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Tiêu đề Appearance Inspection Method for Plated Surfaces on PWB
Trường học International Electrotechnical Commission
Chuyên ngành Electrical Materials and Printed Boards
Thể loại Technical Specification
Năm xuất bản 2016
Thành phố Geneva
Định dạng
Số trang 20
Dung lượng 0,93 MB

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IEC TS 61 1 89 3 301 Edition 1 0 201 6 07 TECHNICAL SPECIFICATION Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 3 301 Test methods fo[.]

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IEC TS 611 89- 3- 301

Edit io 1.0 2 16-0

Test met hods for electrical mat erials, printed boards and other int erconnect ion

st ruct ures and assembl es –

Part 3- 301: Test met hods for int erconnect ion struct ures (print ed boards) –

Appearance inspection met hod for plat ed sur aces on PW B

®

c olour

inside

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THIS PUBLICATION IS COPYRIGHT PROT CTED

Copyr ight © 2 16 IEC, Ge e a, Switzer la d

Al r i hts r es r ve Unle s oth r wis s e ifi d, n p r t of this p blc tio ma b r epr od c d or uti z d in a y for m

or b a y me n ,ele tr onic or me h nic l in lu in p oto o yin a d microfim, with ut p r mis io in wr itin fr om

eith r IEC or IEC's memb r Natio al Commite in th c u tr y of th r eq e ter If y u h v a y q e tio s a o t IEC

c p r i ht or h v a e q iry a o t o tainin a ditio al r i hts to this p blc tio , ple s c nta t th a dr es b low or

y ur lo al IEC memb r Natio al Commite for f ur th r infor matio

Ab ut he IEC

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Th st an -alo e a plc at io for c on ult in t he e t ire

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Te h ic al Sp cific at io s, Tec hnic al R ep rt s a d ot her

d c ume t s A v aia le for PC, Ma OS, A ndroid Ta let s a d

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v riety of c riteria (efere c e n mb r, text, t ec hnic l

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St ay u to d t e o al n w IEC p blc t io s Ju t Pu ls e

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als o c a mo t h b emai

Ele tro edia - www.ele tro edia.org

Th world's le din o ln dic t io ary of elec t ro ic a d

elec t ric l t erms c ont ainin 2 0 0 t erms a d d finitio s in

En ls a d Fre c , wit h e uiv le t t erms in 15 a dit io al

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Fre c ex t rac t ed fom t he Terms a d Definit io s cla s of

IEC p blc tio s is u d sin e 2 0 Some e trie h v b e

c lec t ed fom e rler p blc at io s of IEC TC 3 , 7 , 8 a d

CIS R

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If y ou wis t o giv u your fe d ac k o t his p blc t io or

n e furt her a sist an e,ple s c nt act t he Cu t omer Servic

Ce t re: c sc@ie c h

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IEC TS 61 1 89- 3- 301

Edit io 1.0 2 16-0

Test methods for electrical mat erials, printed boards and ot her int erconnect ion

struct ures and assembl es –

Part 3- 301: Test met hods for int erconnect ion st ructures (printed boards) –

A ppearance inspect ion met hod for plat ed sur aces on PW B

INT R NATIONAL

ELECTR OT C NICAL

®

W arnin ! Ma e s re th t you o tain d this publ c tion from a a thorize distributor

c olour

inside

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CONTENTS

FOREWORD 3

1 Sco e 5

2 Normative ref eren es 5

3 Terms an def i ition 5

4 Test sp cimen 5

5 Eq ipment / a p ratu 5

5.1 Evaluation of lu tre non-u if ormity 5

5.2 Evaluation of colour non-u if ormity 6

6 Proced re 6

6.1 Outlne of the method 6

6.2 Sp cimen pre aration 6

6.3 Imagin of s rf ace rou h es /c romaticity distribution 6

6.4 Binarization of images 6

6.5 Extraction of f eature q antities 7

6.6 Derivation of dis riminant f un tion 7

6.7 Sy tem registration 7

7 Re ort 8

8 Ad itional inf ormation 8

An ex A (informative) Example of eq ipment an tested res lt for lu tre non -u if ormity 9

A.1 Eq ipment for lu tre non-u iformity in p ction 9

A.2 Tested res lt 9

A.2.1 Surf ace rou h es image 9

A.2.2 Binarized image an feature extraction 1

A.2.3 Freq en y analy is of f eature q antities 12 A.2.4 Final estimate 12 An ex B (informative) Example of tested res lt for colour non-u iformity in p ction 13 B.1 Image analy is of colour non-u iformity 13 B.2 Fe ture extraction an dis riminant analy is 14 Bibl ogra h 16 Fig re 1 – Flow c art of the test proced re 6

Fig re A.1 – Eq ipment prototyp 9

Fig re A.2 – Images of gold-platin of non-defective an defective prod cts 10 Fig re A.3 – Images of S- an P-p larized comp nents, an Ψ’ for gold-platin with lu tre non-u if ormity 1

Fig re A.4 – Image examples of gold-platin with lu tre non-u if ormity 11

Fig re A.5 – Example of f req en y analy is of f eature q antity 12

Fig re A.6 – Example of the fi al estimate of the q al ty of gold-platin 12

Fig re B.1 – Images of gold-platin p d 13

Fig re B.2 – Images of colour distribution 14

Fig re B.3 – Freq en y analy is example of a f eature q antity 14

Fig re B.4 – Example of the dis riminant analy is res lt 15

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INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 3-301: Test methods f or interconnection structures (printed boards) –

Appearance inspection method f or plated surf aces on PWB

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

al n tio al ele trote h ic l c mmite s (IEC Natio al Commite s) Th o je t of IEC is to promote

intern tio al c -o eratio o al q e tio s c n ernin sta d rdiz tio in th ele tric l a d ele tro ic f i ld To

this e d a d in a ditio to oth r a tivitie , IEC p bls e Intern tio al Sta d rd , Te h ic l Sp cif i atio s,

Te h ic l Re orts, Pu lcly Av ia le Sp cific tio s (PAS) a d Guid s (h re f ter refere to a “IEC

Pu lc tio (s)”) Th ir pre aratio is e tru te to te h ic l c mmite s; a y IEC Natio al Commite intere te

in th s bje t d alt with ma p rticip te in this pre aratory work Intern tio al g v rnme tal a d n

n-g v rnme tal org niz tio s laisin with th IEC als p rticip te in this pre aratio IEC c la orate clo ely

with th Intern tio al Org niz tio for Sta d rdiz tio (ISO) in a c rd n e with c n itio s d termin d b

a re me t b twe n th two org niz tio s

2) Th formal d cisio s or a re me ts of IEC o te h ic l maters e pre s, a n arly a p s ible, a intern tio al

c n e s s of o inio o th rele a t s bje ts sin e e c te h ic l c mmite h s re re e tatio fom al

intere te IEC Natio al Commite s

3) IEC Pu lc tio s h v th form of re omme d tio s f or intern tio al u e a d are a c pte b IEC Natio al

Commite s in th t s n e Whie al re s n ble eforts are ma e to e s re th t th te h ic l c nte t of IEC

Pu lc tio s is a c rate, IEC c n ot b h ld re p n ible for th wa in whic th y are u e or f or a y

misinterpretatio b a y e d u er

4) In ord r to promote intern tio al u iformity, IEC Natio al Commite s u d rta e to a ply IEC Pu lc tio s

tra s are tly to th ma imum e te t p s ible in th ir n tio al a d re io al p blc tio s An div rg n e

b twe n a y IEC Pu lc tio a d th c r e p n in n tio al or re io al p blc tio s al b cle rly in ic te in

th later

5) IEC its lf d e n t pro id a y ate tatio of c nformity In e e d nt c rtific tio b die pro id c nformity

a s s me t s rvic s a d, in s me are s, a c s to IEC mark of c nformity IEC is n t re p n ible for a y

s rvic s c rie o t b in e e d nt c rtif i atio b die

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oth r d ma e of a y n ture wh ts e er, wh th r dire t or in ire t, or f or c sts (in lu in le al fe s) a d

e p n e arisin o t of th p blc tio , u e of, or rela c u o , this IEC Pu lc tio or a y oth r IEC

