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Journal of Magnetism and Magnetic Materials 316 2007 e269–e272Longitudinal Hall effect in Terfecohan thin films with perpendicular magnetic anisotropy N.H.. Etienne du Rouvray, France Ava

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Journal of Magnetism and Magnetic Materials 316 (2007) e269–e272

Longitudinal Hall effect in Terfecohan thin films with

perpendicular magnetic anisotropy N.H Duca, , N.T.M Honga, J Teilletb

a Laboratory for Nano Magnetic Materials and Devices, Faculty of Engineering Physics and Nanotechnology, College of Technology,

Vietnam National University, Hanoi, Buiding E3, 144 Xuan Thuy Road, Cau Giay, Hanoi, Viet Nam

b

Groupe de Physique des Mate´riaux, Universite´ de Rouen, UMR CNRS 6634, 76801 St Etienne du Rouvray, France

Available online 28 February 2007

Abstract

Longitudinal extraordinary Hall Effect (LEHE) of magnetic Tb(Fe0.55Co0.45)1.5(known as Terfecohan) thin films with perpendicular magnetic anisotropy has been investigated as a function of both the intensity of applied magnetic fields and the angle a between the applied field and film normal directions The Hall voltage loops exhibit a parallelogram shape, which is almost similar to those of the perpendicular magnetization The high-field Hall voltage susceptibility is positive at a ¼ 0 Its value decreases with increasing a and changes in sign at am¼201, which is considered as the easy magnetizable direction of the film This finding is comparable with those obtained from the magnetization, magnetic force microscopy (MFM) and conversion electron Mo¨ssbauer spectra (CEMS) measurements The obtained LEHE behaviors are rather promising for applications such as magnetic recording heads and magnetic field detectors, where a large output signal is required at low magnetic fields

r2007 Elsevier B.V All rights reserved

PACS: 72.20.My; 75.70.Kw; 75.70.j; 76.80.+y

Keywords: Longitudinal extraordinary Hall effect; Magnetization; Magnetic force microscopy; Conversion electron Mo¨ssbauer spectrometry

In the magnetic films, the longitudinal extraordinary

Hall effect (LEHE) is well known to be governed by the

perpendicular magnetization component[1] Thus, LEHE

is recognized as an useful tool to study magnetic properties

of magnetic films having perpendicular anisotropy In this

case, a large LEHE is usually obtained at low fields The

high-field magnetization state is, however, determined by

the applied field direction and the high-field LEHE

susceptibility can be positive or negative depending on

the relative orientation of the intrinsic easy magnetization

axis with respect to the applied magnetic field The

maximum of the LEHE voltage is obtained when

the intrinsic easy magnetization axis is in coincidence with

the applied magnetic field direction As a consequence, the

high-field LEHE voltage susceptibility can be used to

determine the magnetization orientation in magnetic films

with perpendicular anisotropy This problem is tackled in

this paper for the Tb(Fe0.55Co0.45)1.5 films (known as Terfecohan [2,3]) with a thickness of 570 nm deposited on glass substrates using RF-sputtering technique

The conversion electron Mo¨ssbauer spectrum (CEMS)

at room temperature was recorded using a conventional spectrometer equipped with a homemade helium–methane proportional counter The source was a 57Co in rhodium matrix The film was set perpendicular to the incident g-beam The CEMS for the as-deposited Terfecohan film is presented in Fig 1 The spectrum is typical of a distribution of iron environments It was fitted with a distribution of hyperfine fields only The average ‘‘cone-angle’’ b between the incident g-ray direction (being along the film-normal direction) and that of the hyperfine field

Bhf (or the Fe-magnetic moment direction) is estimated from the line-intensity ratios 3:x:1:1:x:3 of the six Mo¨ssbauer lines, where x is related to b by sin2b ¼ 2x/ (4+x) Despite a poor statistics, the information about the average hyperfine field /BhfS and the Fe-spin reorientation (/bS angle) can be extracted from this

www.elsevier.com/locate/jmmm

0304-8853/$ - see front matter r 2007 Elsevier B.V All rights reserved.

doi: 10.1016/j.jmmm.2007.02.116

Corresponding author Tel.: +84 4 7547203; fax: +84 4 7547460.

E-mail address: ducnh@vnu.edu.vn (N.H Duc).

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spectra: /BhfS ¼ 23.57(0.5) T and /bS ¼ 18 (75)1 The

/bS angle reflects the perpendicular magnetic

aniso-tropy The /BhfS value obtained for this amorphous

Tb(Fe0.55Co0.45)1.5 phase is, as expected, slightly higher

than that of 21 T reported for the amorphous TbFe2alloy

Similar behaviors were previously reported[4]

Domain structure was studied using magnetic force

micro-scopy (MFM) with magnetic tip that was magnetized

perpendicular to the sample plane The result is presented in

Fig 2 It exhibits an interlacement of bright and dark color

corresponding to stripe domains with alternating

perpendicu-lar magnetization component In zero-field, the two stripes

were found to have almost the same size and to possess equal

areas In an applied magnetic field, the domain structure is

modified by the magnetization process (domain width,

geometrical type) until the sample approached saturation state

Magnetization was determined using a vibrating sample

magnetometer and LEHE measurements are carried out at

room temperature by the standard DC four-probe method

on square samples of 4  4 mm2 For the magnetic field

applied perpendicular to the film plane (a ¼ 01), the Hall voltage is found to be negative (seeFig 4 below), which implies that the negative contribution of Tb is important This is in good agreement with what was reported for heavy rare earth—transition intermetallics[5]

The normalized Hall voltage VH(H)/VH(0.6 T) and the normalized M(H)/M(0.6 T) hysteresis loops for the case

a ¼ 01, where VH(0.6 T) and M(0.6 T) are the Hall voltage and magnetization measured in the magnetic field of 0.6 T, are reported inFig 3 These two loops are merged, what is

a good evidence that the longitudinal Hall measurement can serve as a direct determination of the perpendicular magnetization component In Fig 3, a low-field Hall sensitivity as large as 2  102V/T is achieved This LEHE behavior is rather promising for applications such as magnetic recording heads and magnetic field detectors, where the large output signal is an important parameter at low magnetic fields In practice, a Hall sensitivity of about

7  102V/T can be realized for films showing a more perfect rectangular magnetic hysteresis loops

The Hall voltage VH measured as a function of angle a between the applied field and film normal directions is shown

in Fig 4 for a ¼ 01, 451 and 901 One observes that with increasing a, not only the Hall voltage decreases, but also the hysteresis parallelogram becomes more oblique In addition,

Fig 5shows the high-field Hall voltage susceptibility (wHFHV) variation with a At a ¼ 0, wHFHV has a positive value (as already observed inFig 4) With increasing a, firstly wHFHV

decreases, cancels around am¼201 and then changes in sign This am-value is close to the ‘‘cone angle’’ b value determined from the CEMS measurement for the orientation of the Fe magnetic moments Consequently, the observed positive high-field susceptibility at a ¼ 0 in both Hall voltage and magnetization curves (Fig 3) is, in accordance to the CEMS results, expected to relate to a non-perfect 901 -out-of-plane magnetic anisotropy

The variation of the high-field Hall voltage susceptibility with a can be explained from the magnetization processes,

Fig 1 Mo¨ssbauer spectrum at 300 K of as-deposited Terfecohan film

Fig 2 The MFM image of Terfecohan film in zero field The light and the

dark areas present domains with magnetization pointing out-of and into

the film plane.

Fig 3 The M/M(0.6 T) and V H /V(0.6 T) curves of Terfecohan film at angle a ¼ 01.

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which can be described by the model illustrated in Fig 6

for different magnetic field directions

At low fields, magnetization is contributed mainly by the

orientation of the magnetic moments along the easy

magnetization axis In higher fields, the magnetization rotates progressively from easy axis to the field direction and the final magnetizable state is always along the applied field direction When aoam, this process causes the perpendicular magnetization component (as well as Hall voltage) to be increased (Fig 6a), corresponding to a positive Hall voltage susceptibility On the other hand, when a4am, the rotation

of magnetization towards the applied field causes the magnetization to decrease (Fig 6c) As a consequence, a negative Hall voltage susceptibility is observed For a ¼ am, however, the magnetization rotation process is absent and a zero high-field Hall susceptibility is observed (Fig 6b)

In addition, the Hall voltage data measured in 0.6 T are plotted as a function of a angle in Fig 7 The experimental results are well fitted with a sinus function

VH(a) ¼ VH(0) cos a This confirms the contribution of the final magnetization state (magnetization rotation process described above) to the Hall voltage

Finally, it is interesting to note that the perpendicular anisotropy of the film is destroyed after annealing at

Fig 4 Hall voltage measured at various angles a (see in the text).

Fig 5 Angular dependence of high-field Hall voltage susceptibility

(w HFHV ).

Fig 6 Illustration of magnetization processes and angular dependence of

Hall voltage for different orientations of applied fields.

Fig 7 Angular dependence of Hall voltage measured in 0.6 T.

Fig 8 Hall voltage measured at various angles a for 350 1C-annealed Terfecohan film.

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TaX350 1C In the case of samples with parallel magnetic

anisotropy, the Hall voltage loop reflects the out-of-plane

rotation of the magnetization (Fig 8) and the relationship

between the final magnetization state and Hall voltage is

confirmed also In a bias magnetic field, the field

orientation dependence of Hall voltage exhibits either the

perfect sinus or saw tooth angular symmetries depending

on the nature of the magnetic anisotropy

In summary, the perpendicular magnetic anisotropy of

the Terfecohan film is well evidenced by means of MFM,

CEMS, VSM as well as LEHE measurements In

particular, this paper shows that LEHE investigations

allow determining the magnetization orientation in films

having perpendicular magnetic anisotropy This LEHE

behavior is rather promising for various applications at low

magnetic fields

This work is supported by the State Program for Fundamental Research in Natural Sciences under Project 410.406 and by the College of Technology, Vietnam National University

References

[1] D.G Stinson, A.C Palumbo, B Brandt, M Berger, J Appl Phys 61 (1987) 3816.

[2] N.H Duc, J Magn Magn Mater 242–245 (2002) 1411.

[3] N.H Duc, P.E Brommer, in: K.H.J Buschow (Ed.), Handbook of Magnetic Materials, Vol 14, Elservier Science, North-Holland, Amsterdam, 2002, p 89.

[4] T.M Danh, N.H Duc, H.N Thanh, J Teillet, J Appl Phys 87 (2000) 7208.

[5] P Hansen, Aritlce, in: K.H.J Buschow (Ed.), Handbook of Magnetic Materials, Vol 6, Elsevier, Amsterdam, 1991 (Chapter 4).

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