Iec 60310 2016

This stan ard can also b a pled, afer agre ment b twe n purc aser an man facturer, to the traction tran formers of thre -phase a.c.. u ed for se arate source voltage, in u ed voltage, vo

Appl cations fer oviaires – Transformateurs de traction et bobines d'inductance

à bord du matériel roulant

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Appl cations fer oviaires – T ransformateurs de traction et bobines d'inductance

à bord du matériel roulant

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3.1 General definition 10

3.2 Definition for tran formers 1

3.3 Definition for in u tors 11

7 Rated voltage an p wer of tran former win in s 13

7.1 Rated lne-side voltage 13

7.2 Rated secon ary voltage 13

7.3 Rated p wer of tran former 14

8 Tran former ta pin s 14

9 Co ln 14

9.1 Identification of tran formers an in u tors ac ordin to co l n method 14

9.2 Ar an ement of s mb ls 15

9.2.1 En losed tran formers an in u tors 15

9.2.2 Non-en losed tran formers an in u tors 15

9.2.3 Air co ln 15

10 Temp rature lmits 15

10.1 Clas ification of in ulatin materials 15

10.2 Temp rature l mits of sol d in ulation 16

10.3 Temp rature l mits for l q id 16

10.4 Temp rature l mits for other p rts 17

13.2 Tests on tran formers 18

13.2.1 General – List of tests 18

13.2.6 Me s rement of voltage ratio, p larities an vector groups ( yp an

routine tests) 21

13.2.7 Me s rement of no-lo d primary c r ent an los es ( yp an routine tests) 2

13.2.8 Me s rement of imp dan e voltages or s ort circ it imp dan es ( yp an routine tests) 2

13.2.9 Me s rement of fu damental lo d los es ( yp and routine tests) 2

13.2.10 Determination of total los es ( yp test 2

13.2.1 Temp rature-rise test ( yp test 2

13.2.12 In ulation resistan e test (o tional typ an routine test 2

13.2.13 Dielectric tests ( yp an routine tests) 2

13.2.14 Partial dis harge test ( yp or o tional routine test for dry- yp , in estigation test for immersed typ ) 3

13.2.15 Short circ it with tan test (o tional typ test 3

13.2.16 Shock an vibration test (o tional typ test 3

13.2.17 Voltage tran mis ion ratio – VTR (o tional typ test 4

13.2.18 Noise me s rement ( yp test 41

13.2.19 L a age mag etic flu den ity me s rement (o tional typ test 41

13.2.2 Electrical Freq en y Resp n e Analy is FRA (in estigation test 4

13.2.21 Inru h c r ent me s rement (o tional typ test 4

13.3 Tests on in u tors 4

13.3.1 List of tests 4

13.3.2 Toleran es 4

13.3.3 Vis al c ecks ( yp an routine test 4

13.3.4 Mas ( yp an o tional routine test 4

13.3.5 Me s rement of win in resistan e ( yp an routine test 4

13.3.6 Determination of los es ( yp test 4

13.3.7 Me s rement of in u tan e ( yp an routine tests) 4

13.3.8 Temp rature-rise test ( yp tests) 4

13.3.9 In ulation resistan e test (o tional typ an routine test 4

13.3.10 Dielectric tests ( yp an routine tests) 4

13.3.1 Partial dis harge test ( yp or o tional routine test for the dry- yp ) 4

13.3.12 Short circ it with tan test (o tional typ test 4

13.3.13 Shock an vibration test (o tional typ test 5

13.3.14 Vibration test with c r ent flowin (in estigation test 5

13.3.15 Noise me s rement ( yp test 5

13.3.16 L a age mag etic flu den ity me s rement (o tional typ test 5

An ex A (informative) List of items for whic an agre ment b twe n purc aser an man facturer is ne ded or for whic further information or sp cification s al b given by the purc aser or by the man facturer 51

A.1 Items s bject to agre ment b twe n purc aser an man facturer 51 A.1.1 Tran former an in u tors 51

A.1.2 Tran formers 5

A.1.3 In u tors 5

A.2 Information to b given by purc aser to man facturer 5

A.2.1 Tran formers an in u tors 5

A.2.2 Tran formers 5

A.2.3 In u tors 5

A.3 Information to b given by man facturer to purc aser 5

A.3.1 Tran formers an in u tors 5

A.3.2 Tran formers 5

A.3.3 In u tors 5

An ex B (informative) Thermal agein an in ulation l fe time 5

B.1 In ulation l fe time an thermal agein 5

B.2 Definition of thermal en uran e 5

B.3 Thermal en uran e calc lation 5

B.4 Sp cial con ideration for thermal desig an test 5

B.4.1 General 5

B.4.2 Co l n medium temp rature at the external interface 59 B.4.3 Rated c r ent 6

B.4.4 Temp rature rise test of a dry- yp tran former/in u tor 6

B.5 Thermal conformity of the in ulation s stem 6

B.6 En of l fe criterion 6

An ex C (informative) Example of thermal en uran e calc lation to demon trate the s ita i ty of an in ulation s stem for a sp cified a pl cation 61 C.1 Prel minary 61

C.2 Example 1 – Temp rature l mits for a dry- yp tran former/in u tor 61

C.3 Example 2 – Thermal en uran e calc lation 61

C.3.1 General 61

C.3.2 Op ratin con ition to be provided by the purc aser 6

C.3.3 Thermal en uran e c aracteristic to b provided by the man facturer 6

C.3.4 Temp rature rise test res lts 6

C.3.5 Calc lation 6

An ex D (informative) Wet dielectric tests for dry- yp tran formers an in u tors 6

D.1 General 6

D.2 Wet test 1 (o tional typ test or o tional routine test : s ort so kin 6

D.3 Wet test 2 (in estigation test or o tional typ test : mistin 6

D.4 Wet test 3 (in estigation test : thermal s ock – lon so kin – mistin 6

D.4.1 General 6

D.4.2 Temp rature con itionin 6

D.4.3 Thermal s ock 6

D.4.4 Dielectric test 66 D.5 Common test proced re an criteria for wet dielectric tests 66 An ex E (informative) L ad profi es 68 Bibl ogra h 6

Fig re 1 – Examples of set up for in u ed voltage with tan in tests 31 Fig re 2 – Examples of set up for se arate source voltage with tan in tests 3

Fig re 3 – Examples of impulse test con ection for traction, in u tor an au i ary tran formers 3

Fig re 4 – Partial dis harge test: voltage vers s time 3

Fig re 5 – Config ration for VTR test 41

Fig re 6 – Example of test circ it 4

Ta le 1 – L ter s mb ls for co l n method 14

Ta le 2 – Order of s mb ls 15

Ta le 3 – Temp rature l mits of sol d in ulation 16

Ta le 4 – Temp rature l mits for l q id 16

Ta le 5 – List of c ecks an tests to b made on traction tran formers 19

Ta le 6 – Toleran es 2

Ta le 7 – Referen e temp ratures 21

Ta le 8 – Dielectric test voltage 3

Ta le 9 – Partial dis harge me s rements 3

Ta le 10 – List of c ecks an tests to b made on in u tors 4

Ta le 1 – Toleran es 4

Ta le 12 – Test method of voltage b twe n terminals with tan test 4

Ta le C.1 – Temp rature l mits an exp cted l fetime for a dry- yp tran former or in u tor (examples) 61

Ta le C.2 – L ad c cle histogram 6

Ta le C.3 – Temp rature histogram 6

Ta le C.4 – Temp rature rise test res lts 6

Ta le C.5 – Thermal en uran e calc lation 6

Ta le C.6 – Eq ivalent c r ent an temp ratures 6

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p te t rig ts IEC sh l n t b h ld resp nsible for id ntifyin a y or al su h p te t rig ts

International Stan ard IEC 6 310 has b en pre ared by IEC tec nical commit e 9: Electrical

eq ipment an s stems for raiway

This fourth edition can els an re laces the third edition is ued in 2 0 an con titutes a

tec nical revision

This edition ta es into ac ou t the new generic rai way stan ard , more sp cifical y general

service con ition refer in to IEC 6 4 8-1 an s ock an vibration con ideration refer in

to IEC 613 3 It also in lu es the folowin sig ificant tec nical c an es with regard to the

– in u tan e me s rement method ;

– voltage b twe n terminals with tan test;

– thermal agein an in ulation l fetime (informative);

– examples of thermal en uran e calc lation (informative);

– wet dielectric tests (informative);

– lo d profies (informative)

The text of this stan ard is b sed on the fol owin doc ments:

Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on

votin in icated in the a ove ta le

This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

RAILWAY APPLICATIONS –

INDUCTORS ON BOARD ROLLING STOCK

This International Stan ard a pl es to traction an au i ary p wer tran formers in tal ed on

b ard rol n stock an to the variou typ s of p wer in u tors in erted in the traction an

au i ary circ its of rol n stock, of dry or l q id-immersed desig

NOT Th re uireme ts of IEC 6 0 6 (al p rts) are a plc ble to tra sformers a d in u tors wh re th y d n t

c nflct with this sta d rd, or with th sp cialze IEC p blc tio s d aln with tra tio a plc tio s

This stan ard can also b a pled, afer agre ment b twe n purc aser an man facturer, to

the traction tran formers of thre -phase a.c l ne-side p wered vehicles an to the

tran formers in erted in the sin le-phase or p ly-phase au i ary circ its of vehicles, ex e t

in trument tran formers an tran formers of a rated output b low 1 kVA sin le-phase or

5 kVA p ly-phase

This stan ard do s not cover ac es ories s c as ta c an ers, resistors, he t ex han ers,

fan , etc inten ed for mou tin on the tran formers or in u tors, whic are tested se arately

ac ordin to relevant rules

2 Normativ referenc s

The folowin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 0-81 , Intern to al Electrotech ical Vocab ulary (IEV) – Ch pter 81 : Electric

tracto

IEC 6 0 0-1, High-v lage test te ch iques – Part 1: G en ral defini o s a d test re quireme ts

IEC 6 0 0-2, High-v la e test te ch iques – Part 2: Me asurin system s

IEC 6 0 6-1:2 1 , Power tra sformers – Part 1: G en ral

IEC 6 0 6-2, Power tra sformers – Part 2: Tempe rature rise for lquid-mmersed tra sforme rs

IEC 6 0 6-3: Power tra sformers – Part 3: Insu lato le vels, diele ctric tests a d e tern l

cle ra ce s in air

IEC 6 0 6-4, Powe r tra sformers – Part 4: G uide to th lghtnin imp u lse a d swichin

impulse testn – Powe r tra sforme rs a d re actors

IEC 6 0 6-5, Power tra sforme rs – Part 5: Ab il y to wihsta d sh rt circuit

IEC 6 0 6-6:2 0 , Powe r tra sforme rs – Part 6: Re ctors

IEC 6 0 6-7, Power tra sformers – Part 7: Lo din guide for oi immersed p we r

IEC 6 0 6-10, Power tra sformers – Part 10 : Determin to ofsound le els

IEC 6 0 6-1 , Power tra sformers – Part 1 : Dry-yp e tra sformers

IEC 6 0 6-12:2 0 , Power tra sformers – Part 12: Lo din gu ide fordry-y e tra sformers

IEC 6 0 6-14, Power tra sformers – Part 14: Liquid-mmersed p ower tra sformers usin

high-emp erature insulato mate rials

IEC 6 0 6-18, Powe r tra sforme rs – Part 18: Me asureme t offrequency resp onse

IEC 6 0 7-1, Raiwa a p licato s – Electric e uipme t for rol n stock – Part 1: G en ral

service co di o s a d g ne ral rule s

IEC 6 0 5, Ele ctrical insulato – Th rmal e alu ato a d de signato

IEC 6 2 0, High-v lage test tech iqu e s – Partal dis h rge me sureme nts

IEC 6 2 6, Fluids for electrote ch ical ap plcato s – Unused min ral insulatn ois for

tra sforme rs a d swich e r

IEC 6 8 6, Spe cificato s for unuse dsi co e insu latn lqu ids for electrote ch ical p u rp oses

IEC 6 8 0, Raiwa ap p licato s – Su p ply v la e of tracto systems

IEC 610 9, Clas ificato of insu latn lquids

IEC 610 9, Insulatn lqu ids – Sp e cificato s for u nused sy th tc organic esters for electrical

p urp se s

IEC 613 3:2 10, Raiwa ap plcato s – Rol n stock e uipme t – Sh ck a d vib rato tests

IEC 613 8-1:2 1 , Con ertortra sformers – Part 1: Tra sformers forindustrial ap p licato s

IEC 6 4 7-1, Raiwa a p licato s – Insu lato co rdin to – Part 1: Basic re quireme ts –

Cle ra ces a d cre ep ge dista ce s foral ele ctrical a d electro ic e uip me t

IEC 6 4 8-1, Raiwa a p licato s – En iro me tal co di o s for e u ipme t – Part 1:

Equipme t o b oard rol n stock

ISO 3 4 , Acoustc – Determin to of sou nd p owerle els a d sound e erg le els of n ise

sources usin sound p res ure – Surv y meth d usin a e ve lo in me sureme t surface

o e r a refle ctn p la e

ISO 9 14-1, Acoustc – Determin to of sound p ower le vels of n ise sources usin sound

inte siy – Part 1: Me sureme t at dis rete p ints

ISO 9 14-2, Acoustc – Determin to of sound p wer le e ls of n ise source s usin sound

inte siy – Part 2: Me surem ent b y s a nin

3 Terms and definitions

For the purp ses of this doc ment, the terms an definition given in IEC 6 0 6-1 an

IEC 6 0 0-81 together with the fol owin a ply

NOT Wh n th term “tra sformer is use alo e, it a ples to b th tra tio a d a xi ary tra sformers.

Th term “tra sformer(s)in u tor(s)” a p ars in cla ses a plc ble to b th tra sformers a d in u tors to a oid

r.m.s with tan voltage value as ig ed by the man facturer to the eq ipment or a p rt of it,

c aracterisin the sp cified p rmanent (over 5 min) with tan ca a i ty of its in ulation

Note 1 to e try: U

Nm

is a v lta e b twe n a lv p rt of e uipme t a d e rth or a oth r lv p rt For rol n sto k,

e rth refers to th c r b d

Note 2 to e try: For circ its, systems a d su -systems in raiwa a plc tio s this d finitio is prefere to

"hig est v lta e for e uipme t" whic is wid ly use in intern tio al sta d rds

impulse voltage value, c aracterizin the sp cified with tan ca a i ty of its in ulation

again t tran ient over-voltages

u ed for se arate source voltage, in u ed voltage, voltage

b twe n terminals with tan , de en in on test car ied out

or b twe n terminals an grou d (U

mG)

3.2 Definition for tran formers

3.2.1

voltage transmis ion ratio

VTR

ratio b twe n the secon ary voltage an the primary voltage when a sp cified impulse or a.c

s uare voltage is a pled on the primary

The VTR is expres ed as a p rcentage of this a pled voltage

3.2.2

impedance voltage

voltage a pled to re c the rated c r ent in s ort circ it

This is expres ed as a p rcentage of this a pl ed voltage to the rated voltage at referen e

temp rature

Note 1 to e try: Wh n e pres e as a p rc nta e or p r u it, this is e u l to th sh rt circ it imp d n e refere

Values of in u tan e for in u tors are related to the dif erent clas es of uti sation an are

defined as fol ows, with the u derstan in that they in lu e an in ication of the nature an

value of the c r ent u ed in their me s rement

3.3.1

a.c indu tance

in u tan e derived from the me s rement of the alternatin c r ent car ied by the in u tor

when it is s p l ed by a sin soidal alternatin voltage of sp cified value an freq en y

3.3.2

dif erential in uctance

in u tan e defined from the derivative of the lnk d flu as a fu ction of c r ent (eq al to the

slo e of the mag etic c aracteristic)

Note 1 to e try: It is d riv d from th tra sie t re ord of insta ta e us v lta e a d c r e t in th in u tor or from

3.3.3

incremental in uctance

in u tan e se n by the a.c c r ent of a p rtic lar value an freq en y s p rimp sed on a

direct c r ent throu h the in u tor

Note 1 to e try: It sh uld b me tio e th t th rip le fa tor of a p lsatin c re t, e pres e as a p rc nta e, is

ma x

+IIII

wh re I

max

a d I

min

resp ctiv ly re rese t th ma imum a d minimum v lu s of th c re t wa e

Note 2 to e try: It is d riv d from a re ord of th termin l v lta e

4 Clas ification

4.1 Clas ification of transformers

The tran formers mentioned a ove may b :

– traction tran formers to s p ly the pro ulsion circ its, an o tional y also other

Ac ordin to their u e, in u tors can b clas ified as fol ows:

– in u tors for alternatin c r ent:

in u tors that car y alternatin c r ent, s c as tran ition in u tors u ed for tran ition

b twe n ta pin s of ta c an ers, ind ctors for a.c commutator motor bra in circ its,

interferen e s p res ion in u tors, tu ed fi ter in u tors, etc

– in u tors for direct c r ent:

in u tors that car y direct c r ent with smal or negl gible a.c comp nents, s c as d.c

l ne fi ter in u tors, in u tive s u ts for traction motors, in u tors for d.c motor bra in

circ its, etc

– in u tors for pulsatin c r ent:

in u tors that car y direct or alternatin c r ent with a sig ificant p riodic rip le, s c as

smo thin in u tors for traction motors, sin soidal fi ter in u tors in au i ary con erters,

etc

5 Service conditions

The normal service con ition for tran formers an in u tors s al b in ac ordan e to

IEC 6 4 8-1 Sp cial service condition s al b agre d b twe n the purc aser an

6 Rated cur e t and load profile

6.1 Load profi e

A tran former/in u tor is desig ed to o erate on the train in ste d -state an tran ient

(s rge) con ition , b th in normal an overlo d con ition

The purc aser s ould sp cify the lo d profi e ac ordin to An ex E (informative) The c r ent

freq en y sp ctrum s al b sp cified by the resp n ible p rty

6.2 Rated c r ent

The rated c r ent of a win in is the c r ent this win in can s stain p rmanently at the

referen e temp rature for contin ou lo d

The rated c r ent s al b calc lated ac ordin to either of folowin method :

a) r.m.s c r ent derived from the lo d profi es;

b) con iderin thermal agein of in ulatin materials ac ordin to An ex B (informative)

Sp cial at ention s ould b p id to varyin co ln modes an to the averagin time win ow

The referen e temp rature for contin ou lo d is the co ln medium temp rature at the

external interface of the tran former/in u tor It s al :

c) either b directly sp cified by the purc aser;

Sp cified values s ould b b sed on the air temp rature external to vehicle as defined in

IEC 6 4 8-1

d) or calc lated by the man facturer b sed on the temp rature histogram provided by the

purc aser an the method of An ex B (informative): se co l n medium referen e

temperature for l fetime calc lation in B.4.2

For a traction win in , the rated c r ent s al cor esp n to the prin ip l ta pin This

definition of rated c r ent a pl es when other win in s, whic are normal y on lo d, del ver

their rated lo d

7 Rated voltage and power of transformer windings

7.1 Rated l ne-side voltage

The rated l ne-side voltage is the r.m.s voltage a pl ca le in normal o eratin con ition to

the l ne-side win in group If this win in has ta pin s, the rated voltage s al b refer ed to

the prin ip l ta pin

Unles otherwise agre d b twe n purc aser an man facturer, the rated l ne-side voltage is

sp cified as b in eq al to the nominal voltage of the traction s stem

NOT IEC 6 8 0 giv s th lst of th n min l v lta esof tra tio systems

7.2 Rated secondary voltage

The rated voltage of a secon ary win in of a tran former is the r.m.s no-lo d voltage at the

terminals of the win in when the prin ip l ta pin of the l ne-side win in of the tran former

is fed at its rated voltage an freq en y

7.3 Rated p wer of tran former

The rated p wer of a tran former win in is defined as the prod ct of the rated voltage of this

win in an its rated c r ent

NOT Tra sformers usu ly h v se eral se o d ry win in s (e.g tra tio , a xi aries, train h atin ) Th rate

p wer of th ln -sid win in of a tra sformer c n b les th n th sum of th rate p wers of its v rio s

se o d ry win in s

8 Transformer tappings

In order to p rmit variation of the voltage ratio of the tran former, one or more of its win in s

may b eq ip ed with intermediate ta pin s, whic s al b in icated on the diagram an in

the sp cification, with a statement of their maximum o eratin c aracteristic

The prin ip l ta pin is that whic ena les the rated traction motor voltage to b o tained at

the terminals of the motors when they are ta in their rated c r ent, the tran former l ne-side

win in b in s p led at rated voltage an freq en y

When b th l ne-side win in s an traction win in s have intermediate ta pin s, the prin ip l

ta pin s s al b in icated

For multi-s stem vehicles, the prin ip l ta pin s may b dif erent for e c s stem

The no-lo d voltage ratio s al b defined for the prin ip l ta pin an for other ta pin s

9 Cooling

9.1 Identification of tran formers and inductors ac ordin to cool ng method

Tran formers an in u tors s al b identified ac ordin to the co l n method employed

L t er s mb ls for u e in con ection with e c co l n method s al b as given in Ta le 1

Ta le 1 – Let er s mbols for cool ng method

Min ral oi or oth r insulatin lq id with fire-p int ≤ 3 0 ° C

Insulatin lq id with fire-p int > 3 0 °C

Insulatin lq id h vin a fire-p int gre ter th n its b i n -p int

In tran formers an in u tors with forced-directed circ lation, a certain p rtion of the forced

flow is c an el ed so as to p s throu h the win in s Some win in s, however, may have a

non-directed flow, for in tan e se arate ta pin win in s, au i ary win in s an sta i zin

9.2 Ar angement of s mb ls

9.2.1 Enclosed transformers and ind ctors

Tran formers an in u tors s al b identified by s mb ls of four leters for e c co l n

method for whic a ratin is sp cified by the man facturer

Ty e of c oln me ium Ty e of circ latio Ty e of c oln me ium Ty e of circ latio

Ex mple: a lq id-immerse tra sformer with forc d-dire te lq id circ latio a d forc d-air circ latio wo ld b

d sig ate b OD F or K AF

For oi -immersed tran formers in whic the alternatives of natural or forced co l n with non

-directed oi flow are p s ible, typical desig ation are: ONAN/ONAF, ONAN/OFAF

For a dry- yp tran former in a non-ventiated protective en los re with natural air co l n

in ide an outside the en los re, the desig ation is: ANAN

9.2.2 Non-en losed transformers an ind ctors

Dry- yp tran formers an in u tors without protective en los res are identified by two

s mb ls only for the co l n medium that is in contact with the win in s or the s rface co tin

of win in s with an overal co tin (e.g e ox resin)

The co l n method of a dry- yp tran former without a protective en los re or with a

venti ated en los re an with natural air co l n is desig ated by: AN

9.2.3 Air cool ng

When tran formers or in u tors are co led by the drau ht of air cau ed by the motion of the

vehicle or by a forced-air co l n s stem whic is not tested with the tran former or in u tor,

the air flow (or velocity) on whic the rated p wer of the eq ipment is b sed s al b in icated

by the purc aser

10 Temperature limits

10.1 Clas ification of in ulating materials

The dif erent clas es of sol d materials (EIM – Electrical In ulatin Material) an s stems

(EIS – Electrical In ulatin Sy tem) u ed at present for the in ulation of the win in s of

tran formers an in u tors to whic this stan ard a ples are defined in IEC 6 0 5 an l sted

in Ta le 3

For a given sol d in ulation material the thermal clas may b diferent de en in on the

s r ou din medium (air, mineral oi , ester fluid , etc.)

The thermal clas of the sol d materials u ed for the in ulation of the win in s s al b

in icated by the man facturer

10.2 Temp rature l mits of sol d in ulation

The maximum temp rature of the tran former an in u tor comp nents s al not ex e d the

l mits given in Ta le 3

Temp rature lmits a ply to s ort time maximum temp rature con iderin hot sp t

These a solute temp ratures are related to the worst case sp cified o eratin con ition

For the lon time o eration temp rature l mits refer to 13.2.1 6

Ta le 3 – Temp rature l mits of sol d ins lation

For immerse ty e insulatio systems, temp rature lmits are hig er th n for dry-y e b c use of re u e

o id tio of insulatio materials Th e c ptio s are insulatio systems b se o c lulose (10 a d 12

clas ), for whic th temp rature lmits are b se o IEC 6 0 6-7

b)

Dry-y e lmits are a c rdin to IEC6 0 6-12:2 0 , Ta le 2

Other lmits may b ado ted by agre ment b twe n purc aser an man facturer when certain

combination of in ulatin materials are u ed It b comes esp cialy imp rtant when materials

of dif erent thermal clas es are combined within one in ulation s stem Then, thorou h

evaluation of the thermal ca acity of s c cre ted s stem is neces ary

To estimate l fe time refer to An ex B (informative) an An ex C (informative)

The values of temp rature are b sed on IEC 6 0 6-14 The recommen ed temp rature l mits

are vald for the sp cific en ironment for in ulation s stems Se led s stems l mit the imp ct

of ox gen an moisture as typical agin factors For the fre bre thin s stem, maintenan e

has to b ada ted

10.4 Temp rature l mits for other p rts

Tank s rface maximum temp rature s al b agre d b twe n purc aser an man facturer

The temp rature of the cores an other p rts of the tran former or in u tor s al in no case

re c a value whic wi cau e damage to these p rts or adjacent ones, or u d e agein of

the in ulatin l q id

11 Mechanical design

The mec anical b haviour can b proved by Finite Element Analy is (F A) calc lation

