Bsi bs cecc 16100 1980 (1999)

00140532 PDF BRITISH STANDARD BS CECC 16100 1980 Harmonized system of quality assessment for electronic components — Sectional specification Electromechanical all or nothing relays UDC 621 318 56 BS C[.]

BRITISH STANDARD BS CECC

BS CECC 16100:1980

This British Standard, having

been prepared under the

direction of the Electronic

Components Standards

Committee, was published

under the authority of the

Executive Board and

comes into effect on

29 August 1980

© BSI 11-1999

The following BSI references

relate to the work on this

standard:

Committee reference ECL/1

Draft for comment 77/29527 DC

ISBN 0 580 11518 6

Cooperating organizations

The Electronic Components Standards Committee, under whose direction this British Standard was prepared, consists of representatives from the following Government department and scientific and industrial organizations:

British Electrical and Allied Manufacturers’ Association (BEAMA)Electricity Supply Industry in England and Wales

Electronic Components Industry Federation*

Electronic Engineering Association*

Institution of Electronic and Radio EngineersMinistry of Defence*

National Supervising Inspectorate*

Post Office*

Society of British Aerospace Companies LimitedTelecommunication Engineering and Manufacturing Association (TEMA)*The organizations marked with an asterisk in the above list, together with the following, were directly represented on the Committee entrusted with the preparation of this British Standard:

Association of Control Manufacturers Tacma (BEAMA)Cinematograph Exhibitors’ Association of Great Britain and IrelandTransmission and Distribution Association (BEAMA)

Amendments issued since publication

Amd No Date of issue Comments

BS CECC 16100:1980

Contents

PageCooperating organizations Inside front cover

Components Committee (CECC) 16100 “Harmonized system of quality

assessment for electronic components Sectional specification: Electromechanical all-or-nothing relays”

This standard is a harmonized specification within the CECC system The

existing non-harmonized BS 9151 “Rules for the preparation of detail

specifications for all-or-nothing relays of assessed quality” will remain in force for the time being because of current approvals within the BS 9000 scheme

Terminology and conventions. The text of the CECC specification has been approved as suitable for publication, without deviation, as a British Standard Some terminology and certain conventions are not identical with those used in British Standards; attention is especially drawn to the following

The comma has been used throughout as a decimal marker In British Standards

it is current practice to use a full point on the baseline as the decimal marker

Cross-reference. The British Standard harmonized with CECC 00100 is

BS E9000 “General requirements for electronic components of assessed quality

harmonized with the CENELEC Electronic Components Committee System”

Part 1 “Basic rules” The British Standard harmonized with CECC 00107 is

BS E9000-2 “Rules of procedure”

IEC 255 (to which reference is made in 4.2), is a multipart standard and relevant

parts of it are to be published as identical British Standards

A British Standard does not purport to include all the necessary provisions of a contract Users of British Standards are responsible for their correct application

Compliance with a British Standard does not of itself confer immunity from legal obligations.

International Standard Corresponding British Standard

IEC 410:1973 BS 6001:1972 Sampling procedures and tables for

inspection by attributes

(Technically equivalent)CECC 16000:1979 BS CECC 16000:1980 Harmonized system of quality

assessment for electronic components Generic specification: Electromechanical all-or-nothing relays

Section 3 Quality assessment procedures 1

3.1 Primary stage of manufacture 1

3.2 Structurally similar relays 1

3.3 Qualification approval tests 1

3.4 Formation of inspection lots 1

Appendix A Explanations and examples regarding IL- and AQL-values 10

Table 1 — Basic test schedules for electromechanical all-or-nothing relays 4

The object of the System is to facilitate international trade by the harmonization

of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity The components produced under the System are thereby accepted by all member countries without further testing

This document has been formally approved by the CECC, and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for ELECTROMECHANICAL ALL-OR-NOTHING RELAYS It should be read in conjunction with document CECC 00100: Basic Rules (1974)

Preface

This sectional specification was prepared by CECC Working Group 16: “Relays”

In accordance with the requirements of document CECC 00100 it is based, wherever possible, on the Recommendations of the International

Electrotechnical Commission

The text of this sectional specification was circulated to the CECC for voting in the document CECC(Secretariat)644 in September 1977, and was ratified by the CECC for printing as a CECC specification

The layout of this specification deviates from that given in CECC 00400, mainly by the insertion of an “Appendix A: Explanations and Examples Regarding IL- and AQL-Values”, which gives guidance to specification writers

iv blank

BS CECC 16100:1980

Section 1 Scope

This sectional specification applies to electromechanical all-or-nothing relays of assessed quality

It selects from the generic specification CECC 16000 the appropriate methods of tests to be used in detail specifications derived from this specification, and contains basic test schedules to be used in the

preparation of such specifications Detailed test schedules are contained in the blank detail specifications supplementary to this specification

Section 2 General

2.1 Related documents

CECC 16000:1979, Generic Specification: Electromechanical all-or-nothing relays.

