Li ce ns ed C op y W an g B in , I S O /E xc ha ng e C hi na S ta nd ar ds In fo rm at io n C en tr e, 0 5 A pr il 20 04 , U nc on tr ol le d C op y, ( c) B S I Li ce ns ed C op y W an g B in , I S O[.]
Trang 2BRITISH STANDARD BS EN
61290-3-1:2003
Optical amplifiers —
Test methods —
Part 3-1: Noise figure parameters —
Optical spectrum analyzer method
The European Standard EN 61290-3-1:2003 has the status of a
British Standard
ICS 33.180.30
Trang 3BS EN 61290-3-1:2003
This British Standard was
published under the authority
of the Standards Strategy and
Policy Committee on
© BSI 16 January 2004
ISBN 0 580 43166 5
National foreword
This British Standard is the official English language version
of EN 61290-3-1:2003 It is identical with IEC 61290-3-1:2003
It supersedes DD IEC PAS 61290-3-1:2002 which is withdrawn
The UK participation in its preparation was entrusted by Technical Committee GEL/86, Fibre optics, to Subcommittee GEL/86/3, Fibre optic systems and active devices, which has the responsibility to:
A list of organizations represented on this subcommittee can be obtained on request to its secretary
Cross-references
The British Standards which implement international or European
publications referred to in this document may be found in the BSI Catalogue
under the section entitled “International Standards Correspondence Index”, or
by using the “Search” facility of the BSI Electronic Catalogue or of
British Standards Online
This publication does not purport to include all the necessary provisions of a contract Users are responsible for its correct application
Compliance with a British Standard does not of itself confer immunity from legal obligations.
— aid enquirers to understand the text;
— present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the
Amendments issued since publication
BS EN 26110-3-:10240
ThrB sihsiti natSradd wsa
upsilbheu dnedr hte uahtroyti
fo the Stnadards dna yciloP
no eettimmoC ygetartS
ISB © 16 January 2004
ISBN 0 085 61345 6
itaNanol owerofdr
hTis BritisS htaadni drs htffo eiical Egnlisl hagnauge srevion
of NE 216-09-3:13002tI i sidneitw lactih 16 CEI092-3-02:1.30
tI supesredes DD EIAP C16 S092-3-102:w 20hhci is withdrawn
hTKU e aptricipatioi nn its erpparatiow nas ensurtetb dy eTinhcacl Coimmttee GEL/,68 biFro epitt ,sco uSocbtimmtee GEL/68F 3/erbi ops citytssme nad cative devicew ,shcih hat shr eesponisilibyt ot:
A ilst fo agrointazisno serpertneeo dn ihts octimmtac eeb ne boatinde on euqerst to tis setercayr
Csor-serefercnes
The irBtsih tSnaddrahw shci pmimelneni tetnritaonla or uEporena
puacilbtoins ferederr to in htsi doucemnt amy eb found ni the SBolataC Igue
ednur eht esitcoe nnittl“ deItnanreitnola tSanadC sdropserrednoednI ecn”x, ro
yb usnig hte S“aerch” faciliyt of hte SBE IltceorolataC cineug fo ro
tirBsih Satndards Onnile
hTsi buplication dseo ton troprup tni odulca ell thecen essyra privosiofo sn a tnoctcarsU sre er erasponsilbe ti rofs tcerroc ilppatac.noi
pmoCliantiw ech a tirBS hsitdnaadr dose ton fo iteslf cofnmmi retinuy frl moelag lbotagisnoi.
— aid neuqirers ot undrestand tht eetx;
— persetn to the serpsnoitni elbetanreporuE/lanoian ocmmtiteyna e qneuiries on thi enetterpraitno, orp ropsolaof sr ahcnge, ank dpee the
tnemdnemAs ideuss cnisp eulbictanoi
Trang 4EUROPEAN STANDARD EN 61290-3-1
NORME EUROPÉENNE
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
ICS 33.180.30
English version
Optical amplifiers – Test methods Part 3-1: Noise figure parameters – Optical spectrum analyzer method
(IEC 61290-3-1:2003)
Amplificateurs optiques –
Méthodes d'essai
Partie 3-1: Paramètres du facteur de bruit -
Méthode d'analyseur du spectre optique
(CEI 61290-3-1:2003)
Lichtwellenleiter-Verstärker -
Prüfverfahren Teil 3-1: Rauschzahlparameter - Prüfverfahren mit optischem Spektralanalysator
(IEC 61290-3-1:2003)
This European Standard was approved by CENELEC on 2003-11-01 CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member
This European Standard exists in three official versions (English, French, German) A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom
Trang 5EN 61290-3-1:2003 - 2 -
Foreword
The text of document 86C/543/FDIS, future edition 1 of IEC 61290-3-1, prepared by SC 86C, Fibre optic systems and active devices, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61290-3-1 on 2003-11-01
This standard is to be read in conjunction with EN 61291-1:1998
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-08-01
– latest date by which the national standards conflicting
The International Electrotechnical Commission (IEC) and CENELEC draw attention to the fact that it is claimed that compliance with this standard may involve the use of a patent concerning the polarization nulling technique given in subclause 6.2.2
The IEC and CENELEC take no position concerning the evidence, validity and scope of these patent rights
The holders of these patent rights have assured the IEC that they are willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throughout the world In this respect, the statements of the holders of these patent rights are registered with the IEC Information may be obtained from:
Lucent
600 Mountain Avenue Murray Hill, NJ 07974 USA
Attention is drawn to the possibility that some of the elements of this standard may be the subject of patent rights other than those identified above IEC and CENELEC shall not be held responsible for identifying any or all such patent rights
Annexes designated "normative" are part of the body of the standard
In this standard, annexes A and ZA are normative
Annex ZA has been added by CENELEC
Endorsement notice
The text of the International Standard IEC 61290-3-1:2003 was approved by CENELEC as a European Standard without any modification
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60793-1-1 NOTE Harmonized as EN 60793-1-1:2003 (not modified)
IEC 60825-1 NOTE Harmonized as EN 60825-1:1994 (not modified)
IEC 60825-2 NOTE Harmonized as EN 60825-2:2000 (not modified)
IEC 60874-1 NOTE Harmonized as EN 60874-1:1999 (not modified)
IEC 61290-3 NOTE Harmonized as EN 61290-3:2000 (not modified)
Page 2
EN 61290−3−1:2003
Trang 6-09216-31 3002:CEI – 3 –
CONTENTS
FOWERODR 5
TNIROTCUDOIN 9
1 Scope and object 5
2 Normative references 5
3 Abbreviations 6
4 Apparatus 6
5 Test sample 8
6 Procedure 8
6.1 Calibration 9
6.1.1 Calibration of optical bandwidth 9
6.1.2 Calibration of nulling stage insertion loss 10
6.1.3 Calibration of OSA power correction factor 10
6.2 Measurement 11
6.2.1 Single channel DI technique 11
6.2.2 PN technique 12
7 Calculation 12
8 Test results 13
Annex A (normative) Limitation of direct interpolation techniques due to source spontaneous emission 14
Biilbgorhpay 17
FirugT – 1 ewt oycipa larrmegnastneo fcitpo eht s lapcertmuylana zreset trappa suta for ions efiugrp earametre measuremtnes 7
ugiFr ID – 1.A esutbracte noirrro as a funco noitf sourc espsuoenatno emissilevel no 15
Page 3 EN 61290−3−1:2003 61290-3-1 IEC:2003 – 3 – TNOCENTS FOREWORD 5
TINRODUCTION 9
1 Sco dna epobject 4
roN 2mvita ereferneces 4
bbA 3revnoitais 5
appA 4rutas 5
T 5es tsample 7
P 6rocudere 7
bilaC 1.6raoitn 8
bilaC 1.1.6r noitaof itpocdnab lawtdih 8
2.1.6bilaCro noitaf lluni gnsti egansertl noioss 9
3.1.6bilaCro noitaf OSp Aowre correc noitfacotr 9
aeM 2.6suremnet 01
elgniS 1.2.6 ch lennat IDecuqinhe 01
P 2.2.6N teceuqinh 11
laC 7cluoitan 11
T 8es tresutls 21
Anxen( A nroma)evitmiL io noitatfrid ectretni cet noitalopseuqinhs ot eud oruc e spsuoenatno emission 31
INTRODUCTION 4
FirugT – 1 ewt oycipa larrmegnastneo fcitpo eht s lapcertmuylana zreset trappa suta for ions efiugrp earametre measuremtnes 6
ugiFr ID – 1.A esutbracte noirrro as a funco noitf sourc espsuoenatno emissilevel no 41
Pa3 eg E3002:1−3−09216 N 61290-3-1 IEC:2003 – 3 – TNOCENTS FOREWORD 5
TINRODUCTION 9
1 Sco dna epobject 5
roN 2mvita ereferneces 5
bbA 3revnoitais 6
appA 4rutas 6
T 5es tsample 8
P 6rocudere 8
bilaC 1.6raoitn 9
bilaC 1.1.6r noitaof itpocdnab lawtdih 9
2.1.6bilaCro noitaf lluni gnsti egansertl noioss 01
3.1.6bilaCro noitaf OSp Aowre correc noitfacotr 01
aeM 2.6suremnet 11
elgniS 1.2.6 ch lennat IDecuqinhe 11
P 2.2.6N teceuqinh 12
laC 7cluoitan 12
T 8es tresutls 13
Anxen( A nroma)evitmiL io noitatfrid ectretni cet noitalopseuqinhs ot eud oruc e spsuoenatno emission 14
Bibliography 17
Figure 1 – Two typical arrangements of the optical spectrum analyzer test apparatus for noise figure parameter measurements 7
Figure A.1 – DI subtraction error as a function of source spontaneous emission level 15
Pa3 eg E3002:1−3−09216 N 16290-3-1 IEC:2003 – 3 – TNOCENTS FOREWORD 5
TINRODUCTION 9
1 Sco dna epobject 4
roN 2mvita ereferneces 4
bbA 3revnoitais 5
appA 4rutas 5
T 5es tsample 7
P 6rocudere 7
bilaC 1.6raoitn 8
bila6.1.1 Cration fo ptiocal bandwtidh 8
6.1.2 Calibrfation o ullning stage insertion loss 9
6.1.3 Calibrfation o OoA pSwre correcion tfactor 9
6.2 Measurement 10
6.2.1 Single cannel heDI tchnique 10
N6.2.2 P etcehniqu 11
7 Calcluation 11
8 Tes tresults 12
nexnA A (ornmative) Limiftation o directr intepolation techniques due to srouce sontaneousp emission 13
NOITCUDORTNI 4
Firuge 1 – Twyo tpicral arangementsf othe optic l saecptrum analyzers tet appartusa for noise fiugrae prameter maesurements 6
iguFre A.1 – DI sbturaction error sa a funcftion o suorce sontaneousp emission level 14
aP3 eg E3002:1−3−09216 N Annex ZA (normative) Normative references to international publications with their corresponding European publications 16
Trang 861290-3-1 IEC:2003 – 11 –
OPTICAL AMPLIFIERS – TEST METHODS Part 3-1: Noise figure parameters – Optical spectrum analyzer method
1 Scope and object
This part of IEC 61290 applies to commercially available optical amplifiers (OAs) such as
optical fibre amplifiers (OFAs), semiconductor optical amplifiers (SOAs) and planar waveguide
amplifiers (PWOAs) as classified in IEC 61292-3
The object of this standard is to establish uniform requirements for accurate and reliable
measurements, by means of the optical spectrum analyzer (OSA) test method, of the following
OA parameters, as defined in IEC 61291-1:
a) signal-spontaneous noise figure;
b) forward amplified spontaneous emission (ASE) power level
The methods described in this part of IEC 61290 apply to single-channel stimulus only
Two alternatives for determining the signal-spontaneous beat noise are possible, namely
the ASE direct interpolation technique (DI) and the polarization nulling with interpolation
technique (PN) The accuracy of the DI technique will suffer when the slope of the OA spectral
ASE curve has large wavelength dependence, as in the case of an OA with an internal
narrowband ASE suppressing filter
The accuracy of the DI technique degrades at high input power level due to the spontaneous
emission from the laser source(s) Annex A provides guidance on the limits of this technique
for high input power
NOTE 1 All numerical values marked with (‡) are suggested values for which the measurement is assured Other
values may be acceptable but should be verified
NOTE 2 General aspects of noise figure test methods are reported in IEC 61290-3
2 Normative references
The following referenced documents are indispensable for the application of this document For
dated references, only the edition cited applies For undated references, the latest edition of
the referenced document (including any amendments) applies
IEC 61290-1-1, Optical fibre amplifiers – Basic specification – Part 1-1: Test methods for gain
parameters – Optical spectrum analyser
IEC 61291-1, Optical fibre amplifiers – Part 1: Generic specification
IEC 61292-3, Optical amplifier technical reports – Part 3: Classification, characteristics and
applications of optical amplifiers
Pa4 eg
E3002:1−3−09216 N
Page 5
EN 61290−3−1:2003
Trang 961290-3-1 IEC:2003 – 13 –
3 Abbreviations
For the purposes of this document, the following abbreviations apply:
ASE Amplified spontaneous emission
DBR Distributed Bragg reflector
DFB Distributed feedback laser
DI Direct interpolation (technique)
ECL External cavity laser (diode)
LED Light emitting diode
OA Optical amplifier
OFA Optical fibre amplifier
OSA Optical spectrum analyzer
PN Polarization nulling (with interpolation technique)
PWOA Planar waveguide optical amplifier
SOA Semiconductor optical amplifier
SSE Source spontaneous emission
4 Apparatus
Two schemes of the measurement set-up (for DI and PN techniques, respectively), are given in
Figure 1
The test equipment listed below, with the required characteristics, is needed
a) Narrowband optical source
The optical source shall be either at a fixed wavelength or wavelength tunable
– Fixed-wavelength optical source
This optical source shall generate light with a wavelength and optical power specified in the relevant detail specification Unless otherwise specified, the optical source shall emit light with the full width at half maximum of the spectrum narrower than 1 nm (‡) Single-line lasers such as a distributed feedback (DFB) laser, a distributed Bragg reflector (DBR) laser
or an external cavity laser (ECL) are applicable Also applicable is a light emitting diode (LED) with a narrowband filter The suppression ratio for the side modes for the single-line laser shall be higher than 30 dB (‡) The output power fluctuation shall be less than 0,05 dB (‡), which may be better attainable with an optical isolator at the output port of the optical source Source-spontaneous emission and spectral broadening at the base of the lasing spectrum should be minimal for laser sources
– Wavelength-tunable optical source
This optical source shall generate wavelength-tunable light within the range specified in the relevant detail specification Its optical power shall be specified in the relevant detail specification Unless otherwise specified, the optical source shall emit light with the full width at half maximum of the spectrum narrower than 1 nm (‡) A single-line laser or an LED with a narrow bandpass optical filter is applicable, for example The suppression ratio
of the side modes for the single-line laser shall be higher than 30 dB (‡) The output power fluctuation shall be less than 0,05 dB (‡), which may be better attainable with an optical isolator at the output port of the optical source Source-spontaneous emission and spectral broadening at the base of the lasing spectrum should be minimal for the ECL
Pa5 eg
E3002:1−3−09216 N
Page 6
EN 61290−3−1:2003
Trang 1061290-3-1 IEC:2003 – 15 –
Polarization controller
Narrowband optical source
OA under test
OA spectrumOptical
analyzer Source module
Variable optical attenuator
dB
Linear polarizer
Figure 1a – DI technique
Linear polarizer Nulling stage
OA under test
Linear polarizer Polarizationcontroller
Narrowband optical source
Variable optical attenuator
Optical spectrum analyzer
Source module
Polarization controller OA
dB
Figure 1b – PN technique
Figure 1 – Two typical arrangements of the optical spectrum analyzer test apparatus
for noise figure parameter measurements
b) Polarization controller
This device shall be able to convert any state of polarization of a signal to any other state of polarization The polarization controller may consist of an all fibre polarization controller or
a quarter-wave plate rotatable by a minimum of 90° followed by a half wave plate rotatable
by a minimum of 180° The reflectance of this device shall be smaller than –50 dB (‡) at
each port The insertion loss variation of this device shall be less than 0,2 dB (‡)
c) Linear polarizer
This device should have a minimum extinction ratio of 30 dB (‡), and reflectance smaller than –50 dB (‡) at each port A rotatable polarizer is preferred to maximize the input signal power
d) Variable optical attenuator
The attenuation range and stability shall be over 40 dB (‡) and better than 0,1 dB (‡), respectively The reflectance from this device shall be smaller than –50 dB (‡) at each port
e) OSA
The OSA shall have polarization sensitivity less than 0,1 dB (‡), stability better than
0,1 dB (‡), and wavelength accuracy better than 0,05 nm (‡) The linearity should be better than 0,2 dB (‡) over the device dynamic range The reflectance from this device shall be
smaller than –50 dB (‡) at its input port
f) Optical power meter
This device shall have a measurement accuracy better than 0,2 dB (‡), irrespective of the state of polarization, within the operational wavelength bandwidth of the OA and within the power range from –40 dBm to +20 dBm (‡)
NOTE The optical power meter is for calibration purposes
g) Broadband optical source
This device shall provide output broadband optical power over the operational wavelength bandwidth of the OA (for example, 1 530 nm to 1 565 nm) The output spectrum shall be flat with less than a 0,1 dB (‡) variation over the measurement bandwidth range (typically
10 nm) For example, the ASE generated by an OA with no signal applied could be used
Pa6 eg
E3002:1−3−09216 N
Page 7
EN 61290−3−1:2003