Iec 62153 4 4 2015

IEC 621 53 4 4 Edition 2 0 201 5 04 INTERNATIONAL STANDARD Metallic communication cable test methods – Part 4 4 Electromagnetic compatibil ity (EMC) – Test method for measuring of the screening attenu[.]

IEC 621 53- 4- 4

Editio 2.0 2 15-0

Met al ic communicat ion cable t est met hods –

Part 4- 4: Elect romagnet ic compat ibi ity (EMC) – Test met hod for measuring of

t he screening at t enuat ion a

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IEC 621 53- 4- 4

Edit io 2.0 2 15-0

Met al ic communicat ion cable t est met hods –

Part 4- 4: Elect romagnet ic compat ibi ity (EMC) – Test met hod for mea uring of

t he screening at t enuat ion a

FOREWORD 3

1 Sco e 5

2 Normative ref eren es 5

3 Symb ls an the retical b c grou d 5

3.1 Electrical s mb ls 5

3.2 The retical b c grou d 6

3.3 Scre nin at en ation 7

3.4 Imp ct of coupl n len th an relation hip b twe n the s re nin at en ation an the s r ace tran fer imp dan e Z 7

4 Prin iples of the me s rin method 10 5 Me s rement 1

5.1 Eq ipment 1

5.2 Ca le u der test 1

5.2.1 Co xial ca les 1

5.2.2 Symmetrical an multicon u tor ca les 1

5.2.3 Imp dan e matc in 12 5 3 Proced re 1

2 5.4 Expres ion of res lts 12 6 Req irement 13 An ex A (normative) Determination of the imp dan e of the in er circ it 14 An ex B (informative) Example of a selfmade imp dan e matc in ada ter 15 An ex C (inf ormative) Reflection los of a ju ction 17 Biblogra h 19 Fig re 1 – Relation hip of U 2 /U 1 on a log (f) s ale for a sin le braided ca le 8

Fig re 2 – Relation hip of U 2 /U 1 on a l ne r (f) s ale an s re nin at en ation a on a l ne r (f) s ale for a sin le braided ca le 9

Fig re 3 – Me s red s re nin aten ation a formed by the maximum en elo e c rve to the me s red coupl n voltage ratio U 2 /U 1 of a sin le braided ca le 9

Fig re 4 – Triaxial me s rin set-up 10

Fig re 5 – Triaxial me s rin set-up con ected to the network analy er 10

Fig re 6 – Pre aration of test sample (s mmetrical an multi-con u tor ca les) 12

Fig re B.1 – At en ation an return los of an 5 Ω to 5 Ω imp dan e matc in

ada ter; logarithmic f req en y s ale 15

Fig re B.2 – At en ation an return los of an 5 Ω to 5 Ω imp dan e matc in

ada ter; lne r f req en y s ale 16

Fig re C.1 – Eq ivalent circ it of generator with lo d 17

INTERNATIONAL ELECTROTECHNICAL COMMISSION

_

Part 4-4: Electromagnetic compatibi ity (EMC) –

Test method for measuring of the screening at enuation a

s

up to and above 3 GHz, triaxial method

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International Stan ard IEC 6 15 -4-4 has b en pre ared by tec nical commite 4 : Ca les,

wires, waveg ides, R.F con ectors, R.F an microwave p s ive comp nents an

ac es ories

This secon edition can els an re laces the first edition, publ s ed in 2 06 an con titutes a

tec nical revision

This edition in lu es the f ol owin sig ificant tec nical c an es with resp ct to the previou

edition Imp dan e matc in ada ters are no lon er req ired when me s rin devices have a

c aracteristic imp dan e diff erent f om the c aracteristic imp dan e of the test eq ipment

The reflection los d e to a mismatc is taken into ac ou t by a (calc lated) cor ection f actor

The text of this stan ard is b sed on the fol owin doc ments:

Ful inf ormation on the votin for the a proval of this stan ard can b foun in the re ort on

votin in icated in the a ove ta le

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 6 15 series, publ s ed u der the general title, Metal l ic

c mmu ic tion c bl e test met hods, can b f ou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

• recon rmed,

• with rawn,

• re laced by a revised edition, or

A bi n ual version of this publcation may b is ued at a later date

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colour printer

META LLIC COMMUNICA TION CA BLE TEST METHODS –

Part 4-4: Electromagnetic compatibi ity (EMC) –

Test method for measuring of the screening at enuation a

metal c commu ication ca le s re n Due to the con entric outer tub , me s rements are

in e en ent of ir eg larities on the circ mferen e an outer electromag etic field

A wide d namic f req en y ran e can b a pl ed to test even s p r s re ned ca les with

normal in trumentation fom low f req en ies up to the l mit of def i ed tran versal waves in

the outer circ it at a proximately 4 GHz

The f ol owin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a ples For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 15 -4-1, Metall ic c mmu ic t ion c ble t est methods – Part 4-1: Ele troma n tic

Comp t ibil ity (EMC) – Introd uction to ele troma n t ic scre ning me sureme ts

normal zed value of the c aracteristic imp dan e of the en ironment

of a typical ca le in tal ation (15 Ω) It is in no relation to the

imp dan e of the outer circ it of the test set-up Z

primary side of the two p rt is the DUT an the secon ary side is the

primary side of the two p rt is the DUT an the secon ary side is the

tub

0r211

/

0r21

23

ϕϕ

3.2 Theoretic l ba k rou d

There wi b a variation of the voltage U

2

on the f ar en , cau ed by the electromag etic

coupl n throu h the s re n an s p rimp sition of the p rtial waves cau ed by the s r ace

tran f er imp dan e Z

T, the ca acitive coupln imp dan e Z

F ( ravel n to the far an ne r

en ) an the total y reflected waves f rom the ne r en

For exact calc lation, if fe db c f om the secon ary to the primary circ it is negl gible, the

ratio of the f ar en voltages U

1

2are given by

((((

((((

(((

((((

(((

Ze

ZZZ

e112

1

1e

1

20

1

r2r

FT

r2r

FT

12

ϕ

ϕϕ

ω

εεε

i.e f ormal y | A + B | × C × D, where A × C is the far en cros talk, B × C is the reflected ne r

en cros talk an D is the mismatc factor

The total os i ation of D are

2/R < 1,2

2/R = 1,4

2/R >

Maximum values of A × C an B × C are given, if ϕ

1,2

= (2N + 1) × π an N is an integer

The voltage ratio me s red is not de en ent on the diameter of the outer tub of the triaxial

test set-up or on the c aracteristic imp dan e Z

2

of the outer s stem, provided that Z

2is

larger than the input imp dan e of the receiver

A more detai ed des ription of the s bject is given in IEC 6 15 -4-1

10

log

10

PP

Ena

imp dan e R is

Sma

2,

mar,

2r

R

PP

FT

r2r

FT

1o

1

ma,2

εεεε

Z

RZc

PP

(4)

3.4 Impa t of coupl n le gth a d relation hip betwe n the s re ning at e uation a d

T

The relation hip b twe n the eff ective coupl n len th of the ca le u der test and the

electrical wave len th is imp rtant for the c aracteristic c rve of the s re nin at en ation

(se Fig res 1 an 2) In the f eq en y ran e of electrical y s ort coupl n len th , the

me s red at en ation decre ses with in re sin len th Theref ore, it is neces ary to define

the related len th

With electricaly lon len th , the s re nin aten ation formed by the maximum en elop

c rve to the coupln voltage ratio is con tant f or a 6 dB/octave (2 dB/decade) in re sin

tran fer imp dan e Therefore, the s re nin at en ation is defined only at hig f eq en ies

The coupl n len th is electrical y s ort, if

r0

10× × ε

<

lc

f

(5)

or electrical y lon , if

r2r0

>

lc

UU

Zl

(7)

Also, at hig f eq en ies, Z

T can b calc lated if Z

F

is negl gible:

1

ma2

ro

r2r1

T

2

PP

c

RZ

(8)

therefore

r2r1

roT

1

ma2

2

εεω

cZ

PP

(9)

A more detai ed des ription of the s bject is given in IEC 6 15 -4-1

Figure 1 – Relation hip of U

2/U

Fig re 2 – Relations ip of U

2/U

4 Principles of the me suring method

The disturbin or primary circ it is the matc ed ca le u der test The disturb d or secon ary

circ it con ists of the outer con u tor (or the outermost layer in the case of multis re n

ca les) of the ca le u der test an a sol d metal c tub havin the ca le un er test in its axis

(se Fig res 4 an 5)

The voltage p ak at the f ar en of the secon ary circ it have to b me s red The ne r en

of the secon ary circ it is s ort-circ ited For this me s rement, a matc ed receiver is not

neces ary The exp cted voltage p ak at the f ar en are not de en ent on the input

imp dan e of the receiver, provided that it is lower than the c aracteristic imp dan e of the

secon ary circ it However, it is an ad antage to have a low mismatc , for example, by

selectin a ran e of tub diameters for several sizes of co xial ca les

Fig re 4 – Tria ial me s ring s t up

Figure 5 – Tria ial me s ring s t up conne te to the network a aly er

Calbrat ed re eiv er

or n twork a aly ser

U

1

U

2