Pu lc tio s

8) Ate tio is drawn to th Normativ refere c s cite in this p blc tio Us of th refere c d p blc tio s is

in is e s ble for th c re t a plc tio of this p blc tio

9) Ate tio is drawn to th p s ibi ty th t s me of th eleme ts of this IEC Pu lc tio ma b th s bje t of

p te t rig ts IEC s al n t b h ld re p n ible f or id ntifyin a y or al s c p te t rig ts

The main tas of IEC tec nical commite s is to pre are International Stan ard In

ex e tional circ mstan es, a tec nical commit e may pro ose the publ cation of a tec nical

sp cif i ation when

• the req ired s p ort can ot b o tained for the publ cation of an International Stan ard,

despite re e ted ef f orts, or

• the s bject is sti u der tec nical develo ment or where, f or an other re son, there is the

f uture but no immediate p s ibi ty of an agre ment on an International Stan ard

Tec nical sp cif i ation are s bject to review within thre ye rs of publ cation to decide

whether they can b tran f ormed into International Stan ard

IEC TS 61 8 -3-3 1, whic is a tec nical sp cifi ation, has b en pre ared by IEC tec nical

commit e 91: Electronic as embly tec nolog

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The text of this tec nical sp cif i ation is b sed on the folowin doc ments:

En uiry draft Re ort o v tin

Ful information on the votin for the a proval of this tec nical sp cif i ation can b fou d in

the re ort on votin in icated in the ab ve ta le

This publcation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

A l st of al p rts in the IEC 61 8 series, publs ed u der the general title Te t meth ds for

electric l materials, printed b ards a d other interc n e tio stru ture a d a s mb e , can

b fou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "htp:/we store.iec.c " in the data

related to the sp cifi publ cation At this date, the publ cation wi be

• tran formed into an International stan ard,

• with rawn,

• re laced by a revised edition, or

A bi n ual version of this publ cation may b is ued at a later date

IMPORTANT – Th 'colour in ide' logo on the cov r pa e of this publ c tion indic te

understa ding of its conte ts Us rs s ould therefore print this doc me t usin a

colour printer

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TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND

Part 3-301: Test methods f or interconnection structures (printed boards) –

Appearance inspection method f or plated surf aces on PWB

This p rt of IEC 61 8 outlnes a way to determine the a p aran e non-u if ormity of b th the

lu tre an colour on plated metal s rf aces in printed wirin b ard (PWBs) The method is

a pl ca le to gold, nic el an co p r platin in PWBs

There are no normative ref eren es in this doc ment

3 Terms and def initions

For the purp ses of this doc ment, the fol owin terms an def i ition a ply

ISO an IEC maintain terminological data ases for u e in stan ardization at the f olowin

• IEC Electro edia: avai a le at ht p:/ www.electro edia.org/

• ISO Onl ne browsin platf orm: avai a le at htp:/ www.iso.org/o p

3.1

lustre non-unif ormity

a normal rou h es distribution in plated s rf aces le din to ir eg lar brig tnes of ref lected

l g t

3.2

colour non-uniformity

ir eg lar reflection sp ctrum

Note 1 to e try: Colo r n n-u if ormity is c u e b oth r influ n e th n ro g n s c a g , s c a a n rmal

c mp n nts, a h sio of foreig mater a d o id tio in plate s ra e

4 Test specimens

4.1 Sp cimen dimen ion an f orms s ould b in ac ordan e with the test s stem

4.2 Sp cimen of non-defective an of defective prod cts, of several ten to one h n red,

at le st of ten, are req ired as te c er data f or e c series of evaluation

5 Equipment / apparatus

5.1 Ev luation of lu tre non-unif ormity

For the evaluation of the lu tre non-u if ormity, a test s stem ca a le of me s rin the

s rf ace rou h es distribution s ould b u ed As f or an o tical method, CCD (c arg

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e-coupled device), or CMOS (complementary metal oxide semicon u tor) camera s stems, or

as f or a mec anical method, stylu typ tester s al b u ed, resp ctively

5.2 Ev luation of colour non-uniformity

For the evaluation of the colour non-u iformity, an o tical s stem ca a le of me s rin the

c romaticity distribution s al b u ed

6.1 Outl ne of the method

The method is outlned by the f low c art in Fig re 1

Th n mb rs in ic te th s b la s refere c s

Figure 1 – Flow c art of the te t proc dure

In this method, the proced res of the evaluation of lu tre non-u if ormity an colour non