(method, model cal bration an fatig e lmits) to b agre d b twe n the purc aser an

man facturer, or by the s ock an vibration test If the FEA method is c osen it s ould at

le st in lu e the static lo d cases, the modal analy is up to 6 Hz an a relevant fatig e

analy is that is b sed on the sp ctral p wer den ity defined by the IEC 613 3 test con ition

as input sig al A relevant damage evaluation s al b made with a recog ized stan ard

method (e.g Sin le moment, Rayleig , etc.) The material data have to b ta en in

ac ordan e with this stan ard The calc lation s al ta e the weld into ac ou t an safety

co f icient a pled in ac ordan e with the relevant stan ard agre d with the purc aser s al

b u ed The l q id has to b ta en into ac ou t an the way it has b en simulated has to b

demon trated

12 Rating plates

Eac u it that can b han led in e en ently s al b provided with its own ratin plate

s owin at le st the items in icated b low, u les otherwise agre d b twe n purc aser an

man facturer:

– man facturer's name;

– man facturer’s typ desig ation or n mb r;

– man facturer's serial n mb r;

– date an place of man facturin ;

– con ection diagram;

– ta pin s;

– rated p wer, voltage an freq en y of e c win in ;

– rated c r ent (r.m.s value, or me n direct c r ent ;

– value of the in u tan e (at one or more sp cified referen e c r ent values);

– volume of co l n medium an typ (only for the l q id fi ed);

– name of co l n fluid (only for the l q id fi ed);

– identification of co l n method;

– total mas

The identification plate s al b placed in s c a way that it wi b e siy in p cted an

cle ned in normal maintenan e o eration on e the tran former is in taled in the final

– in estigation tests.

Des ription of the diferent tests b lon in to e c category are given b low

13.1.2 Type tests

Typ tests are car ied out on a sin le piece of eq ipment of a given desig The test s al b

car ied out on one u it c osen amon the first b tc prod ced

Bulk prod ction eq ipment s al b de med to have p s ed the typ tests an s al b

exempted from them if the man facturer prod ces d ly sig ed certificates of typ tests

alre d car ied out on identical eq ipment con tru ted on a previou oc asion

Optional typ tests are to b car ied out only if they have b en expres ly sp cified in the

order

13.1.3 Routine tests

Routine tests are car ied out on al eq ipment of the same order For certain eq ipment, afer

agre ment b twe n purc aser an man facturer, the routine tests may b re laced by tests

car ied out on a few items of eq ipment ta en at ran om from the order

13.1.4 Investigation tests

In estigation tests are sp cial tests of an o tional c aracter car ied out on a sin le eq ipment

in order to o tain ad itional information on its p rforman e; they are only to b car ied out if

they have b en expres ly sp cified in the order

The res lts of these tests s al not influen e the ac e tan e of the eq ipment u les

agre ment to the contrary has b en sp cified in the order

13.2 Tests on transformers

13.2.1 General – List of tests

The c ecks, me s rements an tests to b made on traction an au i ary tran formers are

in icated in Ta le 5, whic also stipulates the category of the test an the clau es to whic

referen e s ould b made

As far as practica le, the tests on diferential in u tors whic can ot b dis ociated from the

tran former s al b car ied out together with the tests on the later Purc aser an

man facturer s al agre on the tests to b made, if neces ary, on these in u tors as

se arate eq ipment, so as to en ure that they fulfi al req irements of this stan ard

When ta c an ers are an integral p rt of the tran formers, they can ot b se arated whi e

the later are tested

Me sureme t of v lta e ratios, p larities a d

Volta eb twe n termin ls withsta d test

13.2.13.5

(o tio al)

Partial disc arg test

13.2.2 Tolerances

Ta le 6 gives toleran es a pl ca le to certain rated q antities an to other q antities when

they are the s bject of man facturer's g arante s refer ing to this stan ard

When a toleran e in one direction is omit ed, there is no lmit on the value in that direction

3 Volta e ratioat n -lo d o th prin ip l

ta pin Rate v lta e ratio

For series pro u tio a lower tolera c is e p cte a d sh l b pro id d b th ma ufa turer d p n in o

wire size a d win in tolera c s

Fu ctional tests: on al au i aries ( or example: oi flow in icator, voltage an c r ent

me s rement devices, co l n s stem, etc.)

Up n agre ment b twe n the purc aser an man facturer, ad itional typ tests could b

car ied out

13.2.4 Mas ( ype and o tional routine test

The tran former s al b weig ed with al ac es ories in lu ed in the s o e of s p ly

If it is not p s ible to me s re mas with the a ove mentioned p rts combined, the p rts s al

13.2.5 Me s rement of windin resistance ( ype and routine tests)

The resistan e of e c win in b twe n ac es ible terminals s al b me s red when cold

with direct c r ent Referen e s ould b made to IEC 6 0 6-1 for the precaution to b ta en

for the minimization of self in u tive ef ects an the pro er determination of the temp rature

of the win in s The temp rature at whic the me s rement is ta en s al also b recorded

Resistan e of win in s al b cor ected to referen e temp ratures from Ta le 7 ac ordin to

Other values of referen e temp rature can b fou d in IEC 6 0 6-1 an IEC 6 0 6-1 an

can b u ed for tran formers/in u tors by agre ment b twe n purc aser an man facturer

For typ tests:

a) if a win in is provided with ta pin s for the reg lation of the voltage of the traction

circ it, the total resistan e of the l ve p rtion of the said win in s al b me s red for

b) if certain au i ary win in s have several section , the resistan e of e c s al b

me s red

For routine tests:

c) me s rement a) may b l mited to the prin ip l ta pin of the win in ;

d) me s rement b) may only b car ied out on the whole of the au i ary win in

13.2.6 Me s rement of voltage ratio, p larities and vector groups ( ype and routine

tests)

The variou voltage ratios b twe n p irs of win in s s al b me s red for al ac es ible

ta pin s of these win in s

If a tran former with a hig -voltage control has several traction secon ary win in s an if

cor ect voltage ratios have b en recorded d rin me s rement made b twe n these

secon ary win in s, it wi b s ficient to me s re the voltage ratio b twe n one of these

secon ary win in s an the l ne-side win in for al the ta pin s of the lat er

The me s rement of the voltage ratio of a fixed ratio traction tran former formin a p rt of a

tran former with hig -voltage control is a typ test

Together with the voltage ratio me s rement, the p larities an vector groups s al b

13.2.7 Me s rement of no-load primary c r ent and los es ( ype and routine tests)

13.2.7.1 General

Me s rement s al b made at rated freq en y, the waveform of the a pl ed voltage b in

sin soidal

In case of a non-sin soidal test voltage, referen e s ould b made to IEC 6 0 6-1 for the

method of cor ection whic may b u ed The voltage s al b a pl ed to a s ita le win in of

the tran former; if the tran former has hig -voltage control, the ta c an er an the primary

of the fixed ratio traction tran former s al remain in circ it but, in an case, al other win in s

ma 1

ma 2(IEC 6 8 0) Other values may b con idered if agre d

b twe n man facturer an purc aser

For an au i ary tran former, the p a no lo d c r ent s al b me s red at U

r, an if req ired

at 1,1 U

r

an 1,2 U

r

If the tran former has ta pin s or is sp cified for multi-voltage o eration, the me s rements

s al b made for sp cified ta pin s or voltages, one of them cor esp n in to the prin ip l

Due to the diversity of win in ar an ements of traction an au i ary tran formers, al the

combination in p irs of win in s on whic imp dan e voltages are to b me s red s al b

fixed by agre ment b twe n purc aser an man facturer The typ tests s ould provide

s f icient data to al ow plotin of the on-lo d c aracteristic of the tran former on al

p sition of the ta c an in eq ipment as wel as for calc latin the fault c r ents

Imp dan e voltages s al b me s red ac ordin to the proced re in IEC 6 0 6-1 for the

fol owin combination of win in s:

a) l ne-side win in to al traction win in s in common ( yp an routine tests);

b) l ne-side win in to e c group of win in s commutatin at, or almost, the same time

( yp test ;

c) l ne-side win in to e c in e en ent traction win in se arately ( yp an routine tests);

d) l ne-side win in to e c au i ary win in se arately ( yp test

In typ tests a), b) an c), me s rements s al b ta en on al ta pin s, whie for typ test d)

an for the routine tests me s rements ne d only b ta en on the prin ip l ta pin for the

If ad itional me s rements on other ta pin s or in other combination of win in s are

req ired, these s al b agre d b twe n purc aser an man facturer The imp dan e voltage

s al b me s red at rated freq en y u in an a proximately sin soidal voltage s p ly The

me s rements may b made at an c r ent b twe n 2 % an 10 % of the rated c r ent

The voltage a pl ed to an win in s ould not ex e d 5 % of the rated voltage of the said

win in an the c r ent throu h it s ould not ex e d to its rated value

The me s red value s al b cor ected by in re sin it in the ratio of rated c r ent to test

c r ent The values so derived s al b cor ected to the a pro riate referen e temp rature

in icated in Ta le 7

The s ort circ it imp dan e s al b derived from the imp dan e voltage an spl t into s ort

circ it resistan e an in u tan e (se IEC 6 0 6-1:2 1 , 3.7)

