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As a result the D/A converter becomes one of the bottlenecks in system performance.The Current Steering Digital to Analog Converter CS DAC offers the possibility forsuch wideband high dy

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WIDE-BANDWIDTH HIGH DYNAMIC RANGE D/A CONVERTERS

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THE INTERNATIONAL SERIES IN ENGINEERING AND COMPUTER

SCIENCE

ANALOG CIRCUITS AND SIGNAL PROCESSING

Consulting Editor: Mohammed Ismail Ohio State University

HIGH-SPEED PHOTODIODES IN STANDARD CMOS TECHNOLOGY

Radovanovic, Sasa, Annema, Anne-Johan, Nauta, Bram

Vol 869, ISBN: 0-387-28591-1

LOW-POWER LOW-VOLTAGE SIGMA-DELTA MODULATORS IN NANOMETER CMOS

Yao, Libin, Steyaert, Michiel, Sansen, Willy

DYNAMIC CHARACTERISATION OF ANALOGUE-TO-DIGITAL CONVERTERS

Dallet, Dominique; Machado da Silva, José (Eds.)

Vol 860, ISBN: 0-387-25902-3

ANALOG DESIGN ESSENTIALS

Sansen, Willy

Vol 859, ISBN: 0-387-25746-2

DESIGN OF WIRELESS AUTONOMOUS DATALOGGER IC'S

Claes and Sansen

Vol 854, ISBN: 1-4020-3208-0

MATCHING PROPERTIES OF DEEP SUB-MICRON MOS TRANSISTORS

Croon, Sansen, Maes

Vol 851, ISBN: 0-387-24314-3

LNA-ESD CO-DESIGN FOR FULLY INTEGRATED CMOS WIRELESS RECEIVERS

Leroux and Steyaert

CMOS PLL SYNTHESIZERS: ANALYSIS AND DESIGN

Shu, Keliu, Sánchez-Sinencio, Edgar

Vol 783, ISBN: 0-387-23668-6

SYSTEMATIC DESIGN OF SIGMA-DELTA ANALOG-TO-DIGITAL CONVERTERS

Bajdechi and Huijsing

Vol 768, ISBN: 1-4020-7945-1

OPERATIONAL AMPLIFIER SPEED AND ACCURACY IMPROVEMENT

Ivanov and Filanovsky

DESIGN AND ANALYSIS OF HIGH EFFICIENCY LINE DRIVERS FOR Xdsl

Piessens and Steyaert

Vol 759, ISBN: 1-4020-7727-0

LOW POWER ANALOG CMOS FOR CARDIAC PACEMAKERS

Silveira and Flandre

Vol 758, ISBN: 1-4020-7719-X

MIXED-SIGNAL LAYOUT GENERATION CONCEPTS

Lin, van Roermund, Leenaerts

Vol 751, ISBN: 1-4020-7598-7

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WIDE-BANDWIDTH HIGH DYNAMIC RANGE D/A

Arthur van Roermund

Eindhoven University of Technology, Eindhoven, The Netherlands

and

Domine Leenaerts

Philips Research Laboratories, Eindhoven, The Netherlands

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A C.I.P Catalogue record for this book is available from the Library of Congress.

www.springer.com

Printed on acid-free paper

All Rights Reserved

© 2006 Springer

No part of this work may be reproduced, stored in a retrieval system, or transmitted

in any form or by any means, electronic, mechanical, photocopying, microfilming, recording

or otherwise, without written permission from the Publisher, with the exception

of any material supplied specifically for the purpose of being entered

and executed on a computer system, for exclusive use by the purchaser of the work

Printed in the Netherlands

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Glossary

Abbreviations

Preface

ix

1 Digital to Analog conversion concepts 1

1.1 Functional aspects 1

1.1.1 Definition of the D/A function 1

1.1.2 Functional specifications 3

1.2 Algorithmic aspects 8

1.3 Signal processing aspects 11

1.3.1 Waveforms and Line coding 11

1.3.2 Signal Modulation concepts 13

1.4 Circuit aspects 13

1.4.1 Architecture terminology 14

1.4.2 Resistive voltage division architectures 15

1.4.3 Capacitive voltage and charge division architectures 16

1.4.4 Current division based architectures 18

1.5 Conclusions 18

2 Framework for Analysis and Synthesis of DACs 19 2.1 Overview 19

2.2 Framework description 21

2.2.1 Analysis 21

2.2.2 Synthesis 24

xiii xv

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3.1 Basic circuit 25

3.1.1 Partitioning and segmentation 26

3.1.2 Current switching network and current sources 29

3.1.3 Clock-data synchronization circuit 29

3.1.4 Auxiliary circuits 30

3.2 Implementations and technology impact 30

4 Dynamic limitations of Current Steering DACs 35 4.1 State of the art in dynamic linearity 35

4.2 Dynamic limitations of current steering DACs 40

4.2.1 Matching and relative amplitude precision 41

4.2.2 Matching and relative timing precision 42

4.3 Conclusions 44

5 Current Steering DAC circuit error analysis 45 5.1 Amplitude domain errors 45

5.1.1 Relative amplitude inaccuracies 45

5.1.2 Output resistance modulation 47

5.2 Time domain errors 48

5.2.1 Nonlinear settling and output impedance modulation 48

5.2.2 Asymmetrical switching 51

5.2.3 Modulation of switching behavior 53

5.2.4 Charge feedthrough and injection 54

5.2.5 Relative timing inaccuracies 56

5.2.6 Power supply bounce and substrate noise 59

5.2.7 Clock (timing) jitter 63

5.3 Conclusions 66

6 High-level modeling of Current Steering DACs 67 6.1 System modeling 67

6.1.1 System layers 68

6.1.2 System excitations and responses 69

6.1.3 System parameters 69

6.1.4 Subsystem interaction 71

6.1.5 System modulation 72

6.2 Error properties and classification 72

6.2.1 Error properties 73

6.2.2 Error classification 77

6.3 Functional error generation mechanisms 79

6.3.1 Definitions 79

6.3.2 Algorithmic modeling 80

6.3.3 Functional modeling 82

6.3.4 Examples 85 vi

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6.4 Conclusions 88

7 Functional modeling of timing errors 89 7.1 Non-uniform timing 89

7.1.1 The Equivalent Timing error of a transition 89

7.1.2 Non-uniform timing in the process of signal sampling 91

7.1.3 Non-uniform timing in the process of signal creation 92

7.2 Stochastic non-uniform timing analysis 95

7.2.1 Correlated non-uniform timing 95

7.2.2 White non-uniform timing 97

7.2.3 RZ and NRZ waveforms 100

7.3 Deterministic non-uniform timing 103

7.3.1 Non-linear mapping of time domains 103

7.3.2 Non-uniform timing in signal creation 105

7.4 Conclusions 106

8 Functional analysis of local timing errors 109 8.1 Local timing error analysis 109

8.1.1 Equivalent timing error calculation 109

8.1.2 Signal error calculation 113

8.2 High level architectural parameter tradeoffs: segmentation 116

8.3 Conclusions 118

9 Circuit analysis of local timing errors 119 9.1 Circuit analysis with linear models 119

9.1.1 Circuit behavioral-level analysis of timing errors in a chain 120

9.1.2 Transistor level analysis 126

9.2 Local timing error tradeoffs 135

9.2.1 Switch timing errors 135

9.2.2 Latch timing errors 137

9.3 Conclusions 137

10 Synthesis concepts for CS DACs 139 10.1 Information management in the CS DAC 139

10.1.1 The basic current steering DAC hardware 141

10.1.2 Information sources 141

10.1.3 Optional hardware: detection and control operations 142

10.1.4 Algorithms 143

10.1.5 Space/Time error mapping and processing 145

10.2 Synthesis Policy 146

10.3 A-posteriori error correction methods 148

10.3.1 Calibration in amplitude and time domain 148

10.3.2 Generalized mapping 151

10.3.3 Applications of generalized mapping 155

vii

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10.3.4 Realization issues of the generalized mapping concept 156

10.4 Conclusions 157

11 Design of a 12 bit 500 Msample/s DAC 159 11.1 Design approach 159

11.2 Architecture 160

11.2.1 Signaling and circuit logic 160

11.2.2 Power supply and biasing 161

11.2.3 Thermometer/binary bits partitioning 162

11.3 Switched-Current cell 11.3.1 Current source 11.3.2 Switch 11.4 Decoder, data synchronization and conditioning 174

11.4.1 11.4.2 Delay equalization

11.4.3 Master-slave latches and drivers 11.4.4 Clock buffer 177

11.5 Layout 178

11.6 Experimental results 180

11.6.1 DC linearity measurements 180

11.6.2 AC linearity measurements 181

11.7 Conclusions 184

References 185 A Output spectrum for timing errors 199 A.1 Power spectrum of y (t) for random timing errors 199

A.2 Spectrum of y (t) for deterministic timing errors 202

B Literature data 203 viii 164

164

170

175

Binary-to-Thermometer decoder 174

175

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Aβ current factor mismatch process parameter

A D gain of a driver

A V th threshold mismatch process parameter mVµm

B1 lower frequency limit of a bandpass signal Hz

B2 higher frequency limit of a bandpass signal Hz

c n −m (t n ,t m) joint probability density function of timing errors

C k −l ( f k , f l) characteristic function for timing errorsµm

C q ( f ,− f ) characteristic function for correlated stationary timing errors

|C( f )|2 characteristics function for uncorrelated stationary timing errors

C u capacitance difference between switched on and off phases of a

switched current source

F

C on output capacitance of a switched-on current source F

C o f f output capacitance of a switched-off current source F

C CD output capacitance of the clock driver F

C D self output load capacitance of the driver F

C G gate capacitance of the current switches F

C int interconnect capacitance between driver and current switches F

C Int clock interconnect network capacitance F

C ov MOS overlap capacitance per unit width F m −1

δ(t) delta pulse

I k unit error of the k-th current source A

t timing error created by a circuit (accompanied by a subscript) sec

d i (m) thermometer bit i as a function of discrete time index m

D (m) DAC binary input word at time index m

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E {} expectation with respect to the probability density function

(PDF) of the function under consideration

h (t) arbitrary interpolation pulse

|H( f )|2 energy spectral density of an arbitrary pulse h (t) Hz −2

I norm (w) normalized current amplitude as a function of w A

I u current generated by a switched current cell A

J p (x) Bessel function of the first kind

K number of bands

λ frequency normalized over f s

m discrete time index

µi local timing error of each circuit element i sec

µm timing errors as a function of the time index m sec

N number of bits

N B bits remaining in binary code

N T bits decoded in thermometer code

p r (t) rectangular pulse

p (t) sinc interpolation pulse

P total signal power including signal and noise W

P max power of the largest spurious component in the band of interest W

R y (t,t +τ) probabilistic autocorrelation of the CT process y (t) V2or A2

ˆ

R y(τ) empirical autocorrelation of the CT process y (t) V2or A2

R z (m,m + q) probabilistic autocorrelation of the DT process z (m) V2or A2

ˆ

R y (τ) averaged probabilistic autocorrelation V2or A2

E { ˆR y)} mean of the empirical autocorrelation V2or A2

ˆ

S y ( f ) averaged probabilistic power spectrum of the CT process y (t) W Hz −1

E { ˆS y ( f )} mean of the empirical power spectrum of the CT process y (t) W Hz −1

x

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S0 amplitude of the power spectral density W

S zDT(λ) power spectral density of z (m) W normalized Hz

S z (t) first derivative of z (t)(instantaneous slope) V sec −1

τ time constant (accompanied with subscripts) sec

τ(w) DAC output node time constant as a function of w sec

τu DAC output node time constant increment per each step of w sec

T E (w1 ,w2) equivalent timing error for the transistion w1→ w2 sec

V swi voltage swing

w (m) integer value of D (m)

xi

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ADC Analog-to-Digital Converter

BJT Bipolar Junction Transinstor

CMOS Complementary Metal Oxide Semiconductor

DAC Digital-to-Analog Converter

DNL Differential Non Linearity

DT/CT Discrete Time to Continous Time conversion

HD2,HD3 Second and third order harmonic distortion

PPM Pulse Position Modulation

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Abbre viations

SDR Signal to Distortion Ratio

SFDR Spurious Free Dynamic Range

SNDR Signal to Noise and Distortio Ratio

THD Total Harmonic Distortion

xiv

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HIGH-SPEED Digital to Analog (D/A) converters are essential components in

digi-tal communication systems providing the necessary conversion of signals encodinginformation in bits to signals encoding information in their amplitude vs time domaincharacteristics In general, they are parts of a larger system, the interface, which con-sists of several signal conditioning circuits Dependent on where the converter is locatedwithin the chain of circuits in the interface, signal processing operations are partitioned inthose realized with digital techniques, and those with analog

The rapid evolution of CMOS technology has established implicit and explicite trendsrelated to the interface, and in particular to the D/A converter The implicit relationshipcomes via the growth of digital systems First, it is a global trend with respect to allinterface circuits that increasing operating frequencies of digital systems place a similardemand for the interface circuits The second trend takes place locally within the inter-face Initially, the D/A converter was placed at the beginning of the interface chain, and allsignal conditioning was implemented in the analog domain after the D/A conversion Theincreasing flexibility and robustness of digital signal processing shifted the D/A convertercloser to the end point of the chain where the demands for high quality high frequencyoperation are very high Third, there is a gradual change in the signal properties and spec-ifications, which reflect to the rapid widening of application range, to user requirements,and of course to environmental constraints relevant to the application Explicit trends areestablished by the direct impact of physical constrains of the technology on converters.One of them concerns how information is distributed in the amplitude and time domains.Modern CMOS technologies allow less and less room to use the amplitude domain due todecreasing power supply levels but not decreasing noise and interference levels Instead,they offer plenty of room in the time domain

Wideband high dynamic range D/A converters are carriers of these trends and enablers

of modern multi-carrier communication applications These converters are required toprocess multiple signals over large frequency ranges of hundreds of mega hertz with high

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linearity and low noise levels To further simplify the subsequent lowpass filtering and toallow efficient implementation of pre-distortion techniques for high data rate communi-cations sampling rates multiple times higher than the actual transmitted signal bandwidthare required However, the demands placed by these trends can not be straightforwardlymapped to physical realization despite the potential offerings of modern technologies As

a result the D/A converter becomes one of the bottlenecks in system performance.The Current Steering Digital to Analog Converter (CS DAC) offers the possibility forsuch wideband high dynamic range signal conversion However, its potential to achievehigh speed is limited by the fact that it exhibits strong nonlinear behavior at high fre-quencies, which is unwanted This nonlinear behavior, especially at high frequencies, isdominated by mechanisms that can not be described as amplitude domain transfer func-tions between input and output signals, like for example the case of the nonlinear behavior

of an operational amplifier This nonlinear behavior is neither easy to understood, nor tocope with It stems mainly from the way circuit imperfections affect the inherently nonlin-ear transient behavior of the signals the D/A converter generates The appearance of suchbehavior reveals that there is limited knowledge about the CS DAC nonlinear behavior athigh frequencies As a result, there is a corresponding difficulty to bring a relationshipbetween signals, user information, application aspects, internal aspects of the converter,environmental aspects, etc in a generic form that would allow maximum exploitation ofwhat modern technologies offer The lack of knowledge brings up an ambiguity element

in the CS DAC design phase that impedes performance progress

This book provides a structured and comprehensive description of the nonlinear havior of the CS DAC and of ways to deal with it In order to achieve this an analysisand synthesis framework of concepts will be built with a generic scope beyond this par-ticular architecture, and then the proposed concepts will be applied in practice with an ICimplementation The book consists of an introductory part about DACs (Chapters 1-2),

be-a modeling be-and be-anbe-alysis pbe-art for Current Steering Digitbe-al to Anbe-alog Converters (chbe-apters3-9) and a synthesis part (Chapters 10 and 11) Chapters 1 and 2 deal with the generalaspects of D/A converters, and those of the framework of analysis and synthesis that will

be developed

Chapters 3-6 concern CS DACs In Chapter 3 architectural and circuit aspects of CSDACs are discussed In Chapter 4, the current state of the art is examined which helps toformulate the characteristics of knowledge that needs to be developed about the behavior

of this circuit In Chapter 5 circuit error mechanisms due to hardware imperfections areanalyzed, emphasizing those that limit high frequency performance This chapter reviewsand extends further existing knowledge about these error mechanisms Chapter 6 dealswith high level DAC modeling The signal errors are mapped to principle causes withinthe physical hierarchy of the DAC and they are categorized to classes according to theirprinciple characteristics with amplitude, time, spatial domains, and other properties.Chapters 7-9 deal specifically with the class of timing errors which is the most signif-icant one for high frequencies Chapter 7 addresses functional modeling issues of timingerrors, and shows that they can be described with Pulse Position and Pulse Width Modu-lation in the DAC signal creation process This unifies all the errors of this class under onexvi

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Pref ace

common modulation mechanism, each error being a specific subcase of this mechanismthat is determined by its other error properties In chapter 8 the developed models are ap-plied to spatially local timing errors (timing skew between individual current transients)which is one of the most important but least understood high frequency error mechanisms

In chapter 9 these errors are analyzed in circuit details, moving from the functional pects to circuit and transistor level ones All analysis results are then combined to revealinteresting design tradeoffs

as-Chapters 10 and 11 deal with DAC synthesis A generic view of DAC synthesis is sented in chapter 10 The information available about a CS DAC is classified according toits type (e.g information about signals, errors, application, user, etc.) and properties Ofparticular importance is the definition of a-priori information, which is information aboutthe DAC known at the design phase, and a-posteriori information obtained only after chipimplementation It is explained that current DACs use only a-priori information to dealwith the dominant high-frequency error mechanisms The use of a-posteriori informationcan provide a next step in DAC performance and efficiency Two methods that can dealwith local timing errors are discussed

pre-Chapter 11 presents the design of a concept driven 12 bit 500 Msample/s DAC IC

in a CMOS 0.18µm process that achieves exceptionally high performance at low power

consumption and occupying small area The DAC is optimized using only a-priori mation about error generation mechanisms to investigate the limits of this approach

infor-xvii

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Digital to Analog conversion concepts

FUNCTIONAL , algorithmic, signal processing, and circuit aspects of a Digital to

Analog (D/A) converter will be briefly reviewed in this chapter Definitions withrespect to these aspects and D/A converters architectures will be given

1.1 Functional aspects

The term Digital to Analog (D/A) conversion describes the conversion of a signal thatrepresents data in Digital format to a signal that represents data in Analog format Thisdescription excludes the electrical nature of conversion, and refers basically to how infor-mation is represented, i.e in digital or in analog form When one speaks of an electronicDigital to Analog converter there are additional conversions that take place

An electronic linear D/A converter is an electronic circuit that accepts at its input aset of electrical signals, that represent a digital numeric code, and yields at its output ananalog electrical signal, i.e in proportion to a reference electrical quantity as the inputnumeric code is to the full range of possible codes A full list of the electronic character-istics that the ideal electronic D/A converter must satisfy are described in [1] It is indeedtempting to reduce the definition of the D/A converter to a statement similar to “the con-version of an input code word to an output electric quantity”, neglecting completely theelectrical waveform characteristics of the input signal Because information in the inputelectrical signal is defined very accurately with the use of only two digits, the input elec-trical signals can be abstracted to generic signals described by a sequence of values; itbecomes identical to speak of abstract signals with zero’s and one’s or of continuous time

1

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2 Chapter 1 Digital to Analog conversion concepts

(CT) electrical signals that use specific voltage levels to represent logic levels Since theelectrical nature of the input signal can be neglected the only relevant “time” issue is thesequence of the input samples

On the basis of this reduction an N bit linear D/A converter is the electronic system that represents an N bit binary word D = D1D2 D Nat its input with an electrical quantity

at its output (usually voltage or current) that has amplitude or time domain characteristicsthat are modulated in proportion to the value of the code word and to a reference quantity

to integer

CT

Pulseh(t)

s(t)

Ts

D(m)

Cw(m)

amplitude and time references

Waveform shaping Electrical signal creation

Code conversion

Figure 1.1 D/A conversion in the amplitude domain

A functional diagram of the D/A conversion when the information is placed in theamplitude domain is given in fig 1.1 The generic input signal is represented by the

sequence of code words D (m) In the first stage of the diagram, the words D(m) are converted into the integer values w (m) The second stage represents the creation of the

electrical signal that possesses physical dimensions This is realized using amplitudeand time references A multiplication assigns the amplitude dimensions to the abstractsignal The Discrete-to-Continuous time conversion (DT/CT) assigns the time domainproperties to the signal The last sub-function of the D/A function is the shaping (filtering)

of the generated electrical signal to obtain the predetermined shape (e.g interpolation).The result of the three sub-functions is an electrical signal consisting of pulses that are

amplitude modulated by the integer equivalent w (m) of the binary words D(m).

Where exactly the time domain conversion takes place does not imply any physicalnecessity, rather it represents the subjectiveness of the model Physically, time domain

exists in D (m) and can not be separated from it From a modeling perspective, such a

dis-tinction defines at which point time domain issues are important at the realized hardwareand can not be neglected any more For example, if a Track and Hold (T/H) circuit is used

at the output to re-sample the signal and clean it from artifacts that appear at the switchingtransients, the time domain assignment takes place there It should be mentioned that the

term DT is misleading, because it implies that time is involved in the signal D (m); this is not true since the only relevant issue in D (m) is the sequence (the order) of the values.

The D/A conversion function with information encapsulated in the time domain of anelectrical signal is given in fig 1.2 and can be explained in a similar manner In summary,the function of an ideal electronic D/A converter consists of:

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1.1 Functional aspects 3

 code conversion in the abstract amplitude domain.

 conversion from the abstract to the electrical signal domain It consists of amplitude

and time domain signal creation with the use of references (e,g, voltage, current)

 Electrical signal shaping (filtering) in which the electrical signal takes a mined pulse shape modulated by the integer value w.

predeter-Electrical signal creation Code conversion

binary

to integer

w(m) D(m)

PWM

time and amplitude references

s(t)

C Ts

Figure 1.2 D/A conversion in the time domain

In this description of a D/A converter with figures 1.1 and 1.2 there is no coupling ofthe types of sub-operations and no transparency on the way of implementing each ofthem In practice, all three sub-functions come together every time a specific algorithm isinstantiated to realize the D/A function The D/A converter that performs the 1-1 mapping

of an input code to an output electrical signal as defined by the previously mentioned

operations will be referred to as a D/A converter core, or simply a DAC core.

A real D/A converter is subject to many physical imperfections that introduce limitations

to its functionality The DAC is designed such that it complies with a set of functionalspecifications, which can be embraced under the term “signal quality” within a well de-fined area of electrical and environmental conditions Specifications include

 Functional specifications that express whether the signal quality offered by the

hardware complies to a prespecified range Resolution, absolute accuracy, version rate, dynamic range are typical examples

con- Physical specifications that describe the physical resources required (area, power

etc) for the hardware to deliver a prespecified signal quality

 Environmental specifications that describe the conditions under which the hardware

can operate with a predetermined signal quality Temperature is a typical example.Hardware quality depends on the factors considered relevant for a given application Of-ten, figures of merit are defined to capture a combination of functional and physical spec-ifications (e.g energy per conversion per frequency for a specific accuracy) Functionalspecifications for DAC’s are described in more detail in the following

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Signal quality receives proper meaning by defining how information is embodied inthe characteristics of the electrical signal, and how these are affected by physical imper-fections In an ADC (see fig 1.3) all errors due to physical imperfections are embodied

ADC

Problems are distributed in the amplitude and time domains

All problems are embodied

in the amplitude domain (codewords)

Output

DAC00111

Figure 1.3 Dynamic problems affecting amplitude and time domains of

DAC/ADC output signals

in the amplitude domain of the output signal (the codewords) In a DAC the output nal consists of a series of pulses Therefore, errors related to limitations in the dynamicresponse of the DAC are embodied in the characteristics of pulse to pulse transitions (fig.1.3) These dynamic phenomena decay substantially at the end of the sampling periodand the settled (DC) value of the converter can be determined Therefore, the impact ofphysical problems in the functional behavior of the DAC is distributed in both amplitudeand time domains at the output signal and each problem can be mapped to a specific de-formation of the ideally expected waveform (overshoot, delay, settling, etc.); in contrast,

sig-in an ADC everythsig-ing ends to amplitude domasig-in errors Consequently, the revelant issuefor DAC’s is which output waveform characteristics are relevant for a given application

A major distinction is between static and dynamic performance evaluation This refers

to the use of time invariant, or variant input signals (e.g sinusoids), respectively The ter result in dynamics of transients that dominate the performance One way of assessingdynamic performance is based on the time domain response of the DAC for a full scalepulse as input (fig 1.4) This method relies on evaluation of waveform characteristicssuch as the time it takes for the output signal to settle within a specified value (e.g LSB).Other criteria include the rise/fall times, or the glitch magnitude compared to an LSBvalue Evaluating time domain electrical characteristics was exercised until the beginning

lat-of the 90’s.1The shift of interest to the spectral properties of signals was essentially a shift

from characterizing hardware at a higher layer, following the trends of digital processingsystems evolution toward larger signal processing systems

Sinusoidal signals are the most widely adopted type of signals used for performanceevaluation When processing sinusoids, any waveform deformation that generates (non)harmonic distortion is relevant to performance Before giving the figures of merit thatdescribe linearity it is insightful to give a brief description of the concept of linearity

1 Static and dynamic performance terminology for ADCs and DACs is given in [2], expressing the methods

to characterize functional performance (see also [3] for static and dynamic test methods of these times).

Chapter 1 Digital to Analog conversion concepts

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1.1 Functional aspects 5

LSB

LSB settles to 1 LSB error

LSB

Settling time

overshoot and glitches < LSB

Figure 1.4 Full scale transition: (a) settling time and (b) amplitude based

eval-uation of dynamic performance

Nonlinear distortion is the distortion caused by a deviation from a linear relationshipbetween specified input and output parameters of a system or component For the DAC,nonlinear distortion refers to its input-output functional relationship Yet, further specifi-cation is required to define which particular aspects of this relationship are relevant.The DAC realizes a transfer function between its input and output signal amplitudes

For an ideal DAC this linear function can be described as s· w, whereα is a gain

factor while s and w have their usual meaning Time domain effects are not included here;

it simply defines the output settled, or DC, signal value that corresponds to an input value

In practice, the transfer function is not linear and shows deviations It can be modeled as

-th order polynomial s=α1w+α2w2+α3w3+ ανwν The degree of deviation from

the ideal transfer function determines the accuracy of the converter Because only staticsignals are assumed, it can be called static nonlinearity Neglecting the inherent dynamics

of the DAC but using a time-variant signal, a nonlinear error is generated at the outputthat changes over time The only dynamic phenomenon here relates to the signal

In reality time-variant signals are processed by a DAC that in addition involves certaindynamic behavior For a input sample to sample transition, an output signal transient iscomposed The nonlinear errors in these case extend to the nonlinear relationship betweenthe output signal transients, which are different for different input sample transitions.Errors generated in this way are also dynamic nonlinear errors, but dynamic applies nowboth to the signal and the inherent dynamics of the DAC In practice, the DAC dynamics

are dominant as frequencies increase beyond a few MHz.

Number of bits

The number of bits N of the DAC represents the relative accuracy with which a full scale

electrical signal range can be represented in discrete steps Observe that in a DAC tization noise or distortion is not a relevant issue since by nature of the DAC function itdoes not introduce quantization

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Differential and Integral Non-Linearity

For static performance characterization, Integral-Non-Linearity (INL) and the Non-Linearity (DNL) figures are used DNL expresses the output difference between twoadjacent codes compared to the LSB step∆ The INL expresses output amplitude devi-ations from ideal values for a selected input codeword The ideal output values fall in aline that is corrected for gain and offset errors The DNL and INL at an input step k aredefined in [4] by

Differential-DNL k=A k − A k −1

a ·INL k= A k

where∆is the LSB step and a is the input value corrected for offset and gain error.

The worst case DNL and INL are given by

DNL= maxk ∈1 N {|DNL k |}, INL = max k ∈1 N {|INL k |}, (1.2)

where P S is the signal power and P N is the noise power in the band of interest

The SNR is not a linearity figure in the strict sense Whether or not it may be used in alinearity context is a modeling issue For example, amplitude quantization is a non-lineareffect that is expressed as a transfer function [5] and for sinusoidal signals it generatesharmonic distortion that can be calculated However, it is often approximated as noise(see [6] for an overview of the conditions) Other effects can be considered noisy as well

Dynamic range

In a system or device dynamic range is the ratio of a specified maximum level of a rameter, such as power, current, voltage, or frequency to the minimum detectable value ofthat parameter The dynamic range is usually expressed in dB In a transmission system,dynamic range is the ratio of the overload level, i.e., the maximum signal power that thesystem can tolerate without distortion of the signal, to the noise level of the system Used

pa-in the context of digital systems, it defpa-ines the ratio of maximum and mpa-inimum signallevels required to maintain a specified bit error ratio

Total Harmonic Distortion and Signal to Distortion ratio

The total harmonic distortion (THD) is the ratio of the total harmonic distortion powerand the power of the fundamental in a certain frequency band, i.e

T HD = 10 · log10∑∞ k=2P k

Chapter 1 Digital to Analog conversion concepts

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1.1 Functional aspects 7

where P k is the power of the k-th harmonic, and P Sis the power of the signal The inverse

of the THD can be defined as the Signal to Distortion ratio (SDR)

SFDR

2f fundamental

frequency (Hz)

Figure 1.5 Spurious Free Dynamic Range (SFDR)

Signal-to-Noise and Distortion Ratio

The signal-to-noise-and-distortion ratio (SNDR) is the ratio between the power of thefundamental and the total noise and distortion power in a certain frequency band

SNDR = 10 · log10 P S

P N+∑∞ k=2P k

where P kis the power of the k-th harmonic

Spurious Free Dynamic Range

The spurious-free dynamic range (SFDR) is the ratio between the power of the signaland the power of the largest spurious (unwanted) tone within a certain frequency band, asshown in figure 1.5 SFDR is usually expressed in dB as

SFDR = 10 · log10 P S

where P S is the signal power and P maxis the power of the largest spurious component in theband of interest The SFDR is the same when one distortion component is very dominantwith respect to the other, and when all components are equal In the former case the SFDRapproximates the SDR, but in the latter SFDR and SDR are widely different

Bandwidth and conversion rate

All the previously given measures of linearity need always to be associated with a width in which they are evaluated, and a conversion rate The bandwidth of the DAC

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defines the frequency range in which the figures of merit are evaluated The maximumconversion rate of DAC defines the maximum rate of conversion of samples at which thefunctional specifications are within their specified range In literature, it is most oftenused to describe the maximum conversion rate at which the DAC still operates, meaningthat it still captures properly the digital input data This definition, however, does onlycharacterise the digital parts of the DAC and the limits of the technology used

Functional specifications for this book

The range of functional specifications that are relevant for this thesis are

 Resolution and accuracy 10 − 16 bits.

be realized with a wide variety of algorithms Each D/A conversion algorithm represents

a mapping of the D/A function to a specific combination of functional components andoperations that can realize the function The main components of a D/A algorithm are

1 Coding Coding describes all aspects related to how the assumed binary input

sym-bols will be converted in the end to integer symsym-bols at the output The weightingcan be binary, thermometer or any other code form which can be easily convertible

to an integer value

2 The reference quantity The (electric) reference of the signals being processed to

make the conversion

3 The electrical generation mechanism The electrical generation mechanism

de-scribes the physical mechanism that creates the signal It is distinguished in

(a) the Amplitude domain, where for example amplitude modulation (eg PAM)

describes the mechanism of signal shaping of the amplitude in proportion tothe input code,

(b) and in the Time domain, where PWM, PPM, etc modulation concepts

de-scribe the signal shaping of the time domain characteristic (duration, positionetc) in proportion to the input code

Chapter 1 Digital to Analog conversion concepts

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1 Partitioning: it defines how certain operations will be divided in sub-parts, each part

realized with different algorithmic concepts It also defines the number of steps andthe order with which the algorithmic concepts instantiated occur

2 Time Scheduling: it assigns relative time to the operations, ie the order in which

the operations are performed

Partitioning is a concept that can be applied hierarchically and recursively in a DAC Moredetails about it will be given in another chapter

Next, a specific form of partitioning used very often in the coding of the DAC will bedescribe in more details: segmentation The binary to decimal conversion is written as

with N C +N F = N This equation says that the output code is generated by the summation

of two terms, each one defined with different weighting factors and different bits of theinput code word The separation of the overall code conversion in two or more parts is

a partitioning of the code The part with the N C Most Significant Bits (MSB’s) is called

the coarse part, and the part with the N F Least Significant Bits (LSB’s) fine part Codeconversion in a segment requires a dedicated code conversion digital circuitry

In DAC terminology, segmentation is explicitly meant as partitioning of the binarycode in one part that remains binary coded, and another one that is decoded to a ther-mometer code [7], which is only one of the possibilities available If all binary words aretranslated to thermometer code then it is said that the converter is called fully segmented;and when only some bits become thermometer encoded, then the larger the number of thethermometer bits is, the larger the segmentation that the converter uses For example, for

a 10 bit DAC in [8] 80% segmentation means 8 thermometer and 2 binary bits This minology will not be used here Segmentation is a form of partitioning, consequently thelarger the segmentation should be interpreted as “the more the binary code is partitioned

ter-to more parts, or segments”, and not that number of bits per partition is increased

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2N−2 2N−3

C

encoder D

Figure 1.6 Parallel-bit algorithms: (a) combination of weighted units, (b)

se-lection of the correct value among all possible ones

Examples of algorithms

In fig 1.6(a) binary weighted (coding) summation is portrayed Unit replicas of thereference electrical quantity are provided by reference replication and scaling mecha-nisms Other types of algorithms which are not based on summation and combination ofweighted units exist as well In fig 1.6(b) another algorithm is shown, named parallel-select algorithm [1] The algorithm selects the proper output value among all 2N − 1

possible output values This means that all possible values must be available (task to

be accomplished by reference replication and scaling) A selection mechanism picks theright output value with the aid of an encoding mechanism

D0is the sign−bit for Di

D

1D

2 D

N i=1,2, ,ND=

i

Figure 1.7 Serial-bit algorithms: (a) conversion starts with LSB D N, (b)

con-version starts with MSB D1.

Chapter 1 Digital to Analog conversion concepts

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1.3 Signal processing aspects 11

Because in fig 1.6(a) the composition of the output word is made in parallel for allweighted units the algorithm is called parallel-bit The same applies for the algorithmdepicted in fig 1.6(b) Parallel-bit algorithms offer intrinsic advantages for high speedoperation because all sub-operations can be performed synchronously to each other.Another main category of algorithms are the serial-bit algorithms [1] The main char-acteristic of serial-bit converters is that they require a sequence of steps before they gener-ate the correct output value In each step a bit is resolved and the equivalent analog value

of this bit is added in the output After all bits are resolved the final value is availablefor use The type of coding used determines the number of steps For binary weighting

codes N steps are needed, whereas for a thermometer code the steps vary between zero

and 2N −1 A binary weighted serial-bit algorithm is described by the iterative procedure:

where m is the sample index, and i iterates from bit to bit A specific version of a serial

bit algorithm is the cyclic algorithm, which uses the same hardware iteratively for allsteps of the conversion Two examples of serial-bit algorithms are shown in fig 1.7 Inliterature, the term “algorithmic” converter is misleading because it is meant only for aspecific type of cyclic converters neglecting the fact that all converters are algorithmic bynature! For both algorithmic-architectures shown in fig 1.7 the code conversion is based

on summation of binary weighted units, hence it is finalized after N steps Therefore,

although both are serial, there are differences on how they are realized

Most of the concepts mentioned can be instantiated recursively An example can

be found in [9], where the partitioning concepts are applied in the amplitude and timedomains, in the coding, in a serial-bit formation In particular, an amplitude domain D/Aconverter of 15 bits is partitioned in three parts (5− 5 − 5, i.e coarse, fine, finest) The

three partitions are cascaded in series, which means that the conversion is divided in threesequential steps Each part is individually realized using thermometer coding and realizedagain in a serial-bit manner Several other algorithmic concepts may be added next to theparallel and serial concepts: for example, converters based on counters, on duty cycles,interpolation between previous and next values, etc

1.3 Signal processing aspects

Sampling and interpolation theory is the theoretical framework under which A/D andD/A conversion is placed when it comes to input-output signal relationships The D/Afunction represents the reconstruction process of a sampled signal, however, if seen inview of generic discrete time signals it can be defined as a signal generation process Twosignal processing aspects of this process are discussed in this section

In communication terminology Binary Line Coding [10] represents how a series of bitdata are formatted physically in an electrical signal which is passed on to a physical

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(m+2)Ts(m+1)Ts

s(t)

Figure 1.8 DT/CT conversion and RZ interpolation of samples in a DAC

channel These formats are called line codes Line codes are distinguished in two major

categories: Return-to-Zero (RZ) and Non-Return-to-Zero (NRZ) Given a bit interval T s,

a RZ waveform returns to zero volts (for a voltage waveform) for a portion of the bitinterval, whereas the NRZ stays constant Line codes may be further classified according

to the voltage levels that represent the binary data Examples include Unipolar signaling,Polar signaling, Bipolar (Pseudoternary) signaling [10], etc

(m+2)Ts (m+1)Ts

s(t)

Figure 1.9 Interpolation of samples in D/A converter using NRZ pulses

The D/A converter output can show similar shape, and this is why the terms RZ andNRZ are used In the D/A output, the signal represents CT information, and the pulseshape determines the interpolation of the signal value between the sample moments

DT/CT conversion and RZ Interpolation of D/A input data w (m) is shown in fig 1.8.

If T0is the duration of each pulse, then the RZ pulses are described by

with zero initial conditions A graphical representation of this signal is given in fig 1.9

Chapter 1 Digital to Analog conversion concepts

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despite that the sequence of samples z (m) does not constitute any time varying signal as

the term DT implies Notice now how both NRZ and RZ waveforms from eq (1.10)and (1.10), respectively, can be mapped to the general description of eq (1.12) For

the RZ waveform, we let the interpolating pulse be h (t) = u(t) and the samples z(m) to represent the specific samples w (m) of the D/A input For the NRZ waveform, we assume that the signal w (m) is passed through a differentiator before it is interpolated, such that

z (m) =w (m) = w(m) − w(m − 1) Alternatively, one may consider z(m) = w(m) and replace h (t) by p(t), where p(t) is a pulse with a fixed duration of one sample period T s.Moving back to the digital bitstream, to create such a waveform a series of finite en-

ergy pulses h (t − mT s ) is amplitude modulated by the binary data z(m), which are either

logic one, or logic zero For the spectral content of such a pulse train as a function ofthe pulse type, the encoding of bit values, etc there is a plethora of results in telecom-munication theory textbooks that describe it when assumptions are made for the type and

content of signals z (m) (stochastic, deterministic, signals that represent specific digital

modulation schemes, etc.) and for the specific line coding [10] These results are placed

in the heart of the D/A area on the basis of the previously mentioned similarities, if one

modifies the meaning and properties of z (m) to the D/A input signal, and then links the

D/A output signal to the particular physical problems that appear in a physical realization

The D/A conversion algorithms that described so far refer to algorithms that implementthe DAC core function DAC cores can be used as well as parts of larger D/A convertersthat use signal modulation in the whole stream of data that carries information, instead ofusing the one to one mapping between an input and an output value

These D/A converters seize specific modulation concepts that convert informationfrom a given combination of amplitude and time domains to another combination, therebyoperating in both domains of a real signal simultaneously Σ∆modulation is maybe themost popular modulation concepts that belongs in this category

1.4 Circuit aspects

The architecture of the circuit hardware is the result of a one-to-many translation of analgorithm to hardware In this section we review some basic architectures that realize

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at high speed operation, therefore only parallel amplitude-domain DAC’s are considered.

An architecture can be further distinguished in three main circuit parts: (1) referencescaling and replication network; (2) code conversion network; (3) output network

Reference network

To realize waveforms that have characteristics proportional to the applied input codes, theamplitude range of the converter (amplitude and time references) should be discretizedsuch that all resolution defined values can be recovered either via reference division, orvia replications of the reference into scaled units and combinations of them according

to a code For an N bit linear converter with all information in the amplitude domain,

the reference scaling and replication circuit should provide 2N − 1 discrete unit levels.

Reference scaling in general (division or multiplication) is realized with a few basic circuitnetworks consisting of resistors, capacitors, voltage and current sources Most amplitudedomain scaling concepts exploit the charge conservation law

Code conversion

The code conversion domain is where the binary to integer conversion is realized Thetwo main implementations are (a) a selection network that selects the correct value thatcorresponds to the input binary code, among all possible codes that are available for se-lection, (b) a combinatorial network, which combines weighted quantities according to

a code or code combinations and generates the proper output value dependent on the put code The code conversion domain can be realized in the voltage, current, or chargedomain and usually grands the name of the converter

in-Output network

It is the role of the output network to make the necessary conversions and impedanceadaptations such that the DAC can drive efficiently external loads The most commonblocks required are voltage to voltage buffers for impedance adaptation, resistors, or in-tegrating amplifiers to convert charge packets or currents into voltage In practice, thesecircuits influence significantly the high speed potential of an architecture

Chapter 1 Digital to Analog conversion concepts

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1.4 Circuit aspects 15

A parallel resistive voltage division DAC is shown in fig 1.10 [1] It consists of threestages: the first is a resistive divider, the second is a network of switches, and the third is an

impedance adaptation buffer The reference voltage V re f of the voltage divider is divided

Figure 1.10 Resistor string DAC core circuit

in M= 2N steps using a network of identical resistors Because the number of resistors

scales with a power of N, for high resolution this architecture becomes impractical.

The main consideration for the ladder is to meet the requirements for INL and DNL,which are limited by process mismatch between resistors The ladder’s resistors are made

of polysilicon or of diffusion layers The physical reasons causing the values of identicallydesigned resistors to vary are geometrical variations, doping level variations, variations incontact resistances, etc The layout of the resistor ladderon silicon has a significant impact

on the magnitude of these problems The DC signal error for an input code is determined

by the accumulation of the individual resistor errors that contribute to the output value.When the individual errors are random, the law of the large numbers applies

The resistor value seen at each tap is important for the capability of the ladder todischarge large capacitive load at each tap Because the resistance varies from tap totap the speed of charging a capacitive load varies as well The transition time from asignal value to another is modulated by the input codeword value because this determineswhich tap is selected This result in significant signal distortion If the ladders are made

of diffused resistors, then the dependence of the resistance value on the thickness of thedepletion layer beneath the device which is a function of the voltage is important, becausethis voltage is a function of the rank of the resistor in the ladder, and varies from thereference voltage to the ground Also, the depletion layer capacitance across the ladder to

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the substrate can also impact the charging and discharging time constants of each tap.The network of switches is controlled via a decoder by the input bits For an inputcodeword the network selects one of the binary taps and provides resistive path from

that tap to the output node For an N bit DAC N switches appear in series between the

tap and the output nodes Consequently, a very large number of switches is required forhigh resolution Moreover, the switch devices introduce additional input signal dependentimpedance modulation [11] Finally, an output buffer is required by this DAC to driveproperly an output load This buffer is a major bottleneck in high speed

In literature several architectural modifications have been considered [4,7,11] In [12]

a modification called switched subdivider has been introduced, which reduces the number

of required devices to approximately 2N /2instead of 2N This technique is based on titioning the ladder in a coarse-fine configuration Drawbacks of the switched subdividerarchitecture have been alleviated with the double resistor string ladder (intermeshed lad-der) architecture [13] In [11] the combination of an intermeshed ladder [13] in a matrix

par-arrangement [14] proved the feasibility of 10 bits of resolution with 50 MHz conversion

rate, which is basically the highest reported for these type of converter In summary, themain limitations of this circuit architecture are: the accuracy of matching (random anddeterministic) between the resistors; the output buffer, which dominates the performance

at higher frequencies; the code-dependent output impedance; the switch network.Resistor string DACs proved capable and versatile for medium-high resolution andlow to moderate speed applications due to several inherent advantages (monotonicity,versatility, compactness of integration etc), but not equally succesful for high speeds

Capacitive voltage and charge division based DAC cores are realized with networks ofswitched capacitors based on charge re-distribution This concept has been adopted in[15] to create a voltage-division binary-weighted parallel-bit A/D converter, whereas in[16] it was used to construct a voltage-division cyclic DAC The binary-weighted DACfrom [15] is portrayed in fig 1.11(a)

The SC network consists of weighted capacitors An additional capacitor C is added such that for an N bit converter a total of 2 N C capacitance is present at the common ca-

pacitor terminal The capacitor array is discharged before each conversion via the switch

S d Then all capacitors except the additional resume the reference voltage at their

individ-ual terminals and precharge to V re f The additional capacitor C is held grounded A total charge Q = V re f C2 Nis deposited on the top plates When the conversion starts all capac-

itors resume ground, or V re f, dependent on their bits, while the additional capacitor is letfree The charge conservation law makes the stored charge in the top plate to re-distribute

forcing a voltage voltage at the top plate which is a fraction of V re faccording to the code.The accuracy of SC DACs is limited by capacitor matching [17,18] and shares similar-ities with that of resistors: for a fixed relative capacitance spread, the averaging principledetermines the impact on INL as a function of the number of elements of the converter In-herent matching of capacitors is practically limited around the level of 10 bits of accuracy.Additional non-linearity problems rise from the voltage and temperature dependency of

Chapter 1 Digital to Analog conversion concepts

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Figure 1.11 (a) SC DAC core circuit, (b)SC DAC using an integrating amplifier.

MOS integrated capacitors [17, 18] The dynamic performance of SC DACs based onparallel capacitor arrays is highly affected by the large capacitance connected in parallel

in the common node, and by the thermal noise considerations that dictate large capacitors.Notice that for all SC DACs a voltage buffer is required as well For charge division, thisbuffer is replaced by an integrator to convert the current delivering the charge packets intovoltage transients To drive resistive loads an additional Gm stage may be necessary Therequirements for such blocks limits substantially the maximum speed of operation for SCDACs SC DACs are realized today with differential circuit topologies

The architecture shown in fig 1.11(a) has received several modifications [4, 7, 9,19–23] In [24, 25] the binary capacitor array was partitioned in coarse-fine segmentsconnected by a capacitive divider (two-stage binary-weighted architecture [19, 26]) Inthis way, the LSB to MSB capacitor ratio’s was reduced significantly A combination ofcircuit and code level partitioning was applied in [27] using a coarse thermometer resistorpart and a fine binary capacitor part The transition from the voltage division to the chargedivision using the same capacitor array from fig 1.11(a) has been introduced in [19] (seefig 1.11(b)) A circuit modification called the Direct-Charge-Transfer (DCT) technique

is described in [22] Sequential bisection of charge has been initially applied in [20]and recently in [28] and [29] with 10 bits in a differential version reaching a sampling

rate of 400 Msample/s [29], and good dynamic performance for 300 Msample/s In

summary, SC DAC’s are limited by: matching accuracy of the capacitors; speed andlinearity limitations of the voltage buffer; large capacitance present in the node of the topplates of the capacitors; non-linear relation between a capacitor’s value and the voltage;on-linear behavior of the junction capacitance in MOS switches; thermal noise

SC DAC cores have been used successfully as parts of other architectures such as

“algorithmic” ADCs [30], pipeline [31], andΣ∆ADCs and DACs [22, 32] A wide plication range is covered with this technique, from low data rate very high-resolutionaudio DACs [22, 23, 33] to high-resolution medium-frequencies [32] for communicationapplications (e.g ADSL), SC DACs have been proven most suitable for high accuracyapplications (12− 16+ bits) and low to medium frequencies (1 kHz − 1 MHz).

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A parallel DAC based on current division is shown in fig 1.12 known as the currentsteering (CS) DAC It consists of a reference current replication network, a network thatcombines binary weighted currents to generate the output value and a current to voltageconverter The original version of this architecture was filed as a patent in 1955 [1] andgranted in 1963 This architecture has proven well its potential for high speeds becausethe current steering nature of the circuitry is inherently fast, and because the demandingoutput buffer can be replaced with a simple resistor

V out

I/V buffer

Current division network

Figure 1.12 Conceptual diagram of the binary CS DAC architecture

CS DAC’s are used for high speed and high resolution applications such as DirectDigital Synthesis, video applications, upstream cable transmission channels, etc DACs

with conversion rates in the range of hundreds of MHz have been available in non CMOS

processes for a long time already [34–38] Recently they appear in CMOS as well [8, 39,40] whereas resolution and accuracy of 10− 16 bits are mainstream features of todays

DACs [41–43] The dynamic range offered by today’s realizations vary roughly between

50− 90 dB dependent mainly on frequency ranges and conversion rates and not so much

on the resolution This architecture will be the main focus for the remaining of this book

1.5 Conclusions

The chapter presented an overview of the functional, algorithmic, and circuit aspects ofDigital to Analog converters The D/A conversion function was defined as a signal cre-ation process that realizes a code conversion in the abstract amplitude domain, a conver-sion from the abstract to the electrical signal domain, and a process of electrical signalshaping The algorithmic aspects of the DAC were discussed, and the concepts of parti-tioning and scheduling were introduced Waveform Line coding in the DAC output pulseswas defined based on its similarities with digital pulse methods Finally, circuit architec-ture terminology and an overview of the main DAC architectures were given

Chapter 1 Digital to Analog conversion concepts

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Framework for Analysis and Synthesis of DACs

THE qualitative lines of the proposed framework of analysis and synthesis for DACswill be described in this chapter

2.1 Overview

The main lines of an analysis and synthesis framework are explained with the aid of fig.2.1 The system, e.g a DAC, realizes a function between input and output signals Itcan be described in various hierarchical layers with subfunctions, circuits, etc Actualinput signals are applied to it via its functional, electrical, and physical environment.The functional inputs are constitutional parts of its functional relationship, whereas allother inputs are parameters of its behavior The outputs responses of the system and itsphysical characteristics are described by properties, such as signal quality, silicon area,power consumption, etc Several signals constitute its hidden excitations and responsesthat are visible only within its hierarchy

An analysis framework reveals the links between the system responses and ties and the input excitations applied to it, and shows the physical, circuit, and functionalmechanisms and principles that govern its operation Synthesis is the inverse of analysis

proper-It starts with a predetermined aim of a system that is to be built and problems to address,although specific properties are still left open A synthesis combines analysis with prin-ciple design techniques throughout the complete hierarchy of the system, from physics tosignals Therefore, synthesis requires the knowledge of design techniques to exploit theknowledge offered by the analysis in view of a coarsely defined system A specific designexample is the result of the combination of a specific set of required system properties-the specifications-, and the general synthesis procedures

19

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actual system responses

signal & physical (e.g resources, responses&properties

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2.2 Frame work description 21

2.2 Framework description

In this section the main aspects of the framework for analysis and synthesis that will

be build will be described For a DAC, the limit to achieve low signal errors and highquality figures of performance (functional, physical, etc.) is determined by two factors:(a) the potential offered by the used technology that realizes the converter, (b) the level ofexploitation of this potential, which is determined by the knowledge available about theway errors are generated, and the use of proper techniques to exploit this potential

The CS DAC represents the system shown in fig 2.1 Of primary role in the developedconcepts is the meaning of errors in the actual DAC response -the output signal-, and theway it can be grasped functionally, given that only in the functional level they can beevaluated The meaning of errors in the signal can be understood introducing the concept

of the normalized pulses at the DAC output In the top left side of fig 2.2 an idealDAC output signal is shown Below the actual signal we see the normalized pulses thatresult by dividing each pulse with the corresponding number of discrete steps it includes

In this ideal situation all normalized pulses are identical; they start at the same moment

every other T s and they have the same shape during the transition from the old value tothe new value The problem is that for a wide variety of reasons, the actual DAC signalpulses are corrupted, consequently their normalized counterparts look different from eachother This can be seen at the right side of fig 2.2 The normalized deformations is

Figure 2.2 The concept of normalized pulses

an indication of signal errors If the normalized pulses are different for each sample in

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a data-dependent way, then for a sinusoidal signal the errors are harmonically related

to it, whereas if the deformations are random, then the results are noise and distortiondependent on the correlation with the input signal

From chapter 1, in eq (1.12) we see that the signal creation mechanism is based onmapping a sequence of samples to a sequence of pulses according to

(2.1)

which says that

1 the amplitude of the signal is determined by z (m),

2 the time difference between successive sample transitions equals T s,

3 the shape of the pulse h (t) is identical for every code to code transition.

Therefore, when modeling the actual signal with the former equation, the timing of a pulsecan be distinguished from its shape, both of which together form the actual signal pulse,

or the actual code to code signal transition In the following the use of the word actual

is meant for this distinction If each transition from an input value to another resulted

in identical normalized pulse shape and ideally accurate timing, then the ideal amplitudemodulated pulse train given in eq (2.1) would be obtained The quality degradation of

a DACs actual output signal can be related to the deformations of its normalized pulseshape and timing in random or deterministic ways, correlated or not to the input signal(for example, clock jitter) In other words, the signal’s quality is a function of the thenon-linear transfer functions pulse-shape vs signal, and timing vs signal

Horizontal modulation in the signal flow

subfunction 1

Figure 2.3 Signal flow in the functional description of the DAC

Another aspect in the framework is the association between output signal errors andthe input signal in view of system parameters and properties of lower hierarchy: that is,

how do the normalized pulses depend on the signal; what do exactly these dependencies

cause; what is their dependence with system properties and parameters

Chapter 2 Frame work for Analysis and Synthesis of DACs

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2.2 Frame work description 23

To understand these aspects the so called error generation mechanism of each error need to be found These are the mixing of vertical and horizontal modulation mecha-

nisms The DAC function can be partitioned in main subfunctions realized by functionalcircuits, which are further realized by circuit components In each hierarchy layer there

are horizontal modulation mechanisms in the input-output signal flow Horizontal means

that the modulations take place at the same physical abstraction layer For example, theprinciples of modulation theory apply to describe how the signal is generated from its

primitive signal components in the functional layer: this defines the functional signal generation mechanisms of the DAC A description of this functional mechanism is given

in fig 2.3 for the CS DAC, without loss of generality Circuit imperfections are ally introduced at specific locations at the bottom layers of the DAC description, howeverthey can be abstracted at the functional level How they are introduced at these locations

usu-is determined by the vertical modulation mechanusu-isms which translate physical

imperfec-tions to error signals at the subfuncimperfec-tions The way errors are generated in each sublayercan be described with the corresponding error mechanisms (e.g circuit mechanisms).Consequently, the mixture of horizontal and vertical modulation mechanisms results inthe creation of signal errors in the output signal (see the schematic in fig 2.4), and it

describes the error generation, or error creation mechanism.

DAC functional description

circuit transistor circuit network

physical subfunction 2

Horizontal modulation in the signal flow

physical

subfunction 3

s(t) signal out

Environment

signal in

z(m)

Figure 2.4 Vertical and horizontal error generation mechanisms

The pattern that will be followed is the following

1 Vertical error mechanisms are analyzed (i.e the imperfections in the realization ofeach DAC subfunction) in electronic circuit details;

2 The results of the analysis will be translated to abstract errors in the subfunctionssuch subsignals embody important properties of the lower hierarchical levels Thiswill be made by grouping errors that share similar properties Therefore, errorproperties will be defined, and the errors will be classified

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