Iec 61058 1 2 2016

NOT This test c n itio refle ts th pro er fu ctio in of th switc.. 7.2 .2 Simulated test con ition for electronic switc es with typ of lo d as clas ified in 7.2.. NOT This test c n itio

Switches for appl ances –

Part 1-2: Requirements for electronic switches

Inter upteurs pour apparei s –

Partie 1-2: Exigences relatives aux inter upteurs électroniques

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Switches for appl ances –

Part 1-2: Requirements for electronic switches

Inter upteurs pour apparei s –

Partie 1-2: Exigences relatives aux inter upteurs électroniques

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CONTENTS

FOREWORD 4

1 Sco e 6

2 Normative referen es 6

3 Terms an definition 6

4 General req irements 6

5 General information on tests 6

6 Ratin 8

7 Clas ification 8

8 Markin an doc mentation 8

9 Protection again t electric s ock 9

10 Provision for e rthin 9

1 Terminals an termination 9

12 Con tru tion 9

13 Mec anism 9

14 Protection again t in res of sol d foreig o jects, in res of water an h mid con ition 9

15 In ulation resistan e an dielectric stren th 9

16 He tin 9

17 En uran e 9

17.1 General req irements 10 17.2 Electrical con ition 13 17.3 Thermal con ition 15 17.4 Actuatin con ition 15 17.5 Typ of test con ition (TC) 17 17.6 Evaluation of compl an e 18 18 Mec anical stren th 19 19 Screws, c r ent car yin p rts an con ection 19 2 Cle ran es, cre p ge distan es, sol d in ulation an co tin s of rigid printed b ard as embles 19 21 Fire hazard 19 2 Resistan e to ru tin 19 2 Abnormal o eration an fault con ition for switc es 2

2 1 Switc con tru tion 20 2 2 Test set up 2

2 3 Abnormal testin 20 2 4 Compl an e 21

2 5 Protection in case of fai ure of forced co l n 21

2 Comp nents for switc es 21

2 EMC req irements 21

Ta le 101 –Test sp cimen 7

Ta le 10 – Switc information an the lo d placed in groups 8

Ta le 10 – Test lo d for electrical en uran e tests for a.c circ its 14

Ta le 10 – Test lo d for electrical en uran e tests for d.c circ its 15

Ta le 10 – Switc o eratin con ition 16

INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 1-2: Requirements for electronic switches

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International Stan ard IEC 610 8-1-2 has b en pre ared by s bcommit e 2 J: Switc es for

a pl an es, of IEC tec nical commitee 2 : Electrical ac es ories

The text of this stan ard is b sed on the fol owin doc ments:

Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on

votin in icated in the a ove ta le

This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 610 8 series, publ s ed u der the general title Swiche s for

This p rt of IEC 610 8 is to b u ed in conju ction with IEC 610 8-1(2 16).

This Part 1-2 s p lements or modifies the cor esp n in clau es in IEC 610 8-1, so as to

con ert that publ cation into the IEC stan ard: Re uireme ts forelectro ic swiche s

When a p rtic lar s bclau e of Part 1 is not mentioned in this Part 1-2, that s bclau e a pl es

as far as re sona le Where this stan ard states “ad ition”, “modification” or “re lacement”,

the relevant text of Part 1 is to b ada ted ac ordin ly

In this stan ard:

1) the fol owin print typ s are u ed:

– req irements pro er: in roman typ ;

– te st sp e cificato s: in ialc typ e;

– n tes/e pla atory maters: in smal roma ty e

2) s bclau es, notes, fig res an ta les whic are ad itional to those in Part 1 are n mb red

startin from 101 An exes whic are ad itional to those in Part 1 are letered AA, BB, etc

The commite has decided that the contents of this publcation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

• reconfirmed,

• with rawn,

• re laced by a revised edition, or

• amen ed

This p rt of IEC 610 8 a pl es to electronic switc in devices an s al b u ed in

conju ction with the general req irements of IEC 610 8-1

NOT Ad itio al re uireme ts for p rtic lar switc es ma b fo n in th rele a t p rt 2 of IEC 610 8

Ta le 101 provides information on:

– The minimum n mb r of sp cimen ne ded for e c test

– The minimum n mb r of total sp cimen , when a plca le tests are ad ed, ne ded for

e c evaluation

– Ad itional sp cimen that may b req ired as a res lt of ad itional electrical ratin ,

Table 101 –Te t spe ime s

Minimum number of

spe imens for e c te t

a)Note

5 Ge eral informatio o tests

Prote tio a ainst h mid c n itio s

Insulatio resista c a d diele tric stre gth

Ea h ele tric l ratin su mite to th testin of Cla ses 16 a d 17 re uires a a ditio al 3 sp cime s (su h

as ratin i = 3 sp cime s, ratin i = a ditio al 3 sp cime s)

c)

Th sp cime ma b use for more th n 1 test, if c mulativ stres as a result of se u ntial testin is

a oid d Wh n a sp cime is d ma e a n w sp cime sh l b use for th n xt test

d)

In g n ral 1 sp cime for in res of sold foreig o je ts (d st, a d 1 sp cime for in res of water

Sp cific IP ratin s (su h as IP5 , IP6 a d prote tio a ainst water) re uire a sp cial e closure to b

pro id d with th switc sp cime in ord r to c mplete th testin

e)

Th same test sp cime s are use to c mplete th testin of 14.3 a d 15 Th test are c mplete in

imme iatese u n e

f

He tin a d e d ra c is re omme d d to b teste o th same sp cime s If d clare , se arate

sp cime s ma b use wh n n te o th test re ord

Ab ormal o eratio a d fa lt c n itio s are g n raly d stru tiv , ty ic ly th switc c n ot b re aire

a d re se for th n xt fa lt Sp cialy pre are sp cime s (su h as with wires sold re to th intern l

circ it ma b n c s ary in ord r to c mplete th testin Th total n mb r of sp cime s d p n s o th

switc c nstru tio , for d tais se Cla se 2

m)

This test is p rt ofa se u n e, a d a n w set of 3 sp cime s sh l n t b use e c pt as p rmite b 5.1.2

7.2 1 Ele tric l e dura c method “a” (Table 10 )

7.2 2 Ele tric l e dura c method “b” (Table 10 )

7.2 Minimum loa for ele tronic switc e

7.2 Ac ording to te t conditions for ele tronic switc e :

7.2 1 Fu ctional test con ition for electronic switc es with thermal c r ent or maximum

rated resistive c r ent

NOT This test c n itio refle ts th pro er fu ctio in of th switc This test d es n t simulate th a tu l lo d

of th e d a plc tio

7.2 2 Simulated test con ition for electronic switc es with typ of lo d as clas ified in 7.2

NOT This test c n itio refle ts th pro er fu ctio in of th switc It also simulates al c n itio s of th e d

Table 10 – Switc information a d the loa s pla e in groups

12.7 Test c n itio s fu ctio al or

simulate

9 Protection against electric shock

Compla ce is ch ck d ac ordin to TE2 in Clause 17 Forele ctro ic swich s rated for le ss

th n 1E4 cycle s th TE2 te st sh l b e p erformed o th complete swich

– For electro ic swiche s, th test is caried ou t acros full dis o n cto a d

micro-dis o n cto o ly o electro ic swich s wih m ech nical swichin de ices co n cted in

series wih th semico ductor swichin de vice

– For e le ctro ic swich s, th tests are n t caried ou t acros p rotectv impe da ces a d

p ole s interco ne cte d b y comp n nts

16 He ting

This clau e of p rt 1 is a pl ca le

17 Endurance

17.1 Ge eral re uireme ts

17.1.1 Switc es s al with tan without ex es ive we r or other harmful ef ect the

electrical, thermal an mec anical stres es that oc ur in normal u e

17.1.2 Electronic switc es are tested in an in re sin TC order as sp cified in Ta le 10

Th test co di o s are ac ordin to th folowin dep endin o th irclas ificato in 7.27

