95 10531 95 10532 Applications Circuits for safe protective separation against electrical shock according to safety class II reinforced isolation: D For application class I – IV at mains
Trang 1Optocoupler with Phototransistor Output
Order Nos and Classification table is on sheet 2.
Description
The 4N25V(G)/ 4N35V(G) series consists of a
photo-transistor optically coupled to a gallium arsenide
infrared-emitting diode in a 6-lead plastic dual inline
package
The elements are mounted on one leadframe using a
coplanar technique, providing a fixed distance between
input and output for highest safety requirements
95 10531
95 10532
Applications
Circuits for safe protective separation against electrical
shock according to safety class II (reinforced isolation):
D For application class I – IV at mains voltage < 300 V
D For application class I – III at mains voltage < 600 V
according to VDE 0884, table 2, suitable for:
Switch-mode power supplies, computer peripheral
interface, microprocessor system interface, line
receiver.
These couplers perform safety functions according to the following equipment standards:
D VDE 0884
Optocoupler providing protective separation
D VDE 0805/IEC 950/EN 60950
Office machines (applied for reinforced isolation for
Trang 2D Approvals:
BSI: BS EN 41003, BS EN 60065 (BS 415)
BS EN 60950 (BS 7002)
Certificate number 7081 and 7402
FIMKO (SETI): EN 60950
Certificate number 41400
Underwriters Laboratory (UL) 1577
recognized-file No E-76222
VDE 0884 Certificate number 94778
VDE 0884 related features:
D Rated impulse voltage (transient overvoltage)
VIOTM = 6 kV peak
D Isolation test voltage (partial discharge test voltage)
Vpd = 1.6 kV
D Rated isolation voltage (RMS includes DC)
VIOWM = 600 VRMS (848 V peak)
D Rated recurring peak voltage (repetitive)
VIORM = 600VRMS
D Creepage current resistance according to
VDE 0303/IEC 112
Comparative Tracking Index: CTI = 275
General features:
D Isolation materials according to UL94-VO
D Pollution degree 2
(DIN/VDE 0110 part 1 resp IEC 664)
D Climatic classification 55/100/21 (IEC 68 part 1)
D Special construction:
Therefore extra low coupling capacity
typical 0.2 pF, high Common Mode Rejection
D Low temperature coefficient of CTR
D Coupling System A
Order Schematic
Suffix: G = Leadform 10.16 mm
Pin Connection
1
A (+) C (–) nc
B
Trang 3Absolute Maximum Ratings
Input (Emitter)
Output (Detector)
Coupler
Soldering temperature 2 mm from case, t ≤ 10 s Tsd 260 °C
Trang 4Maximum Safety Ratings (according to VDE 0884)
Input (Emitter)
Output (Detector)
Coupler
1) This device is used for protective separation against electrical shock only within the maximum safety ratings
This must be ensured by using protective circuits in the applications
Derating Diagram
0
50
100
150
200
300
Tamb ( ° C )
150
94 9182
100
250
Phototransistor Psi ( mW )
IR Diode Isi ( mA )
Trang 5Electrical Characteristics
Tamb = 25°C
Input (Emitter)
Output (Detector)
Collector emitter
cut-off current
VCE = 10 V, IF = 0 2)
VCE = 30 V, IF = 0 2)
ICEO
ICEO
50 500
nA
mA
Coupler
Isolation test voltage
(RMS)
Collector emitter
saturation voltage
Cut-off frequency VCE = 5 V, IF = 10 mA,
2) Tamb = 100°C
Current Transfer Ratio (CTR)
IC/IF VCE = 10 V, IF = 10 mA 4N25V(G) CTR 0.20 1
IC/IF VCE = 10 V, IF = 10 mA 4N35V(G) CTR 1.00 1.5
IC/IF VCE = 10 V, IF = 10 mA,
Tamb = 100°C
Trang 6Switching Characteristics (Typical Values)
VS = 5 V
Typeyp RL = 100 W (see figure 1) RL = 1 kW (see figure 2)
Channel I
Channel II
100W
50W
+ 10 V
Oscilloscope
IC = 10 mA ; Adjusted through
input amplitude
IF
IF
RG = 50W
tp
tp = 50 ms
T = 0.01 0
95 10793
Figure 1 Test circuit, non-saturated operation
Channel I Channel II
1 kW
50W
+ 5 V
Oscilloscope
IC
IF = 10 mA
IF
RG = 50W
tp
tp = 50 ms
T = 0.01 0
95 10844
Figure 2 Test circuit, saturated operation
Trang 7Insulation Rated Parameters (according to VDE 0884)
Partial discharge
test voltage
Lot test (sample test)
tTr = 10 s,
ttest = 60 s
test voltage (sample test) ttest = 60 s
Insulation resistance
VIO = 500 V,
Insulation resistance
VIO = 500 V,
Tamb =150°C
(construction test only)
VIOTM
VPd
VIOWM
VIORM V
t4
t3 ttest
tstres
t2
t1
t 0
13930
tTr = 60 s
t1, t2= 1 to 10 s
t3, t4= 1 s
ttest = 10 s
tstres = 12 s
Figure 3 Test pulse diagram for sample test according to DIN VDE 0884
Trang 8Typical Characteristics (Tamb = 25 ° C, unless otherwise specified)
0
50
100
150
200
250
300
T amb – Ambient Temperature ( ° C )
96 11700
Coupled device
Phototransistor
IR-diode
Figure 4 Total Power Dissipation vs Ambient Temperature
0.1
1.0
10.0
100.0
1000.0
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
VF – Forward Voltage ( V )
96 11862
Figure 5 Forward Current vs Forward Voltage
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
–30 –20 –10 0 10 20 30 40 50 60 70 80
Tamb – Ambient Temperature ( ° C )
96 11874
VCE=10V
I F =10mA
Figure 6 Rel Current Transfer Ratio vs Ambient Temperature
1 10 100 1000 10000
T amb – Ambient Temperature ( ° C )
96 11875
I – Collector Dark Current, CEO
V CE =10V
I F =0
Figure 7 Collector Dark Current vs Ambient Temperature
0.001 0.010 0.100 1.000
IF – Forward Current ( mA )
96 11876
VCB=10V
Figure 8 Collector Base Current vs Forward Current
0.01 0.10 1.00 10.00 100.00
IF – Forward Current ( mA )
96 11904
V CE =10V
Figure 9 Collector Current vs Forward Current
Trang 9Typical Characteristics (Tamb = 25 ° C, unless otherwise specified)
0.1
1.0
10.0
100.0
V CE – Collector Emitter Voltage ( V )
96 11905
20mA
10mA 5mA
2mA 1mA
IF=50mA
Figure 10 Collector Current vs Collector Emitter Coltage
0
0.2
0.4
0.6
0.8
1.0
IC – Collector Current ( mA )
100
95 10972
CTR=50%
20%
10%
Figure 11 Collector Emitter Sat Voltage vs Collector Current
200
400
600
800
1000
h – DC Current GainFE
VCE=10V
5V
1 10 100 1000
IF – Forward Current ( mA )
100
95 10976
VCE=10V
Figure 13 Current Transfer Ratio vs Forward Current
0 10 20 30 40 50
IF – Forward Current ( mA )
20
95 10974
Saturated Operation
V S =5V
RL=1k W
t off
ton
Figure 14 Turn on/ off Time vs Forward Current
Operation
VS=10V
RL=100 W
toff
ton
5 10 15 20
Trang 10Dimensions in mm
Leadform 10.16 mm (G-type)
14771
weight: ca 0.50 g
creeping distance: y 8 mm
after mounting on PC board
Trang 11Dimensions in mm
14770
creeping distance: y 6 mm
y 6 mm
Trang 12Ozone Depleting Substances Policy Statement
It is the policy of TEMIC TELEFUNKEN microelectronic GmbH to
1 Meet all present and future national and international statutory requirements
2 Regularly and continuously improve the performance of our products, processes, distribution and operating systems with respect to their impact on the health and safety of our employees and the public, as well as their impact on the environment
It is particular concern to control or eliminate releases of those substances into the atmosphere which are known as ozone depleting substances ( ODSs )
The Montreal Protocol ( 1987 ) and its London Amendments ( 1990 ) intend to severely restrict the use of ODSs and forbid their use within the next ten years Various national and international initiatives are pressing for an earlier ban
on these substances
TEMIC TELEFUNKEN microelectronic GmbH semiconductor division has been able to use its policy of
continuous improvements to eliminate the use of ODSs listed in the following documents
1 Annex A, B and list of transitional substances of the Montreal Protocol and the London Amendments respectively
2 Class I and II ozone depleting substances in the Clean Air Act Amendments of 1990 by the Environmental Protection Agency ( EPA ) in the USA
3 Council Decision 88/540/EEC and 91/690/EEC Annex A, B and C ( transitional substances ) respectively
TEMIC can certify that our semiconductors are not manufactured with ozone depleting substances and do not contain
such substances
We reserve the right to make changes to improve technical design and may do so without further notice.
Parameters can vary in different applications All operating parameters must be validated for each customer application by the customer Should the buyer use TEMIC products for any unintended or unauthorized application, the buyer shall indemnify TEMIC against all claims, costs, damages, and expenses, arising out of, directly or indirectly, any claim of personal damage, injury or death associated with such unintended or
unauthorized use
TEMIC TELEFUNKEN microelectronic GmbH, P.O.B 3535, D-74025 Heilbronn, Germany
Telephone: 49 ( 0 ) 7131 67 2831, Fax number: 49 ( 0 ) 7131 67 2423