Iec 61000 4 11 2017

21 Fig re C.1 – Sc ematic of test in trumentation f or voltage dips, s ort inter uption an voltage variation.. 2 Fig re C.2 – Sc ematic of test in trumentation for thre -phase voltage di

Elect romagnet ic compat ibi ity (EMC) –

Part 4- 11: T est ing and measurement t echniques – V olt age dips, short

int er upt ions and volt age variat ions immunity t est s

Compat ibi it é élect romagnét ique (CEM) –

Part ie 4- 11: Techniques d'essai et de mesure – Essais d'immunit é aux creux de

t ension, coupures brèves et variat ions de t ension

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p blc t io o si v ou av ez d s q e t io s c nt ac t ez-n u :

Elect romagnet ic compat ibi ity (EMC) –

Part 4- 11: T est ing and measurement t echniques – V olt age dips, short

int er upt ions and volt age variat ions immunity t est s

Compat ibi it é élect romagnét ique (CEM) –

Part ie 4- 11: Techniques d'e s i et de me ure – Ess is d'immunit é aux creux de

t ension, coupures brèves et variat ions de t ension

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inside

IEC 61 000- 4- 1 1

Editio 2.1 2 17-0

Elect romagnet ic compat ibi ity (EMC) –

Part 4- 11: T est ing and measurement t echniques – V olt age dips, short

int er upt ions and volt age variat ions immunity t est s

Compat ibi it é élect romagnét ique (CEM) –

Part ie 4- 11: Techniques d'essai et de mesure – Essais d'immunit é aux creux de

t ension, coupures brèves et variat ions de t ension

SC 7 A/Publ cation 610 0-4-1 (2 0 ), Secon edition/I-SH 01

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-1 : Te ting a d me s reme t te hnique –

Volta e dips, s ort inter uptions a d volta e v riations immunity te ts

INTERPRETA TION SHEET 1

This interpretation s e t has b en pre ared by s bcommite 7 A: L w f req en y

phenomena, of IEC tec nical commit e 7 : Electromag etic comp tibi ty

The text of this interpretation s e t is b sed on the f ol owin doc ments:

Ful information on the votin for the a proval of this interpretation s e t can b fou d in the

re ort on votin in icated in the a ove ta le

_ _ _ _ _ _

Interpretation of the ris - ime a d f al - ime re uireme ts d ring EUT te ting in IEC

610 0-4-1 :20 4: Ele troma n tic compatibi ity (EMC) – Part 4-1 : Te ting a d

me s reme t te hnique – Volta e dips, s ort inter uptions a d volta e v riations

immunity te ts

1) In IEC 610 0-4-1 :2 0 , Ta le 4 do s not a ply to EUT (eq ipment u der test testin

Ta le 4 is f or generator cal bration an desig only

2) With referen e to Ta le 1 an Ta le 2, there is no req irement in 610 0-4-1 :2 0 f or

rise-time an fal-time when testin EUT; theref ore, it is not neces ary to me s re these

p rameters d rin tests

3) With referen e to Ta le 4, al of the req irements a ply to desig an cal bration of the

generator The req irements of Ta le 4 only a ply when the lo d is a non-in u tive 10 Ω

resistor The req irements of Ta le 4 do not a ply d rin EUT testin

 IEC 2 17

FOREWORD 3

INTRODUCTION 5

1 Sco e 6

2 Normative referen es 6

3 Terms an def i ition 6

4 General 8

5 Test levels 8

6 Test in trumentation 12 7 Test set-up 14 8 Test proced res 15 9 Evaluation of test res lts 17 10 Test re ort 18 An ex A (normative) Test circ it detai s 19 An ex B (informative) Electromag etic en ironment clas es 2

An ex C (informative) Test in trumentation 2

An ex D (informative) Rationale for generator sp cif i ation regardin voltage, rise-time an f al -time, an inru h c r ent ca a i ty 2

Bibl ogra h 2

Fig re 1 – Voltage dip - Examples 1

Fig re 2 – Short inter uption 1

Fig re 3 – Voltage variation 12 Fig re 4 – Phase-to-neutral an phase-to-phase testin on thre -phase s stems 17 Fig re A.1 – Circ it f or determinin the inru h c r ent drive ca a i ty of the s ort inter uption generator 2

Fig re A.2 – Circ it f or determinin the p ak inru h c r ent req irement of an EUT 21

Fig re C.1 – Sc ematic of test in trumentation f or voltage dips, s ort inter uption an voltage variation 2

Fig re C.2 – Sc ematic of test in trumentation for thre -phase voltage dips, s ort inter uption an voltage variation u in p wer ampl fier 2

Ta le 1 – Prefer ed test level an d ration f or voltage dips 9

Ta le 2 – Prefer ed test level an d ration f or s ort inter uption 9

Ta le 3 – Timin of s ort-term s p ly voltage variation 10

Ta le 4 – Generator sp cification 13

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cif i atio s (P S) a d Guid s (h re f ter ref ere to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n

n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio for Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio f rom al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th form of re omme d tio s for intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eff orts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible for th wa in whic th y are u e or f or a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtif i atio b die pro id c nf ormity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtific tio b die

6) Al u ers s o lde s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s f or a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or f or c sts (in lu in le al f ee ) a d

e p n e arisin o t of th p blc tio , u e o or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ ref ere c s cite in this p blc tio Us of th ref ere c d p blc tio s is

in is e s ble f or th c re t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible for id ntif yin a y or al s c p te t rig ts

DISCLA IMER

This Consol d te v rsion is not a of f icial IEC Sta d rd a d ha be n prepare f or

us r con e ie c Only the c r e t v rsions of th sta dard a d its ame dme t(s) are

to be considere the off icial doc me ts

This Consol date v rsion of IEC 610 0-4-1 be rs the e ition number 2.1 It con ists of

the s con e ition (2 0 -0 ) [doc me ts 7 A /4 2/FDIS a d 7 A /4 5/RVD] a d its

interpretation s e t 1 (2 10-0 ), a d its ame dme t 1 (2 17-0 ) [doc me ts

7 A /9 1/FDIS a d 7 A /9 1/RVD] Th te h ic l conte t is ide tic l to the ba e e ition

a d its ame dme t

 IEC 2 17

In this Re l ne v rsion, a v rtic l l ne in the margin s ows where th te hnic l conte t is

modif ie by ame dme t 1 A ddition are in gre n te t, deletions are in strik through re

te t A s parate Fin l v rsion with al c a ge a c pte is a ai able in this publ c tion

International Stan ard IEC 610 0-4-1 has b en pre ared by s bcommite 7 A: L w

f eq en y phenomena, of IEC tec nical commite 7 : Electromag etic comp tibi ty

This secon edition con titutes a tec nical revision in whic

1) pref er ed test values an d ration have b en ad ed f or the dif ferent en ironment clas es;

2) the tests f or the thre -phase s stems have b en sp cif ied

It f orms p rt 4-1 of IEC 610 0 It has the statu of a Basic EMC Publ cation in ac ordan e

with IEC Guide 10

This publ cation has b en drafted in ac ordan e with the ISO/IEC Directives, Part 2

The commite has decided that the contents of the b se publ cation an its amen ment wi

remain u c an ed u ti the sta i ty date in icated on the IEC we site u der

"htp:/we store.iec.c " in the data related to the sp cif i publ cation At this date, the

IMPORTA NT – The 'colour insid ' logo on the cov r pa e of this publ c tion in ic te

that it contain colours whic are con idere to be u ef ul f or the cor e t understa ding

of its conte ts Us rs s ould th ref ore print this doc me t using a colour printer

 IEC 2 17

IEC 610 0 is publ s ed in se arate p rts ac ordin to the fol owin stru ture:

Part 1: Ge eral

General con ideration (introd ction, f un amental prin iples)

Def i ition , terminolog

Mitigation method an devices

Part 6: Ge eric sta dards

Part 9: Mis el a eous

Eac p rt is f urther s bdivided into several p rts, publs ed either as International Stan ard

or as tec nical sp cif i ation or tec nical re orts, some of whic have alre d b en publ s ed

as section Others wi b publs ed with the p rt n mb r folowed by a das an a secon

n mb r identif yin the s bdivision (example: 610 0-6-1)

This p rt of IEC 610 0 defines the immu ity test method an ran e of prefer ed test levels

for electrical an electronic eq ipment con ected to low-voltage p wer s p ly network for

voltage dips, s ort inter uption , an voltage variation

This stan ard a pl es to electrical an electronic eq ipment havin a rated input c r ent not

ex e din 16 A p r phase, f or con ection to 5 Hz or 6 Hz a.c network

It do s not a ply to electrical an electronic eq ipment f or con ection to 4 0 Hz a.c network

Tests for these network wi b covered by future IEC stan ard

The o ject of this stan ard is to esta ls a common referen e f or evaluatin the immu ity of

electrical an electronic eq ipment when s bjected to voltage dips, s ort inter uption an

voltage variation

NOT Volta e flu tu tio immu ity te ts are c v re b IEC 610 0-4- 4

The test method doc mented in this p rt of IEC 610 0 des rib s a con istent method to

as es the immu ity of eq ipment or a s stem again t a def i ed phenomenon As des rib d in

IEC Guide 10 , this is a b sic EMC publ cation f or u e by prod ct commite s of the IEC As

also stated in Guide 10 , the IEC prod ct commite s are resp n ible f or determinin whether

this immu ity test stan ard s ould b a pled or not, an , if a pl ed, they are resp n ible f or

definin the a pro riate test levels Tec nical commite 7 an its s b-commite s are

pre ared to co-o erate with prod ct commit e s in the evaluation of the value of p rtic lar

immu ity tests f or their prod cts

The fol owin referen ed doc ments are in isp n a le for the a plcation of this doc ment For

dated ref eren es, only the edition cited a ples For u dated referen es, the latest edition of

the referen ed doc ment (in lu in an amen ments) a pl es

IEC 610 0-2-8, Ele troma n tic c mp tibi ty (EMC) − P art 2-8: En iro me t − Voltag dips

a d sh rt interu tio s o p blc ele tric p wer su ply systems with statistic l me sureme t

results

3 Terms and def initions

For the purp se of this doc ment, the fol owin terms an definition a ply:

 IEC 2 17

3.1

ba ic EMC sta d rd

stan ard givin general an fu damental con ition or rules for the ac ievement of EMC,

whic are related or a plca le to al prod cts an s stems an serve as ref eren e doc ments

f or prod ct commite s

NOT As d termin d b th Ad is ry Commite o Ele troma n tic Comp tibi ty (A EC) – s e IEC Guid 10

3.2

immu ity (to a disturba c )

the a i ty of a device, eq ipment or s stem to p rorm without degradation in the presen e of

an electromag etic disturb n e

[IEV 161-01-2 ]

3.3

volta e dip

a s d en red ction of the voltage at a p rtic lar p int of an electricity s p ly s stem b low a

sp cif ied dip thres old f olowed by its recovery after a brief interval

NOT 1 Ty ic ly, a dip is a s ciate with th o c re c a d termin tio of a s ort circ it or oth r e treme

c re t in re s o th s stem or in talatio s c n e te to it

NOT 2 A v lta e dip is a two-dime sio al ele troma n tic disturb n e, th le el of whic is d termin d b b th

v lta e a d time (d ratio )

3.4

s ort inter uption

a s d en red ction of the voltage on al phases at a p rtic lar p int of an electric s p ly

s stem b low a sp cified inter uption thres old folowed by its restoration af ter a brief interval

NOT Sh rt interu tio s are ty ic ly a s ciate with switc g ar o eratio s relate to th o c re c a d

termin tio of s ort circ its o th s stem or o in talatio s c n e te to it

3.5

re idu l volta e (of volta e dip)

the minimum value of .m.s voltage recorded d rin a voltage dip or s ort inter uption

NOT Th re id al v lta e ma b e pre s d a a v lu in v lts or a a p rc nta e or p r u it v lu relativ to

method to prove that the me s rement eq ipment is in compl an e with its sp cif i ation

NOT For th p rp s s of this sta d rd, c lbratio is a ple to th te t g n rator

3.8

v rif ic tion

set of o eration whic is u ed to c ec the test eq ipment s stem (e.g the test generator

an the intercon ectin ca les) to demon trate that the test s stem is f un tionin within the

sp cif i ation given in Clau e 6

NOT 1 Th meth d u e for v rif i atio ma b diff ere t f rom th s u e for c lbratio

NOT 2 Th v rif i atio pro e ure of 6.1.2 is me nt a a g id to in ure th c re t o eratio of th te t

g n rator, a d oth r items ma in u th te t s t-u th t th inte d d wa eform is d lv re to th EUT

 IEC 2 17

Electrical an electronic eq ipment may b af fected by voltage dips, s ort inter uption or

voltage variation of p wer s p ly

Voltage dips an s ort inter uption are cau ed by faults in the network, primari y s ort circ its

(se also IEC 610 0-2-8), in in tal ation or by s d en large c an es of lo d In certain cases,

two or more con ec tive dips or inter uption may oc ur Voltage variation are cau ed by

contin ou ly varyin lo d con ected to the network

These phenomena are ran om in nature an can b minimal y c aracterized for the purp se of

la oratory simulation in terms of the deviation f rom the rated voltage an d ration

Con eq ently, diferent typ s of tests are sp cified in this stan ard to simulate the efects of

a rupt voltage c an e These tests are to b u ed only for p rtic lar an ju tified cases,

u der the resp n ibi ty of prod ct sp cification or prod ct commite s

It is the resp n ibi ty of the prod ct commit e s to esta l s whic phenomena amon the

ones con idered in this stan ard are relevant an to decide on the a pl ca i ty of the test

5 Test levels

The voltages in this stan ard u e the rated voltage for the eq ipment (U

T) as a b sis for

voltage test level sp cification

Where the eq ipment has a rated voltage ran e the f olowin s al a ply:

− if the voltage ran e do s not ex e d 2 % of the lower voltage sp cif ied f or the rated

voltage ran e, a sin le voltage within that ran e may b sp cif ied as a b sis for test level

sp cif i ation (U

T);

− in al other cases, the test proced re s al b a pl ed for b th the lowest an hig est

voltages declared in the voltage ran e;

− g idan e for the selection of test levels an d ration is given in IEC 610 0-2-8

5.1 Volta e dips a d s ort inter uption

The c an e b twe n U

T

an the c an ed voltage is a rupt The ste can start an sto at an

phase an le on the main voltage The f olowin test voltage levels (in % U

T) are u ed: 0 %,

4 %, 7 % an 8 %, cor esp n in to dips with resid al voltages of 0 %, 4 %, 7 % an

The pref er ed test levels an d ration given in Ta les 1 an 2 take into ac ou t the

inf ormation given in IEC 610 0-2-8

The pref er ed test levels in Ta le 1 are re sona ly severe, an are re resentative of man re l

world dips, but are not inten ed to g arante immu ity to al voltage dips More severe dips, for

example 0 % f or 1 s an b lan ed thre -phase dips, may b con idered by prod ct

commite s

 IEC 2 17

The voltage rise time, t

, an voltage f al time, t, d rin a rupt c an es are in icated in

Ta le 4

The levels an d ration s al b given in the prod ct sp cification A test level of 0 %

cor esp n s to a total s p ly voltage inter uption In practice, a test voltage level f om 0 % to

2 % of the rated voltage may b con idered as a total inter uption

Shorter d ration in the ta le, in p rtic lar the half c cle, s ould b tested to b s re that the

eq ipment u der test (EUT) o erates within the p r orman e l mits sp cif ied for it

When setin p rf orman e criteria for disturb n es of 0,5 p riod d ration f or prod cts with a

main tran f ormer, prod ct commite s s ould p y p rtic lar at ention to eff ects whic may

res lt f rom inru h c r ents For s c prod cts, these may re c 10 to 4 times the rated

c r ent b cau e of mag etic flu saturation of the tran former core af ter the voltage dip

Table 1 – Pref er e te t le el a d d rations f or volta e dips

Cla s

a

Te t level an d ratio s f or v ltage dips (

s) (5 Hz/6 Hz)

 IEC 2 17

5.2 Volta e v riations (optional)

This test con iders a defined tran ition b twe n rated voltage U

T

an the c an ed voltage

NOT Th v lta e c a g ta e pla e o er a s ort p rio , a d ma o c r d e to c a g of lo d

The prefer ed d ration of the voltage c an es an the time f or whic the red ced voltages are

to b maintained are given in Ta le 3 The rate of c an e s ould b con tant; however, the

voltage may b ste p d The ste s s ould b p sitioned at zero cros in s, an s ould b no

larger than 10 % of U

T Ste s u der 1 % of U

Tare con idered as con tant rates of c an e of

voltage

Table 3 – Timing of s ort term s pply volta e v riations

Voltage te t level Time f or de re sin

v ltage (

d)

Time at red c d

v ltage(

s)

Time f or incre sin

v ltage (

i) (5 Hz/6 Hz)

Xa

Xa

a

To b d f i e b pro u t c mmite

b

"2 /3 c cle " me n "2 c cle for 5 Hz te t" a d "3 c cle for 6 Hz te t"

This s a e is the typical s a e of a motor startin

Fig re 3 s ows the r.m.s voltage as a fu ction of time Other values may b taken in ju tified

cases an s al b sp cified by the prod ct commite

U

t (p rio s)

IEC 2 70/0

NOT Th v lta e d cre s s to 7 % f or 2 p rio s Ste at z ro cro sin

Figure 1a) – Volta e dip – 7 % volta e dip sin wa e graph

The fol owin f eatures are common to the generator f or voltage dips, s ort inter uption an

voltage variation , ex e t as in icated

Examples of generators are given in An ex C

The generator s al have provision to prevent the emis ion of he v disturb n es, whic , if

injected in the p wer s p ly network, may influen e the test res lts

An generator cre tin a voltage dip of eq al or more severe c aracteristic (ampl tu e an

d ration) than that pres rib d by the present stan ard is p rmit ed

 IEC 2 17

6.1.1 Ch ra teristic a d perf orma c of the g nerator

Table 4 – Ge erator spe if ic tion

v lta e f or a d ratio of 3 s (This re uireme t ma b

re u e a c rdin to th EUT rate ste d -state s p ly

f), s e Fig re 1b)

a d 2, d rin a ru t c a g ,g n rator lo d d with

Zero cro sin c ntrol of th g n rators ±10°

Output imp dan e s al b predominantly resistive

The output imp dan e of the test voltage generator s al b low even d rin tran ition (for

example, les than 0,4 + j0,2 Ω)

NOT 1 Th 10 Ω re istiv lo d u e to te t th g n rator s o ld n t h v a ditio al in u tivity

NOT 2 To te t e uipme t whic re e erate e erg , a e tern l re istor c n e te in p ralel to th lo d c n b

a d d Th te t re ult mu t n t b influ n e b this lo d

6.1.2 Verif ic tion of the c ara teristic of the volta e dips, s ort inter uptions

ge erators

In order to comp re the test res lts o tained f om diferent test generators, the generator

c aracteristic s al b verified ac ordin to the fol owin :

– the 10 %, 8 %, 7 % an 4 % r.m.s output voltages of the generator s al conf orm to

those p rcentages of the selected o eratin voltage: 2 0 V, 12 V, etc

– the 10 %, 8 %, 7 % an 4 % r.m.s output voltages of the generator s al b me s red

at no lo d, an s al b maintained within a sp cif ied p rcentage of the U

T

;

– lo d reg lation s al b verified at nominal lo d c r ent at e c of the output voltages an

the variation s al not ex e d 5 % of the nominal p wer s p ly voltage at 10 %, 8 %,

7 % an 4 % of the nominal p wer s p ly voltage

 IEC 2 17

For output voltage of 8 % of the nominal value, the a ove req irements ne d only b verif ied

for a maximum of 5 s d ration

For output voltages of 7 % an 4 % of the nominal value, the a ove req irements ne d only

b verif ied for a maximum of 3 s d ration

If it is neces ary to verify the p ak inru h drive c r ent ca a i ty, the generator s al b

switc ed f rom 0 % to 10 % of f ul output, when drivin a lo d con istin of a s ita le rectifier

with an u c arged ca acitor whose value is 1 7 0 µ on the d.c side The test s al b car ied

out at phase an les of b th 9 ° an 2 0° The circ it req ired to me s re generator inru h

c r ent drive ca a i ty is given in Fig re A.1

When it is b leved that a generator with les than the sp cified stan ard generator p ak

inru h c r ent may b u ed b cau e the EUT may draw les than the sp cif ied stan ard

generator p ak inru h c r ent (e.g 5 0 A for 2 0 V-2 0 V main ), this s al f irst b confirmed

by me s rin the EUT p ak inru h c r ent When p wer is a pled f om the test generator,

me s red EUT p ak inru h c r ent s al b les than 7 % of the p ak c r ent drive ca a i ty

of the generator, as alre d verif ied ac ordin to An ex A The actual EUT inru h c r ent s al

b me s red b th f om a cold start an af ter a 5 s turn-off , u in the proced re of Clau e A.3

Generator switc in c aracteristic s al b me s red with a 10 Ω lo d of s ita le p wer

dis ip tion ratin

NOT Th 10 Ω re istiv lo d u e to te t th g n rator s o ld n t h v a ditio al in u tivity

Rise an f al time, as wel as overs o t an u ders o t, s al b verified for switc in at b th

9 ° an 2 0°, f rom 0 % to 10 %, 10 % to 8 %, 10 % to 7 %, 10 % to 4 %, an 10 % to

0 %

Phase an le ac urac s al b verified for switc in f om 0 % to 10 % an 10 % to 0 %, at

nine phase an les f om 0° to 3 0° in 4 ° in rements It s al also b verified for switc in

10 % to 4 % an 4 % to 10 %, at 9 ° an 18 °

The voltage generators s al , pref era ly, b recalbrated at defined time p riod in ac ordan e

with a recog ized q al ty as uran e s stem

6.2 Power sourc

The f eq en y of the test voltage s al b within ± 2% of rated f eq en y

7 Test set up

The test s al b p r ormed with the EUT con ected to the test generator with the s ortest

p wer s p ly ca le as sp cif ied by the EUT man facturer If no ca le len th is sp cified, it

s al b the s ortest p s ible len th s ita le to the a plcation of the EUT

The test set-ups for the thre types of phenomena des rib d in this stan ard are:

– voltage dips;

– s ort inter uption ;

– voltage variation with grad al tran ition b twe n the rated voltage an the c an ed

voltage (o tion)

Examples of test set-ups are given in An ex C

 IEC 2 17

Fig re C.1a) s ows a s hematic for the generation of voltage dips, s ort inter uption an

voltage variation with grad al tran ition b twe n rated an c an ed voltage u in a

generator with internal switc in , an Fig re C.1b) u in a generator an a power ampl fier

Fig re C.2 s ows a s hematic for the generation of voltage dips, s ort inter uption an

voltage variation u in a generator an a p wer ampl fier for thre -phase eq ipment

8 Test procedures

Bef ore startin the test of a given EUT, a test plan s al b pre ared

The test plan s ould b re resentative of the way the s stem is actualy u ed

Sy tems may req ire a precise pre-analy is to define whic s stem con g ration mu t b

tested to re rod ce field situation

Test cases mu t b explained an in icated in the Test re ort

It is recommen ed that the test plan in lu e the folowin items:

– the typ desig ation of the EUT;

– information on p s ible con ection (plu s, terminals, etc.) an cor esp n in ca les, an

p ripherals;

– input p wer p rt of eq ipment to b tested;

– re resentative o erational modes of the EUT for the test;

– p rf orman e criteria u ed an def i ed in the tec nical sp cif i ation ;

– o erational mode(s) of eq ipment;

– des ription of the test set-up

If the actual o eratin sig al sources are not avaia le to the EUT, they may b simulated

For e c test, an degradation of p rf orman e s al b recorded The monitorin eq ipment

s ould b ca a le of displayin the statu of the o erational mode of the EUT d rin an after

the tests Af ter e c group of tests, a ful fu ctional c ec s al b p rf ormed

8.1 Lab ratory ref ere c conditions

8.1.1 Cl matic conditions

Unles otherwise sp cif ied by the commite resp n ible for the generic or prod ct stan ard,

the cl matic con ition in the la oratory s al b within an lmits sp cif ied f or the o eration of

the EUT an the test eq ipment by their resp ctive man facturers

Tests s al not b p rf ormed if the relative h midity is so hig as to cau e con en ation on the

EUT or the test eq ipment

NOT Wh re it is c n id re th t th re is s f ficie t e id n e to d mo strate th t th ef fe ts of th p e ome o

c v re b this sta d rd are in u n e b clmatic c n itio s, this s o ld b bro g t to th ate tio of th

c mmite re p n ible f or this sta d rd

8.1.2 Ele troma netic conditions

The electromag etic con ition of the la oratory s al b s c as to g arante the cor ect

o eration of the EUT in order not to in uen e the test res lts

 IEC 2 17

8.2 Ex c tion of th te t

Durin the tests, the main voltage for testin s al b monitored within an ac urac of 2 %

8.2.1 Volta e dips a d s ort inter uptions

The EUT s al b tested f or e c selected combination of test level an d ration with a

seq en e of thre dips/inter uption with intervals of 10 s minimum (b twe n e c test event

Eac re resentative mode of o eration s al b tested

For voltage dips, c an es in s p ly voltage s al oc ur at zero cros in s of the voltage, an at

ad itional an les con idered critical by prod ct commite s or in ivid al prod ct sp cification

pref era ly selected f rom 4 °, 9 °, 13 °, 18 °, 2 5°, 2 0° an 315° on e c phase

For s ort inter uption , the an le s al b def i ed by the prod ct commit e as the worst case

In the a sen e of def i ition, it is recommen ed to u e 0° f or one of the phases

For the s ort inter uption test of thre -phase s stems, al the thre phases s al b

simultane u ly tested as p r 5.1

For the voltage dips test of sin le-phase s stems, the voltage s al b tested as p r 5.1 This

impl es one series of tests

For the voltage dips test of thre -phase s stems with neutral, e c in ivid al voltage (ph

ase-to-neutral an phase-to-phase) s al b tested, one at a time, as p r 5.1 This impl es six

dif ferent series of tests Se Fig re 4 )

For the voltage dips test of thre -phase s stems without neutral, e c phase-to-phase voltage

s al b tested, one at a time, as p r 5.1 This imples thre diff erent series of tests Se

NOT Ph s -to-n utral te tin o thre -p a e s stems is p rorme o e p a e at a time.

Figure 4 ) – Pha e- o-ne tral te tin on thre -ph s s stems

IEC 275/04

NOT Ph s -to-p a e te tin o thre -p a e p a e s stems is als p rf orme o e p a e at a time Both (A) a d

(B) s ow a 7 % dip (A) is prefere , b t (B) is als a c pta le

Fig re 4b) – Ph s - o-pha e te ting on thre -pha e s stems

Fig re 4 – Pha e- o-ne tral a d pha e- o-pha e te ting on thre -pha e s stems

8.2.2 Volta e v riations (optional)

The EUT is tested to e c of the sp cified voltage variation , thre times at 10 s interval for

the most re resentative modes of o eration

9 Ev luation of test results

The test res lts s al b clas ified in terms of the los of fu ction or degradation of

p rorman e of the eq ipment u der test, relative to a p rorman e level defined by its

man facturer or the req estor of the test, or agre d b twe n the man f acturer an the

purc aser of the prod ct The recommen ed clas if i ation is as f ol ows:

a) normal p rf orman e within l mits sp cif ied by the man facturer, req estor or purc aser;

b) temp rary los of fu ction or degradation of p rf orman e whic ce ses af ter the

disturb n e ce ses, an fom whic the eq ipment u der test recovers its normal

p rf orman e, without o erator intervention;

c) temp rary los of f un tion or degradation of p rf orman e, the cor ection of whic req ires

o erator intervention;

d) los of f un tion or degradation of p rorman e whic is not recovera le, owin to damage

to hardware or software, or los of data

The man facturer's sp cification may define eff ects on the EUT whic may b con idered

in ig if i ant, an theref ore ac e ta le

This clas if i ation may b u ed as a g ide in formulatin p rf orman e criteria, by commit e s

resp n ible f or generic, prod ct an prod ct-f amiy stan ard , or as a f ramework for the

 IEC 2 17

agre ment on p rorman e criteria b twe n the man facturer an the purc aser, for example

where no s ita le generic, prod ct or prod ct-ami y stan ard exists

NOT Th p rorma c le els ma b diff ere t for v lta e dip te ts a d s ort interu tio te ts a wel a f or

v lta e v riatio s te ts, if this o tio al te t h s b e re uire

10 Test report

The test re ort s al contain al the information neces ary to re rod ce the test In p rtic lar,

the f ol owin s al b recorded:

– the items sp cified in the test plan req ired by Clau e 8;

– identif i ation of the EUT an an as ociated eq ipment, e.g bran name, prod ct typ ,

serial n mb r;

– identif i ation of the test eq ipment, e.g bran name, prod ct typ , serial n mb r;

– an sp cial en ironmental con ition in whic the test was p rf ormed, for example s ielded

en los re;

– an sp cific con ition neces ary to ena le the test to b p rf ormed;

– p r orman e level defined by the man f acturer, req estor or purc aser;

– p r orman e criterion sp cif ied in the generic, prod ct or prod ct- ami y stan ard;

– an eff ects on the EUT o served d rin or af ter the a plcation of the test disturb n e, an

the d ration for whic these ef fects p rsist;

– the rationale for the p s / fai decision (b sed on the p rf orman e criterion sp cified in the

generic, prod ct or prod ct-f amiy stan ard, or agre d b twe n the man f acturer an the

purc aser);

– an sp cific con ition of u e, f or example ca le len th or typ , s ieldin or grou din , or

EUT o eratin con ition , whic are req ired to ac ieve complan e

 IEC 2 17

A nnex A

(normative)

Test circuit detai s

A.1 Test generator pe k inrush cur ent driv capabi ity

The circ it for me s rin generator p ak inru h c r ent drive ca a i ty is s own in Fig re A.1

Use of the brid e rectifier makes it u neces ary to c an e rectifier p larity for tests at 2 0°

vers s 9 ° The rectifier half c cle main c r ent ratin s ould b at le st twice the generator's

inru h c r ent drive ca a i ty to provide a s ita le o eratin safety factor

The 1 7 0 µF electrolytic ca acitor s al have a toleran e of ± 0 % It s al have a voltage

ratin pref era ly 15 % – 2 % in ex es of the nominal p ak voltage of the main , for example

4 0 V for 2 0 V – 2 0 V main It s al also b a le to ac ommodate p ak inru h c r ent up to

at le st twice the generator's inru h c r ent drive ca a i ty, to provide an adeq ate o eratin

safety f actor The ca acitor s al have the lowest p s ible eq ivalent series resistan e (ESR)

at b th 10 Hz an 2 kHz, not ex e din 0,1 Ω at either f req en y

Sin e the test s al b p rf ormed with the 1 7 0 µF ca acitor dis harged, a resistor s al b

con ected in p ral el with it an several time con tants (RC) mu t b alowed b twe n tests

With a 10 0 0 Ω resistor, the RC time con tant is 17 s, so that a wait of 1,5 min to 2 min

s ould b u ed b twe n inru h drive ca a i ty tests Resistors as low as 10 Ω may b u ed

when s orter wait times are desired

The c r ent pro e s al b a le to ac ommodate the f ul generator p ak inru h c r ent drive f or

one-q arter c cle without saturation

Tests s al b ru by switc in the generator output fom 0 % to 10 % at b th 9 ° an 2 0°,

to en ure s f ficient p ak inru h c r ent drive ca a i ty for b th p larities

A.2 Cur ent monitor's characteristics f or me suring pe k inrush cur ent

 IEC 2 17

A.3 EUT pe k inrush cur ent requirement

When a generator p ak inru h c r ent drive ca a i ty me ts the sp cified req irement (e.g at

le st 5 0 A for a 2 0 V – 2 0 V main ), it is not neces ary to me s re the EUT p ak inru h

c r ent req irement

However, a generator with les than this inru h c r ent may b u ed f or the test, if the inru h

req irement of the EUT is les than the inru h drive ca a i ty of the generator The circ it of

Fig re A.2 s ows an example of how to me s re the p ak inru h c r ent of an EUT to

determine if it is les than the inru h drive ca a i ty of a low-inru h drive ca a i ty generator

The circ it u es the same c r ent tran f ormer as the circ it of Fig re A.1 F ur p ak inru h

c r ent tests are p rf ormed:

In order to b a le to u e a low-inru h drive c r ent ca a i ty generator to test a p rtic lar

EUT, that EUT's me s red inru h c r ent s al b les than 7 % of the me s red inru h

c r ent drive ca a i ty of the generator

To o ci o c p

R+

C

T

BVolt ag

G v lta e interu t g n rator, switc e o at 9 ° a d 2 0°

T c re t pro e, with mo itorin o tp t to o ci o c p

B re tif i r brid e

R ble d r re istor, n t o er 10 0 0 Ω or le s th n 10 Ω

C 1 7 0 µF ± 2 % ele trolytic c p citor

Fig re A 1 – Circ it f or d terminin the inrus c r e t driv c pabi ity of

the s ort inter uptions ge erator

 IEC 2 17

To o ci o c p

T

EUTVolta e

 IEC 2 17

A nnex B

(inf or mativ )

Electromagnetic environment classes

B.1 Electromagnetic environment classes

The f ol owin clas es of electromag etic en ironment clas es have b en s mmarised f rom

IEC 610 0-2-4

• Cla s 1

This clas a pl es to protected s p les an has comp tibi ty levels lower than publ c network

levels It relates to the u e of eq ipment very sen itive to disturb n es in the p wer s p ly, f or

in tan e the in trumentation of tec nological la oratories, some automation an protection

eq ipment, some computers, etc

NOT Cla s 1 e viro me ts n rmaly c ntain e uipme t whic re uire prote tio b s c a p ratu a

u interu tible p wer s p le (U S),fiters, or s rg s p re s rs

• Cla s 2

This clas a ples to p ints of common coupl n (PCC’s for con umer s stems) an in-plant

p ints of common coupl n (IPC’s) in the in u trial en ironment in general The comp tibi ty

levels in this clas are identical to those of publc network ; therefore comp nents desig ed f or

a plcation in publc network may b u ed in this clas of in u trial en ironment

• Cla s 3

This clas a ples only to IPC’s in in u trial en ironments It has hig er comp tibi ty levels

than those of clas 2 f or some disturb n e phenomena F r in tan e, this clas s ould b

con idered when an of the folowin con ition are met:

– a major p rt of the lo d is f ed throu h con erters;

– weldin mac ines are present;

– large motors are f req ently started;

– lo d vary ra idly

NOT 1 Th s p ly to hig ly disturbin lo d , s c a arc-urn c s a d larg c n erters whic are g n raly

s p le f rom a s gre ate b s-b r, fe u ntly h s disturb n e le els in e c s of cla s 3 (h rs e viro me t) In

s c s e ial situ tio s, th c mp tibi ty le els s o ld b a re d u o

NOT 2 Th cla s a plc ble f or n w pla ts a d e te sio s of e istin pla ts s o ld relate to th ty e of

e uipme t a d pro e s u d r c n id ratio

 IEC 2 17

A nnex C

(inf or mativ )

Test instrumentation

C.1 Examples of ge erators and test set ups

Fig res C.1a) an C.1b) s ow two p s ible test config ration for main s p ly simulation

To s ow the b haviour of the EUT u der certain con ition , inter uption an voltage

variation are simulated by me n of two tran formers with varia le output voltages

Voltage dro s, rises an inter uption are simulated by alternately closin switc 1 an

switc 2 These two switc es are never closed at the same time an an interval up to 10 µs

with the two switc es o ened is ac e ta le It s al b p s ible to o en an close the

switc es in e en ently of the phase an le Semicon u tors switc es con tru ted with p wer

MOSFETs an IGBTs can fulfi this req irement Th ristors and triac o en d rin c r ent

zero cros in , an therefore do not me t this req irement

The output voltage of the varia le tran formers can either b adju ted manual y or

automatical y by me n of a motor Alternatively, an autotran former with multiple switc

-selected ta s may b u ed

Wave- orm generators an p wer ampl fiers can b u ed in te d of varia le tran formers

an switc es (se Fig re C.1b) This config ration also al ows testin of the EUT in the

context of f eq en y variation an harmonic

The generators des rib d for single-phase testin (se Fig res C.1a), C.1b) an C.1c) can

V aria le tra sformer 1

V aria le tra sformer 2

Swit ch 1

Swit ch 2

V olt met er

o ci o c pEUT

IEC 278/0

Fig re C.1a) – Sc ematic of te t in trume tation f or volta e dips, s ort inter uptions

a d volta e v riations u in v riable tra sf ormers a d switc e

Co troler

Power

amplfierWave-orm

g n rat or

IEC 279 /0

Fig re C.1b) – Sc ematic of te t instrume tation f or volta e dips,

s ort inter uptions a d volta e v riations using p wer ampl f ier

Power

s p ly

Ne t ral (or Ph se for

p ase-t o-p ase

IEC 28 0/04

Figure C.1c) – Sc ematic of te t instrume tation f or volta e dips,

s ort inter uptions a d volta e v riations usin tappe tra sf ormer a d switc e

Figure C.1 – Sc ematic of te t instrume tation f or volta e dips,

s ort inter uption a d volta e v riations

Figure C.2 – Sc ematic of te t instrume tation f or thre -pha e volta e dips,

s ort inter uptions a d volta e v riations using p wer ampl f ier

 IEC 2 17

Annex D

(inf or mativ )

