Iec 60384 16 2005

INTERNATIONAL STANDARD IEC 60384 16 QC 301200 Second edition 2005 11 Fixed capacitors for use in electronic equipment – Part 16 Sectional specification Fixed metallized polypropylene film dielectric d[.]

Scope

This part of IEC 60384 applies to fixed capacitors with metallized electrodes and polypropylene dielectric for use in electronic equipment

Certain capacitors possess "self-healing properties" based on their usage conditions and are primarily designed for direct voltage applications Capacitors intended for alternating voltage and pulse applications are excluded from this category but are addressed under IEC 60384-17.

The maximum power to be applied is 500 var at 50 Hz and the maximum peak voltage is 2 500 V

Two performance grades of capacitors are covered, Grade 1 for long-life application and

Capacitors for electromagnetic interference suppression are not included, but are covered by

Capacitors for electrical shock hazard protection (covered by IEC 60065) and fluorescent lamp and motor capacitors (covered by IEC technical committee 33, and IEC technical committee 34).

Object

This standard aims to establish preferred ratings and characteristics for capacitors, selecting appropriate quality assessment procedures, tests, and measurement methods from IEC 60384-1 (1999) It also outlines general performance requirements for this type of capacitor Detailed specifications referencing this sectional specification must adhere to test severities and requirements that meet or exceed the prescribed performance levels, as lower performance levels are not acceptable.

Normative references

The following referenced documents are indispensable for the application of this document

For dated references, only the edition cited applies For undated references, the latest edition of the referenced document (including any amendments) applies

IEC 60063:1963, Preferred number series for resistors and capacitors

IEC 60068-1, Environmental testing Part 1: General and guidance

IEC 60384-1, Fixed capacitors for use in electronic equipment – Part 1: Generic specification

IEC 60384-16-1, Fixed capacitors for use in electronic equipment – Part 16: Blank detail specification: Fixed metallized polypropylene film dielectric d.c capacitors – Assessment level E

IEC 60410, Sampling plans and procedures for inspection by attributes

ISO 3, Preferred numbers – Series of preferred numbers

LICENSED TO MECON Limited - RANCHI/BANGALORE FOR INTERNAL USE AT THIS LOCATION ONLY, SUPPLIED BY BOOK SUPPLY BUREAU.

Information to be given in a detail specification

Detail specifications shall be derived from the relevant blank detail specification

Detail specifications must not impose requirements that are less stringent than those outlined in the generic, sectional, or blank detail specifications If more stringent requirements are included, they should be clearly listed in section 1.9 of the detail specification and marked in the test schedules, for instance, with an asterisk.

NOTE The information given in 1.4.1 may for convenience, be presented in tabular form

The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional specification

This article will include an illustration of the capacitor to facilitate easy identification and comparison with other components The detailed specification will provide dimensions and associated tolerances that impact interchangeability and mounting It is preferred that all dimensions be expressed in millimeters.

Numerical values should be provided for the body length, width, height, and wire spacing, or for cylindrical types, the body diameter along with the length and diameter of the terminations This is essential, especially when multiple items are involved.

(capacitance values/voltage ranges) are covered by a detail specification, the dimensions and their associated tolerances shall be placed in a table below the drawing

If the configuration differs from the specified description, the detailed specification must include sufficient dimensional information to accurately describe the capacitor Additionally, if the capacitor is not intended for use on printed boards, this must be explicitly mentioned in the detailed specification.

The detail specification must outline the mounting methods for standard use, as well as for vibration and shock tests Capacitors should be mounted using conventional methods, but if the design necessitates special mounting fixtures, these must be detailed in the specification and utilized during vibration and shock testing.

The ratings and characteristics shall be in accordance with the relevant clauses of this specification, together with the following:

NOTE When products approved to the detail specification may have different ranges, the following statement should be added:

"The range of values available in each voltage range is given in IEC QC 001005

Additional characteristics may be listed, when they are considered necessary to specify adequately the component for design and application purposes

The detail specification shall prescribe the test methods, severities and requirements applicable for the solderability and the resistance to soldering heat test

The detail specification shall specify the content of the marking on the capacitor and on the package Deviations from 1.6 of this sectional specification, shall be specifically stated.

Terms and definitions

For the purposes of this document, the terms and definitions of IEC 60384-1 and the following apply

1.5.1.1 performance grade 1 capacitors (long-life) capacitors intended for long-life applications with stringent requirements for the electrical parameters

1.5.1.2 performance grade 2 capacitors (general purpose) capacitors for general application where the stringent requirements of performance grade 1 are not necessary

1.5.2 stability grade capacitance drift after climatic and mechanical tests and after endurance tests

NOTE The performance grade and the stability grade shall be noted in the detail specification

1.5.3 performance grade and stability grade combinations see the table below for preferred values

Performance grades Stability grades Combination designations

The three combinations of performance grades and stability grades concern capacitance stability and tan δ values Distinction in performance of the three combinations is shown in Table 4

1.5.4 rated voltage maximum d.c voltage which may be applied continuously to a capacitor at the rated temperature

The total voltage applied to the capacitor, which includes both the direct current (d.c.) voltage and the peak alternating current (a.c.) voltage, must not exceed the capacitor's rated voltage It is important to consider the permissible peak a.c voltage at various frequencies.

Marking

See 2.4 of IEC 60384-1, with the following details:

The marking information typically includes several key items, arranged by their relative importance: a) rated capacitance, b) rated voltage (with d.c voltage denoted by the symbol – – – or ), c) tolerance on rated capacitance, d) year and month (or week) of manufacture, e) manufacturer's name or trademark, f) climatic category, g) manufacturer's type designation, and h) reference to the detail specification.

The capacitor must be distinctly labeled with items a), b), and c), along with any additional relevant information deemed necessary It is important to ensure that there is no duplication of information in the capacitor's markings.

1.6.3 The package containing the capacitor(s) shall be clearly marked with all the information listed in 1.6.1

1.6.4 Any additional marking shall be so applied that no confusion can arise

Preferred characteristics

The values given in detail specifications shall preferably be selected from the following:

The capacitors covered by this specification are classified into climatic categories according to the general rules given in IEC 60068-1

The lower and upper category temperatures and the duration of the damp heat, steady state test shall be chosen from the following:

Duration of the damp heat, steady state test: 4; 10; 21 and 56 days

The severities for the cold and dry heat tests are the lower and upper category temperatures respectively.

Preferred values of ratings

Preferred values of rated capacitance are values chosen from the E series of preferred values given in IEC 60063

The preferred tolerances on the rated capacitance are ±20 %; ±10 %; ±5 %; ±2 %; ±1 %

2.2.3 Rated capacitance with associated tolerance values

For preferred combinations of capacitance series and tolerances see the table below:

The preferred values of rated voltage are: 40 V – 63 V – 100 V – 160 V – 250 V – 400 V –

630 V – 1 000 V – 1 600 V – 2 500 V These values conform to the basic series of preferred values R5 given in ISO 3

The category voltage is equal to the rated voltage U R for upper category temperatures up to 85 °C For an upper category temperature of >85 °C the category voltage is 0,7 U R

The standard value for rated temperature is 85 °C Except for upper category temperature of

Primary stage of manufacture

The primary stage of manufacture is the winding of the capacitor element or the equivalent operation.

Structurally similar components

Capacitors considered as being structurally similar are capacitors produced with similar processes and materials, though they may be of different case sizes and values.

Certified records of released lots

According to IEC 60384-1, section 3.9, essential information must be provided in the detail specification and upon request by the purchaser Following the endurance test, the key parameters that require variable information include capacitance change, tan δ, and insulation resistance.

Qualification approval

The procedures for qualification approval testing are given in the generic specification,

The qualification approval testing schedule, based on lot-by-lot and periodic tests, is outlined in section 3.5 of this specification Additionally, the procedure for utilizing a fixed sample size schedule is detailed in sections 3.4.1 and 3.4.2.

3.4.1 Qualification approval on the basis of the fixed sample size procedures

The fixed sample size procedure outlined in IEC 60384-1, 3.5.3 b) requires that the sample be representative of the range of capacitors for which approval is being sought, which may not necessarily encompass the entire range specified in the detail specification.

The sample must include specimens with the lowest and highest voltages, as well as the corresponding lowest and highest capacitances If there are more than four rated voltages, an intermediate voltage must also be tested To approve a range, testing is necessary for either four or six capacitance/voltage combinations In cases where the range has fewer than four values, the number of specimens tested should still meet the requirements for four values.

Spare specimens are allowed under two conditions: firstly, one spare specimen per value can replace a defective item in Group 0; secondly, one spare specimen per value may be used to replace items that are defective due to incidents not caused by the manufacturer.

The numbers given in Group 0 assume that all groups are applicable If this is not so the numbers may be reduced accordingly

When new groups are added to the qualification approval test schedule, the number of specimens needed for Group 0 must be increased by the same amount as the additional groups.

Table 3 gives the number of samples to be tested in each group or subgroup together with the permissible number of defectives for qualification approval tests

For the approval of capacitors outlined in a specific detail specification, it is essential to conduct the complete series of tests listed in Tables 3 and 4 The tests must be performed sequentially, following the prescribed order for each group.

The whole sample shall be subjected to the tests of Group 0 and then divided for the other groups

Specimens found defective during the tests of Group 0 shall not be used for the other groups

"One defective" is counted when a capacitor has not satisfied the whole or a part of the tests of a group

Approval is granted when the number of defective items remains within the allowable limits for each group or subgroup, as well as the overall total permissible defects.

Tables 3 and 4 outline the fixed sample size test schedule, with Table 3 detailing the sampling and allowable defectives for various tests In contrast, Table 4, along with the information in Clause 4, provides a comprehensive summary of test conditions and performance requirements, highlighting instances where choices must be made regarding test methods or conditions in the detailed specification.

The conditions of test and performance requirements for the fixed sample size test schedule must be identical to those prescribed in the detail specification for quality conformance inspection

Table 3 – Sampling plan together with numbers of permissible defectives for qualification approval tests

Number of specimens ( n ) and number of permissible non- conformances ( c )

For four or less values to be tested c

For six values to be tested c

Group No Test Subclause of this publication

Solvent resistance of the marking

4.13 5 20 1 30 2 a As required in the detail specification b Not more than one non-conformity is permitted from any one value c Capacitance-voltage combinations, see 3.4.1

Table 4 – Test schedule for qualification approval

Subclause number and test a D or

Conditions of test a Number of specimens ( n ) and number of permissible non- conformances ( c )

Legible marking and as specified in the detail specification

4.1 Dimensions (detail) See detail specification

(tan δ ) Frequency: 1 kHz As in 4.2.3.2

4.2.1 Voltage proof See detail specification for the method

No breakdown or flashover 4.2.4 Insulation resistance

See detail specification for for the method

See detail specification for the method

Inductance: ≤ mH (see detail specification)

No seepage of impregnant or harmful deformation of the case

Visual examination No visible damage

No pre-drying See detail specification for the method (1A or 1B)

4.14 Component solvent resistance (if applicable)

Grade 2: ≤ 3 % of value measured in 4.3.1

Tangent of loss angle Increase of tan δ for C ≤ 1 à F: for Grade 1.1: ≤ 0,001 Grade 1.2: ≤ 0,002 Grade 2: ≤0,004 for C > 1 à F: see detail specification, compared to values measured in 4.3.1

Conditions of test 1) Number of specimens ( n ) and number of permissible non- conformances ( c )

4.15 Solvent resistance of the marking

Without ageing See detail specification for the method

Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within s, as applicable

C R ≤ 1 à F: at 10 kHz 4.6 Rapid change of temperature

T B = Upper category temperature Five cycles Duration t = 30 min Visual examination No visible damage

4.7 Vibration For mounting method see detail specification Frequency range: from Hz to Hz Amplitude: 0,75 mm or acceleration 100 m/s 2 (whichever is the less severe) Total duration: 6 h

4.7.2 Final inspection Visual examination No visible damage

4.9) For mounting method see detail specification Number of bumps:

Acceleration: m/s 2 Duration of pulse: ms

Acceleration: m/s 2 Duration of pulse: ms 4.8.3 or 4.9.3

Grade 2: ≤3 % of value measured in 4.6.1 Tangent of loss angle Increase of tan δ : for C ≤ 1 àF: for Grade 1.1: ≤ 0,001 Grade 1.2: ≤0,002 Grade 2: ≤ 0,004 for C > 1 àF: see detail specification, compared to values measured in 4.6.1

Insulation resistance ≥ 50 % of values in 4.2.4.2

4.10.2 Dry heat Temperature: upper category temperature Duration: 16 h

4.10.4 Cold Temperature: lower category temperature Duration: 2 h

(if required by the detail specification)

4.10.5.3 Final measurement Visual examination No permanent breakdown, flashover or harmful deformation of the case

4.10.6.2 Final measurements Visual examination No visible damage

Grade 2: ≤5 % of value measured in 4.4.2, 4.8.3 or 4.9.3 as applicable

Tangent of loss angle Increase of tan δ : for C ≤ 1 à F: for Grade 1.1: ≤ 0,0015 Grade 1.2: ≤ 0,003 Grade 2: ≤0,005 for C > 1 à F: see detail specification, compared to values measured in 4.3.1 or 4.6.1 as applicable

Insulation resistance ≥50 % of values in 4.2.4.2

Tangent of loss angle at

4.11.3 Final measurements Visual examination No visible damage

Tangent of loss angle See Table 3

Increase of tan δ : for C ≤ 1 à F: for Grade 1: ≤0,001 Grade 2: ≤ 0,002 for C > 1 à F: see detail specification, compared to values measured in 4.11.1

Tangent of loss angle: for C R > 1 àF: at 1 kHz

Tangent of loss angle Increase of tan δ : for C ≤ 1 à F: for Grade 1: ≤ 0,002 Grade 2: ≤0,004 for C > 1 à F: see detail specification, compared to values measured in 4.12.1

4.2.6 Characteristics depending on temperature (if applicable)

C R ≤ 1 àF: at 10 kHz Duration of charge: s Duration of discharge: s

4.13.3 Final measurements Capacitance ∆ C/C for Grade 1.1: ≤1 %

Group 4 (continued) Tangent of loss angle See Table 3 Increase of tan δ : for C ≤ 1 à F: for Grade 1: ≤ 0,003 Grade 2: ≤ 0,005 for C > 1 à F: see detail specification, compared to values measured in 4.13.1

Insulation resistance ≥ 50 % of values in 4.2.4.2 a Subclause numbers of test and performance requirements refer to Clause 4 of this specification b In this table: D = destructive ; ND = non-destructive.

Visual examination and check of dimensions

Legible marking and as specified in the detail specification

4.1 Dimensions (detail) See detail specification

(tan δ ) Frequency: 1 kHz As in 4.2.3.2

4.2.1 Voltage proof See detail specification for the method

No breakdown or flashover 4.2.4 Insulation resistance

See detail specification for for the method

See detail specification for the method

Inductance: ≤ mH (see detail specification)

No seepage of impregnant or harmful deformation of the case

Insulation resistance ≥ 50 % of values in 4.2.4.2 a Subclause numbers of test and performance requirements refer to Clause 4 of this specification b In this table: D = destructive ; ND = non-destructive

3.5.1 Formation of inspection lots a) Groups A and B inspection

These tests shall be carried out on a lot-by-lot basis

A manufacturer may aggregate the current production into inspection lots subject to the following safeguards:

1) The inspection lot shall consist of structurally similar capacitors (see 3.2)

2a) The sample tested shall be representative of the values and dimensions contained in the inspection lot:

– in relation to their number;

– with a minimum of five of any one value

If a sample contains fewer than five instances of any specific value, the method for selecting samples must be mutually agreed upon by the manufacturer and the national supervising inspectorate This pertains to Group C inspection.

These tests shall be carried out on a periodic basis

Samples must accurately represent the current production for the specified periods and be categorized into high, medium, and low voltage ratings To ensure comprehensive approval coverage, one case size from each voltage group will be tested during each period In future testing periods, additional case sizes and/or voltage ratings will be evaluated to encompass the entire range of production.

The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in Table 4 of the blank detail specification IEC 60384-16-1

When, according to the procedures of 3.10 of IEC 60384-1, re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and B inspection

The assessment level(s) given in the blank detail specification shall preferably be selected from the following Tables 5 and 6:

Table 5 – Lot-by-lot inspection

The Acceptable Quality Level (AQL) is defined by the sample size (n) and the permissible number of non-conforming items (c) To ensure quality control, 100% testing must be followed by re-inspection through sampling, monitoring the outgoing quality level in terms of non-conforming items per million (10^{-6}) The manufacturer is responsible for establishing the sampling level, and any parametric failure is considered a non-conforming item in the calculation of 10^{-6} values If one or more non-conforming items are found in a sample, the entire lot will be rejected The sample size for testing is specified according to the code letter for Inspection Level (IL) in Table 2a of IEC 60410.

(Single sampling plan for normal inspection)

The periodicity in months is denoted by \$p\$, while \$n\$ represents the sample size and \$c\$ indicates the permissible number of non-conforming items The assessment levels D, F, and G are currently being evaluated Additionally, the details regarding the content of the inspection subgroups can be found in clause 2 of the applicable blank detail specification.

4.1 Visual examination and check of dimensions

Robustness of terminations

Resistance to soldering heat

Solderability

Rapid change of temperature

Vibration

see detail specification Frequency range: from Hz to Hz Amplitude: 0,75 mm or acceleration 100 m/s 2 (whichever is the less severe) Total duration: 6 h

Bump

Shock

Climatic sequence

Damp heat, steady state

Endurance

Component solvent resistance

Solvent resistance of the marking

Insulation resistance ≥ 50 % of values in 4.2.4.2 a Subclause numbers of test and performance requirements refer to Clause 4 of this specification b In this table: D = destructive ; ND = non-destructive

3.5.1 Formation of inspection lots a) Groups A and B inspection

These tests shall be carried out on a lot-by-lot basis

A manufacturer may aggregate the current production into inspection lots subject to the following safeguards:

1) The inspection lot shall consist of structurally similar capacitors (see 3.2)

2a) The sample tested shall be representative of the values and dimensions contained in the inspection lot:

– in relation to their number;

– with a minimum of five of any one value

If a sample contains fewer than five instances of any specific value, the method for selecting samples must be mutually agreed upon by the manufacturer and the national supervising inspectorate This pertains to Group C inspection.

These tests shall be carried out on a periodic basis

Samples must accurately represent the current production for the specified periods and be categorized into high, medium, and low voltage ratings To ensure comprehensive approval coverage for each period, one case size from each voltage group will be tested In future periods, additional case sizes and/or voltage ratings will be tested to encompass the entire range of production.

The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in Table 4 of the blank detail specification IEC 60384-16-1

When, according to the procedures of 3.10 of IEC 60384-1, re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and B inspection

The assessment level(s) given in the blank detail specification shall preferably be selected from the following Tables 5 and 6:

Table 5 – Lot-by-lot inspection

The Acceptable Quality Level (AQL) is defined by the sample size (n) and the permissible number of non-conforming items (c) To ensure quality control, 100% testing must be followed by re-inspection through sampling, monitoring the outgoing quality level in terms of non-conforming items per million (10^-6) The manufacturer is responsible for establishing the sampling level, and any parametric failure is considered a non-conforming item in the calculation of 10^-6 values If one or more non-conforming items are found in a sample, the entire lot will be rejected The sample size for testing is specified according to the code letter for IL in Table 2a of IEC 60410.

(Single sampling plan for normal inspection)

The periodicity in months is denoted by \$p\$, while \$n\$ represents the sample size and \$c\$ indicates the permissible number of non-conforming items The assessment levels D, F, and G are currently being evaluated Additionally, the details regarding the content of the inspection subgroups can be found in clause 2 of the applicable blank detail specification.

4.1 Visual examination and check of dimensions

See IEC 60384-1, 4.6 with the following details:

The product of R 1 and the rated capacitance C x shall be smaller than or equal to 1 s and greater than 0,01 s

R 1 includes the internal resistance of the power supply

R 2 shall limit the discharge current to a value equal to or less than 1 A

4.2.1.2 The following voltages shall be applied between the measuring points of Table 3 of

IEC 60384-1, for a period of 1 min for qualification approval testing and for a period of 1 s for the lot-by-lot quality conformance testing

Table 7 – Voltages to be applied

NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed

Capacitance measurements must be conducted at a frequency of 1,000 Hz or adjusted to this frequency For rated capacitance values greater than 10 µF, frequencies between 50 Hz and 120 Hz can be utilized, but 1 kHz will serve as the reference frequency.

The peak voltage applied at 1,000 Hz must not exceed 3% of the rated voltage, while at frequencies between 50 Hz and 120 Hz, it should not surpass 20% of the rated voltage, with a maximum limit of 100 V (70 V r.m.s.).

4.2.2.2 The capacitance shall be within the specified tolerance

4.2.3 Tangent of loss angle (tan δ )

4.2.3.1 Measuring conditions for measurements at 1 000 Hz

Tan δ shall be measured as follows:

– peak voltage: ≤3 % of the rated voltage;

4.2.3.2 Requirement for measurement at 1 000 Hz

Tan δ shall not exceed the values shown in the following table:

Tangent of loss angle Measurement frequency Rated capacitance Performance

1 000 Hz C R ≤ 1 à F ≤ 10 ì 10 –4 ≤ 20 ì 10 –4 NOTE For C R >1 à F, values of tan δ must be specified in the detail specification

4.2.3.3 Measuring conditions for measurements at 10 kHz

For capacitors with C R ≤ 1 àF, tan δ shall be measured as follows:

Before conducting measurements, it is essential to fully discharge the capacitor The product of the discharge circuit's resistance and the rated capacitance of the capacitor being tested must be equal to or greater than 0.01 seconds, or any other value specified in the detailed specifications.

4.2.4.2 The measuring voltage shall be in accordance with 4.5.2 of IEC 60384-1

The voltage shall be applied immediately at the correct value through the internal resistance of the voltage source

The product of the internal resistance and the rated capacitance of the capacitor shall be smaller than 1 s or any other value prescribed in the detail specification

The insulation resistance shall meet the following requirements:

( R = insulation resistance between the terminations)

Minimum insulation resistance between the terminations

Minimum insulation resistance between terminations and case

G Ω Measuring points in accordance with Table 3 of IEC 60384-1:

When testing at temperatures different from 20 °C, results must be adjusted to 20 °C using the appropriate correction factor If there is uncertainty, measurements taken at 20 °C are considered definitive Average correction factors for metallized polypropylene film capacitors should be applied accordingly.

The maximum inductance value shall be stated in the detail specification

An approximative value can be provided from measurement of resonance frequency and capacitance value measured in 4.2.2

4.2.6 Characteristics depending on temperature (if required in the detail specification)

See IEC 60384-1, 4.24.1 with the following details:

The capacitance measurements shall be carried out at points b), d) and f) The measurement of insulation resistance is also carried out at point f)

Table 11 – Characteristics at lower category temperature

Test temperature as given in item b) Temperature characteristic of capacitance

Table 12 – Characteristics at upper category temperature

Test temperature as given in item b)

Insulation resistance (measuring point 1b) and 1c))

The capacitance shall be measured according to 4.2.2

The tangent of loss angle shall be measured according to 4.2.3.1 or 4.2.3.3 as appropriate

4.4.2 Final inspection, measurements and requirements

The capacitors shall be visually examined and measured and shall meet the requirements given in Table 4

The requirements for the globule test method shall be prescribed in the detail specification

When neither the solder bath nor the solder globule method is appropriate the soldering iron test shall be used with soldering iron size A

4.5.2 The performance requirements are given in Table 4

Initial measurements shall be made as prescribed by 4.3.1

Duration of exposure at the temperature limits: 30 min, unless otherwise prescribed in the detail specification for larger capacitors

When prescribed in the detail specification, capacitors shall be measured after recovery; they shall meet the requirements of the detail specification

4.7.1 The following degree of severity of Test Fc applies:

0,75 mm displacement or 100 m/s 2 , whichever is the lower amplitude, over one of the following frequency ranges: 10 Hz to 55 Hz, 10 Hz to 500 Hz, 10 Hz to 2 000 Hz The total duration shall be 6 h

The specification must outline the frequency range and the required mounting method For axial lead capacitors designed for lead-only mounting, the distance from the body to the mounting point should be 6 mm ± 1 mm.

The detail specification shall state whether the bump or the shock test applies

4.8.2 The detail specification shall state which of the following severities applies:

Total number of bumps: 1 000 or 4 000

Pulse duration: 6 ms or 16 ms

The specification must outline the required mounting method For capacitors with axial leads designed for lead-only mounting, the distance from the capacitor body to the mounting point should be 6 mm ± 1 mm.

4.8.3 Final inspection measurements and requirements

The detail specification shall state whether the bump or the shock test applies

4.9.2 The detail specification shall state which of the following preferred severities applies:

Corresponding duration of the pulse ms

The specification must outline the required mounting method For capacitors with axial leads designed for lead-only mounting, the distance from the body to the mounting point should be 6 mm ± 1 mm.

