Iec 60384 23 2015

Dimen ion an their as ociated toleran es, whic af fect interc an e bi ty an mou tin , s al b given in the detai sp cification.. When neces ary, for example when a n mb r of items sizes a

INTER NA TIONA L

Fixed capacit ors for use in elect ronic equipment –

Part 23: Sect ional specificat ion – Fixed met al iz d polyet hylene napht halat e fi m

dielect ric sur ace mount d.c capacit ors

Condensat eurs fixes ut il sés dans les équipement s élect roniques –

Part ie 23: Spécificat ion int ermédiaire – Condensat eurs fix es pour mont age en

sur ace pour courant cont inu à diélect rique en fi m de polynapht alat e d'ét hylène

THIS PUBLICATION IS COPYRIGHT PROTECTED

Copyr ight © 2 15 IEC, Ge e a, Switzer la d

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Abo t IEC p blc tio s

Th te h ic l c nte t of IEC p blc tio s is k pt u d r c n ta t r eview b th IEC Ple s ma e s re th t y u h v th

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IEC Cat alo ue - webst ore.e ch/ cat alo ue

Th st an -alo e a plc t io for c n ultin th e tire

biblo ra hic l informat io o IEC Intern tio al Sta d rd ,

Te h ic l Sp cific tio s, Te h ic l R ep rts a d oth r

d c me ts A v aia le for P , Ma OS, A ndroid Ta let s a d

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IEC p blc t i ns s arch - www ie ch/ se rch u

Th a v an e s arc e a le to fin IEC p blc t io s b a

variety of crit eria (efere c n mb r, t ext, t ec nic l

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7 ,8 a d CISPR

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If y ou wis to giv e u your fe d a k o t his p blc tio or

n e furt her a sist an e, ple s c nt act h Cu t omer Serv ic

Ce t re:c c@ie c

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CE 3 , 7 , 8 et CISPR d l EC

Serv ic Clent s - w ebst ore.e c h/ cs

INTER NA TIONA L

Fixed capacit ors for use in elect ronic equipment –

Part 23: Sect ional specificat ion – Fixed met al iz d polyet hylene napht halat e fi m

dielect ric sur ace mount d.c capacit ors

Condensat eurs fix es ut il sés dans les équipement s élect roniques –

Part ie 23: Spécificat ion int ermédiaire – Condensat eurs fix es pour mont age en

sur ace pour courant cont inu à diélect rique en fi m de poly apht alat e d'ét hylène

FOREWORD 5

1 General 7

1.1 Sco e 7

1.2 Object 7

1.3 Normative ref eren es 7

1.4 Inf ormation to b given in a detai sp cif i ation 7

1.4.1 General

7 1.4.2 Outlne drawin an dimen ion 8

1.4.3 Mou tin 8

1.4.4 Ratin s an c aracteristic 8

1.4.5 Markin 9

1.5 Terms an def i ition 9

1.6 Markin 9

1.6.1 General 9

1.6.2 Information f or markin 9

1.6.3 Markin of ca acitors 9

1.6.4 Markin on p c agin 10 2 Pref er ed ratin s an c aracteristic 10 2.1 Pref er ed c aracteristic 10 2.1.1 Prefer ed cl matic categories 10 2.2 Pref er ed values of ratin s 10 2.2.1 Nominal ca acitan e (C N ) 10 2.2.2 Toleran e on nominal ca acitan e 1

0 2.2.3 Rated voltage (U R ) 10 2.2.4 Category voltage (U C ) 1

2.2.5 Rated temp rature 1

3 Qual ty as es ment proced res 1

3.1 Primary stage of man facture 1

3.2 Stru tural y simi ar comp nents 1

3.3 Certified test record of rele sed lots 1

3.4 Qualfication a proval proced res 1

3.4.1 General 1

3.4.2 Qualfication a proval on the b sis of the fixed sample size proced re 12 3.5 Qual ty conf orman e in p ction 19 3.5.1 F rmation of in p ction lots 19 3.5.2 Test s hed le 2

3.5.3 Delayed delvery 2

3.5.4 As es ment levels 2

4 Test an me s rement proced res 21

4.1 Mou tin 21

4.2 Vis al examination an c ec of dimen ion 21

4.2.1 General 21

4.2.2 Vis al examination an c ec of dimen ion 21

4.5.2 Initial me s rement 2

4.5.3 Final in p ction an req irements 2

4.6 Resistan e to solderin he t 2

4.6.1 General 2

4.6.2 Initial in p ction 2

4.6.3 Test con ition 2

4.6.4 Recovery 2

4.6.5 Final in p ction an req irements 2

4.7 Soldera i ty 2

4.7.1 General 2

4.7.2 Test con ition 2

4.7.3 Final in p ction an req irements 2

4.8 Ra id c an e of temp rature 2

4.8.1 General 2

4.8.2 Initial in p ction 2

4.8.3 Test con ition 2

4.8.4 Final in p ction an req irements 2

4.9 Cl matic seq en e 2

4.9.1 General 2

4.9.2 Initial me s rements 2

4.9.3 Dry he t 2

4.9.4 Damp he t, c cl c, Test Db, first c cle 2

4.9.5 Cold 2

4.9.6 Damp he t, c cl c, Test Db, remainin c cles 2

4.9.7 Recovery 2

4.9.8 Final in p ction an req irements 2

4.10 Damp he t, ste d state 2

4.10.1 General 2

4.10.2 Initial in p ction 2

4.10.3 Test con ition 2

4.10.4 Recovery 2

4.10.5 Final in p ction an req irements 2

4.1 En uran e 2

4.1 1 General 2

4.1 2 Initial in p ction 2

4.1 3 Test con ition 2

4.1 4 Final in p ction an requirements 2

4.12 Charge an dis harge 2

4.12.1 General 2

4.12.2 Initial in p ction 2

4.12.3 Test con ition 2

4.13 Comp nent solvent resistan e (if req ired) 2

4.14 Solvent resistan e of markin (if eq ired) 2

Biblogra h 3

Ta le 1 – Percentage l mit of the rated voltage at a.c voltage feq en y 1

Ta le 2 – Test an sampl n plan for q al f i ation a proval As es ment level EZ 13 Ta le 3 – Test s hed le for q alf i ation a proval 14 Ta le 4 – L t-by-lot in p ction 2

Ta le 5 – Periodic tests 21

Ta le 6 – Test voltages 2

Ta le 7 – Tan ent of los an le lmits 2

Ta le 8 – Req irements regardin in ulation resistan e 2

Ta le 9 – Cor ection f actor de en ent on test temp rature 2

Ta le 10 – En uran e test Grade 1 an Grade 2 ca acitors 2

Ta le 1 – En uran e test Grade 3 ca acitors 2

Part 23: Sectional specification – Fixed metal ized polyethylene

naphthalate film dielectric surface mount d.c capacitors

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cific tio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (P S) a d Guid s (h re f ter ref er e to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n

n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio f or Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th f ormal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio fom al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th f orm of re omme d tio s f or intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble ef forts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible f or th wa in whic th y are u e or for a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nf ormity In e e d nt c rtific tio b die pro id c nf ormity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible f or a y

s rvic s c rie o t b in e e d nt c rtif i atio b die

6) Al u ers s o lde s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s f or a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or for c sts (in lu in le al f ee ) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s ble f or th c r e t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible for id ntif yin a y or al s c p te t rig ts

International Stan ard IEC 6 3 4-2 has b en pre ared by IEC tec nical commit e 4 :

Ca acitors an resistors f or electronic eq ipment

This secon edition can els an re laces the f irst edition publ s ed in 2 0 an con titutes a

tec nical revision

This edition in lu es the f ol owin sig if i ant tec nical c an es with resp ct to the previou

edition:

a) Revised al p rts of the doc ment b sed on the ISO/IEC Directives, Part 2:2 1 (sixth

edition) an harmonization b twe n other simiar kin s of doc ments

b) Revised ta les an Clau e 4 so as to prevent d pl cation an contradiction

The text of this standard is b sed on the fol owin doc ments:

Ful inf ormation on the votin for the a proval of this stan ard can b foun in the re ort on

votin in icated in the a ove ta le

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

The l st of al p rts of the IEC 6 3 4 series, u der the (new) general title Fix d c p citors for

use in electro ic e uipme t , can b fou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

• with rawn,

• re laced by a revised edition, or

1 General

1.1 Scope

This p rt of IEC 6 3 4 is a pl ca le to f i ed s rf ace mou t ca acitors for direct c r ent, with

metal zed electrodes an p lyeth lene na hthalate dielectric f or u e in electronic eq ipment