Rationale for generator specification regarding voltage, rise- ime

and fal - ime, and inrush cur ent capabi ity

D.1 Concept of basic sta dard

The immu ity b sic stan ard of the IEC 610 0-4-x series are b sed on the con e t of

definin a test s stem in one doc ment re resentin typical y one typ of electromag etic

disturb n e The en ironmental des ription of the IEC 610 0-2-x series (whic in lu es also

comp tibi ty levels) together with practical in u try exp rien e are the b sis f or definin the

disturb n e source simulator, the neces ary coupln an decoupl n network an the ran e

of test levels

Parameters in the b sic stan ard are alway compromises selected f rom a large amou t of

data derived f om the disturb n e source The compromise is as umed to b cor ect if, on e

the immu ity test is a pl ed, only a few malf un tion oc ur in the re l world

To ke p the immu ity test as e s as p s ible, the generator output s al b verified in a

cal bration set-up an not with the EUT con ected to the output of the generator The purp se

of the calbration is to g arante comp ra le test res lts b twe n diff erent bran s of

generators

D.2 IEC 61000-4-11:19 4 (f irst e ition)

Data f rom UNIPEDE re ort was u ed whic in icated s ort circ it in terms of voltage red ction

an inter upt d ration At that time, rare me s rement res lts were avai a le s owin how

eq ipment on the same phase was aff ected, in the publ c p wer network

Based on this information, IEC 610 0-4-1 :19 4 (first edition) was def i ed an publs ed in

19 4 For the switc in time a value of 1 µ to 5 µ was c osen for re resentin the s ort

circ it's worst case oc ur in at a distan e of up to 5 m b twe n the source an the af fected

eq ipment For example, the eq ipment u ed in a la oratory or in an in u trial plant has a

gre ter ris of b in af fected by voltage dips an s ort inter uption within 5 m

D.3 Rationale f or the need of ra id f al - imes

In case of s ort circ it in the l ne, the voltage at the input terminals of the eq ipment mig t go

to zero in les than 5 µ

If the s ort circ it originates f om the publ c network, the fal -time wi b relatively slow, in the

order of h n red of microsecon s to some mi isecon s If , however, the s ort circ it is at the

local premise, for example d e to the f ai ure of another eq ipment in taled in close proximity,

the main voltage wi go to zero within microsecon s, with f al -times s orter than 1 µ re orted

f or some cases

In this case, the input rectifier diodes of the eq ipment wi b commutated fom con u tion

mode to bloc in mode with a s d en hig reverse voltage d e to that very f ast voltage ri

se-time As those diodes are u ual y desig ed for natural l ne commutation with a rise-time of the

voltage in the ran e of mi isecon s, this event is an in re sed stres for the rectifier diodes

More general y, fast voltage tran ients may disturb electronic as wel , le din to the damage

of the eq ipment

 IEC 2 17

Tests p rf ormed with a f ast fal -time in the ran e of a few microsecon s emulatin the s ort

circ it con ition can b u ed to test the ro u tnes of eq ipment again t f ast tran ient s ort

1) "In IEC 610 0-4-1 :2 0 , Ta le 4 do s not a ply to EUT (eq ipment u der test testin

Ta le 4 is for generator cal bration an desig only

2) With referen e to Ta le 1 an Ta le 2, there is no req irement in 610 0-4-1 :2 0 f or ri

se-time an fal -time when testin EUT; therefore, it is not neces ary to me s re these

3) With ref eren e to Ta le 4, al of the req irements a ply to desig an cal bration of the

generator The req irements of Ta le 4 only a ply when the lo d is a non-in u tive 10 Ω

resistor The req irements of Ta le 4 do not a ply d rin EUT testin "

D.5 Main conclusions

With resp ct to rise-time an f al -time, the main con lu ion are the fol owin

• It is p s ible, for re l-world voltage dips, to have f al-times faster than 5 µ in the case of

s ort circ its close to the eq ipment However, for the time b in , this stan ard do s not

con ider the ef fects of voltage fal times s orter than 1 µ

• Rise-time de en s on several f actors in lu in the imp dan e of the network, ca l n an

eq ipment con ected in p ral el

• The rise-time an f al -time req irements have remained u c an ed an the stan ard has

b en u ed worldwide sin e its f irst publ cation in 19 4, but, as in the interpretation s e t,

these rise-time an f al -time req irements do not a ply d rin a test of an EUT They only

a ply when cal bratin a dip generator with a 10 Ω resistive lo d These rise-times an

f al-times do not neces ari y oc ur d rin an actual EUT test

• Most voltage dip an s ort inter uption immu ity tests b gin an en at 0˚ or 18 ˚

Publ s ed rese rc general y con lu es that these are the most severe phase an les for

voltage ride-throu h tests Note that at 0˚ an at 18 ˚ the in tantane u waveform voltage

is zero, so rise-time an fal -time have no me nin

• Pre-compl an e testin could b con idered u in a dip generator with a lon er rise-time

an f al-time up to 2 0 µs f or voltage dip an s ort inter uption tests that b gin an en at

0˚ or 18 ˚, as rise-time an fal-time are not imp rtant at these an les However, f ul

complan e with the test method of this stan ard req ires to u e a generator that, when

tested with a 10 Ω resistive lo d, me ts the 1 µs to 5 µ req irement in 6.1.2

D.6 Rationale f or inrush cur ent capabi ity

Durin the con ection of an eq ipment to a p wer l ne, an inru h c r ent f lows into it This

inru h c r ent could con eiva ly damage p rts of the eq ipment, for example an input rectifier

with ca acitive smo thin In order to prevent damage, me s res f or inru h c r ent l mitation

are u ualy in orp rated in ide the eq ipment

An inru h c r ent wi also oc ur when the l ne voltage recovers af ter a voltage dip or

inter uption In this case, the inru h c r ent l mitation me s res mig t not b activated in the

eq ipment with disa led pre-c arge circ it, so it is p s ible f or the p st-dip inru h c r ent to

damage the eq ipment

 IEC 2 17

For this re son, it is neces ary f or the voltage dip generator to b ca a le of s p lyin

s f ficient c r ent an that the p st-dip inru h c r ent is not lmited by the dip generator

Without this inru h c r ent req irement, it would b p s ible f or the eq ipment to p s the

immu ity test p rormed with the dip generator, but to f ai in the re l world d e to inru h

c r ent damage

In a re l in tal ation, this inru h c r ent wi b lmited by the network imp dan e If the s ort

circ it is on the publ c s p ly, the network imp dan e is ac ordin to the l ne ref eren e

imp dan e of the publ c s p ly (7 6 µH ac ordin to IEC TR 6 7 5), whic is typical for rural

low voltage network , an it wi lmit the inru h c r ent to a out 15 A to 2 A However, if the

s ort circ it is in ide the local premise, in a p rtic lar large in tal ation s c as an in u trial

plant, the imp dan e may b mu h lower an the inru h c r ent mu h larger

In order for the test generator to have adeq ate ca a i ties to pro erly stres the eq ipment

u der test, the stan ard provides g idan e in 6.1.2 to as ure that the eq ipment do s not

deman more c r ent than 7 % of the generator ca a i ty, f or example 5 0 A f or 2 0 V to

2 0 V main

 IEC 2 17

Bibl ogr aphy

IEC 6 0 0(161):199 , Int ern t ion l El ect rot ec nical Vo a ulary (IEV) – Ch pt er 161 –

El ectroma n tic c mp t ibility

for use in determinin th disturb n e c ara teristics of ele tric l e uipme t h vin a rated

c re t ≤75 A p r p ase

IEC 610 0-2-4, Ele troma n tic c mp tibi ty (EMC) – P art 2-4: En iro me t – Comp tibi ty

le els in industrial pla ts for low-fe u n y c ndu ted disturb n es

IEC 610 0-4-1 :2 0 /ISH1:2 10, I nterpretatio sh et 1 – Ele troma n tic c mp tibi ty (EMC)

v ltag v riatio s immu ity tests

1

IEC 610 0-4-14, Ele troma n tic c mp tibi ty (EMC) – P art 4-14: Testin a d me sureme t

te h iq es – Volta e flu tu tio immu ity test

Determin tio ofth Ch ra teristics of U su l Distortio s of th Voltag Wa eform, p blsh d in

Ele tricity Su ply, 5 th Ye r, No 9 , May 19 1

_ _ _ _ _ _

———————

1

An interpretatio s e t wa is u d b IEC SC 7 A for IEC610 0-4- 1 inAu u t 2 10

SC 7 A/Publ cation 610 0-4-1 (2 0 ), Deu ième édition/I-SH 01

COMPA TIBILITE ELECTROMAGNETIQUE (CEM) –

Partie 4-1 : Te h ique d'e s i et de me ure –

Es ais d' mmunité a x cre x de te sion, coupure

brè e et v riations de te sion

FEUIL E D' NTERPRÉTATION 1

Cete feui e d’ nterprétation a été éta l e p r le sou -comité 7 A: Phénomènes b s e

f éq en e, d comité d'étu es 7 de la CEI Comp tibi té électromag étiq e

L texte de cete feui e d’ nterprétation est is ue des doc ments s ivants:

L ra p rt de vote in iq é dan le ta le u ci-des u don e toute inf ormation s r le vote ayant

a outi à lap ro ation de cete f eui e d’ nterprétation

_ _ _ _ _ _

Interprétation de e ige c s pour le temps de monté et d s temps d de c nte

pe da t le e s is d’EST da s la CEI 610 0-4-1 :2 0 : Compatibi té éle troma nétique

(CEM) – Partie 4-1 : Te hnique d’e s i et d me ure – Es ais d’ mmunité a x cre x de

te sion, coupure brè e et v riations de te sion

1) Dan la CEI 610 0-4-1 :2 0 , le Ta le u 4 ne s’a pl q e p s à l es ai s r l EST

(éq ip ment soumis au test L Ta le u 4 est seulement p ur l étalon age et la

con e tion d générateur

2) En ce q i con erne le Ta le u 1 et le Ta le u 2, i n’y a p s d’exigen e dan la

CEI 610 0-4-1 :2 0 p ur le temps de monté et le temps de des ente lors ue l on

es aie l EST; c’est p urq oi, i n’est p s néces aire de mes rer ces p ramètres p n ant

les es ais

3) En ce q i con erne le Ta le u 4, toutes les exigen es s’a pl q ent à la con e tion et à

l étalon age d générateur L s exigen es d Ta le u 4 s’a pl q ent seulement q an la

c arge est u e résistan e non-in u tive de 10 Ω L s exigen es d Ta le u 4 ne

s’a pl q ent p s p n ant l es ai de l EST

7 Montage d'es ai 4

8 Procéd res d'es ai 4

9 Evaluation des rés ltats d'es ai 4

10 Ra p rt d'es ai 4

An exe A (normative) Détais s r les circ its d’es ai 4

An exe B (inf ormative) Clas es d'en iron ement électromag étiq e 5

An exe C (inf ormative) In truments d’es ai 51

An exe D (informative) Ju tification p ur la sp cif i ation des générateurs con ernant

les temps de monté et de des ente de ten ion et les valeurs des courants d’a p l 5

Bibl ogra hie 5

Fig re 1 – Creu de ten ion - Exemples 3

Fig re 2 – Coupure brève 3

Fig re 3 – Variation de ten ion 4

Fig re 4 – Es ai phase neutre et phase phase des s stèmes triphasés 4

Fig re A.1 – Circ it uti sé p ur déterminer le courant d’a p l crête d générateur

de coupures brèves 4

Fig re A.2 – Circ it uti sé p ur déterminer les con ition req ises s r la valeur crête

d courant d’a p l d’u EST 4

Fig re C.1 – Sc émas des in truments d’es ai p ur les creu de ten ion, les coupures

brèves et les variation de ten ion 5

Fig re C.2 – Sc éma des in truments d’es ai p ur les creu de ten ion, les coupures

brèves et les variation de ten ion triphasés à laide d’u ampl ficateur de puis an e 5

Ta le u 1 – Duré s et nive u d’es ai préférés p ur les creu de ten ion 3

Ta le u 2 – Duré s et nive u d’es ai préférés p ur les coupures brèves 3

Ta le u 3 – Duré des variation de ten ion d’al mentation à court terme 3

Ta le u 4 – Sp cification d générateur 41

1 L Commis io Ele trote h iq e Intern tio ale (IEC) e t u e org nis tio mo diale d n rmals tio c mp s e

d le s mble d s c mité éle trote h iq e n tio a x (Comité n tio a x d l EC) L’EC a p ur o jet d

f av ris r la c o ératio intern tio ale p ur to te le q e tio s d n rmals tio d n le d main s d

léle tricité et d léle tro iq e A c t ef fet, l EC – e tre a tre a tivité – p ble d s Norme intern tio ale ,

d s Sp cif i atio s te h iq e , d s Ra p rts te h iq e , d s Sp cif i atio s a c s ible a p blc (P S) et d s

Guid s (ci-a rè d n mmé "Pu lc tio (s) d l EC" L ur éla oratio e t c n é à d s c mité d'étu e , a x

tra a x d s u ls to t Comité n tio al intére s p r le s jet traité p ut p rticip r L s org nis tio s

intern tio ale , g u ern me tale et n n g u ern me tale , e lais n a e l EC, p rticip nt é aleme t a x

tra a x L’EC c la ore étroiteme t a e lOrg nis tio Intern tio ale d Normals tio (ISO), s lo d s

c n itio s f i é s p r a c rd e tre le d u org nis tio s

2) L s d cisio s o a c rd off i iels d l EC c n ern nt le q e tio s te h iq e re ré e te t, d n la me ure

d p s ible, u a c rd intern tio al s r le s jets étu ié , éta t d n é q e le Comité n tio a x d l EC

intére s s s nt re ré e té d n c a u c mité d’étu e

3) L s Pu lc tio s d l EC s pré e te t s u la f orme d re omma d tio s intern tio ale et s nt a ré e

c mme tele p r le Comité n tio a x d l EC To s le ef forts rais n a le s nt e tre ris a n q e l EC

s'a s re d le a titu e d c nte u te h iq e d s s p blc tio s; l EC n p ut p s être te u re p n a le d

lé e tu le ma v is uti s tio o interprétatio q i e e t f aite p r u q elc n u uti s te r fin l

4) Da s le b t d'e c ura er lu iformité intern tio ale, le Comité n tio a x d l EC s'e g g nt, d n to te la

me ure p s ible, à a plq er d f aç n tra s are te le Pu lc tio s d l EC d n le rs p blc tio s n tio ale

et ré io ale To te div rg n e e tre to te Pu lc tio s d l EC et to te p blc tio s n tio ale o

ré io ale c re p n a te d iv nt être in iq é s e terme clairs d n c s d rnière

5) L’EC ele-même n fo rnit a c n ate tatio d c nformité De org nisme d c rtif i atio in é e d nts

f ournis e t d s s rvic s d'é alu tio d c nf ormité et, d n c rtain s cte rs, a c d nt a x marq e d

c nformité d l EC L’EC n'e t re p n a le d'a c n d s s rvic s eff ectu s p r le org nisme d c rtif i atio

in é e d nts

6) To s le uti s te rs d iv nt s'a s rer q ' s s nt e p s e sio d la d rnière é itio d c te p blc tio

