Iec 60393 2 2015

1.3.3 Mountin The detai sp cif i ation s al sp cify the method of mou tin to b a pl ed f or the voltage proof an the in ulation resistan e tests an for the a plcation of the vibration an

Pot ent iomet ers for use in elect ronic equipment –

Part 2: Sect ional specificat ion – Lead- screw act uat ed and rot ary preset

pot ent iomet ers

Part ie 2: Spécificat ion int ermédiaire – Potent iomèt res d'ajust ement mult it ours et

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Pot ent iomet ers for use in elect ronic equipment –

Part 2: Sect ional specificat ion – Lead- screw act uat ed and rot ary preset

pot ent iomet ers

Part ie 2: Spécificat ion int ermédiaire – Potent iomèt res d'ajust ement mult it ours et

rot at ifs

INT ERNAT IONAL

ELECT ROT ECHNICAL

ELECT ROT ECHNIQUE

INT ERNAT IONALE

®

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FOREWORD 4

1 General 6

1.1 Sco e 6

1.2 Normative ref eren es 6

1.3 Inf ormation to b given in a detai sp cif i ation 6

1.3.1 General 6

1.3.2 Outlne drawin an dimen ion

7 1.3.3 Mou tin 7

1.3.4 Style 7

1.3.5 Resistan e law 7

1.3.6 Ratin s an c aracteristic 7

1.3.7 Markin 8

1.3.8 Orderin inf ormation 8

1.3.9 Ad itional information (not for in p ction purp ses) 8

1.4 Markin 8

1.4.1 General 8

1.4.2 Markin for p tentiometers 8

1.4.3 Markin for p c agin 8

1.4.4 Ad itional markin

8 2 Pref er ed ratin s, c aracteristic an test severities 9

2.1 Pref er ed c aracteristic 9

2.1.1 General 9

2.1.2 Prefer ed cl matic categories

9 2.1.3 Temp rature co ff i ients an temp rature c aracteristic of resistan e 9

2.1.4 Limits f or c an e in resistan e or output voltage ratio 10 2.1.5 Total mec anical travel 1

2.2 Pref er ed values of ratin s 1

2.2.1 General 1

2.2.2 Nominal total resistan e 1

2.2.3 Toleran es on nominal total resistan e 12

2.2.4 Rated dis ip tion 12

2.2.5 Limitin element voltage 13

2.2.6 In ulation voltage 13

2.2.7 Limits f or in ulation resistan e 13

2.3 Pref er ed test severities 13

2.3.1 General 13

2.3.2 Dryin 13

2.3.3 Vibration 14

2.3.5 L w air pres ure 14

2.3.6 Chan e of temp rature 14

3 Qual ty as es ment proced res 14

3.1 General 14

3.2 Definition 14

3.2.1 Primary stage of man facture 14

3.2.2 Stru tural y simi ar comp nents 14

3.2.3 As es ment levels EZ an FZ (zero non onformin ) 15

3.3 Qualfication a proval 15

3.3.1 General 15

3.3.2 Qualfication a proval on the b sis of the fixed sample size proced re 15

3.3.3 Tests 16

3.4 Qual ty conforman e in p ction 2

3.4.1 F rmation of in p ction lots 2

3.4.2 Test s hed le 2

3.4.3 As es ment levels 2

3.5 Delayed delvery 2

Biblogra h 2

Fig re 1 – Rated dis ip tion c rve 12 Fig re 2 – Rated dis ip tion c rve 13 Ta le 1 – Temp rature co ff i ients an temp rature c aracteristic of resistan e 10 Ta le 2 – Limits f or c an e in resistan e or output voltage ratio 1

Ta le 3 – Fixed sample size test s hed le for q alfication a proval (1 of 7 ) 17 Ta le 4 – Qual ty conforman e in p ction: L t-by-lot in p ction 2

Ta le 5 – Qual ty conforman e in p ction: Periodic testin (1 of 2) 2

INTERNATIONAL ELECTROTECHNICAL COMMISSION

Part 2: Sectional specification – Lead-screw actuated

and rotary preset potentiometers

1 Th Intern tio al Ele trote h ic l Commis io (IEC) is a worldwid org niz tio for sta d rdiz tio c mprisin

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6) Al u ers s o lde s re th t th y h v th late t e itio of this p blc tio

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Pu lc tio s

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p te t rig ts IEC s al n t b h ld re p n ible for id ntifyin a y or al s c p te t rig ts

International Stan ard IEC 6 3 3-2 has b en pre ared by IEC tec nical commit e 4 :

Ca acitors an resistors f or electronic eq ipment

This third edition can els an re laces the secon edition publ s ed in 19 9 an con titutes a

tec nical revision

This edition in lu es the f ol owin sig if i ant tec nical c an es with resp ct to the previou

edition:

a) rev ision of t he informat ion on t he as es ment lev el EZ an FZ (zero non onformin );

b) complete editorial revision

The text of this standard is b sed on the f ol owin doc ments:

Ful inf ormation on the votin f or the a proval of this stan ard can b foun in the re ort on

votin in icated in the a ove ta le

This International Stan ard is to b u ed in conju ction with IEC 6 3 3-1:2 0

A l st of al p rts in the IEC 6 3 3 series, publ s ed u der the general title P otentiometers for

use in electro ic e uipme t , can b fou d on the IEC we site

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "ht p:/ we store.iec.c " in the data

related to the sp cific publ cation At this date, the publ cation wi b

• with rawn,

• re laced by a revised edition, or

POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT –

Part 2: Sectional specification – Lead-screw actuated

and rotary preset potentiometers

1.1 Scope

This p rt of IEC 6 3 3 a pl es to le d-s rew actuated an rotary preset p tentiometers,

wirewou d an non-wirewou d for u e in electronic eq ipment These p tentiometers are

primari y inten ed f or u e in circ its f or trimmin purp ses whic req ire inf eq ent

adju tments

This p rt of IEC 6 3 3 pres rib s prefer ed ratin s an c aracteristic an selects f rom

IEC 6 3 3-1 the a pro riate q alty as es ment proced res, tests an me s rin method It

provides general p r orman e req irements for this typ of p tentiometer

This stan ard gives the minimum p r orman e req irements an test severities

1.2 Normative ref ere c s

The f ol owin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le for its a pl cation For dated ref eren es, only the edition cited a ples For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 2, Mark in c des for resistors a d c p cit ors

IEC 6 0 8-1:2 13, Enviro me tal test in – P art 1: Ge eral a d g id an e

IEC 6 0 8-2-1:2 0 , Enviro me tal t est in – P art 2-1: Tests – Test A: Cold

IEC 6 0 8-2-2:2 0 , Enviro me tal t esting – P art 2-2: Tests – Test B: Dry h at

IEC 6 3 3-1:2 0 , P ot ent iomet ers for use in ele tro ic e uipme t – P art 1: Ge eric

sp cific tio

IEC 61 9 -2:2 0 , Qu lity as es me t syst ems – P art 2: Selection a d use of sampling

pla s for insp ction ofelectro ic c mp n nts a d p ckag s

1.3 Inf ormation to be give in a detai spe if ic tion

Detai sp cification s al b derived fom the relevant blan detai sp cif i ation

Detai sp cif i ation s al not sp cify req irements inferior to those of the generic, sectional

or blan detai sp cif i ation When severer req irements are in lu ed, they s al b l sted in a

s bclau e of the detai sp cification an in icated in the test s hed les, f or example by an

asteris

The inf ormation given in 1.3.2 an 1.3.4 may, f or con enien e, b presented in ta ular f orm

The folowin inf ormation s al b given in e c detai sp cification an the values q oted

s al prefera ly b selected f rom those given in the a pro riate clau e of this sectional

sp cification

1.3.2 Outl ne drawin a d dime sions

The detai sp cif i ation s al in orp rate an i u tration of the p tentiometer b in sp cif ied

Where sp ce is in uf ficient to s ow the detai dimen ion req ired f or in p ction purp ses,

s c dimen ion s al a p ar on a drawin f ormin an an ex to the detai sp cification

Al dimen ion s al pref era ly b stated in mi imetres, however, when the original

dimen ion are sti given in in hes, the con erted metric dimen ion in mi imetres s al b

ad ed

When the p tentiometer is not desig ed for u e on printed bo rd , this s al b cle rly

in icated in the detai sp cif i ation

1.3.3 Mountin

The detai sp cif i ation s al sp cify the method of mou tin to b a pl ed f or the voltage

proof an the in ulation resistan e tests an for the a plcation of the vibration an s oc

tests The p tentiometers s al b mou ted by their normal me n , but the desig may b

s c that sp cial mou tin fixtures are req ired In this case the detai sp cification s al

des rib the mou tin f i tures an they s al b u ed f or the voltage pro f an the in ulation

resistan e tests an for the a pl cation of the vibration an s oc tests For the later tests

the mou tin s al b s c that there s al b no p rasitic vibration

The resistan e law is general y not verified If req ired, the detai sp cif i ation s al pres rib

the me s rin p ints an the as ociated l mits f or the output ratio an s al sp cify the

p sition of the cor esp n in tests in the test s hed les

1.3.6 Ratin s a d c ara teristic

The ratin s an c aracteristic s al b in ac ordan e with the relevant clau es of this

stan ard together with 1.3.6.2

1.3.6.2 Nominal total re ista c

Se IEC 6 3 3-1:2 0 , 2.3.2

When prod cts a proved ac ordin to the detai sp cification have diff erent ran es, the

f ol owin statement s ould b ad ed:

The q alf ied prod cts l st “QPL” style is given in the register of a provals, avai a le, for

example, on the we site as stated a ove

1.3.7 Marking

The detai sp cification s al sp cify the content of the markin on the p tentiometer an on

the p c age Deviation f rom 1.4 of this sectional sp cification s al b sp cif i al y stated

1.3.8 Ord ring information

The detai sp cif i ation s al in icate that the fol owin information, in cle r or in coded form,

is req ired when orderin :

a) nominal total resistan e an toleran e on nominal total resistan e;

b) resistan e law (if other than lne r);

c) n mb r an is ue ref eren e of the detai sp cif i ation an style ref eren e

1.3.9 Addition l information (not f or in pe tion purpos s)

The detai sp cification may in lu e inf ormation whic is not req ired to b verified by the

in p ction proced re, s c as circ it diagrams, c rves, drawin s an notes ne ded f or the

clarification of the detai sp cification

1.4 Marking

When codin is u ed f or nominal resistan e, toleran e an date of man facture, the method

s al b selected fom those given in IEC 6 0 2

The information given in the markin is normal y selected f rom the f ol owin l st The relative

imp rtan e of e c item is in icated by its p sition in the l st:

a) nominal total resistan e;

b) toleran e on nominal total resistan e;

c) resistan e law (if other than lne r);

d) detai sp cif i ation an style ref eren e;

e) ye r an month (or we k) of man facture;

f ) man facturer's name an /or trademark;

g) man facturer’s typ desig ation

1.4.2 Marking for pote tiometers

The p tentiometer s al b cle rly marked with a) and b) of 1.4.1 an with as man of the

remainin items as is practica le An d pl cation of inf ormation in the markin of the

p tentiometer s ould b avoided

2 Pref er ed ratings, chara teristics and test severities

The values given in the detai sp cification s al pref era ly b selected f rom the f olowin :

2.1.2 Prefer e cl matic c te orie

The p tentiometers covered by this stan ard are clas ified into clmatic categories ac ordin

to the general rules given in IEC 6 0 8-1:2 13, An ex A

The lower an up er category temp rature an the d ration of the damp he t, ste dy state

test s al b c osen f rom the folowin :

Duration of the damp he t, ste d state test: 4, 10, 21 an 5 day

The severities for the cold an dry he t tests are the lower an up er category temp ratures

resp ctively Becau e of the con tru tion of some p tentiometers these temp ratures wi

IEC 6 0 8-2-2:2 0 In this case the ne rest pref er ed temp rature within the actual

temp rature ran e of the p tentiometer s al b c osen for this severity

2.1.3 Temperature coeff icie ts a d temperature c ara teristic of re ista c

The lmits of c an e in resistan e f or the prefer ed temp rature c aracteristic of resistan e

are given in Ta le 1

Eac lne in the ta le gives the prefer ed temp rature co ff i ients an cor esp n in

temp rature c aracteristic f or 2 °C to 7 °C an lmits of c an e in resistan e for

me s rement of the temp rature c aracteristic of resistan e (se IEC 6 3 3-1:2 0 , 4.14)

on the b sis of the category temp rature ran es of 2.1.2

Dif ferent p rtion of the resistan e ran e may b covered by diff erent temp rature

c aracteristic (or co ff i ients) of resistan e althou h they a p ar in a sin le detai

sp cification

If me s rements at ad itional temp ratures are req ired, they s al b sp cified in the detai

sp cification

Table 1 – Temperature coef f icie ts a d temperature c ara teristic of re ista c

Temperature chara teristic of e istanc

(lmits of e istanc chan e in perc ntage)

%

Referenc temperature/

L wer c teg ry temperature

°C

Referenc temperature/

Up er c teg ry temperature

°C

10–

+ ,5

+1,2/

+–2,6/

–6,5

–3,2/

–8–4,2/

2.1.4 Limits f or c a ge in re ista c or output volta e ratio

The prefer ed combination of l mits f or c an e in resistan e or output voltage ratio in e c of

the tests l sted in the he din of Ta le 2 are as in icated in the l nes of the ta le

Table 2 – Limits f or c a ge in re ista c or output volta e ratio

UU

∆

a, b

aa

UU

For wirewo n p te tiometers, th v lu of re olutio s e ifie in th d tai s e ific tio s al b a d d to

th p rmis ible o tp t ratio lmits or th p rmis ible c a g in re ista c lmits for al te ts

b

Th s tin sta i ty c a g in th o tp t v lta e ratio

aa

UU

b) for sin le-turn rotary preset p tentiometers:

the an le s al b sp cif ied in the detai sp cification

2.2 Prefer e v lue of ratin s

The values given in detai sp cif i ation s al prefera ly b selected fom the fol owin :

2.2.2 Nominal total re ista c

Se IEC 6 3 3-1:2 0 , 2.3.2

2.2.3 Tolera c s on nominal total re ista c

The pref er ed toleran es on nominal total resistan e are:

A smaler (or larger) are of o eration may b given in the detai sp cification In this event,

the detai sp cification s al state the maximum al owa le dis ip tion at temp rature other

than 7 °C Al bre k p ints on the c rve s al b verif ied by test

A deratin c rve havin examples of smal er are s of o eration (carb n comp sition) is given

in Fig re 2

Up er c te ory

temp rature+ 7 °C

L wer c te ory

temp rature

Are of e omme d d

o eratioPerc nta e of th

rate dis ip tio

10

0

IE C

Th dif fere c s b twe n ( ), (2) a d (3) d p n o th s b trate, wh re y

The detai sp cification s al pres rib the value of the in ulation voltage, rou ded of to the

ne rest 10 V The n merical value of the in ulation voltage s al b :

L w air pres ure (at 8 kPa): ≥two-third the value at normal air pres ure

2.2.7 Limits f or ins lation re ista c

Unles otherwise sp cif ied in the detai sp cif i ation the in ulation resistan e s al b not

les than 1 GΩ after dry he t tests an 100 MΩ af ter h midity tests

Swe p en uran e: Total d ration: 6 h

The detai sp cif i ation s al pres rib the mou tin method to b u ed (Se 1.3.3)

Se IEC 6 3 3-1:2 0 , 4.3 5, with the fol owin detai s:

Air pres ure: 8 kPa

2.3.6 Cha ge of temperature

Se IEC 6 3 3-1:2 0 , 4.3 , with the f ol owin detais:

The d ration of the exp s re at the extremes of temp rature s al b 3 min

Se IEC 6 3 3-1:2 0 , Clau e H.1

3.2 Definitions

3.2.1 Primary sta e of ma ufa ture

For preset p tentiometers, primary stage of the man facture is:

– F r fim typ s: The de osition of the resistive f ilm on the s bstrate

p lymerization of the bin er

– F r wire-wou d types: The win in of the resistan e wire on the man rel in ulation or

in ulated

3.2.2 Stru tural y simi ar compone ts

Preset p tentiometers are con idered as b in stru tural y simi ar if they are p tentiometers

prod ced with the same or simi ar proces es an materials, an that have the same nominal

dimen ion but have diff erent resistan e values an temp rature c aracteristic (or

co ff i ients) of resistan e

3.2.3 As e sme t le els EZ a d FZ (zero nonconforming)

As es ment levels EZ an FZ me t the req irements of “zero non onformin ” a pro c They

have b en introd ced to al g the as es ment proced res an levels with c r ent in u try

practices by pres ribin the p rmit ed n mb r of non onformin items (ac e tan e n mb r) c

as zero

Therefore the sample size f or lot-by-lot testin is determined by IEC 61 9 -2:2 0 , Ta le 1

3.3 Qual fic tion approv l

The proced res f or q al fication a proval testin are given in IEC 6 3 3-1:2 0 , Clau e H.5

The s hed le to b u ed for q al f i ation a proval testin on the b sis of lot-by-lot an

p riodic test is given in 3.4

The proced re u in a fixed sample size s hed le is given in 3.3.2 an 3.3.3 b low

3.3.2 Qual fic tion approv l on the ba is of the fix d s mple size proc dure

Sampl ng

The fixed sample size proced re is des rib d in IEC 6 3 3-1:2 0 , H.5.3 b) The sample

s al b re resentative of the ran e of values for whic a proval is sou ht This may or may

not b the complete ran e covered by the detai sp cification

The sample s al con ist of sp cimen havin the hig est an lowest resistan e values for

whic a proval is b in sou ht It s ould also in lu e the sp cimen havin the critical

resistan e value, if this is within the ran e b in s bmit ed When a proval is b in sou ht

f or more than one temp rature co ff i ient (or c aracteristic ) of resistan e, the sample s al

contain sp cimen re resentative of the dif ferent temp rature co f ficients (or c aracteristic )

of resistan e In a simi ar man er, the sample s ould contain a pro ortion of sp cimen of the

diff erent resistan e values havin the closest toleran e f or whic a proval is b in sou ht

The pro ortion of sp cimen havin the dif ferent c aracteristic s al b pro osed by the

man facturers c ief in p ctor an s al b to the satisfaction of a certificat ion b d (for ex ample

IECQ CB)

Sp re sp cimen are p rmited as f ol ows:

a) One p r resistan e value an one p r e c temp rature co f ficient or temp rature

c aracteristic value whic may b u ed to re lace the p rmited non onformin items in

Group 0

b) One p r resistan e value an one p r e c temp rature co f ficient or temp rature

c aracteristic value whic may b u ed to re lace sp cimen whic are non onf ormin

b cau e of in idents not at ributa le to the man facturer The n mb r given in Group 0

as ume that al groups are a pl ca le

When ad itional groups are introd ced into the q al f i ation a proval test s hed le, the

n mb r of sp cimen req ired f or Group 0 s al b in re sed by the same n mb r as that

req ired f or the ad itional groups

3.3.3 Te ts

The complete series of tests sp cif ied in Ta le 3 are req ired f or the ap roval of

p tentiometers covered by one detai sp cification The tests of e c group s al b car ied

out in the given order

The whole sample s al b s bjected to the tests of Group 0 an then divided f or the other

The a proval is granted when the n mb r of non onformin items do s not ex e d the

sp cified n mb r of permis ible non onf ormin items for e c group or s b-group an the

total n mb r of p rmis ible non-conf orman es

In Ta le 3 the f i ed sample size test s hed le is given It in lu es detai s of sampl n an

p rmis ible non onformin items for diff erent tests f or groups of tests an gives, together with

the detai s of the test contained in IEC 6 3 3-1:2 0 , Clau e 4, an Clau e 2 of this stan ard,

a complete s mmary of test condition an p r orman e req irements

It is in icated in Ta le 3, where, for the test method , test con ition an /or p r orman e

req irements, a c oice s al b made in the detai sp cification

The con ition of test an the p rf orman e req irements for the fixed sample size test

s hed le s al b identical to those pres rib d in the detai sp cification for q alty

conforman e in p ction

4.3 Sold ra i ty Sold r b th meth d

Temp rature a d d ratio :

UU

As in 4.21.2

UU

UU

Volta e pro f in ulate

p te tiometers o ly)

Switc c nta t re ista c

(if a plc ble)

Co tin ity

Startin torq e

Volta e pro f in ulate

p te tiometers o ly)

gro p: 4 s e ime s

2n

gro p: 10 s e ime s

2n

Volta e pro f in ulate

p te tiometers o ly)

≥1 GΩ

Table 3 (7 of7)

a

Su cla s n mb rs of te t a d p rf orma c re uireme ts refer to IEC 6 3 3- :2 0 , e c pt f or s me

s v ritie f or e viro me tal te ts a d lmits of c a g in re ista c or o tp t ratio, whic h v to b ta e

fom th rele a t cla s s of this s ctio al s e if i atio

2) Comp n nts d sig e a "mo nte b termin ls" s al b te te whist mo nte b th ir termin ls o a

printe b ard, ire p ctiv of wh th r a y h le e ist whic c uld p rmit mo ntin b th b d

3.4 Qual ty conf orma c inspe tion

3.4.1 Formation of inspe tion lots

An in p ction lot s al con ist of stru tural y simi ar p tentiometers (Se 3.2.2) In ad ition,

the fol owin detai s are a pl ca le:

a) Groups A an B: These tests s al b car ied out on a lot-by-lot b sis an resistan e

values s al b re resentative of prod ction

b) Group C

1) The sample s al b col ected over 13 we k

2) The sample s al b re resentative of the ran e of resistan e values prod ced d rin

Table 4 – Qual ty conf orma c in pe tion: Lot by-lot inspe tion

d

IL a

n a

c a

Inspe tio su gro p

d

IL a

n a

c a

A0

4.6 Eleme t

re ista c

10 % b

A0

4.6 Eleme t

re ista c

10 % b

This in p ctio s al b p rorme af ter remo al of n n o formin items b 10 % te tin d rin th

ma uf acturin pro e s Wh th r th lot wa a c pte or n t, al of s mple f or s mpln in p ctio s al b

in p cte in ord r to mo itor o tg in q alty le el b n n o f ormin items p r mi o (×10

This te t ma b re la e b in-pro u tio te tin if th ma uf acturer in tals statistic l pro e s c ntrol

(SP ) o dime sio al me s reme ts or oth r me h nisms toa oid p rt e c e in th dime sio al lmits

Table 5 – Qu l ty conf orma c inspe tion: Periodic te ting (1 of 2)

Inspe tio su gro p

b

p a

n a

c a,c

Inspe tio su gro p

b

p a

n a

c a,c

Table 5 (2 of2)

Inspe tio su gro p

b

p a

n a

c a

Inspe tio su gro p

b

p a

n a

c a

If o e n n o formin item is o tain d, al th te ts of s b ro p s al b re e te o a n w s mple a d th n

n furth r n n o formin items are p rmite Rele s of pro u t ma c ntin e d rin re e t te tin

3.5 Dela e del very

The provision of IEC 6 3 3-1:2 0 , Clau e H.10, s al a ply, ex e t that the in p ction level

s al b red ced to S-2 an (ex e t for carb n comp sition p tentiometers) the p riod s al

b exten ed to two ye rs The p riod f or carb n comp sition p tentiometers s al remain at

one ye r

Bibl ogr aphy

IEC 6 410:19 3, Sampling plans a d pro ed ures for insp ctio b atribut es