Iec cispr 16 2 3 2016

2 Ta le 3 – Ap lcable freq en y ran es an doc ment referen es for CISPR radiated emis ion test sites an test method.. SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY Part 2-3: Methods o

Specification for radio disturbance and immunity measuring apparatus and

Spécifications des méthodes et des apparei s de mesure des perturbations

radioélectriques et de l immunité aux perturbations radioélectriques –

Partie 2-3: Méthodes de mesure des perturbations et de l'immunité – Mesurages

COMIT INT ERNA TIONA L SPÉCIA L DES PERTURBA TIONS RA DIOÉLECTRIQUES

PUBLICA TION FONDA MENTA LE EN CEM

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Spécifications des méthodes et des apparei s de mesure des perturbations

radioélectriques et de l immunité aux perturbations radioélectriques –

Partie 2-3: Méthodes de mesure des perturbations et de l'immunité – Mesurages

COMIT INT ERNA TIONA L SPÉCIA L DES PERTURBA TIONS RA DIOÉLECTRIQUES

PUBLICA TION FONDA MENTA LE EN CEM

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CONTENTS

FOREWORD 7

1 Sco e 9

2 Normative referen es 9

3 Terms, definition an a breviation 10 3.1 Terms an definition 10 3.2 Ab reviated terms 15 4 Typ s of disturb n e to b me s red 16 4.1 General 16 4.2 Typ s of disturb n e 16 4.3 Detector fu ction 16 5 Con ection of me s rin eq ipment 16 6 General me s rement req irements an con ition 17 6.1 General 17 6.2 Disturb n e not prod ced by the eq ipment u der test 17 6.2.1 General 17 6.2.2 Compl an e (conformity as es ment testin 17 6.3 Me s rement of contin ou disturb n e 17 6.3.1 Nar owb n contin ou disturb n e 17 6.3.2 Broadb n contin ou disturb n e 17 6.3.3 Use of sp ctrum analy ers an s an in receivers 17 6.4 EUT ar an ement an me s rement con ition 18 6.4.1 General ar an ement of the EUT 18 6.4.2 Op ration of the EUT 2

6.4.3 EUT time of o eration 2

6.4.4 EUT ru nin -in time 21

6.4.5 EUT s p ly 21

6.4.6 EUT mode of o eration 21

6.4.7 Op ration of multifu ction eq ipment 21

6.4.8 Determination of ar an ement s) cau in maximum emis ion 21

6.4.9 Recordin of me s rements 21

6.5 Interpretation of me s rin res lts 2

6.5.1 Contin ou disturb n e 2

6.5.2 Dis ontin ou disturb n e 2

6.5.3 Me s rement of the d ration of disturb n e 2

6.6 Me s rement times an s an rates for contin ou disturb n e 2

6.6.1 General 2

6.6.2 Minimum me s rement times 2

6.6.3 Scan rates for s an in receivers an sp ctrum analy ers 2

6.6.4 Scan times for ste pin receivers 2

6.6.5 Strategies for o tainin a sp ctrum overview u in the p a detector 2

6.6.6 Timin con ideration u in FFT-b sed in truments 2

7 Me s rement of radiated disturb n es 3

7.1 Introd ctory remarks 3

7.2 L o -anten a s stem me s rements (9 kHz to 3 MHz) 3

7.2.1 General 3

7.2.2 General me s rement method 3

7.2.3 Test en ironment 3

7.2.4 Config ration of the eq ipment u der test 3

7.2.5 Me s rement u certainty for LAS 3

7.3 Op n-are test site or semi-anec oic c amb r me s rements (3 MHz to 1 GHz) 3

7.3.1 Me s ran 3

7.3.2 Test site req irements 3

7.3.3 General me s rement method 3

7.3.4 Me s rement distan e 3

7.3.5 Anten a heig t variation 4

7.3.6 Prod ct sp cification detai s 4

7.3.7 Me s rement in trumentation 4

7.3.8 Field-stren th me s rements on other outdo r sites 4

7.3.9 Me s rement u certainty for OATS an SAC 4

7.4 Fuly-anec oic ro m me s rements (3 MHz to 1 GHz) 4

7.4.1 Test set up an site ge metry 4

7.4.2 EUT p sition 4

7.4.3 Ca le layout an termination 4

7.4.4 Me s rement u certainty for FAR 4

7.5 Radiated emis ion me s rement method (3 MHz to 1 GHz) an radiated immu ity test method (8 MHz to 1 GHz) with common test set up in semi -anec oic c amb r 4

7.5.1 Ap l ca i ty 4

7.5.2 EUT p rimeter definition an anten a- o-EUT se aration distan e 4

7.5.3 Uniform test volume 4

7.5.4 Sp cification for EUT set up in common emis ion /immu ity test set up 4

7.5.5 Me s rement u certainty for common emis ion/immu ity set up an method 5

7.6 Fuly-anec oic ro m an a sorb r-l ned OAT /SAC me s rements (1 GHz to 18 GHz) 5

7.6.1 Quantity to me s re 5

7.6.2 Me s rement distan e 5

7.6.3 Set up an o eratin con ition of the eq ipment u der test (EUT) 5

7.6.4 Me s rement site 5

7.6.5 Me s rement in trumentation 5

7.6.6 Me s rement proced re 5

7.6.7 Me s rement u certainty for FAR 6

7.7 In siu me s rements (9 kHz to 18 GHz) 6

7.7.1 Ap l ca i ty of an pre aration for in siu me s rements 6

7.7.2 Field-stren th me s rements in siu in the freq en y ran e 9 kHz to 3 MHz 6

7.7.3 Field-stren th me s rements in siu in the freq en y ran e a ove 3 MHz 6

7.7.4 In siu me s rement of the disturb n e ef ective radiated p wer u in the s bstitution method 6

7.7.5 Doc mentation of the me s rement res lts 7

7.7.6 Me s rement u certainty for in siu method 7

7.8 Substitution me s rements (3 MHz to 18 GHz) 7

7.8.1 General 7

7.8.2 Test site 71

7.8.3 Test anten as 71

7.8.4 EUT config ration 7

7.8.5 Test proced re 7

7.8.6 Me s rement u certainty for s bstitution method 7

7.9 Reverb ration c amb r me s rements (8 MHz to 18 GHz) 7

7.10 TEM waveg ide me s rements (3 MHz to 18 GHz) 7

8 Automated me s rement of emis ion 7

8.1 Introd ction – Precaution for automated me s rements 7

8.2 Generic me s rement proced re 7

8.3 Pre-s an me s rements 7

8.3.1 General 7

8.3.2 Determination of the req ired me s rement time 7

8.3.3 Pre-s an req irements for dif erent typ s of me s rements 7

8.4 Data red ction 7

8.5 Emis ion maximization an final me s rement 7

8.6 Post proces in an re ortin 7

8.7 Emis ion me s rement strategies with FFT-b sed me s rin in truments 7

An ex A (informative) Me s rement of disturb n es in the presen e of ambient emis ion 7

A.1 General 7

A.2 Terms an definition 7

A.3 Pro lem des ription 7

A.4 Pro osed solution 7

A.4.1 Overview 7

A.4.2 Pre- estin the EUT in a s ielded ro m 81

A.4.3 Method of me s rement of EUT disturb n es in the presen e of nar owb n ambient emis ion 8

A.4.4 Method of me s rement of EUT disturb n e in the presen e of bro db n ambient emis ion 8

A.5 Determination of the EUT disturb n e in case of s p rp sition 8

An ex B (informative) Use of sp ctrum analy ers an s an in receivers 9

B.1 General 9

B.2 Overlo d 9

B.3 Line rity test 9

B.4 Selectivity 9

B.5 Normal resp n e to pulses 9

B.6 Pe k detection 9

B.7 Freq en y s an rate 9

B.8 Sig al interce tion 9

B.9 Average detection 9

B.10 Sen itivity 9

B.1 Ampl tu e ac urac 9

An ex C (informative) Scan rates an me s rement times for u e with the average detector 9

C.1 Purp se 9

C.2 Sup res ion of disturb n es 9

C.2.1 Sup res ion of impulsive disturb n e 9

C.2.2 Sup res ion of impulsive disturb n e by digital averagin 9

C.2.3 Sup res ion of ampl tu e mod lation 9

C.3 Me s rement of slowly intermitent, u ste d or drifin nar owb n

disturb n es 9

C.4 Recommen ed proced re for automated or semi-automated me s rements 9

An ex D (informative) Explanation of the APD me s rement method a plyin to the compl an e test 9

An ex E (normative) Determination of s ita i ty of sp ctrum analy ers for compl an e tests 101 Bibl ogra h 10 Fig re 1 – Me s rement of a combination of a CW sig al (NB) an an impulsive sig al (BB) u in multiple swe ps with maximum hold 2

