Iec 60384 13 2011

IEC 60384 13 Edition 4 0 2011 12 INTERNATIONAL STANDARD NORME INTERNATIONALE Fixed capacitors for use in electronic equipment – Part 13 Sectional specification – Fixed polypropylene film dielectric me[.]

Scope

This section of IEC 60384 pertains to fixed direct current capacitors that utilize polypropylene film as the dielectric and thin metal foils as electrodes These capacitors are designed specifically for application in electronic equipment.

Capacitors for electromagnetic interference suppression are not included, but are covered by

Object

This standard aims to define preferred ratings and characteristics for capacitors, selecting appropriate quality assessment procedures, tests, and measurement methods from IEC 60384-1 It establishes general performance requirements, ensuring that the test severities and specifications referenced meet or exceed a specified performance level, as lower performance levels are not acceptable.

Normative references

The following referenced documents are indispensable for the application of this document

For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments) applies

IEC 60063:1963, Preferred number series for resistors and capacitors

IEC 60068-1, Environmental testing – Part 1:General and guidance

IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic specification

IEC 60384-13-1, Fixed capacitors for use in electronic equipment – Part 13-1: Blank detail specification – Fixed polypropylene film dielectric metal foil d.c capacitors – Assessment level E and EZ

IEC 60384-14, Fixed capacitors for use in electronic equipment – Part 14: Sectional specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains

IEC 60410:1973, Sampling plans and procedures for inspection by attributes

IEC 61193-2, Quality assessment systems – Part 2: Selection and use of sampling plans for inspection of electronic components and packages

ISO 3, Preferred numbers – Series of preferred numbers

Information to be given in a detail specification

Detail specifications shall be derived from the relevant blank detail specification

Detail specifications must not impose requirements that are lower than those outlined in the generic, sectional, or blank detail specifications If more stringent requirements are included, they should be documented in section 1.9 of the detail specification and clearly marked in the test schedules, such as with an asterisk.

NOTE The information given in 1.4.1 may, for convenience, be presented in tabular form

The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional specification

This article provides an illustration of a capacitor to facilitate easy recognition and comparison with other components It includes detailed specifications on dimensions and tolerances that impact interchangeability and mounting, with all measurements preferably expressed in millimeters.

Numerical values for the length, width, and height of the body, as well as wire spacing, should be provided For cylindrical types, include the body diameter and the length and diameter of the terminations When detailing multiple items, such as capacitance values or voltage ranges, dimensions and their associated tolerances must be presented in a table below the drawing.

For configurations differing from the specified standards, the detailed specification must include sufficient dimensional information to accurately describe the capacitor Additionally, if the capacitor is not intended for use on printed boards, this must be explicitly mentioned in the detailed specification.

The detail specification must outline the mounting methods for standard use, as well as for vibration and shock testing applications Capacitors should be mounted using conventional methods, but if the design necessitates special mounting fixtures, these must be detailed in the specification and utilized during vibration and shock tests.

The ratings and characteristics shall be in accordance with the relevant clauses of this specification, together with the following

Additional characteristics may be listed, when they are considered necessary to specify adequately the component for design and application purposes

The detail specification shall prescribe the test methods, severities and requirements applicable for the solderability and the resistance to solder heat test

The detail specification shall specify the content of the marking on the capacitor and on the package Deviations from 1.6 of this sectional specification shall be specifically stated.

Terms and definitions

For the purpose of this document, the terms and definitions given in IEC 60384-1 and the following apply

1.5.1 stability class tolerance on the temperature coefficient together with the permissible change of capacitance after defined tests

NOTE 1 The stability class is stated in the detail specification

NOTE 2 Table 2 shows the preferred stability classes

U R maximum d.c voltage which may be applied continuously to a capacitor at the rated temperature

The total of the direct current (d.c.) voltage and the peak alternating current (a.c.) voltage applied to a capacitor must not surpass its rated voltage Additionally, the peak a.c voltage should remain within specified percentages of the rated voltage at designated frequencies and must not exceed 280 V.

10 000 Hz: 1 % unless otherwise specified in the detail specification.

