Iec Ts 60871-2-2014.Pdf

IEC TS 60871 2 Edition 3 0 201 4 1 1 TECHNICAL SPECIFICATION SPECIFICATION TECHNIQUE Shunt capacitors for a c power systems having a rated voltage above 1 000 V – Part 2 Endurance testing Condensateur[.]

Shunt capacit ors for a.c pow er syst ems having a rat ed volt age above 1 000 V –

Part 2: Endurance t est ing

Condensat eurs shunt pour réseaux à courant alt ernat if de t ension assignée

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Shunt capacit ors for a.c pow er syst ems having a rat ed volt age above 1 000 V –

Part 2: Endurance t est ing

Condensat eurs shunt pour réseaux à courant alt ernat if de t ension assignée

supérieure à 1 000 V –

INT ERNAT IONAL

ELECT ROT ECHNICAL

ELECT ROT ECHNIQUE

INT ERNAT IONALE

FOREWORD 3

1 Sco e 5

2 Normative ref eren es 5

3 Terms an def i ition 5

4 Qual ty req irements an tests 6

4.1 Test req irements – General purp se 6

4 2 Test proced re

6 4.2.1 General 6

4.2.2 Routine test 6

4.2.3 Con itionin of the u its b fore the test 6

4.3 Agein test 6

4.3.1 Initial ca acitan e an dielectric los me s rements 6

4.3.2 Final ca acitan e an dielectric los me s rements 7

4.3.3 Ac e tan e criteria 7

4.4 Val dity of test 7

An ex A (normative) Req irements regardin comp ra le element desig an test u it desig 8

A.1 Test element desig criteria 8

A.2 Test u it desig 8

An ex B (informative) Def i ition of element an ca acitor container dimen ion 10 B.1 Flat ened pres ed element 1

0

B.2 Ca acitor container 10

Fig re B.1 – Flat ened pres ed element 10

Fig re B.2 – Ca acitor container 10

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con titutes a tec nical revision

This edition in lu es the folowin sig ificant tec nical c an es with resp ct to the previou

edition:

a) The overvoltage c cln test has b en moved to IEC 6 871-1:2 14

The text of this tec nical sp cification is b sed on the fol owin doc ments:

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the re ort on votin in icated in the a ove ta le

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A lst of al p rts in the IEC 6 8 1 series, publ s ed u der the general title Sh nt c p cit ors

for a.c p wer systems h vin a rated voltag a ove 1 0 0 V, can b f ou d on the IEC

we site

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related to the sp cific publ cation At this date, the publ cation wi b

• tran f ormed into an International stan ard,

• recon rmed,

• with rawn,

• re laced by a revised edition, or

SHUNT CA PACITORS FOR A C POWER SYSTEMS

Part 2: Endurance testing

This p rt of IEC 6 8 1, whic is a tec nical sp cif i ation, a pl es to ca acitors ac ordin to

IEC 6 8 1-1 an gives the req irements f or agein tests of these ca acitors

The f ol owin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a pl es For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 8 1-1:2 14, Sh nt c p citors for a.c p wer systems h vin a rated v ltag a o e

one of the u its to b man f actured or a sp cial u it whic , with resp ct to the pro erties to

b c ec ed by the agein test, is eq ivalent to the u its to b man f actured

Note 1 to e try: Th re trictio s o te t u it d sig are d taie in An e A

3.2

comparable eleme t d sign

ran e of con tru tion elements that wi b comp ra le in p rorman e, u der the test

proced re, with elements of the u its to b man f actured

Note 1 to e try: Se An e A for d taie d sig lmits

3.3

inter-eleme t ins lation

in ulation b twe n two series-con ected elements, con istin of:

– the outer turn of the in ulation layers arou d the electrodes in an element, or

– a se arate in ulation layer placed b twe n the two elements

Note 1 to e try: This s p rate in ulatio la er ma protru e o tsid th width a d (or le gth dime sio (s) of th

f l te e eleme t (s e An e B)

4 Qual ty requirements and tests

4.1 Te t re uireme ts – Ge eral purpos

The agein test is a sp cial test car ied out in order to as ertain that the progres ion of

deterioration res ltin f rom in re sed voltage stres at elevated temp rature do s not cau e

u timely fai ure of the dielectric It is a me n to en ure that b sic material selection is

pro erly made an that an ra id deterioration do s not take place The test s ould not b

se n as a to l for an exact as es ment of l f e c aracteristic of a dielectric For that purp se

variou rese rc an develo ment activities are to b taken care of by the man facturers

The agein test s al b car ied out as sp cial tests by the man facturer for a p rtic lar

dielectric s stem, i.e not f or e c p rtic lar ca acitor ratin The test res lts are a pl ca le to

a wide ran e of ca acitor ratin s within the l mits defined in An ex A The purc aser s al, on

request, b s p l ed with a certif i ate detai n the res lts of s c tests

The agein test s al b car ied out in the seq en e given b low The a pled test voltage

s al have a f req en y of 5 Hz or 6 Hz, ex e t for the test ac ordin to 4.2.2 where a d.c

voltage can b u ed ac ordin to 9.3 of IEC 6 8 1-1:2 14

4.2.2 Routine te t

The test u it s al b s bjected to the routine voltage test b twe n the terminals (se

IEC 6 8 1-1) with an ampl tu e s c that the cor ect test voltage is o tained acros e c

element

4.2.3 Conditioning of the units bef ore the te t

The test u it s al b s bjected to a voltage of not les than 1,1 U

4.3.1 Initial c pa ita c a d diele tric los me s reme ts

The ca acitor u it s al b me s red at 0,9 to 1,1 times the rated voltage The c oice of

temp rature is left to the man f acturer

4.3.1.1 Te t method

The ambient temp rature d rin the agein test s al b not les than 5 °C

It is anticip ted, given the l mits f or the test o ject sp cif ied in An ex A, that more than 6 °C

average dielectric temp rature is ac ieved If req ested by the purc aser further detai s a out

the relation b twe n external an internal (dielectric) temp ratures s ould b given by the

man f acturer The dielectric temp rature may b me s red with thermocouples on sp cial y

pre ared test u its or estimated f rom previou ly esta l s ed relation hips b twe n internal

an external temp ratures s c as by use of resistive d mmy cap citors des rib d in

IEC 6 9 6

The ambient temp rature s al b held con tant with a toleran e of – °C to +5 °C Prior to

energization, the test u its s al b sta i zed in this ambient for 12 h Due to the len th of this

test, voltage inter uption are al owed Durin these inter uption , the u its s al remain in the

control ed ambient If p wer is lost to the c amb r, the ambient temp rature s al b

re tained for 12 h prior to re-energization of the u its

The testin time s al de en on the test voltage Either one of the fol owin test con ition

4.3.2 Final c pa ita c a d diele tric los me s reme ts

The me s rement s al b re e ted u der the same con ition as f or the initial

me s rement, within a temp rature toleran e of ± °C The me s rements s al b made

within two day after completin the tests in 4.1.3.2

4.3.3 Ac epta c criteria

No bre k own s al oc ur when two u its have b en tested, or alternatively one bre k own is

ac e ted when thre u its have b en tested

To verify no bre k own the ca acitan e me s rements p rormed in 4.3.1 an 4.3.2 s al

diff er by les than an amou t cor esp n in to bre k own of an element

4.4 Val dity of te t

The agein test is a test on the elements ( heir dielectric desig an comp sition), an on

their proces in (element win in , dryin an impreg ation) when as embled in a ca acitor

u it Eac agein test wi also cover other ca acitor desig s, whic are al owed to diff er f rom

the tested desig within the l mits stated in An ex A

A test p rormed at 5 Hz is also a pl ca le for 6 Hz (an lower feq en y) u its an vice

versa

Annex A

(nor mative)

element design and test unit design

A 1 Test element design criteria

A tested element desig is con idered to b comp ra le with resp ct to the elements in the

u its to b man f actured if the f ol owin req irements are fulfi ed:

a) the tested element s al have the same or an inferior n mb r of layers of sold materials in

the dielectric an b impreg ated with the same lq id

the dielectric s al b within 7 °% to 130°% of the thic nes an b rated at eq al or

hig er electrical stres

when a dielectric contain b th fi m an p p r, the stres value to b u ed in this

comp rison is the stres acros e c of the sol d materials, calc lated u in the thic nes

of only the sol d materials an their resp ctive p rmitivity

for the agein test, u in resistors an /or internal fu es is ir elevant f or the test It is up to

the man f acturer to c o se

b) the dielectric comp sition of the sol d materials s al b the same, for example al -i m or

– exten ed or non-exten ed foi ed es;

– f olded f oi at the ed es an (or) c t en s if it is a f eature of the desig ;

– les or eq al f e margin;

e) element con ection s al b of the same typ , f or example ta s, solderin , etc

f ) the element width (active foi width) is alowed to vary within 5 °% to 4 0°% an the

element len th (active f oi len th) is al owed to vary within 3 °% to 3 0°% (se An ex B)

A 2 Test unit design

A test u it is con idered to b comp ra le to the u its to b man factured if the fol owin

req irements are satis ed:

a) elements me tin the req irements of Clau e A.1 s al b simi arly as embled, have

eq al or thin er inter element in ulation, b eq al y pres ed within the man f acturin

toleran e, etc as comp red with the u its to b man f actured;

b) a s ita le n mb r of elements s al b con ected to give not les than 10 k ar output at

rated voltage (5 Hz) Al con ected elements s al b placed adjacent to e c other

NOT Th c n e te eleme ts ma b s rie a d p ralel-c n e te in a y wa to matc th te t

e uipme t

c) the con ection outside the tested elements may b enlarged in order to han le the

in re sed c r ents d e, for example, to a n mb r of elements in p ral el;

d) the in ulation to the container s al b of the same thic nes or thic er;

NOT This re uireme t is inte d d to e s re th t th dryin a d impre n tio c n itio s are e u l to th s

of th u its to b pro u e Th ele tric l with ta d re uireme ts of th in ulatio to c ntain r are ta e c re

of b th te ts a c rdin to Cla s s 10 a d15 of IEC 6 8 1 1:2 14

e) a container s al b u ed, the heig t of whic is not les than 2 % of the heig t of the u it

to b man factured The de th an width of the container s al not b les than 5 %

NOT Th s ra g s in c ntain r dime sio s are n c s ary to alow f or th v riatio in eleme t siz s

The container material s al b of eq al typ (metal, p lymer etc.), but the p intin can b

omited or may b dif ferent

The bu hin desig an n mb r of bu hin s may b adju ted in order to matc the test

voltage an /or test c r ents;

f) the dryin an impreg ation proces s al b identical with the normal prod ction proces

Element or (active) foi len th is o tained by u win in the element in the len th direction.

B.2 Capacitor container

Heig t

De th

Width

IEC

Fig re B.2 – Capa itor container

Heig t is alway determined fom the side on whic the bu hin s are f ited to the o p site

side Normal y the len th dimen ion of the flat ened element cor esp n s to the container

de th dimen ion De en in on the desig , the element width direction may cor esp nd to

either the container heig t or the container width dimen ion (se Fig re B.2)

_ _