IEC TS 60870 5 604 Edition 2 0 201 6 06 TECHNICAL SPECIFICATION Telecontrol equipment and systems – Part 5 604 Conformance test cases for the IEC 60870 5 1 04 companion standard IE C T S 6 0 8 7 0 5 6[.]
Trang 1IEC TS 60870-5-604
T elecontrol equipment and sy stems –
Part 5-604: Conformance test cases for the IEC 60870-5-104 companion standard
Trang 2THIS PUBLICATION IS COPYRIGHT PROT CTED
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Trang 3IEC TS 60870-5-604
T elecontrol equipment and sy stems –
Part 5-604: Conformance test cases for the IEC 60870-5-104 companion standard
Trang 4CONTENTS
FOREWORD 4
INTRODUCTION 6
1 Sco e 7
2 Normative referen es 7
3 Terms an definition 8
4 Ab reviated terms 8
5 Conforman e testin for IEC 6 8 0-5-10 8
5.1 Overview an legen 8
5.2 Config ration p rameters IEC 6 8 0-5-10 10 5.3 Verification of IEC 6 8 0-5-10 commu ication 10 5.4 Conforman e test proced res 51
5.5 Test res lts c art 88 5.6 Test res lts of comman tran mis ion 9
5.6.1 General 9
5.6.2 Test res lts of sin le comman tran mis ion 96 5.6.3 Test res lts of double comman tran mis ion 9
5.6.4 Test res lts of reg latin ste comman tran mis ion 10 5.6.5 Test res lts of setp int comman tran mis ion 10 Fig re 1 – Test proced re 9
Ta le 1 – Ru the Conforman e Test Proced res for e c of the fol owin s p orted config ration p rameter values 10 Ta le 2 – Tests on tran p rt provider level ( of 5) 1
Ta le 3 – Tests on data u it identifier 16 Ta le 4 – Verification of ASDUs for proces information in monitor (normal) direction ( of 18) 17 Ta le 5 – Verification of ASDUs for proces information in control (normal) direction ( of 8) 3
Ta le 6 – Verification of ASDUs for s stem information in monitor (normal) direction 4
Ta le 7 – Verification of ASDUs for s stem information in control (normal) direction ( of 3) 4
Ta le 8 – Verification of ASDUs for p rameters in control (normal) direction ( of 2) 4
Ta le 9 – Verification of ASDUs for fi e tran fer (in monitor (normal) an control direction) ( of 4) 4
Ta le 10 – Data u it identifier conforman e test proced res ( of 2) 5
Ta le 1 – Information o ject ad res conforman e test proced res 5
Ta le 12 – Station initial sation fu ction conforman e test proced res ( of 3) 5
Ta le 13 – Red n ant lnk conforman e test proced res ( of3) 57 Ta le 14 – Cy lc data tran mis ion fu ction conforman e test proced res 6
Ta le 15 – Data ac uisition throu h re d fu ction conforman e test proced res 61
Ta le 16 – Ac uisition of events fu ction conforman e test proced res 6
Trang 5Ta le 19 – Comman tran mis ion fu ction conforman e test proced res ( of 9) 6
Ta le 2 – Tran mis ion of integrated totals ( elecou tin ) fu ction conforman e test proced res ( of 4) 7
Ta le 21 – Parameter lo din fu ction conforman e test proced res 81
Ta le 2 – Test proced re fu ction conforman e test proced res 8
Ta le 2 – Fi e tran fer proced re fu ction conforman e test proced res ( of 3) 8
Ta le 2 – Ad itional conforman e test proced res 8
Ta le 2 – Negative conforman e test proced res 8
Ta le 2 – PIXIT related conforman e test proced res 8
Ta le 2 – Test res lts c art ( of 7) 8
Ta le 2 – Test res lts of sin le comman tran mis ion ( of3) 9
Ta le 2 – Test res lts of double comman tran mis ion ( of3) 9
Ta le 3 – Test res lts of reg latin ste comman tran mis ion ( of 3) 10
Ta le 31 – Test res lts of setp int comman tran mis ion ( of 2) 10
Trang 6INTERNATIONAL ELECTROTECHNICAL COMMISSION
1) Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org nizatio for sta d rdizatio c mprisin
al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote
intern tio al c -o eratio o al q estio s c n ernin sta d rdizatio in th ele tric l a d ele tro ic fields To
this e d a d in a ditio to oth r a tivities, IEC p blsh s Intern tio al Sta d rds, Te h ic l Sp cific tio s,
Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re fer refere to as “IEC
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in th su je t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n
n-g v rnme tal org nizatio s laisin with th IEC also p rticip te in this pre aratio IEC c la orates closely
with th Intern tio al Org nizatio for Sta d rdizatio (ISO) in a c rd n e with c n itio s d termin d b
a re me t b twe n th two org nizatio s
2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pres , as n arly as p s ible, a intern tio al
c nse sus of o inio o th rele a t su je ts sin e e c te h ic l c mmite h s re rese tatio from al
intereste IEC Natio al Commite s
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Pu lc tio s is a c rate, IEC c n ot b h ld resp nsible for th wa in whic th y are use or for a y
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th later
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servic s c rie o t b in e e d nt c rtific tio b dies
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e p nses arisin o t of th p blc tio , use of, or rela c u o , this IEC Pu lc tio or a y oth r IEC
Pu lc tio s
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in isp nsa le for th c re t a plc tio of this p blc tio
9) Ate tio is drawn to th p s ibi ty th t some of th eleme ts of this IEC Pu lc tio ma b th su je t of
p te t rig ts IEC sh l n t b h ld resp nsible for id ntifyin a y or al su h p te t rig ts
The main task of IEC tec nical commite s is to pre are International Stan ard In
ex e tional circ mstan es, a tec nical commit e may pro ose the publ cation of a tec nical
sp cification when
• the req ired s p ort can ot b o tained for the publ cation of an International Stan ard,
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• the s bject is sti u der tec nical develo ment or where, for an other re son, there is the
future but no immediate p s ibi ty of an agre ment on an International Stan ard
Tec nical sp cification are s bject to review within thre ye rs of publ cation to decide
whether they can b tran formed into International Stan ard
Trang 7This secon edition can els an re laces the first edition publ s ed in 2 0 This edition
con titutes a tec nical revision
This edition in lu es the fol owin sig ificant tec nical c an es with resp ct to the previou
edition:
( ogether with IEC 6 8 0-5-10 /AMD1);
b) Refinement of some test cases to en an e o era i ty b twe n tested devices;
c) Ad itional test cases (mainly negative test cases) ad ed
The text of this tec nical sp cification is b sed on the folowin doc ments:
Ful information on the votin for the a proval of this tec nical sp cification can b fou d in
the re ort on votin in icated in the ab ve ta le
This publcation has b en drafed in ac ordan e with the ISO/IEC Directives, Part 2
A l st of al p rts of IEC 6 8 0 series, publs ed u der the general title Teleco trol e qu ipme t
The commit e has decided that the contents of this publ cation wi remain u c an ed u ti
the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data
related to the sp cific publ cation At this date, the publ cation wi b
• tran formed into an International stan ard,
• reconfirmed,
• re laced by a revised edition, or
A bi n ual version of this publ cation may b is ued at a later date
IMPORTANT – Th 'colour in ide' logo on the cov r pa e of this publ c tion indic te
understa ding of its conte ts Us rs s ould therefore print this doc me t usin a
colour printer
Trang 8This p rt of IEC 6 8 0, whic is a tec nical sp cification, des rib s test cases for
Trang 9TELECONTROL EQUIPMENT AND SYSTEMS –
This p rt of IEC 6 8 0, whic is a tec nical sp cification, des rib s test cases for
The u e of this p rt of IEC 6 8 0 faci tates intero era i ty by providin a stan ard method of
testin protocol implementation , but it do s not g arante intero era i ty of devices It is
-intero era i ty
The go l of this p rt of IEC 6 8 0 is to ena le u ambig ou an stan ardised evaluation of
IEC 6 8 0-5 comp nion stan ard protocol implementation The g idel nes an con ition for
tec nical sp cification Other fu ctionalty may ne d ad itional test cases but this is outside
the s o e of this p rt of IEC 6 8 0 For pro er testin , it is recommen ed to define these
ad itional test cases This doc ment is s c a Tec nical Sp cification for the mentioned
comp nion stan ard
This p rt of IEC 6 8 0 de ls mainly with commu ication conforman e testin ; therefore other
other stan ard (if a pl ca le) an the pro f of compl an e for these to ic is done ac ordin
to these stan ard
The folowin doc ments, in whole or in p rt, are normatively referen ed in this doc ment an
are in isp n a le for its a pl cation For dated referen es, only the edition cited a pl es For
1
IEC 6 8 0-5-4:19 3, Teleco trol e quipme nt a d systems – Part 5: Tra smis io p rotocols –
IEC 6 8 0-5-5:19 5, Teleco trol e quipme nt a d systems – Part 5: Tra smis io p rotocols –
Trang 10IEC 6 8 0-5-6:2 0 , Tele co trol e u ipme nt a d system s – Part 5-6: G uidelne s for
p rotocols – Comp nio sta dard forb asic te le co troltasks
p rotocols – Network ac es forIEC 6 870-5-10 1 usin sta dard tra sp ort p rofie s
For the purp ses of this doc ment, the terms an definition given in IEC 6 8 0-5-6 a ply
For the purp ses of this doc ment, the a breviation given in IEC 6 8 0-5-6 a ply
An overview of tests is given in Ta les 1 to 2 Proced ral an fu ctional testin s al alway
start with the Station Initialsation fu ction an proce d with the next Basic Ap l cation
a le to fu ction as des rib d in the sp cific test case
The test proced res in Ta les 1 throu h 1 s al b car ied out with no er ors detected d rin
prefera ly automatical y p rformed by the u ed test platorm
In ad ition to the p rforman e criteria l sted in the test proced res, 5.3 l sts the protocol
sp cification that s al b verified automatical y by the testin sofware or verified man al y
by review of the test history log afer exec tion of the test proced res The verification s al
res lt in no er ors detected d rin the complete test proced re
This test plan has a direct referen e to the PICS an p s ibly a PIXIT Without a referen e to
a PICS or PIXIT this test plan is o solete
Test case n mb rin s ntax is s bclau e n mb r + ta le n mb r + test case n mb r
Test cases are man atory de en in on the des ription in the column ‘Req ired’ The
fol owin situation are p s ible:
M = Man atory test case regardles if ena led in the PICS/PIXIT, not only in one
situation but d rin exec tion of al the tests as in the PICS an /or PIXIT
PICS, x.x = Man atory test case if the fu ctional ty is ena led in the PICS (by markin the
a pl ca le c eck b x), with a referen e to the section n mb r of the PICS (x.x);
NOT PICS 9.x alwa s refers to 6 8 0-5-10 :2 0 , Cla se 9
Trang 11For e c test case the test res lts s al b mark d in the a pro riate column of the test res lt
c art in 5.5 an 5.6 Eac test case can either p s the test (Pas ed), fai the test (Faied),
not a pl ca le, wh n th co figuratio v lu is n t su p rte by th d vice (N.A.), or the test case
was not p rformed (Empty) Ide l y, th re sh uld b n empty b xes wh n testing is complete
For testin reverse direction, the same test proced res a ply in the o p site direction
(re lace "Control n " with "Control ed" an vice versa), ex e t for COT4 -4 whic are only
defined in Monitor direction (only a control ed station is alowed to sen these COT)
The test ta les are divided into 5 s bclau es:
• Subclau e 5.2 Config ration p rameters IEC 6 8 0-5-10
• Subclau e 5.3 Verification of IEC 6 8 0-5-10 commu ication
• Subclau e 5.4 Conforman e test proced res
• Subclau e 5.5 Test res lt c art
• Subclau e 5.6 Test res lts of command tran mis ion
pro e ures a c rdin 5.4
Do v rific tio a c rdin to 5.3
Trang 12n
Trang 13M
Trang 17M