Iec 61869-9-2016.Pdf

IEC 61 869 9 Edition 1 0 201 6 04 INTERNATIONAL STANDARD Instrument transformers – Part 9 Digital interface for instrument transformers INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 1 7 220 20 ISBN 97[.]

CONTENTS

FOREWORD 4

INTRODUCTION 7

1 Sco e 12 2 Normative referen es 12 3 Terms an definition 13 3.5 T erms a d definition related to other ratin s 13 3.7 In ex of a breviation 13 4 Normal an sp cial service con ition 14 5 Ratin s 14 5.6 Rated ac urac clas 14 5.9 1 Performan e req irements 15 6 Desig an con tru tion 16 6.9 1 Tec nological b u daries 16 6.9 1.1 Interface p int 16 6.9 1.2 Digital output interface 16 6.9 1.3 Human-mac ine interface 16 6.9 2 Electrical req irements 17 6.9 2.1 Freq en y resp n e req irements 17 6.9 2.2 Maximum proces in delay time req irement 17 6.9 3 Sp cification of the commu ication profie 19 6.9 3.1 General 19 6.9 3.2 Variants 19 6.9 3.3 Digital output sample rates 2

6.9 3.4 L gical devices 21 6.9 3.5 L gical nodes LPHD 21

6.9 3.6 L gical nodes L N0 21

6.9 3.7 L gical nodes TCTR 21

6.9 3.8 L gical nodes TVTR 2

6.9 3.9 Qual ty 25 6.9 3.10 Dataset s) 26 6.9 3.1 Multicast sampled value control block(s) 27 6.9 3.12 Config ration of the mergin u it 2

6.9 3.13 Rated conforman e clas es 2

6.9 4 Sy c ronization 3

6.9 4.1 General 3

6.9 4.2 Precision time protocol s n hronization 3

6.9 4.3 1PPS s n hronization 35 6.9 4.4 Sample value mes age SmpSy c atribute 35 6.9 4.5 Holdover mode 3

6.9 4.6 Fre -ru nin mode 3

6.9 4.7 Time adju tments 3

7 Tests 3

7.2 Typ tests 3

7.2.6 Test for ac urac 38 7.2.9 1 Digital output conforman e tests 3

7.2.9 3 L s of s n hronization tests 3

7.2.9 4 1PPS test 39 An ex 9A (informative) Dy amic ran e con ideration 4

An ex 9B (informative) Time s n hronization an management example 4

An ex 9C (informative) Example mergin u it ICD fie 4

An ex 9D (informative) Test circ its for ac urac me s rement 5

An ex 9E (informative) Electronic name late 5

Bibl ogra h 6

Fig re 9 1 – General block diagram of an electronic LPIT with digital output 8

Fig re 9 2 – General i u tration of the o jects within a mergin u it (example) 9

Fig re 9 3 – Electronic LPIT with digital output (con e t example) 10 Fig re 9 4 – Stan alone mergin u it 1

Fig re 9 5 – Duplex LC con ector 16 Fig re 9 6 – Maximum proces in delay time 17 Fig re 9 7 – Output mes age timestamp p int 19 Fig re 9 8 – TCTR namin example 2

Fig re 9 9 – 1PPS sig al waveform at the mergin u it clock input 3

Fig re 910 – Time adju tment example (6 ASDU example) 3

Fig re 9A.1 – Nomogram for c r ent 41

Fig re 9A.2 – Nomogram for voltage 4

Fig re 9B.1 – Sampled value sig al proces in example s owin 2ASDUs p r mes age (F4 0 S2I4U4 example) 43 Fig re 9D.1 – Example test circ it 56 Fig re 9D.2 – Example test circ it 58 Ta le 9 1 – Maximum proces in delay time l mits 18 Ta le 9 2 – Stan ard sample rates 2

Ta le 9 3 – Exten ion to the LPHD clas 21

Ta le 9 4 – AmpSv o ject at ribute values 2

Ta le 9 5 – Exten ion to the TCTR clas 2

Ta le 9 6 – VolSv o ject at ribute values 2

Ta le 9 7 – Exten ion to the TVTR clas 2

Ta le 9 8 – Config ration p rameters of the mergin u it 2

Ta le 9 9 – Basic conforman e statement 2

Ta le 910 – ACSI models conforman e statement 2

Ta le 91 – ACSI service conforman e statement 31

Ta le 912 – PICS for A-Profi e s p ort 3

Ta le 913 – PICS for T-Profi e s p ort 3

INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 9: Digital interface for instrument transformers

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International Stan ard IEC 618 9-9 has b en pre ared by IEC tec nical commite 3 :

In trument tran formers

This first edition re laces the cor esp n in sp cific req irements previou ly contained in

IEC 6 0 4-8, publ s ed in 2 0

The text of this stan ard is b sed on the fol owin doc ments:

Ful information on the votin for the a proval of this stan ard can b fou d in the re ort on

votin in icated in the a ove ta le

This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 618 9 series, publs ed u der the general title Instru me t

tra sformers, can b fou d on the IEC we site

This publcation contain an atac ed fi e in the form of a xml fi e This fi e is inten ed to b

u ed as a complement an do s not form an integral p rt of the publ cation

This International Stan ard contain sp cific req irements for electronic low p wer in trument

tran formers (LPIT) havin a digital output

This Part 9 is to b re d in conju ction with, an is b sed on, IEC 618 9-1:2 0 , G ene ral

Re u ireme ts an IEC 618 9-6:2 16 However, the re der is en ouraged to u e its most

recent edition

This Part 9 fol ows the stru ture of IEC 618 9-6 an IEC 618 9-1 an s p lements or

modifies their cor esp n in clau es/s bclau es

When a p rtic lar clau e/s bclau e of Part 6 is not mentioned in this Part 9, that

clau e/s bclau e a pl es When this stan ard states “ad ition”, “modification” or

“re lacement”, the relevant text in Part 6 is to b ada ted ac ordin ly

When a p rtic lar clau e/s bclau e of Part 1 is not mentioned in Part 6, that

clau e/s bclau e a pl es When p rt 6 states “ad ition”, “modification” or “re lacement”, the

relevant text in Part 1 is to b ada ted ac ordin ly

For ad itional clau es, s bclau es, fig res, ta les, an exes or note, the fol owin n mb rin

s stem is u ed:

– clau es, s bclau es, ta les, fig res an notes that are n mb red startin from 9 1 are

ad itional to those in Part 1;

– ad itional an exes are let ered 9A, 9B, etc

An overview of the plan ed set of stan ard at the date of publ cation of this doc ment is

given b low The updated l st of stan ard is ued by IEC TC3 is avai a le at the we site:

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A bi n ual version of this publ cation may b is ued at a later date

IMPORTANT – Th 'colour in ide' logo on the cov r pa e of this publ c tion indic te

that it contain colours whic are consid re to be us ful for th cor e t

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colour printer

Ge eral

This stan ard is a prod ct fami y stan ard for in trument tran formers It provides an

a pl cation of the stan ard series IEC 618 0, whic detais layered s bstation commu ication

arc itecture in the world of in trument tran formers

By providin tutorial material s c as examples an explanation , it also provides ac es for

in trument tran former, protective relay an meter exp rts to con e ts an method a pl ed

in the IEC 618 0 series

Comp red to in trument tran formers, digital commu ication tec nolog is s bject to on-goin

c an es whic are exp cted to contin e in the future Sig ificant exp rien e with electronic

integrated directly into in trument tran formers has yet to b gathered on a bro der b sis, as

this typ of eq ipment is not widely spre d in the in u try an a c an e of p radigm has not

yet oc ur ed

Position of this sta dard in relation to th IEC 618 0 s rie

The IEC 618 0 series is a stan ard inten ed to b u ed for commu ication networks an

s stems for p wer uti ty automation The most imp rtant p rts of this series define:

a) information models for the s bstation automation s stem;

b) these information models in lu e b th the models of the in trument tran formers an

other proces eq ipment (l k circ it bre k rs an dis on ectors), an the models of the

s bstation automation s stem (l k protection relay an meters) The models are defined

in IEC 618 0-7-3 an IEC 618 0-7-4;

c) the commu ication b tween intel gent electronic devices (IEDs) of the s bstation

automation s stem The a stract models are defined in IEC 618 0-7-2 an the ma pin s

on commu ication stacks are defined in IEC 618 0-8-1 an IEC 618 0-9-2;

d) a config ration lan uage u ed to des rib the config ration asp cts of the s bstation

automation s stem is des rib d in IEC 618 0-6;

e) conforman e testin of the commu ication interfaces of the IEDs of the p wer uti ty

automation s stem in lu in their data models The conforman e testin is defined in

IEC 618 0-10

Typical y, in a traditional s stem, IEDs l k b y level control ers or protection relay interface

directly throu h analog e sig als to in trument tran formers In that case, the data models of

the in trument tran formers are implemented in these b y level devices However, this is not

the only re l zation In the case where electronic are integrated directly into electronic LPIT,

the a ove-mentioned data models s ould b implemented within the in trument tran former

an the in trument tran former ne d to s p ort a commu ication interface The p rt of an

electronic LPIT that do s this is known as the mergin u it

IEC 618 0, b in a s stem oriented stan ard series, le ves man o tion o en in order to

s p ort present an future req irements of al sizes of s bstation at al voltage levels

To red ce the en ine rin amou t req ired to ac ieve intero era i ty for the digital interface

b twe n in trument tran formers an eq ipment that u es the digital sig al (l k protective

relay , meters or b y level control ers), this stan ard sp cifies ad itional con traints on

implementin a digital commu ication interface

The IEC 618 9-9 stan ard:

– re laces the IEC 6 0 4-8 digital solution;

– provides a prod ct stan ard for in trument tran formers with a digital interface ac ordin

to the IEC 618 0 series; simi ar to what IEC 6 2 1-3 ofers for switc ge r;

– in lu es b ckward comp tibi ty for the UCA International Users Group Imp leme ntato

G uideln forD igital Interface to Instru me t Tra sformers Usin IEC 618 0-9-2;

– u es IEC 615 8 b sed time s n hronization in ac ordan e with IEC/IEEE 618 0-9-3, with

an o tion for 1PPS (pulse p r secon )

Ov rview of the digital interfa e for instrume t tra sformers

An i u trative general block diagram of an in trument tran former with digital output is s own

in Fig re 9 1 It s ows multiple c r ent an /or voltage information comin from the secon ary

con erters (SC in Fig re 9 1) an fed into a common block la el ed “mergin u it” The

mergin u it p rforms al the data proces in (sampl n , analog e to digital con ersion,

s al n , mes age formatin , etc.) neces ary to prod ce a time-coherent output data stre m

ac ordin to this stan ard For the purp ses of this stan ard a mergin u it is a ph sical u it

(hardware s bs stem) u ed to as emble an tran mit digital output data frames

Fig re 9 1 – Ge eral bloc dia ram of a ele tronic

LPIT with digital output

A mergin u it is model ed as one or more logical devices that contain multiple logical nodes

as i u trated in Fig re 9 2

Mergin u it (ph sic l d vic )

LN cla s

In ta tiate to MSV B0

In ta tiate to Un NT VT R4

IE

Figure 9 2 – Ge eral i lustration of the obje ts within a mergin unit (e ample)

Cur ent an voltage me s rements in the example mergin u it in Fig re 9 2 are model ed

p r IEC 618 0-7-1 by u in the fol owin logical nodes:

• Clas TCTR p r IEC 618 0-7-4, in tantiated in ivid al y for e c of the thre c r ent

tran former phases, an for the neutral c r ent me s rement

• Clas TVTR p r IEC 618 0-7-4, in tantiated in ivid al y for e c of the thre voltage

tran former phases, an for the neutral voltage me s rement

• L gical node zero LLN0 containin in tan es of the sampled value control blocks

(MSVCB0 an MSVCB0 in this example) control n simultane u publ s in of

IEC 618 0-9-2 data stre ms (in this example one with 4 8 0 samples p r secon an

2 samples p r frame yieldin a frame rate of 2 4 0 p r secon , the other with

2 4 0 p r secon ), an a dataset that controls the content of the sampled value digital

output mes ages

Ap l ca le sample rates, time s n hronization, control blocks an dataset are defined in this

stan ard

Ph sical re l zation of the a ove con e ts may vary with the a pl ed tec nolog determinin

whic p rts are neces ary for the re l zation of an actual in trument tran former One s c

re l zation s owin an electronic LPIT with buit in digital data output is s own in Fig re 9 3

an further des rib d in the relevant prod ct sp cific stan ard in the IEC 618 9 series

(Part 7, Part 8, Part 12, Part 14, Part 15)

A Phase Curent

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

sen or con e er tran mitin s stem con erter

In trument

Tran former

Sy tem

IEC

Figure 9 3 – Ele tronic LPIT with digital output (con ept e ample)

It is not a solutely neces ary that al p rts s own in Fig re 9 3 b in lu ed For clarity, p wer

s p l es are not s own here An in trument tran former may b implemented in a sin le

ph sical u it or in multiple ph sical u its For example, there may b a se arate ph sical u it

for e c phase containin the primary voltage an /or c r ent sen ors, primary con erters an

primary in ulation, with al secon ary con erters an the mergin u it in a se arate ph sical

u it located in the control hou e The n mb r of primary inputs an their typ (voltage or

c r ent in a sin le in trument tran former may b other than s own here

For comp rison, an i u trative general block diagram of an in talation u in a stan -alone

mergin u it (SAMU) is s own in Fig re 9 4 Unl k the mergin u it in an in trument

tran former, a SAMU is a se arate prod ct covered in IEC 618 9-13 It ac e ts as inputs the

outputs of in trument tran formers, said outputs conformin to the sp cification of one of the

prod ct stan ard in the IEC 618 9 series The n mb r of inputs an their typ (voltage or

c r ent may b other than s own in Fig re 9 4 Output prod ced by a SAMU an output

prod ced by an electronic LPIT with bui t in mergin u it s ould in prin iple b

in istin uis a le from e c other (ex ludin the fact that SAMU output wi typical y have

lower ac urac d e to cas adin the se arately given in trument tran former an SAMU

ac urac sp cification )

Inst rume t Tra sformer

Inst rume t Tra sformer

Inst rume t Tra sformer

Inst rume t Tra sformer

Inst rume t Tra sformer

Inst rume t Tra sformer

Inst rume t Tra sformer

Inst rume t Tra sformer

IT o t put sig als

(a alo u or digit al)

, as so n as this sta d rd wi b a aia le

Figure 9 4 – Sta dalon merging unit

_ _ _ _ _ _ _

INSTRUMENT TRANSFORMERS –

Part 9: Digital interface for instrument transformers

This p rt of IEC 618 9 is a prod ct fami y stan ard a pl ca le to in trument tran formers with

digital output The prod ct stan ard is comp sed of IEC 618 9-1 an IEC 618 9-6, in ad ition

to this stan ard an the relevant prod ct sp cific stan ard in the IEC 618 9 series (Part 7,

Part 8, Part 12, Part 13, Part 14, an Part 15)

This stan ard defines req irements for digital commu ication of in trument tran former

me s rements It is b sed on the IEC 618 0 series, UCA international u ers group doc ment

Impleme tato guideln for digital inte rface to instru me nt tra sforme rs usin IEC 618 0 -9-2,

an the relevant p rts of IEC 6 0 4-8 that are re laced by this stan ard It in lu es ad itional

improvements in lu in the IEC 615 8 network b sed time s n hronization

The folowin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

Clau e 2 of IEC 618 9-6:2 16 is a pl ca le with the folowin ad ition :

IEC 615 8:2 0 , Precisio clock sy chro izato p rotocol for n twork d me sureme t a d

co trol syste ms

IEC 618 0-6:2 0 , Commu nicato n tworks a d systems for p we r u ti ty au tomato –

Part 6: Configurato de scrip tio la gu ag forcommu nicato in e le ctrical sub stato s relate d

to IEDs

IEC 618 0-7-1:2 1 , Communicato n tworks a d systems for p ower u ti ty au tomato –

Part 7-1: Basic commu nicato structu re – Princip les a d models

IEC 618 0-7-2:2 10, Commu nicato n tworks a d systems for p ower u ti ty au tomato –

Part 7-2: Basic informato a d commu nicato structure – Ab stract commu nicato service

interface (ACSI

IEC 618 0-7-3:2 10, Communicato n tworks a d systems for p owe r u ti ty au tomato –

Part 7-3: Basic commu nicato structure – Commo data clas es

IEC 618 0-8-1:2 1 , Commu nicato n tworks a d systems for p owe r u ti ty automato –

Part 8-1: Sp ecific commu nicato service ma p in (SCSM) – Map pin s to MMS (ISO 950 6-1

a d ISO 950 -2) a d to ISO/IEC 8 02-3

IEC 618 0-9-2:2 1 , Commu nicato n tworks a d systems for p owe r u ti ty automato –

Part 9-2: Sp cific commu nicato service m ap p in (SCSM) – Sample d v lues o er

ISO/IEC 880 -3

IEC/IEEE 618 0-9-3:2 16, Commu nicato n tworks a d systems for p owe r u ti ty

IEC 618 0-10:2 12, Commu nicato n tworks a d system s for p wer u ti ty au tomato –

Part 10 : Co forma ce te stn

IEC 618 9-6:2 16, Instru me t tra sforme rs – Part 6: Ad i o al gene ral re qu ireme ts for

low-p ower instru me t tra sformers

UCA (International Users Group), Impleme tato gu ideln fordigital inte rface to instru me t

tra sforme rs usin IEC 618 0-9-2

3 Terms a d definitions

3.5 Terms a d definitions relate to other rating

For the purp ses of this doc ment, the terms an definition in IEC 618 9-6:2 16 a ply, with

the fol owin ad ition :

3.5.9 1

rate holdov r time

rated d ration over whic the mergin u it contin es to sen samples maintainin the sample

timin req ired for the me s rin ac urac clas fol owin los of the time sig al

3.5.9 2

proc s ing dela time

t

p

dif eren e b twe n the time en oded by the field SmpCnt in a digital output mes age an the

time this mes age a p ars at the digital output

3.5.9 3

ma imum proc s in dela time

lon est proces in delay time (t

p) u der al rated o eratin con ition

3.5.9 4

fre runnin mod

o eratin mode where sampled values is ued by the mergin u it are not s n hronised to an

external clock to the degre req ired to me t the me s rin ac urac clas phase er or l mit

Note 1 to e try: Th v lu s are b se o a intern l clo k osci ator

3.7 Ind x of abbre iation

In ex of a breviation of IEC 618 9-6:2 16 is exten ed by the ad ition of the fol owin :

9-2 E The sampled value protocol defined by UCA International Users Group doc ment

Impleme ntato G u ide lin for D igital Inte rface to Instru me t Tra sformers usin

IEC 618 0-9-2, modification In ex R2-1 dated 2 0 -0 -0

ASDU Ap l cation Service Data Unit

ACSI Abstract Commu ication Service Interface

SCSM Sp cific Commu ication Service Ma pin

SAV Common data clas defined in IEC 618 0-7-3:2 10, 7.4.4 for model n sampled

values

TCTR L gical node defined in IEC 618 0-7-4:2 10, 5.15.4 for model n sampled values

from c r ent tran formers

TVTR L gical node defined in IEC 618 0-7-4:2 10, 5.15.2 for model n sampled values

from voltage tran formers

SCL Sy tem Config ration des ription L n uage ac ordin to IEC 618 0-6:2 0 ,

Clau e 4

ICD IED Ca a i ty Des ription fi e ac ordin to IEC 618 0-6:2 0 , 5.3

IED Intel gent Electronic Device

SAS Substation Automation Sy tem

SAMU Stan Alone Mergin Unit

EMC ElectroMag etic Comp tibi ty

4 Normal and special servic conditions

Clau e 4 of IEC 618 9-1:2 0 a pl es

Ac urac clas es for electronic LPIT with digital output are defined in the a pl ca le

IEC 618 9 series prod ct stan ard Part 7, Part 8, Part 12, Part 13, Part 14, an Part 15

Ac urac clas sp cification a ply en - o-en , re resentin al er ors introd ced b twe n

the in trument tran former primary an the pro erly time-stamp d mes age cre ted at the

digital output

Ac urac sp cification directly in orp rate al er ors as ociated with time s n hronization

Time s n hronization req irements are as des rib d in 6.9 4

With regard to ac urac clas es, in trument tran formers with digital output s al b clas ified

in two groups:

• me s rin in trument tran formers,

• protection in trument tran formers

To ma e b st u e of the d namic ran e ena led by the 3 -bit mes age format sp cified in

this stan ard, al protection in trument tran formers an protection ca a le SAMU c an els

s al b sp cified with d al ac urac clas ratin s Dual ratin is inten ed to precisely

doc ment the me s rin an protection ac urac clas a pl ca le to a given c an el

The d al ratin req irement acknowled es the fact that protection rated in trument

tran formers are commonly also u ed for me s rement an in ication purp ses It

esta l s es a proven, wel u dersto d method for doc mentin this p rforman e

The protection in trument tran former ac urac clas s al b given as a slas “ ” s mb l

se arated p ir, with me s rin ac urac clas ta in the first p sition an the protection

ac urac clas fol owed by the ac urac l mit factor K

ALF

at the en Dual sp cification s al

b re orted on the digital in trument tran former name late

Ratin examples:

0,2S 0,2S clas me s rin in trument tran former (not rated for protection)

0,2S/5P2 5P2 protection in trument tran former me tin clas 0,2S me s rin

ac urac clas req irements

5.9 1 Performa c re uireme ts

Electronic LPIT with digital output s al me t al the req irements defined in IEC 618 9

sp cific prod ct stan ard Part 7, Part 8, Part 12, Part 13, Part 14, an Part 15, if a pl ca le

This req irement therefore exten s to the mergin u it comp nent whic is an integral p rt of

the in trument tran former a p ratu , an is therefore s bject to the same en ironmental an

EMC con ition

De en in on the device conforman e clas defined in 6.9 3.13, the mergin u it comp nent

may b exp sed to variou levels of Ethernet network trafic Althou h it is imp s ible to

forese al o eratin en ironments, the fol owin recommen ation are provided b sed on

re l l fe field exp rien e:

• mergin u it b haviour s ould b wel defined u der al o eratin con ition ;

• if present, the test sig al generatin ca a i ty s ould b disa led by default;

• al data in lu ed in the same ASDU (in lu in q alty bits) s ould b mutual y con istent

an re resent the same time in tant as req ired by the a pl ca le ac urac clas

sp cification;

• data s al b s n hronized to a common time referen e as des rib d in 6.9 4

Mergin u its s ould have wel defined b haviour u der al o eratin con ition This

esp cial y a pl es d rin p wer-up, p wer-down an self diag ostic s stem faiure in ication

(as req ired by IEC 618 9-6:2 16, 6.6 4) Whi e the mergin u it output (data stre m) may

b come u avai a le at an time ( hrou h comp nent fai ure), when present, q al ty bits within

the stre m s ould faithful y re resent the electronic LPIT o eratin state in ac ordan e with

the bui t in self c eck, diag ostic ca a i ties or external alarm inputs (when present Qual ty

bits are u ed by protective relay , an are reled up n to prevent protective s heme mal

-o eration

For example, when p werin up, an o tical c r ent tran former may ne d to activate

thermo lectric co lers, p rform careful y control ed laser start up, an wait u ti the s stem

has sta i zed to al ow o eration within stated ac urac Durin this proces , mergin u it

(digital) output s ould b disa led If data output is ena led, al af ected data values s ould

b tag ed as ‘ n al d’, an detai ed q al ty set to either ‘fai ure’ or ‘nac urate’ in ac ordan e

with 6.9 3.9 The same req irement a pl es d rin p wer-down (los of p wer) an self

diag ostic s stem activation (i.e DSP s bs stem fai ure) The mergin u it s ould g arante

no u - lag ed b d sampled value data is output

Bui t in test sig al generatin ca a i ty is general y en ouraged, but s ould b con idered at

the s bstation s stem level It s ould b disa led by default This a pl es to s ip in an to

al active p wer s stem in tal ation When present, test values s al b ac omp nied by the

as ociated test bit activation as des rib d in 6.9 3.9

External Ethernet traf ic received by the mergin u it s ould not interfere with the sampled

value tran mis ion This req irement a pl es regardles of the typ of traf ic, destination

ad res ran e or the receive c an el lo din (10 % lo din an ful d plex commu ication

are as umed)

A data con isten y req irement a pl es to al data values within the same ASDU Qual ty bit

updates s ould b atomic (s al b updated at the same time an s al b con istent with the

SV data p int they des rib ), an are not al owed to lag b hin their as ociated data values

For example; the outOfRan e q al ty bit s ould b set as so n as cl p in oc urs, an it

s ould stay set u ti the input value is b ck within cl p in lmits an output return within the

ac urac clas Whi e the outOfRan e bit is true, the as ociated data value s ould b

re orted as b in at some value b twe n the clp in l mit an the actual input value The

output b haviour, whi e the input is outside the clp in l mits, s ould b monotonic, with the

output value not al owed to c an e sig without a cor esp n in c an e at the device input

(no p larity in ersion)

6 Design a d construction

6.9 1 Te h ologic l bound rie

6.9 1.1 Interfa e point

An electronic LPIT with bui t in mergin u it has two sig al interface b u daries, plu an

au i ary p wer s p ly interface The first sig al b u dary is the in trument tran former hig

voltage primary, whi e the secon is the mergin u it’s digital output con ector interface The

mergin u it output con ector s ould also define the spl t of resp n ibi ty b twe n the

electronic LPIT man facturer an the s stem integrator Ad itional interface b u daries s c

as interfaces b twe n the primary an secon ary con erter are con idered to b integral

p rts of the electronic LPIT Ad itional interface p ints, s c as 1PPS time s n hronization

input, may also b present in some in talation

The ca les an con ection that are internal to the electronic LPIT as embly in lu in

con ection b twe n a mergin u it an the primary side sen or are outside the s o e of this

stan ard The s stem integrator s ould s p ly al ca les an con ection that form p rt of the

con ection to the s bstation automation s stem (SAS) Where an ca les or con ection are

ru external to en los res, they s ould b s p led with s ita le mec anical protection

6.9 1.2 Digital output interfa e

A fibre o tic digital tran mis ion s stem 10 BASE-FX (1 3 0 nm, multimode, ful d plex, two

stran fibre o tic ca le) ac ordin to ISO/IEC 8 0 -3:2 01 is recommen ed, but future

tec nologies in lu in 1 Gbits (10 0BASE-LX) can b u ed (se IEC TR 618 0-9 -4)

NOT 9 1 In ivid al o tic l c ble stra ds with B OC/2,5 (also k own as S ty e) c n e tors are sti wid ly

use , c l n for in ivid al fibre la el n (Rx,Tx fibres) Goin forward d ple LC

3

c n e tors sh wn in Fig re 9 5

are th prefere solutio as th se elmin te th Rx/Tx cros c n e tio c bln is u s Wh n re uire (b c ward

c mp tible instalatio s) c n ersio b twe n th S , FC a d LC c n e tor ty es c n b a c mplsh d with wid ly

a aia le fibre-o tic p tc c rd c bles

Figure 9 5 – Duple LC conne tor

6.9 1.3 Huma -ma hine interfa e

Due to the wide variety of p s ible mergin u it implementation , h man-mac ine interface

(HMI) req irements are k pt to the a solute minimum, an are lmited only to devices that can

b vis al y in p cted by the o erator d rin normal o eration There are no l mits on the

• the device is in service

• alarm con ition an /or fai ure;

• the commu ication lnk statu ;

In trument tran formers with digital output s al comply with the freq en y resp n e an

ac urac req irements on harmonic sp cified in IEC 618 9-6:2 16, An ex 6A For electronic

LPIT with buit in digital output, this req irement a pl es b twe n the in trument tran former

primary, an the in trument tran former digital output

6.9 2.2 Ma imum proc s ing dela time re uireme t

Proces in delay time (t

p) is defined in 3.5.9 2 as the diferen e b twe n the time en oded

by the mes age field SmpCnt an the time the mes age a p ars at the digital output

S fr ames at th MU o tp t

Absolute sample times for

4 0 samples p r se o d

(to 4 d cimals)

A C sample insta ts with

Figure 9 6 – Ma imum proc s in dela time

The time of the mes age a p arin on the digital output s al b me s red at the mes age

timestamp p int (Fig re 9 7) u in the external clock s p l ed to the device s n hronization

input

Maximum proces in delay time is the lon est proces in delay time u der rated o eratin

con ition It is me s red in ac ordan e to 7.2.9 1, an i u trated in Fig re 9 6 In this

example, the sample with smpCnt 0 0 , whic en odes a time of x x,0 0 , re c es the MU

output at time x x,0 0 , so the proces in delay time for this sample is 0,9 ms As there is no

lon er proces in delay time in this example, 0,9 ms is also the maximum proces in delay

time

The maximum proces in delay time s al b sp cified by the man facturer an s al b

within the l mits sp cified in Ta le 9 1

Table 9 1 – Ma imum proc s ing d la time l mits

Ap l c tio cla s Ma imum proc s ing dela time l mit

Timecritic l low b n width d.c c ntrol a plc tio s 10 µs

Hig b n width d.c c ntrol a plc tio s

2 µs

The maximum proces in delay time l mit is me s red at the mergin u it output an do s

not in lu e external delay contributed by the proces bu network comp nents or network

con estion External delay are a pl cation de en ent an are critical for cor ect s stem

o eration External network delay are the resp n ibi ty of the s stem integrator (network

desig en ine r) an are outside of the s o e of this stan ard

The maximum proces in delay time s al remain compl ant with this stan ard, regardles

whether the device is in the holdover mode or s n hronized to an external time referen e

Per definition, maximum proces in delay time can ot b me s red when the device is fre

ru nin Due to complexity as ociated with precise hig voltage an hig c r ent

me s rements, delay time in the fre ru nin mode is not se arately verified However, no

sig ificant proces in delay time c an e s al b o served d rin the tran ition from the

holdover to the fre ru nin mode in ac ordan e to 7.2.9 1

With mergin u its, in contrast to in trument tran formers with analog e output, the main

imp ct of delay time is that it ad s to the relay’s fault detection time With analog e outputs,

the delay time is also imp rtant in estimatin primary phase an les With digital output, the

sample time en oded within the mes age rather than the time of sig al receipt is u ed in

estimatin the primary phase an le Th s, phase er or is a res lt of dif eren es b twe n the

en oded sample time an the time that the sample cor esp n s to on the p wer s stem

primary, an is in e en ent of delay time Phase er or l mits sp cified in the a pl ca le

prod ct stan ard (Part 7, Part 8, Part 12 an Part 13) en ure cor esp n en e of the

en oded sample time an the time that the sample cor esp n s to on the p wer s stem

primary In trument tran formers for d.c a pl cation (Part 14 an Part 15) me t phase er or

an wi b in orp rated in the next revision of IEEE 15 8 / IEC 615 8 stan ard

(star of dstinatio ad res)

IEC

Fig re 9 7 – Output me s g time tamp point

6.9 3 Spe ific tion of th communic tions profi e

6.9 3.1 Ge eral

The IEC 618 9-9 commu ication profi e is a careful y selected s bset of the IEC 618 0

series It u es IEC 618 0-9-2:2 1 for sampled values sp cific commu ication service

ma pin (SCSM) It u es IEC 618 0-8-1 for cl ent server an p er- o-p er SCSM The

a stract commu ication service interface (ACSI) is as defined in IEC 618 0-7-2 The logical

nodes are as defined in IEC 618 0-7-4 Common data clas es an con tru ted atribute

clas es are as defined in IEC 618 0-7-3

6.9 3.2 Varia ts

To faci tate intero era i ty, only a l mited varia i ty is p rmited for namin , mes age

stru ture, sample rate, analog e sig al content an s al n The p rmit ed variants are

des rib d in the device name late u in the fol owin notation, introd ced here as an e s

way to des rib mergin u it ca a i ties in a h man re da le text format:

F fS s I i U u

where

f is the digital output sample rate expres ed in samples p r secon ;

s is the n mb r of ASDUs (samples) contained in a sampled value mes age;

i is the n mb r of c r ent q antities contained in e c ASDU;

u is the n mb r of voltage q antities contained in e c ASDU

Device name late doc ments device ca a i ty (ran e of s p orted variants) with active

config ration se arately sp cified in the mergin u it config ration fie (An ex 9C)

Variant notation examples:

F4 0 S1I4U4 des rib s the 9-2 E MSVCB01 sampled values with 5 Hz nominal s stem

freq en y

F12 0 S8I4U4 des rib s the 9-2 E MSVCB0 sampled values with 5 Hz nominal s stem

freq en y

F4 0 S2I8U0 des rib s sampled values with 4 8 0 samples p r second, two ASDU

(samples) p r mes age, 8 c r ents, an no voltages

In trument tran formers/SAMU claimin compl an e to this stan ard s al b config ra le to

implement one of the prefer ed rates defined in Ta le 9 2 an at le st one of the fol owin

b ckward comp tible config ration :

• F4 0 S1I4U4

• F4 0 S1I4U4

• F5 6 S1I4U4

Mergin u its may also implement variants with other n mb rs of c r ents an voltages The

minimum n mb r of c r ent plu voltage q antities alowed is 1 The maximum n mb r of

q antities al owed on a 10 Mbits network is:

• for general me s rin an protection: 2 q antities maximum

• for d.c control a pl cation : 2 q antities maximum

The maximum l mitation are introd ced to en ure fair network ac es an prevent blockin

cau ed by ex es ively lon Ethernet frames No sp cific l mits are defined for 1 Gbit s an

faster networks DC in trument tran former outputs may req ire p int to p int con ection an

Giga it Ethernet l nks

6.9 3.3 Digital output s mple rate

The stan ard sample rates (fin the variant notation) are in icated in Ta le 9 2

Table 9 2 – Sta dard s mple rate

a plc tio s, re ardles of th p wer system

fre u n y

c mp tible with 9 samples p r n min l system

fre u n y c cle

re ardles of th p wer system fre u n y in lu in

instrume t tra sformers for time critic l low

b n width d.c c ntrol a plc tio s

b n width d.c c ntrol a plc tio s

Sampl n rates with variants F4 0 S1I4U4, F4 0 S1I4U4, F12 0 S8I4U4 an F15 6 S8I4U4

are identical to the sample rates recommen ed by UCA international u ers group doc ment

Implementation Guide l ne for Digital Interface to In trument Tran formers u in

IEC 618 0-9-2 (commonly refer ed to as 9-2 E) an are retained for b ckward comp tibi ty

purp ses Goin forward, preferen e is given to 4 8 0 Hz, 14 4 0 Hz an 9 0 0 Hz with 2, 6

an 1 ASDUs resp ctively, whic are mark d “prefer ed” in Ta le 9 2 Sp cified sample rates

are con tant an are normal y s n hronized to an external time source Power s stem

MUn is the logical device in tan e name, the atribute “in t” of the element LDdevice in the

IED section of the ICD fi e n s al b a decimal n mb r that ma es the in tan e

identifier of the logical device u iq e within the ph sical device

NOT 9 2 Th c mbin tio of th IED n me a d th LD insta c n mb r ma es th lo ic l d vic u iq e within

th system

6.9 3.5 Logic l node LPHD

LPHD logical nodes s al b as sp cified in IEC 618 0-7-4:2 10, 5.3.2, ex e t that the LPHD

logical nodes s al b exten ed by the ad ition of the name late data o jects defined in

Ta le 9 3 The value of dataNs data atributes of these exten ed data o jects s al b

“IEC 618 9-9:2 16” The data at ributes of these exten ed data o jects s al b read-only

The LPHD data o ject Ph Nam s al conform to the DPL common data clas definition in

IEC 618 0-7-3:2 10, 7.8.2, ex e t that at ributes Ph Nam.ven or, Ph Nam.model,

Ph Nam.serNum, Ph Nam.hwRev, Ph Nam.swRev an Ph Nam.d are man atory an re d

an in Ta le 9 3 The value of dataNs data at ributes of these exten ed data o jects s al b

“IEC 618 9-9:2 16” The data at ributes of these exten ed data o jects s al b re d-only

Eac TCTR name (LNName) s al b formated d rin en ine rin phase ac ordin to:

I n p TCTR n

where

n is the in tan e n mb r of the c r ent me s rement p int (01-9 ) that ma es the

c r ent me s rement identification (In ) u iq e within the b y This value is p rt of the

s bstation section of the SCL des ription an is defined d rin the en ine rin

proces

p is the phase identification of the primary c r ent, either A, B, C, or N for AC in trument

tran formers For d.c in trument tran formers, p n in s p ort for d.c s stems in the

IEC 618 0 series of stan ard , u e A for p le 1, B for p le 2, an N for e rth return

This value s ould cor esp n to the SubEq ipment phase at ribute in the s bstation

section of the SCL des ription if an

n is the atribute “in t” of the element LN in the s bstation an IED section of the ICD

fi e It bin s the TCTR des rib d in the s bstation section to the TCTR des rib d in

the IED section “ ” s al b a decimal n mb r (1 throu h 9 ) that ma es the in tan e

identifier of the TCTR u iq e within the logical device, an is in general fixed by the

man facturer

As an example, a TCTR name mig t b :

I0 ATCTR4

The a ove name is for c r ent me s rement p int n mb r 0 , phase A, with c r ent

tran former core con ected to TCTR in tan e 4 as i u trated in Fig re 9 8 This is only one

example i u tratin s bstation model n defined in IEC 618 0-7-1 an s bstation

config ration lan uage rules defined in IEC 618 0-6

The TCTR data o ject AmpSv s al conform to the SAV common data clas definition in

IEC 618 0-7-3:2 10, 7.4.4, ex e t that atributes AmpSv.in tMag.i, AmpSv.sVC.s aleFactor,

AmpSv.sVC.of set, AmpSv.u its.multipl er an AmpSv.u its.SIUnit are man atory an re d

-only with values sp cified in Ta le 9 4:

Table 9 4 – AmpSv o je t at ribute v lue

AmpSv.u its.SIUnit 5 (c d for amp re)

AmpSv.nstMa c u t (of mi iamp re)

Table 9 5 – Exte sions to the TCTR cla s

TCTR cla s e tensio swith nameplate informatio

nodes s al b exten ed by the ad ition of the name late data objects defined in Ta le 9 7

an in Ta le 9 3 The value of dataNs data at ributes of these exten ed data o jects s al b

“IEC 618 9-9:2 16” The data at ributes of these exten ed data o jects s al b re d-only

Eac TVTR name (LNName) s al b formated d rin en ine rin phase ac ordin to:

U n pTVTR n

where

n is the in tan e n mb r of the voltage me s rement p int (01-9 ) that ma es the

voltage me s rement identification (Un ) u iq e within the b y This value is p rt of

the s bstation section of the SCL des ription

p is the phase identification, either A, B, C, AB, BC, CA or N for a.c in trument

tran formers For d.c in trument tran formers, p n in s p ort for d.c s stems in the

IEC 618 0 series, u e A for p le 1, B for p le 2, an N for e rth return This value

s ould cor esp n to the SubEq ipment phase at ribute in the s bstation section of

the SCL des ription if an

n is the atribute “in t” of the element LN in the s bstation an IED section of the ICD

fi e It bin s the TVTR des rib d in the s bstation section to the TVTR des rib d in the

IED section " " s al b a decimal n mb r (1 throu h 9 ) that ma es the in tan e

identifier of the TVTR u iq e within the logical device, an is in general fixed by the

The TVTR data o ject VolSv s al conform to the SAV common data clas definition in

IEC 618 0-7-3:2 10, 7.4.4, ex e t that atributes VolSv.in tMag.i, VolSv.sVC.s aleFactor,

VolSv.sVC.ofset, VolSv.u its.multipl er an VolSv.u its.SIUnit are man atory an re d-only

with values sp cified in Ta le 9 6

Table 9 6 – VolSv obje t at ribute v lue

VSD th ratio of th clp in lmit of th insta ta e us v lta e to th rate

primary v lta e multiple with a sq are ro t of two, e.g “2”

The q al ty at ribute refers to the q al ty of the sampled value in e en ently of an er or in

the sample time in tant The q al ty of sample timin is commu icated in the SmpSy c

at ribute defined in 6.9 4.4 b low For in tan e when in the fre -ru mode, wherein sample

time er or is arbitrari y large, sample q al ty may sti b go d an sampled values p rfectly

u a le by s bs rib rs that are not sen itive to the phase dif eren e b twe n these samples

an samples from other in trument tran formers

The qual ty of e c sampled value in e c ASDU s al b as re resented by its q alty value

in that ASDU For example, if a c an el havin previou ly b en ac urate b comes inac urate,

the first inac urate value s al have in the same ASDU as its inac urate atribute set

The val dity atribute s al b in al d an al other atributes of the q al ty atribute s al b

their default value when the q antity is not provided, e.g when a sin le phase bu voltage is

b in tran mit ed in a legac format with a 4 TCTR, 4 TVTR dataset, the u u ed phases s al

b tag ed as in al d

The val dity atribute s al b set to q estiona le an the outOfRan e at ribute s al b true

as so n as clp in oc urs, an they s al stay set ti the input value is again within cl p in

l mits an the output value ac urac has recovered This mec anism al ows the s bs ribin

a pl cation to u e the cl p in information where a pro riate ( or example for recordin or

time overc r ent fu ction)

The val dity atribute s al b set to q estiona le when the inac urate at ribute is true

The fai ure at ribute s al b true when an in trument tran former s p rvision fu ction has

detected an er or con ition other than the los of s n hronism in icatin that the sampled

value is u u a le, e.g to in icate internal hardware fai ure

The inac urate at ribute s al b true when an in trument tran former s p rvision fu ction

has detected an er or con ition other than the los of s n hronism in icatin that the sampled

value do s not me t the name late me s rin ac urac clas , but may b u e ble

Notwith tan in IEC 618 0-7-3:2 10, 6.2.2, the sampled value s al at al times b the

mergin u it’s b st estimate of the primary value Subs rib r a pl cation s al in ivid al y

c o se how to u e values mark d q estiona le

The overflow, b dReferen e, os i atory, oldData, in on istent an o eratorBlock d flag

s al b set to false

The source atribute s al b set to proces

The test atribute s al b set in ac ordan e with IEC 618 0-7-3

x is the is the in tan e n mb r of the dataset (1-9 ) "x" s al b a decimal n mb r that

ma es the dataset name u iq e within L N0, an is in general fixed by the

Dataset memb rs s al con ist of AmpSv.in tMag.i (c r ent sampled value) or VolSv.in tMag.i

(voltage sampled value) at ributes, e c folowed immediately by the cor esp n in AmpSv.q

or VolSv.q (q al ty) atribute The n mb r of c r ent sampled values an the n mb r of

voltage sampled values s al matc the n mb r of e c sp cified by the variant code for the

dataset

Al AmpSv memb rs (c r ent sampled values) s al precede an VolSv memb rs (voltage

sampled values)

By default, where multiple c r ent or multiple voltage memb rs for a common me s rement

p int exist, they s al b adjacent an in the seq en e: A, AB, B, BC, C, CA, N

6.9 3.1 Multic st s mple v lue control bloc (s)

The multicast sampled value control blocks s al b as sp cified in IEC 618 0-7-2:2 10,

L N0, an is in general fixed by the man facturer

For b ckward comp tibi ty with legac prod cts, in the control blocks MSVCB01, MSVCB0 ,

an hig b n width d.c control a plcation with sample rate eq al to 9 kHz, the SmpMod

at ribute s al have a value of ‘0’ (samples p r nominal p riod) For al other a pl cation ,

SmpMod s al have a value of ‘1’ (samples p r secon )

The value of at ribute Ms ID s al b u iq e within the s bstation It is recommen ed that this

field b s ort to preserve commu ication b n width (recommen ma in it eq al to

hexadecimal c aracter re resentation of APPID: 4 0 to 7FFF)

NOT 9 3 Some le a y d vic s restrict th le gth of this field to b b twe n 10 a d 3 c ara ters

The SmpRate atribute s al have a value matc in the sample rate in the variant code for the

control block For control blocks MSVCB01 SmpRate at ribute s al b 8 , an for MSVCB0

it s al b 2 6 For other control blocks, the value in the variant code is u ed directly with

ex e tion of the d.c control block for 9 kHz whose value is 9 6 0 Use of 9 6 0 samples p r

nominal p riod, implyin a nominal freq en y of 10 Hz, is a work rou d to the maximum

value the SmpRate atribute can en ode

The OptFld refres - ime at ribute s al b false

The OptFld reserved (OptFld samples n honised in IEC 618 0-9-2:2 1 at ribute s al b

true

The OptFld sample-rate atribute s al b false

The OptFld data-set name at ribute s al b false

The OptFld sec rity at ribute as p r IEC 618 0-9-2:2 1 s al b false

The smpMod atribute s al not b present in the SV mes age

The noASDU atribute s al have a value matc in the n mb r of ASDUs in the a plca le

variant code defined in 6.9 3.2

6.9 3.12 Config ration of the merging unit

Ta le 9 8 s mmarizes the p rameters that ne d to b config ra le

Table 9 8 – Configuration parameters of the merging u it

LD ame x x MUn x x is th c nfig ra le IED n me of th mergin u it p r

IEC 618 0-6:2 0 , 8.5.3

MUn is th atrib te Inst of th LDe ic p r IEC 618 0-6:2 0 ,

8.5.3

MSV Bx SvEn TR E/FALS Re e te for e c MSV B impleme te

MSV Bx MsvID se d tais Sh uld b u iq e within th su statio It is re omme d d th t this

field b sh rt set to matc th h x d cimal AP ID re rese tatio

NOT Some le a y d vic s restrict th le gth of this field to

c nfig ratio It is stro gly re omme d d to h v u iq e, so rc

orie tate SV AP ID within a system, in ord r to e a le afiter o

th ln la er Th c nfig ratio of AP ID sh uld b e forc d b th

c nfig ratio system

6.9 3.13 Rate conforma c cla s s

The stan ard of the IEC 618 0 series sp cify a large set of commu ication models an

services Not al of these are u ed in mergin u its Man of these s p ort ad itional

ca a i ties s c as config ration an s p rvision of a mergin u it

NOT 9 4 Commu ic tio servic s are use to a c s a d e c a g d ta residin in lo ic l n d s via a serial

c mmu ic tio n twork a c rdin to th IEC618 0 series

Therefore, not al of the models or services defined in the IEC 618 0 series ne d to b

implemented in al mergin u its The services that are req ired to b implemented are

defined in terms of conforman e clas es within this s bclau e 6.9 3.13.1 The conforman e

clas es are defined u in the a stract commu ication service interface (ACSI) conforman e

statements sp cified in 6.9 3.13.2 throu h 6.9 3.13.6, whic in turn are b sed on those in

IEC 618 0-7-2:2 10, An ex A The conforman e clas es may be s mmarized as fol ows:

– clas a: the minimal set of services req ired to tran mit MU data u in sampled values;

– clas b: clas a ca a i ties plu the minimal set of services req ired to s p ort GOOSE

mes ages;

– clas c: clas b ca a i ties plu services req ired to implement the IEC 618 0 series’

information model with self des riptive ca a i ties;

– clas d: clas c ca a i ties plu services for fi e tran fer, bufered an u bufered

re ortin

NOT 9 5 Th c mmu ic tio servic s within th IEC 618 0 series are d fin d usin a a stra t mo el n

te h iq e (a stra t c mmu ic tio servic interfa e or A SI) Abstra t me ns th t th d finitio is a hig le el

d scriptio of wh t th servic s pro id Th lower le els u o whic th a stra t le el is impleme te are

sp cifie insp cific c mmu ic tio servic ma pin s (SCSM)

NOT 9 6 L gic l n d s a d servic s within th IEC 618 0 series pro id me ns to retrie e c mpre e siv

informatio a o t th informatio mo el a d th servic s th t o erate o th informatio mo els, ie a o t

th mselv s This c p bi ty is c le selfd scriptio

NOT 9 7 Fie tra sfer c n b use to tra smit informatio su h as c nfig ratio informatio via th

c mmu ic tio n twork

NOT 9 8 L g in a d re ortin are c mmu ic tio fa i ties within th IEC 618 0 series whic c n b use for

th tra smis io of, for e ample, a se u n e of e e ts, from a mergin u it to a h ma -ma hin interfa e for th

p rp se of mainte a c of asu statio

6.9 3.13.2 ACSI ba ic conforma c stateme t

The b sic conforman e statement s al b as defined in Ta le 9 9

Table 9 9 – Ba ic conforma c stateme t

6.9 3.13.3 ACSI models conforma c stateme t

The ACSI models conforman e statement s al b as defined in Ta le 910

Table 910 – ACSI models conforma c stateme t