Iec 61326 3 1 2017

The overal safety req irements sp cification sp cif ies al relevant req irements of the inten ed a plcation, as f ol ows: a definition of the safety f un tion , b sed on a ris as es ment

Part 3- 1: Immunit y requirement s for safety- relat ed syst ems and for equipment

int ended t o per orm safety- relat ed funct ions (funct ional safet y) – General

indust rial appl cat ions

Mat ériel élect rique de mesure, de commande et de laborat oire – Ex igences

relat ives à la CEM –

Part ie 3- 1: Ex igences d'immunit é pour les syst èmes relat ifs à la sécurit é et

pour les mat ériels dest inés à réal ser des fonct ions relat ives à la sécurit é

(sécurit é fonct ionnele) – Appl cat ions indust riel es générales

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p blc t io o si v ou av ez d s q e t io s c nt ac t ez-n u :

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Part 3- 1: Immunit y requirement s for safety - relat ed syst ems and for equipment

int ended t o per orm safety- relat ed funct ions (funct ional safet y ) – General

indust rial appl cat ions

Mat ériel élect rique de mesure, de commande et de laborat oire – Exigences

relat ives à la CEM –

Part ie 3- 1: Ex igences d'immunit é pour les syst èmes relat ifs à la sécurit é et

pour les mat ériels dest inés à réal ser des fonct ions relat ives à la sécurit é

(sécurit é fonct ionnel e) – Appl cat ions indust riel es générales

W arning! Mak e s re t hat y ou o tain d this publc t ion from a a thorize dist ribut or

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inside

FOREWORD 4

INTRODUCTION 6

1 Sco e 8

2 Normative ref eren es 8

3 Terms, def i ition an a breviation 9

3.1 Terms an def i ition 9

3 2 Ab reviation 1

2 4 General 13 5 EMC test plan 13 5.1 General 13 5.2 In tru tion f or testin 13 5.3 Config ration of EUT d rin testin 14 5.3.1 General 14 5.3.2 Comp sition of EUT 14 5.3.3 As embly of EUT 1

4 5.3.4 I/O p rts 14 5.3.5 Au i ary eq ipment (AE) 14 5.3.6 Ca l n an e rthin (grou din ) 14 5.4 Op ration con ition of EUT d rin testin 14 5.4.1 Op ration modes 14 5.4.2 En ironmental con ition 15 5.4.3 EUT sof tware d rin test 15 5.5 Sp cif i ation of p r orman e criteria 15 5.6 Test des ription 15 6 Perorman e criteria 15 6.1 Per orman e criterion DS 15 6.2 Ap l cation of the p rorman e criterion DS 16 6.3 Asp cts to b con idered d rin a pl cation of p r orman e criterion DS 16 7 Immu ity req irements 17 8 Test set-up an test phi oso h for EUTs with fu ction inten ed for safety a pl cation 2

8.1 Testin of safety- elated s stems an eq ipment inten ed to b u ed in saf ety- elated s stems 2

8.2 Test phi oso h f or eq ipment inten ed for u e in safety- elated s stems 2

8.3 Test phi oso h f or saf ety- elated s stems 2

8.4 Test config ration an test p r orman e 2

8.5 Monitorin 2

9 Test res lts an test re ort 2

An ex A (informative) Ap ro c es on how to a ply IEC 613 6-3 series 2

An ex B (informative) Evaluation of electromag etic phenomena 3

An ex C (inf ormative) Al owed ef fects d rin immu ity tests 3

Biblogra h 3

Fig re 1 – Typical test set-up for eq ipment inten ed f or u e in safety- elated s stem,

Fig re 2 – Typical test set-up for eq ipment inten ed for u e in a safety- elated s stem

integrated into a re resentative saf ety- elated s stem d rin test 2

Fig re A.1 – Cor elation b twe n the stan ard IEC 613 6-1, IEC 613 6-2-x,

IEC 613 6-3-1 an IEC 613 6-3-2 2

Fig re B.1 – Emis ion/immu ity levels an comp tibi ty level, with an example of

emis ion/immu ity levels for a sin le emit er an s s e tor, as a f un tion of some

in e en ent varia les (se IEC TR 610 0-1-1) 31

Ta le 1 – Re ction of EUT d rin test 16

Ta le 2 – Immu ity test req irements – En los re p rt 17

Ta le 3 – Immu ity test req irements – Input an output AC p wer p rts 18

Ta le 4 – Immu ity test req irements – Input an output DC p wer p rts 19

Ta le 5 – Immu ity test req irements – I/O sig al/control p rts 19

Ta le 6 – Immu ity test req irements – I/O sig al/control p rts con ected direct to

p wer s p ly network 2

Ta le 7 – Immu ity test req irements – Fu ctional e rth p rt 2

Ta le 8 – Freq en y ran es of mo i e tran miters an ISM eq ipment for tests with

electromag etic f ield 21

Ta le 9 – Freq en y ran es of mo i e tran miters an ISM eq ipment for the

con u ted RF tests 2

Ta le 10 – Ap l ca le p rorman e criteria an o served b haviour d rin test f or

eq ipment inten ed for u e in safety- elated s stems 2

Ta le B.1 – Exemplary con ideration on electromag etic phenomena an test levels

with regard to fu ctional saf ety in in u trial a plcation 3

Ta le C.1 – Alowed eff ects d rin immu ity tests on fu ction of eq ipment 3

Ta le C.2 – Alowed eff ects d rin immu ity tests on fu ction of a s stem 3

INTERNATIONAL ELECTROTECHNICAL COMMISSION

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Part 3-1: Immunity requirements f or saf ety-related systems and

for equipment intended to perf orm safety-related f unctions

(f unctional safety) – General industrial appl cations

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio f or sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cif i atio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cif i atio s (P S) a d Guid s (h re f ter refer e to a “IEC

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a re me t b twe n th two org niz tio s

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p te t rig ts IEC s al n t b h ld re p n ible for id ntif yin a y or al s c p te t rig ts

International Stan ard IEC 613 6-3-1 has be n pre ared by s bcommite 6 A: Sy tem

asp cts, of IEC tec nical commite 6 : In u trial-proces me s rement, control an

automation

This secon edition can els an re laces the f irst edition publs ed in 2 0 This edition

con titutes a tec nical revision This edition in ludes the fol owin sig ificant tec nical

• in lu in immu ity tests f or devices with c r ent con umption > 16 A ac ordin to

IEC 610 0-4-3 ,

• updatin Ta le 8 – Freq en y ran es of mo i e tran mit ers an ISM eq ipment,

• updatin Fig re A.1 an Fig re 1 for b ter re da i ty

IEC 613 6-3-1 is to b re d in conju ction with IEC 613 6-1

The text of this stan ard is b sed on the f ol owin doc ments:

Ful inf ormation on the votin f or the a proval of this stan ard can b foun in the re ort on

votin in icated in the a ove ta le

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

A lst of al the p rts of the IEC 613 6 series, u der the general title El ectric l e uipme t for

me sureme t, c ntrol a d l ab ratory use – EMC re uireme ts, can b fou d on the IEC

we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "ht p:/we store.iec.c " in the data

related to the sp cif i publ cation At this date, the publ cation wi b

• with rawn,

• re laced by a revised edition, or

IMPORTANT – The 'colour inside' logo on the cov r pa e of this publ c tion indic te

th t it contains colours whic are considere to be us ful f or the cor e t

und rsta ding of its conte ts Us rs s ould therefore print this doc me t using a

colour printer

Fu ctional saf ety is that p rt of the overal saf ety relatin to the eq ipment u der control

(EUC) an the EUC control s stem whic de en s on the cor ect f un tionin of the electrical

safety- elated s stems To ac ieve this, al items of eq ipment of the safety- elated s stem

whic are in olved in the p r orman e of the saf ety f un tion mu t b have in a sp cified

man er u der al relevant con ition

The IEC b sic saf ety publ cation f or fu ctional saf ety of electrical/electronic/programma le

electronic saf ety- elated s stems is IEC 615 8 It sets the overal req irements to ac ieve

f un tional safety Suf ficient immu ity to electromag etic disturb n es is one of those

req irements

The con e t of IEC 615 8 distin uis es b twe n the con ideration of the a pl cation an the

desig of saf ety- elated electrical an electronic s stems The overal safety req irements

sp cification sp cif ies al relevant req irements of the inten ed a plcation, as f ol ows:

a) definition of the safety f un tion , b sed on a ris as es ment of the inten ed a pl cation

(whic fu ction are inten ed to red ce ris );

b) a pro riate safety integrity level (SIL) for e c safety-u ction b sed on a ris as es ment

of the inten ed a pl cation;

c) definition of the en ironment in whic the s stem is inten ed to work in lu in the

electromag etic en ironment as req ired by IEC 615 8-2

The req irements f or e c saf ety fu ction are then sp cified in one or more s stem saf ety

req irements sp cification (SSRS) Hen e, with regard to immu ity again t electromag etic

phenomena, the es ential startin p int is that the electromag etic en ironment an its

phenomena are con idered in the SSRS, as req ired by IEC 615 8 The safety- elated

s stem inten ed to implement the sp cified safety fu ction has to f ulfi the SSRS, an , f rom it,

cor esp n in immu ity req irements have to b derived f or the items of eq ipment, whic

res lts in an eq ipment req irement sp cification With resp ct to the electromag etic

en ironment, the SSRS an the eq ipment req irement sp cification s ould b b sed on a

comp tent as es ment of the forese a le electromag etic thre ts in the re l en ironment

over the whole o erational lf e of the eq ipment Hen e, immu ity req irements for the

eq ipment de en on the c aracteristic of the electromag etic en ironment in whic the

eq ipment is inten ed to b u ed

The eq ipment man facturer, theref ore, has to prove that the eq ipment fulf ils the eq ipment

req irement sp cification an the s stem integrator mu t prove that the s stem fulfis the

SSRS Eviden e has to b prod ced by a plcation of a pro riate method They do not ne d

to con ider an other asp cts of the ap lcation, f or example, ris of the a pl cation

as ociated to any f ai ure of the safety- elated s stem The o jective is for al eq ipment in the

s stem to comply with p rtic lar p rorman e criteria takin into ac ou t fu ctional safety

asp cts (f or example, the p rorman e criterion DS) up to levels sp cif ied in the SSRS

in e en ent of the req ired safety integrity level (SIL)

For a pro c es on how to a ply IEC 613 6-3 series, se An ex A

There exists me nwhi e the generic EMC stan ard IEC 610 0-6-7 de l n with fu ctional

safety asp cts in in u trial en ironments Generic EMC stan ard are desig ed to a ply f or a

defined electromag etic en ironment, to prod cts f or whic no dedicated prod ct fami y

EMC/prod ct EMC stan ard exist However, f or the eq ipment in the s o e of this doc ment,

the inf ormation given in the generic EMC stan ard was con idered not to b s ff i ient More

detaied information an sp cification were ne ded, f or example sp cific test set-ups,

con ideration of the fu ctional e rth p rt or the del b rate dif ferentiation b twe n typ s of

Thou h historical y this prod ct stan ard was develo ed several ye rs b fore the generic

EMC stan ard, this 2

n

edition con iders the information given in the generic EMC stan ard

an a pl es it where a pro riate

ELECTRICAL EQUIPMENT FOR MEA SUREMENT, CONTROL

Part 3-1: Immunity requirements f or saf ety-related systems and

for equipment intended to perf orm safety-related f unctions

(f unctional safety) – General industrial appl cations

This p rt of IEC 613 6 covers al eq ipment within the s o e of IEC 613 6-1, but is l mited to

s stems an eq ipment f or in u trial a pl cation inten ed to p rorm saf ety fu ction as

defined in IEC 615 8 with SIL 1-3

The electromag etic en ironments en omp s ed by this prod ct fami y stan ard are

in u trial, b th in o r an outdo r, as des rib d for in u trial location in IEC 610 0-6-2 or

defined in 3.8 of IEC 613 6-1 Eq ipment an s stems inten ed for u e in other

electromag etic en ironments, for example, in the proces in u try or in en ironments with

p tential y explosive atmospheres, are ex lu ed f om the s o e of this doc ment

Eq ipment an s stems con idered as “proven-in-u e” ac ordin to IEC 615 8 or “prior u e”

ac ordin to IEC 6151 are ex lu ed f om the s o e of this doc men

Fire alarm s stems an sec rity alarm s stems inten ed f or protection of buidin s are

ex lu ed fom the s o e of this doc ment

The f ol owin doc ments are ref er ed to in the text in s c a way that some or al of their

content con titutes req irements of this doc ment For dated referen es, only the edition

cited a ples For u dated ref eren es, the latest edition of the referen ed doc ment (in lu in

an amen ments) a pl es

IEC 6 0 0-161, Intern tion l El ectrote h ic l Vo a ulary – Part 161: Ele troma n tic

c mp t ibility (avai a le at <ht p:/www.electro edia.org/

IEC 610 0-4-2:2 0 , Electroma n tic c mp t ibil ity (EMC) – Part 4-2: Testing a d

me sureme t tec niqu s – Electrostatic d isc arg immu ity test

IEC 610 0-4-3:2 0 , Electroma n tic c mp t ibil ity (EMC) – Part 4-3: Test ing a d

me sureme t t ec niqu s – Rad iat ed , rad io-fe u n y, el ectroma n t ic fiel d immu ity test

IEC 610 0-4-3:2 0 /AMD1:2 0

IEC 610 0-4-3:2 0 /AMD2:2 10

IEC 610 0-4-4:2 12, El ectroma n tic c mp t ibil ity (EMC) – Part 4-4: Testing a d

me sureme t tec niqu s – Electric l fast ra sient/b rst immu ity test

IEC 610 0-4-5:2 14, Electroma n tic c mp tibil ity (EMC) – Part 4-5: Test ing a d

me sureme t t ec niqu s – Surg immu ity test

IEC 610 0-4-6:2 13, Electroma n tic c mp tibil ity (EMC) – Part 4-6: Test ing a d

me sureme t te h iq es – Immu ity to c nd ucted d isturb n es, induc d b rad io-fe u n y

IEC 610 0-4-8:2 0 , El ectroma n t ic c mp tibil ity (EMC) – Part 4-8: Test ing a d

me sureme t t ec niqu s – Power fe u n y mag etic fiel d immu ity t est

IEC 610 0-4-1 :2 0 , El ectroma n t ic c mp tibility (EMC) – P art 4-1 : Test in a d

me sureme t t ec niqu s – Voltag dips, sh rt interu tions a d voltag variat io s immu ity

tests

IEC 610 0-4-16:2 15, El ectroma n t ic c mp t ibility (EMC) – P art 4-16: Testin a d

me sureme t tec niq es – Test for immu ity t o c nd ucted, c mmo mode d isturb n es in

th fe u n y ra g 0 Hz to 150 kHz

IEC 610 0-4-2 :2 0 , El ectroma n tic c mp t ibil ity (EMC) – P art 4-2 : Testin a d

me sureme t t ec niqu s – Vol ta e d ips, sh rt int er u tio s a d vol tag variat io s o d c

inp t p wer p rt immu ity t ests

IEC 610 0-4-3 :2 0 , El ectroma n tic c mp t ibil ity (EMC) – P art 4-3 : Testin a d

me sureme t t ec niqu s – Volt ag dips, sh rt interu tions a d voltag variat io s immu ity

tests for e uipme t with inp t c re t more t ha 16 A p r p ase

IEC 610 0-4-3 :2 0 /AMD1:2 0

IEC 610 0-6-2:2 16, Ele troma n tic c mp tibil it y (EMC) – Part 6-2: Ge eric sta dards –

I mmu ity for ind ustrial e viro me ts

IEC 613 6-1:2 12, El ectric l e uipme t for me sureme t , c ntrol a d l ab ratory use – EMC

re uireme ts – Part 1: Ge eral re uireme ts

IEC 613 6-3-2:_ _

1

, El ectric l e uipme t for me sureme t, c ntrol a d l ab ratory use –

EMC re uireme ts – Part 3-2: Immu ity re uireme ts for safety-relat ed systems a d for

e uipme t inte ded to p rorm safety-rel at ed fu ctio s (u ctio al safety) – Industrial

a p c tio s with sp cified ele troma n tic e viro me t

IEC 615 8-2:2 10, Fun tion l safety of ele tric l /ele tro ic/pro ramma l e electro ic

safety-related syst ems – Part 2: Re uireme ts for el ectric l /ele tro ic/pro ramma le el ect ro ic

safety-rel at ed systems

3 Terms, def initions and abbreviations

• IEC Electro edia: avai a le at htp:/ www.electro edia.org/

• ISO Onl ne browsin platf orm: avai a le at htp:/www.iso.org/o p

NOT Oth r d finitio s, n t in lu e in IEC 6 0 0- 61 a d in this d c me t, b t n v rth le s n c s ary f or th

a plc tio of th dif fere t te ts, are giv n in th EMC b sic p blc tio s of th IEC 610 0 s rie

3.1.1

da gerous f ai ure

f ai ure of an element an /or s bs stem and/or s stem that play a p rt in implementin the

safety fu ction that:

a) prevents a saf ety fu ction f om o eratin when req ired (deman mode) or cau es a

saf ety fu ction to fai (contin ou mode) s c that the EUC is put into a hazardou or

p tential y hazardou state; or

b) decre ses the pro a i ty that the safety fu ction o erates cor ectly when req ired

eq ipment, mac inery, a p ratu or plant u ed f or man f acturin , proces , tran p rtation,

medical or other activities

Note 1 to e try: Th EUC c ntrol s stem is s p rate a d distin t f rom th EU

[SOURCE: IEC 615 8-4:2 10, 3.2.1]

3.1.4

f unctional s fety

p rt of the overal safety relatin to the EUC an the EUC control s stem that de en s on the

cor ect fu ctionin of the E/E/PE saf ety- elated s stems an other ris red ction me s res

[SOURCE: IEC 615 8-4:2 10, 3.1.12]

3.1.5

harm

ph sical injury or damage to the he lth of p o le, or damage to pro erty or the en ironment

[SOURCE: ISO/IEC Guide 51:2 14, 3.1, modif ied – "ph sical" has b en ad ed]

3.1.6

hazard

p tential source of harm

Note 1 to e try: Th term in lu e s ort-term or imme iate d n er (s c a fom f ire or e plo io ) a d lo g-term

eff ects o h alth (s c a f rom rele s of a to ic s b ta c )

[SOURCE: ISO/IEC Guide 51:2 14, 3.2, modif ied – the note to entry has b en ad ed]

3.1.7

s fe f ai ure

f ai ure of an element an /or s bs stem an /or s stem that play a p rt in implementin the

saf ety fu ction that:

a) res lts in the spuriou o eration of the saf ety f un tion to put the EUC (or p rt there f) into

a saf e state or maintain a saf e state; or

b) in re ses the pro a i ty of the spuriou o eration of the safety fu ction to put the EUC (or

p rt there f ) into a safe state or maintain a saf e state

3.1.8

s fety function

f un tion to b implemented by an E/E/PE saf ety- elated s stem or other ris red ction

me s res, that is inten ed to ac ieve or maintain a safe state f or the EUC, in resp ct of a

– micro-c ntrolers;

– pro ramma le c ntrolers;

– a plc tio s e ific inte rate circ its (ASICs);

– pro ramma le lo ic c ntrolers (PLCs);

– oth r c mp terb s d d vic s (or e ample, smart s n ors, tra smiters, a tu tors)

Note 1 to e try: This term c v rs micro le tro ic d vic s b s d o o e or more c ntral pro e sin u its (C Us)

to eth r with a s ciate memorie , etc

[SOURCE: IEC 615 8-4:2 10, 3.2.12]

3.1.10

ele tric l/ele tronic/programmable ele tronic

E/E/PE

b sed on electrical (E) an /or electronic (E) an /or programma le electronic (PE) tec nolog

EX MPLE Ele tric l/ele tro ic/pro ramma le ele tro ic d vic s in lu e

– ele tro-me h nic l d vic s (ele tric l);

– s ld-state n n-pro ramma le ele tro ic d vic s (ele tro ic);

– ele tro ic d vic s b s d o c mp ter te h olo y (pro ramma le ele tro ic); s e 3.2.5

(of IEC 613 6- :2 12)

Note 1 to e try: Th term is inte d d to c v r a y a d al d vic s or s stems o eratin o ele tric l prin iple

[SOURCE: IEC 615 8-4:2 10, 3.2.13, modified – the referen e in the last das is modif ied]

3.1.1

DC distribution network

local DC electricity s p ly network in the inf rastru ture of a certain site or bui din inten ed

f or con ection of an typ of eq ipment

Note 1 to e try: Co n ctio to a lo al or remote b tery is n t re ard d a a D distrib tio n twork if s c a ln

c mpris s th p wer s p ly f or o ly a sin le pie e of e uipme t

3.1.12

• implements the req ired safety f un tion neces ary to ac ieve or maintain a safe state for

the EUC; an

• is inten ed to ac ieve, on its own or with other E/E/PE safety- elated s stems an other

ris red ction me s res, the neces ary safety integrity for the req ired safety fu ction

Note 1 to e try: A s fety-elate s stem in lu e al th h rdware, s f tware a d s p ortin s rvic s (f or e ample,

p wer s p le ) n c s ary to c ry o t th s e if i d s fety fu ctio (s n ors, oth r in ut d vic s, f i al eleme ts

(a tu tors) a d oth r o tp t d vic s are th refore in lu e in th s fety-elate s stem)

[SOURCE: IEC 615 8-4:2 10, 3.4.1, modif ied – notes 1, 2, 3, 4, 5 an 7 have b en removed]

eq ipment neces ary to provide the eq ipment u der test (EUT) with the sig als req ired for

normal o eration an eq ipment to verify the p r orman e of the EUT

dis rete level (one out of a p s ible four), cor esp n in to a ran e of safety integrity values,

where safety integrity level 4 has the hig est level of saf ety integrity an safety integrity

level 1 has the lowest

Note 1 to e try: Th targ t f aiure me s re f or th f our s fety inte rity le els are s e ifie in Ta le 2 a d 3 of

IEC 615 8- :2 10

Note 2 to e try: Saf ety inte rity le els are u e f or s e if yin th s fety inte rity re uireme ts of th s fety

f un tio s tob alo ate to th E/E/PE s fety-elate s stems

Note 3 to e try: A s f ety inte rity le el (SIL) is n t a pro erty of a s stem, s b y tem, eleme t or c mp n nt

Th c re t interpretatio of th p ra e “SIL n s fety-elate s stem” (wh re n is 1, 2, 3 or 4) is th t th s stem is

p te tialy c p ble of s p ortin s f ety f un tio s with a s f ety inte rity le el u to n

[SOURCE: IEC 615 8-4:2 10, 3.5.8, modified – the referen e to 3.5.17 of IEC 615 8-1 has

b en removed an its date of publcation ad ed]

4 General

In ad ition to the req irements in IEC 613 6-1, this stan ard sp cifies req irements for

s stems an eq ipment f or in u trial a plcation inten ed to p r orm saf ety fu ction

ac ordin to IEC 615 8 These req irements do not a ply to the non-saf ety- elated fu ction

of the eq ipment or s stems

NOT Th o eral d sig pro e s a d th n c s ary d sig fe ture to a hie e f un tio al s fety of ele tric l a d

ele tro ic s stems are d f i e in IEC 615 8 This in lu e re uireme ts for d sig fe ture th t ma e th s stem

tolera t (IEC 615 8-2:2 10, 7.4.7.1 of ele troma n tic disturb n e

The immu ity req irements in IEC 613 6-1 have b en selected to en ure an adeq ate level of

immu ity for eq ipment u ed in non-saf ety- elated a pl cation , but the req ired immu ity

levels do not cover extreme cases that may oc ur at an location but with an extremely low

pro a i ty of oc ur en e

In re sed immu ity test levels comp red to IEC 613 6-1 are def i ed as a s stematic me s re

inten ed to avoid dan erou fai ures cau ed by electromag etic phenomena Con eq ently, it

is not neces ary to take into ac ou t the ef fect of electromag etic phenomena in the

q antif i ation of hardware safety integrity, for example, pro a i ty of fai ure on deman

In re sed immu ity test levels are def i ed where neces ary

In re sed immu ity test levels are related to fu ctional safety asp cts only; they are not

a pl ca le for the as es ment of rel a i ty an avai a i ty asp cts The in re sed immu ity

test levels a ply only to the safety- elated fu ction havin a sp cific p rorman e criterion

f or fu ctional saf ety (p r orman e criterion DS) The in re sed immu ity test levels set the

l mits f or the maximum test values Further tests with hig er values are not req ired f or

compl an e with this stan ard

5 EMC test plan

An EMC test plan s al b esta l s ed prior to testin It s al contain as a minimum the

elements given in 5.2 to 5.6

If an tests are de med u neces ary to prove compl an e with this stan ard, the rationale f or

not p r ormin those tests s al b doc mented in the EMC test plan

5.2 In truction f or te ting

The in tru tion for testin immu ity in case of safety- u ction s al b detai ed an

u ambig ou Hen e al relevant detai s when p r ormin s c a series of immu ity tests

s al b des rib d in the test plan Su h a test plan s al contain at le st information a out

• input an output p rts relevant f or immu ity testin ,

• config ration of the EUT in lu in an neces ary au i ary an monitorin equipment,

• o eration mode of safety fu ction ,

• levels for the immu ity test,

• sp cified p rf orman e criteria in lu in the defined state(s),

• monitorin of the b haviour of the EUT,

• as es ment of the re ction of the EUT again t the man f acturers’ sp cified p r orman e

5.3 Configuration of EUT during te ting

Me s rement, control an la oratory eq ipment of ten con ists of s stems with no fixed

config ration The kin , n mb r an in talation of dif ferent s b s embl es within the eq i

p-ment may vary f rom s stem to s stem

To simulate EMC con ition re l stical y, the eq ipment as embly s al re resent a typical

in tal ation as sp cified by the man facturer EMC tests s al b car ied out as typ tests

u der normal con ition as sp cified by the man facturer

In some cases au i ary set-ups are neces ary to monitor the pro er o eration of the saf ety

f un tion when electromag etic disturb n es act on the EUT

5.3.2 Composition of EUT

Al devices, rac s, mod les, b ard , etc whic are p tential y relevant to EMC an b lon in

to the EUT s al b doc mented The rationale for the comp sition of the EUT selected for

testing s al b doc mented in the EMC test plan

5.3.3 As embly of EUT

If an EUT has a variety of internal or external config ration , the typ tests s al b made with

the most s s e tible config ration, as exp cted by the man facturer Al typ s of mod les

s al b tested at le st on e The rationale f or this selection s al b doc mented in the EMC

test plan The p s ibi ty of an electromag etic interaction b twe n items of eq ipment s al

b taken into ac ount when buidin up the most s s e tible config ration The rationale for

the as embly selected for testin s al b doc mented in the EMC test plan

5.3.4 I/O p rts

Where there are multiple I/O p rts al of the same typ an f un tion, con ectin a ca le to

ju t one of those p rts is s ff i ient, provided that it can b s own that the ad itional ca les

would not aff ect the res lts sig if i antly The rationale for this selection s al b doc mented

in the EMC test plan

5.3.5 Auxi iary e uipme t (AE)

When a variety of items of AE is provided f or u e with the EUT, at le st one of e c typ of

item of AE s al b selected to simulate actual o eratin con ition AE may b simulated

An software u ed by AE s al b doc mented s ficiently to al ow re e tin the test

It is stron ly recommen ed that the AE u ed is not s s e tible to electromag etic

disturb n es, s c as f or example mec anical eq ipment, to e se detection an as es ment

of the re ction of the EUT

5.3.6 Cabl n a d e rthing (grounding)

The ca les an e rth (grou d) s al b con ected to the EUT in ac ordan e with the

man facturer's sp cif i ation There s al b no ad itional e rth con ection

5.4 Operation conditions of EUT during te ting

A selection of re resentative o eration modes s al b made, takin into ac ou t that not al

f un tion , but only the most typical f un tion of the eq ipment can b tested The estimated

worst-case o eratin modes within the sp cification of the eq ipment for the inten ed

5.4.2 Environme tal conditions

The tests s al b car ied out within the man facturer’s sp cif ied en ironmental o eratin

ran e (for example, ambient temp rature, h midity, atmospheric pres ure), an within the

rated ran es of s p ly voltage an f req en y, ex e t where the test req irements state

otherwise

5.4.3 EUT sof tware during te t

The software u ed for exercisin the selected modes of o eration s al b doc mented

s f ficiently to alow re e tin the test

5.5 Spe ific tion of perf orma c criteria

Perorman e criteria for e c p rt an test s al b sp cified, where p s ible, as q antitative

values

5.6 Te t de cription

Eac test to b a pled s al b sp cified in the EMC test plan The des ription of the tests,

the test method , the c aracteristic of the tests, an the test set-ups are given in the b sic

stan ard , whic are ref er ed to in Ta le 1 The contents of these b sic stan ard ne d not

b re rod ced in the test plan; however, ad itional information ne ded for the practical

implementation of the tests is given in this stan ard In some cases, the EMC test plan s al

sp cify the a pl cation in detai

NOT Not al k own disturb n e p e ome a h v b e s e if i d for te tin p rp s s in this sta d rd, b t o ly

th s whic are c n id re a critic l For furth r informatio , s e An e B

6 Perf ormanc criteria

6.1 Performa c criterion DS

Perf orman e criteria are u ed to des rib an to as es the re ction of the eq ipment u der

test when b in exp sed to electromag etic phenomena With regard to f un tional safety

purp ses, a p rtic lar p rf orman e criterion DS s al b a pled Perorman e criterion DS is

as fol ows

a) The fu ction of the EUT inten ed for u e in safety a plcation

1) are not af fected outside their sp cification, or

2) may b aff ected temp rari y or p rmanently (even by destru tion of comp nents), if the

EUT re cts to a disturb n e in a way that a detecta le an defined state(s) of the EUT

NOT 1 It is p s ible for th d fin d state to b o tsid n rmal o eratin lmits

NOT 2 Editio 1 of this sta d rd u e th a bre iatio F f or th t p rorma c criterio Ac ordin to th b sic

sta d rd IEC 610 0- -2 a d g n ric sta d rd IEC 610 0-6-7, th a bre iatio DS is u e n w with ut h vin

6.2 Appl c tion of th perf orma c criterion DS

The p rorman e criterion DS is a pl ca le only for f un tion of the EUT inten ed for saf ety

a pl cation It is relevant for an phenomenon There is no dif ferentiation req ired b twe n

contin ou an tran ient electromag etic phenomena

Eq ipment p rf ormin or inten ed to p rorm f un tion inten ed for safety a pl cation or

p rts of s c f un tion s al b have in a sp cif ied man er as defined by p rf orman e

criterion DS The sp cif ied b haviour of a safety- elated s stem is inten ed to ac ieve or

maintain safe con ition of the eq ipment an the related eq ipment u der control To

ac ieve this, saf ety fu ction s al b c ec ed b fore, d rin an af ter the immu ity test

Where an item of eq ipment or a s stem p rf orms b th fu ction inten ed for saf ety

a pl cation an fu ction not inten ed for safety a pl cation , the req irements f or fu ctional

safety a ply in context with the f un tion inten ed for safety a pl cation only

The neces ity to as es saf ety fu ction ac ordin to the p rorman e criterion DS cal s for a

precise monitorin of the tec nical state of the EUT To that en , p rf orman e criterion DS

s al b stated u ambig ou ly In man cases, sp cif i au i ary eq ipment wi b neces ary

to u ambig ou ly identify an monitor the cor ect o eration of the safety fu ction u der

con ideration It s al b en ured that s c au i ary eq ipment do s not af fect the b haviour

of the EUT d rin immu ity tests

6.3 Aspe ts to be considere d ring appl c tion of performa c criterion DS

If an EUT re cts to a disturb n e by goin to the def i ed state, it s al b verif ied that this

ac ievement of the def i ed state is not only an oc asional res lt, but that this b haviour is

re rod cible To verify the re rod cibi ty, the rules def i ed in Ta le 1 s al b a pl ed on the

a pl cation of p rf orman e criterion DS

7 Immunity requirements

Ta le 2 to Ta le 7 give immu ity test req irements ad itional to those given in IEC 613 6-1

Ta le 10 gives an overview of the al owed ef fects of electromag etic disturb n es on

f un tion inten ed for safety a plcation an f un tion not inten ed for safety ap l cation

NOT Some of th te t v lu s in Ta le 2 to Ta le 7 are le s strin e t th n th v lu s giv n in th g n ric EMC

sta d rd IEC 610 0-6-7 Ac ordin to IEC Guid 10 , wh re a pro u t f amiy/pro u t EMC sta d rd s e if i s le s

strin e t te t v lu s/le els f or a p e ome o or if a p e ome o is o ly p rtialy c v re (e.g th pro u t

f amiy/pro u t EMC sta d rd o ly c v rs a s b et of th re omme d d fe u n y ra g ), eith r a ju tific tio or a

ref ere c to th rele a t re uireme t in a oth r EMC sta d rd s al b giv n in th pro u t famiy/pro u t EMC

sta d rd Su h a ref ere c c n b ma e to IEC 613 6-3- :2 0 fom whic th re uireme ts in this sta d rd were

d riv da d whic re uireme ts h v b e pro e in pra tic

Some of the electromag etic phenomena l sted in Ta le 1 may relate to an o eratin state of

eq ipment in a statistical way only, for example, the in tant of an impulse with resp ct to the

momentary state of a digital circ it or a digital sig al tran mis ion In order to in re se the

level of con den e for saf ety- elated s stems an eq ipment inten ed for hig er SIL

regardin immu ity again t electromag etic disturb n es, it is req ired to p rf orm immu ity

tests again t s c electromag etic phenomena with a larger n mb r of impulses comp red to

the test p rorman e req irements of the cor esp n in b sic EMC stan ard This can b

done by u in a lon er test time or by a plyin more test impulses (se text in Ta le 1)

Table 2 – Immu ity te t re uireme ts – Enclos re port

P en men n Ba ic stan ard

Te ts f or f unctio s inten ed f or s fety ap lc tio s

Te t value – Perf ormanc criterio

Th s v lu s s al b a ple in a c rd n e with th e viro me tal c n itio s d s rib d in IEC 610 0-4-2 o

p rts whic ma b a c s ible b p rs n oth r th n staf f workin in a c rd n e with d fin d pro e ure for

th c ntrolof E D b t n t to e uipme t wh re a c s is lmite to a pro riately train d p rs n el o ly

b

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th n mb r of dis h rg s at th hig e t le el s al

b in re s d b a fa tor of 3 c mp re to th n mb r a giv n in th b sic sta d rd

Table 3 – Immunity te t re uirements – Input a d output AC power p rts

Te ts f or f unctio s inten ed f or s fety ap lc tio s

Te t value – Perf ormanc criterio

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th d ratio of th te t at th hig e t le el s al b

in re s d b a fa tor of 5 c mp re to th d ratio a giv n in th b sic sta d rd

b

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th n mb r of p ls s at th hig e t le el s al b

in re s d b a fa tor of 3 c mp re to th n mb r a giv nin th b sic sta d rd

c

Th re uire immu ity le el c n b a hie e thro g th u e of e tern l prote tio d vic s An d vic s u e

a d th ir in talatio re uireme ts s al b s e if i d in th u er d c me tatio

Table 4 – Immunity te t re uirements – Input a d output DC power p rts

P en men n Ba ic stan ard

Te ts f or f unctio s inten ed f or s fety ap lc tio s

Te t value – Perf ormanc criterio

D c n e tio s b twe n p rts of e uipme ts stem whic are n t c n e te to a D distrib tio n twork are

tre te a I/O sig al/c ntrol p rts (s e Ta le 5 a d 6)

a

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th d ratio of th te t at th hig e t le el s al b

in re s d b a fa tor of 5 c mp re to th d ratio a giv n in th b sic sta d rd

b

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th n mb r of p ls s at th hig e t le el s al b

in re s d b a fa tor of 3 c mp re to th n mb r a giv nin th b sic sta d rd

c

Th re uire immu ity le el c n b a hie e thro g th u e of e tern l prote tio d vic s An d vic s u e

a d th ir in talatio re uireme ts s al b s e if i d in th u er d c me tatio

d

Th s te t v lu s s al b a ple in fe u n y ra g s a giv n in Ta le 9 u e for mo ie tra smiters in

g n ral ISM f re u n ie s al b ta e into a c u t o a in ivid al b sis

Table 5 – Immunity te t re uireme ts – I/O sign l/control ports

P en men n Ba ic stan ard

Te ts f or f unctio s inten ed f or s fety ap lc tio s

Te t value – Perf ormanc criterio

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th d ratio of th te t at th hig e t le el s al b

in re s d b a fa tor of 5 c mp re to th d ratio a giv n in th b sic sta d rd

c

Only in c s of lo g-dista c ln s (s e 3.10 of IEC 613 6- :2 12)

d

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th n mb r of p ls s at th hig e t le el s al b

in re s d b a fa tor of 3 c mp re to th n mb r a giv nin th b sic sta d rd

e

Th re uire immu ity le el c n b a hie e thro g th u e of e tern l prote tio d vic s An d vic s u e

a d th ir in talatio re uireme ts s al b s e if i d in th u er d c me tatio

f

Th s te t v lu s s al b a ple in f re u n y ra g s a giv n in Ta le 9 u e f or mo ie tra smiters in

g n ral ISM f re u n ie s al b ta e into a c u t o a in ivid al b sis

g

Only in c s of e rth d s stems or e uipme t, re p ctiv ly

Table 6 – Immunity te t re uireme ts – I/O sig al/control ports

conn cte dire t to p wer s pply network

P en men n Ba ic stan ard

Te ts f or f unctio s inten ed f or s fety ap lc tio s

Te t value – Perf ormanc criterio

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th d ratio of th te t at th hig e t le el s al b

in re s d b a fa tor of 5 c mp re to th d ratio a giv n in th b sic sta d rd

b

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th n mb r of p ls s at th hig e t le el s al b

in re s d b a fa tor of 3 c mp re to th n mb r a giv nin th b sic sta d rd

c

Th re uire immu ity le el c n b a hie e thro g th u e of e tern l prote tio d vic s An d vic s u e

a d th ir in talatio re uireme ts s al b s e if i d in th u er d c me tatio

d

Th c u ln n twork A /D p wer ln s s al b u e

e

Th s te t v lu s s al b a ple in fe u n y ra g s a giv n in Ta le 9 u e for mo ie tra smiters in

g n ral ISM fe u n ie s al b ta e into a c u t o a in ivid al b sis

Table 7 – Immunity te t re uireme ts – Functional e rth port

P en men n

Ba ic

stan ard

Te ts f or f unctio s inten ed f or s fety ap lc tio s

Te t value – Perf ormanc criterio

6.1 Burst IEC 610 0-4-4 2kV (5/5 n , 5 kHz)

a

DS

a

For e uipme t inte d d to b u e in SIL 3 a plc tio s, th d ratio of th te t at th hig e t le el s al b

in re s d b a f actor of 5 c mp re to th d ratio a giv n in th b sic sta d rd

Table 8 – Fre ue c ra g s of mobi e tra smit ers

a d ISM e uipme t f or te ts with ele troma netic f ield

F r inf ormatio o ly

b p rorme at th t f re u n y o ly If a fe u n y ra g is in ic te in th te t fe u n y ra g c lumn, th t

fe u n y ra g s al b ste p dthro g with a ste siz n t larg r th n 1 % of th a tu l fe u n y

NOT 1 For th te ts, th mo ulatio s h me a giv n in th b sic sta d rd is a ple Oth r mo ulatio p rameters

are p s ible

NOT 2 For more informatio a o t f re u n y alo atio p r re io , s e IEC 610 0-2-5 or ITU p blc tio s

Table 9 – Fre ue c ra ge of mobi e tra smit ers a d

8 Test set up a d test phi osophy f or EUTs with f unctions intended f or saf ety

appl cations

8.1 Te ting of s fety-relate s stems a d e uipme t inte de to be us d in s

fety-relate s stems

A saf ety- elated s stem may comprise a complex an exten ed in tal ation an may also b

bui t up in variou ph sical ar an ements Immu ity testin of s c s stems can hardly b

p rormed in a practical way by me n of the variou b sic stan ard as given in Ta les 2 to

7 Hen e, cor esp n in immu ity tests s al b car ied out prefera ly on eq ipment level as

des rib d in 8.2

In case of ph sical y smal safety- elated s stems, cor esp n in immu ity tests can b

a pl ed to entire safety- elated s stem whic is des rib d in 8.3 If an alternative test

phi oso h is u ed, this s al b des rib d in the EMC test plan an a rationale f or its u e

given

8.2 Te t phi oso hy f or e uipme t inte de f or us in s fety-relate s stems

Even thou h fu ctional saf ety req ires the cor ect f un tionin of the complete s stem, f or

example, comprisin sen ors, logic solver an actuators, it is p s ible to test its devices

in ivid al y The in ivid al devices inten ed to b u ed f or implementation into a

safety-related s stem s al b s ff i iently sp cified This sp cification comprises the inten ed

f un tion an the al owed b haviour in case of f ai ure The o jective of the immu ity tests is to

prove that the sp cif i ation is f ulfi ed for the con idered electromag etic phenomena

Whether or not a disturb d f un tion wi b come dan erou is u k own b cau e it de en s on

the f uture a pl cation in a safety- elated s stem Therefore the test has to s ow the b haviour

of the EUT Deviation fom the u disturb d f un tion s al b detecta le an s al b

doc mented in the test re ort

The p rorman e criterion DS places ad itional req irements on the eq ipment that is

inten ed for u e in safety- elated a pl cation In this case, the normal per orman e criteria

within their as ociated l mits an the p rorman e criterion DS b th a ply The normal

p rorman e criteria within their as ociated lmits an the p rf orman e criterion DS are

con idered se arately The general a pro c of a plyin p rf orman e criteria for the diff erent

Table 10 – Appl c ble perf orma c criteria a d o s rv d be a iour d ring te t f or

e uipme t inte de for us in s fety-relate s stems

F nctio inten ed f or s fety ap lc tio F nctio n t inten ed f or s fety ap lc tio

Normal EMC te t EMC s f ety te t Normal EMC te t EMC s f ety te t

Performanc criteria

a cordin to the relevant

pro uct stan ard

Perf ormanc criteria

DS

Perf ormanc criteria

a cordin to the relevant

pro uct stan ard

NOT 1 Th d s riptio of th p rf orma c criteria A, B a d C is giv n in IEC 613 6-

NOT 2 For more d taie informatio a o t alowe ef fe ts d rin immu ity te tin , s e Ta le C.1 a d C.2

8.3 Te t phi oso hy f or s fety-relate s stems

The EUT s al b monitored d rin test to s ow that its f un tionalty is in compl an e with this

stan ard This monitorin s stem s al not b af fected by electromag etic disturb n es fom

the a pl ed test

For a safety- elated s stem its inten ed f un tion an p s ible safe states are sp cif ied The

aim of the immu ity tests is to s ow whether the s stem as a whole b haves as sp cified by

the man facturer an as req ired by the p rf orman e criterion DS (se Clau e 6)

The p rf orman e criteria f or fu ctional saf ety place ad itional req irements on saf ety- elated

s stems The normal p rorman e criteria within their as ociated lmits an the fu ctional

req irements f or fu ctional safety are con idered se arately Ta le B.2 i u trates the

a pl cation of the relevant p rf orman e criteria by s owin examples of al owa le ef fects due

to sp cif i electromag etic phenomena

8.4 Te t config ration a d te t perf orma c

Fig re 1 s ows a typical config ration of a test set-up for eq ipment inten ed f or u e in a

saf ety- elated s stem tested as stan -alone eq ipment or entire s stem In this config ration,

the immu ity tests a ply to the con idered eq ipment only Other devices u ed to ru the

EUT d rin test are se arated f rom an electromag etic influen es Fig re 1 is also val d if a

saf ety- elated s stem can b tested as an entire s stem

Fig re 2 s ows a typical config ration of a test set-up for eq ipment inten ed f or u e in a

safety- elated s stem when tested as p rt of a re resentative saf ety related s stem In this

config ration, the immu ity tests a ply to the eq ipment con idered Other devices u ed to

ru the EUT d rin test are se arated f om an electromag etic influen es

If the EUT is not an entire safety- elated s stem, then the p rts of the EUT s ould b

con ected to other elements simulatin the safety s stem (sen ors/logic elements/actuators)

The EUT s al co p rate with the devices of a safety s stem, whic are neces ary for the

f un tion of the EUT an for p rf ormin the sp cified fu ction of the EUT inten ed f or safety

a pl cation

In cases of combination of eq ipment ru nin with safety logic solver sof tware ac ordin to

IEC 615 8, cor esp n in immu ity tests s al b a pl ed to at le st one typical combination

as lon as a pro f of immu ity f or other combination can b provided throu h a pro riate

analytical eviden e

The AE whic are neces ary f or the f un tion of the EUT an for p rf ormin the fu ction

inten ed f or safety a pl cation s al b mou ted in a wel -protected electromag etic

en ironment (se Fig re 1) Durin the test, these AE s al not b af fected by electromag etic

disturb n es

Relevant I/O p rts of the EUT s al b con ected with the a pro riate p rts of the devices of

the safety- elated s stem, whic are neces ary for the f un tion of the EUT an or for

p rormin the f un tion inten ed f or safety a pl cation

Ca les an I/O p rts of the EUT that are not u ed s al b terminated as sp cified by the

man facturer

Only ca les sp cif ied by the man f acturer of the EUT or the safety s stem s al b u ed in

the test set-up

If stan ardized test method are avaia le f or commu ication l n s u ed f or saf ety fu ction

then it is stron ly recommen ed that they are u ed (f or example, for field bu commu ication

refer to IEC 617 4-3)

The safety f un tion of the safety related s stem s al b tested one after the other an in

sp cified combination Immu ity tests are car ied out in the static mode of a saf ety fu ction,

e.g a safety fu ction is activated an then the test is p r ormed

Immu ity tests are not req ired to b a pl ed d rin the in tan es of activatin or d

e-activatin saf ety fu ction , but these may b ad ed to the test plan by the man f acturer

8.5 Monitoring

If at al p s ible, the monitorin s stem s al not influen e the b haviour of the EUT If this is

not p s ible, the extent of influen e s al b doc mented Un er no circ mstan es s al the

saf ety- elated f un tion of the EUT b af fected by the monitorin s stem

The monitorin s stem s al o serve, if a pl ca le:

• the data commu ication b twe n the EUT an the devices whic are neces ary for the

fu ction of the EUT an f or p rormin the fu ction inten ed f or saf ety a pl cation ; an

• the statu of the outputs whose f un tion are inten ed for saf ety a pl cation

9 Test results a d test report

The test res lts s al b doc mented in a comprehen ive test re ort with s f ficient detai to

provide for test re e ta i ty

The test re ort s al contain the f ol owin minimum inf ormation:

– EUT des ription;

– the items sp cif ied in the test plan;

– test eq ipment an set-up;

– the b haviour o served d rin the test

Key

A EUT: s fety relate s stem u d r te t

C gro n in p int f or s ield d c ble(s) (if re uire b th ma ufa turer

D d c u ln n twork(s) at th intera e b twe n th EUT a d th ele troma n tic ly d c u le

T EUT p rt termin tio s (gro n e if e uire b th ma ufa turer

U u s ield d mo itorin c ble(s) (a y n c s ary, a d al s f ety-elate , f un tio s)

X ele troma n tic ly d c u le e viro me t

Figure 1 – Typic l te t s t up f or e uipme t inte de f or us in s fety-relate s stem,

Key

A EUT: p rt of th s f ety-elate s stem u d r te t

B p rt of th s fety-elate s stem n t u d r te t, a d a xi ary d vic s

C gro n in p int f or s ield d c ble (if re uire b th ma uf acturer

D d c u ln n twork(s) at th interf ac b twe n th EUT a d th ele troma n tic ly

S s f ety- elate s stem o tp t – mo itore

T EUT p rt termin tio s (gro n e if re uire b th ma ufa turer

U u s ield d mo itorin c ble (a y n c s ary, a d al s fety-elate , fu ctio s)

X ele troma n tic ly d c u le e viro me t

Fig re 2 – Typic l te t s t up f or e uipme t inte de f or us in a s fety-relate s stem

inte rate into a repre e tativ s f ety-relate s stem during te t

Annex A

(inf or mative)

Approaches on how to apply IEC 61326-3 series

There are b sical y two a pro c es on how to de l with the electromag etic en ironments

an to con lu e on immu ity req irements

a) To con ider a general electromag etic en ironment with no sp cif i restriction , for

example, an in u trial en ironment, an to take into ac ou t al the electromag etic

phenomena that can oc ur as wel as their maximum ampl tu es when derivin

a pro riate immu ity levels f or the s stem an the eq ipment This a pro c has b en

u ed to determine the levels sp cified within this doc ment le din to in re sed immu ity

levels f or some electromag etic phenomena comp red to immu ity levels whic are

derived without fu ctional safety con ideration

b) To control the electromag etic en ironment, f or example, by the a plcation of p rtic lar

in tal ation an mitigation practices, in s c a way that electromag etic phenomena an

their ampl tu es could oc ur only to a certain extent These phenomena an restricted

ampltu es are then taken into ac ou t by a pro riate immu ity levels These levels are

not neces ari y hig er than those derived without f un tional safety con ideration b cau e

it is en ured by cor esp n in me n that hig er ampl tu es are not normal y exp cted

This a pro c is con idered in IEC 613 6-3-2

Ap lyin a pro c (a) with regard to a general in u trial en ironment req ires a pro riate

k owled e of the electromag etic phenomena an the ampl tu es to b exp cted there For

this purp se, the electromag etic en ironment data of IEC 610 0-2-5 are to b u ed, whic

gives inf ormation a out electromag etic phenomena to b exp cted an des rib s their

ampl tu es in terms of comp tibi ty levels Sin e they can b con idered as disturb n e

levels at whic an ac e ta le electromag etic comp tibi ty s ould exist, these levels are

u ed as the b sis for normal immu ity req irements as given in non-saf ety- elated stan ard

s c as IEC 613 6-1, IEC 613 6-2-X or the generic stan ard IEC 610 0-6-2 This normal

a pro c a pl ed to ac ieve electromag etic comp tibi ty is b sed on a tec nical/economical

compromise alowin a certain amou t of harmf ul inter eren e cases This a pro c ,

however, is not s f ficient in the case of safety- elated s stems an the eq ipment u ed in

them Immu ity levels have to b determined, whic take into ac ou t al electromag etic

phenomena an the maximum levels to b exp cted in the electromag etic en ironment

u der con ideration an hen e, f or man electromag etic phenomena, these levels are

in re sed comp red to the normal ones

Fol owin a pro c (a), this doc ment gives sp cific electromag etic immu ity req irements

that a ply to safety- elated s stems an eq ipment inten ed to b u ed in saf ety- elated

s stems These req irements s p lement certain req irements of IEC 613 6-1, an the

selected electromag etic phenomena an defined immu ity test levels are exp cted to matc

with the en ironmental con ition of most in u trial a pl cation

The cor elation b twe n the stan ard IEC 613 6-1, IEC 613 6-2-X, IEC 613 6-3-1 an

IEC 613 6-3-2 is des rib d in the diagram of Fig re A.1

The in re sed sp cified test levels in this doc ment are derived f rom the hig est levels to b

exp cted in the en ironment of most in u trial a plcation These in re sed test levels are

related to the electromag etic en ironment ( hat can oc ur) They can ot b related in an

analytical way to the SIL req ired for the safety- elated s stem b cau e there is no practical y

prova le relation hip b twe n test level an pro a i ty of f ai ure d rin u e The influen es

of electromag etic phenomena are con idered as s stematic eff ects an by their nature often

Desig fe tures of eq ipment s al take into ac ou t the req ired SIL an s al b desig ed

to avoid dan erou s stematic fai ures Suff i ient immu ity again t electromag etic

disturb n es can only b en ured by desig , mitigation an con tru tion tec niq es whic

take into ac ou t electromag etic asp cts, whic , however, are not within the s o e of this

doc ment

It is therefore recommen ed that the a pro c to ac ieve the ca a i ty for the req ired SIL

s ould b throu h the ado tion of desig f eatures on the one han an throu h a pro riate

test p rorman e p rameters in order to in re se the level of confiden e in the test res lts on

the other

NOT This f l wc art is n t inte d d to giv re uireme ts a o t th s q e c of te t.

Fig re A.1 – Cor elation betwe n the sta dard

S A R T

Te t fu ct io s

a ain t p rorma c crit eria,

u d r elec troma n tic t est

a ain t p rorma c criteria

u d r ele t roma n tic te t

a ain t p rorma c crit eria

u d r ele t roma n tic te t

inte d d a plc tio

Annex B

(inf or mative)

Evaluation of electromagnetic phenomena

The relation hip b twe n EMC an safety req ires d e con ideration, p rtic larly b cau e

the con eq en es of safety f ai ures can b seriou EMC req irements for saf ety- elated

eq ipment an s stems can only b b sed on exten ive dis u sion b twe n the p rties

in olved Some IEC stan ard or tec nical sp cif i ation an re orts l ke IEC 615 8 an

IEC 610 0-1-2 de l with EMC an f un tional safety asp cts but b th of them refer to

IEC TR 610 0-2-5

The o jective of the req irements to ac ieve fu ctional safety with E/E/PE s stems is,

ac ordin to IEC 615 8, to l mit the maximum pro a i ty of a dangerou faiure of a saf ety

f un tion by a value given by the SIL This me n that the E/E/PE s stem mu t p rf orm the

intended fu ction s ff i iently with a pro a i ty gre ter than the value derived f om the SIL or,

in the case of a f ault, p r orm a defined f ault- eaction f un tion To ac ieve this go l,

IEC 615 8 req ires the a pl cation of sp cific tec niq es an me s res to avoid fai ures or to

control faults that may oc ur d rin o eration of the s stem These req irements relate to al

p s ible sources that could cau e f ai ures IEC 615 8 ref ers to the IEC 610 0 series

con ernin EMC an as s f or an EMC sp cif i ation is ued by the p rties in olved The EMC

sp cification s al b b sed on IEC TR 610 0-2-5 Wel -k own electromag etic phenomena

are des rib d in IEC TR 610 0-2-5 for diff erent en ironments The selection of the relevant

phenomena an a pro riate test levels is up to the p rties involved

Saf ety asp cts are not covered by the EMC req irements f or normal u e Whie the EMC

req irements f or normal u e, for example, as defined in IEC 610 0-6-2, aim to s p ort

s f ficient o eration u der normal con ition , it is the aim of the safety req irements to as ure

saf ety of the eq ipment or the eq ipment u der control

The clas ical a pro c f or derivin immu ity levels in the EMC are can b demon trated by

me n of Fig re B.1 (f or f urther detai s, se IEC TR 610 0-1-1 an IEC TR 610 0-2-5) It

s ows the pro a i ty den ity of the oc ur en e of electromag etic disturb n es res ltin f rom

the emis ion fom in ivid al sources le din to an electromag etic disturb n e level (left

Figure B.1 – Emis ion/immunity le els a d compatibi ty le el with a e ample of

emission/immunity le els f or a single emit er a d s s eptor, a a fu ction of some

indepe de t v riable (se IEC TR 610 0-1-1)

Adjacent to it a c rve is s own whic re resents the immu ity b haviour of eq ipment again t

electromag etic disturb n es Immu ity levels are normal y given as dis rete q antitative

values Nonetheles , a pro a i stic c rve res lts for the immu ity b haviour of eq ipment

This c rve reflects the fact that of ten eq ipment may have a hig er immu ity than the

req ired one ( he immu ity is tested normal y with resp ct to the req ired level only an not

b yon this level), but also that there is a variation in the actual immu ity d e to

u certainties, s c as toleran es in the eq ipment itself , in the eq ipment man facturin

proces or u certainties d e to test eq ipment an test p rf orman e

For a q antitative des ription of s c a p tential inter eren e situation, a comp tibi ty level is

introd ced an is c osen as a kin of referen e level f or the des ription of disturb n es

Comp tibi ty levels for the variou electromag etic phenomena are given in

IEC TR 610 0-2-5, for example, an they can b u ed as a startin -p int f or derivin

immu ity levels Of course, their actual values stron ly de en on the electromag etic

en ironment u der con ideration Hen e, EMC can b ac ieved only if the emis ion an

immu ity levels are control ed in s c a way that, at e c location, the disturb n e level

res ltin fom the c mulative emis ion is s ff i iently lower than the immu ity level for e c

device, eq ipment an s stem situated at the same location It s ould, however, b noted that

comp tibi ty levels can b phenomenon-, time- or location-de en ent

From the s a e of the c rves in Fig re B.1, it can b con lu ed that an in re sin margin

b twe n the comp tibi ty level an the a pled immu ity level le d to a red ced pro a i ty

f or the oc ur en e of interf eren e situation an theref ore to a b t er immu ity an in total to

a “b ter” state of EMC Hen e for most of the electromag etic phenomena to b con idered,

immu ity test levels have to b u ed whic are in re sed comp red to those u ed for normal

EMC

In practice, the immu ity levels f or pure EMC purp ses are derived so that the p tential

overla b twe n the are in icatin the disturb n e levels an that in icatin the immu ity

This a pro c re resents a tec nical/economic compromise an it al ows the p s ibi ty that

in some cases, the sp cified immu ity levels are not hig enou h to avoid intereren e The

overla of 5 % do s not neces ari y me n that interf eren e takes place in 5 % of the

in tal ation where these comp nents are u ed The res ltin pro a i ty of intereren e is

normal y mu h lower as explained in Clau e A.6 of IEC TR 610 0-1-1

The c rves in Fig re B.1 s ow the prin ip l b haviour of the pro a i ty of disturb n e levels

an eq ipment immu ity level, the ran es of plan in levels an immu ity test levels as wel

as the p sition of the comp tibi ty level These c rves are phenomenon-, time- an /or

location-de en ent Hen e, a p tential k owled e of s c pro a i stic den ity c rves f or a

p rtic lar phenomenon at a p rtic lar in tal ation can ot b tran fer ed to any other

electromag etic phenomenon an in tal ation

The actual k owled e of s c pro a i stic c rves is relatively p or for most electromag etic

phenomena In e d, detai ed information is avaia le only f or f ew phenomena (as, f or

example, for the to ic of lg tnin protection an the are of s rge pulses) But also in these

cases the k owled e exists more or les in the f ield of the phenomenon itself (in the case of

l g tnin strokes by me n of isokerau ic c rves) an not so mu h in the s bseq ently actin

stres onto an eq ipment d e to these phenomena

Even for the case of relatively wel -k own pro a i stic c rves, it can b exp cted that the

pro a i stic den ities are wel k own in the are s where they have values of a smal p r cent

or several ten of p r cent This, however, can ot b con idered as s f ficient when lookin at

prob bi stic req irements as they are defined by the SIL

In the field of saf ety, the en ine rs of a safety- elated s stem have to take into ac ou t

prob bi ties of 10

-5

to 10-9

dan erou f ai ures p r hour, or pro a i ties of dan erou fai ure

down to p r 10

-5

deman , whic fig res are far f rom an rel a le pro a i stic data con ernin

b th the oc ur en e of electromag etic disturb n es an the oc ur en e of the levels related

to the disturb n es

From those b u dary con ition it can b con lu ed that in most cases there wi b no

rel a le, evident an prova le way to fin a cle r cor elation b twe n the comp tibi ty level of

disturb n es within an in tal ation an the immu ity level for an item of eq ipment to b

in tal ed in a safety- elated s stem

The only practical way to derive a pro riate immu ity levels se ms to b the as es ment of

the p rtic lar electromag etic en ironment in whic the saf ety- elated s stem is inten ed to

b u ed an to determine immu ity levels by me n of tec nical arg ments The comp tibi ty

levels as given in IEC TR 610 0-2-5 can b u ed as b sis for derivin the req ired immu ity

A pro osal a plyin this a pro c an takin into ac ou t the k owled e of EMC an

f un tional saf ety exp rts to avoid a worst-case sp cif i ation in this field is given in Ta le B.1

The column “Dif ferent test level for f un tion of the EUT inten ed f or saf ety a pl cation ”

gives inf ormation on how these test levels are related to the test levels f or normal f un tion

They are derived by multipl cation of the test level f or normal f un tion ( aken, f or example,

f rom IEC 613 6-1 f or in u trial location ) by a certain f actor or alternatively by a plyin the

next test level in the order of test levels as given in the basic stan ard u der con ideration In

b th cases, this con lu ion on test levels f or safety fu ction was made on the b sis of the

Table B.1 – Ex mplary considerations on ele troma netic ph nome a a d te t le els

with re ard to f un tional s fety in industrial appl c tions

No P en mena Ba ic stan ard Dif ferent te t level

a c s ible b p rs n oth r th n staf workin

in a c rd n e with d f i e pro e ure f or th

e c ptio s giv n in th g n ric sta d rd

No s f ety margin in g n ral A s f ety margin

ma b n c s ary in a e viro me t a

d fin d in IEC 610 0-6-5 or simiar lk a

in u trial switc y rd

interu tio s, v lta e v riatio s) Volta e

v riatio s are c n id re a f un tio al a p cts

a d n t EMC relate

8 Sh rt

inter u tio s

interu tio s, v lta e v riatio s) Volta e

v riatio s are c n id re a f un tio al a p cts

a d n t EMC relate

c mmo -mo e

v lta e

IEC 610 0-4- 6 Ye Ye , b t for s ort-time p wer f re u n y

p e ome a o ly Limite to th rate v lta e of

th p wer s p ly

interu tio s, v lta e v riatio s) Volta e

v riatio s are c n id re a f un tio al a p cts

a d n t EMC relate

inter u tio s

interu tio s, v lta e v riatio s) Volta e

v riatio s are c n id re a f un tio al a p cts

a d n t EMC relate

interu tio s, v lta e v riatio s) Volta e

v riatio s are c n id re a fu ctio al a p cts

a d n t EMC relate

13 Sh rt

inter u tio s

interu tio s, v lta e v riatio s) Volta e

v riatio s are c n id re a fu ctio al a p cts

a d n t EMC relate

Annex C

(inf or mative)

Al owed effects during immunity tests

Ta les C.1 an C.2 give an overview of the al owed eff ects d rin immu ity tests on the

diff erent f un tion , i.e fu ction inten ed f or safety a plcation an fu ction not inten ed

f or saf ety ap l cation The oc ur en e of eig t p s ible ef fects is con idered Ta le C.1

refers to the situation when eq ipment is con erned an Ta le C.2 refers to the situation

when lo kin at the entire saf ety- elated s stem

These ta les present the phioso hy u ed in this doc ment for determinin al owed eff ects

d ring tests These ef fects de en on the f ol owin con ideration :

• typ of fu ction (f un tion inten ed for saf ety a pl cation or fu ction not inten ed f or safety

a plcation); an

• typ of test (normal EMC test or EMC safety test

F nctio s inten ed f or s f ety ap lc tio s F nctio s n t inten ed f or s f ety ap lc tio s

No Ef f ect d rin interf erenc

1 Fu ctio u disturb d A lways alowed A lways alowed A lways alowed A lways alowed A lways alowed A lways alowed A lways alowed

2 Temp rary re ro u ible d

f aiure is d te ta le b a tomatic

dia n stic (aiure informatio is

4 Temp rary lo s of fu ctio ,

5 Temp rary lo s of fu ctio whic

re uire o erator interv ntio or

re et f or re o ery

+

f aiure is d te ta le, for e ample,

b dia n stic (f aiure informatio is

F nctio s inten ed f or s f ety ap lc tio s F nctio s n t inten ed f or s f ety ap lc tio s

No Ef f ect d rin interf erenc

6 Temp rary lo s of fu ctio whic

re uire o erator interv ntio or

Not alowed Not alowed Not alowed

NOT As s ort-time tra sie t ele troma n tic p e ome a are c n id re : E D, b rst, s rg ; a lo g-time tra sie t ele troma n tic p e ome a are c n id re : v lta e dip

a d v lta e interu tio s

1 Fu ctio u disturb d A lways alowed A lways alowed A lways alowed A lways alowed A lways alowed A lways alowed A lways alowed

2 Temp rary lo s of fu ctio ,

3 Temp rary lo s of fu ctio ,

4 Temp rary lo s of fu ctio whic

re uire o erator interv ntio or

5 Temp rary lo s of fu ctio whic

re uire o erator interv ntio or

Not alowed Not alowed Not alowed

NOT As s ort-time tra sie t ele troma n tic p e ome a are c n id re : E D, b rst, s rg ; a lo g-time tra sie t ele troma n tic p e ome a are c n id re : v lta e dip

a d v lta e interu tio s