IEC 61 671 6 Edition 1 0 201 6 04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test station description IE C 6 1 6 7 1 6 2 0 1 6 0 4 (e n ) IE E E S td 1 6 7 1 6 2 0 1 5 I[.]
Normative references
The referenced documents are essential for understanding and applying this document, as each one is cited within the text to clarify its relationship to the main content.
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IEEE Std 1 671 ™, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML 4,5
Definitions, acronyms, and abbreviations
Definitions
This document defines specific terms, with the IEEE Standards Dictionary Online serving as a reference for any undefined terms If a term is redefined in an ATML component standard, that definition will take precedence An "abstract type" refers to a declared type used to derive other types, with only non-abstract types being applicable in instance documents, identified by the xsi:type attribute Additionally, "automatic test information" encompasses all necessary details to describe a partial automatic test system, such as only rack 1 of the complete ATE.
The Automatic Test Markup Language (ATML) instance document is an XML document that adheres to a specific XML schema, ensuring it is well-formed and valid An XML element is a bounded component of this document, characterized by a type and potentially containing XML attributes and content An XML attribute is a name-value pair linked to an XML element, while an entity represents something with a distinct existence The XML schema defines a class of XML documents, imposing constraints on their structure and content beyond basic syntax rules In programming terms, an object comprises state and behavior, storing its state in fields and exposing behavior through methods Overall, a well-formed XML document complies with all syntax rules set forth by XML standards.
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5 The standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc
6 IEEE Standards Dictionary Online subscription is available at: http://www.ieee.org/portal/innovate/products/standard/standards_dictionary.html.
Acronyms and abbreviations
ATML Automatic Test Markup Language
DCLVA dc power supply low voltage type A
DMMHI digital multimeter high connection
DMMLO digital multimeter low connection
NC normally closed relay contact
NO normally open relay contact
UTF-8 8-bit Unicode transformation format
Schema—TestStationDescription.xsd
General
The prefixes used in the IEEE Std 1671-2010 XML schemas denote the origin of elements: "c:" signifies elements defined by the Common.xsd schema, "hc:" indicates elements from the HardwareCommon.xsd schema, and "te:" represents elements from the TestEquipment.xsd schema.
Elements
The root element, also known as the document element, is unique as it does not appear in any other element's content This root serves as the parent for all elements within the TestStationDescription schema.
The TestStationDescription schemas root element is defined as follows: 7
Attribute form default Unqualified (see NOTE)
Element form default Qualified (see NOTE)
Imported schema urn:IEEE-1671 :2010:Common urn:IEEE-1671 :2010:HardwareCommon urn:IEEE-1671 :2010:TestEquipment Target namespace urn:IEEE-1671 6:2015:TestStationDescription
NOTE—Qualified and unqualified are described in A.3.7 of IEEE Std 1 671 a The namespace reference URL is: http://www.w3.org/2001 /XMLSchema
The TestStationDescription element shall be used to document the aspects of a family of test stations
TestStationDescription element inherits the attributes from TestSationDesciption complex type (see 4.2.3)
7 Notes in text, tables and figures are given for information only, and do not contain requirements needed to implement the standard
TestStationDescription element inherits the child elements from TestStationDescription complex type (see 4.2.3).
Base type: Extension of te:TestEquipment
The test station description type will encompass all information necessary to identify all of the hardware, software, and documentation in a test station
Figure 1 illustrates the XML types inherited and the XML types (both simple and complex) that comprise the TestStationDescription
The subclauses referenced in Figure 1 identify where the definition of the element is located within this standard
TestStationDescription te:TestEquipment (Annex B of IEEE Std 1 671 )
Figure 1 —Test station description complex type content
TestStationDescription contains the securityClassification, classified, name, version and uuid attributes inherited from the te:TestEquipment complex type and the DocumentRootAttributes attribute group defined in Annex B of IEEE Std 1671
TestStationDescription contains the following child element in addition to those inherited from the te:TestEquipment complex type contained in Annex B of IEEE Std 1 671
Child elements
The TestStationDescription/Instruments child element shall identify each instrument within the test station
TestStationDescription/Instruments contains no attributes
TestStationDescription/Instruments contains the following child element:
Instrument InstrumentDescriptionReference A description of an instrument in a test station Optional 4.3.2 TestStationDescription/Instruments/Instrument
The TestStationDescription/Instruments/Instrument child element uniquely identifies a specific instrument within a test station This reference should only appear in the TestDescriptionDocument section, eliminating the need for instruments to be mentioned in the Components section.
