Iec Tr 62660-4-2017.Pdf

IEC TR 62660 4 Edition 1 0 201 7 02 TECHNICAL REPORT Secondary l ithium ion cells for the propulsion of electric road vehicles – Part 4 Candidate alternative test methods for the internal short circui[.]

IEC T R 62660-4

Editio 1.0 2 17-0

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IEC T R 62660-4

Editio 1.0 2 17-0

INT ERNAT IONAL

ELECT ROT ECHNICAL

CONTENTS

FOREWORD 4

INTRODUCTION 6

1 Sco e 7

2 Normative referen es 7

3 Terms an definition 7

4 General provision for alternative test 7

5 Alternative test method 8

5.1 Alternative test method des ription 8

5.1.1 General 8

5.1.2 Test pre aration an test set up 8

5.1.3 Test exec tion 10 5.1.4 Ac e tan e criteria 1

An ex A (informative) Test data 12 A.1 General 12 A.2 Test data 12 A.2.1 Test res lts 12 A.2.2 Data of e c test 18 Fig re 1 – Example of test setup 1 9

Fig re 2 – Example of test setup 2 9

Fig re 3 – Example of ceramic nai with Ni tip 10 Fig re 4 – Example of ceramic nai with Ni tip test 10 Fig re A.1 – Voltage an temp rature of test 1-1 18 Fig re A.2 – Voltage an temp rature of test 1-2 18 Fig re A.3 – Voltage an temp rature of test 1-3 19 Fig re A.4 – Voltage an temp rature of test 2-1 19 Fig re A.5 – Voltage an temp rature of test 2-2 2

Fig re A.6 – Voltage an temp rature of test 2-3 2

Fig re A.7 – Voltage an temp rature of test 3-1 21

Fig re A.8 – Voltage an temp rature of test 3-2 21

Fig re A.9 – ø3 mm ceramic nai with Ni tip 2

Fig re A.10 – Voltage an temp rature of test 4 2

Fig re A.1 – Voltage an temp rature of test 5-1 2

Fig re A.12 – Voltage an temp rature of test 5-2 2

Fig re A.13 – Voltage data of tests 6 2

Fig re A.14 – Voltage data of tests 7 2

Fig re A.15 – Voltage data of tests 8 2

Fig re A.16 – Voltage data of tests 9 2

Fig re A.17 – Voltage data of tests 10-1 2

Fig re A.18 – Voltage data of tests 10-2 2

Fig re A.19 – Voltage data of test 1 -1 2

Fig re A.2 – Voltage data of test 1 -2 2

Fig re A.21 – Voltage data of test 12-1 2

Fig re A.2 – Voltage data of test 12-2 2

Fig re A.2 – Voltage data of test 12-3 2

Fig re A.2 – Voltage data of test 12-4 2

Fig re A.2 – Voltage data of test 12-5 2

Fig re A.2 – Voltage data of test 12-6 2

Fig re A.2 – Voltage data of test 12-7 3

Fig re A.2 – Voltage data of test 13 3

Fig re A.2 – Voltage data of test 14-1 31

Fig re A.3 – Voltage data of test 14-2 31

Fig re A.31 – Voltage data of test 14-3 31

Fig re A.3 – Voltage data of test 14-4 3

Fig re A.3 – Voltage data of test 14-5 3

Fig re A.3 – Voltage data of tests 15 3

Fig re A.3 – Voltage data of tests 16 3

Ta le 1 – Recommen ed test sp cification 8

Ta le A.1 – Internal s ort circ it test res lts 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION

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data of a diferent kin from that whic is normal y publs ed as an International Stan ard, for

example "state of the art"

IEC TR 6 6 0-4, whic is a Tec nical Re ort, has b en pre ared by IEC tec nical commite

21: Secon ary cels an b teries

The text of this Tec nical Re ort is based on the fol owin doc ments:

Ful information on the votin for the a proval of this Tec nical Re ort can b fou d in the

re ort on votin in icated in the a ove ta le

This doc ment has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 6 6 0 series, publ s ed u der the general title Secondary l hiu

m-io n cels fo r th p rop u lsio o f e le c tric road v hicles, can b fou d on the IEC we site

The commite has decided that the contents of this doc ment wi remain u c an ed u ti the

sta i ty date in icated on the IEC we site u der "ht p:/ we store.iec.c " in the data related to

the sp cific doc ment At this date, the doc ment wi b

IEC 6 6 0-3 provides the test proced res an ac e tan e criteria for safety p rforman e of

secon ary l thium-ion cels an cel bloc s u ed for pro ulsion of electric vehicles (EV)

in lu in b tery electric vehicles (BEV) an h brid electric vehicles (HEV) IEC 6 6 0-3

sp cifies the internal s ort circ it test to simulate an internal s ort circ it of a cel cau ed by

the contamination of con u tive p rticle, b sed on IEC 6 619 Becau e the test method

b sed on IEC 6 619 req ires o enin of the cel an care to b taken, the in u try ne d

alternative test method that could also b a pl ed u der certain con ition This doc ment

provides can idates of alternative test proced res

NOT This te t is to b c n u te in a fa i ty s ita le to c ntain th p te tial for h z rd u re ctio s u to a d

in lu in a e plo io a d with staf train d to ma a e th ris s

SECONDARY LITHIUM-ION CELLS FOR THE PROPULSION

Part 4: Candidate alternative test methods

for the internal short circuit test of IEC 62660-3

This Part of IEC 6 6 0 provides the test data on the can idate alternative test method for

the internal s ort circ it test ac ordin to 6.4.4.2.2 of IEC 6 6 0-3:2 16 The internal s ort

circ it test in this doc ment is inten ed to simulate an internal s ort circ it of a cel cau ed by

the contamination of con u tive p rticle, an to verify the safety p rforman e of the cel u der

s c con ition

This doc ment is a pl ca le to the secon ary l thium-ion cel s an cel bloc s u ed for

pro ulsion of electric vehicles (EV) in lu in b tery electric vehicles (BEV) an h brid

electric vehicles (HEV)

NOT This d c me t d e n t c v r c ln ric l c ls

The folowin doc ments are refer ed to in the text in s c a way that some or al of their

content con titutes req irements of this doc ment For dated referen es, only the edition

cited a pl es For u dated referen es, the latest edition of the referen ed doc ment (in lu in

an amen ments) a pl es

IEC 6 619:2 17, Se condary c els and b ate ries c ontainin alkaln or othe r n n-a id

ele c trolyte s – Safety re u ireme ts for se c o ndary l hiu m cels and bate rie s, fo r use in

industrial ap plc ato ns

IEC 6 6 0-3:2 16, Se condary l hium-o cels forth p ro pu lsio o fele ctric road v hicles –

Part 3: Safety re u ireme ts

3 Terms a d definitions

For the purp ses of this doc ment, the terms an definition given in IEC 6 6 0-3 a ply

ISO an IEC maintain terminological data ases for u e in stan ardization at the fol owin

• IEC Electro edia: avai a le at ht p:/ www.electro edia.org/

• ISO Onlne browsin plat orm: avai a le at htp:/ www.iso.org/ob

4 Ge eral provisions for alternative te t

The internal s ort circ it test is sp cified in 6.4.4.2.1 of IEC 6 6 0-3:2 16 The other test

method to simulate the internal s ort circ it of cel cau ed by the contamination of

con u tive p rticle may b selected if the fol owin criteria are satisfied, an agre d b twe n

the c stomer an the s p l er:

a) The case deformation s al not af ect the s ort circ it event of cel thermal y or electrical y.

The energ s al not b disp rsed by an s ort circ it other than the interelectrode s ort

The detai ed test con ition an p rameters of an alternative test s al b adju ted b fore the

test ac ordin to the agre ment b twe n the c stomer an the cel man facturer, so that the

a ove criteria can b satisfied The test res lt s al b evaluated by the disas embly of the

cel , X-ray o servation, etc

If the test res lt s ows more than one layer internal s ort circ it, or larger s ort circ ited are ,

the test may b de med as val d alternative test, provided that the ac e tan e criteria in

6.4.4.3 of IEC 6 6 0-3:2 16 are satisfied The fai ure in an alternative test do s not me n the

fai ure in the test ac ordin to 6.4.4.2.1 of IEC 6 6 0-3:2 16, b cau e the test con ition of

the alternative test may b more severe than the pres rib d criteria

NOT In c s th intern l s ort circ it c n ot b simulate , th te t is in ald a d th te t d ta are re orte

5 Alternative test method

5.1 Alternativ te t method de cription

This s bclau e des rib s the test method of the in entation in u ed internal s ort circ it test

as a can idate of alternative test method in Clau e 4 Ta le 1 provides the recommen ed

test sp cification of the test

Table 1 – Re omme de te t spe ific tions

Te t temp rature (temp rature of th te t b n h a d c l) 2 °C ± 5 °C

Time to sto th in e ter afer v lta e dro is d te te 10 ms or le s

5.1.2 Te t preparatio a d te t s t up

For prismatic cel with hard casin , casin could b thin ed or removed by an a pro riate

method recommen ed by the cel man facturer Thin in or removal of casin s ould b

con u ted takin al the safety me s res ne ded

5.1.2.2 Te t s tup

The cel s ould b held in a man er not to move d rin the test The cel s ould b

electrical y isolated from test b n h

A flat or p u h cel req ires a fixation device Fig re 1 an Fig re 2 s ow examples of the

fixation device

Figure 1 – Ex mple of te t s tup 1

Figure 2 – Ex mple of te t s tup 2

5.1.2.3 In e ter de ic

Two typ s of in enter device, as defined in 5.1.2.3.2 an 5.1.2.3.3 are pro osed in this

alternative test method

5.1.2.3.2 Type 1: 3 mm c ramic nai

Typ 1 in enter is a ceramic nai havin a diameter of 3 mm ± 0,2 mm The an le of the nai

tip s ould b 4 ° ± 3° Fig re 1 s ows an example of the ceramic nai s orientation to the cel

electrode layers d rin the pres

The test u in the Typ 1 in enter is not a pl ca le to the cel s of whic the casin is u ed as

a p rt of the electrodes If the casin is removed, this test may b a pl ca le

Dime sio s inmi imetre

Figure 3 – Ex mple of c ramic nai with Ni tip

Figure 4 – Ex mple of c ramic nai with Ni tip te t

5.1.3 Te t e e ution

The test s ould b con u ted as fol ows:

a) Pre are the cel in ac ordan e with 5.1.2.1

IEIE

b) Adju t the SOC of the cel in ac ordan e with 5.3 of IEC 6 6 0-3:2 16, at the maximum

SOC sp cified by the cel man facturer

c) Fix the cel to the test setup in ac ordan e with 5.1.2.2 The in enter device s ould b

selected ac ordin to 5.1.2.3, b sed on the agre ment b twe n the c stomer an the

s p l er The in enter s ould b placed p rp n ic lar to the electrode layers of the cel

The cel or the in enter s ould move alon this p rp n ic lar axis The in entation

location s ould b the same as IEC 6 6 0-3:2 16

d) Pres the in enter to the cel , or pres the cel up to the in enter, with a con tant velocity

of les than 0,1 mm/s Displacement of the in enter s ould b sto p d when a voltage

dro of at le st 5 mV is detected It is ac e ta le to u e a voltage dro of les than 5 mV

if a hig ac urac voltage meter is u ed and the actual s ort location can b confirmed

with an in p ction of the internal s ort location af er the test The ac urac of the voltage

meter s ould b re orted If the voltage dro of at le st 5 mV is not detected u ti the

in enter is de res ed to half the thic nes of a cel, the test s ould b sto p d an

con idered as in al d, an the test s ould b con u ted on e again

e) Afer the in entation sto s, the in enter s ould remain in place u ti the en of the

o servation p riod Durin the test, the cel voltage, the force of the pres , the

displacement of the pres an the temp rature of the cel s ould b recorded The cel

temp rature s ould b me s red on the s rface of the cel , at a distan e of les than

2 mm from the centre of the in entation Sampl n time for voltage an pres ure

recordin s ould b 5 ms or les Sampl n time for other p rameters recordin s ould b

1 s or les

5.1.4 Ac epta c criteria

Durin the test an within 1 h of o servation, the cel s ould ex ibit no eviden e of fire or

explosion

Annex A

(informativ )

Test data

This an ex provides information on the res lt of tests con u ted ac ordin to Clau e 5, an

of relevant comp rison tests

The re rod cibi ty of e c test res lt is confirmed on several cel desig s Further test data

ne d to b evaluated with cel s that faied the test in 6.4.4.2.1 of IEC 6 6 0-3:2 16, etc

A.2.1 Te t re ults

Ta le A.1 s ows the res lt of internal s ort circ it tests on several typ s of cel s, u in the

in enters in 5.1.2.3, an other typ s of in enters for comp rison The forced internal s ort

circ it (FISC) test in 6.4.4.2.1 of IEC 6 6 0-3:2 16 is also con u ted as comp rison test

Al cels in Ta le A.1 ex ibited no eviden e of fire or explosion, an met the ac e tan e

criteria in 5.1.4

In most of the tests ex e t FISC test, the n mb r of s ort circ ited layers is larger than one

layer, an also varies amon the same cel s

Further data of e c test are s own in A.2.2