Iec 61000 4 13 2015

This p rt is an EMC b sic stan ard whic gives immu ity req irements an test proced res related to harmonic an interharmonic in lu in main sig al n at a.c... power port, low frequency imm

Partie 4-13: T echniques d’essai et de mesure – Essais d’ mmunité basse

sur le r éseau électrique alternatif

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Partie 4-13: T echniques d’essai et de mesure – Essais d’ mmunité basse

sur le r éseau électrique alternatif

INT ERNAT IONAL

ELECT ROT ECHNICAL

ELECT ROT ECHNIQUE

INT ERNAT IONALE

BASIC EMC PUBLICATION

PUBLICA TION FONDAMENTA LE EN CEM

®

Warnin ! Mak e s re that you obtain d this publc tio from a a th rize distributor

Atte tio ! Ve i ez v u a s rer q e v u a ez obte u c t e publc tio via u distribute r a ré

c lo r

insid

IEC 61 000-4-1 3

Editio 1.2 2 15-12

Partie 4-13: T echniques d’essai et de mesure – Essais d’ mmunité basse

sur le r éseau électrique alternatif

CONTENTS

FOREWORD 3

lNTRODUCTlON 5

1 Sco e an o ject 6

2 Normative referen es 6

3 Definition 7

4 General 8

4.1 Des ription of the phenomenon 8

4.2 Sources 9

5 Test levels 10 5.1 Harmonic test levels 10 5.2 Test levels for interharmonic an main sig al n 12 6 Test in trumentation 13 6.1 Test generator 13 6.2 Verification of the c aracteristic of the generator 15 7 Test set up 15 8 Test proced res 16 8.1 Test proced re 16 8.2 Ap lcation of the test 16 9 Evaluation of test res lts 2

10 Test re ort 2

An ex A (informative) Imp dan e network b twe n voltage source an EUT 3

An ex B (informative) Resonan e p int 31

An ex C (informative) Electromag etic en ironment clas es 3

Bibl ogra h 3

INTERNATIONAL ELECTROTECHNICAL COMMISSION

1) Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic field To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re fer refere to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n

n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio for Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio from al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th form of re omme d tio s for intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eforts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible for th wa in whic th y are u e or for a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtific tio b die pro id c nformity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtific tio b die

6) Al u ers s o lde s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s for a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or for c sts (in lu in le al fe s) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s ble for th c re t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible for id ntifyin a y or al s c p te t rig ts

DISCLAIMER

This Cons l d te v rsion is not a of icial IEC Sta d rd a d ha be n prepare for

us r c n e ie c Only the c r e t v rsion of th sta dard a d its ame dme t(s) are

to be c nsidere the of icial d c me ts

In this Re l ne v rsion, a v rtic l l ne in the margin s ows where the te h ic l c nte t is

modifie by ame dme ts 1 a d 2 Ad ition are in gre n te t, deletions are in

strik throu h re te t A s parate Final v rsion with al c a ge a c pte is a ai able in

this publ c tion

International Stan ard IEC 610 0-4-13 has b en pre ared by s bcommite 7 A: L w

freq en y phenomena, of IEC tec nical commite 7 : Electromag etic comp tibi ty

This stan ard has the statu of a b sic EMC publ cation in ac ordan e with lEC Guide 10

This publ cation has b en draf ed in ac ordan e with the ISO/IEC Directives, Part 3

An exes A, B, an C, are for information only

The commite has decided that the contents of the b se publ cation an its amen ments wi

remain u c an ed u ti the sta i ty date in icated on the IEC we site u der

"htp:/we store.iec.c " in the data related to the sp cific publcation At this date, the

that it c ntain c lo rs whic are c n idere to be u eful for the c r e t u dersta ding

of its c nte ts Us rs s o ld th refore print this d c me t using a c lour printer

IEC 610 0 is publ s ed in se arate p rts ac ordin to the fol owin stru ture :

Part 1: Ge eral

General con ideration (introd ction, fu damental prin iples)

Definition , terminolog

In tal ation g idel nes

Mitigation method an devices

Part 6: Ge eric Sta dard

Part 9: Mis el a e us

Eac p rt is further s bdivided into several p rts, publ s ed either as International Stan ard

or as tec nical sp cification or tec nical re orts, some of whic have alre d b en publs ed

as section Others wi b publ s ed with the p rt n mb r fol owed by a das an a secon

n mb r identifyin the s bdivision (example: 610 0-6-1)

This p rt is an EMC b sic stan ard whic gives immu ity req irements an test proced res

related to harmonic an interharmonic in lu in main sig al n at a.c p wer p rt

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-13: Testing and measurement techniques –

Harmonics and interharmonics including mains signal ing at

a.c power port, low frequency immunity tests

1 Sc pe and object

This p rt of IEC 610 0 defines the immu ity test method an ran e of recommen ed b sic

test levels for electrical an electronic eq ipment with rated c r ent up to 16 A p r phase at

disturb n e freq en ies up to an in lu in 2 kHz ( or 5 Hz main ) an 2,4 kHz ( or 6 Hz

main ) for harmonic an interharmonic on low voltage p wer network

It do s not a ply to electrical an electronic eq ipment con ected to 16 2/3 Hz , or to 4 0 Hz

a.c network Tests for these network wi b covered by future stan ard

The o ject of this stan ard is to esta l s a common referen e for evaluatin the fu ctional

immu ity of electrical an electronic eq ipment when s bjected to harmonic an in

ter-harmonic an main sig al n freq en ies The test method doc mented in this p rt of IEC

610 0 des rib s a con istent method to as es the immu ity of an eq ipment or s stem

again t a defined phenomenon As des rib d in IEC g ide 10 , this is a b sic EMC publ cation

for u e by prod ct commit e s of the IEC As also stated in Guide 10 , the IEC prod ct

commite s are resp n ible for determinin whether this immu ity test stan ard s ould b

a pled or not, an if a pled, they are resp n ible for determinin the a pro riate test levels

an p rforman e criteria TC 7 an its s b-commite s are pre ared to co-o erate with

prod ct commite s in the evaluation of the value of p rtic lar immu ity tests for their prod cts

The verification of the rela i ty of electrical comp nents ( or example ca acitors, fiters, etc.)

is not in the s o e of the present stan ard L n term thermal ef ects (gre ter than 15 min) are

not con idered in this stan ard

The levels pro osed are more ada ted for residential, commercial an l g t in u try

en ironments For he v in u trial en ironments the prod ct commit e s are resp n ible for

the definition of a clas X with the neces ary levels They have also the p s ibi ty of definin

more complex waveforms for their own ne d Nevertheles , the simple waveforms pro osed

have b en mainly o served on several network ( lat c rve more of en for sin le phase

s stem) an also on in u trial network (overswin c rve more for thre phase s stems)

2 Normative reference

The fol owin referen ed doc ments are in isp n a le for the a pl cation of this doc ment For

dated referen es, only the edition cited a ples For u dated referen es, the latest edition of

the referen ed doc ment (in lu in an amen ments) a pl es

IEC 6 0 0(161), Inte rnato nal Electrote ch ic l Voc bulary (IEV) – Chap te r 161: Ele ctro

-mag e tic co mp atbil y

IEC 610 0-2-2, Electromag e tic co mp atbil y (EMC) – Part 2-2: En iro nme nt – Co mp atbil y

le ve ls fo r lo w-fre que ncy co nducte d disturbance s and sig al n in p ub lic lo w-vo ltag p o wer

sup p ly systems

IEC 610 0-3-2, Ele ctro mag e tic co mp atbil y (EMC) – Part 3-2: Limis – Limis for harmo nic

curre nt e mis io s (e quip me nt inp ut curre nt ≤ 16 A p e r p ha e )

IEC 610 0-4-7, Electromag e tic comp atbil y (EMC) – Part 4-7: Te stn and mea ure me nt

te ch ique s – G e ne ral guide o n harmo nic and inte rharmo nic me asure me nts and

instrume tato n, fo r p ower sup p ly systems and e quip me nt co nne cted th re to

waveform that folows a time related fu ction in whic e c half wave con ists of thre p rts:

Part 1: starts from zero an fol ows a pure sine fu ction up to the sp cified value;

Part 2: is a con tant value;

Part 3: fol ows a pure sine fu ction down to zero

4 Ge eral

4.1 De cription of th ph nome on

4.1.1 Harmonic

Harmonic are sin soidal voltages an c r ents with freq en ies that are integer multiples of

the freq en y at whic the s p ly s stem o erates

Harmonic disturb n es are generaly cau ed by eq ipment with non-lne r voltage – c r ent

c aracteristic or by p riodic an l ne-s n hronised switc in of lo d Su h eq ipment may b

regarded as sources of harmonic c r ents

The harmonic c r ents from the diferent sources prod ce harmonic voltage dro s acros the

imp dan e of the network

As a res lt of ca le ca acitan e, l ne in u tan e an the con ection of p wer factor cor ection

ca acitors, p ral el or series resonan e may oc ur in the network an cau e a harmonic

voltage ampl fication even at a remote p int from the distortin lo d The waveforms pro osed

are the res lt of the s mmation of dif erent harmonic orders of one or several harmonic

sources

4.1.2 Interharmonic

Betwe n the harmonic of the p wer freq en y voltage an c r ent, further freq en ies can b

o served whic are not an integer multiple of the fu damental They can a p ar as dis rete

freq en ies or as a wide-b n sp ctrum Summation of dif erent interharmonic sources is not

l kely an is not taken into ac ou t in this stan ard

4.1.3 Mains sig al ng (rip le c ntrol)

Sig al freq en ies ran in from 1 0 10 Hz to 3 kHz u ed in network or p rts of them in

order to tran fer information from a sen in p int to one or more receivin p ints

kHz/6 Hz)

For the Meister c rve, se Fig re 8

NOT Th fig re is ta e from IEC 610 0-2-2:2 0 , Fig re 3.

