Volume 10 - Materials Characterization Part 10 ppt

Capabilities of Related Techniques• Scanning electron microscopy: • Transmission electron microscopy: • X-ray diffraction: Small-Angle Scattering of X-rays,... Lett., Small-Angle Scatter

s I

s,

s

θ

(Eq 11)

w

18-20 0.75 0.40 0.70 0.72

r

s s

I

I s

Table 3 Comparison of the correlation functions F(calc,exp) and F'(calc,exp) for carbon with five models

J Non-Cryst Solids, Carbon,

Ann Phys.,

Z Phys., X-ray Diffraction, X-ray Diffraction,

Phys Rev.,

J Non-Cryst Solids, Acta Cryst.,

J Appl Cryst.,

Advances In X-ray Analyses,

J Appl Cryst.,

J Non-Cryst Solids, Carbon,

Capabilities of Related Techniques

• Scanning electron microscopy:

• Transmission electron microscopy:

• X-ray diffraction:

Small-Angle Scattering of X-rays,

Small-Angle X-ray Scattering,

X-rays in Theory and Experiment, X-ray Diffraction Procedures, Newer Methods of Polymer Characterization,

Direct Analysis of Diffraction by Matter,

x, y

λ λ

Small-Angle Scattering of X-rays,

Newer Methods of Polymer Characterization,

Acta Crystallogr.,

J Coll Int Sci., Macromolecules,

Small-Angle Scattering of X-rays,

X-rays in Theory and Experiment,

J Math Phys.,

J Appl Phys., Kolloid Zh.,

Table 1 Some applications of SAS techniques

Polymer molecules Configuration SANS 27

Small-Angle Scattering of X-rays,

Small-Angle X-ray Scattering,

J Am Ceram Soc.,

Phys Chem Glasses, Phys Chem Glasses,

J Mater Sci.,

J Poly Sci Poly Phys.,

J Poly Sci Poly Phys., Eur Poly.,

Macromol.,

J Appl Crystallogr.,

Poly Eng Sci.,

J Poly Sci Poly Lett.,

Z Metallkd.,

Philos Mag A,

J Nucl Mater., Phys Status Solidi,

Acta Metall., Phys Status Solidi (A),

J Phys.,

Philos Mag A, Philos Mag A,

IEEE Trans., Topics in Applied Physics,

J Poly Sci Poly Phys.,

J Appl Poly Sci.,

J Poly Sci Poly Phys.,

J Poly Sci Poly Phys., Appl Phys Lett.,

Small-Angle Scattering of X-rays, Small-Angle X-ray Scattering,

X-rays in Theory and Experiment, X-ray Diffraction Procedures,

Newer Methods of Polymer Characterization,

Direct Analysis of Diffraction by Matter,

Acta Metall.,

Appl Phys Lett.,

J Phys.,

J Am Ceram Soc.,

Phys Chem Glasses, Phys Chem Glasses,

J Mater Sci.,

J Poly Sci Poly Phys.,

J Poly Sci Poly Phys., Eur Poly.,

Macromol.,

J Appl Crystallogr.,

Poly Eng Sci.,

J Poly Sci Poly Lett.,

Z Metallkd.,

Philos Mag A,

J Nucl Mater., Phys Status Solidi,

Acta Metall., Phys Status Solidi (A),

J Phys.,

Philos Mag A, Philos Mag A,

IEEE Trans., Topics in Applied Physics,

J Non-Cryst Solids,

J Appl Crystallogr.,

J Appl Crystallogr.,

Poly Eng Sci., J Poly Sci Poly Phys.,

J Poly Sci Poly Phys.,

J Appl Poly Sci.,

J Poly Sci Poly Phys.,

J Poly Sci Poly Phys., Appl Phys Lett.,

Capabilities of Related Techniques

• X-ray or neutron diffraction:

• X-ray anomalous scattering:

• Electron energy loss spectroscopy:

• Magic-angle spinning nuclear magnetic resonance:

x

k

Physics of Non-Crystalline Solids,

Phys Rev.,

Z Phys.,

Z Phys.,

Sci Rep Tohoku Univ.,

Rev Mod Phys.,

M

M M

Phys Rev B, Phys Rev B, Phys Rev B,

Philos Mag., Surf Sci.,

Appl Surf Sci.,

J Am Chem Soc.,

Phys Rev Lett.,

I I.

I I.

Table 1 Synchrotron radiation sources

GeV

Current, mA

Bending radius, m

Critical energy, keV

Kurchatov Moscow, Soviet Union 0.45 1.0 0.21 Dedicated

IEEE Trans Nucl Sci.,

J Vac Sci Technol., Phys Rev.,

Synchrotron Radiation Research,

Phys Rev.,

Am J Phys.,

Solid State Commun., Rev Sci Instrum.,

Phys Rev Lett.,

Rev Sci Instrum.,

Phys Rev B, Prog Inorg Chem., Synchrotron Radiation Research,

Rev Mod Phys., Topics in Applied Physics,

Solid State Phys., Handbook on Synchrotron Radiation,

Science,

Rev Sci Instrum.,

Rev Sci Instrum., Rev Sci Instrum.,

Rev Sci Instrum., Synchrotron Radiation Research,

k

k

χ

Phys Rev B, Phys Rev B,

J Am Chem Soc.,

IEEE Trans., Phys Rev Lett.,

J Am Chem Soc.,

J Am Chem Soc.,

J Chem Phys., Phys Rev B,

J Chem Phys.,

J Chem Phys.,

np

s s → d

d

s → d d

s → p

s

s → p

Appl Surf Sci.,

Coord Chem Rev.,

Phys Rev B, Proc Nat Acad Sci.,

J Chem Phys.,

Solid State Commun.,

J Chem Phys., Collect Trav Cjim Techecolovaquie,

φ r

φ r

r

Table 2 Comparison of EXAFS and x-ray diffraction

Topics in Applied Physics,

Table 3 Other EXAFS detection techniques

Detection technique Year

Uses fluorescent x-ray photons to monitor μx of dilute species

Uses Auger electrons to monitor μx of surface atoms

Rapid scan for kinetic studies

For heavy impurities in slightly lower Z matrix

Probes buried interfaces

Electron detection 1984 Applicable for use at atmospheric pressure, avoiding ultrahigh vacuum conditions

Phys Rev Lett.,

IEEE Trans Nucl Sci.,

J Vac Sci Technol.,

Solid State Commun.,

Prog Inorg Chem.,

Rev Mod Phys., Topics in Applied Physics,

Solid State Phys.,

Synchrotron Radiation Research, Synchrotron Radiation Research,

J Mater Sci., Extended X-ray Absorption Fine Structure,

Part VII: Geology and Geochemistry of EXAFS and Near-Edge Structure III,

J Appl Phys., Acta Chem Scand.,

Phys Rev Lett.,

J Phys Lett.,

J Appl Crystallog.,

Solid State Commun.,

Phys Lett., Phys Rev.

Physics of Non-Crystalline Solids,

Phys Rev.,

Z Phys.,

Z Phys.,

Sci Rep Tohoku Univ.,

Rev Mod Phys.,

Phys Rev Lett., Quantum Mechanics of One- and Two-electron Systems,

Phys Rev B, Phys Rev B, Phys Rev B,

Philos Mag., Surf Sci.,

Appl Surf Sci.,

J Am Chem Soc.,

Phys Rev Lett.,

IEEE Trans Nucl Sci.,

J Vac Sci Technol., Phys Rev.,

Synchrotron Radiation Research,

Phys Rev.,

Am J Phys.,

Solid State Commun.,

Rev Sci Instrum.,

Phys Rev Lett.,

Rev Sci Instrum., Phys Rev B,

Prog Inorg Chem., Synchrotron Radiation Research,

Rev Mod Phys.,

Topics in Applied Physics,

Solid State Phys., Handbook on Synchrotron Radiation, Science,

Rev Sci Instrum.,

Rev Sci Instrum., Rev Sci Instrum.,

Rev Sci Instrum., Synchrotron Radiation Research,

Phys Rev B, Phys Rev B,

J Am Chem Soc.,

IEEE Trans., Phys Rev Lett.,

J Am Chem Soc.,

J Am Chem Soc.,

J Chem Phys., Phys Rev B,

J Chem Phys.,

J Chem Phys., Coord Chem Rev.,

Phys Rev B, Proc Nat Acad Sci.,

J Chem Phys.,

Solid State Commun.,

J Chem Phys.,

Collect Trav Cjim Techecolovaquie,

Synchrotron Radiation Research, Synchrotron Radiation Research,

J Mater Sci.,

Extended X-ray Absorption Fine Structure,

Part VII: Geology and Geochemistry of EXAFS and Near-Edge Structure III,

J Appl Phys., Acta Chem Scand.,

Phys Rev Lett.,

J Phys Lett.,

J Appl Crystallog.,

Solid State Commun.,

Phys Lett.,

b f.

d

θ λ

∆d d

θ d

d

in situ

J Mater Sci.,

Textures and Microstructures,

Residual Stress and Stress Relaxation, Metall Trans A,

hkl

θ

Acta Cryst.,

Table 2 Structural parameters for the refined model for Nd 2 (CO 0.1 Fe 0.9 ) 14 B

Atomic coordinate (a) Element/site

R

θ

x y z

y z

Adv Phys.,

J Appl Phys.,

At Energy Rev.,

J Appl Cryst., Nucl Instrum Meth.,

J Appl Cryst.,

J Mater Sci.,

Textures and Microstructures,

Residual Stress and Stress Relaxation,

Metall Trans A, Metall Trans A,

Mater Sci Eng.,

Adv Phys., Acta Metall., Advances in X-ray Analysis, Mater Sci Eng.,

Acta Cryst.,

J Appl Phys.,

At Energy Rev.,

Single Crystal Diffractometry,

Neutron Diffraction,

Experimental Methods in Physics: Neutron Scattering,

• Electron probe x-ray microanalysis:

μ

Electron Optical Applications in Materials Science,

Practical Electron Microscopy in Materials Science, Practical Analytical Electron Microscopy in Materials Science,

Analytical Electron Microscopy,

Electron Microscopy of Thin Crystals,

Interpretation of Electron Diffraction Patterns, Transmission Electron Microscopy of Materials,

hkl hkl

hkl

Z

Z

Z

Electron Optical Applications in Materials Science,

Practical Electron Microscopy in Materials Science, Practical Analytical Electron Microscopy in Materials Science,

Analytical Electron Microscopy,

Electron Microscopy of Thin Crystals,

Interpretation of Electron Diffraction Patterns, Transmission Electron Microscopy of Materials,

Scanning Electron Microscopy and X-ray Microanalysis,

μ μ

μ

μ

Practical Analytical Electron Microscopy in Materials Science,

Analytical Electron Microscopy,

Scanning Electron Microscopy and X-ray Microanalysis,

E hc λ E

α β α α

Bremsstrahlung or Continuum X-Rays.

Excitation of Conduction Electrons Leading to Secondary Electron (Low-Energy) Emission.

Excitation of Phonons.

in situ

≥

Practical Analytical Electron Microscopy in Materials Science,

Scanning Electron Microscopy and X-ray Microanalysis,