IEC 61 671 5 Edition 1 0 201 6 04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test adapter description IE C 6 1 6 7 1 5 2 0 1 6 0 4 (e n ) IE E E S td 1 6 7 1 5 2 0 1 5 I[.]
Normative references
The referenced documents are essential for understanding and applying this document, as each one is cited within the text to clarify its relationship to the main content.
?? ?? ? explained) For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies
IEEE Std 1 671 ™, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML 4, 5
Definitions, acronyms, and abbreviations
Definitions
This document defines key terms relevant to its content, with the IEEE Standards Dictionary Online recommended for additional definitions In cases where a term is redefined in an ATML component standard, that definition takes precedence An abstract type is a declared type used to derive other types, with only non-abstract types allowed in instance documents, identified by the xsi:type attribute An automatic test markup language (ATML) instance document refers to an instance document An element is a bounded component of an XML document's logical structure, possessing a type, XML attributes, and content An entity is something with distinct existence, while an XML attribute is a name-value pair linked to an XML element An XML document is a data object that meets XML's well-formedness requirements, and it is valid if it adheres to the semantic rules of its XML schema An XML schema defines a class of XML documents, imposing constraints on their structure and content beyond basic syntax An instance document conforms to a specific XML schema, and an object comprises state and behavior, storing states in fields and exposing behavior through methods Lastly, a well-formed document adheres to all XML syntax rules.
4 IEEE publications are available from The Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http://standards.ieee.org/)
5 The standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc
6 IEEE Standards Dictionary Online subscription is available at: http://www.ieee.org/portal/innovate/products/standard/standards_dictionary.html
Acronyms and abbreviations
ATML automatic test markup language
DCLVA dc power supply low voltage type A
NC normally closed relay contact
NO normally open relay contact
UTF-8 8-bit Unicode transformation format
TestAdapterDescription Schema
General
The prefixes used in the IEEE Std 1671-2010 XML schemas denote the origin of elements: "c:" signifies elements defined by the Common.xsd schema, "hc:" indicates elements from the HardwareCommon.xsd schema, and "te:" represents elements from the TestEquipment.xsd schema.
Elements
The root element, also known as the document element, is unique as it does not appear in the content of any other element This root serves as the parent for all elements within the TestAdapterDescription schema.
The TestAdapterDescription schema’s root element is defined as follows:
Attribute form default Unqualified (see NOTE)
Element form default Qualified (see NOTE)
Imported schema urn:IEEE-1671 :2010:Common urn:IEEE-1671 :2010:HardwareCommon urn:IEEE-1671 :2010:TestEquipment Target namespace urn:IEEE-1671 5:2015:TestAdapterDescription
NOTE—Qualified and unqualified are described in A.3.7 of IEEE Std 1 671 7 a The namespace reference URL is: http://www.w3.org/2001 /XMLSchema
The TestAdapterDescription element shall be used to document the aspects of a family of test adapters
TestAdapterDescription element inherits the attributes from TestAdapterDesciption complex type (see 4.2.3)
TestAdapterDescription element inherits the child elements from TestAdapterDescription complex type (see 4.2.3)
7 Notes in text, tables, and figures are given for information only, and do not contain requirements needed to implement the standard
The test adapter description type will encompass all information necessary to identify all of the hardware, software, and documentation in a test adapter
Figure 1 illustrates the XML type inherited that comprises the TestAdapterDescription
Figure 1 —TestAdapterDescription complex type content
TestAdapterDescription contains the securityClassification, classified, name, version, and uuid attributes inherited from the hc:HardwareItemDescription complex type and the DocumentRootAttributes attribute group defined in Annex B of IEEE Std 1 671
TestAdapterDescription inherits the child elements of te:TestEquipment contained in Annex B of IEEE Std 1 671
Simple types
Schema—TestAdapterInstance.xsd
General
The prefixes used in the IEEE Std 1671-2010 XML schemas denote the origin of elements: "c:" signifies elements defined by the Common.xsd schema, "hc:" indicates elements from the HardwareCommon.xsd schema, and "te:" represents elements from the TestEquipment.xsd schema.
Elements
The root element, also known as the document element, is unique as it does not appear in any other element's content This root serves as the parent for all elements within the TestAdapterInstance schema.
The TestAdapterInstance schema’s root element is defined as follows:
Attribute form default Unqualified (see NOTE)
Element form default Qualified (see NOTE)
Imported schema urn:IEEE-1671 :2010:Common urn:IEEE-1671 :2010:HardwareCommon urn:IEEE-1671 :2010:TestEquipment
Target namespace urn:IEEE-1671 6:2015:TestAdapterInstance
NOTE—Qualified and unqualified are described in A.3.7 of IEEE Std 1 671 a The namespace reference URL is: http://www.w3.org/2001 /XMLSchema
The TestAdapterInstance element shall be used to document the aspects of a particular instance of a test adapter
TestAdapterInstance element inherits the attributes from TestAdapterInstance complex type (see 5.2.3)
TestAdapterInstance element inherits the child elements from TestAdapterInstance complex type (see 5.2.3)
The test adapter instance type will encompass all information necessary to identify all of the hardware, software, and documentation of that particular test adapter serial number
TestAdapterInstance inherits the securityClassification, classified, and uuid attributes inherited from the DocumentRootAttributes attribute group defined in Annex B of IEEE Std 1671
TestAdapterInstance inherits the child elements of te:TestEquipmentInstance contained in Annex B of IEEE Std 1 671
Simple types
ATML TestAdapterDescription XML schema names and locations
The IEEE offers a dedicated download website for materials related to its published standards, formatted for machine accessibility and subject to digital rights management restrictions This platform supports the ATML family of standards by providing easy access to all associated XML schemas and, in some instances, example XML instance documents The website features multiple folders, each labeled with a corresponding IEEE standard number, such as the IEEE 1671 series found in the 1671 folder Within these folders, users can find the relevant materials, including XML schemas, for each ATML family component standard, which are identified by their IEEE designations.
1 671 series dot standard number and the year in which that standard was published by IEEE
Revised standards will be organized in a folder corresponding to the year of their reissue, and both the original and revised folders for each publication year will be available on the IEEE download website.
Folders for a specific standard will only be accessible once the standard is published by IEEE, provided that there is associated material available for download on the website.
Figure 2 depicts a portion of the entire IEEE download website as it pertains to the Test Adapter Description ATML family standard
Figure 2 —ATML test adapter related IEEE download website structure
The Test Adapter ATML family component standard outlines the definitions of components, their corresponding XML schema names, and the folder name on the IEEE download website where the XML schemas can be accessed, as detailed in Table 1.
Table 1 —ATML family XML schema name and folder location
Component Defined in clause XML schema name IEEE download website folder (See Figure 2)
Test adapter description 4 TestAdapterDescription.xsd 1 671 5-201 5
Test adapter instance 5 TestAdapterInstance.xsd 1 671 5-201 5
The XML schema outlined in Table 2 features ATML common elements, such as the component definition, the corresponding XML schema names, and the folder name on the IEEE download website where the XML schemas can be accessed.
Table 2 —ATML common element XML schema name and location
IEEE Std 1671-2010 XML schema name IEEE download website folder (See Figure 2)
Hardware common Annex B.2 Hardware Common.xsd 1 671 -201 0
Test equipment Annex B.3 TestEquipment.xsd 1 671 -201 0 http:// standards ieee org / downloads/
An extension mechanism is essential for maintaining the viability of the specification, enabling producers and consumers of Test Adapter instance documents to exchange relevant data not covered by the associated XML schema This mechanism allows conformant consumers to utilize extended files without errors, enabling them to ignore or bypass the extended data while effectively using the non-extended portions as intended, ensuring no loss of functionality.
Extensions shall be additional information added to the content model of the element being extended
Extensions shall not repackage existing information entities that are already supported by the Test Adapter XML schema
An extended instance document must include the extension XML schema and comprehensive documentation that clarifies the purpose of the extension, along with the underlying semantics and its relationship to the base Test Adapter XML schema.
The ATML family of standards utilizes XML schemas that support three types of extensions: first, wildcard-based extensions enable the addition of new elements to the XML schemas; second, type derivation allows for the creation of new data types by deriving them from existing common element types; and third, lists derived from c:NamedValues facilitate user-defined properties with associated values.
This clause specifies the requirements that must be satisfied to claim conformance to this standard Conformance is defined for the following items: a) A TestAdapterDescription instance document b) A TestAdapterInstance instance document
Extensions to the TestAdapterDescription and TestAdapterInstance documents are allowed exclusively through the extensibility mechanism outlined in Clause 7 According to the W3C XML schema standard, any extended schema must adhere to the W3C XML schema specification and must not include any entities defined in the base schema.
8.1 Conformance of a TestAdapterDescription instance document
A document qualifies as a TestAdapterDescription instance if it meets specific criteria: it must be a well-formed XML document, have a root element designated as TestAdapterDescription, and its contents must adhere to the TestAdapterDescription XML schema, including any imported schemas.
The XML document must meet the criteria outlined in Clause 4, adhere to the specifications detailed in the annotations of the TestAdapterDescription XML schema, and comply with the requirements of any imported XML schemas Additionally, any extensions included must fulfill the conditions specified in Clause 7.
8.2 Conformance of a TestAdapterInstance instance document
A document qualifies as a TestAdapterInstance instance document if it meets several criteria: it must be a well-formed XML document with a root element designated as TestAdapterInstance Additionally, the document's contents must adhere to the TestAdapterInstance XML schema and any imported schemas, comply with the requirements outlined in Clause 5, and fulfill the stipulations in the annotations of both the TestAdapterInstance XML schema and any imported schemas Lastly, any extensions included must align with the requirements specified in Clause 7.
IEEE download website material associated with this document
This document provides essential supporting materials for the maintenance and development of the ATML framework and its associated standards, published by IEEE in a machine-readable format It includes digital rights management restricted content and utilizes a dedicated download website for easy access to XML schemas and related documents, such as examples and committee drafts For details on the IEEE download website and its structure related to the ATML standards, refer to Clause 6, with additional material outlined in Table A.1.
Table A.1 —IEEE download website contents
TestAdapterDescription.xsd The ATML Test Adapter Description schema defined in Clause 4 TestAdapterInstance.xsd The ATML Test Adapter Instance schema defined in
Readme.txt This file contains user information pertaining to the files posted, related files, and their usage
This example illustrates key elements of the interface test adapter hardware shown in Figure B.1, highlighting components that could be part of a general interface test adapter or a specific instance identified by its serial number.
B.1 2 Test adapter description XML instance document
The XML document P1671_5_TestAdapterExample.xml outlines essential components, including identification details such as manufacturer and part number, interface port definitions for both the test station and unit under test (UUT), and various interface connector types It also includes documentation like assembly drawings and schematics, physical characteristics, internal connections illustrated in Figure B.1, as well as definitions for the switch and terminal blocks within the interface test adapter (ITA).
The XML instance document 1671_5_TestAdapterExample.xml shall be available at: http://standards.ieee.org/ downloads/1671/1671.5-2015/
B.1 3 Test adapter instance XML instance document