These ca acitors have metal zed con ectin p d or solderin strips an are inten ed to b

mou ted directly onto s bstrates for h brid circ its or onto printed b ard These ca acitors

may have "selfhe l n pro erties" de en in on con ition of u e They are primari y

inten ed for a pl cation where the a.c comp nent is smal with resp ct to the rated voltage

Ca acitors for radio inter eren e s p res ion are not in lu ed, they are covered by

IEC 6 3 4-14

1.2 Obje t

The o ject of this stan ard is to pres rib prefer ed ratin s and c aracteristic an to select

f rom IEC 6 3 4-1, the a pro riate q al ty as es ment proced res, tests an me s rin

method an to give general p rf orman e req irements f or this typ of ca acitor Test

severities an req irements pres rib d in detai sp cification refer in to this sectional

sp cification s al b of eq al or hig er p r orman e level, lower p rf orman e levels are not

p rmited

1.3 Normativ ref ere c s

The fol owin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated referen es, only the edition cited a ples For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 2, Mark ing c des for resistors a d c p citors

IEC 6 0 3, Prefered n mb r series for resistors a d c p citors

IEC 6 0 8-1:2 13, Enviro me t al testin – P art 1: Ge eral a d g id an e

IEC 6 3 4-1:2 0 , Fixed c p cit ors for use in el ectro ic e uipme t – Part 1: Ge eric

sp cific tio

IEC 61 9 -2:2 0 , Qu l ity as es me t syst ems – Part 2: Select ion a d use of sampl ing

pla s for inspe tion of el ectro ic c mp n nts a d p ck ag s

ISO 3, Prefered n mb rs – Series ofprefer ed n mb rs

1.4 Inf ormation to be giv n in a detai spe if ic tion

Detai sp cification s al not sp cify req irements inferior to those of the generic, sectional

or blan detai sp cification When more severe req irements are in lu ed, they s al b

l sted in 1.9 of the detai sp cification an in icated in the test s hed les, for example by an

asteris

The information given in 1.4.2 may, f or con enien e, b presented in ta ular form

The folowin information s al b given in e c detai sp cif i ation an the values q oted

s al pref era ly b selected f rom those given in the a pro riate clau e of this sectional

sp cification

1.4.2 Outl ne drawing a d dime sions

There s al b an i u tration of the ca acitor as an aid to e s recog ition an f or comp rison

of the ca acitor with others Dimen ion an their as ociated toleran es, whic af fect

interc an e bi ty an mou tin , s al b given in the detai sp cification Al dimen ion s al

prefera ly b stated in mi imetres, however, when the original dimen ion are given in in hes,

the con erted metric dimen ion in mi imetres s al b ad ed

The n merical values of the b d s al b given as f ol ows:

– width, len th an heig t

The n merical values of the terminals s al b given as f ol ows:

– width, len th an sp cin

When neces ary, for example when a n mb r of items (sizes an ca acitan e/voltage ran es)

is covered by a detai sp cif i ation, the dimen ion an their as ociated toleran es s al b

placed in a ta le b low the drawin

When the config ration is other than des rib d a ove, the detai sp cification s al state s c

dimen ional information as wi adeq ately des rib the ca acitor

1.4.3 Mountin

The detai sp cification s al give g idan e on method of mou tin f or normal u e Mou tin

f or test an me s rement purposes (when req ired) s al b in ac ordan e with 4.1

1.4.4 Ratin s a d c ara teristic

The ratin s an c aracteristic s al b in ac ordan e with the relevant clau es of this

sp cification, together with the fol owin

1.4.4.2 Nominal c pa ita c ra ge

Se 2.2.1

When prod cts a proved to the detai sp cification have dif ferent nominal ca acitan e ran es,

the fol owin statement s ould b ad ed: "The nominal ca acitan e ran e avai a le in e c

voltage ran e is given on the IEC onl ne service, www.iec org/certif i ates."

