15 Ta le A.1 – Immu ity tests an test levels to b con idered in future or for p rtic lar prod ct fami es... This edition in lu es the fol owin sig ificant tec nical c an es with resp ct
Trang 1Electromagnetic compatibi ity (EMC) –
Part 6-2: Generic standards – Immunity standard for industrial environments
Trang 2THIS PUBLICATION IS COPYRIGHT PROT CTED
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Trang 3Electromagnetic compatibi ity (EMC) –
Part 6-2: Generic standards – Immunity standard for industrial environments
Warnin ! Mak e s re th t y ou o tain d this publc tion from a a thorize distributor
Ate tion! Ve i ez v ou a s rer qu v ou av ez o te u c te publc tion via u distribute r a ré
Trang 4CONTENTS
FOREWORD 3
INTRODUCTION 5
1 Sco e 6
2 Normative referen es 6
3 Terms an definition 7
4 Performan e criteria 9
5 Con ition d rin testin 9
6 Prod ct doc mentation 10 7 Ap l ca i ty 10 8 Me s rement u certainty 10 9 Immu ity test req irements 10 An ex A (informative) Guidan e for prod ct commite s 16 Bibl ogra h 18 Fig re 1 – Eq ipment p rts 8
Ta le 1 – Immu ity req irements – En los re p rts 12
Ta le 2 – Immu ity req irements – Sig al/control p rts 13
Ta le 3 – Immu ity req irements – Input an output DC p wer p rts 14
Ta le 4 – Immu ity req irements – Input an output AC p wer p rts 15
Ta le A.1 – Immu ity tests an test levels to b con idered in future or for p rtic lar
prod ct fami es 17
Trang 5INTERNATIONAL ELECTROTECHNICAL COMMISSION
1) Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org nizatio for sta d rdizatio c mprisin
al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote
intern tio al c -o eratio o al q estio s c n ernin sta d rdizatio in th ele tric l a d ele tro ic fields To
this e d a d in a ditio to oth r a tivities, IEC p blsh s Intern tio al Sta d rds, Te h ic l Sp cific tio s,
Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re fer refere to as “IEC
Pu lc tio (s)”) Th ir pre aratio is e truste to te h ic l c mmite s; a y IEC Natio al Commite intereste
in th su je t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n
n-g v rnme tal org nizatio s laisin with th IEC also p rticip te in this pre aratio IEC c la orates closely
with th Intern tio al Org nizatio for Sta d rdizatio (ISO) in a c rd n e with c n itio s d termin d b
a re me t b twe n th two org nizatio s
2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pres , as n arly as p s ible, a intern tio al
c nse sus of o inio o th rele a t su je ts sin e e c te h ic l c mmite h s re rese tatio from al
intereste IEC Natio al Commite s
3) IEC Pu lc tio s h v th form of re omme d tio s for intern tio al use a d are a c pte b IEC Natio al
Commite s in th t se se Whie al re so a le eforts are ma e to e sure th t th te h ic l c nte t of IEC
Pu lc tio s is a c rate, IEC c n ot b h ld resp nsible for th wa in whic th y are use or for a y
misinterpretatio b a y e d user
4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s
tra sp re tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e
b twe n a y IEC Pu lc tio a d th c r esp n in n tio al or re io al p blc tio sh l b cle rly in ic te in
th later
5) IEC itself d es n t pro id a y atestatio of c nformity In e e d nt c rtific tio b dies pro id c nformity
as es me t servic s a d, in some are s, a c s to IEC marks of c nformity IEC is n t resp nsible for a y
servic s c rie o t b in e e d nt c rtific tio b dies
6) Al users sh uld e sure th t th y h v th latest e itio of this p blc tio
7) No la i ty sh l ata h to IEC or its dire tors, emplo e s, serv nts or a e ts in lu in in ivid al e p rts a d
memb rs of its te h ic l c mmite s a d IEC Natio al Commite s for a y p rso al injury, pro erty d ma e or
oth r d ma e of a y n ture wh tso v r, wh th r dire t or in ire t, or for c sts (in lu in le al fe s) a d
e p nses arisin o t of th p blc tio , use of, or rela c u o , this IEC Pu lc tio or a y oth r IEC
Pu lc tio s
8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Use of th refere c d p blc tio s is
in isp nsa le for th c re t a plc tio of this p blc tio
9) Ate tio is drawn to th p s ibi ty th t some of th eleme ts of this IEC Pu lc tio ma b th su je t of
p te t rig ts IEC sh l n t b h ld resp nsible for id ntifyin a y or al su h p te t rig ts
International Stan ard IEC 610 0-6-2 has b en pre ared by IEC tec nical commit e 7 :
Electromag etic comp tibi ty
This third edition can els an re laces the secon edition publ s ed in 2 0 This edition
con titutes a tec nical revision
This edition in lu es the fol owin sig ificant tec nical c an es with resp ct to the previou
edition:
a) improvement of the en ironmental des ription;
b) exten ion of the freq en y ran e for the radio- req en y electromag etic field test
ac ordin to IEC 610 0-4-3;
c) amen ed test levels at p rtic lar freq en ies for the radio- req en y electromag etic field
Trang 6d) c an e of the re etition freq en y for the fast tran ients immu ity test ac ordin to
IEC 610 0-4-4;
e) introd ction of req irements ac ordin to IEC 610 0-4-3 ;
f revision of the test levels;
g) con ideration of me s rement u certainty;
h) ad ition of An ex A
The text of this stan ard is b sed on the fol owin doc ments:
Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on
votin in icated in the a ove ta le
This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2
A l st of al p rts in the IEC 610 0 series, publ s ed u der the general title Electromagnetc
comp tb il y (EMC), can b fou d on the IEC we site
The commit e has decided that the contents of this publcation wi remain u c an ed u ti
the sta i ty date in icated on the IEC we site u der "htp:/ we store.iec.c " in the data
related to the sp cific publ cation At this date, the publ cation wi b
• reconfirmed,
• with rawn,
• re laced by a revised edition, or
• amen ed
Trang 7Mitigation method an devices
Part 6: Ge eric sta dards
Part 9: Mis el a eous
Eac p rt is further s bdivided into several p rts, publs ed either as International Stan ard
or as Tec nical Sp cification or Tec nical Re orts, some of whic have alre d b en
publ s ed as section Others wi b publs ed with the p rt n mb r fol owed by a das an a
secon n mb r identifyin the s bdivision (example: IEC 610 0-6-1)
Trang 8ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 6-2: Generic standards –
Immunity standard for industrial environments
This p rt of IEC 610 0 for EMC immu ity req irements a pl es to electrical an electronic
eq ipment inten ed for u e in in u trial location , as des rib d b low Immu ity req irements
in the freq en y ran e 0 Hz to 4 0 GHz are covered No tests ne d to b p rformed at
freq en ies where no req irements are sp cified
This generic EMC immu ity stan ard is a pl ca le if no relevant dedicated prod ct or prod ct
fami y EMC immu ity stan ard exists
This stan ard a pl es to electrical an electronic eq ipment inten ed to b o erated in
in u trial location , as defined in 3.7, b th in o r an outdo r
This stan ard a pl es also to eq ipment inten ed to b directly con ected to a DC distribution
network or whic is b tery o erated, an inten ed to b u ed in in u trial location
This stan ard defines the immu ity test req irements for eq ipment sp cified in the s o e in
relation to contin ou an tran ient, con u ted an radiated disturb n es, in lu in
electrostatic dis harges
The immu ity req irements have b en selected to en ure an adeq ate level of immu ity for
eq ipment o eratin within in u trial location The levels do not, however, cover extreme
cases, whic may oc ur at an location, but with an extremely low pro a i ty of oc ur en e
Not al disturb n e phenomena have b en in lu ed for testin purp ses in this stan ard, but
only those con idered as relevant for the eq ipment covered by this stan ard These test
req irements re resent es ential electromag etic comp tibi ty immu ity req irements They
are sp cified for e c p rt con idered
NOT 1 Informatio o oth r disturb n e p e ome a is giv n in IEC TR 610 0-4-1
NOT 2 Safety c nsid ratio s are n t c v re b this sta d rd
NOT 3 In sp cial c ses, situ tio s wi arise wh re th le el of disturb n es ma e c e th le els sp cifie in
this sta d rd, for e ample wh re e uipme t is instale in pro imity to in ustrial scie tific a d me ic l e uipme t
as d fin d in CIS R 1 or wh re a h n -h ld tra smiter is use in close pro imity to e uipme t In th se
insta c s, sp cial mitig tio me sures ma h v to b emplo e
The in u trial en ironment may b c an ed by sp cial mitigation me s res Where s c
me s res can b s own to prod ce an electromag etic en ironment eq ivalent to the
residential, commercial or lg t in u trial en ironment, then the generic stan ard for this
en ironment, or the relevant prod ct stan ard, may b a pled
The folowin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an
are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For
u dated referen es, the latest edition of the referen ed doc ment (in lu in an
Trang 9IEC 6 0 0-161, Intern to al Electrotech ical Vocab u lary – Part 161: Electromagnetc
comp atb il y (avai a le at: www.electro edia.org)
IEC 610 0-4-2:2 0 , Ele ctromagnetc com patb il y (EMC) – Part 4-2: Te stn a d
me sureme t te ch iques – Ele ctrostatc dis h rge immu niy te st
IEC 610 0-4-3:2 0 , Ele ctromagnetc com patb il y (EMC) – Part 4-3: Te stn a d
me sureme t tech iques – Radiated, radio-fre uency, electroma n tc field immu niy te st
IEC 610 0-4-3:2 0 /AMD1:2 0
IEC 610 0-4-3:2 0 /AMD2:2 10
IEC 610 0-4-4:2 12, Ele ctroma n tc com patb il y (EMC) – Part 4-4: Testn a d
me sureme nt tech iques – Ele ctrical fast tra sie nt/b urst immu niy test
IEC 610 0-4-5:2 14, Electroma n tc com patb il y (EMC) – Part 4-5: Testn a d
me sureme nt tech ique s – Su rg immu niy test
IEC 610 0-4-6:2 13, Electroma n tc com patb il y (EMC) – Part 4-6: Testn a d
me sureme nt te ch iques – Immu niy to co ducted disturb ances, induced b y radio-fre uency
fields
IEC 610 0-4-8:2 0 , Electroma n tc com patb il y (EMC) – Part 4-8: Testn a d
me sureme t tech ique s – Power fre uency magnetc field immu niy test
IEC 610 0-4-1 :2 0 , Electromagnetc comp atb il y (EMC) – Part 4-1 : Testn a d
me sureme t te ch iques – Volage dip s, sh rt inte rru p tio s a d v lage v riato s immu niy
tests
IEC 610 0-4-2 :2 10, Electromagnetc comp atb il y (EMC) – Part 4-20 : Te stn a d
m easureme t tech ique s – Emis io a d im mu niy testn in tra sv rse electromagnetc
(TEM) wa eguides
IEC 610 0-4-21:2 1 , Electromagnetc comp atb il y (EMC) – Part 4-21: Te stn a d
m easureme t te ch iques – Reve rb erato ch m b er te st meth ds
IEC 610 0-4-2 :2 10, Ele ctroma n tc comp atb il y (EMC) – Part 4-2 : Testn a d
me sureme nt tech iques – Radiatedemis io s a d immu niy me sureme ts in fu lly a e ch ic
ro ms (FARs)
IEC 610 0-4-3 :2 0 , Electroma n tc comp atb il y (EMC) – Part 4-34: Testn a d
