Iec 60127 1 2015

The markin on the p c in Tests ac ordin to this stan ard are typ tests.. It is recommen ed that where ac e tan e tests are req ired, they are c osen f rom the typ tests in this stan ard.

IEC 601 27- 1

Editio 2.2 2 15-0

Miniat ure fuses –

Part 1: Definit ions for miniat ure fuses and general requirement s for miniat ure

THIS PUBLICATION IS COPYRIGHT PROTECTED

Copyr ight © 2 15 IEC, Ge e a, Switzer la d

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IEC 601 27- 1

Edit io 2.2 2 15-0

Miniat ure fuses –

Part 1: Definit ions for miniat ure fuses and general requirement s for miniat ure

IEC 601 27- 1

Editio 2.2 2 15-0

Miniat ure fuses –

Part 1: Definit ions for miniat ure fuses and general requirement s for miniat ure

+AMD1:2 1 +AMD2:2 15  IEC 2 15

FOREWORD 3

1 Sco e an o ject 5

2 Normative referen es 5

3 Terms an def i ition 5

4 General req irements 9

5 Stan ard ratin s 9

6 Markin 9

7 General notes on tests 10 7.1 Atmospheric con ition for testin 10 7.2 Type tests 1

7.3 Fu e-b ses f or tests 1

7.4 Nature of s p ly 1

8 Dimen ion an con tru tion 12 8.1 Dimen ion 12 8.2 Con tru tion 12 8.3 Termination 12 8.4 Al g ment an con g ration of termination 12 8.5 Soldered joints 12 9 Electrical req irements 12 9.1 Voltage dro 12 9.2 Time/c r ent c aracteristic 13 9.3 Bre kin ca acity 14 9.4 En uran e tests 15 9.5 Maximum s stained dis ip tion 16 9.6 Pulse tests 16 9.7 Fu e-l n temp rature 16 An ex A (informative) Colour codin f or miniature fu e-l n s 1

7 An ex B (informative) Example presentation of time/c r ent c aracteristic 19 An ex C (informative) Au it testin an s rvei an e – Guidel nes for the a pl cation of the prin iples of IECEE 0 (CB-FCS) to miniature fu e-l n s 21

Bibl ogra h 2

Fig re A.1– L yout of colour b n s 17 Fig re B.1 – Example presentation of time/c r ent c aracteristic, ratio 2:1 19 Fig re B.2 – Example presentation of time/c r ent c aracteristic, ratio 3:1 2

Fig re C.1 – Example of a fu e-ln des ription 2

Ta le A.1 – Colour codin f or miniature fu e-l n s 18 Ta le C.1 – Au it testin f or o tion 3 2

Ta le C.2 – Au it testin for o tion 4 2

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this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cif i atio s (P S) a d Guid s (h re fter ref ere to a “IEC

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a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

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intere te IEC Natio al Commite s

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misinterpretatio b a y e d u er

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b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtific tio b die pro id c nf ormity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtific tio b die

6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio

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oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or f or c sts (in lu in le al f ee ) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

conte t is id ntic l to th ba e e ition a d its ame dme ts

In this Re l ne v rsion, a v rtic l l ne in th margin s ows where th te h ic l conte t

is modifie by ame dme ts 1 a d 2 Additions a d d letions are displa e in re , with

deletions being struc through A s parate Fin l v rsion with al c a ge a c pte is

a ai able in this publ c tion

This publ c tion h s be n prepare for us r conv nie c

+AMD1:2 1 +AMD2:2 15  IEC 2 15

International Stan ard IEC 6 12 -1 has b en pre ared by s bcommit e 3 C: Miniature

f uses, of IEC tec nical commit e 3 : Fu es

The major tec nical c an es with regard to the f irst edition con ern s bclau e 9.2.3 where

the nature of the c r ent source has b en clarified; in ad ition, IEC 6 0 8: IEC sta dard

v lt ag s, has b en ad ed to the l st of normative ref eren es

This publcation has b en drafted in ac ordan e with the ISO/IEC Directives, Part 2

This Part 1 of the IEC 6 12 series covers definition , general req irements an tests

a pl ca le to al typ s of miniature f uses (e.g cartrid e fu e-l n s, s b-miniature fu e-ln s

an u iversal mod lar f use-l n s) Al s bseq ent p rts of the complete series s ould b re d

in conju ction with this Part 1

IEC 6 12 con ists of the f olowin p rts, u der the general he ding Miniat ure fuses:

Part 1: Definition for miniature fu es an general req irements for miniature fu e-l n s

Part 2: Cartrid e f use-l n s

Part 3: Sub-miniature f use-l n s

Part 4: Universal mod lar fu e-l n s (UMF) – Throu h-hole an s r ace mou t typ s

Part 5: Guidelnes f or q al ty as es ment of miniature fu e-l n s

Part 6: Fu e-holders for miniature fu e-ln s

Part 7: (Fre f or further doc ments)

Part 8: (Fre f or further doc ments)

Part 9: (Fre f or further doc ments)

Part 10: User g ide f or miniature fu es

The commit e has decided that the contents of the b se publ cation an its amen ments wi

remain u c anged u ti the sta i ty date in icated on the IEC we site u der

"htp:/ we store.iec.c " in the data related to the sp cific publ cation At this date, the

