Iec 61196 1 209 2016

IEC 61 1 96 1 209 Edition 1 0 201 6 03 INTERNATIONAL STANDARD Coaxial communication cables – Part 1 209 Environmental test methods – Thermal cycling IE C 6 1 1 9 6 1 2 0 9 2 0 1 6 0 3 (e n ) ® Copyrig[.]

IEC 61 1 96- 1 - 209

Edit io 1.0 2 16-0

Coax ial communicat ion cables –

Part 1- 209: Env ironment al t est met hods – Thermal cy cl ng

®

THIS PUBLICATION IS COPY RIGHT PROTECTED

Co yrig t © 2 16 IEC, Ge e a, Switzer la d

Al r i hts r es r ve Unle s oth rwis s e ifie , n p r t of this p blc tio ma b r epro u e or uti z d in a y for m

or b a y me n , ele tr onic or me h nic l in lu in p oto o yin a d micr ofim, with ut p r mis io in wr itin fr om

eith r IEC or IEC's memb r Natio al Commite in th c u try of th re u ste If y u h v a y q e tio s a o t IEC

c p rig t or h v a e q ir y a o t o tainin a ditio al r i hts to this p blc tio , ple s c nta t th a dr es b low or

y ur lo al IEC memb r Natio al Commite for fur th r informatio

Ab ut he IEC

Th Inter natio al Ele tr ote h ic l Commis io (IEC) is th le din glo al or ga iz tio th t pr ep re a d p bls e

Inter natio al Sta d r ds for al ele tr i al ele tr onic a d r elate te h olo ie

A bout IEC publc tio s

Th te h ic l c nte t of IEC p blc tio s is k pt u d r c n ta t r eview b th IEC Ple s ma e s r e th t y u h v th

late t e itio , a c rr i e d or a ame dme t mig t h v b e p bls e

IEC Cat alo u - webst ore.e ch/cat alo u

Th st an -alo e a plc at io for c n ult in t he e t ire

biblo ra hic al informat io o IEC Int ern t io al St an ard ,

Te h ic l Sp cific t io s, Te h ic al R ep rt s a d ot her

d c me t s A v aia le for PC, Ma OS, Android Ta let s a d

iPa

IEC publc t io s s arch - w w w.e ch/se rch ub

Th a v an e s arc e a le t o fin IEC p blc t io s b a

v riety of criteria (efere c n mb r, text, t ec hnic al

c mmit t ee,…) It als giv es informat io o proje ts, re la e

a d wit hdraw n p blc t io s

IEC J st Publshed - webstore.e ch/j stpublshed

St ay u t o d t e o al n w IEC p blc t io s Ju t Pu ls e

d t ais al n w p blc at io s rele s d A vaia le o ln a d

als o c e a mo t h b emai

Ele t ro edia - w w w ele tro edia.org

Th world's le din o ln dict io ary of ele t ro ic a d

elec t ric l t erms c nt ainin 2 0 0 t erms a d d finit io s in

En ls a d Fre c h, wit h e uiv ale t t erms in 15 a dit io al

la g a e Als k nown a t he Int ern t io al Ele t rot ec hnic al

V oc ab lary (IEV ) o ln

IEC Glos ar y - std.e ch/glos ary

6 0 0 ele t rotec hnic l t ermin lo y e t rie in En ls a d

Fre c h ext ra t ed fom t he Terms a d Definit io s c la s of

IEC p blc t io s is u d sinc e 2 0 Some e trie h v e b e

c ole t ed fom e rler p blc at io s of IEC TC 3 , 7 , 8 a d

CIS R

IEC Cu tomer Servic Cent re - webst ore.e ch/cs

If you wis t o giv u your fe d a k o this p blc at io or

n e furt her a sist anc e, ple s c nt act t he Cu t omer Serv ic e

Ce t re: c c@iec c

IEC 611 96- 1 - 209

Edit io 1.0 2 16-0

Coax ial communicat ion cables –

Part 1- 209: Env ironment al t est met hods – Thermal cy cl ng

INT R NATIONAL

ELECTR OT CHNICAL

®

W arnin ! Mak e s re th t you o tain d this publc tion from a a thorize distributor

FOREWORD 3

1 Sco e 5

2 Normative ref eren es 5

3 Terms an def i ition 5

4 Symb ls 5

5 Method 6

5.1 Thermal c cle prof ile method 6

5.2 Adju tment factors 6

5.2.1 General 6

5.2.2 Tran ition rate adju tment f actor 7

5.2.3 Up er an lower temp rature exp s re test adju tment factor 7

5.3 Sample 7

5.4 Req irements 7

6 Test re ort 8

(inf ormative) Rela i ty ac eleration f actor 9

An ex A Ta le 1 – Mas an exp s re times 6

INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 1-209: Environmental test methods – Thermal cycl ng