– u nderfuncto al te st co di o s ac ordin to 7.27.1 wih th rmal curre t orwih ma imu m

rated resistv curre t, if n th rmal cu rre t is declared, a d wih u t forced co lng;

– u ndersimulated te st co di o s ac ordin to 7.27.2 a d wih ty e of lo d ac ordin to 7.2

a d unde r th co ln co di o s clas ified in 7.2 a d wih te st co di o s as sp e cified in

Tab les 10 a d 10 ;

– u nderspe cific te st co di o s of e d ap plcato ac ordin to 7.27.3, in or togeth r wih

th a p lia ce a d under th co ln co di o s of th a p lia ce;

– u ndertest co di o s ac ordin to duty typ e ac ordin to 7.18, th te sts ma b e p erformed

in comb in to wih simu lated te st co di o s or sp ecific test co di o s of th e d

ap plcato

NOT Ad itio al me h nic l o eratin me ns (or e ample, a tu tin memb r su h as sp e -lmit setin s for

ele tric to ls) are ig ore

TL1 : th rmal c re t or ma imum rate resistiv c re t, if n th rmal c re t is d clare

TL : ma imum rate resistiv c r e t

TC6 : ma u l fu ctio al test at minimumlo d – o tio al (17.5.6)

TC7 : lmite n mb r of o eratio test (17.5.7)

Testin sh l b c mplete usin eith r meth d “a” or meth d “b” Th same meth d sh l b use for b th “c mplete switc ” a d th “c nta ts o ly” testin Switc es with

series a d p ralel c nta ts test sh l a d th p ralelc nta t test with th same meth d “a” or ”b” use for th series c nta t test Testin to b th meth d “a” a d meth d “b”

is n t re uire

17.2 Ele tric l condition

The switc s al b lo ded as sp cified in Ta le 10 , an con ected in ac ordan e with the

test circ it in 610 8-1:2 16, Ta le 2

a) Whe re, in IEC 61058-1:2016, Tab le 2, a auxi ary swich (A) is sym b olzed in th test

circu it, th te sts for th two ON-p osi o s of th sp ecime (S) are p erforme d o two

sep arate sets ofte st samples Th co n cto to th test lo d to b e p e rformed forth two

tests is sym b olzed in IEC 610 8-1:20 16, Tab le 2 b y a auxi ary swich A

b) Mu ltwa swiche s are lo de d ac ordin to 61058-1:20 16, Tab le 1 Th lo d forth othe r

swich p osi o s is th t re su ltn from th lo ds n ces ary to achie ve th co di o s

spe cified ab ov

c) For circuits ac ordin to 7.2.7 for sp ecific lamp lo d, th co ne cto a d te st lo d are as

sp ecified b y th ma u facture r usin th ma imu m oc urrin inrush cu rre t at ro m

temp eratu re Fora sp ecific lamp lo d, i is recomme ded th t th sp e cime b e o e rate d

wih lo ds th t are used in th field rathe r th n wih sy th tc lo ds Forced co ln of th

sp cific lamp lo d ma b e a p lie d in orderto e sure cold resista ce fore ach op eratn

cycle a d sh rte n th test tme

d) No e lectrical lo d is ap pled durin th e dura ce tests for swiche s clas ified to 7.2.6

wih a ratn of 2 mA orle ss

e) For ele ctro ic swiche s, th test circuit sh l b e as sh wn in Figure 16 Th declared lo d

sh l b e set at ratedv lage b efore th ele ctro ic swich is inserted into th circu it (th

Table 10 – Te t loa s for ele tric l e dura c te ts for a.c circ its

Su sta tialy resistiv (clas ifie in 7.2.1) Ma in a d

≥ ,9e)

Circ it for sp cific lo d of motor with a lo k d rotor

a d with a p wer fa tor n t les th n 0,6 (clas ifie in

Th sp cifie ma in c n itio s are maintain d for a p rio b twe n 5 ms a d 10 ms, a d are th n

re u e b a a xi ary switc to th sp cifie bre kin c n itio s

For ele tro ic switc es, th re u tio to th bre k c r e t sh uld b a hie e with ut a y o e circ itin of

th simulate in u tiv lo ds circ it, to e sure th t n a n rmal v lta e tra sie ts are g n rate

c)

Resistors a d in u tors are n t c n e te in p ralel e c pt th t if a y air-c re in u tor is use , a resistor

ta in a pro imately 1 % of th c re t thro g th in u tor is c n e te in p ralel with it Iro -c re

in u tors ma b use pro id d th t th c re t h s a su sta tial sin -wa e form For thre -p ase tests,

thre -c rein u tors are use

– th c ld resista c of th lamps sh l b e sure for e c o eratin c cle;

– th resista c of c n e tio s withinth lo d circ it ( or e ample lampso k ts) sh l b c nsta t

– th pro er fu ctio of th lamps p rformin th lo d set sh l b e sure for e c o eratin c cle

Table 10 – Te t loa s for ele tric l e d ra c te ts for d.c circ its

Type of circ it a

cla sified in 7.2

Operatio of

co ta ts

Te t volta e Te t c r ent Time co stant

Substantial y re istiv load Making an

– th c ld resista c of th lamps sh l b e sure for e c o eratin c cle;

– th resista c of c n e tio s withinth lo d circ it ( or e ample, lamp so k ts) sh l b c nsta t

– th pro er fu ctio of th lamps p rformin th lo d set sh l b e sure for e c o eratin c cle

17.3 Thermal condition

17.3.1 For switc es ac ordin to 7.3.2, d rin the tests in 17.5.8 (TC8) al p rts are

exp sed to temp ratures as fol ows: For the first half of the test p riod at maximum air

temp rature (T + /0) °C For the secon half of the test p riod at 2 °C ± 10 °C or at the

minimum air temp rature (T 0/ 5) °C if T is les than 0 °C

17.3.2 For switc es ac ordin to 7.3.3, d rin the tests in 17.5.8 (TC8), those p rts that are

declared for u e at 0 °C to 5 °C s al b exp sed to a temp rature within this ran e for the

complete test p riod

For th first h lf of th test p eriod, th air temp e rature ofth remainde r of th swich sh l b e

maintaine d at th ma imu m air tem perature (T +5/0) °C

For th se co d h lf of th test p eriod th tests are caried ou t at 2 °C ± 10 °C or at th

minimum air temp erature (T 0/-5) °C if i is le ss th n 0 °C

17.3.3 For switc es ac ordin to 7.3.1, d rin the tests in 17.5.8 (TC8), the switc s al b

exp sed to an air temp rature of the 2 °C ± 10 °C

17.4 Actuating condition

17.4.1 The switc es are o erated by me n of its actuatin memb r either man al y or by

an a pro riate a p ratu whic is ar an ed to simulate normal actuation

Th op eratn sp eed forth o e ratn cycles sh l b e as folows:

For th tests of e lectro ic swich s:

a) For v ry slow sp eed:

– ap p ro imate ly 0 ,5 mm/s for ln ar actuato

b) For slow sp eed:

– ap p ro imately 9°/s for rotary acto s;

– ap p ro imately 5 mm/s for ln ar acto s;

c) For hig sp eed, th actu ato memb er sh l b e actuated b y h nd as fast as p os ib le or

usin th ac elerated sp eed from th mech nical swich testn IEC 610 58-1-1

d) for ac elerated sp eed:

