IEC TS 61 1 89 3 301 Edition 1 0 201 6 07 TECHNICAL SPECIFICATION Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 3 301 Test methods fo[.]
Trang 1IEC TS 611 89- 3- 301
Edit io 1.0 2 16-0
Test met hods for electrical mat erials, printed boards and other int erconnect ion
st ruct ures and assembl es –
Part 3- 301: Test met hods for int erconnect ion struct ures (print ed boards) –
Appearance inspection met hod for plat ed sur aces on PW B
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Trang 3IEC TS 61 1 89- 3- 301
Edit io 1.0 2 16-0
Test methods for electrical mat erials, printed boards and ot her int erconnect ion
struct ures and assembl es –
Part 3- 301: Test met hods for int erconnect ion st ructures (printed boards) –
A ppearance inspect ion met hod for plat ed sur aces on PW B
INT R NATIONAL
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Trang 4CONTENTS
FOREWORD 3
1 Sco e 5
2 Normative ref eren es 5
3 Terms an def i ition 5
4 Test sp cimen 5
5 Eq ipment / a p ratu 5
5.1 Evaluation of lu tre non-u if ormity 5
5.2 Evaluation of colour non-u if ormity 6
6 Proced re 6
6.1 Outlne of the method 6
6.2 Sp cimen pre aration 6
6.3 Imagin of s rf ace rou h es /c romaticity distribution 6
6.4 Binarization of images 6
6.5 Extraction of f eature q antities 7
6.6 Derivation of dis riminant f un tion 7
6.7 Sy tem registration 7
7 Re ort 8
8 Ad itional inf ormation 8
An ex A (informative) Example of eq ipment an tested res lt for lu tre non -u if ormity 9
A.1 Eq ipment for lu tre non-u iformity in p ction 9
A.2 Tested res lt 9
A.2.1 Surf ace rou h es image 9
A.2.2 Binarized image an feature extraction 1
A.2.3 Freq en y analy is of f eature q antities 12 A.2.4 Final estimate 12 An ex B (informative) Example of tested res lt for colour non-u iformity in p ction 13 B.1 Image analy is of colour non-u iformity 13 B.2 Fe ture extraction an dis riminant analy is 14 Bibl ogra h 16 Fig re 1 – Flow c art of the test proced re 6
Fig re A.1 – Eq ipment prototyp 9
Fig re A.2 – Images of gold-platin of non-defective an defective prod cts 10 Fig re A.3 – Images of S- an P-p larized comp nents, an Ψ’ for gold-platin with lu tre non-u if ormity 1
Fig re A.4 – Image examples of gold-platin with lu tre non-u if ormity 11
Fig re A.5 – Example of f req en y analy is of f eature q antity 12
Fig re A.6 – Example of the fi al estimate of the q al ty of gold-platin 12
Fig re B.1 – Images of gold-platin p d 13
Fig re B.2 – Images of colour distribution 14
Fig re B.3 – Freq en y analy is example of a f eature q antity 14
Fig re B.4 – Example of the dis riminant analy is res lt 15
Trang 5INTERNATIONAL ELECTROTECHNICAL COMMISSION
Part 3-301: Test methods f or interconnection structures (printed boards) –
Appearance inspection method f or plated surf aces on PWB
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commit e 91: Electronic as embly tec nolog
Trang 6The text of this tec nical sp cif i ation is b sed on the folowin doc ments:
En uiry draft Re ort o v tin
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the re ort on votin in icated in the ab ve ta le
This publcation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2
A l st of al p rts in the IEC 61 8 series, publs ed u der the general title Te t meth ds for
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• tran formed into an International stan ard,
• with rawn,
• re laced by a revised edition, or
A bi n ual version of this publ cation may b is ued at a later date
IMPORTANT – Th 'colour in ide' logo on the cov r pa e of this publ c tion indic te
understa ding of its conte ts Us rs s ould therefore print this doc me t usin a
colour printer
Trang 7TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND
Part 3-301: Test methods f or interconnection structures (printed boards) –
Appearance inspection method f or plated surf aces on PWB
This p rt of IEC 61 8 outlnes a way to determine the a p aran e non-u if ormity of b th the
lu tre an colour on plated metal s rf aces in printed wirin b ard (PWBs) The method is
a pl ca le to gold, nic el an co p r platin in PWBs
There are no normative ref eren es in this doc ment
3 Terms and def initions
For the purp ses of this doc ment, the fol owin terms an def i ition a ply
ISO an IEC maintain terminological data ases for u e in stan ardization at the f olowin
• IEC Electro edia: avai a le at ht p:/ www.electro edia.org/
• ISO Onl ne browsin platf orm: avai a le at htp:/ www.iso.org/o p
3.1
lustre non-unif ormity
a normal rou h es distribution in plated s rf aces le din to ir eg lar brig tnes of ref lected
l g t
3.2
colour non-uniformity
ir eg lar reflection sp ctrum
Note 1 to e try: Colo r n n-u if ormity is c u e b oth r influ n e th n ro g n s c a g , s c a a n rmal
c mp n nts, a h sio of foreig mater a d o id tio in plate s ra e
4 Test specimens
4.1 Sp cimen dimen ion an f orms s ould b in ac ordan e with the test s stem
4.2 Sp cimen of non-defective an of defective prod cts, of several ten to one h n red,
at le st of ten, are req ired as te c er data f or e c series of evaluation
5 Equipment / apparatus
5.1 Ev luation of lu tre non-unif ormity
For the evaluation of the lu tre non-u if ormity, a test s stem ca a le of me s rin the
s rf ace rou h es distribution s ould b u ed As f or an o tical method, CCD (c arg
Trang 8e-coupled device), or CMOS (complementary metal oxide semicon u tor) camera s stems, or
as f or a mec anical method, stylu typ tester s al b u ed, resp ctively
5.2 Ev luation of colour non-uniformity
For the evaluation of the colour non-u iformity, an o tical s stem ca a le of me s rin the
c romaticity distribution s al b u ed
6.1 Outl ne of the method
The method is outlned by the f low c art in Fig re 1
Th n mb rs in ic te th s b la s refere c s
Figure 1 – Flow c art of the te t proc dure
In this method, the proced res of the evaluation of lu tre non-u if ormity an colour non
-u if ormity are b sical y the same
6.2 Spe ime preparation
Req irements for sp cimen are sp cif ied in Clau e 4
6.3 Ima ing of s rf ac rough e s/c romaticity distribution
Ac uire the images of s rf ace rou h es f or the lu tre non-u iformity, an /or of c romaticity
distribution f or the colour non-u if ormity, by the a p ratu / eq ipment mentioned in Clau e 5
6.4 Binarization of ima e
Obtain the binary images by the thres old proces in The region givin values sig if i antly
deviatin from the average value of the whole image con erned is cou ted to b 1 (white
pixels) as a normal, an the others to b 0 (blac pixels) as normal
IEC
6.2 Sp cime pre aratio
6.3 Ima in of s r a e ro g n s /
c romaticity distrib tio
6.4 Bin rizin of ima e
6.5 Extra tio of fe ture q a titie
6.6 Deriv tio of dis rimin nt fu ctio
6.7 Sy tem re istratio
Trang 9The thres old setin s ould b agre d up n b twe n the p rties
6.5 Extra tion of f eature qua titie
Extract the f eature q antities of a normal region from the binarized images by image
analy is of the size, are , s a e, an distribution, etc of the ir eg larities
For example, the diagonal len th of the minimum rectan les b u din the clu ters of
a normal region , an c an e in the n mb r of pixels by the binary image contraction of
re etition can b u ed as feature q antities
The typ an n mb r of f eature q antities to b u ed s ould b agre d up n b twe n the
p rties
6.6 Deriv tion of dis rimin nt f unction
Dis riminant analy is s al b p rf ormed u in the f eature q antities extracted from
sp cimen of non-def ective an defective prod cts as in icated in 6.5 as the te c er data to
spl t into two groups
The l ne r dis riminant fun tion is expres ed by Eq ation (1):
+ +
+ +
=
i i X a X
a X a X a a Z
3 3 2 2 1 1 0
(1)
where
Z is the dis riminant s ore;
a
0
is a con tant;
i (s bs ript in icates the dimen ion of the dis riminant f un tion;
a
i
is the dis riminant co f ficient as weig tin f actor f or the se aration of test sp cimen of
te c er data into the two groups, non-defective and def ective;
X
i
is the f req en y of feature q antities taken into con ideration
Eq ation (1) is def i ed to distin uis the group of non-defective sp cimen from the group of
defective sp cimen by the value Z, whic is resp ctively set to b p sitive for non-defective
an negative f or def ective sp cimen by adju tin a
i
0
If neces ary, the typ of non-l ne r dis riminant f un tion b sed on Mahalano is' general zed
distan e, D
2
may also b u ed
The typ of the dis riminant fun tion to b u ed can b agre d up n b twe n the p rties
6.7 Sy tem re istration
The res ltin dis riminant f un tion s al b registered to the test s stem to p rf orm evaluation
of u k own sp cimen
For the u k own sp cimen, the value of Z s al b calc lated u in the registered f un tion,
whic is def i ed by Eq ation (1) in ad an e in the l ne r dis riminant analy is
From the values of Z o tained, the q al ty of the u k own sp cimen can b estimated
In case of a non-l ne r dis riminant fun tion, the values of D
2
s al b u ed f or the estimate of
Trang 107 Re ort
7.1 Re ort the sp cimen n mb rs of b th non-def ective an defective prod cts u ed as the
te c er data
7.2 Re ort the a p ratu / eq ipment information for ca turin images of plated s rf aces in
the tested sp cimen
7.3 Re ort the value of thres old for the binarizin images
7.4 Re ort the typ , ste pin width, an ran e of the f eature q antities extracted from the
binarized images
7.5 Re ort the dis riminant fun tion derived for evaluation of the tested sp cimen
8 Additional inf ormation
8.1 An o tical method b sed on the p larization analy is an image recog ition has b en
pro osed f rom AIST, Ja an, an a p werful camera s stem that can o serve b th a lu tre
ir eg larity an u even colourin at the same time has b en develo ed
8.2 Examples of the eq ipment an tested res lts are s own in An ex A an An ex B