IMPORTANT – Th 'colour inside' logo on the cov r pa e of this publ c tion indic te

that it contain colours whic are consid re to be us f ul f or th cor e t

und rsta din of its conte ts Us rs s ould theref ore print this doc me t usin a

colour printer

+AMD1:2 1 +AMD2:2 15  IEC 2 15

Part 1: Definitions f or miniature fuses and

general requirements f or miniature fuse-l nks

This p rt of IEC 6 12 covers the general req irements an tests a pl ca le to al typ s of

miniature f use-l n s (e.g cartrid e f use-l n s, s b-miniature f use-l n s an u iversal mod lar

f use-ln s) f or the protection of electric a plan es, electronic eq ipment an comp nent p rts

there f normal y inten ed to b u ed in o rs

This stan ard do s not a ply to f uses inten ed for the protection of low-voltage electrical

in tal ation These are covered by IEC 6 2 9, L w Vol t ag Fuses

Sp cif i detai s coverin e c major s bdivision are given in s bseq ent p rts

This stan ard do s not a ply to fu es for a pl an es inten ed to b u ed u der sp cial

con ition , s c as in a cor osive or explosive atmosphere

The o ject of this stan ard is

a) to esta l s u if orm req irements for miniature fu es so as to protect a pl an es or p rts

of a pl an es in the most s ita le way,

b) to define the p rf orman e of the fu es, so as to give g idan e to desig ers of electrical

a plan es an electronic eq ipment an to en ure re lacement of f use-l n s by those of

simi ar dimen ion an c aracteristic ,

c) to define method of testin ,

d) to def i e maximum s stained dis ip tion of fu e-l n s to en ure go d comp tibi ty of

stated p wer ac e tan e when u ed with fu e-holders ac ordin to this stan ard (se

IEC 6 12 -6)

The f ol owin referen ed doc ments are in isp n a le for the a pl cation of this doc ment

For dated ref eren es, only the edition cited a pl es For u dated referen es, the latest edition

of the ref eren ed doc ment (in lu in an amen ments) a pl es

IEC 6 0 8, IEC stand ard v l ta es

IEC 6 12 -6:19 4, Miniature fuses – Part 6: F use-h l d ers for miniat ure fuse-links

+AMD1:2 1 +AMD2:2 15  IEC 2 15

3.1

f us

device that, by the fu in of one or more of its sp cial y desig ed an pro ortioned

comp nents, o en the circ it in whic it is in erted by bre kin the c r ent when this

ex e d a given value for a s ff i ient time

NOT Th f us c mpris s al th p rts th t f orm th c mplete d vic

fu e-ln in whic the fu e-element is total y en losed, so that d rin o eration within its

ratin it can ot prod ce an harmf ul external ef fects, e.g d e to develo ment of an arc, the

rele se of gas or the ejection of flame or metal c p rticles

3.5

miniature f us -l nk

en losed f use-l n of rated bre kin ca acity not ex e din 2 kA an whic has at le st one

of its prin ip l dimen ion not ex e din 10 mm for the protection of electric a pl an es,

electronic eq ipment an comp nent p rts there f normal y inten ed to b u ed in o rs

NOT Prin ip l dime sio s are le gth, width, h ig t a d diameter

miniature fu e-l nk f or spe ial appl c tions

e clo e miniature fu e-ln whic is n t c v re in IEC 6 12 -2, IEC 6 12 -3 or IEC 6 12 -4 a d of rate

bre kin c p city n t e c e in 5 kA a d h vin a width a d h ig t n t e c e in 12 mm a d a le gth n t

3.6

s b-miniature fu e-l nk

miniature f use-l n of whic the case (b d ) has no prin ip l dimen ion ex e din 10 mm

NOT Prin ip l dime sio s are le gth, width, h ig t a d diameter

3.7

univ rs l modular f us -l nk

miniature f use-l n primari y ada ted f or direct electrical con ection to printed circ it b ard

or other con u tive s bstrates, in orp ratin fe tures desig ed to provide a degre of non

-interc an e bi ty where neces ary

3.8

f us -l n conta t

con u tive p rt of a fu e-l n desig ed to en age with a fu e-b se contact or with a fu

e-car ier contact

f use-mou t contact

con u tive p rt of a f use-b se, con ected to a terminal desig ed to en age with a f u

se-car ier contact or with a f use-l n contact

con u tive p rt of a fu e-car ier con ected to a f use-l n contact an desig ed to en age with

a f use-b se contact

series of f use-l n s, deviatin fom e c other only in s c c aracteristic that, for a given

test, the testin of one or a red ced n mb r of partic lar f use-l n s of the series may b taken

as re resentative of al the f use-l n s of the series

NOT Fu e-ln s are c n id re a formin a h mo e e u s rie wh n th c ara teristic c mply with th

f olowin :

– th b die h v th s me dime sio s, material a d meth dof ma uf acture;

– th c p or oth r e d clo ure of th b d h v th s me dime sio s, materials a d meth d of ata hme t a d

s aln ;

– th gra ular fi er, if a y, of th b d is of th s me material a d c mplete e s of fi in It s o ld b of th

s me siz or a y v riatio of th grain siz with c re t ratin s o ld b mo oto o s;

– th f us -eleme ts are of th s me material with th s me prin iple of d sig a d c n tru tio ; a y c a g s of

fu e-eleme t dime sio s with c re t ratin s o ld b mo oto o s;

general term employed to desig ate the c aracteristic values that together def i e the workin

con ition up n whic the tests are b sed an for whic the fu e is desig ed

Ex mple of ate v lu s u u ly state for f us s:

− v lta e (U

N );

− c re t (

N);

− bre kin c p city

+AMD1:2 1 +AMD2:2 15  IEC 2 15

3.17

time/c r e t c ara teristic (of a fu e-l nk)

a) F r a.c c rve givin , u der stated con ition of o eration, the value of time expres ed as

virtual time as a fu ction of the prosp ctive s mmetrical c r ent, expres ed as the r.m.s

value

b) F r d.c c rve givin , u der stated con ition of o eration, the value of time expres ed as

actual time as a fu ction of the d.c prosp ctive c r ent

NOT Time/c re t c ara teristic u u ly state for a f us -ln relate to th pre-arcin time a d th o eratin

time

3.18

conv ntional non- using c r e t

value of c r ent sp cif ied as that whic the fu e-l n is ca a le of car yin f or a sp cified time