7) Au u e re p n a i té n d it être imp té à l EC,à s s a ministrate rs, emplo é , a xi aire o ma d taire ,

y c mpris s s e p rts p rtic lers et le membre d s s c mité d'étu e et d s Comité n tio a x d l EC,

p ur to t préju ic c u é e c s d d mma e c rp rels et matériels, o d to t a tre d mma e d q elq e

n ture q e c s it, dire te o in ire te, o p ur s p orter le c ûts (y c mpris le fais d ju tic ) et le

d p n e d c ula t d la p blc tio o d luti s tio d c te Pu lc tio d l EC o d to te a tre

Pu lc tio d l EC, o a cré it q i lui e t a c rd

8) L'ate tio e t atiré s r le référe c s n rmativ s cité s d n c te p blc tio L'uti s tio d p blc tio s

réf ére c e e t o lg toire p ur u e a plc tio c re te d la pré e te p blc tio

9) L’ate tio e t atiré s r le fait q e c rtain d s éléme ts d la pré e te Pu lc tio d l EC p u e t faire

lo jet d droits d bre et L’ EC n s urait être te u p ur re p n a le d n p s a oir id ntifié d tels droits

d bre ets et d n p s a oir sig alé le r e iste c

DÉGA GEMENT DE RESPONSA BILITÉ

Cet e v rsion consol dé n’e t pa u e Norme IEC of f iciel e, el e a été préparé par

commodité pour l uti s te r Se le le v rsions coura te d c t e norme et de

son(s s) ame deme t(s) doiv nt être considéré s comme le doc me ts of ficiels

Cet e v rsion consol dé d l EC 610 0-4-1 porte le numéro d'é ition 2.1 El e

compre d la de xième é ition (2 0 -0 ) [doc me ts 7 A /4 2/FDIS et 7 A /4 5/RVD] et s

f eui le d’ nterprétation 1 (2 10-0 ), et son ame d me t 1 (2 17-0 ) [doc me ts

7 A /9 1/FDIS et 7 A /9 1/RVD] Le conte u te h iq e e t ide tiqu à c lui de l é ition de

ba e et à son ame deme t

 IEC 2 17

Da s c t e v rsion Re l n , un l gne v rtic le da s la marge indiq e ó le conte u

te hniq e e t modifié par l ame deme t 1 Le ajouts sont e v rt, le s ppre sions

sont e roug , bar é s Un v rsion Finale a e toute le modif ic tions a c pté s e t

disp nible da s c t e publ c tion

L Norme internationale IEC 610 0-4-1 a été éta le p r le sou -comité 7 A: Phénomènes

b s e f réq en e, d comité d'étu es 7 de l IEC: Comp tibi té électromag étiq e

Cet e deu ième con titue u e révision tec niq e dan laq el e

1) des d ré s et nive u d'es ai préf érés p ur les diff érentes clas es d'en iron ement ont

été ajouté s ;

2) les es ais p ur les s stèmes triphasés ont été précisés

Ele con titue la p rtie 4-1 de lIEC 610 0 El e a le statut de publ cation fon amentale en

CEM conformément au Guide 10 de l IEC

Cet e publcation a été rédigé selon les Directives ISO/IEC, Partie 2

L comité a décidé q e le conten de la publcation de b se et de son amen ement ne sera

p s modif ié avant la date de sta i té in iq é s r le site we de lIEC sou

"htp:/we store.iec.c " dan les don é s relatives à la publ cation rec erc é A cet e date, la

IMPORTA NT – Le logo "colo r inside q i s trouv s r la pa e de couv rture de c t e

publ c tion indiqu q 'el e contie t d s coule rs qui sont con idéré s comme uti e à

une bon e compré e sion d son conte u Le uti s te rs de raie t, par cons que t,

imprimer c t e publ c tion e uti s nt une imprima te coule r

 IEC 2 17

L’IEC 610 0 est publé sou f orme de plu ieurs p rties, conf ormément à la stru ture s ivante:

Partie 1: Gé éral té

Con idération générales (introd ction, prin ip s fon amentau )

Définition , terminologie

Partie 5: Dire tiv s d' n tal ation et d'at é u tion

Directives d'n talation

Méthodes et disp sitifs d'atén ation

Partie 6: Norme gé érique

Partie 9: Div rs

Chaq e p rtie est à son tour s bdivisé en plu ieurs p rties, publé s soit comme Normes

internationales, soit comme sp cification tec niq es ou ra p rts tec niq es, dont certaines

ont déjà été publ é s en tant q e section D’autres seront publ é s sou le n méro de la

p rtie, s ivi d’u tiret et complété d’u secon c if fre identifiant la s bdivision (exemple:

610 0-6-1)

L présente p rtie de l IEC 610 0 définit les méthodes d'es ai d' mmu ité ain i q e la

gamme des nive u d'es ais préférés p ur les matériels électriq es et électroniq es

con ectés à des rése u d'al mentation b s e ten ion p ur les creu de ten ion, les

coupures brèves et les variation de ten ion

L présente norme s’a pl q e au matériels électriq es et électroniq es dont le courant

nominal d’entré ne dé as e p s 16 A p r phase et destinés à être rel és à des rése u

électriq es alternatif s de 5 Hz ou 6 Hz

Ele ne s'a plq e p s au matériels électriq es et électroniq es destinés à être relés à des

rése u électriq es à courant alternatif de 4 0 Hz L s es ais p ur ces rése u seront traités

dan des normes IEC à venir

L but de cet e norme est d'éta l r u e réf éren e commu e p ur lévaluation de l mmu ité

f on tion ele des matériels électriq es et électroniq es soumis à des creu de ten ion, à des

coupures brèves et à des variation de ten ion

NOT L s e s is d’mmu ité a x f l ctu tio s d te sio s nt traité d n l EC 610 0-4- 4

L méthode d’es ai décrite dan la présente p rtie de lIEC 610 0 détai e u e méthode san

f ai e p ur estimer l mmu ité d’u matériel ou d’u s stème à u phénomène prédéfini

Comme décrit dan le Guide 10 de l IEC, ce doc ment est u e publ cation fon amentale en

CEM destiné à l u age des comités de prod it de l IEC Comme également mention é dan le

Guide 10 , les comités de prod it de l IEC sont resp n a les d c oix d’uti sation ou non de

cet e norme d’es ai d’ mmu ité et, si el e est uti sé , les comités sont resp n a les de la

définition des nive u d’es ai a pro riés L comité d’étu es 7 et ses sou -comités sont

prêts à co p rer avec les comités de prod it p ur l évaluation de la p rtinen e des es ais

p rtic lers d’ mmu ité p ur leurs prod its

L s doc ments de réf éren e s ivants sont in isp n a les p ur la pl cation d présent

doc ment Pour les réf éren es daté s, seule l édition cité s'a plq e Pour les réf éren es non

daté s, la dernière édition d doc ment de réf éren e s'a plq e (y compris les éventuels

amen ements)

IEC 610 0-2-8, Comp tibi té éle troma n tiq e (CEM) – P artie 2-8: En iro n me t – Cre x

de te sio et c u ures brè es sur les rése u d’éle tricité p blcs in lu nt des résultats de

mesures statistiq es

3 Termes et déf initions

Pour les b soin d présent doc ment, les termes et définition s ivants s'a pl q ent: