SPÉCIFICATION TECHNIQUE CEI IEC TECHNICAL SPECIFICATION TS 62101 Première édition First edition 2005 11 Systèmes d''''isolation électriques – Evaluation à court terme des contraintes électriques et therm[.]
Informations générales
The model is valuable for assessing the compatibility of all components used in a candidate Embedded System (SIE) It can also simulate the effects of real manufacturing processes, including winding techniques, output connection methods, and impregnation or encapsulation techniques.
Similitude du modèle candidat et du modèle de référence
The physical form and assembly of the candidate model and the reference model must be similar The differences in the size of the winding wire used in the candidate model and the reference model should fall within two classes according to the specified standards.
Tableau 1 de la CEI 60317-0-1 Les détails de la construction du modèle candidat et du modèle de référence doivent être indiqués conformément à 7.4 de la CEI 61857-1.
Composants de modèle
a) Bobine: la ou les bobines doivent être enroulées avec deux fils identiques parallèles
The article discusses key components of bifilar winding, emphasizing the use of winding wire with diameters between 0.4 mm and 0.63 mm for testing, which is representative of other wire sizes It highlights that electrical insulating materials (EIM) evaluated as coil bodies should not serve as encapsulating materials, and any EIM used for encapsulation must be assessed accordingly Additionally, it addresses the need for insulation between adjacent coils when relevant to the design Connectors play a crucial role, as winding wires are linked to terminals or connection wires that may extend through the encapsulating or impregnating wall Components not electrically constrained during evaluation should not be used as EIM in the final product The design may also incorporate a metallic chassis or layers, and impregnating varnish or resin can be integral components of the model.
Assemblage du modèle
To properly wind the winding wire onto the coil body, utilize approved winding techniques Ribbons or other components may be employed to secure and position the winding wire Next, insert the core into the coils and connect the winding wire to the connection terminals or connecting wires If it is part of the candidate SIE system, apply resin or varnish, followed by the encapsulating material.
NOTE L’essai peut également être appliqué à un dispositif électrotechnique réel
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The model is useful in evaluating the compatibility of all components used in a candidate EIS
It is equally capable of simulating the influences of actual manufacturing processes such as winding techniques, termination techniques and impregnation and/or encapsulation techniques
4.2 Similarity of candidate and reference model
The candidate and reference models must have a similar physical shape and assembly According to Table 1 of IEC 60317-0-1, the size differences in the winding wire between the two models should be limited to within two steps Additionally, the construction details of both models must be documented in accordance with section 7.4.
The model components include bifilar wound coils made of two identical wires, preferably between 0.4 mm and 0.63 mm in diameter for testing Earth insulation must be evaluated separately from encapsulant materials, and insulation between adjacent coils is necessary based on design requirements Connectors are crucial, linking winding wires to terminals or lead wires that pass through the impregnation or encapsulant wall Components not electrically stressed during evaluation cannot be used as encapsulant materials in the final product Additionally, a metal core or laminations should be included in the model where applicable, and impregnating resin or varnish may also be part of the model.
To assemble the model, begin by winding the winding-wire over the bobbin using standard techniques, ensuring it is secured with tapes or other components Next, insert the core into the coil(s) and connect the winding-wire to the binding posts or lead wires If applicable, apply impregnating resin or varnish as part of the candidate EIS, followed by the application of the encapsulant material.
NOTE The test may also be applied to an actual electrotechnical device
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Le nombre minimal d’éprouvettes pour chaque système SIE candidat et de référence et pour chaque température de vieillissement doit être de 5
Généralités
All test tubes, both candidate and reference, must undergo initial selection tests followed by repeated thermal endurance testing cycles These cycles include: a) a portion of thermal aging of the cycle; b) an electrical diagnostic test.
Essai de sélection initiale
Before being subjected to high temperatures for the initial phase of thermal aging, all test specimens, both candidate and reference, must undergo initial selection tests to eliminate defective samples The initial selection tests should include the following steps, performed in the specified order: a) preconditioning; b) visual inspection; c) initial dielectric testing.
Les éprouvettes doivent subir un préconditionnement de 48 h à la température de vieillis- sement la plus basse avant l’essai de sélection initiale
An initial selection test involving a minimum selection voltage of 1,500 V for a duration of (30 ± 2) seconds must be conducted on each specimen before applying additional pre-diagnostic and thermal aging stresses This dielectric test should be performed, if applicable, between coils and between the coil(s) and the ground (core) Additionally, the test between winding wires must be carried out at a minimum of 500 V.
La fréquence de la tension d’essai doit être comprise entre 48 Hz et 62 Hz
The immediate application of maximum voltage is not recommended Surge protection devices can be incorporated into the test circuit to eliminate unintended high voltage spikes.
For the tested samples subjected to tension, successfully calibrated electromechanical circuit breakers with an overcurrent rating and a trip time of 2 to 3 seconds were utilized to detect failures.
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The minimum number of test objects for each candidate and reference EIS for each ageing temperature shall be 5
All test objects, including candidates and references, must undergo initial screening tests, followed by multiple thermal endurance test cycles These cycles consist of a thermal aging phase and an electric diagnostic assessment.
Before exposure to high temperatures during the initial phase of thermal aging, all test specimens, including candidates and references, must undergo preliminary screening tests to identify and discard any defective items These initial screening tests should be performed in the following sequence: a) preconditioning; b) visual inspection; and c) initial dielectric testing.
The test objects shall have a 48 h preconditioning at the lowest ageing temperature prior to the initial screening test
Before applying other prediagnostic stresses and thermal aging, each test object must undergo an initial screening proof voltage test with a minimum voltage of 1500 V for (30 ± 2) seconds This dielectric test should be conducted, when applicable, between coil to coil and coil(s) to earth (core), while winding-wire to winding-wire testing requires a minimum of 500 V.
The frequency of the test voltage shall be between 48 Hz and 62 Hz
NOTE Instantaneous application of full voltage is not recommended Surge protectors may be included in the test circuit to eliminate unintended high voltage spikes
For test objects evaluated by applied voltage, pre-calibrated electromechanical over-current circuit-breakers with a trip time of 2 s to 3 s have been used successfully to detect failure
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General information
The model is useful in evaluating the compatibility of all components used in a candidate EIS
It is equally capable of simulating the influences of actual manufacturing processes such as winding techniques, termination techniques and impregnation and/or encapsulation techniques.
Similarity of candidate and reference model
The candidate and reference models must have a similar physical shape and assembly The winding wire sizes in both models should differ by no more than two steps, as specified in Table 1 of IEC 60317-0-1 Additionally, the construction details of both models must be documented in accordance with section 7.4.
Model components
The coil must be wound using two identical wires in a bifilar configuration, with preferred wire sizes ranging from 0.4 mm to 0.63 mm in diameter for testing It is crucial that an EIM evaluated as a coil bobbin is not used as an encapsulant material; instead, a separate evaluation is required for encapsulants Insulation between adjacent coils should be included if the design permits The winding wires must connect to terminals or lead wires that extend through the impregnation or encapsulant wall, as these connections are vital to the model Components that have not undergone electrical stress during evaluation cannot be utilized as EIM in the final product Additionally, the model should incorporate a metal frame or laminations as the core where applicable, and impregnating resin or varnish may also be included as components of the model.
Assembly of the model
To properly assemble the coil, begin by winding the winding-wire over the bobbin using standard techniques, ensuring secure placement with tapes or other components Next, insert the core into the coil(s) and connect the winding-wire to the binding posts or lead wires If applicable to the candidate EIS, apply impregnating resin or varnish, followed by the encapsulant material.
NOTE The test may also be applied to an actual electrotechnical device
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Le nombre minimal d’éprouvettes pour chaque système SIE candidat et de référence et pour chaque température de vieillissement doit être de 5
All test tubes, both candidates and references, must undergo initial selection tests followed by repeated thermal endurance testing cycles in the following order: a) a portion of the thermal aging cycle; b) an electrical diagnostic test.
Before being exposed to high temperatures for the initial phase of thermal aging, all test specimens, both candidate and reference, must undergo initial selection tests to eliminate defective samples The initial selection tests should include the following steps, performed in the specified order: a) preconditioning; b) visual inspection; c) initial dielectric testing.
Les éprouvettes doivent subir un préconditionnement de 48 h à la température de vieillis- sement la plus basse avant l’essai de sélection initiale
An initial selection test involving a minimum selection voltage of 1,500 V for a duration of (30 ± 2) seconds must be conducted on each specimen before applying additional pre-diagnostic and thermal aging stresses This dielectric test should be performed, if applicable, between coils and between the coil(s) and the ground (core) Additionally, the test between winding wires must be carried out at a minimum of 500 V.
La fréquence de la tension d’essai doit être comprise entre 48 Hz et 62 Hz
The immediate application of maximum voltage is not recommended Surge protection devices can be incorporated into the test circuit to eliminate unintended high voltage spikes.
For the tested samples subjected to tension, successfully calibrated electromechanical circuit breakers with an overcurrent trip time of 2 to 3 seconds were utilized to detect failures.
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The minimum number of test objects for each candidate and reference EIS for each ageing temperature shall be 5
General
All test objects, including candidates and references, must undergo initial screening tests, followed by multiple thermal endurance test cycles These cycles consist of two main components: a thermal aging segment and an electric diagnostic assessment.
Initial screening test
Before subjecting test objects to high temperatures during the initial thermal aging phase, both candidate and reference samples must undergo preliminary screening tests to identify and discard any defective items These initial screening tests should be performed in the following sequence: a) preconditioning, b) visual inspection, and c) initial dielectric testing.
The test objects shall have a 48 h preconditioning at the lowest ageing temperature prior to the initial screening test
Each test object must undergo an initial screening proof voltage test with a minimum of 1500 V for (30 ± 2) seconds before any other prediagnostic stresses or thermal aging are applied This dielectric test, when applicable, should be conducted between coil to coil and coil(s) to earth (core), while winding-wire to winding-wire testing requires a minimum of 500 V.
The frequency of the test voltage shall be between 48 Hz and 62 Hz
NOTE Instantaneous application of full voltage is not recommended Surge protectors may be included in the test circuit to eliminate unintended high voltage spikes
For test objects evaluated by applied voltage, pre-calibrated electromechanical over-current circuit-breakers with a trip time of 2 s to 3 s have been used successfully to detect failure
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After the initial selection tests conducted on the prescribed number of candidate and reference specimens, the specimens must undergo repeated thermal endurance test cycles Each thermal endurance test cycle should be performed on both a candidate model and a reference model in accordance with IEC 61857-1 A test cycle is structured as follows: a) a thermal aging portion of the cycle; b) an electrical diagnostic test.
The thermal aging phase of the cycle must be conducted at four distinct aging temperatures The lowest aging temperature should result in a minimum test duration of 1,500 hours, while the highest aging temperature must yield a minimum test duration of 100 hours It is essential to consider transition temperatures, such as the melting or glass transition temperature.
EIM contenu dans le système en sélectionnant la température de vieillissement la plus haute à au moins 5 K en dessous de la température de transition la plus basse
A voltage of (500 ± 25) V in direct current (48-62 Hz) must be applied to the bifilar windings in the samples during each thermal aging cycle If applicable, the core should be grounded.
Thermal aging, which includes selecting the aging temperature, initial aging durations, and aging procedures, must be conducted in accordance with section 6.3 of IEC 61857-1 Ovens should be utilized as the heating method, as specified in section 6.3.4 of IEC 61857-1.
Les températures de vieillissement doivent être fondées sur la classe thermique prévisible
(TC A ) du SIE candidat (TC A SIE ) débutant à TC A SIE + 40 K comme l’illustre le tableau 1
Les températures d’essai complémentaires peuvent être exigées pour répondre aux critères énoncés en 6.3.2
For each aging temperature, a designated exposure period must be selected to achieve the expected average test lifespan in a minimum of three test cycles for each set of test specimens If the first failure occurs after the first or second cycle, the duration of the cycles should be halved.
Les températures de vieillissement doivent être fondées sur la classe thermique prévisible
The candidate temperature coefficient (TC A) for the SIE should be adjusted at intervals of 10 K for thermal classes up to 180 °C and at intervals of 15 K for thermal classes of 200 °C and above Suggested aging temperatures and durations are provided in Table 1 The minimum temperature is defined as the expected temperature class plus an additional 40 K.
Chaque incrément de température représente un groupe d’éprouvettes à charger dans l’étuve concernée
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Thermal endurance test
After the initial screening tests on the designated candidate and reference test objects, these objects will undergo multiple thermal endurance test cycles Each cycle will be conducted in accordance with IEC 61857-1 and consists of two main components: a thermal aging phase and an electrical diagnostic test.
The thermal ageing portion of the cycle shall be conducted at four different ageing temperatures The lowest ageing temperature shall result in a minimum mean test life of
1 500 h The highest ageing temperature shall result in a minimum mean test life of 100 h
When selecting the highest ageing temperature for the EIM system, it is crucial to consider transition temperatures, including melting and glass transition The chosen temperature should be at least 5 K below the lowest transition temperature to ensure optimal results.
A (500 ± 25) V a.c (48-62 Hz) voltage shall be applied to the bifilar windings in the test objects during each thermal ageing cycle If applicable the core shall be connected to earth
Thermal ageing must be performed following the guidelines outlined in section 6.3 of IEC 61857-1, which includes the selection of ageing temperature, initial ageing periods, and ageing procedures Heating should be conducted using ovens, as specified in section 6.3.4 of IEC 61857-1.
The ageing temperatures will be determined by the expected thermal class (TCA) of the candidate EIS, beginning at EIS TCA + 40 K, as shown in Table 1 Additional testing temperatures may be necessary to fulfill the requirements outlined in section 6.3.2.