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cif i atio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re f ter refer e to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n

n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio for Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio f rom al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th form of re omme d tio s for intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eforts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible for th wa in whic th y are u e or f or a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c re p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtif i atio b die pro id c nformity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nf ormity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtific tio b die

6) Al u ers s o ld e s re th t th y h v th late t e itio of this p blc tio

7) No la i ty s al ata h to IEC or its dire tors, emplo e s, s rv nts or a e ts in lu in in ivid al e p rts a d

memb rs of its te h ic l c mmite s a d IEC Natio al Commite s f or a y p rs n l injury, pro erty d ma e or

oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or f or c sts (in lu in le al fe s) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s ble f or th c r e t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible f or id ntifyin a y or al s c p te t rig ts

International Stan ard IEC 61 9 -1-2 9 has b en pre ared by s bcommit e 4 A: Co xial

ca les, of IEC tec nical commite 4 : Ca les, wires, waveg ides, R.F con ectors, R.F an

microwave p s ive comp nents an ac es ories

The text of this stan ard is b sed on the f ol owin doc ments:

Ful information on the votin for the a proval of this stan ard can b f ou d in the re ort on

votin in icated in the a ove ta le

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al the p rts in the IEC 61 9 series publ s ed un er the general title Co x ial

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cifi publ cation At this date, the publ cation wi b

• with rawn,

• re laced by a revised edition, or

A bi n ual version of this publcation may b is ued at a later date

COAXIAL COMMUNICATION CABLES –

Part 1-209: Environmental test methods – Thermal cycl ng

This p rt of IEC 61 9 sp cif ies a test method to determine the a i ty of a co xial ca le to

with tan the ef fects of temp rature c cl n on its tran mis ion p rf orman e

The purp se of this proced re is to ac elerate the ef fects of temp rature c cl n on a ca le

The f ol owin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an

are in isp n a le for its a pl cation For dated ref eren es, only the edition cited a pl es For

u dated ref eren es, the latest edition of the referen ed doc ment (in lu in an

d efinitio s a d re uireme ts

IEC 6 0 8-2-14, En iro me tal testin – P art 2-14: Te ts – Te t N : Ch n e of temp rature

IEC 6 5 6, M ethods for prod uct a c lerated testing

For the purp ses of this doc ment, the terms an def i ition given in IEC 61 9 -1 a ply

4 Symbols

∆T dif feren e b twe n the up er an lower exp s re temp rature l mits, in °C

∆T

1

dif feren e b twe n the up er an lower o erational temp rature l mits, in °C

∆T

i

temp rature c an e dif feren e other than ∆T

1 , in °C

ζ

Te t

tran ition rate of temp rature of the test, in °C/min te

A adju tment factor for the n mb r of c cles for dif ferent tran ition temp rature rates

an exp s re temp ratures l mits than stan ard con ition

A

tr

adju tment f actor f or the n mb r of c cles with regard to the tran ition rate

A

∆T

adju tment factor for the n mb r of c cles with regard to the up er an lower

exp s re temp ratures

5 Method

5.1 Th rmal c cle profi e method

The test s al b done in ac ordan e with the IEC 6 0 8-2-14 with a tran ition time of

2 °C/minute The temp rature exp s re time s ould b at the up er an lower o erational

l mits of ca le (∆T

1

as given in relevant ca le sp cif i ation, u les otherwise modif ied as

des rib d in 5.2

A c cle s al con ist of one complete exp s re at up er an lower temp rature test l mits

Twenty c cles s ould b con u ted

The time exp sed at the up er an lower test temp ratures s al b s f ficient for the DUT to

re c the sp cif ied temp rature

Mas an exp s re times are given in Ta le 1

Table 1 – Ma s a d e pos re time

hr

≤ 3 g

¼

> 15 gto ≤ 1,5 k

1

> 1,5 k to ≤ 7,5 k

1,5

> 15 k to ≤7 k

3

>15 k

8

5.2 Adju tme t f actors

The n mb r of c cles s ould b adju ted when the tran ition rate an temp rature c an e

varies f rom 5.1 by the fol owin :

N = 2 × A

tr

× A

∆T

(1)

The calc lation wi most l kely le d to a n mb r that wi not b an integer an therefore wi

contain a fraction of a complete c cle An f raction of a c cle s ould b adju ted to the next

hig er integer n mb r

5.2.2 Tra sition rate a justme t f actor

The n mb r of c cles s ould b adju ted to other tran ition rates ac ordin to eq ation (1)

an (2)

A

tr

=

3 1













ς

Test 2

(2)

The maximum adju tment f actor s ould b l mited to 4

5.2.3 Upper a d lower temperature e pos re te t a ju tme t f actor

If dif f erent temp rature exp s re l mits are u ed, the n mb r of c cles s ould b adju ted as

sp cif ied by the fol owin

A

∆T

=

2,5













i T T

Δ Δ

1

(3)

5.3 Sample

Electrical an mec anical tests s al b done on a 5 m ± 5 m len th u les otherwise

sp cif ied Eac test s al req ire a minimum of one sample

The samples s al b lo sely coied in the test c amb r to en ure that adjacent win in s have

airsp ce b twe n e c coi , adjacent samples, an wal s of the c amb r

The mec anical sample s al b c t f l s at b th en s

Suita le con ectors s al b at ac ed f or the electrical tests

Tests that s ould b con idered are: imp dan e, return los , p s ive intermod lation

distortion, contact resistan e, etc

5.4 Re uireme ts

The mec anical test s al monitor dielectric an con u tor movement The criteria f or

ac e tan e s al b des rib d in the detai ed sp cif i ation

The RF p rf orman e c aracteristic s al b evaluated at the con lu ion of the test an may

b also evaluated at intervals d rin the test The criteria f or ac eptan e s al b sp cif ied in

the detai ed sp cif i ation

6 Test report

The test re ort s al in lu e

• initial me s rement;

• n mb r of samples tested;

• sample len th;

• con ector u ed;

• test con ition

– low temp rature,

– rate of temp rature c an e,

– n mb r of c cles,

– d ration of c cle,

– detais of sample placement;

• f i al me s rements an c an es in res lts from the initial me s rements;

• calc lation made;

• deviation from the stan ard method

Annex A

(informative)

Rel abi ity acceleration f actor

The ef f ects of thermal c cl n in u e may b ac elerated by in re sin the temp rature ran e

an tran ition time f rom what is the normal o eration This is k own as the ac eleration f actor

A

TC

n m

T T

A

/ 1

2 1

2 TC

1













ς ς

⋅













∆

∆

where

∆T

1

is the c an e in temp rature that oc urs in test 1;

∆T

2

is the c an e in temp rature that oc urs in test 2 or actual c an e in u age;

1

ς

is the ramp sp ed in test that oc urs in test 1;

2

is the ramp sp ed that oc urs in test 2 or actual ramp rate in u age;

m is a n mb r f or the dif feren e b twe n the exp s re test l mits an is determined by the

comp nentmaterial;

n is a n mb r f or the tran ition rate of temp rature

In actual u e, the thermal c cle prof ile may not b con istent from day to day an theref ore

The m an n may b o tained from testin , field exp rien e, data sources, etc

Ad itional inf ormation can b o tained in IEC 6 5 6

If the ac eleration f actor is 2 , whic me n 1 thermal c cle is eq ivalent to 2 , thermal

c cles of the b se l ne model s al b u ed If the b sel ne model is 1 day of u e, an

ac eleration f actor is eq ivalent to 2 day of u e f or e c c cle

Typical y daiy o erational c cles are complex an more than one c cle oc urs p r day It is

typical practice to model these multiple c cles as one c cle to make the compl cation e s

However, one can u e e c mini-c cle an p rf orm in ivid al calc lation

ratin s of the materials u ed in the con tru tion of the ca le

The m an n exp nents can b determined f orm exp rimentation, however, when they are not

k own, a con ervative n mb r of 2,5 is u ed for m an 1/3 is u ed for n

Ex mple 1:

Perf orm a test on two 5 m ca les with one havin con ectors on b th en s an the other

havin its en s c t fl s

The o erational temp rature l mits are: – 0 °C an + 0 °C

The ca le mas is of 1 k p r meter

The stan ard test would b a lower exp s re test temp rature of – 0 °C an an up er

exp s re test temp rature of + 0 °C The tran ition time would b 1 h (12 °C/6 min tes or

2 °C/min te)

The DUT mas in the c amb r is 10 k an u in Ta le 1, this would provide an exp s re

test d ration of 4 h

Ex mple 2

The same test a ove, ex e t that the test wi b done at – 0 °C at the lower exp s re

temp rature an at + 0 °C for the up er exp s re temp rature with a ramp rate of 1 °C p r

min te

The tran ition rate adju tment f actor from eq ation (2) is as fol ows:

A

tr

=

3 1

2 1













The o erational exp s re temp rature adju tment f actor from eq ation (3) is as f ol ows:

A

∆T

=

5

12

14 ,













The adju tment factor is: A

tr

× A

∆T

= 1,17 an the n mb r of c cles could b red ced by 1,17

_ _ _ _ _ _