(con entional time) without meltin

pre-arcing time (melting time)

interval of time b twe n the b gin in of a c r ent large enou h to cau e a bre k in the f

use-element an the in tant when an arc is initiated

t divided by the value of the s uare of the value of the prosp ctive c r ent

NOT Th v lu s of th virtu l time , u u ly state for a fu e-ln , are th v lu s of th pre-arcin time a d of

t

tiI²t

0d2

NOT 1 Th pre-arcin I

2

t is th I2

t inte ral e te d d o er th pre-arcin time of th fu e

NOT 2 Th o eratin I

2

t is th I2

t inte ral e te d d o er th o eratin time of th f us

NOT 3 Th e erg in jo le rele s d in 1 Ω of e ista c in a circ it prote te b a fu e is e u l to th v lu of

value (r.m.s for a.c.) of prosp ctive c r ent that a f use-l n is ca a le of bre kin at a stated

voltage u der pres rib d con ition of u e an b haviour

+AMD1:2 1 +AMD2:2 15  IEC 2 15

3.2

re ov ry volta e

voltage whic a p ars acros the terminals of a f use af ter bre kin of the c r ent

NOT This v lta e ma b c n id re in two s c e siv interv ls of time, o e d rin whic a tra sie t v lta e

e ists, folowe b a s c n o e d rin whic th p wer fe u n y or th ste d -statere o ery v lta e e ists

3.2

ma imum s staine dis ipation

p wer dis ip tion of a f use-l n me s red u der pres rib d con ition of me s rement at the

maximum c r ent level that can b s stained for a minimum of 1 h or, as sp cified in the

stan ard s e t for ratin s a ove 6,3 A

NOT 1 Th f i ure for ma imum s stain d dis ip tio is u e in c n e tio with th ma imum p wer a c pta c

of fu e-h ld rs for miniature fu e-ln s in a c rd n e with IEC 6 12 -6

NOT 2 Th s v lu s are of te e c e e f or s ort p rio s of time imme iately b f ore th f us -eleme t melts

Valu s a hig a twic th ma imum s stain d dis ip tio h v b e re ord d

4 Ge eral requirements

Fu e-ln s s al b so con tru ted that they are rel a le an safe in o eration an con istent

in p r orman e at an c r ent up to an in lu in the bre kin cap city ratin an at an

voltage up to the rated voltage, when u ed within the l mits of this stan ard

Durin normal u e of the fu e-l n an within the con ition given in this stan ard, no

p rmanent arc, no external arcin , nor any flame that can en an er the s r ou din s, s al

b prod ced Durin the test for esta ls in the maximum s stained dis ip tion an after

o eration, the f use-ln s al not have s f fered damage hin erin its re lacement an the

a) Rated c r ent in mi iamp res for rated c r ents b low 1 A, an in amp res for rated

c r ents of 1 A or more The markin of the rated c r ent s al precede an b adjacent to

the markin of the rated voltage

To ac ommodate existin practice in some countries, f or the time b in , the c r ent may

also b in icated in f raction of amp re

b) Rated voltage in volts (V)

c) Maker's name or trade mark

d) A s mb l denotin the relative pre-arcin time/c r ent c aracteristic as given in the

relevant stan ard s e t This s mb l s al b placed b fore an adjacent to the rated

c r ent

NOT 1 For p trole m s irit th u e of a alp atic s lv nt h x n , with a aromatic c nte t of ma imum 0,1 %

v lume, a k uri-b ta ol v lu of 2 , initial b i n p int a pro imately 6 °C, dry-p int a pro imately 6 °C a d

s e ific gra ity of a pro imately 0,6 is re omme d d

NOT 2 In th c s of c lo r c din , th te t f or in elbi ty n e n t b a ple

6.3 The markin ac ordin to 6.1 s al b printed on the p c in together with a referen e to

this stan ard an an in ication of the a pro riate stan ard s e t The markin on the p c in

Tests ac ordin to this stan ard are typ tests

It is recommen ed that where ac e tan e tests are req ired, they are c osen f rom the typ

tests in this stan ard

7.1 Atmospheric conditions f or te ting

7.1.1 Unles otherwise sp cified in s bseq ent p rts, al tests s al b car ied out u der the

f ol owin atmospheric con ition :

– temp rature b twe n 15 °C an 3 °C;

– relative h midity b twe n 4 % an 7 %;

– air pres ure b twe n 8,6 × 10

4

Pa an 1,0 × 10

5

Pa

Where the a ove-mentioned con ition have a sig ificant influen e, they s al b ke t

s bstantial y con tant d rin the tests

Fu e-l n s s al b tested in the sp cif ied b ses in f re air, an b protected f om drau hts

an direct he t radiation The p sition of the f use-holder s al b horizontal

If temp rature has a marked ef fect on the res lts of the tests, these s al b p rormed at a

temp rature of 2 °C ± 1 °C

+AMD1:2 1 +AMD2:2 15  IEC 2 15

7.1.2 In every test re ort, the ambient temp rature s al b stated If the stan ard con ition

f or relative h midity or pres ure are not fulfi ed d rin tests, a note to this ef fect s al b

ad ed to the re ort

Where tests are req ired at elevated temp ratures, these tests s al b car ied out at an

ambient temp rature of 7 °C ± 2 °C, u les otherwise sp cified

7.2 Type te ts

7.2.1 The n mb r of fu e-l n s req ired s al b sp cified in s bseq ent p rts

Fu e-ln s s al b tested or in p cted in ac ordan e with the f ol owin s bclau es:

a) Markin (se 6.1)

b) Dimen ion (se 8.1)