Fig re 2 – Example of a timin analy is 2

Fig re 3 – A bro db n sp ctrum me s red with a ste p d receiver 2

Fig re 4 – Intermitent nar owb n disturb n es me s red u in fast s ort re etitive swe ps with maximum hold fu ction to o tain an overview of the emis ion sp ctrum 2

Fig re 5 – F T s an in segments 31

Fig re 6 – Freq en y resolution en an ed by FF -b sed me s rin in trument 3

Fig re 7 – Con e t of mag etic field in u ed c r ent me s rements made with the lo p anten a s stem 3

Fig re 8 – Me s rement distan e 3

Fig re 9 – Se aration distan e relative to the phase centre of an LPDA anten a 3

Fig re 10 – Con e t of electric field stren th me s rements made on an o en-are test site (OATS) or semi-anec oic c amb r (SAC) s owin the direct an reflected ray ar ivin at the receivin anten a 3

Fig re 1 – Position of CMAD for ta le- o eq ipment on OAT or in SAC 4

Fig re 12 – Typical FAR site ge metry, where a, b, c, e de en up n the ro m p rforman e 4

Fig re 13 – Typical test set up for ta le- o eq ipment within the test volume of a FAR 4

Fig re 14 – Typical test set up for flo r-stan in eq ipment within the test volume of a FAR 4

Fig re 15 – Position of referen e planes for u iform field cal bration ( o -view) 4

Fig re 16 – Test set up for ta le- o eq ipment 5

Fig re 17 – Test set up for ta le- o eq ipment – To view 5

Fig re 18 – Test set up for flo r-stan in eq ipment 5

Fig re 19 – Test set up for flo r-stan in eq ipment – To view 5

Fig re 2 – Me s rement method a ove 1 GHz, receive anten a in vertical p larization 5

Fig re 21 – Il u tration of heig t s an req irements for two diferent categories of EUTs 5

Fig re 2 – Determination of the tran ition distan e 6

Fig re 2 – Substitution method set up ge metries for: a) me s rement, b) calbration 71

Fig re 2 – Proces to give red ction of me s rement time 7

Fig re A.1 – Flow diagram for the selection of b n width an detectors an the estimated me s rement er ors d e to that selection 8

Fig re A.2 – Relative diferen e in adjacent emis ion ampl tu es d rin prel minary testin 8

Fig re A.3 – Disturb n e by an u mod lated sig al (doted l ne) 8

Fig re A.4 – Disturb n e by an ampl tu e-mod lated sig al (dot ed l ne) 8

Fig re A.5 – In ication of an ampl tu e-mod lated sig al as a fu ction of mod lation freq en y with the QP detector in CISPR b n s B, C an D 8

Fig re A.6 – In ication of a pulse-mod lated sig al (pulse width 5 µs) as a fu ction of pulse re etition freq en y with p a , QP an average detectors 8

Fig re A.7 – Disturb n e by a bro db n sig al (doted l ne) 8

Fig re A.8 – Unmod lated EUT disturb n e (doted l ne) 8

Fig re A.9 – Ampl tu e-mod lated EUT disturb n e (doted l ne) 8

Fig re A.10 – In re se of p a value with s p rp sition of two u mod lated sig als 8

Fig re A.1 – Determination of the ampl tu e of the disturb n e sig al by me n of the ampl tu e ratio d an the factor i (se Eq ation (A.3) an Eq ation (A.6) 8

Fig re A.12 – In re se of average in ication me s red with a re l receiver an calc lated from Eq ation (A.8) 9

Fig re C.1 – Weig tin fu ction of a 10 ms pulse for p a (PK) an average detection with (CISPR AV) an without (AV) p a re din : meter time con tant 16 ms 9

Fig re C.2 – Weig tin fu ction of a 10 ms pulse for p a (PK) an average detection with (CISPR AV) an without (AV) p a re din : meter time con tant 10 ms 9

Fig re C.3 – Example of weig tin fu ction (of a 1 Hz pulse) for p a (PK) an average detection as a fu ction of pulse width: meter time con tant 16 ms 9

Fig re C.4 – Example of weig tin fu ction (of a 1 Hz pulse) for p a (PK) an average detection as a fu ction of pulse width: meter time con tant 10 ms 9

Fig re D.1 – Example of APD me s rement Method 1 for flu tuatin disturb n es 9

Fig re D.2 – Example of APD me s rement Method 2 for flu tuatin disturb n es 10 Ta le 1 – Minimum me s rement times for the four CISPR b n s 2

Ta le 2 – Minimum s an times for the thre CISPR b n s with p a an q asi-p a detectors 2

Ta le 3 – Ap lcable freq en y ran es an doc ment referen es for CISPR radiated emis ion test sites an test method 3

Ta le 4 – Minimum dimen ion of w (w min ) 5

Ta le 5 – Example values of w for thre anten a typ s 5

Ta le 6 – Horizontal p larization cor ection factors as a fu ction of freq en y 6

Ta le 7 – Recommen ed anten a heig ts to g arante sig al interce tion ( or pre-s an) in the freq en y ran e 3 MHz to 1 0 0 MHz 7

Ta le A.1 – Combination of EUT disturb n e an ambient emis ion 7

Ta le A.2 – Me s rement er or de en in on the detector typ an on the combination of ambient an disturbin sig al sp ctra 91

Ta le C.1 – Pulse s p res ion factors an s an rates for a 10 Hz vide b n width 9

Ta le C.2 – Meter time con tants an the cor esp n in vide b n width an minimum s an times 9

Ta le E.1 – Maximum ampl tu e diferen e b twe n p a an q asi-p a detected

sig als 101

INTERNATIONAL ELECTROTECHNICAL COMMISSION

INTERNATIONAL SPECIAL COMMIT EE ON RADIO INTERFERENCE

Part 2-3: Methods of measurement of disturbances and immunity –

Radiated disturbance measurements

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International Stan ard CISPR 16-2-3 has b en pre ared by CISPR s bcommit e A: Radi

o-interferen e me s rements an statistical method

This fourth edition edition can els an re laces the third edition publ s ed in 2 10, its

Amen ment 1:2 10 an its Amen ment 2:2 14 This edition con titutes a tec nical revision

This edition in lu es the folowin sig ificant tec nical c an e with resp ct to the previou

edition: ad ition of content on cor ection of the electric field stren th to ac ou t for phase

centre of log-p riodic dip le ar ay anten as

It has the statu of a b sic EMC publ cation in ac ordan e with IEC Guide 10 ,

Ele ctromagnetc comp atb il y – G u ide to the draftn of ele ctromagnetc comp atb il y

p ub licato s

The text of this stan ard is b sed on the fol owin doc ments:

CIS R/A/1 7 A/FDIS CIS R/A/1 8 /R D

Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on

votin in icated in the a ove ta le

This publ cation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts of the CISPR 16 series, publ s ed u der the general title Sp cificato for

radio disturb ance a d immuniy me su rin ap p aratus a d me th ds, can b fou d on the IEC

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SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY

Part 2-3: Methods of measurement of disturbances and immunity –

Radiated disturbance measurements

This p rt of CISPR 16 sp cifies the method of me s rement of radiated disturb n e

phenomena in the freq en y ran e of 9 kHz to 18 GHz The asp cts of me s rement

u certainty are specified in CISPR 16-4-1 an CISPR 16-4-2

NOT In a c rd n e with IEC Guid 10 [13]

1

, CIS R 16-2-3 is a b sic EMC p blc tio for use b pro u t

c mmite s of th IEC As state in Guid 10 , pro u t c mmite s are resp nsible for d terminin th

a plc bi ty of th EMC sta d rd CIS R a d its su c mmite s are pre are to c -o erate with pro u t

c mmite s in th e alu tio of th v lu of p rtic lar EMC tests for sp cific pro u ts

2 Normative referenc s

The fol owin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

CISPR 14-1:2 16, Electrom agnetc comp tb il y – Re u ire me ts for h use old ap pla ce s,

electric to ls a d simiar ap p aratus – Part 1: Emis io

CISPR 16-1-1, Spe cificato for radio disturb ance a d immu niy me su rin ap p aratus a d

meth ds – Part 1-1: Radio disturb ance a d immu niy me surin ap paratus – Me surin

ap p aratus

CISPR 16-1-2:2 14, Sp ecificato forradio distu rb ance a d immu niy me surin ap paratus

a d meth ds – Part 1-2: Radio distu rb ance a d immuniy me surin a p aratus – Coupln

de ices forco ducted disturb ance m easurem ents

CISPR 16-1-4:2 10, Sp ecificato forradio distu rb ance a d immu niy me surin ap paratus

a d meth ds – Part 1-4: Radio distu rb ance a d immu niy m easurin ap paratus – Ante n s

a d test sies for radiated disturb ance me sureme ts

CISPR 16-1-4:2 10/AMD1:2 12

CISPR 16-2-1:2 14, Sp e cificato forradio disturb ance a d immu niy me surin ap paratus

a d meth ds – Part 2-1: Meth ds of me sureme t ofdisturb ances a d immu niy – Co ducted

distu rb ance me sureme ts

CISPR TR 16-4-1, Sp cificato for radio distu rb ance a d immuniy me surin ap p aratus

a d meth ds – Part 4-1: Uncertaintes, statstc a d lmi model n – Uncertaintes in

sta dardized EMC tests

CISPR 16-4-2, Sp cificato for radio disturb ance a d im mu niy me asurin ap p aratus a d

instru m entato uncertainty

_ _ _ _ _ _ _ _

1

Numb rs in sq are bra k ts refer to th Biblo ra h

CISPR TR 16-4-5, Spe cificato for radio disturb ance a d immuniy me surin ap p aratus

a d meth ds – Part 4-5: Uncertaintes, statstc a d lmi model n – Co di o s forth use

of alern tv te st meth ds

IEC 6 0 0-161, Intern to al Ele ctrotech ical Vocab u lary – Ch pte r 161: Ele ctromagnetc

comp tb il y

IEC 610 0-4-3:2 0 , Electromagnetc comp atb il y (EMC) – Part 4-3: Testn a d

m easureme t te ch iques – Radiated, radio-fre uency, electromagnetc field immuniy test

IEC 610 0-4-3:2 0 /AMD1:2 0

IEC 610 0-4-3:2 0 /AMD2:2 10

IEC 610 0-4-2 , Electromagnetc comp atb il y (EMC) – Part 4-20 : Te stn a d me su reme nt

tech iqu es – Emis io a d immuniy te stn in tra sve rse ele ctromagnetc (TEM) wa e u ides

3 Terms, definitions and a bre iations

tran d cers (e.g c r ent an voltage pro es an artificial networks) con ected to a

me s rin receiver or ( est sig al generator an u ed in the disturb n e sig al tran fer

b twe n the EUT an the me s rin or test eq ipment

3.1.3

a te na be m

main lo e of the anten a p tern (gain p tern) of the receive anten a (u ual y the direction

with maximum sen itivity or lowest anten a factor) that is directed toward the EUT

3.1.4

a te na be mwidth

an le b twe n the half p wer (3 dB) p ints of the main lo e of the anten a b am, when

referen ed to the maximum p wer of the main lo e

Note 1 to e try: It ma b e pres e for th H pla e or for th E pla e of th a te n

Note 2 toe try: Ante n b amwidth is e pres e in d gre s

3.1.5

a sociate e uipme t

AE

a p ratu , that is not p rt of the s stem u der test, but ne ded to help exercise the EUT

Note 1 to e try: This n te a plesto th Fre c la g a e o ly

ca le containin one or more co xial lnes, typicaly u ed for a matc ed con ection of

an i ary eq ipment to the me s rin eq ipment or ( est ) sig al generator providin a

sp cified c aracteristic imp dan e an a sp cified maximum al owa le ca le tran fer

imp dan e

3.1.9

common-mod absorption de ic

device that may b a pl ed on ca les le vin the test volume in radiated emis ion

me s rements to red ce the compl an e u certainty

Note 1 to e try: This n te a plesto th Fre c la g a e o ly

[SOURCE: CISPR 16-1-4:2 10, 3.1.4]

3.1.10

conformity a s s me t

demon tration that sp cified req irements relatin to a prod ct, proces , s stem, p rson or

b d are fulfi ed

Note 1 to e try: Th su je t field of c nformity as es me t in lu es a tivities d fin d elsewh re in

ISO/IEC 17 0 :2 0 [7], su h as testin , insp ctio a d c rtific tio , as wel as th a cre itatio of c nformity

as es me t b dies

[SOURCE: ISO/IEC 17 0 :2 0 , 2.1, modified – Note 2 has b en deleted

3.1.1

continuous disturba c

RF disturb n e with d ration of more than 2 0 ms at the IF-output of a me s rin receiver

that cau es a deflection on the meter of a me s rin receiver in q asi-p a detection mode,

[SOURCE: IEC 6 0 0-161:19 0, 161-0 -12]

3.1.14

e uipme t under te t

EUT

eq ipment (devices, a pl an es an s stems) s bjected to EMC (emis ion) compl an e

(conformity as es ment tests

Note 1 to e try: This n te a plesto th Fre c la g a e o ly

3.1.15

ful y-a ec oic room

FAR

en los re, whose six internal s rfaces are lned with radio- req en y a sorbin material (i.e

RF a sorb r) that aten ates electromag etic energ in the freq en y ran e of interest

Note 1 to e try: This n te a plesto th Fre c la g a e o ly

3.1.16

loop-a te na s stem

LAS

anten a s stem con istin of thre orthogonaly-oriented lo p anten as that are u ed to

me s re the thre orthogonal mag etic dip le moments of an EUT located in the centre of the

ef ective, coherent time for a me s rement res lt at a sin le freq en y

– for the p a detector, the efective time to detect the maximum of the sig al en elo e,

– for the q asi-p a detector, the efective time to me s re the maximum of the weig ted

en elo e,

– for the average detector, the ef ective time to average the sig al en elo e,

– for the rms detector, the efective time to determine the rms of the sig al en elo e

Note 1 to e try: In some are s "me sureme t time" is also c le dwel time

3.1.17.8

total obs rv tion time

T

tot

ef ective time for an overview of the sp ctrum (either sin le or multiple swe ps)

Note 1 to e try: If c is th n mb r of c a n ls within a sc n or swe p, th n T

tot

= c × n × T

m

3.1.18

me s ring re eiv r

in trument s c as a tu a le voltmeter, an EMI receiver, a sp ctrum analy er or an F

T-b sed me s rin in trument, with or without preselection, that compl es with CISPR 16-1-1

3.1.19

number of swe ps per time unit

n

reciprocal of the s m of swe p time an retrace time, i.e 1/ swe p time + retrace time)

Note 1 to e try: Swe ps p r se o d, for e ample

3.1.2

ope -are te t site

OATS

faci ty for me s rements an cal bration in whic the grou d reflection is made re rod cible

by a large flat electrical y con u tin grou d plane

Note 1 to e try: An OAT c n b use for ra iate disturb n e me sureme ts, wh re it is also d sig ate as a

CO T An OAT c nalso b use for a te n c lbratio s, wh re it is d sig ate as a C LT

Note 2 to e try: An OAT is a u c v re o td or site, a d is far e o g awa from b idin s, ele tric ln s,

fe c s, tre s, u d rgro n c bles, pip ln s, a d oth r p te tialy refle tiv o je ts, so th t th efe ts d e to

su h o je ts are n glgible Se CIS R 16-1-4 for g id n e o th c nstru tio of a OAT

Note 3 to e try: This n te a ples to th Fre c la g a e o ly

3.1.21

product sta dard

stan ard that sp cifies req irements to b fulfi ed by a prod ct or group of prod cts, to

esta l s its fitnes for purp se

Note 1 to e try: A pro u t sta d rd ma in lu e, in a ditio to th fitn s for p rp se re uireme ts, dire tly or b

refere c , asp cts su h as termin lo y, sampln , testin , p c a in a d la el n a d, sometimes, pro es in

re uireme ts

Note 2 to e try: A pro u t sta d rd c n eith r b c mplete or n t, a c rdin to wh th r it sp cifies al or o ly a

p rt of th n c s ary re uireme ts In this resp ct, o e ma difere tiate b twe n sta d rds su h as dime sio al

material a d te h ic l d lv ry sta d rds

[SOURCE: ISO/IEC Guide 2:2 0 , definition 5.4 [6]

s mi-an c oic c amber

SAC

s ielded en los re in whic five of the six internal s rfaces are l ned with radio- req en y

a sorbin material (i.e RF a sorb r) that at en ates electromag etic energ in the freq en y

ran e of interest, an the b tom horizontal s rface is a con u tin grou d plane for u e with

OATS test set ups

Note 1 to e try: This n te a plesto th Fre c la g a e o ly

pulse-re etition- req en y (PRF) de en ent con ersion (mostly red ction) of a p a -detected

impulse voltage level to an in ication that cor esp n s to the interferen e ef ect on radio

rece tion

Note 1 to e try: For th a alo u re eiv r, th psy h p ysic l a n y n e of th interfere c is a su je tiv

q a tity (a dible or visu l) usu ly n t a c rtain n mb r of misu d rsta din s of a sp k n te t

Note 2 to e try: For th digital re eiv r, th interfere c efe t is a o je tiv q a tity th t ma b d fin d b th

critic l bit eror ratio (B R) or bit eror pro a i ty (B P) for th t p rfe t er or c re tio c n sti o c r or b

a oth r, o je tiv a d re ro u ible p rameter

Note 3 to e try: Weig tin of imp lsiv disturb n e, for e ample

3.1.2 1

weighte disturba c me s reme t

me s rement of disturb n e u in a weig tin detector

3.1.2 2

weighting c ara teristic

p a voltage level as a fu ction of PRF for a con tant ef ect on a sp cific radiocommu ication

s stem, i.e the disturb n e is weig ted by the radiocommu ication s stem itself

3.1.2 3

weighting d te tor

detector that provides an agre d weig tin fu ction

3.1.2 4

weighting fa tor

value of the weig tin fu ction relative to a referen e PRF or relative to the p a value

Note 1 toe try: Weig tin fa tor is e pres e in dB

3.1.2 5

weighting function or weighting c rv

relation hip b twe n input p a voltage level an PRF for con tant level in ication of a

me s rin receiver with a weig tin detector, i.e the c rve of resp n e of a me s rin

receiver to re e ted pulses

3.1.2

me s reme t

proces of exp rimental y o tainin one or more q antity values that can re sona ly b

at ributed to a q antity

[SOURCE: 2.1 of ISO/IEC Guide 9 :2 0 [9]

, modified – Notes 1 to 3 have b en deleted

3.1.2

te t

tec nical o eration that con ists of the determination of one or more c aracteristic of a given

prod ct, proces or service ac ordin to a sp cified proced re

Note 1 to e try: A test is c r ie o t to me sure or clas ify a c ara teristic or a pro erty of a item b a plyin to

th item a set of e viro me tal a d o eratin c n itio s a d/or re uireme ts

IF Intermediate freq en y

ISM In u trial, s ientific or medical

4 Ty es of disturbance to be meas red

This clau e des rib s the clas ification of diferent typ s of disturb n e an the detectors

a pro riate for their me s rement

4.2 Type of disturba c

For ph sical an ps c o h sical

3

re son , de en ent on the sp ctral distribution, me s rin

receiver b n width, the d ration, rate of oc ur en e, an degre of an oyan e d rin the

as es ment an me s rement of radio disturb n e, distin tion is made b twe n the folowin

typ s of disturb n e:

a) n rowb and co tnu ous disturb ance, i.e disturb n e on dis rete freq en ies as, for

example, the fu damentals an harmonic generated with the intentional a pl cation of RF

energ with ISM eq ipment, con titutin a freq en y sp ctrum con istin only of in ivid al

sp ctral l nes whose se aration is gre ter than the b n width of the me s rin receiver so

that d rin the me s rement only one l ne fal s into the b n width in contrast to b);

b) b ro db and co tnuous disturbance, whic normal y is u intentional y prod ced by the

re e ted impulses of, for example, commutator motors, an whic have a re etition

freq en y that is lower than the b n width of the me s rin receiver so that d rin the

me s rement more than one sp ctral l ne fals into the b n width; an

c) b ro db and dis o tnuous disturb ance is also generated u intentional y by mec anical or

electronic switc in proced res, for example by thermostats or programme controls with a

re etition rate lower than 1 Hz (cl ck-rate les than 3 /min)

The freq en y sp ctra of items b) an c) are c aracterized by havin a contin ou sp ctrum

in the case of in ivid al (sin le) impulses an a dis ontin ou sp ctrum in case of re e ted

impulses, b th sp ctra b in c aracterized by havin a freq en y ran e that is wider than the

b n width of the me s rin receiver sp cified in CISPR 16-1-1

4.3 Dete tor functions

De en in on the typ s of disturb n e, me s rements may b car ied out u in a me s rin

receiver with:

a) an average detector general y u ed in the me s rement of nar owb n disturb n e an

sig als, an p rtic larly to dis riminate b twe n nar owb n an bro db n disturb n e;

b) a q asi-p a detector provided for the weig ted me s rement of bro db n disturb n e

for the as es ment of au io an oyan e to a radio l stener, but also u a le for nar owb n

disturb n e;

c) an rms-average detector provided for the weig ted me s rement of bro db n

disturb n e for the as es ment of the efect of impulsive disturb n e to digital radio

commu ication services but also u e ble for nar owb n disturb n e;

d) a p a detector that may b u ed for either bro db n or nar owb n disturb n e

me s rement

Me s rin receivers in orp ratin these detectors are sp cified in CISPR 16-1-1

5 Conne tion of measuring equipment

Con ernin the con ection of me s rin eq ipment, me s rin receivers an an i ary

eq ipment s c as anten as: the con ectin ca le b twe n the me s rin receiver an the

an i ary eq ipment s al b s ielded an its c aracteristic imp dan e s al b matc ed to the

_ _ _ _ _ _ _ _

3

Psy h p ysic l me ns psy h lo ic l relatio ship b twe n p ysic l stimul a d se sory resp nse

input imp dan e of the me s rin receiver The output of the an i ary eq ipment s al b

terminated with the pres rib d imp dan e

6 General measurement requirements and conditions

Radio disturb n e me s rements s al b :

• re rod cible, i.e in e en ent of the me s rement location an en ironmental con ition ,

esp cial y ambient noise; an

• fre from interaction , i.e the con ection of the EUT to the me s rin eq ipment s al

influen e neither the fu ction of the EUT nor the ac urac of the me s rement eq ipment

These req irements may b met by o servin the folowin con ition :

a) existen e of a s f icient sig al- o-noise ratio at the desired me s rement level, e.g the

level of the relevant disturb n e lmit;

b) havin a defined me s rin set up, termination an o eratin con ition of the EUT

6.2 Disturba c not produc d by the e uipme t un er te t

6.2.1 Ge eral

The me s rement sig al- o-noise ratio with resp ct to ambient noise s al me t the fol owin

req irements Should the ambient noise level ex e d the req ired level, it s al b recorded in

the test re ort

6.2.2 Compl a c (conformity a s s me t) te ting

A test site s al p rmit emis ion from the EUT to b distin uis ed from ambient noise The

ambient noise level s ould prefera ly b 2 dB, but at le st b 6 dB b low the desired

me s rement level For the 6 dB con ition, the a p rent disturb n e level from the EUT is

in re sed by up to 3,5 dB The s ita i ty of the site for the req ired ambient level may b

determined by me s rin the ambient noise level with the test u it in place but not o eratin

When evaluatin compl an e with a l mit, the ambient noise level is p rmited to ex e d the

prefer ed − dB level provided that the level of b th ambient noise an source emanation

combined do s not ex e d the sp cified l mit The EUT is then con idered to me t the l mit

Further g idan e on me s rement of disturb n es in the presen e of ambient emis ion is

provided in An ex A

6.3 Me s reme t of continuous disturba c

6.3.1 Nar owba d continuous disturba c

The receiver s al b k pt tu ed to the dis rete freq en y u der in estigation, an re- u ed if

the freq en y flu tuates

6.3.2 Broa ba d continuous disturba c

For the as es ment of bro db n contin ou disturb n e whose level is not ste d , the

maximum re rod cible me s rement value s al b fou d Se 6.5.1 for further detai s

6.3.3 Us of spe trum a alyzers a d s a ning re eiv rs

Sp ctrum analy ers an s an in receivers are u eful for disturb n e me s rements,

p rtic larly in order to red ce me s rin time However, sp cial con ideration s al b given

to certain c aracteristic of these in truments, whic in lu e overlo d, l ne rity, selectivity,

normal resp n e to pulses, freq en y s an rate, sig al interce tion, sen itivity, ampl tu e

ac urac an p a , average an q asi-p a detection These c aracteristic are con idered

in An ex B

6.4 EUT ar a geme t a d me s reme t con itions

The EUT s al b o erated u der the folowin con ition

6.4.1 Ge eral ar a geme t of the EUT

6.4.1.1 Ge eral

Where not sp cified in the prod ct stan ard, the EUT s al b config red as des rib d b low

The EUT s al b in tal ed, ar an ed an o erated in a man er con istent with typical

a pl cation Where the man facturer has sp cified or recommen ed an in tal ation practice,

that practice s al b u ed in the test ar an ement, where p s ible This ar an ement s al b

typical of normal in talation practice Interface ca les, lo d , an devices s al b con ected

to at le st one of e c typ of interface p rt of the EUT an , where practical, e c ca le s al

b terminated in a device typical of actual u age

Where there are multiple interface p rts of the same typ , ad itional intercon ectin ca les,

lo d an devices may have to b ad ed to the EUT de en in up n the res lts of

prel minary tests Con ectin a ca le or wire to ju t one of that typ of p rt may b s ficient