13.2.8.2 Me s rement of dif erential in uctance ( ype test

If req ired, for non-l ne r s ort circ it in u tan e c aracteristic , the dif erential in u tan e

Fu damental lo d los es s al b recorded d rin the imp dan e voltage typ an routine

tests (se 13.2.8) an the values so o tained s al b cor ected by multiplyin them by the

s uare of the ratio of rated c r ent to test c r ent

The fu damental lo d los es so derived s al b cor ected to the a pro riate referen e

temp rature given in 13.2.8.1, ta in the I R (R = d.c resistan e) as varyin directly with

resistan e an al the other los es varyin in ersely with resistan e Resistan e s al b

NOT 1 Th total los es for al circ its c n ot b o tain d b simple arithmetic a ditio of th los es me sure

o p irs of win in s as prescrib d a o e

NOT 2 Th y ma in some c ses b c lc late from th d.c resista c of e c win in a d th a pro riate

c re t, a din th a ditio al los es d riv d from th tests

13.2.9.2 Type test

Fu damental lo d los es s al b determined for combination a) an b) defined in 13.2.9.1

For combination a), the determination s al b made for thre p sition of the ta c an in

eq ipment cor esp n in resp ctively:

13.2.9.3 Routine test

Fu damental lo d los es s al b determined for combination a) of 13.2.9.1 only an l mited

to the prin ip l ta pin

13.2.10 Determination of total los es ( ype test

The total los es are the s m of the no-lo d los es (13.2.7), an the lo d los es (13.2.9

fu damental an harmonic ) afer cor ection of the later to the a pro riate referen e

temp rature of the win in s, whic is given in Ta le 7 Harmonic los es in u ed by con erter

o eration s al b calc lated ac ordin to IEC 613 8-1:2 1 , An ex A, or an other method

to b agre d b twe n purc aser an man facturer, an wi b ad ed to the los es me s red

at fu damental freq en y

The total los es for the traction circ its of a traction tran former are calc lated for the

prin ip l ta pin an for the ta pin givin the hig est traction load los es

The total los es for the traction tran formers are calc lated for the combination of rated

traction lo d an rated au i ary circ it lo d Subject to agre ment b twe n purc aser an

man facturer, the los es as ociated with the train he tin lo d are u ual y in lu ed in this

calc lation The p wer con umption of the tran former au i ary eq ipment (oi pump, fan,

etc.) is not in lu ed in its total los es

Unles otherwise sp cified, for tran formers other than traction tran formers, the total los es

are calc lated for rated lo d in al win in s simultane u ly

13.2.1 Temp rature-rise test ( ype test

13.2.1 1 General

The detais of the temp rature-rise test con ition are s bject to agre ment b twe n

purc aser an man facturer

The temp rature-rise test s al b p rformed:

a) at the rated p wer/c r ent of the tran former/in u tor (se Clau e 6) in order to determine

the thermal p rameters for in lu ion in the conformity as es ment re ort;

b) an , u les otherwise agre d, in the overlo d con ition ; in order to verify that the

maximum s ort time temp ratures wi not ex e d the l mits of Ta les 3 an 4;

an in two ste s:

– ste 1 – A temp rature-rise test s al b p rformed in the factory of the man facturer, at

rated c r ent p wer with con tant a.c or d.c c r ent, u les the man facturer is a le to

re rod ce the sp cified waveforms;

– ste 2 – If ste 1 has not b en p rformed with the sp cified waveforms, an ad itional test

s al b p rformed on a test b n h with the as ociated con erter

NOT 1 For a dry- y e tra sformer/in u tor mo nte insid a c bicle, ste 2 usin e uiv le t lo d c n e te to

th c n erter is also use to v ld te th imp ct of th instalatio o th temp rature-rises

NOT 2 For a lq id immerse tra sformer/in u tor th p rp se of ste 2 is to me sure th h rmo ic los es

Ta p d win in s s al b tested at their maximum los es ta or other sp cified ta pin

Durin the test, al ac es ories for circ lation an co l n of the co l n medium are ar an ed

in con ition eq ivalent to those o tained on the vehicle (e.g sp cified clog in of he t

ex han er an external pres ure dro , etc.)

The temp rature of oi pump, fan motors an he t ex han er mou ted on the

tran former/in u tor s al b me s red an c eck d again t their o eratin temp rature

ran e

Sp cific temp rature tests may b agre d b twe n the purc aser an the man facturer to

val date the diferent modes of the co l n s stem (e.g o eration with motor fan at red ced

sp ed or with only one pump)

For tran formers/in u tors with forced-air co l n , or simi ar typ of co l n as covered in

9.2.3, the test s al b car ied out with the sp cified air flow or velocity, or with the calc lated

air flow ta in into ac ou t the ad itional external pres ure dro res ltin from

tran formers/in u tors integrated on the vehicle

The purc aser s al define the temp rature of the co l n medium at the external interface of

the tran former/in u tor

13.2.1 2 Temp rature determination methods

Thre method s al b u ed to determine temp rature, de en in on the test p rformed:

a) direct temp rature me s rement:

the temp rature is me s red directly with a temp rature sen or (resistive thermometer,

thermocouple, o tical fib r, temp rature sen itive stick r, infrared camera, etc.);

b) in irect temp rature me s rement:

the temp rature is derived from the me s rements of other ph sical p rameters s c as

voltage, c r ent, resistan e, etc For in tan e, the average temp rature of a win in can

b determined from the variation of the d.c resistan e;

c) temp rature calc lation method:

sometimes the zone where maximum temp rature may exist is not e si y ac es ible for

direct me s rement of the temp rature In s c cases, the temp rature is directly

me s red at a p int close to the critical zone The temp rature-rise from this p int to the

critical zone of maximum temp rature s al then b calc lated The man facturer s al be

a le to provide information a out the calc lation method an the res lts of tests on a

simi ar tran former/in u tor u ed as referen e

13.2.1 3 Temp rature-rise test of l quid-immersed type tran formers/ind ctors

For l q id-immersed tran formers an in u tors, it is not alway practical to me s re directly

hot sp t temp ratures

The hot sp t win in temp ratures can b determined by direct me s rement as a sp cial

test by agre ment b twe n man facturer an purc aser

Otherwise, the hot sp t win in temp rature-rise s al b determined throu h calc lation

b sed on the res lt of a temp rature-rise test as fol ows:

– the average temp rature of the win in s al b me s red (in irect temp rature

me s rement by variation of d.c resistan e);

– the man facturer s al s bmit to the purc aser the res lts of a stu y con ernin the

location of the hot sp ts, an the relation b twe n the hot sp t temp rature an the

win in average temp rature

The stu y s ould b b sed on:

– the le k ge flu field an the distribution of ad itional los es;

– the circ lation p t ern of the in ulatin l q id in ide the win in s in the are s where the

ad itional los es are hig er

In the factory of the man facturer, temp rature-rises s al b esta ls ed in thre ste s:

– ste 1 – l q id temp rature rise test:

This test s al b car ied out by injectin a test c r ent in the win in s whic wi generate

the total los es of the tran former/in u tor ac ordin to 13.2.10 an the total los es of

other comp nents in ide the same tank

If agre d b twe n purc aser an man facturer the test can b car ied out with lower

los es, but not les than 8 % of total los es, an extra olated to total los es ac ordin to

13.2.10

For a multiple voltage tran former/in u tor the voltage s stem generatin the hig est

los es s al b con idered

The fol owin data s al b me s red:

• l q id temp rature at he t ex han er inlet an outlet;

• co l n medium temp rature at the external interface an flow rate

– ste 2 – Win in temp rature-rise tests:

This test s al b car ied out with the rated c r ent injection method ac ordin to

IEC 6 0 6-2 for e c l ne voltage s stem

If agre d, this test s al also b p rformed in sp cified overlo d con ition

– ste 3 – Test con ol dation:

Af er the temp rature-rise tests the man facturer s al con ol date the res lts an

calc late oi an win in temp ratures for the sp cified con ition (in lu in the

in tal ation con traints) an s al s bmit the conformity as es ment re ort to the

purc aser

At this stage the calc lation s al in lu e al c r ent comp nents afectin the core an

win in temp ratures d rin normal eq ipment o eration whic were not p s ible to

re rod ce d rin the previou ste s 1 an 2 (e.g harmonic los es)

L ad profi e temp ratures s al b calc lated b sed on the test res lts

The stan ard method for the determination of the win in temp rature-rise is c r ent

injection For tran formers c r ent injection is ac ieved by the s ort circ it method ac ordin

to IEC 6 0 6-2

In sp cial cases, if agre d, the test can b p rformed a plyin rated voltage an c r ent by

con ection to a s ita le lo d This is mainly a pl ca le to tran formers with low rated p wer

A b ck- o-b ck method may also b agre d In this method, two tran formers, one of whic is

the tran former u der test, are con ected in p ralel an ex ited at the rated voltage of the

tran former u der test By me n of diferent voltage ratios or an injected voltage, rated

c r ent is made to flow in the win in s of the tran former u der test

Some g idan e can b fou d in IEC 6 0 6-2 for:

a) terms an definition ;

b) the me s rement of variou temp ratures;

c) the d ration of tests;

d) the determination of lq id an win in temp ratures;

e) neces ary cor ection of me s rements

13.2.1 4 Temp rature-rise test of dry- ype tran formers/ind ctors

In dry- yp tran formers/in u tors:

– the temp rature gradient b twe n the hot sp t an the average temp rature of the

win in , or the s rface temp rature of the win in , may b sig ificantly hig ;

– thermal coupln b twe n core(s) an win in s may b stron ;

– temp rature sen ors are e sier to fit

For direct me s rement of the temp rature, temp rature sen ors s al b fited in p sition ,

to b agre d b twe n man facturer an purc aser

In ad ition, the average temp rature of the win in s s al b me s red in irectly by the

variation of their d.c resistan e

The gradient b twe n sen or re din s an the average temp rature of the win in s s al b

examined to help confirm that the hotsp t of e c win in has b en me s red

In the factory of the man facturer, temp rature-rises s al b esta l s ed in thre ste s,

u les otherwise agre d:

– ste 1 – Cur ent injection test:

A test c r ent s al b injected in the win in s whic wi generate the total los es of the

tran former/in u tor ac ordin to 13.2.10, u ti the ste d state con ition of the win in s

an mag etic core are re c ed

For tran formers c r ent injection is ac ieved by the s ort circ it method

The ultimate temp rature-rise is re c ed when the temp rature-rise b comes con tant;

this is con idered to have b en ac ieved when the temp rature-rise do s not vary by

more than 2 K p r hour in the win in s an the mag etic core(s) The win in

temp ratures s al then b me s red

If agre d b twe n purc aser an man facturer the test can b car ied out with lower

los es, not les than 8 % of the total los es, an extra olated to total los es ac ordin to

13.2.10

– ste 2 – Op n-circ it test ( or tran former only):

The o en-circ it test, at rated voltage an rated freq en y, s al b contin ed u ti ste d

state con ition of the win in (s) an mag etic core(s) is o tained The in ivid al win in

temperature-rises s al then b me s red

The o en-circ it test can b car ied out b fore or afer the c r ent injection test

– ste 3 – Test con ol dation:

The total win in temp rature-rise of e c win in , with los es in the win in (s) an

normal ex itation of the core(s), s al b calc lated by the man facturer who s al s bmit

a conformity as es ment re ort to the purc aser

This calc lation s al in lu e al c r ent comp nents af ectin the core an win in

temperatures d rin actual eq ipment o eration but whic were not p s ible to re rod ce

d rin ste 1 an 2

For example, core an win in los es related to harmonic are in lu ed at this stage If

a plca le, sp cial at ention is p id to the contribution of harmonic los es generated in a

core (e.g in the s u t core of a tran former with integrated in u tor)

The core contribution to win in hot sp t temp rature-rise at no lo d s ould b the value

given b low or the value me s red by the man facturer d rin the temp rature-rise test

on the tran former/in u tor:

• 5 K for outer win in ;

• 2 K for in er win in

L ad profie temp ratures s al b calc lated b sed on the test res lts

In sp cial cases, if agre d, the test can b p rformed a plyin rated voltage an c r ent

by con ection to a s ita le lo d This is mainly a plca le to tran formers with low rated

A b ck- o-b ck method may also b agre d.

13.2.1 5 Cor ection of temperature determinations

Temp rature me s rements may ne d to b cor ected b fore b in c eck d again t the

criteria:

– when the average temp rature of a win in is determined from the variation of the d.c

resistan e, it s al b extra olated at the in tant of s utdown ac ordin to IEC 6 0 6-2;

– if the sp cified values of injected p wer or c r ent have not b en o tained d rin the

temperature-rise test, the res lts s al b cor ected ac ordin to IEC 6 0 6-2 for

immersed- yp tran formers/in u tors an IEC 6 0 6-12 for dry- yp s This cor ection

s al in lu e the ef ect of temp rature on the d.c resistan e an con eq ently on the

los es ( his is an iterative calc lation proces );

– if the temp rature-rise test has not b en p rformed at the sp cified co l n medium

temp rature, the res lts s al b cor ected to ta e into ac ou t the efect of temp rature

on the d.c resistan e an con eq ently on the los es ( his is an iterative calc lation

proces ): se 13.2.9.1 for g idan e

13.2.1 6 Temp rature-rise test criteria

The test is declared s c es ful if, for an comp nent of the tran former/in u tor:

– The con ol dated hot sp t temp rature, at rated p wer/c r ent (se 6.2 an 7.3) an

referen e co l n medium temp rature:

• either, do s not ex e d the temp rature l mit agre d b twe n purc aser an

man facturer;

• or, is comp tible with the sp cified l fetime; a method an an example to evaluate

l fetime is given in An ex B (informative) an An ex C (informative);

– The con ol dated hot sp t temp rature, in the worst case con ition do s not ex e d the

temp rature of Ta les 3 an 4

13.2.12 Ins lation resistance test (optional type and routine test

Before startin the dielectric tests, the in ulation resistan e s al b me s red by a

megohmmeter a plyin at le st 1 0 0 V d.c b twe n win in s an b twe n win in an the

e rth Oi temp rature at test s al b recorded If req ired the in ulation resistan e

me s rement s al b re e ted af er test completion

The in ulation resistan e s al b hig er than the value agre d b twe n purc aser an

man facturer

13.2.13 Dielectric tests ( ype an routine tests)

13.2.13.1 General

The dielectric tests on new tran formers/in u tors are car ied out in the man facturer's

works o with the tran former/in u tor at ro m temp rature an eq ip ed with those

ac es ories whic could influen e the tests

The relevant stan ard are IEC 6 0 6-3 an IEC 6 0 0-1 an IEC 6 0 0-2

The cle ran e an cre p ge distan es s ould b c eck d fol owin IEC 6 4 7-1 for al the

p rts that are not immersed in the dielectric fluid

In view of the n mb r of l k ly variation , the ar an ement of con ection to b ado ted for

these tests s al b defined in e c p rtic lar case

However:

– the e rth con ection s al b retained on those p ints of the win in s whic are so

con ected in service;

– al non- ested con u tive p rts s c as core, frame, tank or casin of the

tran former/in u tor, temp rature sen ors, dielectric s re n , s al b con ected to e rth;

– for traction tran formers with hig - en ion control, the ta c an er s al b con ected to

the prin ip l ta pin

Dielectric tests in lu e:

– in u ed voltage with tan tests (se 13.2.13.2);

– se arate source voltage with tan tests at in u trial freq en y (se 13.2.13.3);

– in ad ition, for dry- yp tran formers/in u tors, wet dielectric tests may b req ired by the

purc aser ac ordin to An ex D (informative);

– l g tnin impulse voltage with tan test (se 13.2.13.4);

– voltage b twe n terminals with tan test (se 13.2.13.5);

– p rtial dis harge me s rement (se 13.3.1 )

For in u ed an se arate source voltage tests, the test voltages to b u ed are given as

r.m.s values in Ta le 8 The direct me s rement of r.m.s voltage may b re laced by the

me s rement of the voltage p a value; this p a value divided by s uare ro t of two s ould

b eq al to the r.m.s value given in the Ta le 8

The dielectric test voltages of Ta le 8 are defined for a b sic in ulation of the

tran former/in u tor

For al win in s con ected to a p wer con erter generatin ste p voltage waves:

– the purc aser s al sp cify the rec r in p a voltage ampl tu es (U

mT

mG), the d.c

l nk voltage, the voltage rise rate an the re etition freq en y;

– a detai ed desig review s ould b car ied out to en ure that the in ulation con e t has

ta en into ac ou t rec r in dielectric stres es in u ed by the hig dv dt an the

as ociated voltage overs o t

13.2.13.2 Ind ced voltage with tand test ( ype an routine test

The main purp se of this test is to c eck in ulation b twe n turn , coi s an ta pin s of al

the win in s con erned

For al win in s whic have one extremity or one ta pin p rmanently e rthed, this test

con titutes simultane u ly a se arate source voltage with tan test for the non-e rthed

extremity of the win in

Durin the test, one en of the coupled win in s other than the one u ed for the s p ly, s al

b con ected to e rth by one of their terminals

The test voltages U

a

s al b ac ordin to Ta le 8 u les otherwise agre d

An alternatin voltage s al b a pl ed to the terminals of one win in of the tran former The

form of the voltage s al b as ne rly as p s ible sin soidal an its freq en y s al b

s f iciently a ove the rated freq en y to avoid ex es ive mag etizin c r ent d rin the test

