Iec 61671-4-2016.Pdf

IEC 61 671 4 Edition 1 0 201 6 04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test configuration IE C 6 1 6 7 1 4 2 0 1 6 0 4 (e n ) IE E E S td 1 6 7 1 4 2 0 1 4 IEEE St[.]

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Cont ent s

1 Ov erv iew 1

1.1 Genera l 1

1.2 Applca tio of th is docu m ent ’s a n nex es 2

1.3 Sco e 2

1.4 Applca t io 2

1.5 Conv ent ions used wit hin this docu ment 3

2 Norma tiv e ref rences 4

3 Deinitons, a cron y ms, a nd a bbrev ia tions 4

3.1 Deinit io s 4

3.2 Acron yms and a bbrev ia t ions 5

4 TestCon figura t io schema 7

4.1 Ba ckg round 7

4.2 Test configura tion.x sd 7

5 TestCon figura t io insta nce schema 32 6 ATML TestConfigura tio X ML schema names a nd loca t ions 32 7 ATML XML schema ex ten sibi t y 34 8 Confor ma c 34 A n nex A (infor ma t iv e) IE E d ownloa d web-site materia l a ssocia t ed wit h t his d ocu ment 3

A n nex B(in for ma tiv e) Test Configura t io XML elemen t ma pping s t o MTP I ca rd field s 36 A n nex C (in for ma tiv e) Ex amples 41

A n nex D (infor ma tiv e) Biblog ra ph y 4

A n nex ? (infor ma tive) ???? ?????? ???? ?? ????? ? ? ? 4?

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Intern tio al Sta d rd IEC 616 1-4/IEEE Std 16 1.4-2 14 h s b e pro es e thro g IEC

te h ic l c mmite 91: Ele tro ics as embly te h olo y, u d r th IEC/IEEE Du l L g

IEEE St andard for A ut omat ic Test

Sp n or

T est and Dia nosis for Ele tronic Systems

Ap rov ed 2 Marc 2 14

Abstra t: A n ex chan e format is sp cified in t his st an ar d, u in ex t en ible mark p lan uage

(XML), for identifyin the test config ration u ed to test for an diag ose fault s of a u it u der t est

(UUT) on an automat ic t est s stem (AT )

K eyword : ATML in t an e doc men aut omat ic t est eq ipment ATE), Aut omat ic Test Mark p

L n uage (ATML), aut omat ic t est s stem (AT ), IEEE 16 1.4™, Mast er Config rat ion Cont rol

Doc ment (MCCD), Master Test Program Set In e (MTPSI), st at ion config rat ion fie, t est

config ration, XML s hema

?

Op nVMS is a re ist ere tra emark of Hewlett -Pac kard Dev elo me t Comp n , L.P

U IX is a re istered tra emark of Th Op n Gro p

W3C is a t ra emark or r egister ed t ra emark of t he W3C® , (re istere in n mero s cou trie ) World Wid We Co s rum Mark of W3C

are re istere a d h ld b it s h st in t itut io s: Ma s c u et t s In t it ute of Tec hn lo y (MIT), Euro e n Re e rc Co s rum for

Informat io a d Mat hemat ic s (ER IM), a d K eio Univ rsity, Ja a

Win ow s is a r egist ered t rad mark of Mic ros f Corp rat io

I?????nt roduct ion

Th is in trodu ct ion is n ot part o IE E St d 16 1.4™-2 14, IEE E St an d ard f r Au t omat ic Test Marku p L an g u a ge

(A TML ) Test Con fig u rat ion

This child, or “dot” sta nda rd, a lso known a s a a ut omatic t est ma rkup la n g uag e (ATML ) comp nent

sta nd a rd , prov id es for the d efinit io of the TestCo fi gurati on X ML schema a nd conta in s ref rences to a n

ex ample The X ML schema and ex ample tha t a ccomp n y t his sta nda rd prov id e for t he ident ifica t io of a ll

of the ha rdwa re, soft wa re, a n d d ocumenta t io t ha t is req uired to test a nd d ia g nose a u nit und er test (U U T)

o a n a utoma tic test system (ATS)

ATML’s XML schemas d efine t he ba sic infor ma tion req u ired wit hin an y test a pplca tio a nd prov id e a

vehicle for for ma lly d efinin the test environ ment b d efinin g a cla ss hiera rch y corresp nd ing to these

ba sic in for mat io ent it ies an d prov iding sev era l methods wit h in ea ch t o ena ble b sic o era t ions to be

performed o these ent i es ATML comp nen t stand a rd s with in t he ATML framework d efine t he

pa rt icula r req uirements wit hin t he test environ men

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inq uiries into the leg a l va lid ity or sco e of Pa tents Claims, or determining whet her an y lc nsin g ter ms or

cond itions prov id ed in conne tio wit h submis io of a Letter of Assurance, if a ny, or in a y lc n sin g

a g reements a re rea sona ble or non-discrimina t or y U sers of this stand a rd a re ex pres ly a dv ised tha t

d etermina t io of t he v a lid it y of an y pa t ent right s, a nd the risk of in frin g ement of such rig ht s, is entirely

their own resp n sibi t y Furt h er infor matio may be o ta ined from t he IE E St a nda rds Associa t ion

Standard for A ut omatic Test

IMPO RTANT NO TICE: IEEE Stan ards do ume nts are not inte nde d to e nsure safe ty , he alh, or

e nv ironme ntal prote ction, or e nsure against inte rfe renc w ith or from othe r de v ic e s or ne twork

Impleme nte rs ofIEEE Stan ards do ume nts are re s ponsible for de te rminin an c mply in w ith al

a pro riate s afe ty , s e curity , e nv ironme ntal, he alh, an inte rfe re nc prote c tion pra tice s an al

a plic ble laws an re gulation

This IEEE do ume nt is made av aila le for us e subje ct to imp rtant notic e s an le gal disc laime rs

The s e notice s an dis claime rs a pe ar in al public ations c ontainin this doc ume nt an ma

b fou d u de r the he adin “Imp rtant Notice ” or “Imp rtant Notice s an Dis c laime rs

Conc e rnin IEEE Do ume nts.” The y c an als o b o taine d on re que s t from IEEE or v iewe d at

htp:/ tan ard ie e e.org/IP /disc laime rs.html

1.1 General

A utomat ic t est ma r kup lan g u a g e (ATML) is a cole t io of IE E sta nda rd s a nd a ssocia t ed eXt ensible

ma rkup languag e (X ML ) schemas t ha t alow automa tic test system (ATS) a nd test infor ma tion to be

ex chan g ed in a common for ma t a dherin g t o the XML standard

1

The ATML framewor k a nd th e ATML family of stand a rds ha ve be n dev elo ed a nd a re ma inta ined und er

t he g uid ance of the Test In forma t io In t eg ra t io (TI) Subcommitt ee ofIE E Standa rd s Co rd ina t in

Committ ee 2 (SCC2 ) to serv e a s a comprehensiv e env iron ment for integ ra tin g d esig d a ta , test

stra t eg ies, test req uirements, t est proc d ures, test result s ma nag ement, and test system implementation s,

wh ile a llowin g test prog ram (TP), test a sset intero era bi t y, and u nit und er test (U UT) d a t a to be

interchan g ed bet we n heterogeneous systems

This sta nd a rd (a s wel a s the X ML schema a nd X ML in st a nce docu ment ex ample

2

t ha t a ccomp n y t his

sta nd a rd ) is intend ed to be used in d ocu menting t he test configura t io ut ilz d d urin g the testing of a

1

Th is in form a tio is g iv en for t h e con v en ien ce of u ser of t his st an da rd an d d oes n ot con st it ut e a n endorem en t b t h e IE E of t h is

con sort iu m st and a rd E qu iv a l en t sta nda rd s or pro u ct s m a y be u sed if they ca n be sh own t o l ea d t o t h e sa m e resu l t s

pa rticula r U U T This infor matio includ es in for ma tio rega rd ing the t ested U U T, the t est eq uipment, a nd

the t est prog ram set (TP )

1.2 Appl c tion of this doc ume t ’s annex es

This d ocu men t includ es t hree a nnex es

A n nex A, A nnex B, a nd An nex C a re in for ma tiv e, t hu s they a re prov ided strict ly a s infor ma t ion, for users,

implementer s, a nd ma inta iner s of this d ocu men

1.3 Scope

This stand a rd d efines a n ex ch a ng e for ma ut izing X ML , for id entifying al of t he ha rdw a re, soft wa re, a nd

docu men t a t io t ha t is need ed t o t est a nd d ia g nose a UUT o a n ATS

1.4 Appl c tion

This sta nd a rd prov id es for the id ent ifica t io of a ll ne es a r y a ssets req uired to test a pa rticula r U U T Assets

consist of, b t a re not imited to, test sta t ion s, instru men t a t ion, interfa ce ca bles, int erfa ce dev ic s, a nci a r y

eq uipment, test stat io soft ware, test prog ra m soft wa re, a nd test prog ram d ocu ment a tion This cole tio of

a ssets is t he test con fig ura t io for tha t pa rticula r U UT

Id entifying a t est configura tio prov id es for t he g enera tion of a sing le “d ocu ment” (a lso sometimes refrred

to a s a “ind ex ca rd ”) in which ev er y a sset t ha t is req uir ed to be in pla ce prior to testin g t he UU T is

record ed This docu ment is r ea d a ble b b th hu mans a nd ma chines; h u ma n s may use the d ocu ment to

identify a nd a ssemble t he nec s a r y a ssets, wh erea s the machine may use t he docu ment to v erify t ha t the

ne es a r y a ssets a re in pla ce

The infor ma tion conta ined in t he X ML docu ment s conformin g to t his sta nd a rd wil be use ul to the

folowin g :

a ) TP dev elo ers

b) TP ma inta iners

c) A utomatic test eq ipment (ATE) system d ev elo ers

d ) ATE system ma inta iners

e) Dev elo ers ofATML -b sed tools a nd systems

f) U U T d evelo ers a nd ma inta in ers

1.5 Conventions used within this doc me t

1.5.1 Ge eral

In a ccorda nce wit h IE E Sta dards Sty le Ma u l [B9] , a ny schema ex amples wil be shown in C u i r

fo t In cases wh ere instanc docu ment ex amples a re ne es ary t o clea rly depict t he use of a schema t ype or

element , such ex amples wil a lso be shown in C u i r font When t he cha ra cters “ ” a ppea r in a n

ex ample, i ind ica t es t ha t t he ex ample comp nent is incomplete

All simple t ypes, complex t ypes, a ttribute g roups, and elements wi be lsted Ex pla nat or y in for ma tio wil

be prov id ed a long wit h ex am ples if a d d itiona l cla rifica tion is need ed The ex pla na tor y in for ma tion wil

includ e in for ma tio o the int end ed use of t he element s a nd/or a tt ributes where t he name of t he ent ity d oes

not clea rly ind ica te it s intended use Only a t tributes t ha t extend the source t ype wil be lsted for elemen ts

deriv ed from a nother ource t ype (e.g , a n a bstra ct t ype) Det a ils reg a rdin g t he ba se t ype w il be lst ed a lon g

wit h t he ba se t ype

When ref rrin g a n a tt ribute of a n XML elemen t , the co v entio of [element]@ [atri bute ] wi be used In

ca ses where a att ribute name is refrred t o wit h no as ocia t ed element , t he att ribute name wil be enclosed

in sin g le q uotes Elemen t a nd t ype names wil a lways be set n ita lics when a ppea ring in tex t

This standa rd uses the v oca ula r y and d efinit ions of relev a nt IE E standa rd s In case of con flct of

d efinitons, ex cept for those p rtions q uoted from stand a rd s, the folowing prec d ence sha ll be o serv ed: 1)

Cla u se 3 a nd 2) The IE E Sta dards Di cti on ry O nli ne [B8]

1.5.2 Pre e e c

The TestCo fi gurati on schema ( TestCon fig ura tion.xsd ) elemen t, child elemen and a nnota tio in for mation

sha ll t ake prec dence ov er the d escriptiv e in for ma t io contained in Cla u se 4

1.5.3 W ord u a e

In a ccorda nce wit h the IE E Sta dards Sty le Ma u l [B9], t he word sh l is used to indica t e mand a t or y

req uiremen ts strict ly to be folowed in ord er to confor m to t he sta nd a rd a nd from wh ich no d ev ia tio is

permitted (h l equa ls i s r q i red to) The use oft he word must is used only to d escribe una v oid a ble

situat ions The u se of t he wor d w i ll is only u sed in sta t emen t s of fa ct

The word sh uld is u sed to ind ica te t ha t amon g sev eral p s ibi ties one is recommend ed a s pa rticula rly

suita ble, wit hou t mentionin g or ex clud ing ot hers ( h uld eq ua ls i s r commended th t

The word ma is used t o ind ica te a course of a ct io permis ible wit hin the lmit s of th e sta nda rd (ma

equa ls i s pe mitted to)

The word ca is used for t a temen ts of p s ibi t y and capa bi t y ( ca equa ls i s a le to)

2 Normative references

The folowing refrenced d ocu ment is ind ispensa ble for th e a pplca tio ofthis d ocu men t (i.e i must be

und ersto d a nd u sed, so ea ch refrenced docu ment is cit ed in tex t and it s rela t ionship t o this d ocu ment is

ex pla ined ) Only t he cited ed itio a pples

IE E Std 16 1

M

-2 10, IE E Sta nda rd for A utoma tic Test Eq uipment Ma rkup L an gua g e (ATML ) for

Ex chang in g A utomatic Test Eq uipment a nd Test Infor ma tio v ia X ML

4,5

3.1 Definitions

For the purposes of t his d ocu ment, the folowing ter ms a nd d efinitions a pply The IE E Sta dards

Di cti on ry O nli ne [B8] shou ld be consulted for ter ms not d efined in t his clause In the ev ent a ter m is

ex plcitly red efined , or defined in more deta il, in a ATML comp nent sta nd a rd , the component stand a rd s

d efinitio sha ll be nor ma tiv e for tha t ATML comp nent st a n d a rd

aut om at ic tes eq i pment ( ATE) An integ ra ted a ssem bly of stimulu s, mea surement , a nd switchin g

comp nents und er comp ter -control t ha t is ca pa ble of proc s ing soft wa re routines d esig n ed spe ifica lly to

test a pa rticula r item or g rou p of items ATE soft wa re includ es o era ting system soft w a re, test ex ecutiv e

soft wa re, a nd instr u ment con t rol soft wa re

7

aut om at ic t es sys em ( ATS) A fully -integ ra t ed , comput er-controled su ite of ele t ron ic test eq uipment

ha rdwa re, soft wa re, d ocu men ta tion, a nd a ci a r y items d esigned to v erify t he funct ionalt y of u nit und er

test (U U T) a ssembles a t a n y lev el of maintenance A n ATS combines t he folowin three element s: ATE,

TP , a nd the test en v iron ment

7

chi l d or “dot” san ard: An IE E sta nd a rd that is id en tified b a n u mber (e.g , 16 1), a d ot, then a

nu mber (e.g d ot 1 refrs to 16 1.1; d ot 2 ref rs to 16 1.2, etc.)

di gi tal ri ght m ana ement : Acc s control technolo ies t ha t may be utilz ed to imp se lmita tion s o t he

usag e of d ig ita l co tent materia l tha t were not forese n b t he content prov id er Within the contex t of

a utoma tic test ma r kup lan g uag e (ATML), t he dig ita l content ma teria ls a re the a ssocia ted X ML schemas

a nd t he content prov ider is IE E

eX tensi bl e Mark p Langua e ( XML) st yl e she t : A d escriptio of how a X ML docu ment is to be

presented o a computer creen or in print

syst em i denti f r: A refrence int end ed to id entify a elem ent of a n a utoma tic t est system (ATS) (e.g , t he

system id entifier DMM id ent ifies a d igit a l multi-meter in a n ATS)

4

IE E pu bl ict io ns a re a va ilabl e from th e In st itut e of Ele t rica l a nd El ect ron ics E n g in eer, 4 5 Hoes La n e, Pisca ta wa y, N J 08 5 ,

USA (h t t p:/ /st and a rd s.iee.org /)

5

Th e st an da r or pro u ct s re rred t o in th is cl a u se a re t rad em a rk s of t h e Inst itut e of El ect rica l a nd El ect ronics E n g in eer, In c

6

IE E Sta dards D i cti on r Online su bscripto is a v a il abl e a t :

h t :// ww w.ie e.org /port a l /inn ov a t e/prod u ct s t an dard/sta nd a rd s_dict io n a ry.h tm l

t es ex ecut iv e: A soft wa re a pplca t io wh ich controls t he ex ecut io environ ment of unit und er test (U U T)

prog ra ms Ty ica l fu nct ions includ e (but a re not lmited to), t he v erifica t io of ha rdwa re/soft wa re

av a ila bi t y, interpreta tio a nd ex ecutio of o era tors com ma nd s, t he initialza tio an d control of test s,

prov id ing common subprog ra ms for test soft wa re usag e, prov id in g d ebu g and simula t ion ca pa bi ties, t he

log g in g of test d a ta , a nd t he a lloca tio of v irt ua l resources

t es pro ram set (T S) a u toma t ic t est eq u ipment (ATE ), interfa ce ha rdwa re, test prog ram soft wa re,

docu men ta tio , a nd other a nci a r y eq uipment t ha t connects the u ni u nd er test (U UT) to the ATE The TP

soft wa re perfor ms fa ult isolatio a nd diag nostics, and ca n c rtify a UU T a s rea dy for is ue Anci a r y

ha rdwa re con sist s of probes, hold ing fixtures and pe ulia r in stru men ta tion

7

3.2 Acronyms a d a brev iations

AHA F a ir hose a tta ch ment fix t ure

A RB a rbitra ry wav efor m g enera tor

ATML A ut omatic Test Ma rkup La n gua g e

CFA cog nizant field a ctiv it y

F CM fd era l supply cod e for man ufa cturers

ITP/SW int ernal test prog ram soft wa re

MIM ma intenance instr ucto manu a l

MTP I ma ster test prog ram set nd ex

N AMP Na v a l Av ia tio Maintenance Prog ra m

OF /SW o era tiona l flght prog ram soft wa re

OTPH o era tiona l test prog ram ha rdwa re

OTPI o era tiona l test prog ram in str uctio

OTPM o era tiona l test prog ram media

SCC2 Sta nd a rd s Co rdina ting Committee 2

T CPU B techn ica l publcat ion

TI Test Infor ma tio Integ ra t io

Shou ld the rea d er not hav e a g enera l und erstand ing of X ML schema s, t here a re severa l X ML schema

tutoria ls av a ila ble for refrence The XML Schema Pa rt 0: Primer [B1 ], t he X ML Schema Tut oria l [B14],

a nd the X ML Schema Tutoria l, Pa rt 1 [B1 ] a re t hree tut oria ls a v a ila ble o t he World Wide Web These

tutoria ls wil help wit h the un d ersta nd in g of the contents of the TestConfigura tion xsd schema d efined in

Cla u se 4

In a d d itio to t he con v ention s spe ified in 1.5.1, the prefix “ :” represent s t ha t the element is d efined b t he

Common.x sd XML schema de ined in IEE Std 16 1-2 10

9

The IE E Std 16 1-2 10 schema is in herited

b t he TestCon fig ura t ion.xsd X ML schema

4.2 T est configuration.x sd

W3C is a t ra d em a rk or reg ist ered t rad em a rk of the W3C®, (eg ist ered in n u m erou s coun t ries Wor l d Wid e Web Con sort iu m Ma rk s

of W3C a re reg ist ered a nd h el d b it s h ost in st u tion s:Ma ssa ch u sett s In st itu t e of T ech n ol og (MI T), Eu ro ea n Resea rch Con sortium

for In form a t io an d Ma th em a tics (ER IM), an d Keio U n iv erit y, Ja pan

4.2.1 eleme t Te tConfigura on

c idre tc:Anci ary Eq ipme t tc:Ext en io tc:Fle t Su p rtTe mL c t io tc:Su pleme talDat a

t c :Te t Eq ipme tA ss ts tc:Te t Pro ram tc:T PSHardware tc:UnitUn erTe t

a n tat io

Te t Co fig ratio s h ma e c mp s e al informat io n c s ary t o id nt ify t he h rdware, s ft ware a d

d c me t atio t hat ma b n c s ary in ord r t o te t a d dia n s a Unit Un er Te t (U T) o a t est

stat io A giv en U T ma h v e mult iple Te t Co fig rat io XML in tan e d c me ts Th at t rib te

"c a g Numb r s o ld init ialy e 0, a d s o ld b in reme te b 1 e c t ime th XML in t an e

d c me t is c a g d,"c a g Date" s o ld refle t h d t e t he XML in ta c d c me t wa c a g d

Th “title” is e uiv ale t o t he USNav y Ma ter Te t Pro ram Set In e (MTPSI) d c n mb r le s th

v ersio n mb r,or t he t itle of t he U Ma ter Co fig ratio Co trol Do ume t (MC D), a d re re e t s

th t itle of t he Te tCo fig ratio XML in ta c d c me t

c idre tc:A nci ary HardwareIt em

eleme t Te t Co fig rat io /Anc ilary Eq ipme t

Id ntifie e c of th a ci ary ardware it ems (e.g a s ts) re uire t o t est t he U T Ea h a ci ary

h rdware item(e clu in co mmo to ls) s o ld in lu e a d s riptio , th q a tity , a d t he p rt n mb r

This s al b re e t ed for e c a ci ary ardware it em

4.2.3 eleme t An i aryHardwareAs et s/An i ary HardwareIt em

Id nt ifie a p rtic lar a ci ary h rdware it em (e.g a s t ) re uire to te t t he U T Th “p rt n mb r”

re re e t s t he P/ N of t he a s t, th “q a t ity ” s o ld in ic t e h w ma y f t he a s ts are re uire (th

d fa lt is 1 ,a d th “n me” s o ld b a d s riptiv e n me of t he a s t.This s al b re e t ed for e c

a ci ary ardware it em

4.2.4 complex Type AT As ets

c idre t c :Sy st emId nt ifier

Id ntifie a p rt ic lar AT E sy stem id ntifier (DMM, etc ) re re e t at iv e of th A TE st atio a s t Sy stem

id nt ifier a ro yms are t y pic ly niq e t o e c AT E,t hu e c system id nt ifier a ro yms o ld match

th t of th p rt ic lar AT E t hat wi b u e to te t h U T

4.2.6 complex Type AT Version

c idre tc:AT ECo fig rat io t c:A T EFamiy t c:MinimumCo fig rat io

eleme ts Co fig rat io Te t Pro ramEleme ts/ En ToEn R unTime /En ToEn R unTime/A TEV ersio

Co fig ratio Te tPro ramEleme t s/ A T EVersio s

Id ntifie th A T E v ersio s k nown t o ru th T PS

4.2.7 eleme t AT V ersion/AT Config ra on

4.2.8 eleme t AT V ersion/AT Fami y

eleme ts Co fig ratio U T leme t s/ SoftwarePro rams/Int ern lTe tPro ram

Co fig ratio U T leme t s/ SoftwarePro rams/ Op ratio alFlg tPro ram

Co fig rat io U T leme ts/ So ft warePro rams/Soft wareNumb r

Ba e t y pe for al Te tCo fig ratio s ft ware eleme t s

4.2.1 complex Type Config rationTe t ProgramEleme t s

tc:Ada t erR eq ire tc :AT ER unTimeSoftware t c:AT EV ersio s t c:En ToEn R unTime t c :Exte sio

tc:Op rat io alDat aNot e tc:Op rat io alTe tPro ram t c :R unTimeCla sific tio s

tc:Temp raryWork aro n Pro e ure t c:Te t Dia ram tc :Te tPro ramSoftware t c:Te tPro ramTy pe

tc:Fe eralSu ply Co e t c:Unit I e tific t io Co e

eleme t Te tCo fig rat io /Te tPro ram/T estPro ramEleme t s

Ba e t y pe for Te t Co fig ratio eleme t s relat ed t o t he te t pro ram s c a ru -time, s c rit y

cla sific t io ,wh t o erat io al s ftware th te t pro ram wi e e ute with, etc

4.2.12 eleme t Config rat ionTe t ProgramEleme ts/Ad pterR eq ire

Id ntifie if a intera e d v ic (ID) (als k nown a a a a t er or te t a a t er is re uire Th Bo le n

"als " in ic t es th t n a a t er is re uire Th Bo le n "tru " in ic ate th t a ID is re uire Sh uld

this eleme t n t b s e ifie , it s al b a s me t hat n ID is re uire

Th o eratin sy stem (OS) u e d rin th la t u d t e of th te t pro ram If more t ha o v ersio of

OS a ple (d e t o mult iple c nfig rat io s of stat io s e.g A T E V ersio 1,AT E V ersio 2),t ha al

a plc ble OS's ma b lste Ex mple are 'U IX

Th a plc tio s ftware pro ram a d v ersio u e d rin t he la t u d t e of th te t pro ram If more

t ha o e v ersio of a plc t io s ft ware a ple (d e t o mult iple c nfig rat io s of stat io s e.g AT

V ersio 1,AT E V ersio 2),t he al a plc ble a plc tio s ft ware pro rams ma b lste

Id nt ific t io of t he a plc t io s ft ware pro ram Ex mple are "VEC - -0 8" a d "L b Win ows"

Th time re uire for a e p rie c d o erator, b gin in at t he st art me u t o ru a U T to t he e d of

te tin (e.g t he RFI me s g a p ars) T PS direc t ed t est s t up t ime is t y pic ly in lu e ,b t t ear d wn

time t y pic ly is n t in lu e If t he ET E ru t ime is u k own,'U K ' s o ld b id nt ifie

Th e d-to-e d (ET E) ru time(s) If t he T PS c n b e e ut ed o more t ha o e A TE v ersio ,a ET E

ru t ime s o ld b in lu e for e c ATE v ersio

4.2.21 eleme t Config rationTe tProgramEleme ts/

Th A T E V ersio a so ciat ed with t his s ec ific e d-to-e d ru t ime

Th Exte sio t y pe s al b u e o ly s th b s t y pe of e te sio eleme t s in XML s h ma Su h

eleme t s are prov id d t o p rmit impleme t ers t o e t en a XML s h ma a re uire t o me t t he u iq e

n e s of t heir u e c s Us folows th W3C sta d rd XML e t en io me h nism

4.2.2 eleme t Config rationTe tProgramEleme ts/Operat ion lDataNote

Mis ela e u informatio a o t ru nin th T PS

Id ntific t io of t he o eratio al t est pro ram(OT P) in tru tio s a d me ia

4.2.2 eleme t Config rat ionTe t ProgramEleme t s/ Operation lTe t Program/ OT INumber

Th o erat io al te t pro ramme ia (OTPM) id ntific tio n mb r.

Eit her (U) Un la sifie ,(C) Co fid ntial (S) Se ret or (T S) To Se ret Sh uld this n t b id ntifie , it

s o ld b a s me t hat t he TPS is (U) Un la sifie

Th te h ic l work aro n pro e ure (TWP) n mb r,d s riptio a d is u d te of a y a t iv e TWP

a ain t t he TPS TWP's are n tific atio of a work aro n for a TPS e e ut io pro lem If th re are n

a t iv e TWP's for a p rt ic lar T PS, t his eleme t s o ld n t b in lu e

Th te t dia ramn mb r wh n t he t est dia ram is n t in lu e a p rt of t he t est pro ram in truc tio s

(TPI),or T PIrelate mat erial