The actual n mb r of ad itional ca les or wires may b l mited to the con ition where the

ad ition of another ca le or wire do s not sig ificantly afect the emis ion level, i.e varies

les than 2 dB, provided that the EUT remain compl ant The rationale for the selection of the

config ration an lo din of p rts s al b in lu ed in the test re ort

Intercon ectin ca les s ould b of the typ an len th sp cified in the in ivid al eq ipment

req irements If the len th can b varied, the len th s al b selected to prod ce maximum

stif nes , the disp sition of the ex es ca le s al b precisely noted in the test re ort

The res lts of an evaluation of EUTs havin one of e c typ of mod le can b a pled to

config ration havin more than one of e c of those mod les This is p rmis ible b cau e it

has b en fou d that disturb n es from identical mod les are general y not ad itive in

practice However, the 2 dB criteria defined in this clau e s al b a pl ed

An set of res lts s al b ac omp nied by a complete des ription of the ca le an eq ipment

orientation so that res lts can b re rod ced If sp cific con ition of u e are req ired to

me t the l mits, those con ition s al b sp cified an doc mented; for example ca le

len th, ca le typ , s ieldin an grou din These con ition s al b in lu ed in the

in tru tion to the u er

Eq ipment that is p pulated with multiple mod les (drawer, plu -in card, b ard, etc.) s al b

tested with a mix an n mb r re resentative of that u ed in a typical in tal ation The n mb r

of ad itional b ard or plu -in card of the same typ may b lmited to the con ition where

the ad ition of another b ard or plu -in card do s not sig ificantly af ect the emis ion level,

i.e varies les than 2 dB, provided that the EUT remain compl ant The rationale u ed for

selectin the n mb r an typ of mod les s al b stated in the test re ort

A s stem that con ists of a n mb r of se arate u its s al b config red to form a minimum

re resentative config ration The n mb r an mix of u its in lu ed in the test config ration

s al b re resentative of that u ed in a typical in talation The rationale u ed for selectin

u its s al b stated in the test re ort

At le st one mod le of e c typ s al b o erative in e c eq ipment evaluated in an EUT

For a s stem EUT, at le st one of e c typ of eq ipment that can b in lu ed in the p s ible

s stem config ration s al b in lu ed in the EUT

The EUT p sition relative to the RGP s al b eq ivalent to that oc ur in in u e Therefore,

flo r-stan in eq ipment is placed on, but in ulated from, a RGP, an ta leto eq ipment is

placed on a non-con u tive ta le

Eq ipment desig ed for wal -mou ted or cei ng mou ted o eration s al b tested as ta leto

EUT The orientation of the eq ipment s al b con istent with normal in tal ation practice

Combination of the eq ipment typ s identified a ove s al also b ar an ed in a man er

con istent with normal in tal ation practice Eq ipment desig ed for b th ta leto and flo r

stan in o eration s al b tested as ta leto eq ipment u les the u ual in tal ation is flo r

stan in , then that ar an ement s al b u ed

The en s of sig al ca les atac ed to the EUT that are not con ected to another u it or

au i ary eq ipment s al b terminated u in the cor ect terminatin imp dan e defined in

the prod ct stan ard

Ca les or other con ection to as ociated eq ipment located outside the test are s al dra e

to the flo r, an then b routed to the place where they le ve the test volume

Au i ary eq ipment s al b in tal ed in ac ordan e with normal in tal ation practice Where

this me n that the au i ary eq ipment is located on the test site, it s al b ar an ed u in

the same con ition a pl ca le for the EUT (e.g distan e from grou d plane an in ulation

from the grou d plane if flo r stan in , an layout of ca l n )

6.4.1.2 Tabletop ar a g me t

Eq ipment inten ed for ta leto u e s al b placed on a non-con u tive ta le The size of

the ta le wi nominal y b 1,5 m by 1,0 m, but may ultimately b de en ent on the horizontal

dimen ion of the EUT

Al u its formin the s stem u der test (in lu in the EUT, con ected p ripherals an

au i ary eq ipment or devices) s al b ar an ed ac ordin to normal u e Where not defined

in the normal u e, a nominal 0,1 m se aration distan e b twe n the neig b urin u its s al

b defined for the test ar an ement

Intra-u it ca les s al b dra ed over the b ck of the ta le If a ca le han s closer than 0,4 m

to the horizontal grou d plane (or flo r), the ex es s al b folded at the ca le centre into a

bu dle no lon er than 0,4 m, s c that the bu dle is at le st 0,4 m a ove the horizontal RGP

Ca les s al b p sitioned as for normal u age

If the main p rt input ca le is les than 0,8 m lon , (in lu in p wer s p les integrated in

the main plu ) an exten ion ca le s al b u ed s c that the external p wer s p ly u it is

placed on the ta leto The exten ion ca le s al have c aracteristic simi ar to the main

ca le (in lu in the n mb r of con u tors an the presen e of a groun con ection) The

exten ion ca le s al b tre ted as p rt of the main ca le

In the a ove ar an ements, the ca le b twe n the EUT an the p wer ac es ory s al b

ar an ed on the ta leto in the same man er as other ca les con ectin comp nents of the

EUT

6.4.1.3 Flo r-sta ding ar a geme t

The EUT s al b placed on the horizontal RGP, orientated for normal u e, but se arated

from metal c contact with the RGP by up to 15 cm of in ulation

The ca les s al b in ulated (by up to 15 cm) from the horizontal RGP If the eq ipment

req ires a dedicated grou d con ection, then this s al b provided an b n ed to the

horizontal grou d plane

Intra-u it ca les (b twe n u its formin the EUT or b twe n the EUT and au i ary

eq ipment s al dra e to, but remain in ulated from, the horizontal RGP An ex es s al

either b folded at the ca le centre into a bu dle no lon er than 0,4 m or ar an ed in a

serp ntine fas ion If an intra-u it ca le len th is not lon enou h to dra e to the horizontal

RGP but dra es closer than 0,4 m, then the ex es s al b folded at the ca le centre into a

bu dle no lon er than 0,4 m The bu dle s al b p sitioned s c that it is either 0,4 m a ove

the horizontal RGP or at the heig t of the ca le entry or con ection p int if this is within 0,4 m

of the horizontal RGP

For eq ipment with a vertical ca le riser, the n mb r of risers s al b typical of in tal ation

practice Where the riser is made of non-con u tive material, a minimum sp cin of at le st

0,2 m s al b maintained b twe n the closest p rt of the eq ipment an the ne rest vertical

ca le Where the riser stru ture is con u tive, the minimum sp cin of 0,2 m s al b

b twe n the closest p rts of the eq ipment an riser stru ture

6.4.1.4 Combination of tabletop a d flo r-sta ding e uipme t ar a geme t

Intra-u it ca les b twe n a ta leto u it an a flo r stan in u it s al have the ex es

folded into a bu dle no lon er than 0,4 m The bu dle s al b p sitioned s c that it is either

0,4 m a ove the horizontal RGP or at the heig t of the ca le entry or con ection p int if this is

within 0,4 m of the horizontal RGP

6.4.2 Operation of the EUT

The o eratin con ition of the EUT s al b determined by the man facturer ac ordin to the

typical u e of the EUT with resp ct to the exp cted hig est level of emis ion The determined

o erational mode an the rationale for the selected o eratin con ition s al b stated in the

test re ort

The EUT s al b o erated within the rated (nominal) o eratin voltage ran e an typical lo d

con ition (mec anical or electrical) for whic it is desig ed Actual lo d s ould b u ed

whenever p s ible If a simulator is u ed, it s al re resent the actual lo d with resp ct to its

radio freq en y an fu ctional c aracteristic

The test programmes or other me n of exercisin the eq ipment s ould en ure that variou

p rts of a s stem are exercised in a man er that p rmits detection of al s stem disturb n es

6.4.3 EUT time of operation

The time of o eration s al b , in the case of EUTs with a given rated o eratin time, in

ac ordan e with the markin In al other cases, the EUT s al b contin ou ly o erated

throu hout the test

6.4.4 EUT running-in time

No sp cific ru nin -in time, prior to testin , is given, but the EUT s al b o erated for a

s f icient p riod to en ure that the modes an con ition of o eration are typical of those

d rin the l fe of the eq ipment For some EUTs, sp cial test con ition may b pres rib d in

the relevant prod ct stan ard

6.4.5 EUT s pply

The EUT s al b o erated from a s p ly havin the rated voltage of the EUT If the level of

disturb n e varies con idera ly with the s p ly voltage, the me s rements s al b re e ted

for s p ly voltages over the ran e of 0,9 to 1,1 times the rated voltage EUTs with more than

one rated voltage s al b tested at the rated voltage that cau es maximum disturb n e

