Volume 10 - Materials Characterization Part 13 pptx

Quantitative Analysis of Field Ion Microscopy Images... Field Ion Microscopy, Principles and Applications, Surf.. Table 5 Analysis of high-purity 18Cr-12Ni austenitic stainless steelFact

Images of Alloys and Semiconductors

Quantitative Analysis of Field Ion Microscopy Images

Field Ion Microscopy, Principles and Applications, Surf Sci.,

J Phys F (Met Phys.),

et al., Philos Mag.,

The Principle of the Atom Probe

Instrument Design and Operation

μ

Mass Spectra and Their Interpretation

m n

analysis, at.%

carbide analysis, at.%

d

Alternate Forms of Data Representation

Requirements for Quantitative Analysis

(Eq 14)

γ γ

Table 5 Analysis of high-purity 18Cr-12Ni austenitic stainless steel

Factors Limiting Spatial Resolution

The Imaging Atom Probe (lAP)

The High-Resolution Energy-Compensated Atom Probe (ECAP)

The Pulsed Laser Atom Probe (PLAP)

Surface and Interface Analysis,

Proceedings of Phase Transformations Conference, Metall Trans A,

J Phys (Orsay),

Air cool

Air cool

γ

Table 8 Secondary γ' precipitate compositions in IN 939

at.%

Analysis 2 at.%

γ γ

x x x

Table 9 Local composition variations in a metallo-organic chemical-vapor-deposited GaAIAs layer

0.70 ± 0.05

Metall Trans A,

Electron Microscopy and Analysis 1977, Acta Metall.,

Scr Metall., Surf Sci.,

J Phys E (Sci Instrum.),

Surf Sci.,

Proceedings of the 32nd International Field Emission Symposium,

J Phys., Appl Phys Lett.,

Science,

Field Ion Microscopy, Principles and Applications, Surf Sci.,

J Phys F (Met Phys.),

et al., Philos Mag.,

Surface and Interface Analysis,

Proceedings of Phase Transformations Conference, Metall Trans A,

J Phys (Orsay), Electron Microscopy and Analysis 1977, Acta Metall.,

Scr Metall., Surf Sci.,

J Phys E (Sci Instrum.),

Surf Sci.,

Proceedings of the 32nd International Field Emission Symposium,

J Phys., Appl Phys Lett.,

Field Ion Microscopy, Field Emission and Field Ionization,

Field Ion Microscopy A Short Course, Methods of Surface Analysis,

Field Ion Microscopy, Principles and Applications, Prog Surf Sci.,

J Phys E (Sci Instrum.), Prog Surf Sci.,

A Bibliography of Field Ion Microscopy and Related Techniques, Field Ion Microscopy in Materials Science,

Capabilities of Related Techniques

• Secondary ion mass spectroscopy:

o

M E E

E E

E E

Surf Sci., Appl Phys Lett.,

μ

x-y

o

Proceedings of the 1973 Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Surf Sci.,

J Electrochem Soc.,

J Vac Sci Technol.,

• Auger electron spectroscopy:

• Rutherford backscattering spectroscopy:

i x j y

S

Ion Bombardment of Solids,

Atomic and Ionic Impact Phenomena on Metal Surfaces,

Ion Bombardment Modification of Surfaces, Methods of Surface Analysis,

ixjy

i j

Table 1 The effect of oxygen on positive secondary ion yields in metals

i j i

Crit Rev Solid State Sci.,

in situ

O+

Ion Beam Surface Layer Analysis, et al.,

Rev Sci Instrum.,

8th International Conference on X-Ray Optics and Microanalysis,

J Vac Sci Technol.,

O+

m e

m e

m e

m e

Scan Elec Microsc.,

μ

(Eq 4)

K K

Anal Chem.,

et al., Surface Analysis Techniques for Metallurgical Applications,

μ

μ

J Appl Phys.,

J Appl Phys.,

Appl Surf Sci.,

μ μ

O+

m e

μ

x y

x y

x y

x x

x

x