Figure 8 – Meister c rv for ripple

c ntrol s stems in publ c network (10 Hz to 3 0 0 Hz)

4.2 Sourc s

4.2.1 Harmonic

Harmonic c r ents are generated to a smal extent by generation, tran mis ion an distribution

eq ipment an to a gre ter extent by in u trial an residential lo d Sometimes, there are

only a few sources generatin sig ificant harmonic c r ents in a network; the in ivid al

harmonic level of the majority of the other devices is low, nevertheles these may make a

relatively hig contribution to the harmonic voltage distortion, at le st for low order harmonic

d e to their s mmation

Sig ificant harmonic c r ents in a network can b generated by non-lne r lo d , for example:

– controled an u control ed rectifiers, esp cial y with ca acitive smo thin ( or example

u ed in television, in irect an direct static freq en y con erters, an self b l asted lamps),

b cau e these harmonic are in a proximately the same phase from diferent sources an

there is only p or comp n ation in the network;

– phase controled eq ipment, some typ s of computers an UPS eq ipment

Sources may prod ce harmonic at a con tant or varyin level, de en in on the method of

o eration

4.2.2 Interh rmonic

Sources of interharmonic can b fou d in low-voltage network as wel as in medium-voltage

an hig voltage network The interharmonic prod ced in the medium-voltage/hig voltage

network flow in the low-voltage network they s p ly an vice versa

The main sources are in irect an direct static freq en y con erters, weldin mac ines an

arc furnaces

4.2.3 Mains sign l ing (ripple c ntrol)

Sources of main sig al n freq en ies covered by this stan ard are tran miters o eratin

mostly in the 1 0 10 Hz to 2 2,4 kHz (2,4 kHz) freq en y ran e in order for the publc s p ler

to control eq ipment in the s p ly network (publc l g tin , tarif s for meters, etc.) The

tran mit er energ is coupled into the s stem on HV, MV, or LV level The tran miters o erate

with inter upted sig als, an normal y for a s ort time only The freq en ies u ed l e normaly

in b twe n the harmonic

5 Test le els

The test level is the harmonic voltage sp cified as a p rcentage of the fu damental voltage

The voltages given in this stan ard have the nominal p wer s p ly network voltage (U

1

fu damental) as a b sis

It is es ential that the r.m.s voltage of the res ltant waveforms remain at the nominal value

d rin the a pl cation of these tests by adju tin the voltage values of fu damental an

harmonic ac ordin to the p rcentages in icated in the cor esp n in ta les ( or example

2 0 V r.m.s 12 V r.m.s.)

5.1 Harmonic te t le els

The preferential ran e of test levels for in ivid al harmonic are given in ta les 1 to 3

Harmonic voltages at a test level of 3 % an hig er, up to the 9th harmonic, s al b a pl ed

u in a phase s if of b th 0° an 18 ° with resp ct to the p sitive zero-cros in of the

fu damental Harmonic voltages at a test level of les than 3 % s al b a pl ed u in no

phase-s if with resp ct to the p sitive zero-cros in of the fu damental

For comp tibi ty levels se IEC 610 0-2-2 u in factor k Immu ity levels have to b hig er

( or example times 1,5 ad itionaly)

The a pl cation of the test to a multiphase EUT is given in 8.2.5

Table 1 – Odd harmonic non-multiple of 3 harmo ic

NOT 2 Th le els giv n for cla s X are o e Th s le els s al b d fin d b th pro u t c mmite s Howe er,

for e uipme t s p le b low v lta e p blc s p ly s stems, th v lu s s al n t b lower th n th s of cla s 2

Table 2 – Od harmo ic multiple of 3 harmo ic

NOT 1 Cla s s 1, 2,a d 3 are d fin d in a n x C

NOT 2 Th le els giv n for cla s X are o e Th s le els s al b d fin d b th pro u t c mmite s Howe er,

for e uipme t s p le b low v lta e p blc s p ly s stems th v lu s s al n t b lower th n th s of cla s 2

NOT 1 Cla s s 1, 2,a d 3 are d fin d in a n x C.

NOT 2 Th le els giv n for cla s X are o e Th s le els s al b d fin d b th pro u t c mmite s Howe er,

for e uipme t s p le b low v lta e p blc s p ly s stems th v lu s s al n t b lower th n th s of cla s 2

5.2 Te t le els for interharmonic a d mains sign l ing

The preferential ran es of test levels are given in ta les 4 an 4

Table 4 – Fre ue cie betwe n harmonic fre u ncie

Table 4 – Fre ue cie betwe n harmo ic fre u ncie ( or 5 Hz mains)

NOT 1 Cla s s 1, 2, a d 3 are d fin d in a n x C

NOT 2 Th le els for cla s X are o e Th s le els s al b d fin d b th pro u t c mmite s

Table 4b – Fre ue cie betwe n h rmonic fre ue cie ( or 6 Hz mains)

NOT 1 Cla s s1, 2, a d 3 are d fin d in a n x C

NOT 2 Th le els giv n for cla s X are o e Th s le els s al b d fin d b th pro u t c mmite s

Immu ity test levels for interharmonic a ove 10 Hz are covered by b sed on the main

sig al n levels an o tional y by or the Meister c rve levels defined in 8.2.4 de en in on the

clas of eq ipment b in tested Main sig al n levels are in the ran e of 2 % to 6 % of U