Section 3 Quality assessment procedures

3.1 Primary stage of manufacture

The primary stage of manufacture is the manufacturer’s incoming goods inspection stage where he checks that these goods fulfil his specified requirements

3.2 Structurally similar relays

Relays are considered structurally similar if having no other differences in design than in:

1) coil wire diameter and number of windings

2) types, numbers and material of contacts

3) rated coil and/or contact voltage(s)

4) mounting and terminal variants

altogether up to the limits prescribed in the detail specification

NOTE If a detail specification covers variants 1) to 4), then the purchaser shall specify which variant(s) he requires.

3.3 Qualification approval tests

Qualification approval tests shall include all the tests prescribed in the detail specification, and shall be performed:

— for short production runs: by a schedule specifically prescribed in the detail specification

(method 1 of CECC 00107)

— for large production runs: by the schedule prescribed in the detail specification for quality

conformance inspection on three consecutive lots (method 2 of CECC 00107)

As a general rule, a minimum of five specimens are required for each group of tests in a test schedule as in method 1 of CECC 00107 Specimens which pass a non-destructive test may be used again for subsequent destructive tests

3.4 Formation of inspection lots

Inspection lots shall be formed in accordance with § 10 of CECC 00107 and with the sampling plans and procedures given in IEC Publication 410, except for small production runs, isolated lots, and small lots

3.4.1 When sampling is carried out in accordance with IEC Publication 410, the percent defective concept only shall be used Stratified or representative sampling shall always be used to include all production lines and structurally similar relays in proportion to their respective quantities in the lot Where variants are liable to cause differing results in a particular test, exceptions from proportionality may become necessary and shall be stated in the detail specification or agreed between the manufacturer and the National Supervising Inspectorate (ONS) Specimens shall be as representative as possible of the production.Samples for Group C inspection shall be taken from a lot (or lots) which has passed Group A and B inspection They may be taken either from the lot which leaves production at the end of the Group C period,

or from different lots at intervals during the Group C period In either case the sample size shall not be less than that applicable to the average lot size in the current Group C period

BS CECC 16100:1980

3.4.2 A short production run is defined as a production comprising not more than 30 inspection lots For each of these lots the procedures for isolated lots shall be adopted However, depending on lot size and acceptable quality level (AQL), the switching rules may have a greater chance if operating with large lots and low AQL, which may also be considered when determining the sampling plans to be used These shall

be agreed between the manufacturer and the ONS

3.4.3 An isolated lot (as distinct from the lot of isolated nature in IEC 410, Clause 11.6) is defined as a

unique production or supply lot, not forming part of a current sequence of inspection lots in the quality assessment system

The following options are available and shall be chosen by agreement between the manufacturer and the ONS

1) 100 % inspection if the lot is too small for sampling with adequate discrimination against the release

of non-conforming items for the specified AQL and inspection level (IL) (non-destructive tests only)2) Change to a sampling plan with an operating characteristic giving adequate protection (DR)* at the limiting quality (LQ) and for the known usage of the relays in the lot The plan to be used shall be agreed between the manufacturer and the ONS and should not unduly increase the producer’s risk of the original AQL The plan chosen may have both different AQL and IL from those specified in the detail specification

NOTE *DR = Discrimination Ratio, defined as:

(see Table VI-A and Table X of IEC Publication 410)

3) Where good discrimination cannot be obtained e.g for a small lot and a destructive test, a greater sampling risk must be taken and agreement on the plan to be used shall be reached between the manufacturer, the ONS and when known, the ultimate customer (user)

3.4.4 For small lots, procedures as described in 1), 2) or 3) of 3.4.3 above may be used and agreed between

the manufacturer, the ONS and when known, the ultimate customer (user)

3.5 Test schedules

3.5.1 A test sequence shall consist of all tests listed in the detail specification

The reference numbers of the tests are those of CECC 16000 Generic Specification: ElectromechanicalAll-or-nothing Relays, except those described in detail in the detail specification

3.5.2 The IL-notation applies for all tests in one Sub-Group A corresponding range of values of AQL is given, including a centre value which is underlined, and the and the authority preparing detail

specifications shall choose the appropriate value which then applies to all tests in one Sub-Group

3.5.3 All tests in Sub-Group A0 shall normally be performed on every relay However, if for some reason there is a need to check by auditing the outcome of the 100 % test or in special cases of mass production, it

is advisable to check the lot on a statistical basis For this purpose, an IL value and an AQL range are given

in Table 1

3.5.4 Any IL- and AQL-notations shall be interpreted such that the number of defectives allowable for acceptance is applicable to each test within a Sub-Group separately, i.e., no accumulated AQLs are to be stated

3.6 Order of tests

3.6.1 Quality conformance inspection is divided into two parts: that carried out lot-by-lot, on which the release of the individual lots is based, and that carried out on a periodic basis which contains the

time-consuming and more expensive tests

Following § 8.2 of CECC 00107, Groups A and B contain lot-by-lot tests, while periodic and further tests required for the maintenance of qualification approval are contained in Group C

3.6.2 When several tests are subsequently to be carried out on any one specimen or number of specimens, the following order shall apply, unless otherwise prescribed in the detail specification

— Tests of Sub-Group A0 shall always precede any other non-destructive (ND) or destructive (D) tests

— The remaining ND tests may be conducted in any suitable order, provided that the effects of earlier tests are not liable to invalidate the results of the later tests

Quality Level for which Pa = 10 %

AQL -

BS CECC 16100:1980

— Destructive (D) tests may be preceded by one or more ND tests, provided that the effects of the ND tests are not liable to invalidate the results of the D test

Section 4 Writing of blank detail and detail specifications

4.1 Blank detail specifications shall conform with the test schedules given in Table 1 of this specification and the related explanations

Detail specifications shall follow the blank detail specifications as far as tests in the latter are marked by M (mandatory) Tests marked by R (recommended) may be included in the detail specifications Other tests contained in CECC 16000 and any other tests not listed there but considered necessary, may be included but care shall then be taken to check whether the IL- and AQL- notations are still reasonable, and that the final measurements for each test in a Group are correctly listed at the end of that Group

NOTE Although some tests are marked by R in the blank detail specification if included in the detail specification, they are then mandatory.

4.2 Blank detail specifications shall call for, and detail specifications shall include, the following

information:

1) Identification of the detail specification

2) Identification of the relay and information on its applications

Identification shall be provided by such properties as size, sealing, whether monostable or bistable, polarised or not, or as otherwise required for identification

3) Outline drawing of the relay and key dimensions Variants, such as for terminations, may be given in

an Appendix to the detail specification

4) Reference data of the relay

A limited number of values is required on the front page, so as to describe the overall performance of the relay Full information in conformance with IEC-Publication 255-1-00 shall be added on one of the subsequent pages, and accordance with IEC 255-1-00 implies that rated values should preferably be those listed therein Where tests are referred to rated values, they shall be indicated with each test Where tests are to be performed at other than rated values, the test values shall be indicated and clearly distinguished from the rated values

5) Related documents

Reference shall be made to CECC 16000 and this sectional specification When reference to further documents is necessary, such documents shall be listed with their full titles, year of edition and, unless common knowledge, the source from which they can be obtained

6) Level of assessment

Table 1 of this specification contains three test schedules They shall be referenced as test schedule X (number 1, 2 or 3) without additions, if containing only tests listed in that schedule, or as test

schedule X with additions, if tests have been added which are not listed in the test schedule

7) Intervals between tests

8) Formation of inspection lots, if predictable in the sense of 3.4

9) Order of tests, if deviating from 3.6

10) General test conditions, if deviating from 5.5 of CECC 16000

11) Qualification approval test schedule

12) Quality conformance test schedule For 11) and 12):

For each group of tests, the final measurements specified in each of them shall be summed up and be stated at the end of the Sub-Group

13) Specification of IL-numbers

14) Specification of AQL-numbers

15) Marking of package and/or relays beyond that listed in this specification, if necessary

Each of the above items shall be taken into consideration during the testing of the relays covered by the detail specification

4.3 Additional information, such as diagrams and graphs, may be given in an Appendix of the detail specification Such information should not be used for test purposes