Iec 61290 4 3 2015

IEC 61 290 4 3 Edition 1 0 201 5 05 INTERNATIONAL STANDARD Optical amplifiers – Test methods Part 4 3 Power transient parameters – Single channel optical amplifiers in output power control IE C 6 1 2[.]

IEC 61 290-4-3

Editio 1.0 2 15-0

Optical ampl fier s – T est methods

Part 4-3: Power transient parameters – Single channel optical ampl fiers in

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IEC 61 290-4-3

Editio 1.0 2 15-0

Optical ampl fier s – Test methods

Part 4-3: Power transient parameters – Single channel optical ampl fiers in

INT ERNAT IONAL

ELECT ROT ECHNICAL

FOREWORD 3

1 Sco e 5

2 Normative referen es 5

3 Terms, definition an a breviation 6

3.1 Terms an definition 6

3.2 Ab reviation 7

4 Ap aratu 7

4.1 Test set up 7

4.2 Characteristic of test eq ipment 8

5 Test sample 9

6 Proced re

9 6.1 Test pre aration 9

6.2 Test con ition 9

7 Calc lation 10 8 Test res lts 1

8.1 Test setin s 1

8.2 Test data 12 An ex A (informative) Overview of p wer tran ient events in sin le c an el EDFA 13 A.1 Bac grou d 13 A.2 Characteristic input p wer b haviour 13 A.3 Parameters for c aracterizin tran ient b haviour 15 An ex B (informative) Bac grou d on p wer tran ient phenomena in a sin le c an el EDFA 17 B.1 Ampl fier c ain in o tical network 17 B 2 Typical o tical ampl fier desig 1

7 B.3 Ap ro c es to ad res detection er ors 19 An ex C (informative) Slew rate ef ect on tran ient gain resp n e 2

Biblogra h 2

Fig re 1 – Power tran ient test set up 8

Fig re 2 – OA output p wer tran ient resp n e of a) input p wer in re se 1

Fig re A.1 – Example OA input p wer tran ient cases for a receiver a plcation 14 Fig re A.2 – Input p wer me s rement p rameters for a) input p wer in re se an b) input p wer decrease 15 Fig re A.3 – OA output p wer tran ient resp n e of a) input p wer in re se an b) input p wer decrease 16 Fig re B.1 – Tran ient resp n e to a) input p wer dro (in erse ste tran ient with tran ient control, b) de ctivated (con tant pump p wer), an c) activated (p wer control) 21

Fig re B.2 – Tran ient resp n e to a) input p wer rise (ste tran ient with tran ient control, b) de ctivated (con tant pump p wer), an c) activated (p wer control) 2

Ta le 1 – Examples of tran ient control me s rement test con ition 10

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International Stan ard IEC 612 0-4-3 has b en pre ared by s bcommite 8 C: Fibre o tic

s stems an active devices, of IEC tec nical commite 8 : Fibre o tic

This International Stan ard is to b u ed in conju ction with IEC 612 1-1:2 12, on the b sis

of whic it was esta l s ed

The text of this stan ard is based on the fol owin doc ments:

Ful information on the votin for the a proval of this stan ard can b foun in the re ort on

votin in icated in the a ove ta le

A l st of al p rts of the IEC 612 0 series, publ s ed u der the general title Op tic al amp lifie rs –

Te st meth ds

1)

can b fou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

that it c ntains c lours whic are c nsid red to be us ful for the c r e t

und rsta din of its c nte ts Us rs s ould therefore print this doc me t usin a

OPTICAL AMPLIFIERS – TEST METHODS

Part 4-3: Power transient parameters –

Single channel optical ampl fiers in output power control

This p rt of IEC 612 0 a pl es to output p wer controled o tical y amplfied, elementary s

b-s stems It a ples to o tical fibre ampl fiers (OFA) u in active fibres containin rare-e rth

do ants, presently commercial y avai a le, as in icated in IEC 612 1-1, as wel as alternative

o tical ampl fiers that can b u ed for sin le c an el output p wer control ed o eration, s c

as semicon u tor o tical ampl fiers (SOA)

The o ject of this stan ard is to provide the general b c grou d for o tical amplfier (OA)

p wer tran ients an its me s rements an to in icate those IEC stan ard test method for

ac urate an rel a le me s rements of the folowin tran ient p rameters:

a) Tran ient p wer resp n e

b) Tran ient p wer overcomp n ation resp n e

c) Ste d -state p wer of set

d) Tran ient p wer resp n e time

The stimulu an resp n es b haviours u der con ideration in lu e:

Chan el p wer in re se (ste tran ient

These p rameters have b en in lu ed to provide a complete des ription of the tran ient

b haviour of an output p wer tran ient control ed OA The test definition defined here are

a pl ca le if the ampl fier is an OFA or an alternative OA However, the des ription in

An ex A of this doc ment con entrates on the ph sical p rforman e of an OFA an provides

a detaied des ription of the b haviour of OFA; it do s not give a simi ar des ription of other

OA typ s

2 Normative refere ces

The fol owin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 612 1-1:2 12, O p tic al amplfie rs – Part 1: Ge e ric spe c ificato

3 Terms, definitions and abbreviations

relative input p wer diferen e in dB b fore, d rin an af er the input p wer stimulu event

that cau es an OA tran ient p wer ex ursion

3.1.3

input power ris time

time it takes for the input optical sig al to rise from 10 % to 9 % of the total dif eren e

b twe n the initial an final sig al levels d rin an in re sin p wer ex ursion event

Note 1 to e try: s e Fig re A.2

3.1.4

input power fal time

time it takes for the input o tical sig al to fal from 10 % to 9 % of the total dif eren e

b twe n the initial an final sig al levels d rin a decre sin p wer ex ursion event

maximum or minimum deviation (overs o t or u ders o t in dB b twe n the OA’s target

p wer an the o served p wer ex ursion in u ed by a c an e in an input c an el p wer

ex ursion

Note 1 to e try: On e th o tp t p wer of a amplfie c a n l d viate from its targ t p wer, th c ntrol

ele tro ic in th OA s o ld atempt to c mp n ate for th p wer difere c or tra sie t p wer re p n e, brin in

Note 1 to e try: This p rameter is me s re from th time wh n stimulu e e t th t cre te th p wer flu tu tio

to th time at whic th OA p wer re p n e is sta le a d within s e ific tio

3.1.8

tra sie t power ov rc mpe s tion re pons

maximum deviation in dB b twe n the amplfier’s target output p wer an the p wer res ltin

from the control electronic in ta i ty

Note 1 to e try: Tra sie t p wer o erc mp n atio re p n e o c rs afer a p wer e c rsio , wh n a amplfier’s

c ntrol ele tro ic atempts to brin th p wer b c to th amplfier’s targ t le el Th c ntrol pro e s is iterativ ,

a d c ntrol ele tro ic ma initialy o erc mp n ate for th p wer e c rsio u ti s b e u ntly re c in th

Note 2 to e try: Th tra sie t p wer o erc mp n atio re p n e p rameter is g n raly of le s r ma nitu e th n

th tra sie t p wer re p n e a d h s th o p site sig

3.1.9

ste dy state power of s t

dif eren e in dB b twe n the final an initial output p wer of the OA, prior to the p wer

ex ursion stimulu event

Note 1 to e try: Normaly, th ste d state p wer le el folowin a p wer e c rsio difers from th OA p wer

b fore th in ut p wer stimulu e e t Th tra sie t c ntroler atempts to o erc me this ofs t u in fe d a k

3.2 Abbre iations

AGC automatic gain control er

APC automatic p wer control

NEM network eq ipment man facturers

NSP network service providers

O/E o tical- o-electrical

PID pro ortional integral derivative

SOA semicon u tor o tical ampl fier

SAR sig al- o-ASE ratio

SigP sig al p wer

SOP state of p larization

VOA varia le o tical at en ator

WDM wavelen th division multiplexin

4 Apparatus

4.1 Te t s t up

Fig re 1 s ows a generic set up to c aracterise the tran ient resp n e pro erties of output

p wer control ed sin le c an el OAs

Figure 1 – Power tra sie t te t s t up

4.2 Chara teristic of te t e uipme t

The test eq ipment l sted b low is ne ded, with the req ired c aracteristic

a) L ser source for s p lyin the OA input sig al with the fol owin c aracteristic :

– Abi ty to s p ort the ran e of sig al wavelen th for whic the OA u der test is to b

tested This could b provided for example by a tu e ble laser, or a b n of distributed

fe db c (DFB) lasers

– An ac ieva le average output p wer s c that at the input to the OA u der test the

p wer wi b a ove the maximum sp cified input p wer of the OA, in lu in los of

an s bseq ent test eq ipment b twe n the laser source an OA u der test

b) Polarization s rambler to ran omize the in omin p larization state of the laser source, or

to control it to a defined state of p larization (SOP) The p larization s rambler is

o tional

c) Varia le o tical at en ator (VOA) with a d namic ran e s f icient to s p ort the req ired

ran e of s rvivin sig al levels at whic the OA u der test is to b tested

NOT If th o tp t p wer of th la er s urc c n b v rie o er th re uire d n mic ra g , th n a VOA is

n t n e e

d) Optical mod lator to modify the OA input sig al to the defined p wer ex ursion with the

fol owin c aracteristic

– Extin tion ratio at rewrite without put in n mb r hig er than the maximum dro level

for whic the OA u der test is to b tested

– Switc in time fast enou h to s p ort the fastest slew rate for whic the OA u der test

is to b tested

e) Chan el p s -b n fi ter: an o tical fiter desig ed to distin uis the sig al wavelen th

with the fol owin c aracteristic Note the u e of a c an el p s -b n fi ter is o tional

– Abi ty to s p ort the range of sig al wavelen th for whic the OA u der test is to b

tested This could b provided for example by a tu e ble fi ter, or a series of dis rete

fi ters

– 1dB p s -b n of at le st ±2 GHz centred arou d the sig al wavelen th

– At least 2 dB at en ation level b low the minimum in ertion los acros the entire

sp cified tran mis ion b n of the OA u der test ex e t within a ran e of ±10 GHz

centred arou d the sig al wavelen th

f Opto-electronic (O/E) con ertor to detect the fi tered output of the OA u der test with the

fol owin c aracteristic

– A s f iciently wide o tical an electrical b n width to s p ort the fastest slew rate for

g) Os i os o e to me s re an ca ture the tran ient resp n e of the o tical y fi tered output

of the OA u der test, with a s f iciently wide electrical b n width to s p ort the fastest

slew rate for whic the OA is to b tested

h) Fu ction generator to generate the input p wer tran ient waveforms to drive the o tical

mod lator, with electrical pulse width s ort enou h an electrical slew rate hig enou h to

s p ort the fastest slew rate for whic the OA u der test is to b tested

5 Test sample

The OA s al o erate u der nominal o eratin con ition If the OA is l kely to cau e laser

os i ation d e to u wanted reflection , o tical isolators s ould b u ed to isolate the OA

u der test This wi minimize sig al in ta i ty

6 Procedure

6.1 Te t preparation

In the set up s own in Fig re 1, the input o tical sig al p wer injected into the ampl fier b in

tested is generated from a s ita le laser source The o tical p wer is p s ed throu h an

o tional p larization s rambler to al ow ran omization or control of the sig al p larization

state an is s bseq ently adju ted with a VOA to the desired o tical input p wer levels The

sig al then p s es throu h an o tical mod lator driven by a fu ction generator that provides

the desired input p wer test waveform to stimulate the tran ient input p wer ex ursion The

sig al is then injected into the ampl fier b in tested A c an el p s -b n fi ter (s c as a

tu e ble o tical fiter, fixed o tical fi ter or simi ar comp nent may b u ed to select only the

relevant c an el wavelen th u der test, fol owed by an O/E con erter an an os i os o e at

the output of the ampl fier The output c an el selected by the o tional c an el p s -b n

fi ter an its tran ient resp n e is monitored with the O/E con erter an os i os o e

Waveforms simiar to those s own in Fig re A.3 are ca tured via the os i os o e for

s bseq ent computer proces in

Prior to me s rement of the tran ient resp n e, the input p wer waveform trace s al b

recorded Use the set up of Fig re 1 without the OFA u der test The input o tical con ector

from the o tical mod lator is con ected to the c an el p s fiter

For this test to stimulate a p wer ex ursion at the input of the OA u der test, the source laser

p wer at the OA input is set at some typical p wer level The fu ction generator waveform is

c osen to in re se or decre se the input p wer to the OA u der test with p wer ex ursion

an slew rate relevant to the defined test con ition For example, for a typical n mb r in the

case of an o tical receiver, the input p wer to the OA could b in re sed by 7 dB in a

timeframe of 5 µs an then held at this p wer value to simulate a p wer in re se tran ient

p wer resp n e (ste tran ient con ition as s own in Fig re A.1(1) For alternative tran ient

control me s rements, the sig al generator waveform is controled a pro riately, an the

VOA is adju ted ac ordin ly

6.2 Te t c nditions

Several seq ential tran ient control me s rements can b p rformed ac ordin to the o tical

ampl fier’s sp cified o eratin con ition Examples of p wer ex ursion s enarios are s own

in Ta le 1 These me s rements are typical y p rformed over a bro d ran e of input p wer

levels

Table 1 – Ex mple of tra sie t c ntrol me s reme t te t c nditions

In ut p wer ste tra sie t in re s /re u tio 3 dB, 7 dB 5 0 µs, 2 0 µs, 5 µs

5 0 µs, 2 0 µs, 5 µs

7 Calculations

Tran ient p rameters can b calc lated by proces in ampl fier output p wer tran ient

waveforms s own in Fig re 2, u in the folowin criteria

– Tran ient p wer resp n e (dB) = B – A

– Tran ient p wer overcomp n ation resp n e (dB) = G – A

– Ste d state p wer of set (dB) = E – A

– Tran ient p wer resp n e time (μ ) = D – C

The fol owin test set in con ition s al b recorded.

a) Ar an ement of the test set up

b) Detai s (make an model) of e c piece of test eq ipment

c) Set up con ition of e c piece of test eq ipment (e.g o eratin sp ed of p larization

s rambler, resolution b n width of o tical sp ctrum analy er (OSA)

d) Mou tin method of test sample

b) Output o tical p wer P

o ttrace

c) Sig al- o-ASE ratio (SAR) at o eratin con ition b fore an af er ex ursion

d) OFA laser pump p wer b fore an af er ex ursion

e) OA re orted input p wer b fore an af er input ex ursion (where avai a le)

f OA re orted output p wer b fore an af er input ex ursion

g) OA re orted internal temp rature (where avai a le)

h) Me s rement ac urac of e c piece of test eq ipment

i) Temp rature of test sample

j) Tran ient p wer resp n e

k) Tran ient p wer overcomp n ation

l) Ste dy state p wer of set

m) Tran ient p wer resp n e time