c) Con tru tion (se 8.2)

d) Voltage dro (see 9.1)

with s c ad itional tests as are sp cified in s bseq ent p rts

7.2.2 Based on the res lts of the test in item d) a ove, the f use-l n s s al b sorted in

des en in order of voltage dro , an n mb red con ec tively, lower n mb rs b in

al ocated to the f use-l n s havin the hig est voltage dro Tests f om these fu e-l n s s al

then b made in ac ordan e with the relevant testin s hed le

If a test is to b re e ted, sp re fu e-l n s havin a proximately the same voltage dro as the

original fu e-ln s s al b u ed f or the re e t test

7.2.3

a) No f aiure is al owed in an of the tests covered by Clau es 6 an 8, nor those des rib d

in 9.1, 9.2.2 an 9.7 an s c ad itional clau es an s bclau es as s al b sp cified in

s bseq ent p rts

b) If in the tests covered by 9.2.1 an 9.3, two faiures oc ur at an one c r ent, the fu

e-l n s are de med not to comply with this stan ard If , however, one f ai ure oc urs, the test

s al b re e ted on twice the n mb r of f use-l n s, at the same c r ent an a secon

f aiure s al b a cau e f or rejection

If two f ai ures oc ur, but not b th in the same test, the f use-l n s al b de med to comply

provided that there are no f urther fai ures in re e t tests with twice the n mb r of f u

se-l n s

If more than two f ai ures oc ur, but not b th in the same c r ent, the fu e-l n s al b

de med not to comply with this stan ard provided that there are no further f ai ures in

re e t tests with twice the n mb r of f use-l n s

c) In e c of the tests ac ordin to 9.4, 9.5 an 9.6, one faiure is al owed If two or more

f use-l n s f ai in an one test, the f use-l n s are de med not to comply with this stan ard,

u les otherwise sp cified in s bseq ent p rts

7.3 Fus -ba e for te ts

For tests that req ire a f use-b se for mou tin the fu e-l n s, a b se ac ordin to the

req irements sp cif ied in s bseq ent p rts s al b u ed

7.4 Nature of s p ly

The nature of the s p ly for the electrical tests is sp cif ied in the relevant clau es or in the

relevant stan ard s e ts in s bseq ent p rts

8.2 Construction

The f use-element s al b completely en losed Further detais of the con tru tion are given,

as a pro riate, in s bseq ent p rts

8.3 Termination

Fu e-ln contacts s al b made of non-cor odin material or of material s ita ly protected

again t cor osion, an s al b eff ectively f re f om flu or other non-con u tin s bstan e on

their outer s rf aces

Nic el or si ver platin is de med to b adeq ate protection for bras en ca s

Tests f or firm atac ment are given, where a pro riate, in s bseq ent p rts

8.4 Al gnme t a d config ration of terminations

Ap ro riate tests for alg ment or p sition of pin , etc as a pl ca le, are given in s bseq ent

The voltage dro acros the f use-l n s at their rated c r ent s al not ex e d the maximum

values given on the relevant stan ard s e t

In ivid al values s al not deviate f rom the me n value determined f or the model u der test

d rin typ tests by more than 15 %

NOT 1 Ate tio is drawn to th f act th t th s c n p ra ra h is b s d o th a s mptio th t th fu e-ln s,

whic are s bmite to a ty e te t, b lo g to th s me ma ufa turin b tc Wh re s mple are drawn at ra d m,

th c n itio for th p rmite d viatio fom th me n v lu n e n t b fulfi e If , d e to th Peltier ef fe t,

diff ere t v lta e dro s are me s re wh n th c re t thro g th fu e-ln is re ers d, th hig e t v lu s al b

ta e

Compl an e is c ec ed by me s rin the voltage dro when the fu e-l n has car ied its rated

c r ent for a time s f ficient to re c temp rature sta i ty

+AMD1:2 1 +AMD2:2 15  IEC 2 15

Direct c r ent s al b u ed for this test; eq ipment s al b u ed whic do s not influen e

the res lt of the test sig ificantly

Temp rature sta i ty is con idered to b re c ed when the voltage dro c an es by les

than 2 % of the previou ly o served value p r min te Durin this test, the c r ent throu h the

f use-ln s al not deviate by more than ±1 % f rom the rated c r ent an the ac urac of the

voltage dro me s rement s al b within a toleran e of ±1 %

NOT 2 Pro lems c n aris wh n f us -ln s are u e at v lta e c n id ra ly lower th n th ir rate v lta e,

mainly f or low ratin s Du to th in re s of th v lta e dro wh n th eleme t of a f us -ln a pro c e its

meltin p int, c re s o ld b ta e to e s re th t th re is s ff i ie t circ it v lta e a aia le to c u e th fu e-ln

to inter u t th c re t wh n a ele tric l fa lt o c rs Furth rmore, f us -ln s of th s me ty e a d ratin ma ,

d e to dif fere c in d sig or eleme t material h v diff ere t v lta e dro s a d ma th refore n t b

interc a g a le in pra tic wh n u e in a plc tio s with low circ it v lta e , e p cialy in c mbin tio with f us

-ln s of lower rate c re ts

9.2 Time/c r e t c ara teristic

9.2.1 Time/c r e t c ara teristic at normal ambie t temperature

The time/c r ent c aracteristic s al b within the l mits sp cified in the relevant stan ard

s e ts

Compl an e is c ec ed by me s rin the pre-arcin time u der the atmospheric con ition

mentioned in 7.1

The c r ent throu h the f use-l n s al b adju ted to within ±1 % of the req ired value

The c r ent sta i ty d rin the test s al b maintained within ±1 % of the adju ted value The

voltage of the source s al not ex e d the rated voltage of the f use-l n u der test