6.4.6 EUT mode of operation

The EUT s al b o erated u der practical con ition that cau e the maximum disturb n e at

the me s rement freq en y

6.4.7 Operation of multifu ction e uipme t

Multifu ction eq ipment whic is s bjected simultane u ly to diferent clau es of a prod ct

stan ard, an /or diferent stan ard , s al b tested with e c fu ction o erated in isolation, if

this can b ac ieved without modifyin the eq ipment internal y The eq ipment th s tested

s al b de med to have compl ed with the req irements of al clau es an /or stan ard when

e c fu ction has satisfied the req irements of the relevant clau e an /or stan ard

For eq ipment where it is not practical to test with e c fu ction o erated in isolation, or

where the isolation of a p rtic lar fu ction would res lt in the eq ipment b in u a le to fulfi

its primary fu ction, or where the simultane u o eration of several fu ction would res lt in

savin me s rement time, the eq ipment s al b de med to have compl ed if it me ts the

provision of the relevant clau e an /or stan ard with the neces ary fu ction o erated

6.4.8 Determination of ar a geme t s) c using ma imum emis ions

Initial testin s al identify the freq en y that has the hig est disturb n e relative to the l mit

This identification s al b p rformed whi e o eratin the EUT in typical modes of o eration

an with ca le p sition in a test ar an ement that is re resentative of typical in tal ation

practice

The freq en y of hig est disturb n e with respect to the l mit s al b fou d by in estigatin

disturb n es at a n mb r of sig ificant freq en ies This provides confiden e that the

pro a le freq en y of maximum disturb n e has b en fou d an that the as ociated ca le,

EUT ar an ement an mode of o eration has b en identified

For initial testin , the EUT s ould b ar an ed in ac ordan e with the prod ct stan ard as

a pro riate

6.4.9 Re ording of me s reme ts

Of those disturb n es a ove (L – 2 dB), where L is the l mit level in logarithmic u its, the

disturb n e levels an the freq en ies of at le st the six hig est disturb n es s al b

recorded

For radiated disturb n es, the anten a p larization an heig t for e c rep rted disturb n e

s al b recorded

6.5 Interpretation of me s ring re ults

6.5.1 Contin ou disturba c

a) If the level of disturb n e is not ste d , the re din on the me s rin receiver is o served

for at le st 15 s for e c me s rement The hig est re din s s al b recorded, with the

ex e tion of an isolated cl cks, whic s al b ig ored (se 4.4 of CISPR 14-1:2 16)

b) If the general level of the disturb n e is not ste d , but s ows a contin ou rise or fal of

more than 2 dB in the 15 s p riod, then the disturb n e voltage levels s al b o served

for a further p riod an the levels s al b interpreted ac ordin to the con ition of

normal u e of the EUT, as fol ows:

1) if the EUT is one that may b switc ed on an of freq ently, or the direction of rotation

of whic can b reversed, then at e c freq en y of me s rement the EUT s ould b

switc ed on or reversed ju t b fore e c me s rement, an switc ed of ju t afer

e c me s rement The maximum level o tained d rin the first min te at e c

freq en y of me s rement s al b recorded;

2) if the EUT is one that in normal u e ru s for lon er p riod , then it s ould remain

switc ed on for the p riod of the complete test, an at e c freq en y the level of

disturb n e s al b recorded only afer a ste d re din (s bject to the provision that

item a) has b en o tained)

c) If the p t ern of the disturb n e from the EUT c an es from a ste d to a ran om

c aracter p rt way throu h a test, then that EUT s al b tested in ac ordan e

with item b)

d) Me s rements are ta en throu hout the complete sp ctrum an are recorded at le st at

the freq en y with maximum re din an as req ired by the relevant CISPR publcation

6.5.2 Dis ontinuous disturba c

There is c r ently no req irement for the me s rement of radiated dis ontin ou

disturb n es

6.5.3 Me s reme t of the duration of disturba c

The d ration of a disturb n e s al b known in order to me s re it cor ectly an to determine

if it is dis ontin ou The d ration of a disturb n e may b me s red in one of the folowin

way :

• throu h the con ection of an os i os o e to a me s rin receiver’s IF output to al ow

monitorin of the disturb n e in the time-domain;

• throu h the tu in of either an EMI receiver or a sp ctrum analy er to the disturb n e

freq en y without freq en y s an in (i.e ‘zero-sp n’ mode) to al ow monitorin of the

disturb n e in the time-domain; or

• throu h the u e of the time-domain output of an F T-b sed me s rin receiver

Guidan e for the determination of the a pro riate me s rement time can b fou d in 8.3

6.6 Me s reme t time a d s a rate for contin ous disturba c

6.6.1 Ge eral

For b th man al me s rements an automated or semi-automated me s rements, me s

re-ment times an s an rates of me s rin an s an in receivers s al b set so as to me s re

the maximum emis ion Esp cial y, where a p a detector is u ed for pre-s an , the

me s rement times an s an rates have to ta e the timin of the emis ion u der test into

ac ou t More detaied g idan e a out p rforming automated me s rements can b fou d

in Clau e 8

6.6.2 Minimum me s reme t time

The minimum me s rement (dwel ) times are given in Ta le 1 From Ta le 1, the minimum

s an times for me s rements over a complete CISPR b n have b en derived in Ta le 2

These minimum me s rement (dwel ) times for s an in receivers an FFT-b sed me s rin

in truments in Ta le 1 an the s an times for sp ctrum analy ers in Ta le 2 a ply to CW

sig als

In ad ition, the test re ort s al in lu e the value of the me s rement in trumentation

u certainty cor esp n in to the u ed test set up, calc lated as p r the req irements of

Table 2 – Minimum s a time for the thre CISPR ba ds

with pe k a d qua i-pe k dete tors

Frequ nc ban

Sc n time T

Sfor

pe k dete tio

Sc n time T

Sfor

qu si-pe k dete tio

C a d D 3 MHz to 1 0 0 MHz 0,9 s 19 4 0 s = 3 3,3 min = 5 h 2 min

De en in on the typ of disturb n e, the s an time may have to b in re sed – even for

q asi-p a me s rements In extreme cases, the me s rement time T

m

at a certain

freq en y may have to b in re sed to 15 s, if the level of the o served emis ion is not

ste d (se 6.5.1) However isolated cl cks are ex lu ed

Scan rates an me s rement times for u e with the average detector are given in An ex C

Most prod ct stan ard cal out q asi-p a detection for compl an e me s rements, whic

can b very time-con umin if time-savin proced res are not a pl ed (se Clau e 8) Before

timesavin proced res can b a pl ed, the emis ion has to b detected u in a pre-s an To

en ure that, e.g intermitent sig als are not mis ed d rin an automated s an, the

con ideration in 6.6.3 to 6.6.5 s al b ac ou ted for

6.6.3 Sc n rate for s a nin re eiv rs a d spe trum a alyzers

One of two con ition ne d to b met to en ure that sig als are not mis ed d rin

automated s an over freq en y sp n :

• for a sin le swe p: the me s rement time at e c freq en y s al b larger than the

intervals b twe n pulses for intermit ent sig als;

• for multiple swe ps with maximum hold: the o servation time at e c freq en y s ould b

s ficient for interce tin intermitent sig als

The freq en y s an rate is l mited by the resolution b n width of the in trument an the vide

b n width set in If the s an rate is c osen to fast for the given in trument state, er one u

me s rement res lts wi b o tained Therefore, a s f iciently lon swe p time ne d to b

c osen for the selected freq en y sp n Intermit ent sig als may b interce ted by either a

sin le swe p with s ficient o servation time at e c freq en y or by multiple swe ps with

maximum hold Us al y for an overview over u known emis ion , the later wi b hig ly

ef icient: as lon as the sp ctrum resp n e c an es, there may sti b intermitent sig als to

dis over The o servation time s al b selected ac ordin to the p riodicity at whic

interferin sig als oc ur In some cases, the swe p time may have to b varied in order to

avoid s n hronization efects

When determinin the minimum swe p time for me s rements with a sp ctrum analy er or

s an in EMI receiver, b sed on a given in trument setin an u in p a detection, two

dif erent cases have to b distin uis ed If the vide b n width is selected to b wider than

the resolution b n width, the fol owin expres ion can b u ed to calc late the minimum

swe p time:

2

r esmin

s

Bf

kT

k is a con tant of pro ortional ty, related to the s a e of the resolution fi ter;

this con tant as umes a value b twe n 2 an 3 for s n hronou ly- u ed,

ne r-Gau sian fi ters For ne rly rectan ular, stag er- u ed fi ters, k has a

value b twe n 10 an 15

If the vide b n width is selected to b eq al to or smaler than the resolution b n width, the

fol owin expres ion can b u ed to calc late the minimum swe p time:

vid o

r esmin

s

BBf

kT

Most sp ctrum analy ers an s an in EMI receivers automatical y couple the swe p time to

the selected freq en y sp n an the b n width setin s Swe p time is adju ted to maintain a

calbrated display The automatic swe p time selection can b over id en if lon er

o servation times are req ired, e.g to interce t slowly varyin sig als

In ad ition, for re etitive swe ps, the n mb r of swe ps p r secon wi b determined by the

swe p time T

s min

an the retrace time ( ime ne ded to retu e the local os i ator an to store

the me s rement res lts, etc.)

6.6.4 Sc n time for stepping re eiv rs

Ste pin EMI receivers are con ec tively tu ed to sin le freq en ies u in predefined ste

sizes Whi e coverin the freq en y ran e of interest in dis rete freq en y ste s, a minimum

dwel time at e c freq en y is req ired for the in trument to ac urately me s re the input

sig al

For the actual me s rement, a freq en y ste size of rou hly 5 % of the resolution

b n width u ed or les (de en in on the resolution fi ter s a e) is req ired to red ce

me s rement u certainty for nar owb n sig als d e to the ste -width Un er these

as umption the s an time T

s minfor a ste pin receiver can b calc lated u in the folowin

eq ation:

r esmin

mmin

s

5,

f

TT

is the minimum me s rement (dwel ) time at e c freq en y

In ad ition to the me s rement time, some time has to b ta en into con ideration for the

s nthesizer to switc to the next freq en y an for the firmware to store the me s rement

res lt, whic in most me s rin receivers is automatical y done so that the selected

me s rement time is the efective time for the me s rement res lt Furthermore, the selected

detector, e.g p a or q asi-p a , determines this time p riod as wel

For purely bro db n emis ion , the freq en y ste size may b in re sed In this case, the

o jective is to fin the maxima of the emis ion sp ctrum only

6.6.5 Strate ie for obtaining a spe trum ov rview usin the pe k dete tor

For e c pre-s an me s rement, the pro a i ty of interce tin al critical sp ctral

comp nents of the EUT sp ctrum s al b eq al to 10 % or as close to 10 % as p s ible

De en in on the typ of me s rin receiver an the c aracteristic of the disturb n e, that

may contain nar owb n an bro db n comp nents, two general a pro c es are pro osed:

– ste p d s an: the me s rement (dwel ) time s al b lon enou h at e c freq en y to

me s re the sig al p a , e.g for an impulsive sig al the me s rement (dwel) time s ould

b lon er than the reciprocal of the re etition freq en y of the sig al

– swe t s an: the me s rement time s al b larger than the intervals b twe n intermit ent

sig als (sin le swe p) an the n mb r of freq en y s an d rin the o servation time

s ould b maximized to in re se the pro a i ty of sig al interce tion

Fig re 1, Fig re 2, an Fig re 3 s ow examples of the relation hip b twe n variou tim

e-varyin emis ion sp ctra an the cor esp n in display on a me s rin receiver In e c

case, the up er p rt of the fig re s ows the p sition of the receiver b n width as it either

swe ps or ste s throu h the sp ctrum

Ke :

T

o

is th p lse-re etitio interv l of th imp lsiv sig al A p lse o c rs at e c v rtic l ln of th sp ctrum

v rsus time displa (u p r p rt of th fig re)

Fig re 1 – Me s reme t of a combination of a CW sign l (NB) a d a impulsiv

signal (BB) using multiple swe ps with ma imum hold

If the typ of emis ion is u known, multiple swe ps with the s ortest p s ible swe p time an

p a detection faci tate determinin the sp ctrum en elo e A s ort sin le swe p is s f icient

to me s re the contin ou nar owb n sig al content of the EUT sp ctrum For contin ou

bro db n an intermit ent nar owb n sig als, multiple swe ps at variou s an rates u in a

“maximum hold” fu ction may b neces ary to determine the sp ctrum en elo e For low

re etition impulsive sig als, man swe ps wi b neces ary to fi up the sp ctrum en elo e

of the bro db n comp nent

The red ction of me s rement time req ires a timin analy is of the sig als to b me s red

This can b done either with a me s rin receiver that provides a gra hical sig al display,

u ed in zero-sp n mode or u in an os i os o e con ected to the IF or vide output of the

receiver, an with an example s own in Fig re 2

IEC

NOT Disturb n e from a d.c c le tor motor; d e to th n mb r of c le tor se me ts, th p lse re etitio

fre u n y is hig (a pro imately 8 0 Hz) a d th p lse ampltu e v ries c nsid ra ly Th refore for this e ample,

th re omme d d me sureme t (dwel) time with th p a d te tor is >10 ms

Figure 2 – Ex mple of a timing a aly is

From s c a timin analy is, pulse d ration an pulse re etition freq en ies can b

determined an s an rates or dwel times selected, an ac ordin to the fol owin :

– for continuous unmodulate nar owba d disturb n es, the fastest s an time p s ible

for the selected in trument setin s may b u ed;

– for pure continuous broa ba d disturb n es, e.g from ig ition motors, arc weldin

eq ipment, an col ector motors, a ste p d s an (with p a or even q asi-p a detection)

for sampl n of the emis ion sp ctrum may b u ed In this case the knowled e of the

typ of disturb n e is u ed to draw a p lyl ne (piecewise) c rve as the sp ctrum en elo e

(se Fig re 3) The ste size s al b c osen so that no sig ificant variation in the

sp ctrum en elo e are mis ed A sin le swe t me s rement, if p rformed slowly enou h,

wi also yield the sp ctrum en elo e;

– for intermit e t nar owba d disturb n es with u known freq en ies either fast s ort

swe ps in olvin a “maximum hold” fu ction (se Fig re 4) or a slow sin le swe p may b

u ed A timin analy is may b req ired prior to the actual me s rement to en ure pro er

0

ms 2

2 4 6 8 10 12 14 16 18

Mk r : 1 ms 6 ,1 dB(µV)

Th me sureme t (dwel) time T

m

sh l b lo g r th n th p lse re etitio interv l T

p, whic is th in erse of th

p lse re etitio fre u n y

Fig re 3 – A broa ba d spe trum me s re with a steppe re eiv r

IE

NOT 1 Th n mb r of swe ps re uire or th swe p time ma h v to b in re se , d p n in o p lse

d ratio a d p lse re etitio interv l

NOT 2 Inthis e ample, fiv swe ps are re uire for al sp ctral c mp n nts to b interc pte

Figure 4 – Intermit e t n r owba d disturba c s me s re using fa t s ort repetitiv

swe ps with ma imum hold function to obtain a ov rview of th emis ion spe trum

6.6.6 Timing considerations using FFT-ba e instrume ts

FFT-b sed me s rin in truments may combine the p ral el calc lation at N freq en ies an

a ste p d s an For this purp se the freq en y ran e of interest is s bdivided into a n mb r

of segments N

se

that are s an ed seq ential y The proced re is s own in Fig re 5 for thre

segments The total s an time for the freq en y ran e of interest T

FFT-b sed me s rin in truments may also provide method to improve the freq en y

resolution acros a given freq en y ran e In general, an FF -b sed me s rin in trument

wi have a fixed freq en y ste f

ste F T

that is determined by the n mb r of freq en ies of

the F T In re sed freq en y resolution is ac ieved by p rformin re e t calc lation over a

given freq en y ran e For e c re e t calc lation, the lowest freq en y is in remented by a

freq en y ste , f

ste fin l

IEC

Hen e the first calc lation over the given freq en y ran e con iders the folowin

F Tste

m

sa

ff

F Tste

s gm

s a

ff

NT

(6)

NOT 1 F T-b se me surin instrume ts ma c mbin b th meth ds, th ste p d sc n as wel as a meth d to

impro e th fre u n y resolutio

NOT 2 Ad itio al b c gro n informatio o th d finitio of th F T-b se re eiv r c n b fo n in

CIS R TR 16-3 [3]

Figure 6 – Fre ue c re olution e ha c d

by FFT-ba e me s ring instrume t

7 Measureme t of radiated disturbances

7.1 Introductory remark

This clau e sets forth the general proced res for the me s rement of the field stren th of

radio disturb n e prod ced by devices an s stems Exp rien e with radiated disturb n e

me s rements is les exten ive than that of voltage me s rements The radiated disturb n e

me s rement proced res are therefore o en to revision an exten ion as knowled e an

exp rien e are ac umulated In p rtic lar, at ention s al b given to the efect of le d an

ca les as ociated with the EUT Ta le 3 provides a s mmary l st of CISPR radiated emis ion

test sites an test method and the related cros -referen es to s bclau es within this

doc ment or to other doc ments

For some prod cts, it may b req ired to me s re the electric, the mag etic, or b th

comp nents of the radiated disturb n e Sometimes a me s rement of a q antity related to

radiated p wer is more a pro riate Normal y me s rements s ould b made of b th the

horizontal an vertical comp nents of the disturb n e with resp ct to the referen e grou d

plane The res lts of meas rements of either the electric or mag etic comp nents may b

expres ed in p a , q asi- p a , average or rms values

The mag etic comp nent of the disturb n e is normal y me s red at freq en ies up to

3 MHz In mag etic field me s rements only the horizontal comp nent of the field at the

p sition of the receivin anten a is me s red when u in the distant anten a proced re If

the lo p anten a s stem (LAS) is u ed, the thre orthogonal mag etic dip le moments of the

EUT are me s red (Note that in the sin le anten a method, the horizontal comp nent of the

field at the p sition of the anten a is determined by the horizontal an vertical dip le

moments of the EUT b cau e reflection play a p rt.)