Marking

See IEC 60384-1, 2.4 with the following details

The information given in the marking is normally selected from the following list; the relative importance of each item is indicated by its position in the list

– rated voltage (d.c voltage may be indicated by the symbol or );

– year and month (or week) of manufacture;

– manufacturer’s name or trade mark;

– temperature coefficient and stability class;

– reference to the detail specification;

The capacitor must be distinctly labeled with items a), b), and c) from section 1.6.1, along with as many additional relevant items as deemed necessary It is essential to prevent any duplication of information in the capacitor's markings.

The package containing the capacitor(s) shall be clearly marked with all the information listed in 1.6.1

Any additional marking shall be so applied that no confusion can arise

Preferred characteristics

The values given in detail specifications shall preferably be selected from the following

The capacitors covered by this specification are classified into climatic categories according to the general rules given in IEC 60068-1

The lower and upper category temperatures and the duration of the damp heat, steady-state test shall be chosen from the following:

• Duration of the damp heat, steady-state test: 10, 21 and 56 days

The severities for the cold and dry heat tests are the lower and upper category temperatures respectively

Assisted drying is conditionally for a period between 1 h and 6 h at a temperatures (55 ± 2) °C and a relative humidity not exceeding 20 %.

Preferred values of ratings

Preferred values of nominal capacitance are to be taken from the E 6, E 12, E 24, E 48 and

The preferred tolerances on nominal capacitance are given in Table 1

Preferred series Preferred tolerance Tolerance code

In all cases, the minimum tolerance is ±1 pF Additional values of capacitance outside the

E96 range and additional tolerances may be specified

The preferred values of rated voltages are: 40 V – 63 V – 100 V – 160 V – 250 V and their decimal multiples These values conform to the basic series of preferred values R 5 given in

2.2.4 Stability classes in relation to temperature coefficients and change of capacitance

Table 2 presents the preferred values of temperature coefficients (α) along with their associated tolerances, permissible changes in capacitance, and preferred combinations of these values, which are categorized as stability classes.

The table is not valid for capacitance values smaller than 50 pF

Table 2 – Preferred values and combinations

Stability class Temperature coefficient α and tolerance in parts per million per degree Kelvin

Permissible change of capacitance a Upper category temperature

3 ±40 ±50 ±100 ±60 ±125 ±80 ±160 ±160 ±120 ±250 ±250 ±(0,5 ％ +0,5 pF) ±(1 ％ +1 pF) ±(2 ％ +2 pF) ±(1 ％ +0,5 pF) ±(2 ％ +1 pF) ±(5 ％ +2 pF) ±(1 ％ +0,5 pF) ±(2 ％ +1 pF) ±(5 ％ +2 pF) a Permissible change of capacitance after each of the following tests:

At 85 °C the category voltage is equal to the rated voltage (U R ) For upper category temperature of 100 °C, the category voltage is equal to 0,7 U R

The standard value of rated temperature is 85 °C

Primary stage of manufacture

The primary stage of manufacture is the winding of the capacitor element or the equivalent operation.

Structurally similar components

Capacitors considered as being structurally similar are capacitors produced with similar processes and materials, though they may be of different case sizes and values.

Certified records of released lots

Clause Q.9 of Annex Q of IEC 60384-1 mandates that specific information must be provided in the detail specification and upon request by the purchaser Following the endurance test, the key parameters that require variable information include capacitance change, tan δ, and insulation resistance.

Qualification approval

The procedure for qualification approval testing is given in Clause Q.5 of IEC 60384-1

The qualification approval testing schedule, based on lot-by-lot and periodic tests, is outlined in Clause Q.5 of IEC 60384-1 The procedure for utilizing a fixed sample size schedule is detailed in sections 3.4.1 and 3.4.2.

3.4.1 Qualification approval on the basis of the fixed sample size procedures

The fixed sample size procedure outlined in item b) of Q.5.3 of IEC 60384-1 requires that the sample be representative of the capacitor range for which approval is being requested This sample may not necessarily encompass the entire range specified in the detail specification.

The testing samples must include specimens with the lowest and highest voltages, as well as the corresponding lowest and highest capacitances If there are more than four rated voltages, an intermediate voltage must also be tested To approve a range, testing is necessary for either four or six capacitance/voltage combinations In cases where the range has fewer than four values, the number of specimens tested should still meet the requirements for four values.

Spare specimens are permitted two or three per value which may be used as replacements for specimens which are non-conforming because of incidents not attributable to the manufacturer

The numbers given in Group 0 assume that all groups are applicable If this is not so, the numbers may be reduced accordingly

When new groups are added to the qualification approval test schedule, the number of specimens needed for Group 0 must be increased by the same amount as that required for the new group.

Table 1 gives the number of samples to be tested in each group or subgroup together with the permissible number of non-conforming items for qualification approval tests

To obtain approval for capacitors outlined in a specific detail specification, it is essential to conduct the complete series of tests listed in Table 3 and Table 4 The tests must be performed sequentially, following the prescribed order for each group.

The whole sample shall be subjected to the tests of Group 0 and then divided for the other groups

Specimens found non-conforming during the tests of Group 0 shall not be used for the other groups

“One non-conforming” is counted when a capacitor has not satisfied the whole or a part of the tests of a group

Approval is granted when the number of non-conforming items does not exceed the allowable limits for each group or subgroup, as well as the overall permissible total for non-conforming items.

Tables 3 and 4 collectively establish the fixed sample size test schedule Table 3 outlines the sampling details and permissible non-conformities for various tests, while Table 4, along with the information in Clause 4, provides a comprehensive summary of test conditions and performance requirements It also highlights areas where choices must be made regarding test methods or conditions in the detailed specification.

The conditions of the test and performance requirements for the fixed sample size test schedule shall be identical to those prescribed in the detail specification for quality conformance inspection

Table 3 – Sampling plan together with numbers of permissible non-conformance for qualification approval test

Group number Test Subclause of this publication

Number of permissible conformance ( non- b c )

Solvent resistance of the marking

24 0 a As required in the detail specification b Not more than one non-conformity is permitted from any one value

Table 4 – Test schedule for qualification approval

Subclause number and test a or D

Number of specimens ( n ) and number permissible of conformances non- ( c )

Legible marking and as specified in the detail specification

4.1 Dimensions (detail) See detail specification

4.2.1 Voltage proof No break down or flashover

4.2.2 Capacitance Frequency 1 kHz Within specified tolerance

4.2.3 Tangent of loss angle (tan δ ) See detail specification for the method As in 4.2.3.2

4.2.4 Insulation resistance See detail specification for the method As in 4.2.4.2

4.3 Robustness of terminations Visual examination No visible damage

4.4 Resistance to soldering heat No pre-drying

See detail specification for the method (1A or 1B) Recovery: 1 h to 2 h

4.4.2 Final measurements Visual examination No visible damage

Capacitance ∆C/C: Within limit for relevant stability class at upper category temperature as specified in 2.2.4 and compared to values measured in 4.3.1

Tangent of loss angle As in 4.2.3.2

See detail specification for the method

Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within…s, as applicable

4.14 Solvent resistance of the marking

Method 1 Rubbing material: cotton wool Recovery time: …

Tangent of loss angle 4.6 Rapid change of temperature T A = Lower category temperature

T B = Upper category temperature Five cycles

Visual examination No visible damage

4.7 Vibration For mounting method, see detail specification Frequency range: from … Hz to

…Hz Amplitude: 0,75 mm or acceleration 100 m/s 2 : … (whichever is the less severe) Total duration: 6 h

4.7.2 Final inspection Visual examination No visible damage

Tangent of loss angle As per 4.2.3.2

The article discusses the specifications for bumps and shocks, detailing the mounting methods It includes critical parameters such as the number of bumps, acceleration measured in m/s², and the duration of the pulse in milliseconds.