me sureme nt te ch iques – Volage dip s, sh rt interu pto s a d v la e v riato s immuniy
te sts for e quipme nt wih mains curre t more th n 16 A p erp hase
IEC 610 0-4-3 :2 0 /AMD1:2 0
3 Terms and definitions
For the purp ses of this doc ment, the terms an definition given in IEC 6 0 0-161 as wel
Trang 10Note 1 to e try: Ex mples of p rts of interest are sh wn in Fig re 1 Th e closure p rt is th p ysic l b u d ry
of th e uipme t (e.g e closure) Th e closure p rt pro id s for ra iate a d ele trostatic disc arg (E D)
e erg tra sfer, wh re s th oth r p rts pro id for c n u te e erg tra sfer, eith r b dire t inje tio or b
p rt at whic a con u tor or ca le inten ed to car y sig als is con ected to the eq ipment
EX MPLE An lo in uts, o tp ts a d c ntrol ln s; d ta b ses; c mmu ic tio ln s, etc
3.4
power port
p rt at whic a con u tor or ca le, car yin the electrical input output p wer ne ded for the
o eration ( u ctionin ), is con ected to the eq ipment
local DC electricity s p ly network in the infrastru ture of a certain site or bui din inten ed
for flexible u e by one or more diferent typ s of eq ipment an en urin contin ou p wer
s p ly in e en ently from the con ition of the publc main network
Note 1 to e try: Co n ctio to a remote lo al b tery is n t re ard d as a DC distrib tio n twork, if su h a ln
c mprises o ly p wer su ply for a sin le pie e of e uipme t
3.7
indu trial loc tion
location c aracterized by a se arate p wer network, s p l ed from a hig - or medium-voltage
tran former, dedicated for the s p ly of the in tal ation
EX MPLE Metalworkin , p lp a d p p r, c emic l pla ts, c r pro u tio , farm b idin , hig -v lta e are s of
airp rts
Note 1 to e try: In ustrial lo atio s c n g n raly b d scrib d b th e iste c of a instalatio with o e or
more of th folowin c ara teristics:
– items of e uipme t instale a d c n e te to eth r a d workin simulta e usly;
– sig ific nt amo nt of ele tric l p wer g n rate , tra smite a d/or c nsume ;
– fre u nt switc in of h a y in u tiv or c p citiv lo ds;
– hig c re ts a d as o iate ma n tic fields;
Trang 11Th ele troma n tic e viro me t at a in ustrial lo atio is pre omin ntly pro u e b th e uipme t a d
instalatio prese t at th lo atio Th re are ty es of in ustrial lo atio s wh re some of th ele troma n tic
p e ome a a p ar in a more se ere d gre th n in oth r instalatio s
Note 2 to e try: Th c n e tio b twe n lo atio a d ele troma n tic e viro me t is giv n in 3.8
3.8
ele troma netic e vironme t
total ty of electromag etic phenomena existin at a given location
Note 1 to e try: In g n ral th ele troma n tic e viro me t is time-d p n e t a d its d scriptio ma n e a
statistic l a pro c
Note 2 to e try: It is v ry imp rta t n t to c nfuse th ele troma n tic e viro me t a dth lo atio itself
[SOURCE: IEC 6 0 0-161:19 0, 161-01-01, modified – Note 2 to entry has b en ad ed
3.9
publ c mains network
electricity l nes to whic al categories of con umers have ac es an whic are o erated by
an electrical p wer s p ly an /or distribution organization for the purp se of s p lyin
electrical energ
4 Performance criteria
A fu ctional des ription an a definition of sp cific p rforman e criteria, d rin or as a
con eq en e of immu ity testin of eq ipment u der test (EUT), s al b provided by the
man facturer an noted in the test re ort They s al b con istent with one of the fol owin
general criteria for e c test as sp cified in Ta le 1 to Ta le 4:
a) Performan e criterion A: The EUT s al contin e to o erate as inten ed d rin an afer
the test No degradation of p rforman e or los of fu ction is al owed b low a