The test generator s al have the a i ty to generate a sig al with a 5 Hz or 6 Hz fu damental

freq en y an to s p rimp se the req ired freq en ies (harmonic an freq en ies b twe n

the harmonic )

The test generator s al have s f icient fiterin s c that the harmonic an interharmonic

disturb n es do not influen e an au i ary eq ipment whic may b u ed to p rform the test

The test levels ac ordin to ta les 1 to 4 s al b a pl ed at the terminals of the EUT

con ected as in normal con ition (sin le or thre phase) an o eratin as sp cified in the

relevant prod ct stan ard

The test generator s al have the folowin sp cification :

Table 5 – Chara teristic of the te t ge erator

Outp t cur ent per p a e at rated volta e Ne e s ry to fulfi the req irements at the o erating

Freq encie betwe n the harmo ic :

NOT 1 Th g n rator e uipme t s al pro id a o tp t whic is s ficie t to te t th EUT or to a ma imum rate

in ut c re t of 16 A r.m.s p r p a e Oth r v lu s ma b giv n b th pro u t sta d rd or pro u t s e ific tio

NOT 2 Th g n rator s al pro id c ntrol in uts for s le tio of ma nitu e, fre u n y, p a e-a gle, a d

s q e c ty e of th s p rimp s d v lta e

NOT 3 Th g n rator e uipme t s al pro id th o tio to s p rimp s more th n o e v lta ein e c p a e

NOT 4 No o tp t imp d n e is d fin d sin e th intern l v lta e s urc h s to b c ntrole s th t th v lta e

dro a ro s th intern l imp d n e is c mp n ate a d th s t v lu s are met at th termin ls of th EUT Th

c n e tio s s al b a s ort a p s ible

NOT 5 An e tern l s rie imp d n e n twork ma b u e , b t o ly to fin p s ible re o a c e cite b

h rmo ic Th IEC 6 7 5 imp d n e n twork is s g e te An e A is in lu e in this sta d rd for g id n e

NOT 6 ϕh is th p a e difere c b twe n th p sitiv z ro cro sin of th fu d me tal v lta e a d th p sitiv

z ro cro sin of th h rmo ic v lta e e pre s d in d gre s of th h rmo ic fre u n y

6.2 Verific tion of the c ara teristic of the ge erator

The generator output c aracteristic s al b verified at the terminals of the source prior to the

test For this purp se, the terminal voltage s al b monitored by a harmonic analy er

ac ordin to IEC 610 0-4-7, ac urac clas A, an the s p rimp sed values s al b stored

an /or printed An os i os o e may b u ed in ad ition for a rou h overview

The maximum harmonic voltage distortion of the generator s al b in ac ordan e with

IEC 610 0-3-2 (when no harmonic/inter-harmonic is selected) The maximum distortion l mits

whi e del verin p wer to the EUT are given in ta le 6

Table 6 – Ma imum harmonic v lta e distortion

The p ak value of the test voltage s al b within 1,4 an 1,4 times its rms value an s al

b re c ed within 8 ° to 9 ° afer the zero cros in The maximum output voltage c an e

b twe n no lo d an rated c r ent of an EUT s al b ± % of the nominal voltage

The c aracteristic of the generator sp cified in 6.1 le d to generators with low internal

imp dan e To simplfy the proced re, the verification of the c aracteristic of the generator in

ac ordan e with 6.2 s al b p rformed in the a sen e of an external imp dan e network

7 Test set up

In ad ition to the test generator, the folowin test eq ipment may b ne ded for the immu ity

test:

– analy er for harmonic an interharmonic ac ordin to IEC 610 0-4-7 for the verification

of the test voltage at the terminals of the EUT;

– control u it to provide the seq en e of the selected s p rimp sed voltages d rin a test;

– printer or ploter for the doc mentation of the test voltage seq en e;

– os i os o e for monitorin the s p ly voltage on the EUT

Some of these items may b combined in one u it

Examples of test ar an ements are given:

– in fig re 2 for a sin le phase EUT;

– in fig re 3 for a thre phase EUT

8 Test procedures

8.1 Te t proc dure

8.1.1 Cl matic c nditions

Unles otherwise sp cified by the commite resp n ible for the generic or prod ct stan ard,

the cl matic con ition in the la oratory s al b within an l mits sp cified for the o eration of

the EUT an the test eq ipment by their resp ctive man facturers

Tests s al not b p rformed if the relative h midity is so hig as to cau e con en ation on the

EUT or the test eq ipment

NOT Wh re it is c n id re th t th re is s ficie t e id n e to d mo strate th t th efe ts of th p e ome o

c v re b this sta d rd are influ n e b clmatic c n itio s, this s o ld b bro g t to th ate tio of th

c mmite re p n ible for this sta d rd

8.1.2 Te t pla

Before startin the test of a given eq ipment, a test plan s al b pre ared

It is recommen ed that the test plan comprises of the fol owin items:

– the des ription of the EUT;

– information on p s ible con ection (plu s, terminals, etc.) cor esp n in ca les an

p ripherals;

– input p wer p rt of eq ipment to b tested;