D Visual examination See Table 3 No visible damage

4.10.2 Dry heat Temperature: Upper category temperature Duration: 16 h 4.10.3 Damp heat, cyclic, Test Db, first cycle

4.10.4 Cold Temperature: lower category temperature Duration: 2 h 4.10.5 Low air pressure

(if required by the detail specification)

No permanent breakdown flashover or harmful deformation of the case 4.10.6 Damp heat, cyclic, Test Db, remaining cycles

4.10.6.2 Final measurement Visual examination No visible damage

Capacitance ∆C/C: Within limit for relevant stability class at

85 ℃ as specified in 2.2.4 and compared to values measured in 4.4.2, 4.8.5 or 4.9.5 as applicable

Tangent of loss angle tan δ ≤ 1,4 times values measured in 4.3.1 or 4.6.1, as applicable

Insulation resistance ≥50 % of values of 4.2.4.2

Tangent of loss angle at 1 kHz Recovery: 1 h to 2 h

4.11.3 Final measurement Visual examination No visible damage

85 ℃ as specified in 2.2.4 and compared to values measured in 4.11.1

Tangent of loss angle tan δ ≤ 1,4 times values measured in 4.11.1

Tangent of loss angle tan δ as in 4.2.3.2 or ≤1,4 times values measured in 4.12.1, whichever is greater

Capacitance As in 4.2.5 a Subclause numbers of test and performance requirements refer to Clause 4 – Test and measurement procedures b In this table: D = destructive, ND = non-destructive.

Visual examination and check of dimensions

Legible marking and as specified in the detail specification

4.1 Dimensions (detail) See detail specification

4.2.1 Voltage proof No break down or flashover

4.2.2 Capacitance Frequency 1 kHz Within specified tolerance

4.2.3 Tangent of loss angle (tan δ ) See detail specification for the method As in 4.2.3.2

4.2.4 Insulation resistance See detail specification for the method As in 4.2.4.2

4.3 Robustness of terminations Visual examination No visible damage

4.4 Resistance to soldering heat No pre-drying

Capacitance As in 4.2.5 a Subclause numbers of test and performance requirements refer to Clause 4 – Test and measurement procedures b In this table: D = destructive, ND = non-destructive

3.5.1 Formation of inspection lots a) Groups A and B inspection

These tests shall be carried out on a lot-by-lot basis

A manufacturer may aggregate the current production into inspection lots subject to the following safeguards

1) The inspection lot shall consist of structurally similar capacitors (see 3.2)

2a) The sample tested shall be representative of the values and dimensions contained in the inspection lot:

– in relation to their number;

– with a minimum of five of any one value

2b) If there are less than five of any one value in the sample, the basis for the drawing of samples shall be agreed between the manufacturer and National Supervising

These tests shall be carried out on a periodic basis

Samples must accurately represent the current production for the specified periods and be categorized into high, medium, and low voltage ratings To ensure comprehensive approval coverage, one case size from each voltage group will be tested In future periods, additional case sizes and/or voltage ratings will be tested to encompass the entire range of production.

The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification

1 The term Certification Body (CB) replaces the term National Supervising Inspectorate (NSI), see IECQ 01

When, according to the procedures in Clause Q.10 of IEC 60384-1, re-inspection has to be made, solderability and capacitance shall be checked as specified in Groups A and B inspection

The assessment level(s) given in the blank detail specification shall preferably be selected from the following Tables 5 and 6

Table 5 – Lot-by-lot inspection

The Acceptance Quality Limit (AQL) defines the maximum number of non-conforming items allowed in a sample size (n), with c representing the permissible number of these items Inspections must be conducted after all non-conforming items are removed through 100% testing during manufacturing Regardless of the lot's acceptance status, all samples in the inspection must be evaluated to assess the outgoing quality level, measured in non-conforming items per million (× 10^6).

The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2, Annex A

If any non-conforming items are found in a sample, the entire lot will be rejected, but all non-conforming items will still be included in the calculation of quality level values.

The outgoing quality level of non-conforming items per million should be calculated by accumulating inspection data as outlined in IEC 61193-2, section 6.2 The sample size for testing must correspond to the code letter for IL specified in IEC 60410, Table IIA, or be determined according to IEC 61193-2, section 4.3.2 Additionally, the content of the inspection subgroups is detailed in Clause 2 of the applicable blank detail specification.

0 p = periodicity in months; n = sample size; c = permissible number of non-conforming items a The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification

4.1 Visual examination and check of dimensions

Robustness of terminations

terminations Visual examination No visible damage

Resistance to soldering heat

soldering heat No pre-drying

Capacitance As in 4.2.5 a Subclause numbers of test and performance requirements refer to Clause 4 – Test and measurement procedures b In this table: D = destructive, ND = non-destructive

3.5.1 Formation of inspection lots a) Groups A and B inspection

These tests shall be carried out on a lot-by-lot basis

A manufacturer may aggregate the current production into inspection lots subject to the following safeguards

1) The inspection lot shall consist of structurally similar capacitors (see 3.2)

2a) The sample tested shall be representative of the values and dimensions contained in the inspection lot:

– in relation to their number;

– with a minimum of five of any one value

2b) If there are less than five of any one value in the sample, the basis for the drawing of samples shall be agreed between the manufacturer and National Supervising

These tests shall be carried out on a periodic basis

Samples must accurately represent the current production for the specified periods and be categorized into high, medium, and low voltage ratings To ensure comprehensive approval coverage, one case size from each voltage group will be tested In future periods, additional case sizes and/or voltage ratings will be tested to encompass the entire range of production.

The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification

1 The term Certification Body (CB) replaces the term National Supervising Inspectorate (NSI), see IECQ 01

When, according to the procedures in Clause Q.10 of IEC 60384-1, re-inspection has to be made, solderability and capacitance shall be checked as specified in Groups A and B inspection

The assessment level(s) given in the blank detail specification shall preferably be selected from the following Tables 5 and 6

Table 5 – Lot-by-lot inspection

The Acceptance Quality Limit (AQL) defines the maximum number of non-conforming items allowed in a sample size (n), with c representing the permissible number of these items Inspections must be conducted after non-conforming items are removed through 100% testing during manufacturing Regardless of the lot's acceptance status, all samples in the inspection process must be evaluated to assess the outgoing quality level, measured in non-conforming items per million (× 10^6).

The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2, Annex A

If any non-conforming items are found in a sample, the entire lot will be rejected, but all non-conforming items will still be included in the calculation of quality level values.

The outgoing quality level of non-conforming items per million should be calculated by accumulating inspection data as outlined in IEC 61193-2, section 6.2 The sample size must correspond to the code letter for IL in IEC 60410, Table IIA, or be determined according to IEC 61193-2, section 4.3.2 Additionally, the content of the inspection subgroups is detailed in Clause 2 of the applicable blank detail specification.

0 p = periodicity in months; n = sample size; c = permissible number of non-conforming items a The content of the inspection subgroups is described in Clause 2 of the relevant blank detail specification

4.1 Visual examination and check of dimensions

See IEC 60384-1, 4.6, with the following details

The product of R 1 and the nominal capacitance (C N ) of capacitor C x under test shall be smaller than or equal to 1 s and greater than 0,01 s

R 1 includes the internal resistance of the power supply

R 2 shall limit the discharge current to a value equal to, or less than, 1 A

The voltages as given in Table 7 shall be applied between the measuring points of Table 3 of

IEC 60384-1, for a period of 1 min for qualification approval testing and for a period of 1 s for the lot-by-lot quality conformance testing

Table 7 – Test points and voltages

See IEC 60384-1, 4.7, with the following details

The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz The capacitance shall be for a) nominal capacitance C N ≤ 1 000 pF:

– For measuring purposes: 1 MHz ± 20 % or 100 kHz ± 20 %

– For referee purposes: 1 MHz ± 20 % b) nominal capacitance C N > 1 000 pF:

– For measuring purposes: 1 kHz ± 20 % or 10 kHz ± 20 %

The peak value of applied voltage shall not exceed 3 % of the rated voltage or 5 V, whichever is smaller

The capacitance shall be within the specified tolerance

For capacitors with a value of less than 10 pF or of more than 1 àF, the method of measurement and the limits shall be given in the detail specification

4.2.3 Tangent of loss angle (tan δ )

See IEC 60384-1, 4.8, with the following details:

Tangent of loss angle shall be measured and the values recorded (for reference purposes)

The measuring frequency shall be the same as that used for the capacitance measurement in

The accuracy of the measuring instruments shall be such that the measuring error does not exceed 10 – 4

The tangent of the loss angle shall not exceed the following limits

– at 1 MHz or 100 kHz: 10 × 10 –4 for C N ≤ 1 000 pF

– at 1 kHz or 10 kHz: 5 ì 10 –4 for 1 000 pF 1 000 pF: