Iec 62477 1 2012 amd1 2016

GROUP SAFETY PUBLICATION Safety requirement s for pow er elect ronic conv ert er sy st ems and equipment – Part 1: General Ex igences de sécurit é appl cables aux sy st èmes et mat ériel

GROUP SAFETY PUBLICATION

Safety requirement s for pow er elect ronic conv ert er sy st ems and equipment –

Part 1: General

Ex igences de sécurit é appl cables aux sy st èmes et mat ériels élect roniques de

conv ersion de puissance –

Partie 1: Général t és

THIS PUBLICATION IS COPYRIGHT PROT CTED

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GROUP SAFETY PUBLICATION

Safety requirement s for pow er elect ronic conv ert er sy st ems and equipment –

Part 1: General

Ex igences de sécurit é appl cables aux sy st èmes et mat ériels élect roniques de

conv ersion de puissance –

Partie 1: Général t és

Ful inf ormation on the votin f or the a proval of this amen ment can b f ou d in the re ort

on votin in icated in the a ove ta le

The commite has decided that the contents of this amen ment an the b se publ cation wi

remain u c anged u ti the sta i ty date in icated on the IEC we site u der

"ht p:/ we store.iec.c " in the data related to the sp cif i publ cation At this date, the

r.m.s value of the c r ent whic would f low if the s p ly con u tors to the circ it are s

ort-circ ited by a con u tor of negl gible imp dan e located as ne r as practica le to the s p ly

terminals of the P ECS

[SOURCE: IEC 614 9-1:2 1 , 3.8.7] modif ied – "ASSEMBLY" is re laced by "P ECS"

Ad d the following n w terms a d d efinitio s:

3.6

condition l s ort circ it c r e t

I

c

r.m.s value of a pro p ctive s ort-circ it c r e t avai a le f rom a s p ly source, declared by

the P ECS man f acturer u der sp cif ied con ition , u in a sp cif i typ of s ort-circ it

protectiv device protectin the P ECS

Note 1 to e try: Se als Fig re N.1

Note 2 to e try: Th s p ly s urc mig t b a main or n n-main s p ly

Note 3 to e try: Th d clare I

c

is th minimumc r e t v lu u e for c lbratio of th s p ly s urc

© IEC 2 16

[SOURCE: IEC 614 9-1: 2 1 3.8.10.4] modif ied – The def i ition is modif ied to f it to the u e

of PECS a pl cation

3.6

c r e t l miting prote tiv de ic

protective element that, d rin its o eration an sp cif ied c r ent ran e, l mits the c r ent to

a s bstantial y lower value than the p ak value of the prosp ctive c r ent

Note 1 to e try: A c re t-lmitin d vic is n rmaly a c re t-lmitin fu e or a c re t-lmitin circ it bre k r

r.m.s.value of a minimum s ort-circ it c r ent, whic is ne ded to b avai a le f rom a s p ly

source in order to en ure saf e inter uption of the f ault, an whic is declared by the P ECS

man facturer an tested u der sp cif ied con ition , u in a sp cif i typ of s ort-circ it

protective device protectin the P ECS

3.6

ov rc r e t prote tiv de ic

OCPD

device provided to inter upt an electric circ it in case the c r ent in the electric circ it

ex e d a predetermined value f or a sp cif ied d ration

[SOURCE: IEC 6 0 0-8 6:2 0 8 6-14-14, modif ied – "con u tor deleted]

3.7

pe k withsta d c r e t

I

k

value of p ak s ort-circ it c r ent, declared by the P ECS man f acturer, that can b car ied

without damage u der sp cif ied con ition , def i ed in terms of c r ent an time

Note 1 to e try: For th p rp s of this sta d rd, I

k

refers to th initial a ymmetric p a v lu of th pro p ctiv

te t c re t

Note 2 to e try: Time ma b s e ifie a th n mb r of s c e siv c cle at 5 Hz or 6 Hz

[SOURCE: IEC 614 9-1:2 1 , 3.8.10.2, modif ied – The def i ition is modif ied to f it to the u e

Note 1 to e try: A s ort -ci rcu prot ect i ve d evi ce is s ita le for prote tio a ain t s ort-circ it o ly, n t for

prote tio a ain t o erlo d An OCPD ma als in orp rate th fu ctio of a SCPD

[SOURCE: IEC 614 9-1:2 1 , 3.8.10.3, modif ied – " ated" removed f rom the term an

"ASSEMBLY" re laced by "PECS”]

4.2 Fa lt a d abnormal con itions

Ad d, after the s c nd p ra ra h, the followin n w p ra ra h:

Comp nents in 4.2 also in lu e in ulation s stems, p rts, etc

Ad d , at the e d of the b llet list, the followin n w b llet:

• electromag etic f orce and thermal hazard ac ordin to 4.3

4.3.1 Ge eral

Ad d , after the first p ra ra h, the following n w p ra ra h:

To en ure pro er co rdination with s ort-circ it protective d evic s and the avai a le

pro p ctive s ort-circ it c r e t, the P ECS man f acturer s al sp cif y an test f or e c

main s p ly input p rt of the P ECS:

• c nd itio al s ort-circ it c r e t I

c) ac ordin to 4.3.2.2, or

• rated s ort time withstand c re t (I

w) ac ordin to 4.3.5

In ivid al mains s p ly p rts of a P ECS s al have sp cif i s ort-circ it ratin s of either I

c

or I

w, or of b th

Only in case where compl an e do s not rely on the c aracteristic of SCP D, the I

input mains s p ly p rt an output p rt)

For markin se 6.2

Se An ex N f or f urther inf ormation

4.3.2.2 Input ports s ort circ it with ta d c r e t

Re lac the title a d tex t a follows:

4.3.2.2 Spe if ic tion of the rate conditional short-circuit cur ent (

c) on input ports

In case the P ECS man f acturer selects the c nd itio al s ort-circ it c re t (I

c) ratin

ac ordin to 4.3.1, the f ol owin s al b sp cif ied:

• c nd itio al s ort-circ it c r e t I

c),

• c aracteristic of the s ort-circ it protectiv device, an

• minimum re uired pro p ctiv s ort-circ it c r e t I

p,mr

Compl an e is s own, throu h evaluation ac ordin to 4.2 to determine the a propriate

combination of testin ac ordin to 5.2.4.4, 5.2.4.6 an 5.2.3.1 3 in order to evaluate sin le

f ault an a normal con ition , in lu ing in ulation f aults

If it is s own by analy is that the res lt of one test is re resentative of the worst case, les

severe combination ne d not b tested

© IEC 2 16

Ad d , after 4.3.4, the followin n w clau e:

4.3.5 Input ports short time withstand cur ent, I

cw

In case the P ECS man f acturer selects the s ort time withstand c r e t (I

w) ratin ac ordin

to 4.3.1, the f ol owin s al b sp cif ied:

• rated s ort time withstand c re t (I

w),

• as ociated d ration, an

• rated p a withstand c re t (I

k)

Compl an e is s own, throu h evaluation ac ordin to 4.2 to determine the a pro riate

combination of testin ac ordin to 5.2.3.1 3 an 5.2.4.10 in order to evaluate sin le f ault

an a normal con ition , in lu in in ulation f aults

If it is s own by analy is that the res lt of one test is re resentative of the worst case, les

severe combination ne d not b tested

5.2.4.2 Pa s criteria

Add , after the last b llet p int, the followin n w b llet p ints:

• comp nents, e.g bu b r s p orts, used f or the mou tin of live p rts s al not bre k

away f rom their initial p sition,

• no con u tor s al get pul ed out of its terminal con ector

Ad d , in Ta le 2 und er "Abnormal o eration tests", the followin n w test:

Sh rt time with ta d c re t (I

cw

Ad d , after 5.2.4.9.4, the following n w s b lau e:

5.2.4.10 Short time withstand cur ent (

cw) te t (ty e te t)

5.2.4.10.1 Ge eral

As req ired in 4.3.5, the s ort time withstand c re t test s al b p rf ormed as a typ test to

verif y the saf ety of the P ECS

Short-circ its are a pl ed in the P ECS at location b sed on the evaluation in 4.2 so that

terminals an other p rts in the f ault c r ent p th are b in exp sed to the s ort-circ it

c r ent

5.2.4.10.2 Short time withstand cur ent te t method

The input main s p ly p rt terminals s al b provided with a ca le with a cros -section as

sp cif ied f or the installation

If a switc in device is u ed to initiate the s ort-circ it or switc the p wer to the P ECS, it

s al not l mit the test c r ent

The complete len th of the ca le (f orth an b c ) s al b a proximately 2 m, u les this

len th is in uf f icient, in whic case the len th s al b as s ort as practical to p rf orm the

test

The testin s al in lu e in ivid al tests f or e c input main s p ly p rt The worst case

combination of terminals (in lu in neutral an e rth) s al b s bjected to a s ort-circ it

test Analy is may b u ed to red ce the n mb r of tests, if it is s own that the res lts of one

terminal combination are re resentative of the anticipated res lts of another combination

The P ECS can b tested u -energized an not o eratin as inten ed prior to the s ort-circ it

with tan test, if it can b s own that the test res lt is not af f ected

A new sample may b u ed f or e c s ort-circ it test

Ta le 3 l sts the a.c c r ent test method as a minimum req irement f or P ECS

Req irements f or d.c c r ent are u der con ideration

If the sp cif ied I

pvalue is hig er than lsted in Ta le 3 , the recommen ed test c r ent is:

16 kA, 2 kA, 2 kA, 3 kA, 5 kA, 6 kA, 8 kA, 10 kA

De en in on the c aracteristic of the P ECS, the actual values o served d rin the test

may b dif f erent f rom those l sted in Ta le 3 , in whic case the o served values s al b

u ed f or the declaration of I

w

Table 3 – A.c short time withstand cur ent te t, minimum P ECS re uireme ts

cw)

with a rate c re t of 16 A or b low c n b c lc late fom th refere c imp d n e in IEC TR 6 7 5:

2 12: p a e c n u tor 0,2 + j0,15 Ω a d n utral c n u tor 0,16 + j0,10 Ω For 2 0 V/4 0 V s p le , this

To e s re glo al c mp tibi ty with e tern l SCPD to cle r th fa lt in th s e ifie d ratio , a hig er

minimum d ratio s o ld b c n id re a d s e ifie in whic c s this s e ifie time s al b u e for th

te t Se als IEC 614 9- :2 1 , 5.3.4

© IEC 2 16

5.2.4.10.3 Compl a c criteria

As a res lt of the s ort time withstand c re t (

cw) test, the P ECS s al comply with the

complan e criteria of 5.2.4.2

6.2 Inf ormation f or s le tion

Re lac the ex isting b llet list b the following n w b llet li t:

• the name or trademark of the man f acturer, s p l er or imp rter;

• catalog e n mb r or eq ivalent;

• electrical ratin s f or e c p wer p rt:

– maximum nominal input voltage;

– maximum nominal output voltage;

– maximum nominal output c r ent or nominal output p wer ratin ;

– maximum nominal input c r ent rms f or dimen ionin overlo d protective elements

an wirin ;

– n mb r of phases (e.g 3 a.c.);

– nominal f req en y ran e (e.g 5 Hz to 6 Hz);

– protective clas (I I I );

• the typ of electrical s p ly s stem (e.g TN, IT) to whic the P ECS may b con ected;

• s ort-circ it c r ent ratin (s) in terms o

– c nd ition l s ort-circ it c re t (I

c) an minimum re uired pro p ctiv s ort-circ it

(I

k) ac ordin to 4.3.5

• o tput s ort-circ it c re t in ac ordan e with 4.3.2.3;

• s p ly req irements of the lo d (if a pl ca le);

• l q id co lant typ an desig pres ure f or l q id co led P ECS;

• IP ratin f or e clos re;

• o eratin an storage en ironment;

• ref eren e(s) to relevant stan ard(s) f or man f acture, test, or u e;

• ref eren e to in tru tion f or in tal ation, u e an maintenan e

The purp se of An ex N is to provide f urther in de th inf ormative b c grou d p rtainin to

s ort-circ it ratin of the input an output as sp cif ied in 4.3, whic ne d to b con idered

d rin single fa lt an a normal con ition as sp cif ied in 4.2

Internal s ort-circ its in a P ECS, either throug comp nent f ai ure or throu h h man er or,

can le d to sig if i ant eq ipment damage an immediate p tential dan er b sed on the hig

pro p ctive s ort-circ it c re t that can f low when the P ECS is con ected to an a.c or d.c

main s p ly

The damage in a circ it exp sed to a hig pro p ctive s ort-circ it c r e t is mainly d e to

the very hig level of mec anical stres , generated by the mag etic f ield an by the extreme

thermal rise in the circ it an in its comp nents

The sin le f ault an a normal analy is, sp cif ied in 4.2, rel es he vi y on the internal desig

of the P ECS as wel as on some external p rameters

Whi e the internal desig is in f ul control of the man f acturer, the external p rameters

de en on the circ it c aracteristic of the installation Esp cial y, the pro p ctive s

ort-circ it c r e t of the installation is of imp rtan e an ne d to b taken into ac ou t f or e c

in tallation

The pro p ctiv s ort-circ it c re t of the installation in icates the amou t of energ

avai a le f rom the installation d rin a f ai ure in the prod ct Without an l mitin devices, the

avai a le energ wi in re se with hig er pro p ctiv s ort-circ it c re t, an the ris of

f ire, mec anical hazard, electrical s oc or other hazard (se 4.2) wi in re se d rin a

• minimum re uired pro p ctiv s ort-circ it c r e t I

• as ociated d ration (ms);

• rated p a withstand c re t (I

k)

The pro p ctive s ort-circ it c re t is c aracterised by two p rameters:

• the p ak c r ent whic is the maximum c r ent, whic p tential y f lows d rin a s

ort-circ it of negl gible imp dan e;

The ef f ect of the p ak c r ent an I t is mainly related to the f ol owin two ph sical ris s.

• Hazardou mec anical f orces d e to the generated mag etic f ield cau ed by the s

ort-circ it c r ent, whic mig t cau e mec anical damage to bu b rs, e clos re an

red ction of cle ran e an cre p ge distan es The mec anical f orce is pro ortional to

the s uare of in tantane u s ort-circ it c r ent

NOT Furth r informatio a o t th me h nic l efe t of th s ort-circ it c re t c n b fo n in

IEC 6 8 5-

• Hazardou energ in ide comp nents le din to dramatic overhe tin /explosion of

comp nents, arc f aults an con u tive ionization of the air, whic mig t le d to f ire,

red ction of cle ran e an cre p ge distan es an destru tion of the en los re The

thermal imp ct, i.e he tin of con u tors, is pro ortional to the s uare of r.m.s value of

the s ort-circ it c r ent

N.2 Coordination of short circuit cur ent

To en ure that the P ECS an the comp nents wi b a le to o erate saf ely u der the

avai a le s ort-circ it c r ent d rin a f aiure, the P ECS an other in tallatio comp nents

ne d to b desig ed an sp cif ied f or the pro p ctiv s ort-circ it c re t at the p int where

it is in tal ed

For the calc lation of the pro p ctiv s ort-circ it c re ts in thre -phase a.c s stems the

IEC 6 9 9 series provides g idan e The con eq en es of the s ort-circ it are de lt with in

the IEC 6 8 5 series

N.2.2 Conditional sh rt-circuit cur ent (I

c) an minimum required prospective

short-circuit cur ent (I

cp, mr)

N.2.2.1 Ge eral

The c nd ition l s ort-circ it c r e t (I

c) ratin is def i ed in 4.3.2.2

N.2.2.2 Conditional short-circuit cur ent (I

c)

By sp cif yin the I

c, the protection of the P ECS de en s on the c aracteristic of the s ort-

circ it protectiv d evice (e.g f use or circ it bre ker)

In order to red ce the f ault c r ent energ an p ak c r ent an l mit the damage of the

P ECS an avoid a hazard, a c r e t-limiting d evice may b u ed As s own in Fig re N.1,

b th the I t an the p ak c r ent is lmited dramatical y d e to the c r ent-l mitin

c aracteristic of the protective device Con eq ently, the damage is sig if i antly red ced an

the ris of a hazard is red ced sig if i antly Se Clau e N.3 f or more inf ormation

Pe k c ure t w it h a

c ure t -lmit in d v ic e (I

p)

Co rdination of the P ECS with the sp cif ied upstre m SCP D is typical y p rf ormed by the

in tal er, to en ure that the SCP D wi b a le to inter upt the f ault c r ent in a saf e man er

in case of a s ort-circ it

N.2.2.3 Minimum required prospe tive short-circuit cur ent (I

cp,mr)

De en in on the c aracteristic of the s ort-circ it protective d evic , a minimum c r ent

d rin a f ai ure is ne ded to en ure a pro er o eration of the s ort-circ it protectiv device

Whi e the maximum pro p ctiv s ort-circ it c r e t res lts in the hig est f ault c r ent, but

en ures the s ortest o eratin time of the s ort-circ it protective d evic , the minimum

pro p ctive s ort-circ it c re t res lts in a lower f ault c r ent, but a sig if i antly lon er

o eration time an con eq ently an in re sing I t d rin the f ault

The man f acturer s ould b a le to s ow that the P ECS an the sp cif ied SCP D have b en

s c es f ul y tested with the sp cif ied minimum re uired pro p ctiv s ort-circ it c r e t

A man f acturer can sp cif y a maximum an minimum re uired pro p ctiv s ort c re t

an where within the trip c rves of the SCP D However, this selection imp cts the o eration of

the SCP D an the amou t of energ rele sed d rin a f ault

To en ure a s f f iciently low I t value an a q ic o eration of the SCP D, it is recommen ed

to select a minimum re uired pro p ctive s ort-circ it c r e t in the in tanane u trip in or

in the c r ent-lmitin are of the c aracteristic of a selected SCP D Se Fig re N.2 an

Fig re N.3

lmit in c harac t eris c

Max imum sh rt -c irc uit

Fig re N.3 – Ex mple of tripping c ara teristic of a c r e t l miting fus

The test to s ow compl an e with the minimum re uired pro p ctive s ort-circ it c r e t may

b waived if ris analy is can demon trate that the p ak c r ent an the I t values are b low

the values f rom the test with the maximum pro p ctiv s ort-circ it c re t

N.2.3 Short time withstand cur ent (I

cw)

The s ort-circ it ratin is expres ed as explained in 4.3.5, an Fig re N.4 s ows a typical

wavef orm

When the a pl cation req ires a hig f ault c r ent ca a i ty on the output p rt of the P ECS

(e.g f or cle rin a f ault at the output side of the P ECS), a s ita le input I

w ratin is ne ded

Co rdination of the P ECS an the installation is neces ary, to en ure that the upstre m

protective device of the installation wi b a le to inter upt the s ort-circ it c r ent saf ely

Se Clau e N.3 f or more inf ormation

The sp cif i ation of the s ort time withstand c rent

I

cw

is the most f lexible ratin , but also

the hardest ac ieva le solution, as it req ires that the P ECS has to b a le to han le not

only a hig er energ level (I t but also a very hig p ak c r ent

For the installation where the P ECS is in tal ed, the s ort-circ it protection is co rdinated to

en ure a saf e inter uption of a s ort-circ it in ide the P ECS

The f ol owin overview is in lu ed f or clarif i ation f or the man f acturer to cre te their

sp cif i ation:

• pro p ctive s ort-circ it c r e t (I

p);

• rated s ort time withstand c re t (I

w);

• c nd ition l s ort-circ it c r e t (I

c);

• minimum re uired pro p ctive s ort-circ it c r e t (I

p,mr

;

• s ort-circ it protective d evice

In case the P ECS is sp cif ied with a co d ition l s ort-circ it c re t (

c) an a sp cif ied

s ort-circ it protectiv device, it is en ured that:

© IEC 2 16

• the avai a le pro p ctive s ort-circ it c re t of the in tallatio has to b b twe n the

maximum an minimum re uired pro p ctiv s ort-circ it c r e t value of the PECS,

• the s ort-circ it ratin of the protective device has to b eq al to or gre ter than the

pro p ctive s ort-circ it c re t of the installation at the terminals of the s ort-circ it

protectiv device,

• a s ort-circ it protectiv d evic whic me ts the c r ent c aracteristic is sp cif ied by the