1.4.4.3 Partic lar c ara teristic

The detai sp cif i ation s al sp cify the content of the markin on the ca acitor an on the

p c agin Deviation fom 1.6 s al b sp cifical y stated

1.5 Terms a d def initions

For the purp ses of this doc ment, the terms an definition given in IEC 6 38 -1:2 0 , as

wel as the f ol owin a ply

<general purp se ca acitors f or general a pl cation where the strin ent req irements f or

grade 1 ca acitors are not neces ary

1.5.3

perf orma c gra e 3 c pa itors

<low temp rature, miniature typ > miniature typ ca acitors havin a rated temp rature of 8

°C an f or whic les strin ent req irements than for grade 2 ca acitors are ac e ta le

1.6 Marking

Se IEC 6 3 4-1:2 0 , 2.4, with the fol owin detais

1.6.2 Inf ormation f or marking

The information given in the markin is normal y selected f om the fol owin l st The relative

imp rtan e of e c item is in icated by its p sition in the l st:

a) nominal ca acitan e (in cle r or code ac ordin to IEC 6 0 2);

b) rated voltage (d.c voltage may b in icated by the s mb l or );

c) toleran e on nominal ca acitan e;

d) category voltage;

e) year an month (or we k) of man facture;

f ) man facturer's name or trade mark;

g) clmatic category;

h) man facturer's typ desig ation;

i) referen e to the detai sp cification

NOT In item b) th first s mb l h s b e ta e fom IEC 6 417-5 31:2 0 - 0, s mb l for "Dire t c re t"

1.6.3 Marking on c pa itors

An markin s al b legible an not e si y sme red or removed by rub in with a fin er

1.6.4 Marking on pa k gin

The p c agin containin ca acitors s ould b cle rly marked with al the inf ormation l sted in

1.6.2 as neces ary

2 Pref er ed ratings and c ara teristics

The values given in detai sp cification s al pref era ly b selected f rom the f ol owin

2.1.1 Prefer e cl matic c te orie

The s r ace mou t ca acitors covered by this sp cification are clas ified into cl matic

categories ac ording to the general rules given in IEC 6 0 8-1:2 13, An ex A

The lower an up er category temp ratures an the d ration of the damp he t, ste d state

test s al b c osen f rom the folowin :

L wer category temp rature: – 5 °C, – 0 °C an – 5 °C

Up er category temp rature: + 5 °C (only grade 3); +10 °C, +12 °C an +15 °C

Duration of the damp he t, ste d state test: 4, 10, 21 an 5 day

With contin ou o eration at 12 °C in ex es of the en uran e test time, ac elerated agein

has to b con idered (se detai sp cification)

The severities f or the cold an dry he t tests are the lower an up er category temp ratures

resp ctively

2.2 Prefer e v lue of ratin s

N)

Prefer ed values of nominal ca acitan e s al b taken fom the E6 series of IEC 6 0 3:

1,0 – 1,5 – 2,2 – 3,3 –, 4,7 an 6,8 an their decimal multiples (× 10

The pref er ed values of rated voltage taken f rom R 10 series of ISO 3 are:

1 0 0 3

2.2.4 Cate ory volta e (U

C)

The category voltage for Grade 1 an Grade 2 ca acitors is:

– f or up er category temp rature 12 °C: 0,8 U

an for Grade 3 ca acitors is:

– f or up er category temp rature 10 °C: 0,8 U

R

;

– f or up er category temp rature 12 °C: 0,5 U

R

Grade 1 an Grade 2 ca acitors:

the stan ard value of rated temp rature is 10 °C

Grade 3 ca acitors:

the stan ard value of rated temp rature is 8 °C

3.1 Primary sta e of ma ufa ture

The primary stage of man facture is the win in of the cap citor element or the eq ivalent

o eration

3.2 Structural y simi ar compon nts

Ca acitors con idered as b in stru tural y simiar are ca acitors prod ced with simi ar

proces es an materials, thou h they may b of diff erent case sizes an ca acitan e an

voltage values

3.3 Certif ie te t re ords of rele s d lots

The information req ired in IEC 6 3 4-1:2 0 , Q.9 s al b made avai a le when pres rib d

in the detai sp cification an when req ested by a purc aser Af ter the en uran e test the

req ired p rameters are the ca acitan e, tan δ an the in ulation resistan e

3.4 Qual fic tion approv l proc dure

The proced res for q al fication a proval testin are given in IEC 6 38 -1:2 0 , Q.5

The s hed le to b u ed f or q al fication a proval testin on the b sis of lot-by-lot an

p riodic tests is given in 3.5 The proced re u in a f i ed sample size s hed le is given in

3.4.2 b low

3.4.2 Qual fic tion approv l on the basis of th fix d s mple size proc dure

3.4.2.1 Sampl ng

The fixed sample size proced re is des rib d in IEC 6 3 4-1:2 0 , Q.5.3, l st item b) The

sample s al b re resentative of the ran e of ca acitors for whic a proval is sou ht The

sample may b the whole or p rt of the ran e given in the detai sp cification

The sample s al con ist of four sp cimen havin the maximum an minimum rated voltages,

an , for these voltages, the maximum an minimum ca acitan es When there are more than

f our rated voltages an intermediate voltage s al also b tested Th s, for the a proval of a

ran e, testin is req ired of either f our or six values (ca acitan e/voltage combination )

When the ran e con ists of les than f our values, the n mb r of sp cimen to b tested s al

b that req ired for four values

Sp re sp cimen are p rmit ed as fol ows:

Two (for six values) or thre (for four values) p r value whic may b u ed as re lacements

f or sp cimen whic are non-conformin b cau e of in idents not at ributa le to the

man f acturer

The n mb rs given in Group 0 as ume that al groups are a pl ca le If this is not so the

n mb rs may b red ced ac ordin ly

When ad itional groups are introd ced into the q al f i ation a proval test s hed le, the

n mb r of sp cimen req ired f or Group 0 s al b in re sed by the same n mb r as that

req ired for the ad itional groups

Ta le 2 gives the n mb r of samples to b tested f or e c group with the p rmis ible n mb r

of non-conf ormin items for q al fication a proval tests

3.4.2.2 Te ts

The complete series of tests sp cified in Ta le 2 an Ta le 3 are req ired f or the a proval of

ca acitors covered by one detai sp cif i ation The tests of e c group s al b car ied out in

Ap roval is granted when the n mb r of non-conf ormin items is zero

Ta le 2 an Ta le 3 together form the fixed sample size test s hed le for the q al fication

a proval on the b sis of the fixed sample size proced re

Ta le 2 gives the n mb r of the samples an p rmis ible non-conformin items for e c test

an test group

Sp cime s f ou d d fe tiv after mo ntin s al n t b ta e into a c u t wh n c lc latin th p rmis ible

n n-c nformin items f or th folowin te ts Th y s al b re la e b s are p rts

Wh n dif fere t s b trate materials are u e f or th in ivid al gro p of 3.1 to 3.4, th d tai s e ific tio s o ld

in ic te whic s b trate material is u e in th gro p 3.1 to 3.4

These tests s al b car ied out on a lot-by-lot b sis

A man facturer may ag regate the c r ent prod ction into in p ction lots s bject to the

f ol owin safeg ard :

a) the in p ction lot s al con ist of stru tural y simi ar ca acitors (se 3.2);

b) the sample tested s al b re resentative of the values an dimen ion contained in the

in p ction lot:

– in relation to their n mb r;

– with a minimum of f i e of an one value

c) if there are les than five of an one value in the sample the b sis for the drawin of

samples s al b agre d b twe n the man facturer an a certification b d (CB)

3.5.1.2 Group C in pe tion

These tests s al b car ied out on a p riodic b sis

Samples s al b re resentative of the c r ent prod ction of the sp cified p riod an s al

b divided into smal , medium an large sizes In order to cover the ran e of a provals in an

p riod, one voltage s al b tested f rom e c group of sizes In s bseq ent p riod other

sizes an /or voltage ratin s in prod ction s al b tested with the aim of coverin the whole

When ac ordin to the proced res of IEC 6 3 4-1:2 0 , Q.10 re-in p ction has to b made,

soldera i ty an ca acitan e s al b c ec ed as sp cified in Group A an Group B

na

Th in p ctio s al b p rf orme after remo al of n n-c nf ormin items b 10 % te tin d rin th

ma ufa turin pro e s Th s mpln le el s al b e ta ls e b th ma ufa turer, prefera ly a c rdin to

IEC 61 9 -2:2 0 , An e A

Wh th r th lot wa a c pte or n t, al s mple f or s mpln in p ctio s al b in p cte in ord r to

mo itor o tg in q alty le el b n n-c nformin items p r mi io (×10

Th c nte t of th in p ctio s b ro p is d s rib d in Cla s 2 of th bla k d tais s e if i atio

Vis al examination s al b car ied out with s ita le eq ipment with a proximately 10×

mag ification an l g tin a pro riate to the sp cimen u der test an the q al ty level

req ired

The o erator s ould have avai a le faci ties f or in ident or tran mited i umination as wel as

an a pro riate me s rin faci ty

4.2.3 Re uireme ts

The ca acitors s al b examined to verify that the materials, desig , con tru tion, ph sical

dimen ion an workman hip are in ac ordan e with the a plca le req irements given in the

detai sp cif i ation

The voltages given in Ta le 6 s al b a pled b twe n terminals, the me s ring p ints 1a) of

IEC 6 3 4-1:2 0 , Ta le 3 f or a p riod of 1 min for q al f i ation a proval testin an for a

p riod of 1 s for the lot-by-lot q al ty conf orman e testin

There s al b no bre k own or f las over d rin the test

NOT Th o c re c of s lfh aln bre k own d rin th a plc tio of th te t v lta e is alowe

The a pl ed p ak voltage at 1 0 0 Hz s al not ex e d 3 % of the rated voltage, an the

a pl ed p ak voltage at 5 Hz to 12 Hz s al not ex e d 2 % of the rated voltage with a

Se 6 3 4-1:2 0 , 4.8 with the f ol owin detai s:

4.3.3.2 Me s ring conditions for me s reme ts at 1 0 0 Hz

Prior to the test, ca acitors s al b caref ul y cle ned to remove an contamination Care

me s rements

Before the me s rement, the ca acitors s al b f ul y dis harged The prod ct of the

resistan e of the dis harge circ it an the nominal ca acitan e of the ca acitor u der test

s al b ≥ ,01 s or an other value pres rib d in the detai sp cification

The me s rin voltage s al b in ac ordan e with IEC 6 3 4-1:2 0 , 4.5.2 The me s rin

p ints s al b in ac ordan e with IEC 6 3 4-1:2 0 , Ta le 3

The voltage s al b a pl ed immediately at the cor ect value throug the internal resistan e

of the voltage source

The prod ct of the internal resistan e an the nominal ca acitan e of the ca acitor s al b

smal er than 1 s or an other value pres rib d in the detai sp cif i ation

4.3.4.3 Re uireme ts

The in ulation resistan e s al me t the req irements of Ta le 8

Table 8 – Re uireme ts re arding ins lation re ista c

Minimum RC pro uct (R = insulatio

re istanc betwe n the terminatio s,

C = n minal c pa itanc C

N)

Minimum insulatio re istanc betwe n

the terminatio s

When the test is car ied out at a temp rature other than 2 °C, the res lt s al , when

neces ary, b cor ected to 2 °C by multiplyin the res lt of the me s rement by the

a pro riate cor ection factor In case of doubt, me s rement at 2 °C is decisive The

cor ection factors given in Ta le 9 can be con idered as an average f or metal zed

p lyeth lene na hthalate f ilm ca acitors

Table 9 – Cor e tion fa tor depe de t on te t temperature

Temperature

4.5.2 Initial inspe tion

Ca acitan e s al b me s red ac ordin to 4.3.2

4.5.3 Final inspe tions a d re uireme ts

The ca acitan e in the b ard b n in p sition s al b me s red

The ca acitan e value an vis al examination s al me t the req irements s own in Ta le 3

The ca acitan e s al b me s red ac ordin to 4.3.2.

4.6.3 Te t con itions

Test con ition are as fol ows:

− Method: Method 1 or 2, u les otherwise sp cified in detai sp cif i ation;

− Duration: 5 s ± 0,5 s or 10 s ± 1 s, u les otherwise sp cif ied in detai sp cif i ation

If Method 1 is a pl ed, immersion an with rawal sp ed s al b 2 mm/s ± 2,5 mm/s

The recovery p riod s al b 2 h ± 2 h

4.6.5 Final inspe tions a d re uireme ts

After recovery the ca acitors s al b vis al y examined an me s red an s al me t the

f ol owin req irements

Un er normal l g tin an a proximately 10× mag if i ation, there s al b no sig s of damage

The test con ition s al b sp cified in the detai sp cification Precon itioning or agein , is

not req ired, u les otherwise sp cif ied in the detai sp cification

4.7.3 Final inspe tion a d re uireme ts

The ca acitor s al then b vis al y examined un er normal l g tin an a proximately 10×

mag ification There s al b no sig s of damage

The are s to b soldered s al b covered with a smo th an brig t solder co tin with no

more than a smal amou t of s atered imp r ection s c as pin oles or u -weted or d

e-wet ed are s These imp rf ection s al not b con entrated in one are

4.8 Rapid c a g of temperature

The ca acitors s al b mou ted ac ordin to 4.1.

4.8.2 Initial inspe tions

The ca acitan e s al b me s red ac ordin to 4.3.2

The tan ent of los an le s al b me s red ac ordin to 4.3.3

4.8.3 Te t con itions

Test con ition are as fol ows:

– ca acitors s al b tested for 5 c cles;

– the d ration of exp s re at e c temp rature l mit s al b 3 min

4.8.4 Final inspe tions a d re uireme ts

The ca acitors s al b vis al y examined an s al me t the req irements given in Ta le 3

4.9 Cl matic s que c

Se IEC 6 3 4-1:2 0 , 4.21 with the fol owing detais:

The ca acitors s al b mou ted ac ordin to 4.1

4.9.2 Initial inspe tions

The ca acitan e s al b me s red ac ordin to 4.3.2

The tan ent of los an le s al b me s red ac ordin to 4.3.3

4.9.6 Damp h at, cy l c, Te t Db, remaining c cle

Se IEC 6 3 4-1:2 0 , 4.21.6 with the fol owin detai s:

Within 15 min af ter removal f rom the damp he t test, the rated voltage s al b a pled f or

1 min at me s rin p int 1a) u in the test circ it con ition as given in 4.3.1

The recovery p riod s al b 1 h to 2 h, u les otherwise sp cified in the detai sp cification

4.10.1 Ge eral

Se IEC 6 3 4-1:2 0 , 4.2 with the folowin detais:

The ca acitors s al b mou ted ac ordin to 4.1

4.10.2 Initial inspe tions

The ca acitan e s al b me s red ac ordin to 4.3.2

The tan ent of los an le s al b me s red ac ordin to 4.3.3

4.10.3 Te t conditions

Test con ition are as f ol ows:

– Relative h midity: (9 ± 3) %;

4.10.4 Re ov ry

The recovery p riod s al b 1 h to 2 h

4.10.5 Final inspe tion a d re uireme ts

After recovery, the ca acitors s al b vis al y examined an me s red an s al me t the

req irements given in Ta le 3

Se IEC 6 3 4-1:2 0 , 4.2 with the fol owin detais:

The ca acitors s al b mou ted ac ordin to 4.1

4.1 2 Initial inspe tions

The ca acitan e s al b me s red ac ordin to 4.3.2

The tan ent of los an le s al b me s red ac ordin to 4.3.3

4.1 3 Te t conditions

Grade 1 ca acitors s al b tested f or 2 0 0 h, Grade 2 an Grade 3 ca acitors for 1 0 0 h,

as given in Ta le 10 an Ta le 1

Table 10 – En ura c te t Gra e 1 a d Gra e 2 c pa itors

Table 1 – End ra c te t Gra e 3 c pa itors

The test voltage s al b a pled to e c ca acitor in ivid al y throu h a resistor whose value

R is eq al to 0,0 2/C

N(Ω), where C

N

is the nominal ca acitan e in farad R s al b within

3 % of the calc lated value with a maximum of 2 MΩ

After the sp cified p riod the ca acitors s al b al owed to recover an s al then b

dis harged acros the same resistor R as def i ed in a ove

The ca acitan e s al b me s red ac ordin to 4.3.2

The tan ent of los an le s al b me s red ac ordin to 4.3.3

4.12.3 Te t conditions

The ca acitors s al b s bjected to 10 0 0 c cles of c arge an dis harge at a rate of

a proximately one c cle p r secon Eac c cle s al con ist of c argin an dis hargin the

ca acitor Eac ca acitor s al b in ivid al y c arged with the rated voltage throu h a

resistor with a value

(2 0 × 10

–6

) C

N(Ω)

Bibl ogr aphy

IEC 6 0 8 (al p rts), Enviro me tal t esting

1

IEC 6 3 4-14, Fix d c p cit ors for use in el ectro ic e uipme t – Part 14: Se t ion l

sp cific t ion – F ix d c p citors for electroma n tic interere c su pres ion a d c n e t ion

to t he su ply mains

IEC 6 3 4-2 -1, Fix d c p citors for use in el ectro ic e uipme t – Part 2 -1: Bla k d eta

sp cific tio – Fix ed sura e mo nt metal lized p ly thyl en n p t halat e film d iel ectric DC

c p citors – As es me t l evel EZ

_ _