For each aging temperature, a specific exposure period must be designated to achieve the expected average test life within a minimum of three test cycles for each group of test objects If the initial failure happens after the first or second cycle, the duration of the cycles should be reduced by half.
The ageing temperatures for the candidate EIS (EIS TCA) should be determined based on the anticipated thermal class, set at 10 K intervals for thermal classes up to 180 °C and at 15 K intervals for classes of 200 °C and above The lowest temperature is defined as the expected temperature class plus an additional 40 K Each temperature increment corresponds to a specific group of specimens designated for the oven, with suggested ageing temperatures and periods outlined in Table 1.
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Tableau 1 – Températures de vieillissement et durées de vieillissement suggérées
Durée de vieillissement par cycle
Tem p éra tur e de vieilli ssem en t pour TC A SIE °C
A preliminary aging test at a specified temperature can be conducted to determine the appropriate aging conditions, including the TC A SIE and other relevant temperatures and durations for the model under evaluation.
NOTE Les temps de vieillissement sont suggérés comme étant des multiples convenables de 24 h (1 jour)
Après chaque cycle de vieillissement décrit dans les Paragraphes 6.3.2 à 6.3.4, évaluer les éprouvettes conformément à l'essai de diagnostic électrique défini dans le Tableau 2 à température ambiante
Tableau 2 – Essais de diagnostic diélectrique pour les modèles
Essai Méthode Conditions d'essai Fin de vie
Fils dans les bobines bifilaires
Entre bobines (pour les constructions à plusieurs bobines
Isolation par rapport à la terre Essais de diagnostic diélectrique Résistance d’isolement
NOTE La résistance d’isolement est mesurée avec une tension à courant continu d’environ 500 V, la mesure étant effectuée 1 min après application de la tension
To assess the condition of the specimens and determine their end of life, electrical diagnostic tests must be conducted after each successive exposure to the thermal aging cycle.
7 Critère de fin de vie
The end-of-life criterion for individual test specimens should be based on the failure of a model to meet the end-of-life criteria as outlined in Table 2, or a failure occurring during the thermal aging phase of the cycle due to the application of alternating current voltage Once a failure in a test specimen is detected, that specimen must be removed from further testing.
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Table 1 – Suggested ageing temperatures and ageing periods
A g eing tem p er atu re for EIS TC A °C
A preliminary ageing test at a given temperature may be performed to indicate the EIS TCA and other ageing temperatures and periods that are appropriate for the model being tested
NOTE Ageing times are suggested as convenient multiples of 24 h (1 day)
Following each ageing cycle, described in 6.3.2 through 6.3.4, evaluate the specimens in accordance with the electric diagnostic test given in Table 2 at room temperature
Table 2 – Dielectric diagnostic tests for model
Test Method Test condition End-of-life
Wires in bifilar coils Insulation resistance 500 V d.c ≤ 2 MΩ
Coil-to-coil (for multiple coil constructions)
Dielectric diagnostic test Insulation resistance
Earth insulation Dielectric diagnostic test
NOTE Insulation resistance is measured with a d.c voltage of approximately 500 V applied, the measurement being made 1 min after application of the voltage
To assess the condition of test objects and establish their end-of-life, electrical diagnostic tests must be performed following each thermal aging cycle exposure.
The end-of-life criterion for test specimens is defined by their inability to meet the standards outlined in Table 2 or by failures occurring during the thermal aging phase due to applied a.c voltage Upon detection of a failure in a test object, that specimen will be excluded from further testing.
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8 Analyse, compte-rendu et classification
L’analyse, le compte-rendu et la classification doivent être conformes à l’Article 7 de la
CEI 61857-1 refers to the procedures outlined in CEI 60216-5 The thermal endurance qualification for the candidate model must be provided as a figure, followed by the designation (CEI 62101), for example, Class 130 (62101).
The midpoint of the thermal aging phase of the cycle, after which a failure is detected through dielectric diagnostic testing, or the total aging duration before breakdown occurs between parallel wires (if such a breakdown has happened and the time before it is continuously measured), is regarded as the end of life If both events occur, the lower value of the two is considered the end of life.
Au moins trois valeurs ponctuelles de température sont exigées pour l’analyse de données
The lowest aging temperature should result in a minimum test duration of 1,500 hours, while the highest aging temperature must yield a minimum test duration of 100 hours.
NOTE Cette procédure ne donnera pas lieu à des classifications identiques comme c’est le cas des parties de la
The CEI 61857 program aims to establish consistent numerical classifications for electrical insulation systems (EIS), specifically for devices not exposed to cold, humidity, or vibrations Furthermore, any modifications to these systems would require a complete retest.
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