P ECS man f acturer, or

• a sp cif i s ort-circ it protective d evic , sp cif ied by the P ECS man f acturer, is in tal ed

in f ront of the P ECS

In case the P ECS is sp cif ied with a s ort time withstand c re t (

cw), p a withstand

c re t (

p) an d ration ratin , it has to b en ured that:

• the rated s ort time withstand c r e t (

cw) of the P ECS has to b eq al to or gre ter than

the pro p ctive s ort-circ it c re t r.m.s of the in tallatio at the terminals of P ECS,

• the p a withstand c re t (I

p) of the P ECS has to b eq al to or gre ter than the

prosp ctive s ort-circ it p ak c r ent of the in tallatio at the terminals of P ECS, an

the examples s owed in N.3.2 an N.3.5 Another level could have b en c osen an would

have worked as wel

The examples are not inten ed to s ow how a typical installation is made, nor do they s ow

the p sition or n mb rs of bre kers, switc es, f uses b twe n the mains s p ly an the

P ECS

None of the examples are calc lated an re l solution The dif f erent c r ent levels,

d ration an devices are only selected f or the purp se of explanation

N.3.2 Ex mple 1: Two or more P ECS with diff ere t ratings

Fig re N.5 provides some general g idan e on how to a ply I

w, I

k

an d ration or I

can

s ort-circ it protectiv d evic f or two or more P ECS with p rts in tal ed in the same

in tallatio

c p

= 5 k ASCPD: 8 0 A fu e, t y pe x x

c w

= 2,1

I-d rat io = 6 msSCPD:in t aler s lec t ed c irc uit bre k er

IEC

Fig re N.5 – Two P ECS with diff ere t spe if ic tions

P ECS 1 has an I

cratin In this example, a f use with a sp cif ied c r ent ratin an

c aracteristic (8 0 A, typ x ) is u ed f or the P ECS 1, but also a circ it bre ker mig t b

sp cif ied by the man f acturer The sp cif ied s ort-circ it protective d evice can b made

avai a le as a p rt of the P ECS or can b a p rt the in tal er ne d to purc ase ac ordin to

the man f acturer I

c

declaration

P ECS 2 has an I

wratin In the in tallatio , an typ of s ort-circ it protective d evic can b

u ed as lon as it do s not ex e d al sp cif ied I

wratin s (r.m.s c r ent, p ak c r ent ratio,

I

k/I

declaration is b sed on the u e of a sp cif i s ort-circ it protective d evice (in this

example, a 8 0 A f use) whic is req ired to b in taled in f ront of P ECS 1 The man f acturer

has verif ied by test (se Clau e N.4), that the P ECS can with tan the rated c nd ition l

s ort-circ it c re t (

c), f or the total o eration time (cle rin time) of the s ort-circ it

protective d evic u der sp cif ied con ition

In this example, the sp cif ied con ition is that

• the l mitation of the pro p ctive s ort-circ it c r e t is 5 kA This l mitation is a

man f acturer decision The u e of a s ort-circ it protective d evic could b a proved f or

mu h hig er I

p, however it is a man f acturer decision to select the a pl ca le I

whic the in taled P ECS an s ort-circ it protective d evice may b exp sed to in an

installation

As the o eratin time an c r ent l mitation c aracteristic de en s on the a pl ed pro p ctiv

s ort-circ it c re t (

c), it is neces ary to determine the minimum re uired pro p ctiv

s ort-circ it c re t (I

p,mr This is to en ure the exp cted b havior of the s ort-circ it

protectiv device an to verif y that this situation wi not have an severe con eq en es f or

the P ECS, as the o enin time of the s ort-circ it protective d evice wi in re se with lower

© IEC 2 16

pro p ctiv s ort-circ it c re t of the mains s p ly The minimum re uired pro p ctive

s ort-circ it c r e t, I

p,mr, is also verif ied by test (se Clau e N.4)

The device whic the I

c

is b sed on s ould b sp cif ied by the c aracteristic of the s

ort-circ it protective d evice

NOT Th c ara teristic of th prote tiv d vic c n als in lu e s e ific ma ufa turer p rt n mb rs in c s

n e e for th c mpla c of I

c

I

k) (se Clau e N.1, Option 2)

• s ort time withstand c re t = 5 kA

• as ociated d ration= 6 ms

• p a withstand c re t ratio, I

k/I

c r e t (

p)

The sp cif ied I

w

is eq al to or hig er than the avai a le pro p ctiv s ort-circ it c re t (

c)

at the terminals of P ECS 2

NOT Th s stem inte rator c n c o s a a pro riate s ort -ci rcu prote t i ve devi ce b s d o th ir d clare

ratin

N.3.5 Ex mple 2: One P ECS with more tha one rating

Fig re N.6 provides some general g idan e on how to sp cif y I

w,I

k

an d ration or I

can

s ort-circ it protective d evic f or one P ECS with two p rts in tal ed in the same installation

P ECS 3 has two sets of input main s p ly p rts, p rt 1 an p rt 2, an the desig an

• Device = 1 2 0A MCCB (man f acturer data, typ , c aracteristic)

The declaration an con ideration b hin the work are simiar to the example of P ECS 1

The I

c

declaration is b sed on the u e of a s ort-circ it protective d evic , a 1 2 0 A MCCB,

whic is req ired to b in tal ed in f ront of P ECS 3

declaration is b sed on the u e of a s ort-circ it protectiv d evic , in this example a

1 5 0 A aR f use, whic is in lu ed/in orp rated in the P ECS, but the con ideration are

simi ar to those explained f or P ECS 1

N.3.6 Additional e pla ation on terms, def initions a d spe if ic tions

N.3.6 provides some ad itional inf ormation a out u ed p rameters:

• pro p ctiv s ort-circ it c r e t (I

p), an

• main s p ly c aracteristic

u ed as desig p rameters to determine req ired level of I

• Desig p rameter an solution f or the P ECS, where the level (kA) is selected by the

man f acturer b sed on the P ECS a pl cation

• The selected level (I

w r.m.s

) is u ed in test la , where the test generator is cal brated to

the selected level f or I

wtestin , to simulate a maximum avai a le pro p ctive s ort-

circ it c r e t at the input of the main s p ly p rt

P eak withstand cur ent (I

k)

• Desig p rameter selected by the man f acturer b sed on the P ECS a pl cation

• The selected p ak c r ent (I

k) or ratio (I

k/I

w) is u ed in test la , where the test

generator is cal brated to the selected level f or I

w

ctestin

Duration f or I

cw

• Desig p rameter ( ime) selected by the man f acturer b sed on the P ECS a pl cation

• The selected d ration is u ed in test la , where the test generator is adju ted an

cal brated to delver the req ested c r ent an p ak f or the selected d ration

© IEC 2 16

Conditional sh rt-circuit cur ent (I

c)

• Desig p rameter where the solution is selected by the man f acturer b sed on the P ECS

a pl cation an selected device

• The selected level (I

c r.m.s) is u ed in test la , where the test generator is cal brated to

the selected level f or I

ctestin , to simulate a maximum avai a le pro p ctive s ort-

circ it c re t at the input of the main s p ly p rt

Minimum req ired prospe tive short-circuit cur ent (I

p,mr)

• Desig p rameter selected by the man f acturer

• Derived con eq en e of the selected s ort-circ it protective d evice an the avai a le

pro p ctiv s ort-circ it c r e t

• The selected level (

c ,mr

is u ed in test la , where the test generator is calbrated to the

selected level f or I

p,mr testin , to simulate a minimum avai a le pro p ctive s ort-circ it

c re t at the input of the p rt

N.4 Short circ it rating a d single fault conditions testing

As mentioned in Clau e N.1, the P ECS has to b a le to f ai saf ely u der the sp cif ied

maximum an minimum s ort-circ it c r ent This in lu es the f ol owin tests:

• con u t output s ort-circ it test ac ordin to 5.2.4.4;

• con u t protective e uipotential b nd in s ort-circ it with tan test ac ordin to