p rforman e level sp cified by the man facturer, when the EUT is u ed as inten ed If the
p rforman e level is not sp cified by the man facturer, this may b derived from the
prod ct des ription an doc mentation an what the u er may re sona ly exp ct from the
eq ipment if u ed as inten ed
b) Performan e criterion B: The EUT s al contin e to o erate as inten ed afer the test No
degradation of p rforman e or los of fu ction is al owed b low a p rforman e level
sp cified by the man facturer, when the EUT is u ed as inten ed The p rforman e level
may b re laced by a p rmis ible los of p rforman e However, d rin the test
degradation of p rforman e is al owed but no c an e of actual o eratin state or stored
data is alowed If the minimum p rforman e level or the p rmis ible p rforman e los is
not sp cified by the man facturer, either of these may b derived from the prod ct
des ription an doc mentation an what the u er may re sona ly exp ct from the
eq ipment if u ed as inten ed
c) Performan e criterion C: Temp rary los of fu ction is alowed d rin the test, provided
the fu ction is self recovera le or can b restored by the o eration of the controls
If, as a res lt of the a pl cation of the tests defined in this stan ard, the EUT b comes
dan erou or u safe, it s al b de med to have fai ed the test
5 Conditions during te ting
The eq ipment u der test (EUT) s al b tested in the exp cted most s s e tible o eratin
mode, for example identified by p rformin l mited pre- ests This mode s al b con istent
with normal a pl cation The config ration of the test sample s al b varied to ac ieve
maximum s s e tibi ty con istent with typical a plcation an in tal ation practice The
config ration an mode of o eration d rin the tests s al b precisely noted in the test
Trang 12If the eq ipment is p rt of a s stem, or can b con ected to au i ary eq ipment, the
eq ipment s al b tested whi e con ected to the minimum re resentative config ration of
au i ary eq ipment neces ary to exercise the p rts Au i ary eq ipment may b simulated
In cases where a man facturer's sp cification req ires external protection devices or
me s res whic are cle rly sp cified in the u er's man al, the test req irements of this
stan ard s al b a pl ed with the external protection devices or me s res in place
If the eq ipment has a large n mb r of simi ar p rts or p rts with man simiar con ection , a
s f icient n mb r s al b selected to simulate actual o eratin con ition an to en ure that
al the dif erent typ s of termination are covered Ju tification for the selection of the tested
p rts s al b in luded in the test re ort
The tests s al b car ied out at one sin le set of p rameters within the o eratin ran es of
temp rature, h midity an atmospheric pres ure sp cified for the prod ct an at the rated
s p ly voltage, u les otherwise in icated in the b sic stan ard
6 Product documentation
If the man facturer is u in his own sp cification for an ac e ta le level of EMC p rforman e
or degradation of EMC p rforman e d rin or af er the testin req ired by this stan ard, this
fact s al b stated in the u er doc mentation This sp cification itself s al b made avai a le
up n req est
7 Appl cabi ity
The a pl cation of tests for evaluation of immu ity de en s on the p rtic lar eq ipment, its
config ration, its p rts, its tec nolog an its o eratin con ition
Tests s al b a pl ed to the relevant p rts of the eq ipment ac ordin to Ta le 1 to Ta le 4
Tests s al only b car ied out where the relevant p rts exist
It may b determined from con ideration of the electrical c aracteristic an u age of a
p rtic lar eq ipment that some of the tests are ina pro riate an , therefore, u neces ary In