– ap p ro imately 4 °s for rotary acto s,

– ap p ro imately 2 mm/s to 2 mm/s for ln ar acto s

17.4.2 For biased switc es, the actuatin memb r s al b moved to the l mit of travel of the

o p site p sition

17.4.3 Durin the testin , care is ta en that the test a p ratu drives the actuatin memb r,

without imp din the desig ed movements of the switc

17.4.4 Durin the ac elerated sp ed test,

a) care sh l b e ta e n to e sure th t th test ap p aratus alows th actuatn m emb er to

op erate fre ly, so th t th re is n interfere ce wih th n rmal acto of th mech nism;

b) for swich s de sig ed for a rotary actuato whe re th mo eme t is n t lmied in eihe r

dire cto , three -quarters ofth total nu mb erof op eratn cycles in e ach test sh l b e made

in a clockwise directo , a d o e-quarterin a a t clockwise dire cto ;

c) for swiche s which are designed for rotary actuato in o e directo o ly, th test sh l b e

pe rformed in th de signed dire cto , p ro ided th t i is n t p os ib le to rotate th actuatn

memb e r in th re e rse dire cto usin th torque s n ce ssary foractuato in th designe d

directo ;

d) ad i o al lub ricato sh l n t b e ap ple d durin th se tests;

e) th force s ap pled to th e d stop s of th actu atn memb ers sh l n t e ce d th

de clared v lu es (if a y) for rotary a d lne ar actuato Th declared full tra el of th

actuatn memb e r (ifa y) sh l b e a p lied du rin th se tests

17.4.5 So far as the desig al ows, switc es are o erated with the fol owin con ition :

Table 10 – Switc operating conditions

minimumc oln time for e c lo d set sh l b 5 s

a dth c cle rate for th switc ma b in re se

Re uire v ry slow sp e

TC10

Minimum 2 Minimum 6 To alow arcin at th ma e a d bre k

L c e rotor tests (TC9) 1 3 To alow for th inrush

For switc es with more than one lo d ( hrow), e c o eratin in the test circ it s c as

IEC 610 8-1:2 16, Ta le 2 test codes 2.3, 2.5, 2.7 or 2.9, the ON p riod wi b

Multi-way switc es are o erated in compl an e with the ta le a ove, or actuated with the

sp ed in icated in 17.4 an a minimum ON p riod of 2 %

This req irement in Ta le 10 is not val d for very slow sp ed (TC10), the on time s al b

s f icient to al ow arcin

17.5 Type of te t condition (TC)

17.5.1 In re sed-voltage test at ac elerated sp ed (TC1):

– Electrical co di o s: Th lo d sp ecified ac ordin to Tab le s 10 4 a d 105, th v la e

incre sed to 1,15 th ratedv lage (th lo d is n t re adjusted)

– Cap aci v lo d a d sim u late d lamp lo d tests for a.c circuits, th te st v la e is th rated

v lage a d th te st curre ts are incre sed to 1,15 rated curre ts

This test ap ples o ly to swiche s which h v more th n o e p ole a d wh n p olariy re e rsal

oc urs (wh n i is p os ib le to mo e from o e p olariy to th op posie wih ut a mech nical

interlock or simiarmech nical imp edime t

17.5.4 Test at ac elerated sp ed (TC4):

– Ele ctrical co di o s: sp e cifie d in Tab le 17.2

– Th rmal co di o s: 2 °C ± 10 °C

– Actuatn sp ee d: ac elerated sp eed in 17.4

– Op eratn cycles: Total nu mb er declared (7.4) le ss th nu mb er alre dy made du rin te sts

– Op eratn cycle s: 10 (acros th full ra ge of th de vice)