– re resentative o erational modes of the EUT for the test;

– typ of tests/ est levels;

– p rforman e criteria u der test con ition as sp cified by the stan ard or man facturer;

– des ription of the test set up

If the au i ary eq ipment is not avaia le for the EUT, it may b simulated

For e c test, an degradation of p rforman e mu t b recorded The monitorin eq ipment

s ould b ca a le of displayin the statu of the o erational mode of the EUT d rin an afer

the tests Af er e c group of tests a relevant c ec wi b p rformed

8.2 Appl c tio of the te t

Fig res 1a an 1b have b en ad ed to give g idan e on how to o timise test time with a hig

confiden e of test p rforman e The test levels in the « armonic combination » test an the

« we p in freq en ies test ex e d the test levels of the «in ivid al harmonic » test For clas

1 an 2, where the Meister c rve is not a pled, the immu ity test for inter-harmonic is

a plca le

Figure 1a – Te t flowchar cla s 1 an cla s 2

IE 817/02

8.2.1 Harmonic c mbinatio te t flat c rv a d ov r swing

The two harmonic combination tests to b car ied out are flat c rve an over swin The EUT

s al b tested for e c harmonic combination, ac ordin to Ta les 7 an 8 for 2 min The

time-domain waveforms are s own in Fig res 6 an 7 for the flat c rve an over swin tests

resp ctively

Flat c rve: the voltage fol ows a time related fu ction in whic e c half wave con ists of thre

p rts Se Fig re 6

– Part 1 starts from zero, it folows a pure sine fu ction up to 9 % of the p ak value for Clas

1, 9 % of the p ak value for Clas 2 an up to 8 % for Clas 3

– Part 2 is a con tant voltage

– Part 3 is eq ivalent to Part 1 ( ol owin a pure sine fu ction)

The rms value of the res ltant waveform s al b maintained at nominal voltage d rin the

a plcation of this test This me n that the sin soidal p rt of the waveform has to b

NOT 2 Th le els giv n for cla s X are o e Th s le els s al mu t b d fin d b th pro u t c mmite s

Howe er, for e uipme t for u e in p blc s p ly s stems th v lu s s al mu t n t b lower th n th s of cla s 2

harmonic b th with a cor esp n in phase relation hip

Table 8 – Harmonic c mbination, "ov r swing"

NOT 1 Cla s s 1, 2, a d 3 are d fin d in An e C

NOT 2 Th le els giv n for cla s X are o e Th s le els s al h s to b d fin d b th pro u t c mmite s

Howe er, for e uipme t for u e in p blc s p ly s stems, th v lu s s al mu t n t b lower th n th s of cla s 2

8.2.2 Te t method "Swe p in fre ue cie "

The eq ipment set up for swe p freq en y tests are s own in Fig res 2 an 3 The ampl tu e

of the swe p freq en ies de en s on the freq en y ran e (se Ta le 9 an Fig re 5) The

swe p (analog e) or ste rate (digital) s ould b s c that the time taken p r decade is no les

than 5 min, as s own in Fig re 5 The freq en y swe p wi dwel at freq en ies where

p rforman e anomal es are detected as wel as at al resonant freq en ies At e c dwel

p int, the test time s ould b at le st 12 s A resonan e freq en y s al b selected with an

re

re

NOT 1 Cla s s 1, 2, a d 3 are d fin d in a n x C

NOT 2 Th le els giv n for cla s X are o e Th s le els s al b d fin d b th pro u t c mmite s Howe er, for

e uipme t for u e inp blc s p ly s stems th v lu s s al n t b lower th n th s of cla s 2

8.2.3 Individ al harmonic a d interharmonic with a spe ifie te t le el s que c

In the freq en y ran e 2 × f

1

to 4 × f

1, sin le sin soidal voltages with mag itu e ac ordin to

ta les 1 to 3 s al b s p rimp sed on the fu damental voltage U

1 Eac freq en y s al b

a pl ed for 5 s with a one secon interval to the next one (se fig re 4) where s the r.m.s

value of the res ltant voltage s al b ke t con tant d rin the d ration of the whole test

For the interharmonic test, in the freq en y ran es s own in ta les 4 an 4 , the freq en y

ste sizes are dictated in ta le 10 Eac ste p int s al b a pl ed for 5 s with a one secon

interval to the next one where s the r.m.s value of the res ltant waveform s al b ke t

con tant d rin the d ration of the whole test

Table 10 – Fre ue c step size for interharmo ic a d Meister c rv

The Meister c rve test is a pl ed to Clas 2 prod cts Durin this test, the freq en y may b

the swe p (analog) or ste rate (digital) s ould b s c that the time taken p r decade is no

les than 5 min, as s own in Fig re 5

NOT 2,4 kHz is th u p r fre u n y for 6 Hz s stems; th u p r fre u n y for 5 Hz s stems is 2 kHz

In b th cases, the ampl tu e of the a pl ed interharmonic levels has to fol ow the values given

8.2.5 Appl c tio of the te t in a multi-ph s EUT

Se fig re 3

The harmonic or interharmonic distortion s al b a pl ed simultane u ly to al lne-neutral

phases, an the harmonic in e c l ne-neutral voltage s al have the same phase relation to

the fu damental of the cor esp n in wave form This me n , that a art from a 12 ° s if, the

multiple wave forms are eq al as it is most of en o served in low voltage network

A con eq en e of this a pro c is that the test generator s ould have a neutral on its output,

an can ot have a multiple phase output tran former whic wi not tran fer the homo olar

triple harmonic

For multi-phase eq ipment without neutral con ection, this do s not a ply, an testin with

tripled harmonic is not req ired

9 Evaluation of test res lts

The test res lts s al b clas ified in terms of the los of fu ction or degradation of p rform

-an e of the eq ipment u der test, relative to a p rforman e level defined by its man facturer or

the req estor of the test, or agre d up n b twe n the man facturer an the purc aser of the

prod ct The recommen ed clas ification is as fol ows:

a) normal p rforman e within lmits sp cified by the man facturer, req estor or purc aser;

b) temp rary los of fu ction or degradation of p rforman e whic ce ses af er the

disturb n e ce ses, an from whic the eq ipment u der test recovers its normal

p rforman e, without o erator intervention;

c) temp rary los of fu ction or degradation of p rforman e, the cor ection of whic req ires

o erator intervention;

d) los of fu ction or degradation of p rforman e whic is not recovera le, owin to damage

to hardware or sof ware, or los of data

The man facturer's sp cification may define efects on the EUT whic may b con idered

in ig ificant, an therefore ac e ta le

This clas ification may b u ed as a g ide in formulatin p rforman e criteria, by commite s

resp n ible for generic, prod ct an prod ct fami y stan ard , or as a framework for the

agre ment on p rforman e criteria b twe n the man facturer an the purc aser, for example

where no s ita le generic, prod ct or prod ct fami y stan ard exists

10 Test report

The test re ort s al contain al the information neces ary to re rod ce the test In p rtic lar,

the fol owin s al b recorded:

– the items sp cified in the test plan req ired by clau e 8 of this stan ard;

– identification of the EUT an an as ociated eq ipment, for example bran name, prod ct

typ , serial n mb r;

– identification of the test eq ipment, for example bran name, prod ct typ , serial n mb r;

– an sp cial en ironmental con ition in whic the test was p rformed, for example s ielded

en los re;

– an sp cific con ition neces ary to ena le the test to b p rformed;

– p rforman e level defined by the man facturer, req estor or purc aser;

– p rforman e criterion sp cified in the generic, prod ct or prod ct fami y stan ard;

– an ef ects on the EUT o served d rin or afer the a pl cation of the test disturb n e, an

the d ration for whic these efects p rsist;

– the rationale for the p s / fai decision (b sed on the p rforman e criterion sp cified in the

generic, prod ct or prod ct fami y stan ard, or agre d up n b twe n the man facturer an

the purc aser);

– an sp cific con ition of u e, for example ca le len th or typ , s ieldin or grou din , or

EUT o eratin con ition , whic are req ired to ac ieve complan e

Me s r i g

e uipme tu

Wa v eform

g n r ator

A s ur ceMAINS

n mb r 1

U

h:

n mb r 2

U

h:

n mb r 3

IE 8 /0

NOT Th r.m.s v lta e remain c n ta t d rin al h rmo ic te ts

Figure 4 – Te t s q e c s for in ividual harmo ic

(2)(5)

h = 5: 5 % of U

1/ 0°

Fig re 7 – Ov r swin wa e hape

Annex A

(informativ )

Impedance network between voltage source and EUT

Most test generators have an extremely low, ne r zero, imp dan e whic do s not present a

pro lem for testin However, if it can b determined by a prod ct commite that an

imp dan e network is desired to fin p s ible resonan e b twe n lne an the EUT that could

b ex ited by harmonic , the IEC 6 7 5 imp dan e network is s g ested

As a res lt of LC resonant circ its formed by network l ne imp dan e an ca acitor(s) in ide

an EUT, resonant phenomena ex ited by harmonic voltage sources can a p ar These

resonant phenomena can af ect the pro er o eration of an EUT

This le d to the neces ity to place an imp dan e b twe n the voltage fu damental an

harmonic source an the EUT Main disturb n e ef ects are l k ly to oc ur for hig -level

lower freq en y harmonic when they ex ite these resonant circ its

The IEC 6 7 5 imp dan e network (phase Z = 0,2 + j 0,15 Ω, neutral Z = 0,16 + j 0,10 Ω at

5 Hz) is sp cified to b in erted in the test set up b twe n the source an EUT to detect

p s ible damagin resonant phenomena ex ited by harmonic

The re resentative imp dan e for 6 Hz networks is s g ested as folows:

– for 12 / 2 8 V (phase Z = 0,10 + j 0,0 Ω, neutral Z = 0,10 + j 0,0 Ω)

– for 3 7 / 6 0 V (phase Z = 0,2 + j 0,0 Ω, neutral Z = 0,3 + j 0,0 Ω)

Prod ct commite s are fre to re lse ad itional tests with other imp dan e values con idered

to b of sig ificant interest with regard to interaction with the EUT

Annex B

(informativ )

Resonance point

A resonan e p int for example may b as umed, if the harmonic or interharmonic c r ent at a

con tant harmonic voltage ampltu e re c es a maximum value at a freq en y f

re, an the

c r ent decre ses by 3 dB in the freq en y ran e f

re

to 1,5 f

re A resonan e freq en y can

cau e sig ificant thermal disturb n es Thermal ef ects are not con idered in this stan ard

In practice, resonan es a p ar esp cialy at hig er freq en ies

Examp le :

A tran former is lo ded by a ca acitor The ca acitor cau es a risin tran former c r ent by

in re sin the freq en y If the le k ge in u tan e of the tran former an the ca acitor cau e

a resonan e, a p a in the ampl tu e of c r ent can oc ur If the freq en y is further

in re sed, the tran former c r ent decre ses

The harmonic an interharmonic c r ents can cau e ad itional dis ip tion in the tran former

This interaction can cau e a degradation of the p rforman e of an EUT The he tin ef ects

d e to this in re sed dis ip tion are not con idered in this stan ard

Annex C

(informativ )

Electromagnetic environment classes

The fol owin clas es of electromag etic en ironment have b en s mmarised from

IEC 610 0-2-4

Cla s 1

This clas a pl es to protected s p les an has comp tibi ty levels lower than publ c network

levels It relates to the u e of eq ipment very sen itive to disturb n es in the p wer s p ly, for

in tan e the in trumentation of tec nological la oratories, some automation an protection

eq ipment, some computers, etc

NOT 1 Cla s 1 e viro me ts n rmaly c ntain e uipme t whic re uire prote tio b s c a p ratu a u inte

r-ru tible p wer s p le (UPS) or fiters

NOT 2 If UPS with hig distortio le el is u e , cla s 2 ma b re omme d d

Cla s 2

This clas a ples to p ints of common coupln (PCC’s for con umer s stems) an in-plant

p ints of common coupln (IPC’s) in the in u trial en ironment in general The comp tibi ty

levels in this clas are identical to those of publc networks; therefore comp nents desig ed for

a plcation in publc networks may b u ed in this clas of in u trial en ironment

Cla s 3

This clas a ples only to IPC’s in in u trial en ironments It has hig er comp tibi ty levels

than those of clas 2 for some disturb n e phenomena For in tan e, this clas s ould b

con idered when an of the folowin con ition are met:

– a major p rt of the lo d is fed throu h con erters;

– weldin mac ines are present;

– large motors are freq ently started;

– lo d vary ra idly

NOT 1 Th s p ly to hig ly disturbin lo d , s c a arc-urn c s a d larg c n erters whic are g n raly

s p le from a s gre ate b s-b r, fre u ntly h s disturb n e le els in e c s of cla s 3 (h rs e viro me t In

s c s e ial situ tio s, th c mp tibi ty le els s o ld b a re d u o

NOT 2 Th cla s a plc ble for n w pla ts a d e te sio s of e istin pla ts s o ld relate to th ty e of

e uipme t a d pro e s u d r c n id ratio

Bibl ography

IEC 6 0 8-1: En iro me ntal testn – Part 1: G ene ralandguidance

IEC 6 7 5: Co nside rato ns o n refe re nce imp edance s foruse in de te rminin th disturbance

chara teristc o fh use ho ld ap p liance s and simiar ele ctric l e quip me t

IEC 610 0-2-4: Ele ctro mag etc co mp atbil y (EMC) – Part 2: En iro nme nt – Se cto n 4:

Co mp atbil y le ve ls in industrial p lants fo r lo w fre que ncy co nducte d disturbance s

_ _ _ _ _ _

An exe A (informative) Rése u d'mp dan e entre source de ten ion et EST 6

An exe B (informative) Point de résonan e 6

An exe C (informative) Clas es d'en iron ement électromag étiq e 6

Bibl ogra hie 6

COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE

1) L Commis io Ele trote h iq e Intern tio ale (IEC) e t u e org nis tio mo dialed n rmals tio c mp s e

d le s mble d s c mité éle trote h iq e n tio a x (Comité n tio a x d l EC) L’EC a p ur o jet d

fa oris r la c o ératio intern tio ale p ur to te le q e tio s d n rmals tio d n le d main s d

léle tricité et d léle tro iq e A c t efet, l EC – e tre a tre a tivité – p ble d s Norme intern tio ale ,

d s Sp cific tio s te h iq e , d s Ra p rts te h iq e , d s Sp cific tio s a c s ible a p blc (PAS) et d s

Guid s (ci-a rè d n mmé "Pu lc tio (s) d l EC") L ur éla oratio e t c nfié à d s c mité d'étu e , a x

tra a x d s u ls to t Comité n tio al intére s p r le s jet traité p ut p rticip r L s org nis tio s

intern tio ale , g u ern me tale et n n g u ern me tale , e lais n a e l EC, p rticip nt é aleme t a x

tra a x L’EC c la ore étroiteme t a e lOrg nis tio Intern tio ale d Normals tio (ISO), s lo d s

c n itio s fix e p r a c rd e tre le d u org nis tio s

2) L s d cisio s o a c rd oficiels d l EC c n ern nt le q e tio s te h iq e re ré e te t, d n la me ure

d p s ible, u a c rd intern tio al s r le s jets étu ié , éta t d n é q e le Comité n tio a x d l EC

intére s s s nt re ré e té d n c a u c mité d’étu e

3) L s Pu lc tio s d l EC s pré e te t s u la forme d re omma d tio s intern tio ale et s nt a ré e

c mme tele p r le Comité n tio a x d l EC To s le eforts rais n a le s nt e tre ris afin q e l EC

s'a s re d le a titu e d c nte u te h iq e d s s p blc tio s; l EC n p ut p s être te u re p n a le d

lé e tu le ma v is uti s tio o interprétatio q i e e t faite p r u q elc n u uti s te r fin l

4) Da s le b t d'e c ura er lu iformité intern tio ale, le Comité n tio a x d l EC s'e g g nt, d n to te la

me ure p s ible, à a plq er d fa o tra s are te le Pu lc tio s d l EC d n le rs p blc tio s n tio ale

et ré io ale To te div rg n e e tre to te Pu lc tio s d l EC et to te p blc tio s n tio ale o

ré io ale c re p n a te d iv nt être in iq é s e terme clairs d n c s d rnière

5) L’EC ele-même n fo rnit a c n ate tatio d c nformité De org nisme d c rtific tio in é e d nts

fo rnis e t d s s rvic s d'é alu tio d c nformité et, d n c rtain s cte rs, a c d nt a x marq e d

c nformité d l EC L’EC n'e t re p n a le d'a c n d s s rvic s efe tu s p r le org nisme d c rtific tio

in é e d nts

6) To s le uti s te rs d iv nt s'a s rer q ' s s nt e p s e sio d la d rnière é itio d c te p blc tio

7) Au u e re p n a i té n d it être imp té à l EC, à s s a ministrate rs, emplo é , a xi aire o ma d taire ,

y c mpris s s e p rts p rtic lers et le membre d s s c mité d'étu e et d s Comité n tio a x d l EC,

p ur to t préju ic c u é e c s d d mma e c rp rels et matériels, o d to t a tre d mma e d q elq e

n ture q e c s it, dire te o in ire te, o p ur s p orter le c ûts (y c mpris le frais d ju tic ) et le

d p n e d c ula t d la p blc tio o d luti s tio d c te Pu lc tio d l EC o d to te a tre

Pu lc tio d l EC, o a cré it q i lui e t a c rd

8) L'ate tio e t atiré s r le référe c s n rmativ s cité s d n c te p blc tio L'uti s tio d p blc tio s

référe c e e t o lg toire p ur u e a plc tio c re te d la pré e te p blc tio

9) L’ate tio e t atiré s r le fait q e c rtain d s éléme ts d la pré e te Pu lc tio d l EC p u e t faire

lo jet d droits d bre et L’EC n s urait être te u p ur re p n a le d n p s a oir id ntifié d tels droits

d bre ets et d n p s a oir sig aléle r e iste c

DÉGAGEMENT DE RESPONSABILITÉ

Cet e v rsion c ns l dé n’e t pa u e Norme IEC of iciel e, el e a été préparé par

c mmo ité po r l uti s te r Se le le v rsions c ura te d c t e n rme et d

s n(s s) ame deme t(s) doiv nt être c nsidéré s c mme le do ume ts of iciels

Cet e v rsion c n ol dé d l EC 610 0-4-13 porte le numéro d'é ition 1.2 El e

c mpre d la première é ition (2 0 -0 ) [doc me ts 7 A/3 8/FDIS et 7 A/3 7/RVD], s n

ame deme t 1 (2 0 -0 ) [doc me ts 7 A/6 8/CDV et 7 A/6 4/RVC] et s n ame d me t 2

(2 15-12) [do ume ts 7 A/9 4/FDIS et 7 A/916/RVD] Le c nte u te hnique e t ide tique

à c lui de lé itio de ba e et à s s ame deme ts

Da s c t e v rsion Re l n , un l g e v rtic le da s la marg indiqu ó le c nte u

te h iq e e t mo ifié par le ame d me ts 1 et 2 Le ajouts s nt e v rt, le

s ppre sio s s nt e ro ge, bar é s Un v rsion Finale a e to te le modific tions

a c pté s e t disponible da s c t e publ c tion

L Norme internationale IEC 610 0-4-13 a été éta l e p r le sou -comité 7 A: Phénomènes

b s e fréq en e, d comité d’étu es 7 de lIEC: Comp tibi té électromag étiq e

Cet e norme a le statut de publ cation fon amentale en CEM conformément au g ide10 de

l IEC

Cet e publcation a été rédigé selon les Directives ISO/IEC, Partie 3

L s an exes A, B et C sont don é s u iq ement à titre d’ nformation

L comité a décidé q e le conten de la publ cation de b se et de ses amen ements ne sera

p s modifié avant la date de sta i té in iq é s r le site we de l IEC sou

"htp:/we store.iec.c " dan les don é s relatives à la publcation rec erc é A cete date, la