IEC TS 62564 1 Edition 3 0 201 6 07 TECHNICAL SPECIFICATION Process management for avionics – Aerospace qualified electronic components (AQEC) – Part 1 Integrated circuits and discrete semiconductors[.]
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Trang 4CONTENTS
FOREWORD 3
INTRODUCTION 5
1 Sco e 6
2 Normative ref eren es 6
3 Terms, def i ition an a breviation 7
3.1 Terms an def i ition 7
3.2 Ab reviation 9
4 Tec nical req irements 9
4.1 AQEC plan 9
4.2 AQEC doc mentation 10 4.2.1 General 10 4.2.2 AQEC data s e t 10 4.2.3 Material content 10 4.2.4 AQEC visibi ty 10 4.2.5 AQEC l f e exp ctan y 10 4.2.6 Device tec nolog 11 4.2.7 SEE data 1
4.2.8 Termination f i is 1
4.2.9 Third p rty p rt n mb rs 1
4.3 AQEC p rforman e 12
4.3.1 Perf orman e 12
4.3.2 Fu ctional p rameters 13
4.3.3 Known l mitation 13
4.4 Qual ty s stem certif i ation 13
4.5 Comp nent q al f i ation an re-q al fi ation 13
4.6 AQEC q al ty as uran e an rel a i ty monitorin 13
4.7 Prod ct c an e notif i ation (PCN) 14
4.8 L st time bu (LTB) notif i ation 14
4.9 Obsoles en e management 14
4.10 Cou terfeit prevention 14
4.1 User or c stomer g ide 14
An ex A (informative) AQEC material content an con tru tion ta le 15
An ex B (informative) Ad itional desired data 17
Bibl ogra h 18
Ta le A.1 – AQEC material content an con tru tion 15
Trang 5INTERNATIONAL ELECTROTECHNICAL COMMISSION
Part 1: Integrated circuits and discrete semiconductors
1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin
al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote
intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To
this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cif i atio s,
Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re f ter refere to a “IEC
Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te
in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n
n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely
with th Intern tio al Org niz tio for Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b
a re me t b twe n th two org niz tio s
2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al
c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio f rom al
intere te IEC Natio al Commite s
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Commite s in th t s n e Whie al re s n ble eforts are ma e to e s re th t th te h ic l c nte t of IEC
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misinterpretatio b a y e d u er
4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s
tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e
b twe n a y IEC Pu lc tio a d th c r e p n in n tio al or re io al p blc tio s al b cle rly in ic te in
th later
5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtif i atio b die pro id c nformity
a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y
s rvic s c rie o t b in e e d nt c rtific tio b die
6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio
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memb rs of its te h ic l c mmite s a d IEC Natio al Commite s for a y p rs n l injury, pro erty d ma e or
oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or f or c sts (in lu in le al fe s) a d
e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC
Pu lc tio s
8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is
in is e s ble f or th c re t a plc tio of this p blc tio
9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of
p te t rig ts IEC s al n t b h ld re p n ible f or id ntifyin a y or al s c p te t rig ts
The main tas of IEC tec nical commite s is to pre are International Stan ard In
ex e tional circ mstan es, a tec nical commit e may pro ose the publ cation of a tec nical
sp cif i ation when
• the req ired s p ort can ot b o tained for the publ cation of an International Stan ard,
despite re e ted ef f orts, or
• the s bject is sti u der tec nical develo ment or where, f or an other re son, there is the
f uture but no immediate p s ibi ty of an agre ment on an International Stan ard
Tec nical sp cif i ation are s bject to review within thre ye rs of publ cation to decide
whether they can b tran f ormed into International Stan ard
IEC TS 6 5 4-1, whic is a tec nical sp cif i ation, has b en pre ared by IEC tec nical
commit e 10 : Proces management f or avionic
Trang 6This third edition can els an re laces the secon edition, publ s ed in 2 1 This edition
con titutes a tec nical revision
This edition in lu es the f ol owin sig if i ant tec nical c an es with resp ct to the previou
f ) information ad ed regardin comp nents' l fe exp ctan y in 4.2.5
GEIA-STD-0 0 -0 1 (Ju e 2 0 ), Aero p c Qu lified Electro ic Comp n nt (AQEC)
Re uireme ts, Volume 1 – I nte rated Circ its a d Semic nd uctors, has served as a b sis f or
the ela oration of this tec nical sp cif i ation
The text of this tec nical sp cif i ation is b sed on the folowin doc ments:
En uiry draft Re ort o v tin
Ful information on the votin for the a proval of this tec nical sp cif i ation can b fou d in
the re ort on votin in icated in the ab ve ta le
This publcation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2
A l st of al p rts in the IEC 6 5 4 series, u der the general title P ro e s ma a eme t for
a io ic – Aero p c q alified ele tro ic c mp n nts (AQEC), can b fou d on the IEC
we site
The commit e has decided that the contents of this publ cation wi remain u c an ed u ti
the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data
related to the sp cifi publ cation At this date, the publ cation wi b
• tran formed into an International stan ard,
Trang 7Aerosp ce q al f ied electronic comp nents (AQEC) plan are develo ed by man facturers in
order to doc ment compl an e with AQEC req irements For AQEC desig ated comp nents,
the intention is to
a) provide AQEC u ers ac es to inf ormation f rom the AQEC man facturers that is
neces ary for u in commercial-of f -the-s elf (COTS) prod cts;
b) b t er ena le AQEC u ers to as es whether these p rts are ca a le of o eratin rel a ly
in their a plcation ;
c) minimize deviation f rom the AQEC man f acturers’ COTS prod cts;
d) have minimal imp ct on the AQEC man facturers’ stan ard o eratin or bu ines
proced res;
e) promote commu ication b twe n the AQEC man facturers an u ers
Trang 8PROCESS MANAGEMENT FOR AVIONICS –
Part 1: Integrated circuits and discrete semiconductors
This p rt of IEC 6 5 4, whic is a Tec nical Sp cif i ation, defi es the minimum req irements
f or integrated circ its an semicon u tors whic are desig ated as an “a rosp ce q al f ied
electronic comp nent (AQEC) It a pl es to integrated circ its an semicon u tors ex ibitin
the fol owin at ributes:
a) a minimum set of req irements, or inf ormation provided by the p rt man f acturer, whic
wi al ow a stan ard COTS comp nent to b desig ated AQEC by the man facturer;
b) as a minimum, e c COTS comp nent (desig ated AQEC) wi have b en desig ed,
f abricated, as embled, an tested in ac ordan e with the comp nent man facturer’s
req irements for stan ard data b ok comp nents;
c) q al f i ation o an q al ty s stems f or, the COTS comp nents to b desig ated as AQEC
s ould in lu e the man f acturer’s stan ard , o eratin proced res, an tec nical
sp cif i ation This inf ormation s ould b avai a le when req ested;
d) comp nents man factured b fore the man f acturer has ad res ed AQEC req irements,
but uti zin the same proces es, are also con idered AQEC compl ant;
e) ad itional desired atributes of a device desig ated AQEC ( hat wi s p ort AQEC u ers)
are fou d in An ex B of this tec nical sp cif i ation
NOT Parts q alf i d to mi tary s e if i atio s (e c pt th s id ntif i d a b in f or “lo istic s p ort p rp s s
o ly) are c n id re AQEC; th remain er of this te h ic l s e ific tio o ly a dre s s n n-mi tary s e if i atio
p rts
Parts q al fied to AEC-Q10 , grade 0 throu h to grade 3 are con idered AQEC F r those
a pl cation where a 0 °C to +7 °C temp rature ran e is a pro riate, grade 4 is also
con idered to b AQEC The u ers s ould doc ment that the grade category u ed is
comp tible with the a pl cation in ac ordan e with their IEC TS 6 2 9-1 electronic
comp nents management plan (ECMP)
The f olowin doc ments are ref er ed to in the text in s c a way that some or al of their
content con titutes req irements of this doc ment For dated referen es, only the edition
cited a pl es For u dated referen es, the latest edition of the ref eren ed doc ment (in lu in
an amen ments) a pl es
IEC TS 6 2 9-1, P ro e s ma a eme t for a io ic – M an g me t plan – P art 1: P re aratio
a d mainte a c of a electro ic c mp n nts ma a eme t pla
IEC 6 3 6-1, P ro e s ma a eme t for a io ic – Atmo p eric rad iatio efe ts – P art 1:
Ac ommodation of atmo p eric rad iatio efe ts via sin le e e t efe ts within a io ic
electro ic e uipme t
IEC T 6 6 8-1, P ro e s ma a eme t for a io ic – Co ntereit pre e tio − P art 1:
Av id in th u e ofc u tereit, fa dule t a d re y led electro ic c mp n nts
ISO 9 01, Qu lity ma a eme t s stems – Re uirements
Trang 9J-STD-0 8, N otific tio Standard for P rodu t Dis o tinu n e
doc ment pre ared by or f or the man f acturer to des rib an AQEC prod ct
Note 1 to e try: It in lu e a d ta s e t a d ma in lu e oth r d c me ts, s c a material d s riptio s,
e viro me tal te t pro e ure , q alty mo itorin pro e s s, etc It ma b a sta d-alo e d c me t or a cle rly
d n te item within a larg r d c me tatio s stem Th re ma b a ditio al d ta a s ciate with s e ific
a plc tio s whic ma b re u ste s p rately
3.1.2
in trument pre ared by the plan owner (se 3.1.10) that cle rly, con isely, an
u ambig ou ly doc ments the proces es u ed by the plan owner to satisf y the req irements
of this tec nical sp cif i ation
Note 1 to e try: Th pla c ntain a dita le c nte t
microcirc it (device with a hig circ it-element den ity) in whic al or some of the circ it
elements are in e ara ly as ociated an electrical y intercon ected (on one or more
s bstrates, in a u iq e in ivisible p c age) so that the microcirc it is con idered to b
in ivisible f or the purp se of con tru tion an commerce
3.1.5
s micon uctor
dis rete s micon uctor de ic
semicon u tor device that is sp cif ied to p rf orm an elementary fun tion an that is not
divisible into se arate comp nents fun tional in themselves (for example diodes, tran istors,
o tocouplers, LEDs an related prod cts)
Trang 103.1.7
c stomer
us r
de ig er
original eq ipment man facturer (OEM) that proc res integrated circ its an /or
semicon u tor devices compl ant with this tec nical sp cif i ation an u es them to desig ,
prod ce, an maintain s stems
doc ment pre ared by the man facturer that des rib s the electrical, mec anical, an
en ironmental c aracteristic of the comp nent
3.1.10
ma ufa turer
pla owner
prod cer of integrated circ its, microcirc its, or other semicon u tor devices that may b
desig ated AQEC
Note 1 to e try: A ma ufa turer ma pro u e th c mp n nts dire tly or ma o ers e s b o tra te
ma ufa turin a c rdin to th ir own pro e s s Th ma uf acturer is als th pla own r
3.1.1
s ppl er
distributor of comp nents
Note 1 to e try: A pla for c ntrol n AQEC in e tory is in pla e in ord r to s p ly AQECs A ma ufa turer c n
b a s p ler in th c s wh re n distrib tor is in olv d
s a e, size, ar an ement of p rts, visible asp ct, mode in whic a p rt exists or manifests
itself , or the material an item is con tru ted from
Trang 113.2 Abbre iations
AQEC Aerosp ce q al f ied electronic comp nent
Bi-CMOS Bip lar CMOS
BPSG Boro hosphosi cate glas
COTS Commercial of f the s elf
CMOS Complementary metal oxide semicon u tor
DDR Double data rate
DSCC Def en e s p ly centre Columbu (se htp:/ www.d c dla.mi /
DSIAC Def en e s stems information analy is center
ECMP Electronic comp nent management plan
FFF Form, f it an f un tion
FIT Fai ures in time
FPGA Field programma le gate ar ay
GIDEP Government in u try data ex han e program
HAST Hig ly ac elerated stres test
HCI Hot car ier injection
HTOL Hig temp rature o eratin l fe
LED Lig t emit in diode
MCU Multiple cel upset
TDDB Time de en ant dielectric bre k own
VID Ven or item drawin (controled an rele sed by DSCC)
4 Tec nical requirements
The proces es u ed to en ure compl an e with the f ol owin req irements s al b