Volume 10 - Materials Characterization Part 8 doc

Metallographic Specimen Preparation, Metallography and Microstructures, Metals Handbook,Metallography, Nondestructive Testing, Annual Book of ASTM Standards, Capabilities of Related Tech

ASM

Metallographic Specimen Preparation, Metallography and Microstructures, Metals Handbook,

Metallography, Nondestructive Testing, Annual Book of ASTM Standards,

Capabilities of Related Techniques

• Electron probe x-ray microanalysis:

• Scanning electron microscopy:

Annual Book of ASTM Standards,

Annual Book of ASTM Standards, Quantitative Microscopy,

Quantitative Stereology,

Stereological Methods,

STP 430, Techniques of Metals Research, The Basis of Quantitative Metallography,

Metallography: Principles and Practice,

J Microsc., The Microscope,

Pract Metallogr.,

The Microscope, Pract Metallogr.,

∆

δ

N

A N

ASM Handbook Metals Handbook

Annual Book of ASTM Standards,

Annual Book of ASTM Standards, Quantitative Microscopy,

Quantitative Stereology,

Stereological Methods,

STP 430, Techniques of Metals Research,

N

N

ASM Handbook Metals Handbook

Metallography: Principles and Practice,

The Microscope, Microstruc Sci.,

Tint Etching, Metal Prog.,

Pract Metallogr., STP

STP

*

α

α γ γ

Q Rate A

π

Table 1 Typical individual particle data and statistical summaries

Annual Book of ASTM Standards,

Annual Book of ASTM Standards, Quantitative Microscopy,

Quantitative Stereology,

Stereological Methods,

STP 430, Techniques of Metals Research, The Basis of Quantitative Metallography,

Metallography: Principles and Practice,

J Microsc., The Microscope,

Pract Metallogr., The Microscope,

Pract Metallogr., Pract Metallogr.,

Tint Etching, Metal Prog.,

Pract Metallogr., STP

STP

μ

Table 1 X-ray diffraction analysis

d

d-I

α o

α

o o

μ

α β γ

a priori

Table 2 Formulas for calculating interplanar spacing d hkl

d d

Table 3 Line position

d

Table 4 Line intensity

d-I

e mc e

F

a b c x

I

I hkl I

International Tables for X-Ray Crystallography,

X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials,

Advances in X-Ray Analysis,

a priori,

θ

Table 5 Line profile

Advances in X-Ray Analysis,

International Tables for X-Ray Crystallography,

X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials,

Advances in X-Ray Analysis,

General Uses

Capabilities of Related Techniques

• X-ray spectrometry, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectrometry, classical wet chemical analysis

• Auger electron spectroscopy:

• Single-crystal x-ray diffraction:

• Infrared and Raman spectroscopy:

• Neutron diffraction:

R D

θ =   

θ

D d

μ

α

μ

μ

d d

θ θ

θ θ

θ μ μ

α

θ

θ

θ

Ann Phys., Phys Z.,

Nature, Thin Solid Films,

Solid State Elec.,

Thin Solid Films,

(Eq 3)

Adv X-Ray Anal.,

Adv X-Ray Anal., Adv X-Ray Anal.,

Retained Austenite and its Measurements by X-Ray Diffraction,

J Appl Crystallog.,

Anal Chem.,

Adv X-Ray Anal.,

Adv X-Ray Anal.,

θ

Adv X-Ray Anal., Clay Min.,

Adv X-Ray Anal., Adv X-Ray Anal., Adv X-Ray Anal., Adv X-Ray Anal.,

Table 3 Calculated absorption coefficients and relative intensities of ZnO in calcite

100 49.7 1.00

X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials,

Ann Phys., Phys Z.,

Nature, Thin Solid Films,

Solid State Elec.,

Thin Solid Films,

J Appl Crystallog.,

J Appl Crystallog.,

The Laue Method, X-Ray Diffraction,

Adv X-Ray Anal.,

Am Ceram Soc.,

Adv X-Ray Anal.,

J Appl Crystallog.,

J Appl Crystallog.,

Appl Spectrosc Rev.,

X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials,

J Appl Crystallog., Anal Chem.,

Adv X-Ray Anal.,

Adv X-Ray Anal.,

Adv X-Ray Anal.,

Retained Austenite and its Measurements by X-Ray Diffraction,

J Appl Crystallog.,

Anal Chem.,

Adv X-Ray Anal.,

Adv X-Ray Anal.,

Clay Min.,

Adv X-Ray Anal., Adv X-Ray Anal., Adv X-Ray Anal., Adv X-Ray Anal.,

X-Ray Diffraction Methods in Polymer Science,

The Powder Method in X-Ray Crystallography, Structure of Metals,

The APEX Goniometer as a Glancing Angle X-Ray Powder Diffractometer for the Study of Thin Layers,

Accuracy in Powder Diffraction, Crystal Structures of Clay Minerals and their X-Ray Identification,

Adv X-Ray Anal., Elements of X-Ray Diffraction,

J Appl Crystallog.,

Adv X-Ray Anal., Adv X-Ray Anal.,

X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies,

X-Ray Diffraction by Polycrystalline Materials,

The Optical Principles of the Diffraction of X-Rays,

X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials,

Laue Atlas, Adv X-Ray Anal., X-Ray Metallography,

Capabilities of Related Techniques

• Neutron single-crystal diffraction

• Rietveld refinement of x-ray or neutron powder diffraction data

o o o

The Crystalline State, Crystal Structures of Minerals,

r t

Chemical Crystallography,

m

m mmm.

Chemical Crystallography,

hk hk hk

mm Pmm2, Pmc21, Pcc2, Pma2, Pca21, Pnc2, Pmn21, Pba2, Pna21, Pnn2, Cmm2, Cmc21, Ccc2, Amm2,

Abm2, Ama2, Aba2, Fmm2, Fdd2, Imm2, Iba2, Ima2

mmm Pmmm, Pnnn, Pccm, Pban, Pmma, Pnna, Pmna, Pcca, Pbam, Pccn, Pbcm, Pnnm, Pmmn, Pbcn,

Pbca, Pnma, Cmcm, Cmca, Cmmm, Cccm, Cmma, Ccca, Fmmm, Fddd, Immm, Ibam, Ibca, Imma

m Pm3, Pn3, Fm3, Fd3, Im3, Pa3, Ia3

a c b ac

X-Ray Structure Determination,

Z V

a b hkl d dhkl

λ

The Chemistry of Penicillin,

D FW V: