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Scope The main study of the thesis is to examine the techniques of reducing CMOS power dissipation; obtaining the relationship between power dissipation with related circuit parameters;

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UNIVERSITY OF SCIENCE

NGUYỄN THỊ ĐÊ

LOW POWER DESIGN FOR VLSI

Specialization: Electronic Engineering – Microelectronic Major

Code: 60 52 70

MASTER DEGREE THESIS

ELECTRONIC ENGINEERING – MICROELECTRONICS

SUPERVISOR

ASSOC PROF DR NGUYỄN HỮU PHƯƠNG

HO CHI MINH CITY, 2010

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Table of Contents

TABLE OF CONTENTS 1

LIST OF FIGURES 3

LIST OF TABLES 6

CHAPTER I: INTRODUCTION 7

1.1 Rationale 7

1.2 Scope 7

1.3 Structure of the Research 8

CHAPTER II: TECHNIQUES TO REDUCE POWER DISSIPATION 9

2.1 Sources of Power Dissipation 9

2.1.1 Static Dissipation 10

2.1.2 Dynamic Dissipation 12

2.2 Techniques to Reduce Power Dissipation 13

2.2.1 Dynamic Power Reduction 13

2.2.2 Static Power Reduction 14

CHAPTER III: MATLAB SIMULATION OF POWER DISSIPATION 18

3.1 MatLab 18

3.1.1 Why do choose MatLab? 18

3.1.2 A Short Introduction to Matlab 18

3.2 Relationship between Power Dissipation and Related Circuit Parameters 20 3.2.1 Static Power Dissipation 20

3.2.1.1 Relationship between Static Power and Static Current 21

3.2.1.2 Relationship between Static Power and Supply Voltage 22

3.2.2 Dynamic Power Dissipation 23

3.2.2.1 Relationship between Dynamic Power and Activity Switching 23

3.2.2.2 Relationship between Dynamic Power and Load Capacitance 24

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3.2.2.3 Relationship between Dynamic Power and Supply Voltage 25

3.2.2.4 Relationship between Dynamic Power and Frequency 26

CHAPTER IV: LOW POWER DESIGN OF A SIMPLE LOGIC CIRCUIT 28 4.1 1-Bit Magnitude Comparator Circuit 28

4.1.1 Principle 28

4.1.2 Truth Table 28

4.2 Low Power Design 29

4.2.1 Low Power Design at Circuit Level 29

4.2.1.1 Purpose 29

4.2.1.2 Design Basic 29

4.2.1.3 Design Implementation 35

4.2.2 Low Power Design at Layout Level 55

4.2.2.1 Purpose 55

4.2.2.2 Layout Implementation 55

CHAPTER V: CONCLUSION 93

BIBLIOGRAPHY 94

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List of Figures

Figure 2.1: CMOS inverter model for static power dissipation evaluation 11

Figure 2.2: A Variable-Threshold CMOS (VTCMOS) inverter circuit 15

Figure 2.3: Generic structure of a Multiple-Threshold CMOS (MTCMOS) 16

Figure 3.1: Relationship between Static Power and Static Current 26

Figure 3.2: Relationship between Static Power and Supply Voltage 27

Figure 3.3: Relationship between Dynamic Power and Activity Switching 28

Figure 3.4: Relationship between Dynamic Power and Load Capacitance 29

Figure 3.5: Relationship between Dynamic Power and Supply Voltage 30

Figure 3.6: Relationship between Dynamic Power and Frequency 31

Figure 4.1: General operation using switch logic 30

Figure 4.2: Operation of the CMOS NOT gate 30

Figure 4.3: Operation of the 2-input NAND gate 31

Figure 4.4: Operation of the 2-input NOR gate 31

Figure 4.5: Logic formation using nFET in the CMOS logic gate 32

Figure 4.6: Logic formation using pFET in the CMOS logic gate 33

Figure 4.7: XOR and XNOR gates 34

Figure 4.8: XOR and XNOR gates with complementary structuring 35

Figure 4.9: Design_1 Schematic Circuit 36

Figure 4.10: Schematic Circuit using CMOS Transistors 37

Figure 4.11: Waveform of Signals 38

Figure 4.12: Static Power Dissipation 39

Figure 4.13: Dynamic Power Dissipation 41

Figure 4.14: Average Power Dissipation 42

Figure 4.15: Supply Current 43

Figure 4.16: Supply Power (VI) 44

Figure 4.17: Average Supply Power (VI) 45

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Figure 4.18: Design_2 Schematic Circuit 46

Figure 4.19: Schematic Circuit Using CMOS Transistors 47

Figure 4.20: Waveform of Signals 48

Figure 4.21: Static Power Dissipation 49

Figure 4.22: Dynamic Power Dissipation 50

Figure 4.23: Average Power Dissipation 51

Figure 4.24: Supply Current 52

Figure 4.25: Supply Power (VI) 53

Figure 4.26: Average Supply Power (VI) 54

Figure 4.27: Layout_1 View 56

Figure 4.28: Extracted View 57

Figure 4.29: Extracted Parasitic Capacitors 58

Figure 4.30: Analog_Extracted View 59

Figure 4.31: LVS Verification 60

Figure 4.32: Waveform of Signals 61

Figure 4.33: Static Power Dissipation 62

Figure 4.34: Dynamic Power Dissipation 63

Figure 4.35: Average Power Dissipation 64

Figure 4.36: Supply Current 65

Figure 4.37: Supply Power (VI) 66

Figure 4.38: Average Supply Power (VI) 67

Figure 4.39: Layout_2 View 68

Figure 4.40: Extracted View 69

Figure 4.41: Extracted Parasitic Capacitors 70

Figure 4.42: Analog_Extracted View 71

Figure 4.43: LVS Verification 72

Figure 4.44: Waveform of Signals 73

Figure 4.45: Static Power Dissipation 74

Figure 4.46: Dynamic Power Dissipation 75

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Figure 4.47: Average Power Dissipation 76

Figure 4.48: Supply Current 77

Figure 4.49: Supply Power (VI) 78

Figure 4.50: Average Supply Power (VI) 79

Figure 4.51: Layout_3 View 80

Figure 4.52: Extracted View 81

Figure 4.53: Extracted Parasitic Capacitors 82

Figure 4.54: Analog_Extracted View 83

Figure 4.55: LVS Verification 84

Figure 4.56: Waveform of Signals 85

Figure 4.57: Static Power Dissipation 86

Figure 4.58: Dynamic Power Dissipation 87

Figure 4.59: Average Power Dissipation 88

Figure 4.60: Supply Current 89

Figure 4.61: Supply Power (VI) 90

Figure 4.62: Average Supply Power (VI) 91

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List of Tables

Table 3.1: Useful operations, functions and constants in Matlab 19

Table 3.2: Useful plotting commands in Matlab 200

Table 4.1: Truth table for 1-bit magnitude comparator circuit 29

Table 4.2: Summary Table………92

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CHAPTER I

INTRODUCTION

This introductory chapter emphasizes the importance of VLSI low power design for modern electronic devices and systems, and presents the scope and the structure of my thesis

1.1 Rationale

Nowadays, electronic circuits and systems must have as low power dissipation

as possible, especially in the field of mobile communications

In these devices, if have no techniques to reduce power consumption then, they will suffer from either a very short battery life or a very heavy battery pack

Even in the case of non-portable systems, reductions in power consumption are also important These systems often run hot and this causes failure mechanisms

We must cost for cooling and packaging Therefore, it is essential to have the peak power under control [9][13][16]

1.2 Scope

The main study of the thesis is to examine the techniques of reducing CMOS power dissipation; obtaining the relationship between power dissipation with related circuit parameters; and how to design for power dissipation optimization up to layout level of a simple digital circuit

A 1-bit magnitude comparator circuit will be used as an example of a digital circuit for design and estimating power dissipation The design is implemented in

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180nm technology using Cadence software Even rather simple but this illustrative design includes many aspects of low power design

1.3 Structure of the Research

The remainder of this research comprises four chapters

 Chapter II: Techniques to Reduce Power Dissipation

 Chapter III: MatLab Simulation of Power Dissipation

 Chapter IV: Low Power Design of A Simple Logic Circuit

 Chapter V: Conclusion

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2.1 Sources of Power Dissipation

In [14], the instantaneous power P(t) drawn from the power supply is proportional to the instantaneous supply current iDD(t) and the supply voltage VDD

(assumed constant )

P(t) = iDD(t).VDD (2.1)

The average power over some time interval T is

= ∫ ( ) (2.2)

Power dissipation in CMOS circuit comes from two components:

 Static dissipation due to

o Sub-threshold conduction through OFF transistors

o Tunneling current through gate oxide

o Leakage through reverse-bias diodes

 Dynamic dissipation due to

o Charging and discharging of load capacitances

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o “Short-circuit” current while both pMOS and nMOS networks are simultaneously conducting

= + (2.3)

2.1.1 Static Dissipation

Considering the static CMOS inverter shown in Figure 2.1, if the input = ‘0’, the associated nMOS transistor is OFF and pMOS transistor is ON The output voltage is VDD or logic ‘1’ When the input = ‘1’, the associated nMOS transistor is

ON and the pMOS transistor is OFF The output voltage is 0 volts (GND) [14] Ideally, when transistors are OFF no current flow through the circuit, the power dissipation is zero

However, reality even in case transistor is OFF, exist sub-threshold, tunneling, and leakage currents That leads to small amounts of static current flowing through the OFF transistor and static power dissipation is the product of total static current and the supply voltage

Pstatic = Istatic.VDD (2.4)

Where, Istatic is total static current

The sub-threshold current:

= 1 − (2.5)

= . (2.6)

Where Ids0 is the current at threshold and is dependent on process and device geometry; e1.8 term is found empirically, n is a process – dependent term affected by

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the depletion region characteristics and typically in the range of 1.4-1.5 for CMOS process

Figure 2.1: CMOS inverter model for static power dissipation evaluation

We see that the sub-threshold current is exponential function of threshold voltage, so that it is increasing significantly as threshold voltages have reduced

Tunneling current caused by high electric field that through gate oxide

Reverse biased diode leakage current occurs between diffusion regions, wells, and the substrate

The reverse biased diode leakage current is expressed by

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In older technology, static power dissipation was very small comparing with dynamic power dissipation, so that it often considered as zero However, in advanced technology, 130 nm process and beyond, the static power becomes significant Eventually, static power dissipation may become comparable to dynamic power even for high power systems [14][16]

2.1.2 Dynamic Dissipation

The dynamic dissipation component in CMOS circuit is charging the load capacitance Suppose a C is load between GND and VDD at an average frequency of

fsw Over any given interval of time T, the load will be charged and discharged Tfsw

time In one complete charge/discharge cycle, a total charge of Q = CVDD is this transferred from VDD to GND

The average dynamic power dissipation is

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Because the signal input has rise/fall time greater than zero, exist a short time while both nMOS and pMOS transistors will be simultaneously conducting This results in an additional “short circuit" current pulse from VDD to GND

Short circuit power dissipation increases as edge rates become slower because both nMOS and pMOS transistors conduct more time [14]

2.2 Techniques to Reduce Power Dissipation

Power dissipation has become critical to VLSI designers Power reduction techniques can be divided into those that reduce dynamic power and those that reduce static power

2.2.1 Dynamic Power Reduction

The equation (2.10) shows that dynamic power dissipation is reduced by decreasing the activity factors, the switching capacitance, the power supply, or the operating frequency

It’s very important to reduce activity factor We can use clock gating technique to stop portions of the chip that are idle A large amount of power is dissipated by the clock network itself, so we can be turned off entire portions of the clock network where possible Some techniques can applied in order to reduce switching activity such as algorithm optimization, architecture optimization, properly choice of logic topology and logic level optimization

Capacitance is reduced by choosing small transistors Interconnect switching capacitance is most effectively reduced through careful floor-planning, placing communicating units near each other to reduce wire lengths

Voltage has a quadratic proportional to dynamic power Therefore, in order

to reduce significant power dissipation, the circuit should be supplied a lower

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voltage However, the lower voltage can effect to speed of circuit For example, a laptop processor may operate at high voltage and high speed when plugged into an

AC adapter, but at lower voltage and speed when on battery power

Frequency can also be traded for power However, reducing frequency energy doesn’t save energy just reduce rate at which it is consumed

2.2.2 Static Power Reduction

Static power reduction involves minimizing Istatic Some circuit techniques such as turning of analog current sources and pseudo-nMOS gates when they are not needed [14]

Recall that the sub-threshold leakage current for Vgs < Vt

transistors will lead to increased sub-threshold leakage, and consequently, to higher stand-by power dissipation when the output is not switching One possible way to overcome this problem is to adjust the threshold voltages of the transistors in order

to avoid leakage in the stand-by mode, by changing the substrate bias

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In VTCMOS circuit technique, the transistors are designed inherently with a low threshold voltage, and a variable substrate bias control circuit used to generate the substrate bias voltages of nMOS and pMOS transistors, as show in Figure 2.2.

In active mode, the substrate bias voltage of the nMOS transistor is VBn = 0 and the substrate bias voltage of the pMOS transistor is VBp = VDD The circuit operates with low VDD and low VT, benefiting from both low power dissipation (due

to low VDD) and high switching speed (due to low Vt)

In the stand-by mode, however, a lower substrate bias voltage for the nMOS transistor and a higher substrate bias voltage for the pMOS transistor are generated

by the substrate bias control circuit As a result, the threshold voltages Vtn and Vtp

both increase in magnitudes Since the sub-threshold leakage current drops exponentially with increasing threshold voltage, the leakage power dissipation in the stand-by mode can be significantly reduced with this technique

Figure 2.2: A Variable-Threshold CMOS (VTCMOS) inverter circuit

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In order to reduce leakage currents, the VTCMOS technique can also be used

to automatically control the threshold voltages of the transistors, and to compensate for process-related fluctuations of the threshold voltages

Controlling threshold voltage values in low VDD and low Vt applications using the variable threshold CMOS circuit technique is very effective for reducing the sub-threshold leakage currents However, this technique usually requires twin-well or triple-well CMOS technology

Another technique which can be applied for reducing leakage currents in low

voltage circuits in the stand-by mode is Multiple-Threshold CMOS (MTCMOS) technique In this technique, we use two different types of transistors (both nMOS and pMOS) with two different threshold voltages in the circuit Where switching speed is essential, we use low Vt transistors to design the logic, whereas to prevent leakage dissipation, high Vt transistors are used The generic circuit structure of the MTCMOS logic gate is shown in Figure 2.3

Figure 2.3: Generic structure of a Multiple-Threshold CMOS (MTCMOS)

logic gate

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In the active mode, the high Vt transistors are turned on and the logic gates consisting of low Vt transistors can operate with low switching power dissipation and small propagation delay When the circuit is driven into stand-by mode, on other hand, the high Vt transistors are turned off and the conduction paths for any sub-threshold leakage currents the may originate from the internal low Vt circuit are effectively cut off

The MTCMOS technique is conceptually easier to apply and to use compared to the VTCMOS technique, which usually requires a sophisticated substrate bias control mechanism It does not require a twin-well or triple-well CMOS process; the only significant process-related overhead of MTCMOS circuit

is the fabrication of MOS transistors with different threshold voltages on the same chip One of the disadvantages of the MTCMOS circuit technique is the presence of series-connected stand-by transistors, which increase the overall circuit area and also add extra parasitic capacitance [17]

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3.1 MatLab

Matlab is powerful software that is widely used in education and research It has nice interfaces, pictures that are comfortable for simulation and scientific calculator Besides that, it’s is also an easy to used programming language [1]

So that, MatLab is chosen as a programming language in order to simulate the relationship between power dissipation and related circuit parameters

3.1.2 A Short Introduction to Matlab

3.1.2.1 How to Start Matlab

Choose the submenu "Programs" from the "Start" menu From the

"Programs" menu, open the "Matlab" submenu From the "Matlab" submenu, choose "Matlab"

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3.1.2.2 The Matlab Environment

The Matlab interface consists of menus, buttons and a writing area The command window is a location where commands are given to Matlab The command window is very useful if Matlab is used as a scientific calculator or as a graphing tool Usually, the program code is written in a separate window, and then run it in the command window

3.1.2.3 Useful Functions and Operations in Matlab

Table 3.1: Useful operations, functions and constants in Matlab

Operation, function or constant Matlab

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3.1.2.4 Variables in Matlab

We can easily define our own variables in Matlab

x=3.5*sin(2.9); y=2*x;

3.1.2.5 Vectors and Matrices in Matlab

We create a vector in Matlab by putting the elements within [] brackets

Example: x = [ 1 2 3 4 5 6 7 8 9 10], or A = [1 2 3 ; 4 5 6 ; 7 8 9 ],

The vector (1 1.1 1.2 1.3 1.4 1.5) can be created by typing x = [ 1 1.1 1.2 1.3 1.4 1.5 ] or by typing x = 1:0.1:1.5

3.1.2.6 Plotting with Matlab

Table 3.2: Useful plotting commands in Matlab

"Keep plotting in the same window." hold on

Turn off the "keep-plotting-in-the-same-window-command" hold off

3.2 Relationship between Power Dissipation and Related Circuit Parameters 3.2.1 Static Power Dissipation

From (2.4), we have: Pstatic = Istatic.VDD

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3.2.1.1 Relationship between Static Power Dissipation and Static Current

Figure 3.1: Relationship between Static Power Dissipation and Static Current

 Remark: Static Power Dissipation is linearly proportional to Static Current

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3.2.1.2 Relationship between Static Power Dissipation and Supply Voltage

Figure 3.2: Relationship between Static Power Dissipation and Supply Voltage

 Remark: Static Power Dissipation is linearly proportional to Supply Voltage

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3.2.2 Dynamic Power Dissipation

xlabel('Activity Switching \alpha')

ylabel('Dynamic Power Dissipation (W)')

grid

Simulation Result:

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Figure 3.3: Relationship between Dynamic Power Dissipation and Activity Switching

 Remark: Dynamic Power Dissipation is linearly proportional to Activity

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ylabel('Dynamic Power Dissipation (W)')

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title('Relationship between Dynamic Power Dissipation and Supply Voltage')

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Figure 3.6: Relationship between Dynamic Power Dissipation and Frequency

 Remark: Dynamic Power Dissipation is linearly proportional to Frequency

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4.1 1-Bit Magnitude Comparator Circuit

4.1.1 Principle

The circuit determines whether one 1-bit input number is larger than, equal

to, or less than another 1-bit input number The circuitry accomplishes this through several logic gates that operate on the principles of Boolean algebra

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Table 4.1: Truth table for 1-bit magnitude comparator circuit

ASB (A<B)

AGB (A>B)

AEB (A=B)

4.2 Low Power Design

4.2.1 Low Power Design at Circuit Level

4.2.1.1 Purpose

This level will implement 2 designs (Design_1 and Design_2) of the 1-bit magnitude comparator circuit, and simulate it to estimate power dissipation of each design The design which has better power dissipation will be chosen and then preceded to layout level

Designs are executed by using Cadence's Composer Schematic Editor A simulator, Spectre, associated with 180nm technology is used to simulate signals and estimate types of power

4.2.1.2 Design Basic

The design is begun with static CMOS logic gates such as NOT, NAND, NOR This part briefly deals with these gates and the way they are combined to form more complex logic gates like XOR, XNOR that are used in this thesis

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 General Structure of a Static Logic Gate – Complementary Structure [10]

If the pFET switching array is closed, then the output voltage is Vout = VDD

If the nFET switching array is closed, then the output voltage is Vout = 0

Figure 4.1: General operation using switch logic

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 2-input NAND Gate

 2-input NOR Gate

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 Complex Logic Gate

Complex logic function can be implemented by designing the nFET and pFET switching arrays such that only one composite switch is closed for a given set

of inputs The switch equivalents are illustrated in Figure 4.1

Logic formation using nFET in the CMOS logic gate

Figure 4.5: Logic formation using nFET in the CMOS logic gate

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Logic formation using pFET in the CMOS logic gate

Figure 4.6: Logic formation using pFET in the CMOS logic gate

XOR, XNOR gate logic formation

The XOR logic is

= + Taking the complement of the XOR give the XNOR operation

= + ̅

XOR, XNOR functions are created using AOI structuring, the logic may not

be apparent at first sight It is therefore useful to work through the algebra Boolean

to verify the results

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Figure 4.7: XOR and XNOR gates

Using the logic formation rule, we have

= + = ( ) ̅

Thus, the XOR and XNOR functions can be implemented using complementary structuring

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Figure 4.8: XOR and XNOR gates with complementary structuring

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 Design_1 Schematic Circuit

Figure 4.9: Design_1 Schematic Circuit

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 Schematic Circuit using CMOS Transistors

Figure 4.10: Schematic Circuit using CMOS Transistors

 Total number of transistors in Design_1 is 24 that include 12 NMOS and 12 PMOS transistors

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 Waveform of Signals

Figure 4.11: Waveform of Signals

 The waveform is result of simulating Design_1 (Schematic Using CMOS Transistors) at VDD: 1.8V DC, Transient Analysis: 8n (Stop time), and stimulus:

o Input A: Function: pulse, Type: Voltage, Voltage1: 0, Voltage2: 5, Rise time: 0.1n, Fall time: 0.1n, Pulse width: 1n, Period: 2n

o Input B: Function: pulse, Type: Voltage, Voltage1: 0, Voltage2: 5, Rise time: 0.1n, Fall time: 0.1n, Pulse width: 2n, Period: 4n

 Remark: Waveform of Signals matches the Truth table (Table 4.1)

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 Static Power Dissipation

Figure 4.12: Static Power Dissipation

 The waveform is result of measuring the static power dissipation when Design_1 (Schematic Using CMOS Transistors) is simulated at VDD: 1.8V DC, Transient Analysis: 8n (Stop time), and stimulus:

o Input A: OFF

o Input B: OFF

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