2.3, 2.5, 2.7 or 2.9, the ON p riod wi b a proximately 5 %
Multi-way switc es may comply with the ta le a ove, or b actuated with the sp ed in icated
in 17.4.1 an a minimum ON p riod of 2 %
This req irement in Ta le 10 is not val d for very slow sp ed (TC10), the on time s al b
s f icient to alow arcin
17.5 Type of te t condition (TC)
17.5.1 In re sed-voltage test at ac elerated sp ed (TC1):
– Electrical co di o s: Th lo d sp e cifie d ac ordin to Tab le 102, th v lage incre sed to
1,15 th rate d v lage (th lo d is n t re djusted)
– Cap aci v lo d a d simu lated lamp lo d tests for a.c circuits, th test v lage is th rated
v la e a d th test curre ts are incre sed to 1,15 rated curre ts
This test a pl es only to switc es whic have more than one p le an when p larity reversal
oc urs (when it is p s ible to move from one p larity to the o p site without a mec anical
interlock or simi ar mec anical imp diment
17.5.4 Test at ac elerated sp ed (TC4):
– Ele ctrical co di o s: sp e cifie d in 17.2
– Th rmal co di o s: sp ecifie din 17.3
– Actuatn sp ee d: ac elerated spe ed in 17.4
– Op eratn cycles: Total nu mb er declared (7.4) le ss th nu mb er alre dy made du rin te sts
Trang 15For switc es ac ordin to 7.2.2, the test lo d con ition for ma in o eration for resistive
an /or motor lo d with a rated c r ent of 6 × I-M an with a p wer factor of 0,6 is u ed for the
TC10 when req ired by Clau e 13, is completed on a se arate set of 3 sp cimen an is not
p rt of the Ta le 101 seq en e Compl an e is c eck d by 17.6.1 (T 1) an 17.6.2 (TE2)
17.6 Ev luation of compl a c
17.6.1 Function l c ompla ce (T 1)
After al th ap p rop riate te sts of17.5, th swich is insp cted forfuncto al y Compla ce is
ch cke db y th folowing:
– al acto s functo as de clare d;
– n lo se in of electrical or mech nical co n cto s oc ur;
– se ln comp und sh l n t flow to such a e xte nt th t LIVE PARTS are e p osed
17.6.2 The rm al c ompla nce (TE2)
Afte r al th ap p rop riate tests of 17.5, th swich is tested in ac orda ce wih Clause 16 in
IEC 61058-1:2 16 as modifie d b y th folowing:
– 16.4.d) to 16.4.e) are n t ap plcab le
– 16.4.f) al swich s are teste din a amb ie t of 2 °C ± 10 °C
– 16.4.g) to 16.4.i are n t ap plcab le
– 16.4.q) termin ls are me sure d as close as p os ib le to th b ody of th swich If th
the rmocou p les ca n t b e p si o e ddire cty o th te rmin ls th th rm ocouples ma b e
fix d o th co ductors (wih th insu laton remo ed) as close as p s ib le to th b ody of
th swich
Compla ce is ch cke d if th temp e rature rise at th te rmin als do s n t e ce d 5 K
17.6.3 Ins ula ting compla ce (T 3)
Afte r al th ap p rop riate tests of 17.5, th swich is te ste d as folows:
– th dielectric stre gth te st of 15.3 in IEC 61058-1:2016 a p lie s wih th e ce to th t th
sp cime s are n t su b jected to th hu midiy tre tme t b efore th ap plcato of th test
v lag Th test v lage sh l b e 75 % of th core sp ondin test v lage sp ecified in th t
su b clause
Compla ce is che cke d b y e vide ce th t n tra sie t fault b etwe n lv p arts a d e rth metal,
ac es ib le metal p rts, or actu atn memb e rs h s oc urred
18 Mecha ical strength
This clau e of p rt 1 is a pl ca le
Trang 1619 Screws, cur ent car ying parts a d conne tions
23 Abnormal operation and fault conditions for switches
Re lace the existin text by the fol owin :
Mec anical switc es with electronic comp nents are c eck d by the req irements of
Clau e 2 of IEC 610 8-1-2:2 16
Switc es with rigid printed b ard with cre p ge distan es an cle ran es that do not comply
with the req ired distan es of Ta le 12 to Ta le 14 of IEC 610 8-1:2 16, are c eck d by the