17.5.6 Fu ctional test at minimum lo d (TC6) − o tional:

– The rmal co di o s: 2 °C ± 10 °C

– Actuatn Sse d: ma ualy actu ate d to b e ab le to folow th corect o erato

– Op eratn cycle s: 10

Th cycle s are co ducted o e r th wh le ra g from minimu m to ma imum a d b ack to

minimum b y me ns of is actu tn memb e r In ad i o , whe re a p rop riate, th swich is

op e rate d 10 tme s o er th wh le ra ge from minimum to ma imu m a d b ack to minimu m b y

me ns of a remote co trol

Du rin a d afte r th test, th sp e cim ens sh l op erate core cty

For ele ctro ic swich s for which a minimu m lo d or minimu m curre nt is sp ecified b y th

ma ufacturer, th ch racteristc is ad i o aly te sted wih th sp cified co di o s

17.5.7 Test with l mited n mb r of o eration (TC7):

– Electrical co di o s: sp ecifie d in 17.2

– The rmal co di o s: 2 °C ± 10 °C

– Actuatn sp ee d: ac elerated sp eed in 17.4

– Op eratn sycle s: 1 000 orth declared nu mb er

17.5.8 En uran e complete switc (TC8):

– Ele ctrical co di o s: sp ecifie d in 17.2

– The rmal co di o s: sp e cifie din 17.3

– Actuatn sp eed: ac e le rate d sp e d in 17.4

– Op eratn cycles: Total nu m b erof cycle s declared in 7.4

17.5.10 Test at very slow sp ed (TC10):

– Ele ctrical co di o s: sp ecifie d in 17.2

– The rmal co di o s: 2 °C ± 10 °C

– Actuatn sp ee d: v ry slow sp eed in 17.4

– Op eratn cycles: 100

TC10 wh n re qu ired b y Clause 13,is completed o a se arate set of 3 sp e cime ns a d ma b e

p rt ofth Tab le 101 se uence inste d of TC2 Compla ce is ch ck d b y 17.6.1 (TE1) a d

17.6.3 (TE3)

17.6 Ev luation of compl a c

17.6.1 Fu ctional compl an e (TE1)

Afer al the a pro riate tests of 17.5, the switc is in p cted for fu ctional ty

Compla ce is ch cke d b y th folowing:

– n lo se in of electrical or mech nical co ne cto s oc urs;

– se ln comp und sh l n t flow to such a e te nt th t lv p arts are e xp osed

17.6.2 Thermal compl an e (TE2)

The switc is tested in ac ordan e with 16.4 in IEC 610 8-1:2 16 as modified by the

fol owin :

– 16.4.d) to 16.4.e) are n t ap plcab le

– 16.4.f) al swiche s are teste din a amb ie t of 2 °C

± 10 °C

– 16.4.g) to 16.4.i are n t ap plcab le

– 16.4.o) th swich ON p si o is th p osi o th t p ro ides th ma imu m te st cu rre t

through th swich

– 16.4.q) termin ls are me sure d as close as p s ib le to th b ody of th swich If th

the rmocou p les ca n t b e p si o e ddire cty o th te rmin ls th th rm ocouples ma b e

fix d o th co ductors (wih th insu laton remo ed) as close as p s ib le to th b ody of

th swich

Compla ce is ch cke d b y th temp e rature rise at th te rmin ls do s n t e ce d 5 K

17.6.3 In ulatin compl an e (TE3)

After al th ap p rop riate tests of 17.5, th swich is tested as folows,

– th dielectric stre gth te st of 15.3 ap p lies wih th e xce pto th t th sp cime s are n t

sub je cted to th hu midiy tre tme t b efore th ap p licato of th test v lage Th test

v lage sh l b e 75 % ofth coresp ondin te st v lage spe cified in th t su b clause

Compla ce is che ck d b y e ide ce th t n tra sie t fault b etwee n lv p arts a d e rth metal,

ac es ib le metal p arts, or actu atn memb ers h s oc urred

18 Mecha ical strength

23 Abnormal operation and fault conditions for switche

Re lace the existin text by the fol owin :

2 1 Switc construction

Switc es s al b con tru ted so that the risk of fire, mec anical damage imp irin safety or

protection again t electric s ock as a res lt of a normal o eration/u e is prevented

Compla ce of th co structo is te sted b y simulatn ab norm alco di o s

2 2 Te t s t-up

2 2.1 A circ it analy is of the switc s ould b completed to determine p ints for testin

2 2.2 The a normal con ition are a pl ed in a seq en e whic is the most con enient for

testin

2 2.3 Unles otherwise sp cified, the tests are made on switc es mou ted as declared by

the man facturer an con ected ac ordin to Clau e 16

To e alu ate th p s ib le sp re ad offire, b y b u rnin or glowin p artcles fal n from th te st

sp cime , a la er of ts u e p ap eris placed u ndern ath th test sp cime Unle ss oth rwise

sp cified, a single la er of ts ue p ape r is laid o er a p iece of flat smo th wo de n b oard Th

ts ue p ap rsh l b e p osi o ed n t gre aterth n 200 mm b e low th sp ecime

2 2.4 Switc es are con ected to al ow c r ent flow throu h in the critical p th d rin

simulated fault con ition If the critical p th is throu h the lo d, the lo d ac ordin the

maximum declared c r ent s al b con ected

Test is p erformed at amb ie nt temp erature 2 °C ± 10 °C

Th curre t flow is co tnued for1 h, or if n curre nt flow is ob se rv d, afte r th fau lt, for a

durato of 15 min

2 3 Abnormal te tin

2 3.1 Eac of the a normal con ition is a pl ed in turn, one at a time (sin le fault

NOT Oth r fa lts ma o c r d rin th test, whic area dire t c nse u n e

2 3.2 When agre d up n by the man facturer, damaged comp nents, in lu in fu es, may

b re laced provided the switc is eq ivalent to a new sp cimen Otherwise new sp cimen

s al b u ed

2 3.3 Cumulative stres as a res lt of seq ential testin s al b avoided; it wi therefore

b neces ary to u e ad itional sp cimen The n mb r of ad itional sp cimen s ould,

however, b k pt to a minimum by an evaluation of the relevant circ its Damages may b

re aired b fore a plyin the next a normal con ition, otherwise a new sp cimen is req ired

2 3.4 The fol owin a normal con ition , identified by the circ it analy is, s al b

simulated:

a) s ort circ it acros cre p ge distan es an cle ran es that do not comply with the

req ired distan es of IEC 610 8-1:2 16, Ta les 12 to 14

b) s ort circ its acros in ulatin co tin con istin , for example, of lac uer or enamel, s c

the in ulation of a wire, it is con idered as contributin 1 mm to those cre p ge distan es

an cle ran es;

NOT Th term “c atin ” d es n t a ply to e c psulatio ("p tin ")

c) s ort circ it an inter uption of semicon u tor devices;

d) s ort circ it an inter uption of ca acitors an resistors whic do not comply with the

req irements of 2 3 an 2 4

2 3.5 Durin the test, the complete switc en los re s al b vis al y monitored, an

events s c as emis ion of flames, emis ion of molten metals or c ar in of the tis ue p p r

are re orted

2 4 Compl a c

2 4.1 The simulated fault may cre te in irect con eq en es, the final state of the

sp cimen s al b compl ant with the folowin :

a) no ig ition of the tis ue p p r;

b) no ac es of l ve p rts c eck d by Clau e 9

2 5 Prote tion in c s of fai ure of forc d cool ng

2 5.1 Switc es declared with forced co l n ac ordin to 7.2 2, s al b con tru ted so

that the risk of fire, mec anical damage imp irin safety or protection again t electric s ock

as a res lt of fai n of forced co ln is prevented Compl an e is c eck d by the folowin

test

2 5.2 The switc is mou ted as sp cified in Clau e 16, but without forced co l n d rin

the test

2 5.3 The switc is lo ded ac ordin to Ta le 10 TL , whic is contin ed u ti ste d

state temp ratures are ac ieved or the switc dis on ects the lo d circ it

2 5.4 Durin the test, the complete switc en los re s al b vis al y monitored, an

events s c as emis ion of flames, emis ion of molten metals or c ar in of the tis ue p p r