s c a case, the decision an ju tification not to test s al b recorded in the test re ort
8 Measurement uncertainty
Where g idan e for the as es ment of the in trumentation u certainty of an immu ity test is
sp cified in IEC TR 610 0-1-6 or in the cor esp n in b sic stan ard, this s ould b
fol owed
9 Immunity test requirements
The immu ity test req irements for eq ipment covered by this stan ard are given on a p rt by
p rt b sis an l sted in Ta le 1 to Ta le 4
Tests s al b con u ted in a wel -defined an re rod cible man er
The tests s al b car ied out in ivid aly as sin le tests The tests may b p rformed in an
order Identical u its may b u ed for testin in p ral el, an this information s al b
recorded in the test re ort
The des ription of the test, relevant generator, a pro riate method an the set up to b u ed
Trang 13The contents of these b sic stan ard are not re e ted here, however modification or
ad itional information ne ded for the practical a pl cation of the tests are given in this
stan ard
Trang 14Table 1 – Immunity re uireme ts – Enclos re ports
criterio
1.1 Power-re u n y ma n tic field 5 , 6 Hz IEC 610 0-4-8 Ap lc ble o ly to e uipme t c ntainin
d vic s susc ptible to ma n tic fields
Th test sh l b c rie o t at th
fre u n ies a pro riate to th p wer su ply
fre u n y Eq ipme t inte d d for use
inut
)(
Trang 15Wh re n rmal fu ctio in c n ot b a hie e b c use of th imp ct of th c u ln /d c u ln n twork (C N) o th EUT, th test sh l b d n with th re u e
fu ctio alty A ratio ale sh l b giv n in th test re ort for d in so Afer th test a d th remo al of th C N, th n rmal fu ctio sh l n t b afe te
Trang 16Ap lc ble o ly to p rts interfa in with lo g dista c ln s; n t a plc ble to in ut p rts inte d d for c n e tio to a b tery or a re h rg a le b tery whic sh l b
remo e or disc n e te from th e uipme t for re h rgin
c
Not a plc bleto in ut p rts inte d d for c n e tio to a b tery or a re h rg a le b tery whic sh l b remo e or disc n e te from th e uipme t for re h rgin
d
Eq ipme t with a DC p wer in ut p rt inte d d for use with a d dic te A –D p wer a a tor sh l b teste o th A p wer in ut of th A –DC p wer a a tor sp cifie
b th ma ufa turer (se th test le el of Ta le 4) Wh re n a a tor is sp cifie , th test sh l b d n o th D p wer p rt usin th test le el of Ta le 4 Wh re a
a a tor is sp cifie ,th test is a plc ble toDC p wer in ut p rts o ly wh n inte d d to b c n e te p rma e tly to c bles lo g r th n 3 m
e
For su ply v lta es wh re n test e uipme t is c mmercialy a aia le (e.g C Ns), this test is n t re uire
f
Eq ipme t with a D p wer in ut p rt inte d d for use with a A –D p wer a a tor sh l b teste o th A p wer in ut of th A –DC p wer a a tor sp cifie b th
ma ufa turer or, wh re n a a tor is sp cifie , th test sh l b d n o th D p wer p rt usin th test le els of this ta le
Trang 172 0/3 0 at 5 /6 Hz c cle
T
rT
wns
Th test sh l b c r ie o t at th fre u n ies a pro riate to th p wer su ply fre u n y Eq ipme t inte d d to b use in re io s wh re o ly o e of th se fre u n ies
is a ple n e s to b teste at this sp cific fre u n y o ly
f
Th test ma b p rforme at o e or at b th re etitio fre u n ies Th use of 5 kHz re etitio fre u n y is tra itio al; h we er, 10 kHz is closer to re lty
Trang 18Annex A
(informativ )
Guidance for product commit ees
Ac ordin to IEC Guide 10 generic immu ity stan ard sp cify a set of req irements, test
proced res an generalzed p rforman e criteria a pl ca le to s c prod cts or s stems
inten ed to b o erated at location havin the resp ctive electromag etic en ironment The