TestStationDescription/Instruments/Instrument inherits the attributes from InstrumentDescriptionReference (see 4.4.1)
TestStationDescription/Instruments/Instrument inherits the child elements of InstrumentDescriptionReference (see 4.4.1 )
The TestStationDescription/Core child element must reference the base description of the Test Stations from which the test station is derived, as part of a family of testers It is important to note that specific items in the TestStationDescription can override equivalent descriptions defined in the Core reference.
TestStationDescription/Core contains no attributes
TestStationDescription/Core inherits the child elements of c:ItemDescriptionReference complex type contained in Annex B of IEEE Std 1 671.
Complex types
Base type: Extension of c:ItemDescriptionReference
The InstrumentDescriptionReference complex type shall identify details of a specific instrument and its location within a test station
InstrumentDescriptionReference Instrument contains the following attributes:
ID c:NonBlankString A descriptive or common name for the
Instrument Example: “DMM Number 1 ” Required 4.4.1 2 Child elements
InstrumentDescriptionReference contains the following child elements in addition to those inherited from the c:ItemDescriptionReference complex type contained in Annex B of IEEE Std 1 671
When present, the InstrumentDescriptionReference/PhysicalLocation child element shall identify where the instrument is physically located
InstrumentDescriptionReference/PhysicalLocation contains no attributes
InstrumentDescriptionReference/PhysicalLocation contains no child elements
When present, the InstrumentDescriptionReference/Address child element shall identify the address used to communicate with the instrument
InstrumentDescriptionReference/Address contains no attributes
InstrumentDescriptionReference/Address contains no child elements.
Schema—TestStationInstance.xsd 1 0
General .1 0
The prefixes used in the IEEE Std 1671-2010 XML schemas denote the origin of elements: "c:" signifies elements defined by the Common.xsd schema, "hc:" indicates elements from the HardwareCommon.xsd schema, and "te:" represents elements from the TestEquipment.xsd schema.
Elements .1 0
The root element, also known as the document element, is unique in that it does not appear in any other element's content This root serves as the parent for all elements within the TestStationInstance schema.
The TestStationInstance schema’s root element is defined as follows:
Name Set to Attribute form default Unqualified (see NOTE)
Element form default Qualified (see NOTE)
Imported schema urn:IEEE-1671 :2010:Common urn:IEEE-1671 :2010:HardwareCommon urn:IEEE-1671 :2010:TestEquipment Target namespace urn:IEEE-1671 6:2015:TestStationInstance
NOTE—Qualified and unqualified are described in A.3.7 of IEEE Std 1 671 a The namespace reference URL is: http://www.w3.org/2001 /XMLSchema
Base type: Extension of tsi:TestStationInstance
The TestStationInstance element shall be used to document the aspects of a particular instance of a test station
TestStationInstance element inherits the attributes from TestStationInstance complex type (see 5.2.3)
TestStationInstance element inherits the child elements from TestStationInstance complex type (see 5.2.3)
Base type: Extension of te:TestEquipmentInstance
The test station instance type will encompass all information necessary to identify all of the hardware, software, and documentation of that particular test station serial number
TestStationInstance inherits the securityClassification, classified, and uuid attributes from the DocumentRootAttributes attribute group defined in Annex B of IEEE Std 1671
TestStationInstance contains the following child element in addition to those inherited from the te:TestEquipmentInstance complex type contained in Annex B of IEEE Std 1 671
Child elements 1 2
When present, the TestStationInstance/Instruments child element shall identify all of the instruments within the test station
TestStationInstance/Instruments contains no attributes
TestStationInstance/Instruments contains the following child element:
When present, the TestStationInstance/Instruments/Instrument child element shall identify a specific instrument
TestStationInstance/Instruments/Instrument contains no attributes
TestStationInstance/Instruments/Instrument inherits the child elements of c:ItemInstanceReference contained in Annex B of IEEE Std 1 671.
Complex types 1 2 6 ATML TestStationDescription XML schema names and locations 1 4 7 ATML XML schema extensibility 1 5 8 Conformance .1 6
Base type: Extension of c:ItemInstanceReference
The InstrumentInstanceReference complex type shall identify details of a specific instrument instance The mandatory InstrumentDocumentReference/ID attribute shall match the Instrument/ID from the TestStationDescription description
InstrumentInstanceReference Instrument contains no attributes
InstrumentInstanceReference contains the following child elements in addition to those inherited from the c:ItemInstanceReference complex type contained in Annex B of IEEE Std 1671
When present, the InstrumentInstanceReference/PhysicalLocation child element shall identify where the instrument is physically located
InstrumentInstanceReference/PhysicalLocation contains no attributes
InstrumentInstanceReference/PhysicalLocation contains no child elements
When present, the InstrumentInstanceReference/Address child element shall identify the address used to communicate with the instrument
InstrumentInstanceReference/Address contains no attributes
InstrumentInstanceReference/Address contains no child elements
6 ATML TestStationDescription XML schema names and locations
The IEEE offers a dedicated download website for materials related to its published standards, formatted for machine accessibility and subject to digital rights management restrictions This platform supports the ATML family of standards by providing easy access to all associated XML schemas and, in some instances, example XML instance documents The website organizes content into folders labeled by their respective IEEE standards numbers, such as the IEEE 1671 series found in the 1671 folder Each folder contains relevant materials, including XML schemas, for the corresponding ATML family component standard, which is identified by its IEEE 1671 series dot standard number and the publication year.
NOTE 1 — Standards that are revised will contain a folder for the year in which the standard is reissued Both folders (for each year the standard was published) will be present on the IEEE download website
Folders for a specific standard will only be accessible once the standard is published by IEEE, assuming there is related material intended for distribution through the download website.
Figure 2 depicts a portion of the entire IEEE download website as it pertains to the Test Station Description ATML family standard
Figure 2 —ATML test station related IEEE download website structure
The Test Station ATML family component standard outlines the definitions of components, their corresponding XML schema names, and the folder name on the IEEE download website where these XML schemas can be accessed, as detailed in Table 1 For more information, visit the IEEE download site at http://standards.ieee.org/downloads/.
Table 1 —ATML family XML schema name and folder location
Component Defined in clause XML schema name IEEE download website folder (see Figure 2)
Test Station Description 4 TestStationDescription.xsd 1 671 6-2015
Test Station Instance 5 TestStationInstance.xsd 1 671 6-2015
The XML schema outlined in Table 2 features ATML common elements, such as the component definition, the corresponding XML schema name, and the folder name on the IEEE download website where the XML schemas can be accessed.
Table 2 —ATML common element XML schema name and location
IEEE Std 1671-2010 XML schema name IEEE download website folder (see Figure 2)
Hardware Common Annex B.2 Hardware Common.xsd 1 671 -201 0
Test Equipment Annex B.3 TestEquipment.xsd 1 671 -201 0
An extension mechanism is essential for maintaining the viability of the specification, enabling producers and consumers of Test Station instance documents to exchange relevant data not covered by the associated XML schema This mechanism ensures that conformant consumers can effectively utilize the extended files without errors, allowing them to ignore the extended data while still accessing the intended non-extended portions without any loss of functionality.
Extensions shall be additional information added to the content model of the element being extended
Extensions shall not repackage existing information entities that are already supported by the TestStation XML schema
An extended instance document must include the extension XML schema and comprehensive documentation that clarifies the necessity of the extension, along with its semantics and its connections to the base Test Station XML schema.
The ATML family of standards utilizes XML schemas that support three types of extensions: Wildcard-based extensions enable the addition of new elements to the XML schemas, type derivation allows for the creation of new data types from existing common element types, and lists derived from c:NamedValues facilitate user-defined properties with associated values.
This clause specifies the requirements that must be satisfied to claim conformance to this standard Conformance is defined for the following items: a) A TestStationDescription instance document b) A TestStationInstance instance document
Extensions to the TestStationDescription and TestStationInstance documents are allowed exclusively through the extensibility mechanism outlined in Clause 7 Any extended schema must adhere to the W3C XML schema standard and cannot define any entities that are part of the base schema.
Conformance of a TestStationDescription instance document 1 6
A document qualifies as a TestStationDescription instance if it meets several criteria: it must be a well-formed XML document with a root element of TestStationDescription, adhere to the TestStationDescription XML schema and any imported schemas, comply with the requirements outlined in Clause 4, and fulfill the stipulations in the annotations of the TestStationDescription XML schema and its imports Additionally, any extensions must align with the requirements specified in Clause 7.
Conformance of a TestStationInstance instance document 1 6
A document qualifies as a TestStationInstance instance document if it meets several criteria: it must be a well-formed XML document with a root element designated as TestStationInstance Additionally, the document's contents must adhere to the TestStationInstance XML schema and any associated imported schemas It should also comply with the requirements outlined in Clause 5 and the annotations of the TestStationInstance XML schema, including those from imported schemas Lastly, any extensions must fulfill the stipulations specified in Clause 7.
IEEE download website material associated with this document
This document provides essential supporting materials for the maintenance and development of the ATML framework and its associated standards, published by IEEE in a machine-readable format It includes digital rights management restricted content and utilizes a dedicated download website for easy access to XML schemas and related materials, such as examples and committee drafts For details on the IEEE download website and its structure related to the ATML standards, refer to Clause 6, with a description of the available materials found in Table A.1.
Table A.1 —IEEE download website contents
TestStationDescription.xsd The ATML Test Station Description schema defined in Clause 4
TestStationInstance.xsd The ATML Test Station Instance schema defined in Clause 5
Readme.txt This file contains user information pertaining to the files posted, related files, and their usage
Partial automatic test station 1 8
This example illustrates key components of Rack 10 from the Automatic Test Station hardware shown in Figure B.1 It highlights various test station elements that could be part of either a general automatic test station or a specific unit identified by its serial number.
B.1 2 Test Station Description XML instance document
The XML instance document P1671_6_TestStationExample provides comprehensive details about a test station, including its identification (manufacturer, part number, and contact information), interface port definitions (connectors and pins), and types of interface connectors It also outlines essential station documentation such as assembly drawings, schematics, test procedures, and development specifications, along with environmental requirements for operation and storage Additionally, the document specifies the physical characteristics of the station, including weight and dimensions, and illustrates internal connections It details the station controller's hardware definitions, including processor, memory, and storage, as well as the installed software, which encompasses the operating system, runtime system, compiler, and self-test programs Furthermore, it defines the S-Parameter path for the 'HiFreqCh1' connection between the RF Signal Generator and the RF_OUT_UUT01 port, includes specifications for the 7778 Timer Counter, and describes the switching and instrumentation within the rack, along with references to external Instrument Description Instance documents for each instrument.
The XML instance document 1671_6_TestStationExample.xml shall be available at: http://standards.ieee.org/downloads/1 671 /1671.6-201 5/
B.1 3 Test station instance XML instance document
The XML instance document P1671_6_TestStationInstanceExample.xml offers example elements for a specific instance of Rack 10 of the Automatic Test Station hardware, as illustrated in Figure B.1 While it does not serve as a complete specification, it includes essential details such as the reference to the description document for the applicable test station family, the serial number, the date of manufacture, the time of the last calibration, self-test information, station configuration, and references to instrument instance documents for each instrument within this station instance.
The XML instance document 1671_6_TestStationInstanceExample xml shall be available at: http://standards.ieee.org/downloads/1 671 /1671.6-201 5/.
This article defines key terms related to automatic testing standards An "adapter" is a device that ensures compatibility between the unit under test (UUT) and test equipment, potentially including necessary stimuli or loads "Automatic test equipment (ATE)" refers to a system that automates the testing of one or more UUTs, comprising a controller, test resource devices, and peripherals for information management The "automatic test system (ATS)" encompasses the ATE along with all supporting equipment, software, test programs (TP), and adapters A "framework" consists of classes tailored to meet specific application needs, while a "test program (TP)" is designed for testing a UUT The "test program set (TPS)" includes all hardware, software, and documentation required to evaluate a UUT on a specific test system Finally, the "unit under test (UUT)" is the entity being tested, which can vary from a simple component to an entire system.
Bibliographical references serve as supplementary resources that offer valuable information, though they are not essential for understanding or applying this standard These references are intended solely for informational purposes.
[B1 ] Extensible Markup Language (XML) 1 0 (Fifth Edition) World Wide Web Consortium Recommendation 26 November 2008 8
8 Available from the World Wide Web Consortium: http://www.w3.org/TR/2006/REC-xml-20060816
9 IEEE Standards Dictionary Online subscription is available at: http://www.ieee.org/portal/innovate/products/standard/standards/ /standards_dictionary.html.
1 0 Available from IEEE: http://standards.ieee.org/guides/style/2014_Style_Manual.pdf
1 3 Available from the World Wide Web: http://www.xfront.com/xml-schema.html
At the time this IEEE standard was completed, the P1 671 6 Working Group had the following membership:
The following members of the individual balloting committee voted on this standard Balloters may have voted for approval, disapproval, or abstention
Randall Groves Raymond Harbert Werner Hoelzl Noriyuki Ikeuchi Anand Jain Adam Ley Teresa Lopes Mukund Modi
Leslie Orlidge Bartien Sayogo Mike Seavey Joseph Stanco Walter Struppler March Stutzman Ronald Taylor Oren Yuen
When the IEEE-SA Standards Board approved this standard on 26 March 201 5, it had the following membership:
John D Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H Hulett, Past Chair Konstantinos Karachalios, Secretary
David J Law Hung Ling Andrew Myles
T W Olsen Glenn Parsons Ronald C Petersen Annette D Reilly
Stephen J Shellhammer Adrian P Stephens Yatin Trivedi Philip Winston Don Wright
Julie Alessi IEEE-SA Content Production and Management
Christy Bahn IEEE-SA Operational Program Management