-u if ormity are b sical y the same

6.2 Spe ime preparation

Req irements for sp cimen are sp cif ied in Clau e 4

6.3 Ima ing of s rf ac rough e s/c romaticity distribution

Ac uire the images of s rf ace rou h es f or the lu tre non-u iformity, an /or of c romaticity

distribution f or the colour non-u if ormity, by the a p ratu / eq ipment mentioned in Clau e 5

6.4 Binarization of ima e

Obtain the binary images by the thres old proces in The region givin values sig if i antly

deviatin from the average value of the whole image con erned is cou ted to b 1 (white

pixels) as a normal, an the others to b 0 (blac pixels) as normal

IEC

6.2 Sp cime pre aratio

6.3 Ima in of s r a e ro g n s /

c romaticity distrib tio

6.4 Bin rizin of ima e

6.5 Extra tio of fe ture q a titie

6.6 Deriv tio of dis rimin nt fu ctio

6.7 Sy tem re istratio

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The thres old setin s ould b agre d up n b twe n the p rties

6.5 Extra tion of f eature qua titie

Extract the f eature q antities of a normal region from the binarized images by image

analy is of the size, are , s a e, an distribution, etc of the ir eg larities

For example, the diagonal len th of the minimum rectan les b u din the clu ters of

a normal region , an c an e in the n mb r of pixels by the binary image contraction of

re etition can b u ed as feature q antities

The typ an n mb r of f eature q antities to b u ed s ould b agre d up n b twe n the

p rties

6.6 Deriv tion of dis rimin nt f unction

Dis riminant analy is s al b p rf ormed u in the f eature q antities extracted from

sp cimen of non-def ective an defective prod cts as in icated in 6.5 as the te c er data to

spl t into two groups

The l ne r dis riminant fun tion is expres ed by Eq ation (1):

+ +

+ +

=

i i X a X

a X a X a a Z

3 3 2 2 1 1 0

(1)

where

Z is the dis riminant s ore;

a

0

is a con tant;

i (s bs ript in icates the dimen ion of the dis riminant f un tion;

a

i

is the dis riminant co f ficient as weig tin f actor f or the se aration of test sp cimen of

te c er data into the two groups, non-defective and def ective;

X

i

is the f req en y of feature q antities taken into con ideration

Eq ation (1) is def i ed to distin uis the group of non-defective sp cimen from the group of

defective sp cimen by the value Z, whic is resp ctively set to b p sitive for non-defective

an negative f or def ective sp cimen by adju tin a

i

0

If neces ary, the typ of non-l ne r dis riminant f un tion b sed on Mahalano is' general zed

distan e, D

2

may also b u ed

The typ of the dis riminant fun tion to b u ed can b agre d up n b twe n the p rties

6.7 Sy tem re istration

The res ltin dis riminant f un tion s al b registered to the test s stem to p rf orm evaluation

of u k own sp cimen

For the u k own sp cimen, the value of Z s al b calc lated u in the registered f un tion,

whic is def i ed by Eq ation (1) in ad an e in the l ne r dis riminant analy is

From the values of Z o tained, the q al ty of the u k own sp cimen can b estimated

In case of a non-l ne r dis riminant fun tion, the values of D

2

s al b u ed f or the estimate of

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7 Re ort

7.1 Re ort the sp cimen n mb rs of b th non-def ective an defective prod cts u ed as the

te c er data

7.2 Re ort the a p ratu / eq ipment information for ca turin images of plated s rf aces in

the tested sp cimen

7.3 Re ort the value of thres old for the binarizin images

7.4 Re ort the typ , ste pin width, an ran e of the f eature q antities extracted from the

binarized images

7.5 Re ort the dis riminant fun tion derived for evaluation of the tested sp cimen

8 Additional inf ormation

8.1 An o tical method b sed on the p larization analy is an image recog ition has b en

pro osed f rom AIST, Ja an, an a p werful camera s stem that can o serve b th a lu tre

ir eg larity an u even colourin at the same time has b en develo ed

8.2 Examples of the eq ipment an tested res lts are s own in An ex A an An ex B

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