5.2.3.1 3;

• con u t bre k own of comp nent tests ac ordin to 5.2.4.6;

• con u t s ort time withstand c re t (I

w) test ac ordin to 5.2.4.10

Se Fig re N.7

© IEC 2 16

N.4.2 Ex mption f rom short time withstand cur ent te ting

N.4.2.1 Ge eral

Prod ct commit e s can con ider if sp cial ex e tion are a pl ca le f or their prod cts

con iderin sp cif i a pl cation Fol owin exp ction may b u ed in their evaluation

Exemption f rom s ort time withstand c r e t testin a pl es to:

• PECS protected by c r ent-l mitin devices havin a c t-of f c r ent not ex e din 17 kA

with the maximum al owa le prosp ctive s ort-circ it c r ent at the terminals of the

in omin circ it of the PECS;

• PECS inten ed to b s p l ed f rom tran f ormers whose rated p wer do s not ex e d

10 kVA p r phase f or a rated secon ary voltage of not les than 1 0 V, or 1,6 kVA p r

phase f or a rated secon ary voltage les than 1 0 V, an whose s ort-circ it imp dan e

N.4.2.2 Spe ial consideration

In case where the f ault c r ent p th in lu es semicon u tor devices, the a ove ex e tion

mig t not b val d (se Clau e N.1)

The compl an e of criteria 5.2.4.10.3 req ires that the P ECS an its components s ould

remain saf e d rin an af ter the test A red ction of the f unctional ty (e.g P ECS can b come

f ul y non-f un tional) is p rmis ible

N.5 Guidel ne f or short circuit analysis

The s ort-circ it analy is con iders, but not lmited to, the f ol owin :

• I t bre k own ratin s of con u tors an comp nents;

• identif i ation of f ault c r ent p th an imp dan e in the eq ipment;

• p s ibi ty an extent of cas adin f ai ures;

• nature of f ai ure with resp ct to ph sical location (e.g proximity to other critical

comp nents, b r iers, cle ran es, cre p ge distan es, vent o enin s);

• identif i ation of al energ sources (main , ca acitors, motor, etc.) in the circ it;

• f or main s p ly, con ider p wer circ it con g ration an grou din (wye, delta, IT, etc.);

• en los re (size, material, stru ture, o enin s, etc.);

• typ s an ratin s of the overc r ent protective devices sp cif ied to b u ed with the

P ECS;

• sp cif ied l ne rity of c r ent-l mitin comp nents (external and internal) with resp ct to

• variation in comp nents within P ECS f ami y;

• maximum variation of main imp dan e, f req en y, voltage with resp ct to

sp cif ied/publ s ed prod ct a pl cation (u e of tran f ormer, l ne re ctor etc.)

Testin may b neces ary to val date the p rtion of the analy is

Bibliography

Ad d the following refere c s:

IEC TR 6 7 5:2 12, Co sid eration of refere c imp d an e a d p b c s p ly n twork

imp d an e for u e in d etermining the d isturb n e c ara teristic of electric l e uipme t

h ving a rated c r e t ≤ 7 5 A p r p a e

IEC 6 8 5 (al p rts), Sh rt-circ it c r e ts – Calculation of efe ts

IEC 6 8 5-1, Sh rt-circ it c re ts – Calculation of efe ts – P art 1: Definition a d

c lculatio methods

IEC 6 9 9 (al p rts), Sh rt-circ it c r e ts in thre -p a e AC s stems

IEC 6 9 9-0:2 16, Sh rt-circ it c re ts in thre -p a e a.c s stems – P art 0: Calculation of

c r e ts

IEC 6 9 7-1:2 0 , L w-v ltag switch e r a d c ntrolge r – P art 1: Ge eral rules

IEC 6 9 7-6-1:2 0 , L w-v ltag switch e r a d c ntrolge r – P art 6-1: M ultiple fu ction

e uipme t – Tra sfer switching e uipme t

IEC 6 9 7-6-1:2 0 /AMD1:2 13

IEC 614 9-1:2 1 , L w-v ltage switch e r a d c ntrolge r a s mblies – P art 1: Ge eral

rules

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