Iec cispr 24 2015

This edition in lu es the fol owin sig ificant tec nical c an es with resp ct to the previou edition: • dated referen es updated; • o tion of u in a 4 % ste size for contin ou con u ted

INT RNA TIONAL SPECIAL COMMITT E ON RA IO INTERFERENCE

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Copyright © 2 15 IEC, Ge e a, Switzerla d

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A bo t IE p blc tio s

Th te h ic l c nte t of IEC p blc tio s is k pt u d r c n ta t re iew b th IEC Ple s ma e s re th t y u h v th

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INT ERNAT IONAL

ELECT ROT ECHNICAL

COMMIS ION

ELECT ROT ECHNIQUE

INT ERNAT IONALE

INTERNATIONAL S ECIAL COMMIT EE ON RA DIO INT RF RENCE

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Warnin ! Mak e s re that you obtain d this publc tio from a a th rize distributor

Atte tio ! Ve i ez v u a s rer q e v u a ez obte u c t e publc tio via u distribute r a ré

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INT RNA TIONAL SPECIAL COMMITT E ON RA IO INTERFERENCE

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CONTENTS

FOREWORD 4

INTRODUCTION 6

1 Sco e an o ject 7

2 Normative referen es 7

3 Terms an definition 8

4 Immu ity test req irements 1

4.1 General 1

4.2 Partic lar req irements 1

4.2.1 Electrostatic dis harges (ESD) 1

4.2.2 Electrical fast tran ients (EFT) 12 4.2.3 Contin ou radio freq en y disturb n es 12 4.2.4 Power- req en y mag etic field 13 4.2.5 Surges 13 4.2.6 Voltage dips an inter uption 13 5 Ap l ca i ty 13 6 Con ition d rin testin 14 6.1 General con ition 14 6.2 Partic lar con ition (EUT o erational modes, etc.) 15 7 Performan e criteria 15 7.1 General p rforman e criteria 15 7.2 Performan e criterion A 15 7.3 Performan e criterion B 15 7.4 Performan e criterion C 16 7.5 Partic lar p rforman e criteria 16 8 Prod ct doc mentation 16 9 Me s rement u certainty 16 10 Immu ity req irements 16 An ex A (normative) Tele hon terminal eq ipment 19 An ex B (normative) Data proces in eq ipment 31

An ex C (normative) L cal are network (LAN) 3

An ex D (normative) Printers an ploters 3

An ex E (normative) Co yin mac ines 3

An ex F (normative) Automatic tel er mac ines (ATM) 3

An ex G (normative) Point of sale terminals (POST) 4

An ex H (normative) xDSL Terminal eq ipment 4

Bibl ogra h 4

Fig re 1 – Des ription of p rts 9

Fig re A.1 – Example sou d coupl n set up b twe n the acou tic output device of a tele hone han set an an artificial e r for detectin demod lated sou d pres ure level 21

Fig re A.2 – Example test set up for me s rin the sou d pres ure level from the acou tic output device of a tele hone han set 2

Fig re A.3 – Test setup for me s rin the referen e sou d pres ure level from a

+AMD1:2 15 CSV  IEC 2 15

Fig re A.4 – Demod lation on analog e l nes, set up 2

Fig re A.5 – Example of typical smal key tele hone s stem or PABX 2

Fig re A.6 – Example test set up for A.2.6 with secon ary device u in the method A.2.2 2

Fig re A.7 – Example test set up for A.2.6 with secon ary device u in the method A.2.3 2

Fig re H.1 – DSL ac es s stem config ration 4

Ta le 1 – Immu ity, en los re p rt 16 Ta le 2 – Immu ity, sig al p rts an telecommu ication p rts 17 Ta le 3 – Immu ity, input d.c p wer p rt (ex lu in eq ipment marketed with a a.c./d.c p wer con erter) 17 Ta le 4 – Immu ity, input a.c p wer p rts (in lu in eq ipment marketed with a se arate a.c./d.c p wer con erter) 18 Ta le A.1 – Criteria a pled to TTE fu ction , u ed d rin contin ou disturb n es testin 19 Ta le A.2 – Maximum acou tic demod lated levels at an e r piece 2

Ta le A.3 – Maximum acou tic demod lated levels relative to referen e level 2

Ta le A.4 – Maximum demod lated diferential mode sig als at analog e p rts 2

Ta le A.5 – TTE p rforman e criteria for sp t freq en y tests 2

Ta le A.6 – TTE p rforman e criteria for non-contin ou radio freq en y disturb n es 2

Ta le A.7 – Test config ration an p rforman e as es ment method a plca le to a PABX an as ociated terminals for contin ou RF disturb n e tests 3

Ta le H.1 – ITU-T recommen ation for xDSL s stems 4

Ta le H.2 – Example ca le aten ation Aten ation values re resentin ca le len th 4

INTERNATIONAL ELECTROTECHNICAL COMMISSION

1) Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic field To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re fer refere to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n

n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio for Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio from al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th form of re omme d tio s for intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eforts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible for th wa in whic th y are u e or for a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtific tio b die pro id c nformity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtific tio b die

6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s for a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or for c sts (in lu in le al fe s) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s ble for th c re t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible for id ntifyin a y or al s c p te t rig ts

DISCLAIMER

This Cons l date v rsion is not a of icial IEC Sta dard a d ha be n prepare for

us r c nv nie c Only the c r e t v rsio s of the sta d rd a d its ame dme t(s) are

In this Re l ne v rsion, a v rtic l l ne in the margin s ows where th te hnic l c nte t is

modifie by ame dme t 1 Additio s a d d letion are displa e in re , with deletions

being struc throug A s parate Final v rsion with al c a g s a c pte is a ai able in

this publ c tion

+AMD1:2 15 CSV  IEC 2 15

Electromag etic comp tibi ty of information tec nolog eq ipment, multimedia eq ipment an

receivers

This edition in lu es the fol owin sig ificant tec nical c an es with resp ct to the previou

edition:

• dated referen es updated;

• o tion of u in a 4 % ste size for contin ou con u ted immu ity test deleted;

• revision of An ex A for tele hon eq ipment in lu in methodolog for me s rin the

demod lation from a sp aker / han s fre device;

• in lu ion of new an ex related to DSL eq ipment

This publ cation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

The commite has decided that the contents of the b se publ cation an its amen ment wi

remain u c an ed u ti the sta i ty date in icated on the IEC we site u der

"htp:/we store.iec.c " in the data related to the sp cific publ cation At this date, the

The contents of the cor igen um of Ju e 2 1 have b en in lu ed in this co y

IMPORTANT – The 'c lour inside' logo o the c v r pa e of this publ c tion in ic te

that it c ntain c lo rs whic are c n idere to be u eful for the c r e t understa ding

of its c nte ts Us rs s o ld th refore print this d c me t using a c lour printer

This CISPR publ cation esta l s es u iform req irements for the electromag etic immu ity of

information tec nolog eq ipment The test method are given in the referen ed Basic EMC

Immu ity Stan ard This publcation sp cifies a plca le tests, test levels, prod ct o eratin

con ition an as es ment criteria

+AMD1:2 15 CSV  IEC 2 15

1 Sc pe and object

This CISPR publcation a ples to information tec nolog eq ipment (ITE) as defined in

CISPR 2

The o ject of this publ cation is to esta l s req irements that wi provide an adeq ate level of

intrin ic immu ity so that the eq ipment wi o erate as inten ed in its en ironment The

publcation defines the immu ity test req irements for eq ipment within its s o e in relation to

contin ou an tran ient con u ted an radiated disturb n es, in lu in electrostatic

dis harges (ESD)

Proced res are defined for the me s rement of ITE an l mits are sp cified whic are

develo ed for ITE within the freq en y ran e from 0 Hz to 4 0 GHz

For ex e tional en ironmental con ition , sp cial mitigation me s res may b req ired

Owin to testin an p rforman e as es ment con ideration , some tests are sp cified in

defined freq en y b n s or at selected freq en ies Eq ipment whic fulfis the req irements

at these freq en ies is de med to fulfi the req irements in the entire freq en y ran e from

0 Hz to 4 0 GHz for electromag etic phenomena

The test req irements are sp cified for e c p rt con idered

NOT 1 Safety c n id ratio s are n t c v re in this p blc tio

NOT 2 In s e ial c s s, situ tio s wi aris wh re th le el of disturb n e ma e c e th le els s e ifie in

this p blc tio , for e ample wh re a h n -h ld tra smiter is u e in pro imity to e uipme t In th s in ta c s,

s e ial mitig tio me s re ma h v to b emplo e

The fol owin referen ed doc ments are in isp n a le for the a plcation of this doc ment For

dated referen es, only the edition cited a ples For u dated referen es, the latest edition of

the referen ed doc ment (in lu in an amen ments) a pl es

IEC 6 0 0-161:19 0, Inte rnato nal Ele ctrote ch ic l Vo cabulary (IEV) – Chap ter 161:

Ele ctro mag e tic co mp atbil y

IEC 6 318-1:2 0 , Ele ctro aco ustc – Simulato rs o f human he ad and e ar – Part 1: Ear

simulator forth me asureme nt o fsup ra-aural and circumaural e arp ho ne s

IEC 610 0-4-2:2 0 , Electro mag etc co mp atbil y (EMC) – Part 4-2: Te stn and

me asure me t te ch ique s – Ele ctro statc dis harg immuniy te st

IEC 610 0-4-3:2 0 , Ele ctromag e tic co mp atbil y (EMC) – Part 4-3: Te stn and

me asure me nt te ch ique s – Radiate d, radio -fre que ncy, e lectro mag e tic fieldimmuniy te st

Amen ment 1(2 0 )

Amen ment 2(2 10)

IEC 610 0-4-4:2 0 , Ele ctro mag e tic comp atbil y (EMC) – Part 4-4: Te stn and

IEC 610 0-4-5:2 0 , Ele ctro mag e tic comp atbil y (EMC) – Part 4-5: Te stn and

m ea ure me nt tech iques – Surg immuniy te st

IEC 610 0-4-6:2 0 , Ele ctro mag e tic co mp atbil y (EMC) – Part 4-6: Te stn and

m e asure me nt te ch ique s – Immuniy to co nducte d disturbance s, inducedb y radio -fre que ncy

fie lds

IEC 610 0-4-8:2 0 , Ele ctro mag e tic co mp atbil y (EMC) – Part 4-8: Testn and

m e asureme nt te ch ique s – Po we r fre que ncy mag e tic fie ld immuniy test

IEC 610 0-4-1 :2 0 , Ele ctro mag e tic co mp atbil y (EMC) – Part 4-1 : Te stn and

m e asure me nt te ch ique s – Vo ltag dip s, sho rt inte rrup tio ns and v lag variato ns immuniy

te sts

CISPR 16-1-2:2 0 , Sp ecific to n for radio disturbance and immuniy me asurin ap p aratus and

m etho ds – Part 1-2: Radio disturb ance and immuniy me asurin ap p aratus – Anci ary

e quip me t – Co nducte d disturbance s

Amen ment 1(2 0 )

Amen ment 2(2 0 )

CISPR 2 :2 0 , Sound and te le visio n bro adc st rece iv rs and a sociate d e uip me nt –

Immuniy chara te ristc – Limis and me tho ds o f me asure me t

CISPR 2 :2 0 , Info rmato n tech o lo y e quip me nt – Radio disturbance chara te ristc – Limis

and metho ds ofmea ure me nt

u wanted c an e in o erational p rforman e of an EUT d e to electromag etic disturb n es

This do s not neces ariy me n malfu ction or catastro hic faiure

3.2

e uipme t u der te t

EUT

re resentative device or fu ctionaly interactive group of devices ( hat is a s stem) whic

in lu es one or more host u its that is s bjected to test proced res sp cified in this publ cation

3.3

information te h ology e uipme t

ITE

an eq ipment:

a) whic has a primary fu ction of either (or a combination of entry, storage, display,

retrieval, tran mis ion, proces in , switc in , or control, of data an of telecommu ication

mes ages an whic may b eq ip ed with one or more terminal p rts typicaly o erated

for information tran fer;

b) with a rated s p ly voltage not ex e din 6 0 V

It in lu es, for example, data proces in eq ipment, of ice mac ines, electronic bu ines

eq ipment an telecommu ication eq ipment

An eq ipment (or p rt of the ITE eq ipment whic has a primary fu ction of radio tran

-mis ion an /or rece tion ac ordin to the ITU Radio Reg lation are ex lu ed from the s o e

+AMD1:2 15 CSV  IEC 2 15

NOT An e uipme t whic h s a fu ctio of ra io tra smis io a d/or re e tio a c rdin to th d finitio s of

th ITU Ra io Re ulatio s s o ld fulfi th n tio al ra io re ulatio s, wh th r or n t this p blc tio is als v ld

Eq ipment, for whic al disturb n e req irements in the freq en y ran e are explcitly formul

-ated in other IEC or CISPR publ cation , are ex lu ed from the s o e of this publ cation

ph sical b u dary of the EUT throu h whic electromag etic field may radiate or impin e For

plu -in u its, the ph sical b u dary wi b defined by the host u it

3.7

telepho y c l

proces exercised in the network an the telecommu ication terminal eq ipment (TTE) to alow

interc an e of information (sp ec , vide or data) with another TT throu h the network

NOT Th c l s o ld b o erate in th wa s e ifie b th ma ufa turer For circ it switc e s rvic s, th

e c a g of d ta s o ld b c n id re to b p s ible wh n a 6 k its c a n l or e uiv le t is a aia le for b th

p rtie For p c et s rvic , th e c a g of informatio s o ld b c n id re to b p s ible wh n a virtu l p th is

e ta ls e to th c le T E

3.8

e tabl s me t of a teleph ny c l

the o eratin proced re for a u er or an automatic proces in conju ction with the network to

re c the ca a i ty to ex han e information with another TTE

NOT Se Note of 3.7

3.9

re eption of a telephon c l

the o eratin proced re for a u er or an automatic proces initiated by, an in conju ction with,

the network to re c the ca a i ty to ex han e information with another TTE

NOT Se Note of 3.7

3.10

mainte a c of a telephony c l

the ca a i ty of ex han in information without havin to cle r an re-esta ls a cal

Informatio te h olo y

e uipme t

IE 2016 /10

cle ring of a teleph ny c l

the o eratin proced re for a u er or an automatic proces in conju ction with the network

(either at the initiative of the local p rty or the distant p rty) to sto the ca a i ty of ex han in

information by an orderly return to a state where the esta l s ment of a new cal is p s ible

eq ipment inten ed to b con ected to a publc or private telecommu ication network, that is:

a) to b con ected directly to the termination of a telecommu ication network in order to

sen , proces or receive information; or

b) to inter-work with a telecommu ication network b in con ected directly or in irectly to

the termination of a telecommu ication network in order to sen , proces or receive

information

3.15

multifunction e uipme t

information tec nolog eq ipment in whic two or more fu ction s bject to this stan ard

an /or to other stan ard are provided in the same u it

NOT Ex mple of multifu ctio e uipme t in lu e

− ap rs n l c mp ter pro id d with a tele ommu ic tio fu ctio a d/or bro d a t re e tio fu ctio ;