Not required, see 4.4.2, 4.8.3 or 4.9.3 as applicable

4.10.3 Damp heat, cyclic, Test Db, first cycle

4.10.5.1 The test, if required in the detail specification, shall be made at a temperature of 15 °C to 35 °C and a pressure of 8 kPa The duration of the test shall be 1 h

4.10.5.2 While still at the specified low pressure and during the last 5 min of the 1 h period, the rated voltage shall be applied

The capacitor samples for testing will be divided into two or three sections, with each section undergoing one of the tests specified in Table 3.

IEC 60384-1 The test voltage shall be applied to terminations, case, etc as given in 4.2.1.2

The capacitors shall be visually examined and shall meet the requirements given in Table 4

4.10.6 Damp heat, cyclic, Test Db, remaining cycles

4.10.6.1 Within 15 min after removal from the damp heat test, the rated voltage shall be applied for 1 min at test point A using the test circuit conditions as given in 4.2.1

4.10.6.2 Final inspection, measurements and requirements

After recovery, the capacitors shall be visually examined and measured and shall meet the requirements given in Table 4

The capacitance shall be measured according to 4.2.2 The tangent of loss angle shall be measured according to 4.2.3.1

4.11.2 Within 15 min after removal from the damp heat test, the voltage proof test according to 4.2.1 shall be carried out, but with the rated voltage applied

After recovery, the capacitors shall be visually examined and measured and shall meet the requirements given in Table 4

Initial measurements shall be made as prescribed by 4.3.1

4.12.2 Grade 1 capacitors shall be tested for 2 000 h and Grade 2 capacitors for 1 000 h as follows:

Sample part divided into 1 part 1 parts 2 parts

4.12.3 The test voltage shall be applied to each capacitor individually through a resistor whose value R is equal to

C Ω, where C R is the rated capacitance in farads and R is the resistance in ohms and is to be within 30 % of the calculated value with a maximum of 2 MΩ

4.12.4 After the specified period the capacitors shall be allowed to recover and shall then be discharged across the same resistor R as defined in 4.12.3

See 4.27 of IEC 60384-1, with the following details:

For capacitors with rated capacitance C R ≤ 1 àF, tan δ shall be measured according to the method in 4.2.3

Capacitors must undergo 10,000 charge and discharge cycles at a frequency ranging from 0.1 to 60 cycles per second, while maintaining standard atmospheric testing conditions The testing process should ensure that the temperature of the capacitor can does not exceed 10 °C above the ambient temperature Each cycle includes both charging and discharging the capacitor, with a reference rate of 1-2 cycles per second in case of any disputes.

Each capacitor shall be individually discharged through a low inductance resistor R 1 calculated from

U R is the rated voltage of the capacitor;

C R is the rated capacitance in microfarads; dt dU is the appropriate value in volts/microsecond shown in the table below;

R 1 is the resistance value of the entire discharge circuit and shall have the nearest value to the calculated value in the E24 series with a minimum of 2,2 Ω

The applied voltage for the test shall be U R ± 5 %

The capacitors shall be charged through a resistor R 2 having a value R 2 ≥ 22 R 1

The time allowed for charging shall be not less than 10 × C R × R 2 a) Test dU/dt (V/às) for radial lead capacitors

Lead spacing in multiples of "e" (2,5 mm or 2,54 mm) (see note 1)

In cases where the lead spacing does not match the distance between sprayed surfaces, also known as the roll length, the detailed specification must outline the required roll lengths or the method for determining them.

The nearest lead spacing to the roll length shall be used to determine the test dU/dt

The dU/dt values listed in the table are intended for testing purposes only and may not reflect the actual dU/dt values that the capacitor can endure during continuous operation.

LICENSED TO MECON Limited - RANCHI/BANGALORE FOR INTERNAL USE AT THIS LOCATION ONLY, SUPPLIED BY BOOK SUPPLY BUREAU. b) Test dU/dt (V/às) for axial lead capacitors

Tiêu đề	Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors
Trường học	International Electrotechnical Commission
Chuyên ngành	Electrical Engineering
Thể loại	Standard
Năm xuất bản	2005
Thành phố	Geneva

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