The p a value of the in u ed test voltage s al b me s red The p a value divided by

s uare ro t of two s al b eq al to the test value

The test s al b commen ed at a voltage not gre ter than one- hird of the test value an the

voltage s al b in re sed to the test value as ra idly as is con istent with me s rement At

the en of the test, the voltage s al b red ced ra idly to les than one- hird of the test value

b fore switc in of

The test time at ful test voltage s al b 6 s for an test freq en y up to an in lu in twice

the rated freq en y, u les otherwise sp cified When the test freq en y ex e d twice the

rated freq en y, the test time in s of test s al b :

12 × (as igne d fre u ency /test fre uency) but not les than 15 s

Durin the in u ed voltage test on a win in , care s ould b ta en that the voltages in u ed

in the variou win in s on the same mag etic circ it do not ex e d the maximum test values

For au i ary tran formers, u les otherwise sp cified, the in u ed voltage wi be 2 × U

r

(rated voltage) Se IEC 6 0 6-3

For traction tran formers primary win in , the test voltages l sted in Ta le 8 wi a ply

For au i ary tran formers, the in u ed voltage test also re lzes a phase- o-phase voltage

test

The in u ed test set up for traction tran former an for au i ary tran former is s own in

Fig re 1 Note that the s p ly can b made from primary or secon ary side for the au i ary

tran formers

This test is a pl ca le to al win in s of tran formers The se arate source voltage test s al

b made by u in a se arate source, s p lyin an alternative sin le-phase voltage, whic

s al b a pled in turn b twe n e c of the win in s to b tested an al terminals of the

remainin win in s, con ected together to e rth For the waves a e of the test voltage, the

IEC IEC

minimum freq en y, the detai s for a plyin the voltage of test, referen e s ould b made to

Figure 2 – Examples of set up for se arate source voltage withstanding tests

The test voltage s al b ac ordin to U

a

in Ta le 8, an the ful test voltage s al b a pl ed

for 6 s

Win in s con ected to the contact l ne with non-u iform in ulation an not p rmanently

e rthed in the tran former s al b s bjected to a se arate source voltage with tan test at a

voltage value to b agre d b twe n purc aser an man facturer

The test is s c es ful if voltage an c r ent remain sta le d rin the test

13.2.13.4 Lig tning impulse voltage withstand test ( yp test

13.2.13.4.1 General

The purp se of this test is to c eck the win in internal, coi to coi an coi to e rth

in ulation again t lg tnin overvoltage an fast tran ients This test is man atory for

traction an au i ary tran former win in s directly s p l ed from the contact l ne

Durin the test:

– al non- ested ac es ible terminals s al b directly e rthed (se Fig re 3);

– the e rthed en of the l ne-side win in s al b e rthed either directly or throu h an

imp dan e of low value;

– an overvoltage protective devices as ociated with the l ne-side terminal in service s al

b removed or dis on ected;

– if hig - en ion control is u ed, the ta c an er s al b con ected to the prin ip l ta pin

IEC IEC

IEC IEC

The test impulse s al b a ful stan ard l g tnin impulse: 1,2 µs (± 3 %) / 5 µs (± 2 %).

Unles otherwise agre d, the p a value of the a pl ed voltage s al b U

Ni

ac ordin to

Ta le 8

There are cases, however, where this stan ard impulse s a e can ot re sona ly b

o tained, b cau e of low win in in u tan e or hig ca acitan e to e rth The res ltin

impulse s a e is then of en os i atory Wider toleran es may, in s c cases, b ac e ted by

agre ment b twe n purc aser an man facturer Se IEC 6 0 6-4

When the low-voltage win in can ot b s bjected to l g tnin overvoltages from the low

voltage s stem, this win in may, by agre ment b twe n man facturer an purc aser, b

impulse tested with s rges tran fer ed from the hig -voltage win in The method is

des rib d in IEC 6 0 6-3

When the neutral terminal is con ected to the e rth, impulse voltage with tan test for the

neutral terminal is not req ired

When the neutral terminal of a win in has a sp cified impulse with tan voltage, the test is

car ied out ac ordin to IEC 6 0 6-3

13.2.13.4.2 Test sequence

The test seq en e s al con ist of one impulse of a voltage b twe n 5 % an 7 % of the ful

test voltage, an thre s bseq ent impulses at ful voltage If, d rin an of these

a pl cation , an external flas over in the circ it or acros a bu hin sp rk ga s ould oc ur,

or if the os i ogra hic recordin s ould fai on an of the sp cified me s rin c an els, that

a pl cation s al b disregarded an a further a plcation made

13.2.13.4.3 Test criteria

The a sen e of sig ificant diferen es b twe n voltage an c r ent tran ients recorded at

red ced voltage an those recorded at ful test voltage con titutes eviden e that the

in ulation has with to d the test The detai ed interpretation of the os i ogra hic or digital

test record an dis rimination of marginal disturb n es from true record of faiure req ire a

IEC IEC

IEC

IEC IEC

gre t de l of ski an exp rien e Further information is given in IEC 6 0 6-4 If there is

doubt a out the interpretation of p s ible dis re an ies b twe n tran ient record , thre

s bseq ent impulses at ful voltage s al b a pl ed, or the whole impulse test on the terminal

s al b re e ted

The test s al b con idered s c es ful y p s ed if no further an progres ive deviation are

o served Ad itional o servation d rin the test (a normal sou d ef ects, etc.) may b u ed

to confirm the interpretation of the tran ient record , but they do not con titute eviden e in

themselves An dif eren e in the wave s a e b twe n the red ced ful wave an final ful

wave detected by comp rison of the two c r ent tran ient record may b an in ication of

fai ure or deviation d e to non-injuriou cau es They s ould b ful y in estigated an

explained by a new red ced wave an ful-wave test Examples of p s ible cau es of diferent

wave s a es are o eration of protective devices, core saturation, or con ition in the test

circ it external to the tran former

13.2.13.5 Voltage betwe n terminals with tand test (o tional type test

The voltage b twe n terminals with tan test s al b car ied out ac ordin to 13.3.10.4

This test is only a plca le to tran former win in s re e tedly s bjected to ste p front voltage

waveforms

NOT For e ample this test is n t a plc ble to th ln sid win in of a tra tio tra sformer or to th win in s

of 3 h tra sformer su ple thro g a sin soid l fiter, etc

13.2.13.6 Ca l ng dielectric test ( yp and routine test

The low voltage ca l n (au i ary) s al b tested with voltage level ac ordin to

IEC 6 4 7-1

This s bclau e a pl es only to galvanic in ulated con u tors u ed for low voltage circ its an

au i ary comp nents s p ly (ex: thermal sen or, pump, etc.)

13.2.14 Partial dis harge test ( ype or optional routine test for dry- ype, in estigation

test for immersed type)

The purp se of this test is to evaluate the a i ty of the in ulation s stem to p rform over

l fetime The prin iple is to p rform p rtial dis harge me s rements to verify that the

tran former/in u tor wi o erate safely u der normal con ition For immersed typ

tran formers/in u tors p rtial dis harge in estigation tests may b agre d b twe n purc aser

an man facturer refer in to IEC 6 0 6-3 for the in u ed voltage test In case of plu -in

bu hin tran formers/in u tors, an a pro riate method s al b ado ted to avoid p rtial

dis harge within the bu hin

Further information a out p rtial dis harge me s rements may b o tained in IEC 6 2 0

For dry- yp tran formers/in u tors this is a typ test This test may b req ired by the

purc aser as a routine test The test s al b p rformed as fol ows The level of a p rent

c arge Q an the voltage are me s red when a r.m.s a.c voltage (5 Hz or 6 Hz) is a pl ed

(se arate source voltage) in turn b twe n e c of the win in s to b tested an al terminals

of the remainin win in s con ected to e rth

Up to six values s al b recorded d rin the test, ac ordin to Fig re 4 an Ta le 9

Figure 4 – Partial dis harge test: voltage vers s time

he seq en e is as fol ows:

a) Before startin the test, the p rtial dis harge b ckgrou d noise Q

a s f iciently sen itive an ac urate me s rement of the in e tion an extin tion voltage

levels, an of the maximum p rmis ible p rtial dis harge mag itu e Q

MA

The voltage is ramp d up to U

1

in 10 s an is maintained for t = 1 min (se Fig re 4)

Durin this time t , some p rtial dis harges may b o served

p a voltage acros the in ulation b in tested

b) When raisin the voltage:

• the in e tion voltage (U

i

at whic Q re c es or ex e d Q

MA) s al b recorded;

• the extin tion voltage (U

e

at whic Q dro s b low Q

MA) s al b recorded;

decre sed u ti U

e- otwhen dis harges disa p ar (down to b ckgrou d noise Q

BG)

Ac e tan e criteria – The test is s c es ful if:

• no col a se of the test voltage oc urs;

• the p rtial dis harge b haviour at U

For e ample for dry- y e c mp n nts, Q

MA

is usu ly c ose b twe n 10 pC a d 5 pC Th v lu of

Q

MA

is les imp rta t if th e tin tio is sh rp

For typ or in estigation test, if no sig ificant dis harges are o served at U

1, the test voltage

s al b in re sed u ti either dis harges re c the dis harge l mit Q

MA

or u ti the voltage

re c es the se arate source with tan test voltage or the in u ed test voltage

The typ test s ould b car ied out b th in hot (e.g se D.4.1) an cold (e.g ambient

temp rature) con ition

It may ha p n that p rtial dis harge in e tion an extin tion voltages are lower in hot

con ition If the routine test is car ied out in cold con ition , the up er an lower test

voltages (U

1

, U

2) s al b agre d b twe n purc aser an man facturer (however, U

1

s al

never ex e d U

a)

13.2.15 Short circ it withstan test (optional typ test

13.2.15.1 General

When req ired by the purc aser, this test s al b req ested in the ten er sp cification an

agre d b twe n purc aser an man facturer up n order an s al b in ac ordan e with

IEC 6 0 6-5

The tran former/in u tor together with al eq ipment an ac es ories s al b desig ed an

con tru ted to with tan without damage the thermal an d namic ef ects of external s ort

circ its The presen e of an imp dan e an /or of protective devices ( u es, switc es, etc.) in

the cor esp n in circ its s al be ta en into ac ou t The s ort circ it a p rent p wer of the

s stem at the tran former/in u tor location s al b sp cified by the purc aser in his en uiry

in order to o tain the s ort circ it c r ent to b u ed for the desig an tests

The thermal desig s al b in ac ordan e with IEC 6 0 6-5

The maximum value of s ort circ it p wer avaia le at the vehicle input s al b sp cified by

the purc aser to the man facturer

The voltage to b ta en into ac ou t is the maximum (U

ma 1value of the traction s stem, as

sp cified in IEC 6 8 0

For tran formers, the test c r ent p a value an the value of the s mmetrical s ort circ it

c r ent s al b calc lated ac ordin IEC 6 0 6-5

Short circ it c r ents for in u tors s al b defined by the purc aser

Unles otherwise agre d, the tests s al b car ied out with protection ac es ories (pres

ure-rel ef device, etc.)

If the win in s are provided with ta pin s, the re ctan e/in u tan e an , if req ired, also the

resistan e s al b me s red for the ta pin p sition at whic s ort circ it tests wi b

car ied out

Al the re ctan e/in u tan e me s rements s al b to a re e ta i ty of b ter than ± 0,2 %

A re ort containin the res lt of the routine tests s al b avai a le at the b gin in of s ort

circ it tests

13.2.15.2 Testing

To o tain the initial p a value of the c r ent in the phase win in u der test, the moment of

switc in on s al b adju ted by me n of a s n hronou switc In order to c eck the

values of the test c r ents, os i ogra hic record s al alway b ta en In order to o tain the

maximum as mmetry of the c r ent in the phase win in , the switc in -on s al oc ur at the

moment the voltage ap l ed to this win in p s es throu h zero

For sin le-phase tran formers/in u tors the n mb r of tests s al b thre , for thre -phase

tran formers/in u tors the n mb r of tests s al b nine

The d ration of e c test s al b 0,2 s with a toleran e of ± 10 %

Durin e c test, os i ogra hic recordin s s al b ta en of the a pled voltages an the

c r ents

Afer e c test, the os i ograms ta en d rin test s al b c eck d

13.2.15.3 Detection of faults and evaluation of test res lts

Afer completion the test, the external p rts of the tran former/in u tor s al b in p cted

The res lts of the s ort circ it re ctan e/in u tan e me s rements an the os i ograms

ta en d rin the diferent stages of the tests s al b examined for an in ication of p s ible

anomal es d rin the tests, esp cial y an in ication of c an e in the s ort circ it

re ctan e/in u tan e

Diferent proced res are fol owed at this stage for tran formers/in u tors Unles otherwise

tran formers/in u tors only) for in p ction of the core an win in s an comp red with its

state b fore the test, in order to reve l p s ible a p rent defects s c as c an es in le d

p sition, displacements, etc whic , in spite of s c es ful routine tests, mig t en an er the

safe o eration of the tran former/in u tor

Vis al in p ction of the s p ortin stru ture s al give no in ication that there has b en an

c an e in mec anical con ition that wi imp ir the fu ction of the tran former/in u tor If af er

the s ort circ it test program the win in clampin s stem has deteriorated, or s rface cracks

have in re sed sig ificantly in n mb r or dimen ion, the tran former/in u tor is con idered to

have fai ed the s ort circ it test In case of doubt, up to thre more s ort circ it tests with

ful y of set c r ent s al b a pl ed to verify that the monitored con ition has sta i zed If the

deterioration contin es, the tran former/in u tor s al b con idered to have fai ed the test If

con ition sta i ze afer one or two extra s ort circ it test an coupled with s c es ful

routine tests af er s ort circ it tests, the tran former/in u tor s al b con idered to have

p s ed the s ort circ it test

Al the routine tests, in lu in dielectric tests at 8 % of the pres rib d test value s al b

re e ted If a lg tnin impulse test is specified, it s al b p rformed at this stage

In order to con ider the tran former/in u tor as havin p s ed the s ort circ it test, the

fol owin con ition s al b fulfi ed:

– the res lts of the s ort circ it tests an the me s rements an c ecks p rformed d rin

tests do not reve l any con ition of faults;

– the routine tests have b en s c es ful y re e ted, the lg tnin impulse test, if sp cified,

an the wet dielectric tests for dry- yp tran formers/in u tors, if sp cified s c es ful y

p rformed;

– if freq en y resp n e analy is (FRA) is req ired to evaluate the mec anical state of the

win in s, the res lts of me s rements b fore an af er s ort circ it test s al b

dis u sed b twe n the man facturer an purc aser The method s al b ac ordin to

IEC 6 0 6-18 or the one defined in 13.2.2 ;

– the out of tank in p ction do s not reve l an defects s c as displacements, s if of

lamination , deformation of win in s, con ection of s p ortin stru tures, so sig ificant

that they mig t en an er the safe o eration of the tran former/in u tor;

– no traces of internal electrical dis harge are fou d;

– the s ort circ it re ctan e values, in ohms or the in u tan e in mH evaluated for e c

phase at the en of the tests, do not difer from the original values by more than:

• 2 % for tran formers/in u tors with circ lar con entric coi s an san wic non-circ lar

coi s;

• 7,5 % for tran formers/in u tors with non-circ lar con entric cois havin a s ort

circ it imp dan e of 3 % or more The value of 7,5 % may b red ced by agre ment

b twe n man facturer an purc aser but not b low 4 %

In ad ition, for dry- yp tran formers, wet dielectric tests may b req ired ac ordin to

An ex D (informative)

13.2.16 Shock and vibration test (optional type test

13.2.16.1 General

When req ired by the purc aser, this test s al b req ested in ten er sp cification an

agre d b twe n purc aser an man facturer up n order an s al b in ac ordan e with

IEC 613 3

The test is inten ed to hig l g t an we knes /er or whic may res lt in pro lems as a

con eq en e of o eration u der en ironments where vibration an s ocks are known to

oc ur in service of a raiway vehicle This is not inten ed to re resent a ful l fe test However,

the test con ition are s f icient to provide some re sona le degre of confiden e that the

eq ipment wi s rvive the sp cified l fe u der service con ition The folowin tests are

man atory for compl an e with stan ard IEC 613 3:

– fu ctional ran om test:

not req ired for tran former an in u tor;

– simulated lon -l fe test:

this test is aimed at esta l s in the mec anical integrity of the eq ipment at in reased

service levels It is not neces ary to demon trate a i ty to fu ction u der these

con ition ;

– s ock testin :

s ock testin is aimed at simulatin rare service events It is not neces ary to

demon trate fu ctionalty d rin this test It wi b however b neces ary to demon trate

that no c an e in o erational state oc urs, that there is no vis al deformation an that

mec anical integrity has not c an ed These p ints s al b cle rly demon trated in the

final test re ort

Before an af er the test, the mec anical tran fer fu ction s al b esta l s ed in order to

verify the mec anical integrity an the resonan e modes