normative p rt of this doc ment defines a minimum set of immu ity req irements for
eq ipment o eratin at location in in u trial en ironments
However, there are electromag etic phenomena whic are exp cted to oc ur or in re se in
the future whic mig t be relevant for some prod cts or prod ct fami es or interferen e
cases EMC commit e s s ould provide ad ice an s p ort to the prod ct commite s in
set in of cor esp n in immu ity levels
The purp se of An ex A is to in icate tests whic mig t b relevant for s c future situation
or for some prod cts or prod ct fami es The prod ct commite s are req ested to con ider
those tests an test levels given in Ta le A.1 As these tests are not formal y referen ed in
this stan ard they are not ne ded for demon tratin compl an e with this stan ard
Trang 19Table A.1 – Immunity te ts a d te t le els to be consid re in future
or for partic lar product fami e
is lk ly e p se to osci atory tra sie ts,
in u e in low-v lta e c bles d e to th
switc in of ele tric l n tworks a d
re ctiv lo ds, fa ltsa d insulatio
bre k own of p wer su ply circ its or
c ntainsp ase-c ntrols or oth r
zero-cros in d te tio te h iq es
• th p wer distrib tio system, with its
fu d me tal fre u n y, sig ific nt
h rmo ics a d interh rmo ics;
• p wer ele tro ic e uipme t (e.g
p wer c n ertors), whic ma inje t
disturb n es into th gro n
c n u tors a d e rthin system
( hro g stra c p cita c or fiters),
re etitiv osci atory tra sie ts g n rate
b switc in tra sie tsa d th inje tio of
imp lsiv c re ts in p wer systems
(n tworks a d ele tric l e uipme t
Difere tial mo e
Trang 20Bibl ography
IEC TR 610 0-1-6, Electromagnetc comp tb il y (EMC) – Part 1-6: Gen ral – G u ide to th
as es me t of me sureme t u ncertainty
IEC TR 610 0-2-5:2 1 , Electromagnetc comp tb il y (EMC) – Part 2-5: En iro me t –
De scripto a d clas ificato of electromagnetc e viro me ts
IEC 610 0-4-1, Electroma n tc comp tb il y (EMC) – Part 4-1: Te stn a d me su reme nt
tech iqu es – Ove rview of IEC 61000-4 serie s
IEC 610 0-4-12, Electromagnetc comp tb il y (EMC) – Part 4-12: Te stn a d me su reme nt
tech iqu e s – Rin wa e immu niy test
IEC 610 0-4-13, Electromagnetc comp tb il y (EMC) – Part 4-13: Testn a d me asu reme t
tech iqu es – Harmo ic a d interh rmo ic inclu din mains sig al n at a.c p we r p rt, low
fre u e ncy immu niy tests
IEC 610 0-4-16, Electromagnetc comp tb il y (EMC) – Part 4-16: Te stn a d me su reme nt
tech iqu e s – Te st for immu niy to co ducte d commo mode disturb ance s in th fre uency
ra ge 0 Hz to 15 kHz
IEC 610 0-4-18, Ele ctromagnetc comp tb il y (EMC) – Part 4-18: Te stn a d me su reme nt
te ch iqu e s – D amp e dos i atory wa e immu niy te st
IEC 610 0-4-19, Ele ctromagnetc comp atb il y (EMC) – Part 4-19: Testn a d me asu reme t
tech iqu es – Test forimmuniy to co ducted, difere tal mode disturb ance s a d signal n in
th fre quency ra ge 2 kHz to 15 kHz at a.c p ower p orts
IEC 610 0-4-2 , Electromagnetc comp tb il y (EMC) – Part 4-29: Te stn a d me su reme nt
tech iqu e s – Vola e dip s, sh rt interupto s a d v lage v riato s o d.c inp u t p werp ort
immu niy tests
IEC 610 0-4-31
1
, Ele ctromagnetc comp tb il y (EMC) – Part 4-31: Testn a d me sureme t
tech iqu e s – AC mains p rts b ro db and co ducted disturb ance immu niy te st
CISPR 1 :2 0 , Industrial, s ie tfic a d medical e uipme t – Radio-fre uency disturb ance
ch racteristc – Limis a d me th ds of me sureme t
IEC Guide 10 , Electromagnetc comp tb il y – G u ide to th draftn of ele ctrom ag etc
comp atb il y pub licato s
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Un er c nsid ratio