The ac urac of the me s rement of time s al b within a toleran e of ± % for times of les

9.2.2 Te t at ele ate temperature

When sp cified on the stan ard s e t, f use-l n s s al also b tested for 1 h at an ambient

temp rature an with the multiple of the rated c r ent as sp cified on the relevant stan ard

s e t

The c r ent sta i ty d rin the test s al b maintained within ± ,5 % of the adju ted value

The f use-l n s al not o erate

9.2.3 Te t proc dure

Direct c r ent s al b u ed for these tests

NOT 1 Dire t c re t is u e b c u e it is e sier to c ntrol a d elmin te th v riatio in ere t with altern tin

c re t c u e b th p int o th v lta e wa e th t switc in o c rs

NOT 2 Care s o ld b ta e th t th arcin time is n t in lu e in th total time me s re

The output voltage of the c r ent source s al b s f ficient to l mit the variation of c r ent

d rin the pre-arcin time Ad itional y, the output voltage s al not ex e d a value declared

by the man f acturer an c osen f rom the lst of d.c voltages in Ta le 6 of IEC 6 0 8

The time con tant of the circ it s al not ex e d 3 % of the pre-arcin time

Where there is a p s ible influen e of the Peltier eff ect, care s ould b taken to reverse the

direction of the c r ent p s in throu h the fu e-l n f or e c s c es ive sample

+AMD1:2 1 +AMD2:2 15  IEC 2 15

NOT 3 Wh re th in u n e of th Peltier eff ect is e s ntialy d e to th c n tru tio , th time/c re t

c ara teristic s o ld b te te with twic th n mb r of u e-ln s at 2,0 I

N

or 2,1 I

N Th a ditio al s mple ma

b ta e fom th s are fu e-ln s

At ention is drawn to the fact that, f or certain typ s of f use-l n s, the time/c r ent

c aracteristic with a.c can b sig if i antly diff erent f om the c aracteristic determined with

d.c an p rtic larly with c r ents ju t ex e ding the con entional non-u in c r ent

Furthermore, it s ould b noted that d e to the smal thermal inertia of the f use-elements f or

low c r ents, the c aracteristic of the f use-l n s may c an e con idera ly at very low

f req en ies

9.2.4 Pre e tation of re ults

If the time/c r ent c aracteristic with the c r ent as in e en ent varia le are plot ed, it is

prefer ed that they are presented with logarithmic s ales on b th co-ordinate axes The b sis

of the logarithmic s ales s al be in the ratio 2:1 with the lon er dimen ion on the a s is a

If the multiple of the rated c r ent is u ed as the in e en ent varia le, the ratio s al b 3:1

NOT Ex mple of s c formats are giv n in An e B

9.3 Bre king c pa ity

9.3.1 Operating con itions

Fu e-ln s s al o erate satisfactori y without en an erin the s r ou din s when bre kin

prosp ctive c r ents b twe n the con entional non- u in c r ent an rated bre kin ca acity

in ac ordan e with the relevant stan ard s e ts in s bseq ent p rts

The recovery voltage s al b b twe n 1,0 an 1,0

1

times the rated voltage of the fu

e-l n s an s al b maintained f or 3 s after the fu e has o erated

Typical test circ its are given in s bseq ent p rts

For the bre kin ca acity test, the c r ent s al b adju ted by c an in the series

a) rated bre kin ca acity;

b) prosp ctive c r ents of a proximately 5, 10, 5 and 2 0 times the rated c r ent, but

not ex e din the rated bre kin ca acity as sp cified in the relevant stan ard s e t

The circ it s al b closed at (3 ± 5)° af ter the p s age of voltage throu h zero

2) Method B (homogene u series)

a) rated bre kin ca acity with ran om closin an le;

b) f use-l n s s al b tested at rated bre kin ca acity

NOT 1 Th bre kin c p city ma b lower with d.c th n with a.c It is in u n e b th circ it in u ta c a d,

with a.c a ditio aly b th in ta t of clo in th circ it

+AMD1:2 1 +AMD2:2 15  IEC 2 15

More detais of a pro riate tests f or the bre kin ca acity of e c typ of miniature fu e may

b f ou d in the s bseq ent p rts

9.3.2 Criteria for s tisfa tory performa c

In e c of the tests, the fu e-ln s al o erate satisfactori y without an of the fol owin

phenomena:

– p rmanent arcin ;

– ig ition;

– burstin of the fu e-l n

Ad itional criteria for satisf actory p rorman e of in ivid al typ s of miniature f use-l n s are

given, where a pro riate, in s bseq ent p rts

NOT Ch n e in c lo r are n t c n id re a a faiure

Criteria con ernin switc in overvoltages are u der con ideration

9.3.3 Ins lation re ista c

Af ter the bre kin ca acity test, the in ulation resistan e b twe n the fu e-ln termination

s al b me s red with a d.c voltage eq al to twice the rated voltage of the f use-l n , but not

les than 2 0 V The resistan e s al b not les than 0,1 MΩ

9.3.4 Type te t for fus -l nk of homoge eous s rie

Fu e-ln s havin the largest rated c r ent s al b tested completely ac ordin to the

relevant testin s hed le f or the maximum amp re ratin of a homogene u series given in

the s bseq ent p rts

Fu e-ln s havin the smal est rated c r ent s al b tested ac ordin to the relevant testin

s hed le for the minimum amp re ratin of a homogene u series given in the s bseq ent

p rts

9.4 En ura c te ts

Fu e-ln s s al b so con tru ted as to prevent in exten ed normal u e any electrical or

mec anical faiure imp irin their complan e with this stan ard

Complan e is c ec ed by the f ol owin test:

Direct c r ent s al b u ed for this test, u les otherwise sp cified in s bseq ent p rts

a) A c r ent sp cified in the relevant stan ard s e t is p s ed throu h the f use-l n f or a

p riod of 1 h The c r ent is then switc ed of f or a p riod of 15 min This c cle is

re e ted 10 times

The c r ent sta i ty d rin the test s al b maintained within ±1 % of the adju ted value

The test s ould b ru contin ou ly, but where u avoida le, a sin le inter uption is

p rmit ed

b) A c r ent sp cified in the relevant stan ard s e ts is then p s ed throu h the f use-l n for

1 h, or, as sp cified in the stan ard s e t for ratin s a ove 6,3 A At the en of this test

the voltage dro acros the f use-l n is me s red an u ed f or the calc lation of the

maximum s stained p wer dis ip tion, where this is sp cified in s bseq ent p rts

c) Final y, the voltage dro acros the fu e-l n is me s red again ac ordin to 9.1 The

voltage dro acros the f use-l n after the test s al not have in re sed by more than 10 %

of the value me s red b f ore the test an s al not ex e d the maximum value sp cified

in the relevant stan ard s e t

+AMD1:2 1 +AMD2:2 15  IEC 2 15

d) After the test, the markin s al sti b legible an soldered joints on en ca s, for

example, s al not s ow any a precia le deterioration

NOT Ch n e in c lo r are n t c n id re a a faiure

9.5 Ma imum s staine dis ipation

The values calc lated fom the me s rement taken in ac ordan e with 9.4 b) s al b within

the lmits sp cified in the relevant stan ard s e t

9.6 Puls te ts

Where pulse tests are req ired in s bseq ent p rts, they s al b p rf ormed as fol ows:

Puls te ts at normal ambie t temperature

Fu e-ln s s al b so con tru ted as to prevent, when s bjected to c r ent s rges normal y

exp rien ed in service, an electrical or mec anical f ai ure imp irin their compl an e with

this stan ard

Complan e is c ec ed by the folowin test:

a) A c r ent pulse sp cified in the relevant stan ard s e t is p s ed throu h the f use-l n

1 0 0 times at the re etition rate sp cif ied in the relevant stan ard s e t The fu e-l n is

then al owed to co l for at le st 1 h at ro m temp rature

b) A c r ent eq al to the value sp cified in the relevant stan ard s e t is then p s ed

throu h the f use-l n f or the time recommen ed on the relevant stan ard s e t

c) Final y, the voltage dro acros the f use-ln af ter the test is me s red again ac ordin

to 9.1

The voltage dro acros the f use-l n af ter the test s al not have in re sed by more than

10 % of the value me s red b f ore the test

d) After the test, the markin s al sti b legible an soldered joints on en ca s, for

example, s al not s ow an a precia le deterioration

NOT Ch n e in c lo r are n t c n id re a a faiure

9.7 Fus -l n temperature

Where temp rature tests are req ired in s bseq ent p rts, they s al b p rf ormed as

f ol ows:

The temp rature rise, as me s red at any location on the fu e-l n en los re or f use-ln

termination , s al not ex e d 13 K when the f use-l n is tested as fol ows:

– the initial c r ent s al b as sp cif ied in the relevant stan ard s e t;

– the initial c r ent s al b a pl ed for 15 min;

– af ter the first 15 min, the c r ent s al b in re sed by 0,1 I

Nevery 15 min u ti the f use-

l n o erates;

– the temp rature of the fu e-l n s al b me s red contin ou ly;

– the p int for me s rin the temp rature s al b the hotest location

NOT 1 Du to th diff i ulty of s e if yin th lo atio of th h te t p int, it s o ld b d termin d d rin th

+AMD1:2 1 +AMD2:2 15  IEC 2 15

Annex A

(inf ormativ )

Colour coding for miniature fuse-l nks

Where colour b n s are u ed for ad itional identification of the c r ent ratin an the

time/c r ent c aracteristic , the fol owin s stem s al b a pl ed:

a) The miniature f use-l n s sp cified in the relevant stan ard s e ts are provided with four

colour b n s, the first thre identifyin the rated c r ent expres ed in mi iamp res an

the last, bro der, colour b n identifyin the time/c r ent c aracteristic

b) The colour b n s s al exten over at le st half the circ mferen e of the f use b d an

s al b evenly sp ced an cle rly se arated as in icated in Fig re A.1

NOT 1 In th c s of tra s are t miniature fu e-ln s, th s a in s sti alow for th visibi ty of th f us -

eleme t

c) The IEC stan ard with regard to colour codin practices, i.e IEC 6 0 2 an IEC 6 4 5,

s al b u ed as far as a plca le

d) The colour code s stem given in Ta le A.1 s al b u ed

NOT 2 In Ta le A.1, b th s rie R 10 a d R 2 are giv n with th ir c r e p n in c lo r c d In ord r to

k e th n mb r of c lo r b n s to a minimum, o ly th first two c lo r b n s are u e for id ntifyin th first

two digits

e) In ad ition to the req irements given in 6.3, it is recommen ed to print the relevant colour

codin of the contents on the p c in also

+AMD1:2 1 +AMD2:2 15  IEC 2 15

Table A.1 – Colour coding f or miniature f us -l nk

Rated cur ent

100

10

0

100

10

0

100

100

100

100

101

101

101

101

101

101

101

101

101

101

101

101

101

101

101

101

101

101

101

101

10

2

102

102

102

103

+AMD1:2 1 +AMD2:2 15  IEC 2 15

0,0 10,010,11

+AMD1:2 1 +AMD2:2 15  IEC 2 15

Annex C

(inf ormativ )

Audit testing and survei lance – Guidel nes f or the appl cation

of the principles of IECEE 03 (CB-FCS) to miniature f use-l nks

C.1 Introductory remarks

This an ex contain in tru tion for au it testin an s rvei an e of f use-l n s The tests an

in p ction des rib d in this an ex are o tional However, if they are car ied out, it is

es ential that the req irements f or au it testin an s rvei an e are met

C.2 Ov rview

This an ex des rib s the o l gation of the fu e-l n man facturers an the National

Certification Body (NCB) f or au it testin an s rvei an e of fu e-l n prod ction

It covers the pre aration of the Conf ormity As es ment Re ort an the au it testin an

s rvei an e con idered to b the minimum req irements of the NCB Su h in p ction , tests

an me s res are implemented by the NCB as an au it of the me n that the man facturer

exercises to determine the conforman e of prod cts with the req irements of the a pro riate

p rts of IEC 6 12

C.3 Terms of ref erence

For the purp ses of this an ex, the fol owin definition a ply

C.4 Conf ormity A ssessment Report

C.4.1 Product de cription

The p rt of the Conf ormity As es ment Re ort regardin prod ct des ription s al identify

only those detai s of comp nents an dimen ion that have a major imp ct on the

+AMD1:2 1 +AMD2:2 15  IEC 2 15

p r orman e of the fu e-ln The fol owin are examples of the typ of detai s that may b

u ed to pre are the des riptive p rt of the Conformity As es ment Re ort:

a) f us -eleme t: material, thic nes , an diagram of overal s a e for every amp re ratin ;

b) time-d la se tion: def i es general terms s c as sprin -lo ded, solder slu , etc gives

detai s on f usin al oy material, dimen ion an an other major comp nents;

c) body: material an minimum wal thic nes ;

d) f il er: generic des ription of fi er material; grain size if a plca le;

e) conta ts: material an plating, method of sec rement, an key dimen ion not covered

by overal dimen ion req irements;

f ) mis el a eous: des ription of other comp nents whic have a major imp ct on the f u

se-l n desig an p rf orman e

An example of a prod ct des ription is in lu ed in Fig re C.1

IEC 107/0

Cyln ric l fu e-ln s 2 mm lo g b 5 mm in diameter c ntainin a wire eleme t h lc ly wo n o a c ramic

c re Th wire eleme t is s ld re to th c nta ts at e c e d of th fu e-ln

i Co ta ts: c ln ric l e d c p of plate or u plate c p er alo with a minimum wal thic n s of

0,2 mm

i F s -element: wire h lc ly wo n o a s p ortin c re

Amp re ratin : 6,3 A

Wirediameter: 0,4 mm

Ba ic material c p er alo

Platin material tin

iv Fi er: q artz s n ; grain siz 10 µm to 3 0 µm

v T be: gla s with a minimum wal thic n s of 0,5 mm

vi Mis elaneo s items: n n

Figure C.1 – Ex mple of a f us -l nk de cription

C.4.2 Ide tific tion of sig if ic nt s mple

When the red ced sampl n plan is u ed, the Conformity As es ment Re ort s al identify the

sig if i ant samples that are neces ary for testin , c osen on the b sis of their re resentation

of a homogene u series If a certain fu e-l n ratin requires no testin or only a p rtial test

programme d e to simi arities with another f use-l n whic is alre d s hed led for tests, this

s al b noted

+AMD1:2 1 +AMD2:2 15  IEC 2 15

C.5 Use of the standard

The req irements of IEC 6 12 -1 an the relevant s bseq ent p rts s al b a pl ed for the

au it testin an s rvei an e, ex e t where information in the Conf ormity As es ment Re ort

sp cifical y over ides these req irements Sp cific referen es are noted in Ta les C.1 an

C.2

C.6 Audit test and survei la ce programme options

Four programme o tion are avai a le to verify the a i ty of the a plcant to s p ly fu e-ln s

that contin e to me t the req irements of the relevant p rt of IEC 6 12 The a pl cant s al

c o se one of these o tion The programmes are not inten ed for combined u e, thou h

dif ferent programmes may b c osen for dif ferent f use-l n series

Option 1: a complete test programme ac ordin to the relevant p rt of IEC 6 12 s al b

p r ormed on every amp re ratin of e c fu e-l n series The complete programme s al

b re e ted at 10 ye r intervals ac ordin to C.6.1 b low

Option 2: a complete test programme ac ordin to the relevant p rt of IEC 6 12 s al b

p r f ormed on every amp re ratin of e c f use-ln series The complete programme s al b

re e ted at 10 ye rs intervals, an the a pl cant's q al ty control s stem s al b uti zed

ac ordin to C.6.2 b low

Option 3: a test programme whic u es the homogene u series (sig ificant sample)

a pro c s al b p r ormed ac ordin to C.6.3 b low

Option 4: a test programme whic u es the homogene u series (sig ificant sample)

a pro c an the a pl cant’s q al ty control s stem s al b p rf ormed ac ordin to C.6.4

b low

The f ol owin p ints a ply to e c o tion:

a) the s hed l n of the au it testin an s rvei an e may b stag ered;

b) the NCB s al b resp n ible f or s rvei an e an au it activities;

c) the a pl cant s al give pro f of contin ou conf orman e with the req irements of the

a pro riate p rt of IEC 6 12 ;

d) the selection of samples for au it testin an s rvei an e s al b ran om, if p s ible;

e) it is recommen ed that sp re samples b selected for au it testin , in order to red ce the

delay if ad itional tests are ne ded;

f ) uti zation by NCB of man f acturer’s test faci ties:

1) te ting at ma ufa turer’s premis s (TMP) tests may b car ied out by the staf of a

CB testin la oratory at the man facturer’s test la oratory u der sp cif i rules aimed

at verifyin compl an e

Ap roval by the NCB of the man facturer’s la oratory is not neces ary providin the

la oratory is c r ently registered with a d ly ac redited certif i ation b d /registrar;

2) s pervis d ma uf acturer’s te ting (SMT) tests may b car ied out (whol y or in

p rt by the man f acturer’s test la oratory providin it has b en previou ly a proved

by the NCB u der sp cific rules aimed at verifyin compl an e

Ap roval by the NCB of the man f acturer’s la oratory is not neces ary providin the

la oratory is c r ently registered with a d ly ac redited certif i ation b d /registrar

+AMD1:2 1 +AMD2:2 15  IEC 2 15

C.6.1 Au it te ting a d s rv i a c – Option 1

C.6.1.1 Audit te ting

A complete test programme ac ordin to the relevant p rt of IEC 6 12 s al b p rf ormed on

every amp re ratin of e c fu e-l n series The complete programme s al b re e ted at

10 ye r intervals These au it tests may b witnes testin , re-testin , TMP or SMT

C.6.1.2 Surv i a c

Routine in p ction s al take place no les than on e p r ye r The in p ction s al review

e c prod ct f or con isten y with the prod ct des ription in the Conformity As es ment

Re ort

C.6.2 Audit te ting a d s rv i a c – Option 2

C.6.2.1 Additional obl gations of the NCB

The NCB is req ired to as es the man facturer’s q al ty s stem In ad ition, the

man facturer’s q al ty s stem s al b reviewed to en ure that it in lu es the s rvei an e

detai ed b low

C.6.2.2 Additional obl gations of the ap l c nt

Ap lcants are req ired

a) to have a doc mented q al ty s stem in o eration, whic in lu es provision f or

contin ou conforman e with the req irements of the relevant p rt of IEC 6 12 ,

b) to in lu e in their q al ty s stem the s rvei an e detaied in C.6.2.4

C.6.2.3 Audit te ting

A complete test programme ac ordin to the relevant p rt of IEC 6 12 s al b p rf ormed on

every amp re ratin of e c fu e-l n series The complete programme s al b re e ted at

10 ye r intervals These au it tests may b witnes testin , re-testin , TMP, or SMT

C.6.2.4 Surv i a c

Routine in p ction s al take place no les than on e every two ye rs The in p ction s al

review e c prod ct for conforman e with the prod ct des ription in the Conformity

As es ment Re ort The in p ction s al also comprise routine as es ment of the o eration

of the q al ty plan an the q al ty s stem

The a plcant s al record al routine tests req ired by the a pl cant’s q al ty s stem an

make these record avai a le for verif i ation an review on the NCB’s request

The NCB s al in p ct the res lts of al routine tests req ired by the a pl cant's q al ty s stem

A test programme ac ordin to the homogene u series con e ts of IEC 6 12 s al b

p rormed on sig ificant samples in ac ordan e with the s hed le s own in Ta le C.1 These

au it tests may b witnes testin , re-testin , TMP, or SMT

22

2

22

Routine in p ction s al take place no les than on e p r ye r The in p ction s al review

e c sig ificant sample for conforman e with the prod ct des ription in the Conformity

As es ment Re ort

C.6.4 Au it te ting a d s rv i a c – Option 4

A test programme whic u es the homogene u series (sig ificant sample) a pro c an the

a pl cant’s q al ty control s stem s al b p rormed

C.6.4.1 Additional obl gations of the NCB

The NCB is req ired to as es the man f acturer’s q al ty s stem In ad ition, the

man f acturer’s q al ty s stem s al b reviewed to en ure that it in lu es the s rvei an e an

au it testin detai ed b low

C.6.4.2 Additional obl gations of the ap l c nt

The a plcant is req ired

a) to have a doc mented q al ty s stem in o eration whic in lu es provision for

contin ou conforman e with the req irements of the relevant p rt of IEC 6 12 ;

b) to in lu e in their q al ty s stem the s rvei an e detaied in C.6.4.4

C.6.4.3 Audit te ting

A test programme s al b p r ormed in ac ordan e with the s hed le s own in Ta le C.2

These au it tests may b witnes testin , re-testin , TMP, or SMT

22

2

22

Routine in p ction s al take place no les than on e every two ye rs The in p ction s al

review e c sig ificant sample The in p ction s al also comprise routine as es ment of the

o eration of the q alty plan an the q al ty s stem

The a plcant s al record al routine tests req ired by the a pl cant’s q al ty s stem an

make these record avaia le for verification an review on the NCB’s req est

The NCB s al in p ct the routine test res lts every two ye rs

C.7 Accepta i ity of a dit test results

If more than one sample has non-conformin res lts d rin the au it testin , the fu e-l n an

al re resented f use-ln s s al b rejected

If a sin le non-conf ormin res lt is o tained f or a p rtic lar test d rin the au it testin , a

secon set of samples f om the same lot s al b selected an s bjected to the same test

The secon set s al have the same n mb r of samples as the first set If an non-conf ormin

res lts are o tained on the secon set, the f use-l n an al re resented fu e-ln s s al b

rejected

C.8 Accepta i ity of survei la ce results

If an non-conformin res lts are o tained d rin the s rvei an e, the NCB s al con ult with

the manufacturer an a plcant to determine whether the non-conforman e is sig ificant, an

whether cor ection ne d to b made, or typ testin p rormed

+AMD1:2 1 +AMD2:2 15  IEC 2 15

Bibl ogr aphy

IEC 6 0 2:2 0 , Markin c des for resistors a d c pa it ors

IEC 6 4 5:19 3, Guide for the c oic of c l ours to b used for th mark in of c pa it ors a d

resist ors

IECEE 03:2 0 , Rul es ofP ro ed ure of t he Sc eme of th IECEE for Mutu l Re o nitio of

Co formity As es me t Certific tes a c rdin to Stand ards for Ele tric l a d El ectro ic

Equipme t a d Comp n nts (CBFCS)

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