Table 3 – Appl c ble fre ue c ra ge a d doc me t refere c s

for CISPR ra iate emis ion te t site a d te t methods

The lo p anten a s stem (LAS) con idered in this s bclau e is s ita le for in o r me s rement of

the mag etic field stren th emited by a sin le EUT in the freq en y ran e 9 kHz to 3 MHz

The mag etic field stren th is me s red in terms of the c r ents in u ed into the LAS by the

mag etic disturb n e field of the EUT The LAS s al b val dated reg larly u in the method

des rib d in CISPR 16-1-4 CISPR 16-1-4 also gives a complete des ription of the LAS an a

relation b twe n the me s rin res lts o tained with the LAS an those o tained as

des rib d in this s bclau e

7.2.2 Ge eral me s reme t method

Fig re 7 s ows the general con e t of me s rements made with the LAS The EUT is placed

in the centre of the LAS The c r ent in u ed by the mag etic field from the EUT into e c of

the thre large lo p anten as of the LAS is me s red by con ectin the c r ent pro e of the

large lo p anten a to a me s rin receiver (or eq ivalent Durin the me s rements, the

EUT remain in a fixed p sition

The c r ents in the thre large lo p anten as, originatin from the thre mutual y orthogonal

mag etic field comp nents, are me s red in seq en e Eac c r ent level me s red s al

comply with the emis ion l mit, expres ed in dB(µA), as sp cified in the prod ct stan ard The

emis ion lmit s al a ply for an LAS havin large lo p anten as with the stan ardized

diameter of 2 m

Figure 7 – Con ept of ma netic field induc d c r e t me s reme ts ma e

with the loop a te na s stem

7.2.4 Config ration of th e uipme t under te t

To avoid u wanted ca acitive coupl n b twe n the EUT an the LAS, the maximum

dimen ion of the EUT s al alow a distan e of at le st 0,2 m b tween the EUT an the

stan ardized 2 m large lo p anten as of the LAS

The p sition of the main le d s al b o timized for maximum c r ent in u tion In general,

this p sition wi not b critical when the EUT compl es with the con u ted emis ion l mit

In case of a large EUT, the diameter of the lo p anten as of the LAS may b in re sed up to

4 m In that case:

a) the c r ent values me s red s al b cor ected in ac ordan e with Clau e B.6 of

CISPR 16-1-2:2 14; an

b) the maximum dimen ion of the EUT s al al ow a distan e b twe n the EUT an the

large lo ps of at le st (0,1 × D) m, where D is the diameter of the non-stan ardized lo p

7.2.5 Me s reme t unc rtainty for LAS

General an b sic con ideration a out u certainties of emis ion me s rements are given in

CISPR 16-4-1

7.3 Ope -are te t site or s mi-a e hoic c amber mea ureme ts (3 MHz to 1 GHz)

The q antity to b me s red is the maximum electric field stren th emited by the EUT as a

fu ction of horizontal an vertical p larization an at heig ts b twe n 1 m an 4 m, an at a

horizontal distan e of 10 m from the EUT, over al an les in the azimuth plane This q antity

s al b determined with the fol owin provision :

a) the freq en y ran e of interest is 3 MHz to 1 0 0 MHz;

b) the q antity s al b expres ed in terms of field stren th u its that cor esp n with the

u its u ed to expres the l mit levels for this q antity;

c) a SAC/OATS me s rement site an p sitionin ta le s al b u ed that compl es with the

a plca le CISPR val dation req irements;

d) a me s rin receiver complant with CISPR 16-1-1 s al b u ed;

e) the u e of alternative me s rement distan es, s c as 3 m or 3 m in te d of 10 m, s al

b con idered as alternative me s rement method ;

f the me s rement distan e is the horizontal projection of the distan e b twe n the

b u dary of the EUT an the anten a referen e p int to the grou d plane;

g) the EUT is config red an o erated in ac ordan e with the CISPR sp cification ;

h) fre -sp ce anten a factors s al b u ed

The me s ran E is derived from the maximum voltage re din V

r

by u in the fre -sp ce

anten a factor F

a:

FAV

is the los in dB of the me s ring ca le b twe n anten a an receiver

Fre -sp ce anten a factors are u ed as a fig re of merit for the anten a It s ould b noted

the field stren th is me s red a ove a grou d plane, not in a fre -sp ce en ironment

In an EMC disturb n e me s rement the electric field stren th is req ired at a given distan e

from the b u dary of the EUT The test distan e is me s red from the referen e p int of the

anten a to the b u dary of the EUT (se Fig re 8) In the case of a diferen e b twe n the

referen e p int on an anten a an the phase centre, a cor ection factor may b a pl ed to

o tain the field stren th at the test distan e

NOT 1 Se also 7.5.2.2 a d A.6.2 of CIS R 16-1-6:2 14 [2] a o t c re tio s of field stre gth results for

a te n p asec ntre v riatio s

Figure 8 – Me s reme t dista c

As an example, con ider a typical log-p riodic dip le ar ay (LPDA) anten a that has a

se aration of a proximately 0,6 m b twe n the dip le that is resp n ive to the field at

2 0 MHz an the dip le that is resp n ive at 1 0 0 MHz For the me s rement of the

emis ion at a distan e d = 3 m from the EUT, at a freq en y of 2 0 MHz, the electric field

stren th wi b me s red at a distan e of a proximately 3,3 m from P2 in Fig re 9, ac ordin

to the value of d

p asefrom Eq ation (1 ), where P2 is the b u dary of the EUT

For a given freq en y, the fol owin cor ection, ∆E in dB, s al b ad ed to the me s red

electric field stren th:

IEC

p a e

lg2

1P1

p a e

dddd

f

−+

minma

min

1

))

(

d

ll

ddll

MHz an is eq al to 0,9 × 15 /f in m, where 0,9 is a generic s ortenin

factor d e to the finite radiu of the dip le [1 ]

l

min

ma

are len th of the dip les havin minimum an maximum len th (i.e the

dip les are resonant at a proximately the up er an lower o eratin

freq en ies, resp ctively);

d

min

ma

are the distan es from the minimum an maximum len th dip les to the

anten a tip, resp ctively

For h brid anten as the phase center p sition d

p ase

is determined u in information s p l ed

by the anten a man facturer In case of ta ular form the anten a man facturer s al provide

d

1f

for the freq en y ran e 10 MHz to 3 0 MHz with a maximum freq en y ste of 2 MHz

It is as umed in Eq ation (8) that the field p int is in the far- ield of the anten a In a ne

r-field situation, u ual y for les than half a wavelen th, the me s rement for A

APR(se

Eq ation (3 ) of CISPR 16-1-4:2 10/AMD1:2 12) ta es ne r- ield efects into ac ou t For

more detai , in lu in cor ection for ta ered LPDA section of hybrid anten as, se 7.5.2.2

of CISPR 16-1-6:2 14 [2] Line r interp lation is u ed to estimate the phase centre p sition

for freq en ies b twe n the resonant freq en ies of the elements at the en s of the o eratin

freq en y ran e

If a phase centre cor ection is not a pl ed it s al b con idered in the me s rement

in trumentation u certainty bu get in ac ordan e with CISPR 16-4-2

NOT 2 Th a te n c lbratio la oratory ma pro id th ele tric field stre gth c re tio for sp cific

me sureme t dista c s (e.g 3 m a d 10 m) b e uiv le t c re tio s of th a te n fa tor for th se dista c s

Figure 9 – Separation dista c relativ to the pha e c ntre of a LPDA a te na

7.3.2 Te t site re uireme ts

The test site s al conform to the relevant sp cification of CISPR 16-1-4 for its ph sical an

electrical pro erties, an for its val dation

7.3.3 Ge eral me s reme t method

Fig re 10 s ows the con e t of me s rements made on an o en-are test site (OAT ) or in a

semi-anec oic c amb r (SAC) with the direct an grou d reflected ray ar ivin at the

l

ma

l

f l