− ap rs n l c mp ter pro id d with a me s rin fu ctio , etc

3.16

tele ommunic tion n twork port

p int of con ection for voice, data an sig aln tran fers inten ed to intercon ect widely

disp rsed s stems via s c me n as direct con ection to multi-u er telecommu ication

network (e.g publc switc ed telecommu ication network (PSTN), integrated services

digital network (ISDN), x- yp digital s bs rib r lnes (xDSL), etc.), local are network (e.g

Ethernet, Token Rin , etc.) an simiar network

NOT A p rt g n raly inte d d for interc n e tio of c mp n nts of a IT s stem u d r te t (e.g RS-2 2,

IE E Sta d rd 12 4 (p ralel printer), Univ rs l Serial Bu (USB), IE ESta d rd 13 4 (Fire Wire”), etc.) a d u e

in a c rd n e with its fu ctio al s e ific tio s (e.g for th ma imum le gth of c ble c n e te to it , is n t

c n id re to b a tele ommu ic tio s/n twork p rt u d r this d finitio

3.17

a alogu interfa e

an interface that tran mits an receives sig als whose c aracteristic q antities folow

eq ipment ne ded to exercise an /or monitor the o eration of the EUT in a re resentative way

4 Immunity test requirements

4.1 Ge eral

The immu ity test req irements for eq ipment are given on a p rt by-p rt b sis

Tests s al b con u ted in a wel -defined an re rod cible man er

The tests s al b car ied out as sin le tests in seq en e The seq en e of testin is o tional

The des ription of the test, the test generator, the test method an the test set up are given in

IEC b sic EMC stan ard whic are refer ed to in the fol owin ta les

The contents of these IEC b sic EMC stan ard are not re e ted here; however, modification

or ad itional information ne ded for the practical a plcation of the tests are given in this

Electrostatic dis harges s al b a pled only to those p ints an s rfaces of the EUT whic

are exp cted to b tou hed d rin u ual o eration, in lu in u er ac es , as sp cified in the

u er man al, for example cle nin or ad in con uma les when the EUT is p wered

The n mb r of test p ints is EUT de en ent The req irements of 8.3.1 an A.5 of IEC 610

0-4-2 s al b taken into con ideration when selectin test p ints The a pl cation of dis harges

to the contacts of o en con ectors is not req ired

Guidan e on the selection of actual test p ints is given in A.5 of IEC 610 0-4-2 When

selectin test p ints p rtic lar at ention s al b given to keyb ard , dial n p d , p wer

switc es, mice, drive slots, card slots, arou d commu ication p rts, etc

The dis harges s al b a pled in two way :

a) Contact dis harges to the con u tive s rfaces an to coupl n planes:

The EUT s al b exp sed to at le st 2 0 dis harges, 10 e c at negative an p sitive

p larity, at a minimum of four test p ints For ta le- o eq ipment one of the test p ints s al

b the centre front ed e of the horizontal coupl n plane, whic s al b s bjected to at le st

5 in irect dis harges (2 of e c p larity) Al other test p ints s al e c receive at le st 5

direct contact dis harges (2 of e c p larity) Al are s normal y tou hed by the u er s ould

b tested If no direct contact test p ints are avai a le, then at le st 2 0 in irect dis harges

s al b a pl ed in the in irect mode (se IEC 610 0-4-2 for u e of the Vertical Con u tin

For contact dis harges, the there is no req irement to a ply ESD dis harges at lower levels, as

defined in Clau e 5 of IEC 610 0-4-2, is not a plca le voltages b low the test level defined in

Ta le 1

b) Air dis harge at a ertures an in ulatin s rfaces:

On those p rts of the EUT where it is not p s ible to p rform contact dis harge testin , the

EUT s ould b in estigated to identify the u er ac es ible p ints where bre k own may oc ur;

examples are o enin s at ed es of key , or the covers of keyb ard an tele hone han sets

Su h p ints are tested u in the air dis harge method

– multicon u tor ca les, s c as a 5 -p ir telecommu ication ca le, s al b tested as a

sin le ca le Ca les s al not b splt or divided into groups of con u tors for this test;

– a pl ca le only to ca les whic ac ordin to the man facturer’s sp cification s p ort

commu ication on ca le len th gre ter than 3 m;

– the ca le len th b twe n the EUT an the coupl n device s al b as s ort as p s ible in

the ran e 0,5 m to 3,0 m

4.2.3 Continuo s ra io fre ue c disturba c s

4.2.3.1 Ge eral

The freq en y ran e for the radiated field test is 8 MHz to 1 0 0 MHz The freq en y ran e

for the contin ou con u ted test is 0,15 MHz to 8 MHz

The freq en y ran es are s an ed as sp cified; however, at a lmited n mb r of selected

freq en ies a more comprehen ive fu ctional test may b req ired The req irement to

u dertake this ad itional selected freq en y test is not u iversal y a plca le to al prod cts,

but only to prod cts whic have this req irement sp cified in An ex A (u der p rtic lar prod ct

sp cific req irements) The selected freq en ies are given in Ta les 1 to 4

The dwel time at e c freq en y s al not b les than the time neces ary for the EUT to b

exercised an to b a le to resp n However, the dwel time s al not ex e d 5 secon s at

e c of the freq en ies d rin the s an

The time to exercise the EUT s al not b interpreted as a total time of a programme or a c cle

but related to the re ction time in case of fai ure of the EUT

Unles req ired by an an ex of this doc ment, cloc an other sen itive freq en ies do not

ne d to b as es ed se arately

Recog isin that a 1 % ste size is prefer ed, the freq en y ran e can b swe t in rementaly

with a ste size not ex e din 4 % of the previou freq en y with a test level of twice the value

of the sp cified test level in order to red ce the testin time for eq ipment req irin testin in

multiple config ration an /or lon c cle times

+AMD1:2 15 CSV  IEC 2 15

4.2.3.2 Continuo s ra iate disturba c s

The test proced re s al b in ac ordan e with IEC 610 0-4-3

The EUT s al b p sitioned so that the four sides of the EUT s al b exp sed to the

electromag etic field in seq en e In e c p sition the p rforman e of the EUT wi b

in estigated

In the case where the most sen itive s rface side of the EUT is k own throu hout the

freq en y ran e ( or example, via prelminary tests), testin may b restricted to that s rface

side only Where it is not p s ible to determine the most sen itive face with an certainty ( or

example where diferent faces are sen itive at diferent freq en ies) al four faces s al b

tested

If the EUT is to large s c that it can ot b fuly i uminated by the radiatin anten a, or

ex e d the size of the Uniform Field Are (UFA) then p rtial i umination s al b u ed The

EUT can b re ositioned so that the front s rface remain within the UFA in order to i uminate

those section of the EUT that were previou ly outside the UFA

4.2.3.3 Continuo s c ndu te disturba c s

There s al b no ad itional deviation from IEC 610 0-4-6 (other than those sp cified

in 4.2.3.1)

4.2.4 Power-fre ue c ma n tic field

The test proced re s al b in ac ordan e with IEC 610 0-4-8

The EUT s al b ar an ed an con ected to satisfy its fu ctional req irements, an s al b

placed at the centre of the coi s stem (immersion method)

The ca les s p l ed by the EUT man facturer s al b u ed or, in their a sen e, s ita le

alternative ca les of the typ a pro riate to the sig als in olved s al b u ed

Ph sicaly large prod cts ne d not b completely s bmerged in the mag etic field, only the

sen itive devices (s c as CRT monitors if they are the only sen itive p rts) In this case, an

if the CRT monitor is integral with the ITE, then the CRT monitor or sen itive device may b

removed for testin

4.2.5 Surg s

The test proced re s al b in ac ordan e with IEC 610 0-4-5

4.2.6 Volta e dips a d inter uptions

The test proced re s al b in ac ordan e with IEC 610 0-4-1

5 A ppl c bi ity

Tests s al b a pl ed to the relevant p rts of the EUT ac ordin to Ta les 1 to 4

It may b determined from con ideration of the electrical c aracteristic an u age of

p rtic lar EUT that some of the tests are ina pro riate an therefore u neces ary In s c a

case, it is req ired that b th the decision an the ju tification not to a ply an p rtic lar test to

an p rtic lar p rt b recorded in the test re ort

Multifu ction eq ipment whic is s bjected simultane u ly to dif erent clau es of this stan ard

ac ieved without ph sicaly modifyin the eq ipment internal y The eq ipment th s tested s al

b de med to have compl ed with the req irements of al clau es/stan ard when e c

fu ction has satisfied the req irements of the relevant clau e/stan ard For example, a

p rsonal computer with a bro d ast rece tion fu ction s al b tested with the bro d ast

rece tion fu ction disa led ac ordin to this stan ard an then tested with only the bro d ast

rece tion fu ction activated ac ordin to CISPR 2 , if it can o erate e c fu ction in isolation

u der normal o eration

For eq ipment whic it is not practical to test with e c fu ction o erated in isolation, or where

the isolation of a p rtic lar fu ction would res lt in the eq ipment b in u a le to fulfi its

primary fu ction, or where the simultane u o eration of several fu ction would res lt in

savin me s rement time, the EUT s al b de med to have compl ed if it me ts the provision

of the relevant clau e/stan ard with the neces ary fu ction o erated For example, if a

p rsonal computer with a bro d ast rece tion fu ction can ot o erate the bro d ast rece tion

fu ction in isolation from the computin fu ction, the p rsonal computer may b tested with the

computin fu ction an bro d ast rece tion fu ction activated ac ordin to this stan ard an

to CISPR 2 with resp ct to these req irements

Where an al owan e is made ex lu in sp cific p rts or freq en ies or fu ction in a stan ard

b cau e of dif erent test sp cification an /or test set up an /or p rforman e criterion, the

al owan e may b made when relevant fu ction within multifu ction eq ipment are tested

again t a dif erent stan ard (e.g ex lu in of the a pl cation of Ta le 2 to an anten a p rt or

ex lu in of the evaluation of the bro d ast fu ction d rin a me s rement of eq ipment

containin the bro d ast rece tion fu ction ac ordin to this stan ard)

De en ent up n the EUT more than one criterion defined in the an exes may a ply, for

example a TTE atac ed to a LAN s al me t the criteria defined in An ex A an An ex C

6 Conditions during testing

6.1 Ge eral c n itions

The tests s al b made exercisin al primary fu ction in the most re resentative mode

con istent with typical a pl cation The test sample s al b config red in a man er con istent

with typical in talation practice

If the EUT is p rt of a s stem or can b con ected to as ociated eq ipment, then the

eq ipment s al b tested whi e con ected to the minimum re resentative config ration of

as ociated eq ipment neces ary to exercise the p rts in a simiar man er to that des rib d in

Clau e 8 of CISPR 2

The config ration an mode of o eratin d rin the tests s al b precisely noted in the test

re ort It is not alway p s ible to test every fu ction of the a p ratu ; in s c cases, the most

critical mode of o eration s al b selected

If the EUT either has a large n mb r of terminals or a large n mb r of p rts with simi ar

con ection typ s, then a s ficient n mb r s al b selected to simulate the actual o eratin

con ition an to en ure that al the diferent typ s of termination are covered

Coi ca les (s c as keyb ard ca les) s al not b intentional y stretc ed d rin testin For

s c ca les, the len th sp cified in the ta le notes refers to the stretc ed con ition

The test eq ipment or as ociated eq ipment ( or example NT or simulator) con ected to the

EUT s al not have an influen e on the res lt of the testin

In cases where a man facturer’s sp cification req ires external protection devices or

me s res whic are cle rly sp cified in the u er’s man al, then the test req irements of this

+AMD1:2 15 CSV  IEC 2 15

Durin testin , the en ironmental con ition an s p ly voltages s al remain within the

o eratin ran es sp cified for the prod ct u les otherwise in icated in the b sic stan ard

If an e rth con ection in e en ent of the p wer s p ly ca le is provided, this e rth con ection

s al b in tal ed ac ordin to the sp cification of the man facturer for the tests given in

7 Performanc criteria

7.1 Ge eral performa c criteria

The man facturer has the o l gation to expres the p rforman e criteria in terms whic relate

to the p rforman e of his sp cific prod ct when u ed as inten ed

The fol owin p rforman e criteria are a pl ca le, an s al only b evaluated when the

fu ction refer ed to are implemented

Examples of fu ction defined by the man facturer to b evaluated d rin testin in lu e, but

are not l mited to, the fol owin :

– es ential o erational modes an states;

– tests of al p ripheral ac es (hard dis s, flo py dis s, printers, keyb ard, mou e, etc.);

– q al ty of sof ware exec tion;

– q al ty of data display an tran mis ion;

– q al ty of sp ec tran mis ion

7.2 Performa c criterion A

Durin an afer the test the EUT s al contin e to o erate as inten ed without o erator

intervention No degradation of p rforman e or los of fu ction is alowed b low a minimum

p rforman e level sp cified by the man facturer when the EUT is u ed as inten ed The

p rforman e level may b re laced by a p rmis ible los of p rforman e If the minimum

p rforman e level or the p rmis ible p rforman e los is not sp cified by the man facturer,

then either of these may b derived from the prod ct des ription an doc mentation, an by

what the u er may re sona ly exp ct from the EUT if u ed as inten ed

7.3 Performa c criterion B

Afer the test, the EUT s al contin e to o erate as inten ed without o erator intervention No

degradation of p rforman e or los of fu ction is al owed, afer the a pl cation of the

phenomena b low a p rforman e level sp cified by the man facturer, when the EUT is u ed

as inten ed The p rforman e level may b re laced by a p rmis ible los of p rforman e

Durin the test, degradation of p rforman e is al owed However, no c an e of o eratin state

or stored data is al owed to p rsist af er the test

If the minimum p rforman e level (or the p rmis ible p rforman e los ) is not sp cified by the

man facturer, then either of these may b derived from the prod ct des ription an

7.4 Performa c criterion C

Durin an afer testin , a temp rary los of fu ction is al owed, provided the fu ction is self

recovera le, or can b restored by the o eration of the controls or c cl n of the p wer to the

EUT by the u er in ac ordan e with the man facturer’s in tru tion

Fu ction , an /or information stored in non-volatie memory, or protected by a b t ery b c up,

s al not b lost

7.5 Partic lar performa c criteria

The p rtic lar p rforman e criteria whic are sp cified in the normative an exes take

preceden e over the cor esp n in p rts of the general p rforman e criteria

Where p rtic lar p rforman e criteria for sp cific fu ction are not given, then the general

p rforman e criteria s al a ply

8 Product doc mentation

The sp cification u ed by the man facturer to define the p rforman e criteria for the testin

req ired by this stan ard s al b made avai a le to the u er up n req est

When a plyin the test levels given in Ta les 1 to 4, the req irements s al not b c an ed

b sed on an estimate of me s rement u certainties

NOT Me s reme t u c rtaintie are n t re uire to b c lc late

Ap lc ble o ly to EUT c ntainin d vic s s s e tible to ma n tic field , s c a C T mo itors, Hal eleme ts,

ele tro y amic micro h n s, ma n tic field s n ors, etc

b

Th fre u n y ra g is s a n d a s e ifie Howe er, wh n s e ifie in An e A, a a ditio al c mpre e siv

fu ctio al te t s al b c rie o t at a lmite n mb r of fre u n ie Th s le te fre u n ie are: 8 , 12 , 16 , 2 0,

4 4, 4 0, 6 0, 8 3 a d 9 0 MHz (±1 %)

Th fre u n y ra g is s a n d a s e ifie Howe er, wh n s e ifie in An e A, a a ditio al c mpre e siv fu ctio al

te t s al b c rie o t at a lmite n mb r of fre u n ie Th s le te fre u n ie for c n u te te ts are: 0,2; 1; 7,1;

For p rts wh re primary prote tio is inte d d, s rg s are a ple at v lta e u to 4 kV with th primary prote tors fite

Oth rwis th 1 kV te t le el is a ple with ut primary prote tio in pla e

Wh re th c u ln n twork for th 10/7 0 µs wa eform afe ts th fu ctio in of hig s e d d ta p rts, th te t s al b

c rie o t u in a 1,2/5 (8/2 ) µs wa eform a d a pro riate c u ln n twork

Table 3 – Immunity, input d.c power port (e cludin e uipme t mark te

Th fre u n y ra g is s a n d a s e ifie Howe er, wh n s e ifie in An e A, a a ditio al c mpre e siv fu ctio al te t

s al b c rie o t at a lmite n mb r of fre u n ie Th s le te fre u n ie for c n u te te t are: 0,2; 1; 7,1; 13,5 ; 21;

2 ,12 a d 4 ,6 MHz (±1 %)

b

Ap lc ble o ly to p rts whic a c rdin to th ma ufa turer’s s e ific tio ma c n e t dire tly to o td or c ble

Table 4 – Immunity, input a.c power ports (in luding e uipme t mark te

with a s parate a.c./d.c power c n erter)

Th fre u n y ra g is s a n d a s e ifie Howe er, wh n s e ifie in An e A, a a ditio al c mpre e siv fu ctio al te t

s al b c rie o t at a lmite n mb r of fre u n ie Th s le te fre u n ie for c n u te te t are: 0,2; 1; 7,1; 13,5 ; 21;

This an ex covers the req irements for the testin of tele hon terminal eq ipment whic may

provide au io or voice fu ctional ty over PSTN, ISDN, LAN or an other typ of

telecommu ication network Examples of tele hon terminal eq ipment in lu e, POTS (Plain

Old Tele hone Sets), conferen e tele hones, smal key tele hone s stems, vide conferen e

s stems, fac imi e mac ines The req irements of other a pl ca le an exes also a ply

Durin testin , the EUT s al b config red for con ection to a telecommu ication l ne at its

nominal imp dan e As ociated eq ipment may b u ed to simulate the telecommu ication

network

A.2 Continuous ra io frequency disturba ce

This clau e defines the p rforman e req irements for the EUT to the contin ou radio

freq en y disturb n e tests of 4.2.3 an Ta les 1 to 4 The p rforman e criteria are b sed

up n lmitin the amou t of 1 kHz tone from the test sig al that is demod lated within the EUT

This demod lation may a p ar as u wanted noise from the acou tic interface of the EUT, as

an u inten ed sig al a p arin on the telecommu ication l ne or disruption of the digital bit

stre m

Durin the contin ou disturb n e testin of e c p rt in ac ordan e with Ta les 1 to 4, al

fu ction of the EUT s al b monitored u in the method defined in Ta le A.1

Table A.1 – Criteria appl e to TTE fu ctions, us d d ring c ntin ous

main p wer p rt is u der test, al the fu ction of the EUT s al b monitored u in the

a pro riate method whi st the RF is injected into the AC main p wer p rt

With regard to this an ex, the term ”los les ” me n that no aten ation of the au io sig al

oc urs at a ju ction, interface or con ection, for example the ampltu e of the au io sig al is

the same at b th sides of a throu h con ection in a s re ned ro m wal

When a plyin this an ex, con ideration ne d to b given to variou fu ction of the EUT

whic may have a direct imp ct on the test These may ne d to b con idered se arately as

some fu ction may have a direct imp ct up n how the test is p rformed or how the EUT

re cts Elements to b con idered in lu e:

• mute fu ction ;

• ec o can el n ca a i ties;

• noise can el n circ itry

Where p s ible, these fu ction s al b disa led The config ration of the EUT with resp ct to

these fu ction s al b noted in the test re ort

If it is s sp cted that the mute fu ction , ec o can el n ca a i ties, or noise can el n

circ itry are interferin with the a i ty to make the me s rement, then these fe tures may b

disa led an the test p rformed Where this is not p s ible the folowin method may red ce

the influen e of the noise an ec o can el n fu ction This is de en ent on the

implementation an the res ltin disturb n es

The commu ication p th s ould b activated in b th tran mit an receive direction for

me s rements d rin the immu ity tests, however, sin e b th receive an tran mit p th may

not b active simultane u ly, esp cial y d rin han s- re o eration, the immu ity tests for the

receive p th an the tran mit p th may ne d to b as es ed se arately

When me s rements are car ied out in the receive direction, a s ita le test sig al ( or example

3 0 Hz sine wave) s al b coupled into the receive direction p th The level of this test sig al

s al b hig enou h ( or example -5 dBm) to activate the receive p th an b fitered by the

b n -p s fiter d rin the immu ity test

When me s rements are car ied out in the tran mit direction, the tran mit mode s al b

activated with a lou sp aker placed at an a pro riate distan e from the EUT The test sig al

prod ced by the lou sp aker s al b lou enou h for the EUT to activate the tran mit p th

an b fitered by the b n -p s fiter d rin the immu ity test

The mute fu ction s al b switc ed of d rin testin by the normal proced re

NOT Th s meth d ma n t work in al c s s

The config ration of the EUT with resp ct to these fu ction s al b noted in the test re ort

The volume control (where it exists) s al b set as close as p s ible to the p sition whic

gives the nominal value as stated by the man facturer The actual volume level u ed ( or

example 7 % of ful ) s al b noted in the test re ort

For ISDN interfaces, u in b sic ac es mode, the tele hon service to the EUT s al b in

idle mode as defined for the a pl ed digital to analog e con ersion

When a plyin contin ou con u ted disturb n es to tele hon terminals, an artificial han , in

+AMD1:2 15 CSV  IEC 2 15

A.2.2 Me s reme t metho : s un pre s re le el (spl)

This method me s res the actual 1 kHz sig al that is demod lated by the EUT an a p ars as

an au ible tone at the e r piece of a he d et or han set

The sou d pres ure level (spl) of the 1 kHz sig al s al b me s red u in a cal brated

artificial e r, as defined in IEC 6 318-1, coupled without los to the acou tic output device of

the EUT (se Fig re A.1) If los les coupln can not b ac ieved, this method is

ina pro riate an the referen e level method (A.2.3) s al b u ed The b c grou d acou tic

noise s al b les than 4 dB(spl) The au io c an el s al b o en an active

Wh n u e d rin ra iate immu ity te t, th artificial e r re uire s ieldin (d n te with th d s e ln )

This s ieldin s al b remo e d rin c n u te immu ity te t

b

Th c n tru tio of th b x s al n t imp ct th RF sig als re c in th EUT, for e ample c n tru te from

wo d or pla tic c ntainin a o stic a s rb nt material

Figure A.1 – Ex mple s un c upl ng s t up betwe n the a oustic output de ic of a

telephone ha ds t a d a artificial e r for dete ting d mod late s un pre s re le el

Durin testin it is imp rtant to en ure that the me s rement micro hone itself do s not imp ct

on the me s rement, for radiated testin a plastic tub may b u ed to remove the micro hone

from the test are In this case, cor ection for the los cre ted by the plastic tub at 1 kHz s al

b in lu ed

Table A.2 – Ma imum a oustic demodulate le els at a e r pie e

Th 9 0 MHz te t is at a sin le s ot fre u n y (a c ra y +/ 1 MHz) This re uireme t is n t

a plc ble for c u trie wh re n digital mo ie s rvic s o erate at this fre u n y

At th tra sitio fre u n ie th lower a o stic s u d pre s re le el a ple

A.2.3 Me s reme t metho : refere c le el

The referen e level method is where an initial 1 kHz tone, generated by the EUT, is recorded

prior to the test The demod lated 1 kHz au io tone from the EUT is me s red d rin the test

an comp red to this recorded referen e

A sin soidal sig al of 1 kHz, – 0 dBm （dBmO for digital s stems) is impres ed on the

telecommu ication l ne (sig al level without the radio- req en y field) The res ltin acou tic

sou d level is me s red u in a micro hone The me s red level s al b u ed an recorded

as the referen e level The sig al u ed to esta l s the referen e level is switc ed of d rin

the actual test The 3 dB b n width of the me s rement eq ipment s al b 10 Hz (+/ 2 Hz)

The b c grou d noise s al b at le st 15 dB b low the referen e level The demod lated

acou tic noise, me s red in the same set up u ed for recordin the referen e level, s al not

b gre ter than the values given in Ta le A.3

For me s rin the level of demod lated sig al present at a sp aker/han s fre phone the

a d d

Th 9 0 MHz te t is at a sin le s ot fre u n y (a c ra y +/ 1 MHz) This re uireme t is n t

a plc ble for c u trie wh re n digital mo ie s rvic s o erate at this fre u n y

Ac u tic l pro ertie are c mp n ate o t b th c lbratio pro e ure In er a d o ter diameter is 15 mm a d

19 mm, re p ctiv ly (ty ic l) Total le gth of pla tic tu eis 1,5 m (ty ic l)

b

Co ic ly forme a a tor whic is c n e te a o stic ly to th v rio s forms of h n s ts with s me ty e of

s f ru b r This sta le c u ln of th h n s t to th a o stic l tu e s o ld n t b c a g d b twe n th

c lbratio a d th me s reme t

Figure A.2 – Ex mple te t s t up for me s ring the s un pre s re le el

from th a o stic o tput de ic of a telepho e h nds t

Wh re p s ible, th micro h n s o ld b lo ate o tsid th te t are to remo e th pro lem of th

micro h n d mo ulatin th 1 kHz to e A fle ible pla tic tu e c n e tin th EUT a dio p rt b in mo itore

Th d vic s u e to me s re th a dio le els s al b d sig e to minimiz th imp ct o th a ple field

Fig re A.3 – Te t s tup for me s rin the refere c s un pre s re le el

from a spe k r/ha ds fre phon

A.2.4 Me s reme t metho : demo ulatio along a alogu l ne

This test me s res the amou t of 1 kHz (nar owb n ) sig al that is demod lated by the EUT

an injected dif erential y into the telecommu ication network for an analog e lne Durin

testin , the levels may b me s red u in the fol owin proces :

1 Set up the EUT an AE in ac ordan e with Fig re A.4 This ar an ement provides the

a i ty to me s re the demod lated 1 kHz present on the tele hone l ne The fi ter s own in

Fig re A.1 is a b n p s fiter centred at 1 kHz with a 3 dB b n width of 10 Hz (+/

2 Hz)

EUT

Balu

(sea

3 Ap ly the a pro riate EM Phenomenon whist monitorin the demod lated levels u in the

set up defined in Fig re A.4 Ap ro riate me s res may b ne ded to prevent the EM

disturb n es imp ctin the AE an me s rement eq ipment

Durin testin the EUT s al me t the p rforman e req irements given in Ta le A.4

Table A.4 – Ma imum d modulate dif ere tial mode signals at a alog e ports

Freq enc ban

Th 9 0 MHz te t is at a sin le s ot fre u n y (a c ra y +/ 1 MHz) This re uireme t is n t

a plc ble for c u trie wh re n digital mo ie s rvic s o erate at this fre u n y

At th tra sitio fre u n ie th lower le el a ple

A.2.5 Me s reme t metho : spot fre ue c te t

The commu ication an o erational fu ctional ty of the TTE s al b verified d rin the

a plcation of sin le sp t freq en ies The fol owin are a plca le to the sp t freq en y tests

IE 2 02 0/0

Table A.5 – TTE performa c criteria for spot fre ue c te ts

NOT 1 For ISD e uipme t u in primary a c s th folowin als a ple

Th n mb r of lo s of frame alg me ts s al b le s th n 10 within a te t p rio of 10 s Wh re it c n b cle rly

e ta ls e th t a v ic c l is maintain d thro g o t th te t it is n t th n re uire to e alu te th lo s of frame

alg me t

NOT 2 Wh re th e ta ls e c mmu ic tio is maintain d, th startsto pin of c mmu ic tio is o ly

a plc ble to EUT with a dial fu ctio th t pro id s emerg n y s rvic c l c p bi ty

A.2.6 Me s reme t meth d: demo ulatio s nt to digital l ne

For s stems that con ect to a digital tran mis ion s stem it is not general y p s ible to bre k

into the lne, as is done in A.2.4 for analog e l nes, in order to me s re the 1 kHz tone that is

demod lated by the EUT an sent to l ne d rin the testin of contin ou RF disturb n es

This is esp cialy the case for Voice over IP (VoIP) a plcation where the au io sent to lne is

en oded into p c ets that may b sent for example via an Ethernet or DSL tran mis ion

s stem

For s c digital l nes a cal s al b esta l s ed to another tele hon device, k own as the

‘secon ary device’ Whi e a plyin the contin ou RF disturb n es to the EUT, the acou tic

output from the secon ary device ( he received au io sig als from the EUT) s al b me s red

u in the method given in A.2.2 (Se example test setup given in Fig re A.6) Where los les

acou tic coupl n to the secon ary device can ot b ac ieved then the method of A.2.3 s al

b u ed (Se example test setup in Fig re A.7) The lmit levels defined in Ta le A.2 or A.3

s al b a pl ed to the resp ctive method It is ac e ta le to p rform the test twice: on e whi e

monitorin the demod lated au io levels, an again whi e evaluatin other p rforman e

criteria

When u in the method of A.2.3 in order to cal brate the ln a 1 kHz Referen e Noise Source

(RNS) s al b a pled to an artificial mouth, in order to generate a k own sou d pres ure level

of 8 dB(spl) The referen e noise source is coupled to the micro hone of the EUT an the

output at the receiver of the secon ary device is me s red To o tain the actual referen e

level, s btract 3 dB from the me s red value The b c grou d noise s al b at le st 15 dB

b low the esta ls ed referen e level The referen e noise source an artificial mouth are then

removed The acou tic me s rements are then relative to the referen e level esta l s ed with

the RNS

The fol owin p ints s al b con idered:

• Ide l y the secon ary device s ould b the same as the EUT

• The secon ary device s ould b located outside of the test en ironment, for example in a

remote s re ned ro m or outside the test c amb r an where p s ible in an acou tical y

q iet en ironment

• Ca les le vin the test en ironment may req ire ad itional radio freq en y fiterin

• The secon ary device s ould, where a pl ca le, b set up with the same config ration, for

example, the setin of gain, noise can elation an volume control

• Al lou nes ratin s s ould b set to their nominal values

• There is no ne d to ph sical y bre k into the lne in order to me s re the 1 kHz tone sent to

A.3 Non-continuous ra io frequenc disturbances

For non-contin ou radio freq en y disturb n es, a ply the criteria defined in Ta le A.6 for al

CDN-M

EUT

Aco stic shield

* MRP: Mo se r efer ence p int

Note: C N-M a d C N-T

o ly pr es nt d r i g RF

c ntin o s c n u te te t Aco stic los

Ar tificialh nNote: C N-M a d C N-T

o ly pr es nt d r i g RF

c ntin o s c n u te te t

Table A.6 – T E performa c criteria for non-c ntin ous ra io fre ue c disturba c s

NOT Wh re th e ta ls e c mmu ic tio is maintain d d rin th a plc tio of th te t, th

startsto pin of c mmu ic tio is o ly a plc ble to T E with a dial fu ctio th t pro id s emerg n y

s rvic c l c p bi ty

A.4 Ar angements for te ting smal key telephone systems or PABXs

A smal key tele hone s stem or PABX generaly con ists of a main switc in an control u it

(refer ed to as ”main u it” here fer) an a n mb r of terminals that are atac ed to the main

u it via exten ion ca l n or an internal telecommu ication network (ITN)

The main switc u it wi also have one or a n mb r of con ection to an external

telecommu ication network (ETN), for example PSTN, ISDN, DSL or a combination of these

The ITN in man cases may b q ite lon an hen e provide a sig ificant anten a to external

disturb n es req irin the ne d to en ure that al typ s of con u ted disturb n es are a pl ed

to internal telecommu ication network p rts of the main u it an the terminals

This wi req ire reversin an re ositionin an coupln /decoupln network in order to me t

the req irements of the b sic stan ard for se aration b twe n EUT an coupln network

Ex ter nal - EUT-S1to E N

Inter nal - EUT-S1to EUT-S2

Inter nal - EUT-S2 to EUT-S3

Figure A.5 – Ex mple of typic l smal k y telephon s stem or PABX

Ide ly the main u it [EUT-M] an the terminals [EUT-Sx] s ould b tested as se arate EUTs,

with the other p rt actin as the AE The EUT s al b ar an ed in ac ordan e with the

+AMD1:2 15 CSV  IEC 2 15

In tests where contin ou RF disturb n es are a pled to an p rt of the main u it, an at ac ed

terminal s ould b u ed for monitorin an 1 kHz sig al demod lated by the main u it, in

ac ordan e with Ta le A.7 u in the method given in A.2.2 or A.2.3 The atac ed terminal

wi en ure an demod lated sig al sent to the internal network p rt is me s red at the same

time However, it wi sti b neces ary to me s re the level of demod lated sig al sent out via

an external network p rts in ac ordan e with Ta le A.7 u in the method given in A.2.4

For contin ou radiated disturb n e tests a pl ed to the main u it only, it is recommen ed that

the terminal u ed for monitorin an demod lated 1 kHz sig al is placed outside of the test

en ironment

When the test phenomenon is a pl ed to an external network p rt, it is imp rtant to en ure that

a cal p th is esta ls ed from the monitorin terminal via the main u it to the external network

p rt to whic the test phenomenon is b in a pl ed

The folowin ta le defines the test config ration an p rforman e as es ment method to b

u ed for contin ou con u ted an radiated disturb n e tests Other req irements are also

given in A.2.1

Table A.7 – Te t c nfiguration a d performa c a s s me t meth ds appl c ble to a

PABX a d a s ciate termin ls for c ntinu us RF disturba c te ts

Ye

NOT 1 Th c nta t are o th h n s t is b s d o Cla s 8 of CIS R 16-1-2

NOT 2 For a e ample s u d c u ln s t u , refer to Fig re A.1

NOT 3 For e ample th refere c s u d pre s re le el me s reme t, refer to Fig re A.2 a d A.3

a

Wh re th EUT c nfig ratio is a c l to a e tern l n twork c n e tio (E N) th n th me s reme t of th

d mo ulate n is s nt into this e tern l ln s al b c rie o t in a c rd n e with A.2.4 of this ta le Wh re it

is c o e to u e a intern l c l p th to a oth r termin l EUT-S2 a th c nfig ratio , a me s reme t s al b

ma e at th EUT-S2 u in meth d giv n in A.2.2 or A.2.3 of this ta le EUT-S2 is ju t a e ample, it ma b

re la e with a oth r termin l s c a EUT-S1 or EUT-S3 In this c s , th mo itorin p rt s al b c a g d

a c rdin ly

b

Co d cte c mmo mo e disturb n e inje te o to e tern l n twork p rt toward th EUT-M dire tio ma b

d mo ulate into difere tial mo e sig al within th e tern l n twork circ it, a d ma b s nt n t o ly to E

UT-S1 b t als AE via 2 W/4 W circ its within th EUT-M It is, th refore, n c s ary to me s re a d c e k th

a o stic s u d pre s re le el of th EUT-S1 a d AE

c

Co d cte c mmo mo e disturb n e inje te into a intern l n twork p rt toward th EUT-M dire tio ma b

d mo ulate into a difere tial mo e sig al within th intern l n twork circ its a d ma b s nt n t o ly to AE

b t als EUT-S1, S2 via 2 W/4 W circ its within th EUT-M It is, th refore, n c s ary to me s re a d c e k th

s u d pre s re le el of EUT-S1, EUT-S2 a d AE

The test s al b car ied out u in an exercisin program whic can re e t the seq en es for

fu ction of EUT an , in case of fai ure, ena le an o erator to recog ise the nature of faiure

by display or by o erator’s interaction

The test seq en es s al b selected from the fol owin b low ac ordin to the fu ction

defined by the man facturer of the EUT, an the p rforman e criteria A, B or C s al b

selected ac ordin to the disturb n e to b tested

B.2 Re d, write and storage of data

B.2.1 Partic lar te t c nditio s

Data re d an write c cles s al b re e ted with internal storage devices s c as semi

-con u tor memories, mag etic or o tical dis s or mag etic ta e devices, an then the co ied

b c data s al b comp red with the original

Re d-only memories (ROM) s al b re d re e tedly an this data comp red with the exp cted

data

B.2.2 Partic lar performa c criteria

Performa c criterion A

Durin the test storage devices s al maintain normal o eration b th in re d/write an in stan

-by con ition

Performa c criterion B

Durin an af er the test faiures whic can b recovered by re d an write retries are

p rmis ible ( emp rary delay in proces in cau ed by this proces is ac e ta le)

Normal o eration of the EUT s al b restored af er the test, self recovery to the con ition

immediately prior to the a plcation of the test is ac e ted where this is a normal me n of

recovery In these cases, o erator resp n e is p rmit ed to re-initialse an o eration

Performa c criterion C

Faiures d rin test that res lt in a delay in proces in or a s stem a ort, whic afer testin

can b recovered to normal o eration by reset or re o t, are p rmis ible

B.3 Data display

B.3.1 Partic lar te t c nditio s

Text or gra hic s al b displayed on display devices s c as CRT monitors, lq id cry tal,

B.3.2 Partic lar performa c criteria

Performa c criterion A

Durin the test, when se n from the normal viewin distan e, the EUT s al o erate with no

c an e b yon the man facturer’s sp cification, in fl c er, colour, foc s an j t er (ex e t for

the p wer freq en y mag etic field test

Power fre ue c ma netic field te t

For CRT monitors, the fol owin also a ples:

The jter s al b me s red when the CRT monitor is immersed in a contin ou mag etic field

of 1 A/m (r.m.s.) at one of the p wer freq en ies of 5 Hz or 6 Hz

For display with pixels havin contin ou luminan e distribution only, j t er may b me s red

u in a me s rin micros o e of at le st 2 p wer The movement is determined by vis al

al g ment of the micros o e c rsor or comp rator reticle with the extreme p sition of the

centroid or ed e of a c aracter or test o ject d rin the o servation p riod

For an display typ , a sp cial display-me s rin device may b u ed This device s al

determine, on a s an-by-s an b sis, the relative location of a c aracter or test o ject If a

device is u ed that determines movement alon the horizontal an vertical axes only, the

extent of the j ter s al b defined as the s uare ro t of the s m of the s uares of the

maximum horizontal an vertical diferen es

Observation s al exten for p riod of at le st 4 s Me s rin devices that sample s an

s al ac umulate a n mb r of s an eq ivalent to at le st 4 s of contin ou o servation

The maximum jt er p rmited is given by:

3,3

5,2)3,0

≤C

J

where

J is the jt er (in mm);

C is the c aracter heig t (in mm)

Alternatively, a field of 5 A/m may b a pl ed, an a tran p rent grad ated mas u ed to

as es the j ter In this case, the j ter s al not ex e d 5 times the value in the a ove

formula

NOT This te t le el is u e to simplfy th me s reme t of jter L s er v lu s of th te t le el ma b u e if

n n-ln arity is e p rie c d,d e to, for e ample, s turatio of s re nin material

The EUT s al b tested in two p sition , b th p rp n ic lar to the mag etic field

Performa c criterion B

Scre n disturb n es d rin the a plcation of the test are p rmis ible if they self recover afer

removal of the external disturb n e

Performa c criterion C

Faiures d rin the test that can ot self recover af er removal of the external disturb n e, but

+AMD1:2 15 CSV  IEC 2 15

B.4 Data input

B.4.1 Partic lar te t c nditio s

Data s al b ac uired with input devices s c as keyb ard, mou e, mag etic card re der,

o tical c aracter re der, image s an er, input p n or mis el ane u sen ors

Thou h contin ou input is prefera le, testin in the stan -by con ition is p rmited for EUT

whic req ires o erator’s aten an e for o eration

When the EUT is a mas data input device, s c as a c aracter re der or s an er, then the

central proces in u it s al ru a program whic re d an a pro riate test c art contin ou ly

for the d ration of the test Re d data inputs are displayed, printed directly, or stored for later

evaluation

B.4.2 Partic lar performa c criteria

Performa c criterion A

Durin testin u inten ed input from an input device is not al owed

Durin testin input devices s al maintain the sp cified q al ty image data

Performa c criterion B

Durin testin keyb ard/mou e "loc up" is not al owed

For EUT with man al y inputed data that can b confirmed by re din the display, er ors are

p rmis ible d rin testin if they can b recog ised by the o erator an e si y cor ected

Performa c criterion C

Faiures d rin test that res lt in a delay in proces in or a s stem a ort, whic afer testin

can b recovered to normal o eration by reset or re o t, are p rmis ible

B.5 Data printing

B.5.1 Partic lar te t c nditio s

Data s al b printed by printers or ploters For EUT that has several o eration modes, tests

s al b a pl ed in the most typical mode of o eration

B.5.2 Partic lar performa c criteria

Performa c criterion A

Durin testin printers s al maintain the sp cified printin q al ty an normal o eration

Performa c criterion B

Durin testin no degradation of the printin q al ty b yon the man facturer’s sp cification

(s c as distortion of c aracter(s) or mis in pixels) is p rmis ible A p p r fe d fai ure is

al owed if af er removal of the jammed s e ts the jo is automaticaly recovered an there is

no los of printed information

Performa c criterion C

Durin testin printin er ors or omis ion of c aracter(s) whic req ire re rintin are

Input output fai ures that oc ur d rin testin that can b recovered to normal o eration af er

testin by reset or re o t are also p rmis ible

B.6 Data proc ssing

B.6.1 Partic lar te t c nditio s

Data proces in , s c as computation, data con ersion, storage or tran fer s al b

p rformed, an the res lts of proces in s al b comp red with res lts in normal o eration

B.6.2 Partic lar performa c criteria

Performa c criterion A

Durin testin faiures whic do not influen e the sp cified o eration within the prod ct

sp cification, an whic do not prevent automatic recovery are p rmis ible

Performa c criterion B

Durin testin fai ures whic are recovered automatical y but cau e temp rary delay in

proces in are p rmis ible

Performa c criterion C

Faiures d rin testin that res lt in a delay in proces in af er the external disturb n e is

removed, but whic can b recovered af er testin to normal o eration by a reset or re o t are

p rmis ible

Faiures d rin testin that res lt in a s stem a ort, whic can b recovered to normal

o eration afer testin by reset or re o t, are p rmis ible

Faiures d rin testin that are folowed by alarms an can b recovered to normal o eration

by the o erator’s intervention afer testin are p rmis ible

+AMD1:2 15 CSV  IEC 2 15

Annex C

(normative)

Local area networks (LAN)

C.1 Particular test conditions

A minimum test config ration con ists of two pieces of terminal eq ipment intercon ected with

man facturer sp cified ph sical ca le As ociated eq ipment neces ary to the fu ction of the

LAN s al b in lu ed in the test config ration Un sed p rts s al b tre ted ac ordin to the

man facturer’s in tru tion

The s stem s al b ca a le of del verin an receivin data at the sp cified nominal

tran mis ion rate

The LAN eq ipment exec tes a programme whic exercises the LAN fu ction As a minimum,

the fu ction b low s al b as es ed

C.2 Particular performa ce criteria

Performa c criterion A

Durin an af er the test, the EUT s al o erate without:

– er or rate b yon the fig re defined by the man facturer;

– req ests for retry b yon the fig re defined by the man facturer;

– sp ed of data tran mis ion rate b yon the fig re defined by the man facturer;

– protocol faiure;

– los of ln

Performa c criterion B

Er or rate, req est for retry an sp ed of data tran mis ion rate may b degraded d rin the

a plcation of the test

Durin testin degradation of the p rforman e as des rib d in criteria A is p rmited provided

that afer testin the normal o eration of the EUT is self recovera le to the con ition

immediately b fore the a plcation of the test In these cases, o erator resp n e is p rmit ed

to re-initiate an o eration

Performa c criterion C

Durin testin degradation of the p rforman e as des rib d in criteria A an B is p rmit ed

provided that afer testin the normal o eration of the EUT is self recovera le to the con ition

Annex D

(normative)

Printers and plot ers

D.1 Particular test conditions

Data s al b printed with printers or ploters No stan ard image is req ired, but the u e of a

text containin more than thre c aracter fonts an at le st one grid of l nes is recommen ed

Character pitc an lne sp cin s ould b smal If the dot den ity can b selected, the

hig est den ity s al b c osen Tests s al b car ied out with the EUT in the printin mode

D.2 Particular performa ce criteria

Performa c criterion A

The EUT s al o erate without degradation of p rforman e d rin an afer the a pl cation of

the disturb n e For example, there s al b no:

– los or cor uption of data d rin inputoutput o eration ;

– degradation of the printed image b yon the man facturer’s sp cification;

– c an e in output mode or c aracter font;

– p rce tible c an e in dot pitc ;

– u inten ed l ne or p ge fe d

Performa c criterion B

As for p rforman e criterion A, with the folowin ex e tion :

– degradation of the printed image b yon the man facturer’s sp cification is alowed;

– misalg ment of the grid l nes is alowed;

– u inten ed l ne fe d is alowed;

– a p p r fe d fai ure is alowed if af er removal of the jammed s e ts, the jo is

automatical y recovered an there is no los of printed information

Afer the disturb n e is removed, normal o eration of the EUT is self recovera le to the

con ition immediately b fore the a pl cation of the test; this may in olve an o erator resp n e

to re-initiate the o eration

Performa c criterion C

Degradation of the p rforman e as des rib d in criteria A an B is p rmit ed provided that the

normal o eration of the EUT is self recovera le to the con ition immediately b fore the