BSI Standards PublicationFixed capacitors for use in electronic equipment Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c
Scope
IEC 60384 specifies standards for fixed surface mount capacitors designed for direct current applications, featuring metallized electrodes and polyethylene-terephthalate dielectrics These capacitors, equipped with metallized connecting pads or soldering strips, are intended for direct mounting on hybrid circuit substrates or printed circuit boards They may exhibit "self-healing properties" under certain usage conditions and are primarily suited for applications where the alternating current component is minimal compared to the rated voltage.
Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384-14.
Object
This standard aims to define preferred ratings and characteristics for capacitors, selecting appropriate quality assessment procedures, tests, and measurement methods from IEC 60384-1:2008 It establishes general performance requirements, ensuring that test severities and specifications meet or exceed the prescribed performance levels, as lower performance levels are not acceptable.
Normative references
This document references essential documents that are crucial for its application For references with specific dates, only the cited edition is applicable, while for those without dates, the most recent edition, including any amendments, is relevant.
IEC 60062, Marking codes for resistors and capacitors
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling plans for inspection of electronic components and packages
ISO 3, Preferred numbers – Series of preferred numbers
Information to be given in a detail specification
General
Detail specifications shall be derived from the relevant blank detail specification
Detail specifications must not impose requirements that are lower than those outlined in the generic, sectional, or blank detail specifications If more stringent requirements are included, they should be clearly listed in section 1.9 of the detail specification and marked in the test schedules, such as with an asterisk.
The information given in 1.4.2 may, for convenience, be presented in tabular form
The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional specification.
Outline drawing and dimensions
The article will include an illustration of the capacitor for easy identification and comparison with other components The detailed specification will provide dimensions and associated tolerances that impact interchangeability and mounting While all dimensions should ideally be presented in millimeters, if original measurements are in inches, the corresponding metric dimensions in millimeters will also be included.
The numerical values of the body shall be given as follows:
The numerical values of the terminals shall be given as follows:
When applicable, dimensions and their corresponding tolerances for various items, including sizes and capacitance/voltage ranges, should be presented in a table beneath the drawing.
When the configuration is other than described above, the detail specification shall state such dimensional information as will adequately describe the capacitor.
Mounting
The detail specification shall give guidance on methods of mounting for normal use Mounting for test and measurement purposes (when required) shall be in accordance with 4.1.
Ratings and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this standard, together with the following
For products that meet the detail specification but have varying nominal capacitance ranges, it is essential to include the following note: "The nominal capacitance range available for each voltage range can be found on the IEC online service at www.iecq.org/certificates."
Additional characteristics may be listed, when they are considered necessary to specify adequately the component for design and application purposes
The detail specification shall prescribe the test methods, severities and requirements applicable for the solderability and the resistance to soldering heat tests.
Marking
The detail specification shall specify the content of the marking on the capacitor and on the packaging Deviations from 1.6 shall be specifically stated.
Terms and definitions
For the purposes of this document, and in addition to the applicable terms and definitions given in IEC 60384-1:2008, the following definitions apply
capacitors for long-life applications with stringent requirements for the electrical parameters
capacitors for general applications where the stringent requirements for grade 1 capacitors are not necessary
Marking
General
See IEC 60384-1:2008, 2.4, with the following details.
Information for marking
The marking information typically includes several key items, prioritized by their significance: a) nominal capacitance, presented either clearly or in code as per IEC 60062; b) rated voltage, with direct current voltage denoted by the appropriate symbol; c) tolerance on nominal capacitance; d) category voltage; e) manufacturing date, specified by year and month (or week); f) manufacturer's name or trademark; g) climatic category; h) manufacturer's type designation; and i) reference to the detailed specification.
Marking on capacitors is made when necessary
Any marking shall be legible and not easily smeared or removed by rubbing with the finger.
Marking of capacitors
The packaging containing the capacitor(s) shall be clearly marked with all the information listed in 1.6.2 as necessary
The values given in detail specifications shall preferably be selected from the following
The surface mount capacitors covered by this standard are classified into climatic categories according to the general rules given in IEC 60068-1:2013, Annex A
The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following:
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days
With continuous operation at 125 °C in excess of the endurance test time, accelerated ageing has to be considered (see detail specification)
The severities for the cold and dry heat tests are the lower and upper category temperatures respectively
Preferred values of nominal capacitance shall be taken from the E6 series of IEC 60063: 1,0 − 1,5 − 2,2 − 3,3 − 4,7 and 6,8 and their decimal multiples (× 10 n , n = integer)
If other values are required they shall preferably be chosen from the E12 series
The preferred tolerances on the nominal capacitance are ±5 %, ±10 % and ±20 %
The preferred values of rated voltage taken from R 10 series of ISO 3 are:
1,0 − 1,6 − 2,5 − 4,0 − 5,0 − 6,3 and their decimal multiples (× 10n, n: integer)
The sum of the d.c voltage and the peak a.c voltage applied to the capacitor should not exceed the rated voltage
The value of the peak a.c voltage should not exceed the percentages of the rated voltage at the frequencies stated in Table 1, unless otherwise specified in the detail specification.
Marking on packaging
The packaging containing the capacitor(s) shall be clearly marked with all the information listed in 1.6.2 as necessary
Preferred characteristics
Preferred climatic categories
The surface mount capacitors covered by this standard are classified into climatic categories according to the general rules given in IEC 60068-1:2013, Annex A
The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following:
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days
With continuous operation at 125 °C in excess of the endurance test time, accelerated ageing has to be considered (see detail specification)
The severities for the cold and dry heat tests are the lower and upper category temperatures respectively.
Preferred values of ratings
Nominal capacitance (C N )
Preferred values of nominal capacitance shall be taken from the E6 series of IEC 60063: 1,0 − 1,5 − 2,2 − 3,3 − 4,7 and 6,8 and their decimal multiples (× 10 n , n = integer)
If other values are required they shall preferably be chosen from the E12 series.
Tolerance on nominal capacitance
The preferred tolerances on the nominal capacitance are ±5 %, ±10 % and ±20 %.
Rated voltage (U R )
The preferred values of rated voltage taken from R 10 series of ISO 3 are:
1,0 − 1,6 − 2,5 − 4,0 − 5,0 − 6,3 and their decimal multiples (× 10n, n: integer)
The sum of the d.c voltage and the peak a.c voltage applied to the capacitor should not exceed the rated voltage
The value of the peak a.c voltage should not exceed the percentages of the rated voltage at the frequencies stated in Table 1, unless otherwise specified in the detail specification
Table 1 – Percentage limit of the rated voltage at a.c voltage frequency
AC voltage frequency Percentage limit of the rated voltage
Category voltage (U C )
Rated temperature
The standard value of rated temperature is 85 °C
Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent operation.
Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar processes and materials, though they may be of different case sizes and capacitance and voltage values.
Certified test records of released lots
According to IEC 60384-1:2008, Q.9, essential information must be provided in the detail specification and upon request by the purchaser Following the endurance test, the key parameters to assess include capacitance change, tan δ, and insulation resistance.
Qualification approval procedures
General
The procedures for qualification approval testing are given in IEC 60384-1:2008, Q.5
The qualification approval testing schedule, based on lot-by-lot and periodic tests, is outlined in section 3.5, while the procedure for a fixed sample size schedule is detailed in section 3.4.2.
Qualification approval on the basis of the fixed sample size procedure
The fixed sample size procedure outlined in IEC 60384-1:2008, Q.5.3, item b) requires that the sample be representative of the capacitor range for which approval is requested This sample can consist of either the entire range or a portion specified in the detail specification.
The sample must include four specimens representing the maximum and minimum rated voltages, along with their corresponding maximum and minimum capacitances If there are more than four rated voltages, an intermediate voltage must also be tested Therefore, to approve a range, testing is necessary for either four or six capacitance/voltage combinations In cases where the range has fewer than four values, the number of specimens tested should still meet the requirements for four values.
Spare specimens are permitted as follows:
For each value, two specimens (for six values) or three specimens (for four values) can be utilized as replacements for non-conforming items due to incidents not caused by the manufacturer.
The numbers given in Group 0 assume that all groups are applicable If this is not so the numbers may be reduced accordingly
When new groups are added to the qualification approval test schedule, the number of specimens needed for Group 0 must be increased by the same amount as the additional groups.
Table 2 gives the number of samples to be tested for each group with the permissible number of non-conforming items for qualification approval tests
To obtain approval for capacitors outlined in a specific detail specification, it is essential to conduct the complete series of tests listed in Table 2 and Table 3 The tests must be performed sequentially, following the prescribed order for each group.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other groups
Non-conforming specimens found during the tests of Group 0 shall not be used for the other groups
Approval is granted when the number of non-conforming items is zero
Table 2 and Table 3 together form the fixed sample size test schedule for the qualification approval on the basis of the fixed sample size procedure
Table 2 gives the number of the samples and permissible non-conforming items for each test and test group
Table 3 gives a summary of the test conditions and performance requirements, and choices of the test conditions and performance requirements in the detail specification
The qualification approval test conditions and performance requirements must align with the quality conformance inspections outlined in the detailed specification, ensuring consistency in the fixed sample size.
Table 2 – Test and sampling plan for qualification approval
No Test Subclause of this standard
Number of specimens Permissible number of non- conforming items n a c
Solvent resistance of the marking b 4.14
2 Substrate bending test (formerly bond strength of the end face plating) 4.5 12 0
3.4 Charge and discharge 4.12 24 0 a Capacitance / voltage combinations, see 3.4.2 b If required by the detail specification c Specimens found defective after mounting shall not be taken into account when calculating the permissible non-conforming items for the following tests They shall be replaced by spare parts
Table 3 – Test schedule for qualification approval (1 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible conforming non- items ( c )
4.2.1 Visual examination As in 4.2.2 As in 4.2.3
4.2 Dimensions (detail) See detail specification
4.3.2 Capacitance As in 4.3.2.2 Within specified tolerance
4.3.3 Tangent of loss angle As in 4.3.3.2 As in 4.3.3.3
4.3.1 Voltage proof As in 4.3.1.2 and 4.3.1.3 As in 4.3.1.4
4.3.4 Insulation resistance As in 4.3.4.2 As in 4.3.4.3
4.6 Resistance to soldering heat As in 4.6.3
Visual examination As in 4.6 5 As in 4.6.5
Capacitance │∆C/C│ ≤3 % of the value measured in 4.6.2 4.13 Component solvent resistance c,e As in 4.13
Table 3 – Test schedule for qualification approval (2 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
Visual examination As in 4.7.3 As in 4.7.3
4.14 Solvent resistance of the marking c, e As in 4.14
4.5 Substrate bending test See IEC 60384-1:2008,
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤10 % of the value measured in 4.5.2
As in 4.2.2 See detail specification
Capacitance As in 4.3.2.2 │∆C/C│ ≤2 % of the value measured in 4.3.2
Tangent of loss angle As in 4.3.3.2 See detail specification
Insulation resistance As in 4.3.4.2 See detail specification
Table 3 – Test schedule for qualification approval (3 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
4.8 Rapid change of temperature As in 4.8.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 See detail specification
Tangent of loss angle As in 4.3.3.2 See detail specification
Temperature: upper category temperature Duration: 16 h 4.9.4 Damp heat, cyclic,
Test Db, first cycle As in 4.9.4
Table 3 – Test schedule for qualification approval (4 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible conforming non- items ( c )
Visual examination As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤3 % of the value measured in 4.9.2 Tangent of loss angle: at 10 kHz for C N ≤ 1 àF As in 4.3.3.4 Increase of tan δ :
≤0,008 for Grade 2 compared to values measured in 4.9.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,003 for Grade 1
≤0,005 for Grade 2 compared to values measured in 4.9.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4.3
4.10 Damp heat, steady state As in 4.10.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % compared to values measured in 4.10.2
Table 3 – Test schedule for qualification approval (5 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
Tangent of loss angle at 1 kHz D As in 4.3.3.2 Increase of tan δ :
≤0,005 compared to values measured in 4.10.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % for Grade 1
≤8 % for Grade 2 compared to values measured in 4.11.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 compared to values measured in 4.11.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.11.2
Insulation resistance As in 4.3.4.2 ≥50 %of values in 4.3.4.3
4.12 Charge and discharge As in 4.12.3
Table 3 – Test schedule for qualification approval (6 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
≤5 % for Grade 2 compared to values measured in 4.12.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 at 1 kHz for C N > 1àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.12.2
Insulation resistance must meet or exceed 50% of the values specified in Clause 4.3.4 The subclause numbers for test and performance requirements are referenced in Clause 4 In the context of this table, "D" denotes destructive testing while "ND" indicates non-destructive testing Testing may be performed on surface mount capacitors that are mounted on a substrate It is essential for the detail specification to specify the substrate material used for the individual groups 3.1 to 3.4 when different materials are employed This is required if applicable.
Quality conformance inspection
Formation of inspection lots
These tests shall be carried out on a lot-by-lot basis
A manufacturer can combine current production into inspection lots, ensuring that each lot consists of structurally similar capacitors Additionally, the tested sample must accurately represent the values and dimensions found within the inspection lot.
– in relation to their number;
If a sample contains fewer than five of any single value, the manufacturer and the certification body (CB) must mutually agree on the sampling basis.
These tests shall be carried out on a periodic basis
Samples must accurately represent the current production for the specified periods and should be categorized into small, medium, and large sizes To ensure comprehensive approval coverage, one voltage must be tested from each size group In future periods, additional sizes and/or voltage ratings will be tested to encompass the entire range of production.
Test schedule
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification.
Delayed delivery
When according to the procedures of IEC 60384-1:2008, Q.10 re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and Group B inspection.
Mounting
As in 4.2.2 See detail specification
Capacitance As in 4.3.2.2 │∆C/C│ ≤2 % of the value measured in 4.3.2
Tangent of loss angle As in 4.3.3.2 See detail specification
Insulation resistance As in 4.3.4.2 See detail specification
Table 3 – Test schedule for qualification approval (3 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
4.8 Rapid change of temperature As in 4.8.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 See detail specification
Tangent of loss angle As in 4.3.3.2 See detail specification
Temperature: upper category temperature Duration: 16 h 4.9.4 Damp heat, cyclic,
Test Db, first cycle As in 4.9.4
Table 3 – Test schedule for qualification approval (4 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible conforming non- items ( c )
Visual examination As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤3 % of the value measured in 4.9.2 Tangent of loss angle: at 10 kHz for C N ≤ 1 àF As in 4.3.3.4 Increase of tan δ :
≤0,008 for Grade 2 compared to values measured in 4.9.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,003 for Grade 1
≤0,005 for Grade 2 compared to values measured in 4.9.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4.3
4.10 Damp heat, steady state As in 4.10.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % compared to values measured in 4.10.2
Table 3 – Test schedule for qualification approval (5 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
Tangent of loss angle at 1 kHz D As in 4.3.3.2 Increase of tan δ :
≤0,005 compared to values measured in 4.10.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % for Grade 1
≤8 % for Grade 2 compared to values measured in 4.11.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 compared to values measured in 4.11.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.11.2
Insulation resistance As in 4.3.4.2 ≥50 %of values in 4.3.4.3
4.12 Charge and discharge As in 4.12.3
Table 3 – Test schedule for qualification approval (6 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
≤5 % for Grade 2 compared to values measured in 4.12.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 at 1 kHz for C N > 1àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.12.2
Insulation resistance must be at least 50% of the values specified in Clause 4.3.4 The subclause numbers refer to the test and performance requirements outlined in Clause 4 In the context of this table, "D" denotes destructive testing while "ND" indicates non-destructive testing This test can be performed on surface mount capacitors that are mounted on a substrate Additionally, when different substrate materials are utilized for the individual groups 3.1 to 3.4, the detail specification should clearly indicate the substrate material used for each group.
These tests shall be carried out on a lot-by-lot basis
A manufacturer can consolidate current production into inspection lots, ensuring that each lot comprises structurally similar capacitors Additionally, the tested sample must accurately represent the values and dimensions found within the inspection lot.
– in relation to their number;
Samples must contain a minimum of five units of any single value If a sample has fewer than five units of any one value, the manufacturer and the certification body (CB) must mutually agree on the sampling basis.
These tests shall be carried out on a periodic basis
Samples must accurately represent the current production for the specified periods and should be categorized into small, medium, and large sizes To ensure comprehensive approval coverage, one voltage must be tested from each size group In future periods, additional sizes and/or voltage ratings will be tested to encompass the entire range of production.
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification
When according to the procedures of IEC 60384-1:2008, Q.10 re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and Group B inspection
The assessment level EZ is stated in Table 4 and Table 5
Table 4 – Lot-by-lot inspection
The B2 S-3 inspection level specifies the sample size (n) and the permissible number of non-conforming items (c) Details regarding the inspection subgroup are outlined in Clause 2 of the blank detail specification Inspections will be conducted following the removal of any non-conforming items.
100 % testing during the manufacturing process The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2:2007, Annex A
Whether the lot was accepted or not, all samples for sampling inspection shall be inspected in order to monitor outgoing quality level by non-conforming items per million (×10 -6 )
If any non-conforming items are found in a sample, the entire lot will be rejected; however, all non-conforming items will still be included in the calculation of quality level values.
The outgoing quality level of non-conforming items per million (× 10^-6) is calculated by aggregating inspection data as outlined in IEC 61193-2:2007, section 6.2 The sample size for testing must be determined accordingly.
C3.4 6 9 0 a p = periodicity in months n = sample size c = permissible number of non-conforming items b The content of the inspection subgroup is described in Clause 2 of the blank detail specification
This Clause supplements the information given in IEC 60384-1:2008, Clause 4
Visual examination and check of dimensions
General
See IEC 60384-1:2008, 4.4 with the following details:
Visual examination and check of dimensions
Visual examination shall be carried out with suitable equipment with approximately 10× magnification and lighting appropriate to the specimen under test and the quality level required
The operator should have available facilities for incident or transmitted illumination as well as an appropriate measuring facility.
Requirements
The capacitors shall be examined to verify that the materials, design, construction, physical dimensions and workmanship are in accordance with the applicable requirements given in the detail specification.
Electrical tests
Voltage proof
4.3.4 Insulation resistance As in 4.3.4.2 As in 4.3.4.3
4.6 Resistance to soldering heat As in 4.6.3
Visual examination As in 4.6 5 As in 4.6.5
Capacitance │∆C/C│ ≤3 % of the value measured in 4.6.2 4.13 Component solvent resistance c,e As in 4.13
Tangent of loss angle (tan δ )
angle As in 4.3.3.2 As in 4.3.3.3
4.3.1 Voltage proof As in 4.3.1.2 and 4.3.1.3 As in 4.3.1.4
Insulation resistance
resistance As in 4.3.4.2 As in 4.3.4.3
4.6 Resistance to soldering heat As in 4.6.3
Visual examination As in 4.6 5 As in 4.6.5
Capacitance │∆C/C│ ≤3 % of the value measured in 4.6.2 4.13 Component solvent resistance c,e As in 4.13
Table 3 – Test schedule for qualification approval (2 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
Visual examination As in 4.7.3 As in 4.7.3
4.14 Solvent resistance of the marking c, e As in 4.14
4.5 Substrate bending test See IEC 60384-1:2008,
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤10 % of the value measured in 4.5.2
As in 4.2.2 See detail specification
Capacitance As in 4.3.2.2 │∆C/C│ ≤2 % of the value measured in 4.3.2
Tangent of loss angle As in 4.3.3.2 See detail specification
Insulation resistance As in 4.3.4.2 See detail specification
Table 3 – Test schedule for qualification approval (3 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
Substrate bending test
Initial inspections
Resistance to soldering heat
Initial inspections
Visual examination As in 4.6 5 As in 4.6.5
Capacitance │∆C/C│ ≤3 % of the value measured in 4.6.2 4.13 Component solvent resistance c,e As in 4.13
Table 3 – Test schedule for qualification approval (2 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
Visual examination As in 4.7.3 As in 4.7.3
4.14 Solvent resistance of the marking c, e As in 4.14
4.5 Substrate bending test See IEC 60384-1:2008,
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤10 % of the value measured in 4.5.2
As in 4.2.2 See detail specification
Capacitance As in 4.3.2.2 │∆C/C│ ≤2 % of the value measured in 4.3.2
Tangent of loss angle As in 4.3.3.2 See detail specification
Insulation resistance As in 4.3.4.2 See detail specification
Table 3 – Test schedule for qualification approval (3 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
4.8 Rapid change of temperature As in 4.8.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 See detail specification
Tangent of loss angle As in 4.3.3.2 See detail specification
Temperature: upper category temperature Duration: 16 h 4.9.4 Damp heat, cyclic,
Test Db, first cycle As in 4.9.4
Table 3 – Test schedule for qualification approval (4 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible conforming non- items ( c )
Visual examination As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤3 % of the value measured in 4.9.2 Tangent of loss angle: at 10 kHz for C N ≤ 1 àF As in 4.3.3.4 Increase of tan δ :
≤0,008 for Grade 2 compared to values measured in 4.9.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,003 for Grade 1
≤0,005 for Grade 2 compared to values measured in 4.9.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4.3
4.10 Damp heat, steady state As in 4.10.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % compared to values measured in 4.10.2
Table 3 – Test schedule for qualification approval (5 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
Tangent of loss angle at 1 kHz D As in 4.3.3.2 Increase of tan δ :
≤0,005 compared to values measured in 4.10.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % for Grade 1
≤8 % for Grade 2 compared to values measured in 4.11.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 compared to values measured in 4.11.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.11.2
Insulation resistance As in 4.3.4.2 ≥50 %of values in 4.3.4.3
4.12 Charge and discharge As in 4.12.3
Table 3 – Test schedule for qualification approval (6 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
≤5 % for Grade 2 compared to values measured in 4.12.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 at 1 kHz for C N > 1àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.12.2
Insulation resistance must be at least 50% of the values specified in Clause 4.3.4 The subclause numbers for test and performance requirements are referenced in Clause 4 In the context of this table, "D" stands for destructive testing and "ND" for non-destructive testing This test can be performed on surface mount capacitors that are mounted on a substrate When different substrate materials are utilized for the individual groups 3.1 to 3.4, the detail specification should clearly indicate the substrate material used for each group.
These tests shall be carried out on a lot-by-lot basis
A manufacturer can combine current production into inspection lots, ensuring that each lot consists of structurally similar capacitors Additionally, the tested sample must accurately represent the values and dimensions found within the inspection lot.
– in relation to their number;
Samples must contain a minimum of five units of any single value If a sample has fewer than five units of any one value, the manufacturer and the certification body (CB) must reach an agreement on the sampling basis.
These tests shall be carried out on a periodic basis
Samples must accurately represent the current production for the specified periods and should be categorized into small, medium, and large sizes To ensure comprehensive approval coverage, one voltage from each size group will be tested In future periods, additional sizes and/or voltage ratings will be evaluated to encompass the entire range of production.
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification
When according to the procedures of IEC 60384-1:2008, Q.10 re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and Group B inspection
The assessment level EZ is stated in Table 4 and Table 5
Table 4 – Lot-by-lot inspection
The inspection level (IL) for B2 S-3 is defined by the sample size (n) and the permissible number of non-conforming items (c) Details regarding the inspection subgroup can be found in Clause 2 of the blank detail specification Inspections will be conducted following the removal of any non-conforming items.
100 % testing during the manufacturing process The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2:2007, Annex A
Whether the lot was accepted or not, all samples for sampling inspection shall be inspected in order to monitor outgoing quality level by non-conforming items per million (×10 -6 )
If any non-conforming items are found in a sample, the entire lot will be rejected; however, all non-conforming items will still be included in the calculation of quality level values.
The outgoing quality level of non-conforming items per million (× 10^-6) is calculated by aggregating inspection data as outlined in IEC 61193-2:2007, section 6.2 The sample size for testing must be determined accordingly.
C3.4 6 9 0 a p = periodicity in months n = sample size c = permissible number of non-conforming items b The content of the inspection subgroup is described in Clause 2 of the blank detail specification
This Clause supplements the information given in IEC 60384-1:2008, Clause 4
4.2 Visual examination and check of dimensions
See IEC 60384-1:2008, 4.4 with the following details:
4.2.2 Visual examination and check of dimensions
Visual examination shall be carried out with suitable equipment with approximately 10× magnification and lighting appropriate to the specimen under test and the quality level required
The operator should have available facilities for incident or transmitted illumination as well as an appropriate measuring facility
The capacitors shall be examined to verify that the materials, design, construction, physical dimensions and workmanship are in accordance with the applicable requirements given in the detail specification
See IEC 60384-1:2008, 4.6 with the following details:
The product of R 1 and the nominal capacitance of the capacitor under test (C X ) shall be smaller than or equal to 1 s and greater than 0,01 s
R 1 includes the internal resistance of the power supply
R 2 shall limit the discharge current to a value equal to or less than 1 A
The voltages specified in Table 6 must be applied to the terminals at measuring points 1a) as outlined in IEC 60384-1:2008, Table 3 This application should last for 1 minute during qualification approval testing and for 1 second during lot-by-lot quality conformance testing.
There shall be no breakdown or flashover during the test
NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed
See IEC 60384-1:2008, 4.7 with the following details:
The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz For nominal capacitance values >10 àF, 50 Hz to 120 Hz may be used
The peak voltage applied at 1,000 Hz must not exceed 3% of the rated voltage, while at frequencies between 50 Hz and 120 Hz, it should not surpass 20% of the rated voltage, with a maximum limit of 100 V (70 V r.m.s.).
The capacitance shall be within the specified tolerance
4.3.3 Tangent of loss angle (tan δ )
See IEC 60384-1:2008, 4.8 with the following details:
4.3.3.2 Measuring conditions for measurements at 1 000 Hz
The test conditions are as follows:
– Peak voltage: ≤3 % of the rated voltage;
4.3.3.3 Requirement for measurements at 1 000 Hz
Tan δ shall not exceed the applicable values shown in Table 7
Nominal capacitance Tan δ (absolute value) àF Grade 1 capacitors Grade 2 capacitors
4.3.3.4 Measuring conditions for measurements at 10 kHz
For capacitors with C N ≤ 1 àF, tan δ shall be in addition measured when required in Table 2 for certain tests
See IEC 60384-1:2008, 4.5 with the following details:
Prior to the test, capacitors shall be carefully cleaned to remove any contamination Care shall be taken to maintain cleanliness in the test chambers and during post test measurements
Before taking measurements, ensure that the capacitors are completely discharged The resistance of the discharge circuit multiplied by the nominal capacitance of the capacitor being tested must be greater than or equal to 0.01 seconds, or any other value specified in the detailed specifications.
The measuring voltage shall be in accordance with IEC 60384-1:2008, 4.5.2 The measuring points shall be in accordance with IEC 60384-1:2008, Table 3
The voltage shall be applied immediately at the correct value through the internal resistance of the voltage source
The product of the internal resistance and the nominal capacitance of the capacitor shall be smaller than 1 s or any other value prescribed in the detail specification
The insulation resistance shall meet the requirements of Table 8
Table 8 – Requirements regarding insulation resistance
Minimal RC product ( R = insulation resistance between the terminations) ( C = nominal capacitance C N ) s
Minimum insulation resistance between the terminations
When testing at temperatures different from 20 °C, results must be adjusted to 20 °C using the relevant correction factor If there is uncertainty, the measurement taken at 20 °C is considered definitive The correction factors listed in Table 9 serve as average values for metallized polyethylene-terephthalate film capacitors.
Table 9 – Correction factor dependent on temperature
Capacitance shall be measured according to 4.3.2
The capacitance shall be measured in the board bending position
The capacitance value and visual examination: They shall meet the requirements shown in Table 3
See IEC 60384-1:2008, 4.14 with the following details:
The capacitance shall be measured according to 4.3.2.
Final inspections and requirements
Visual examination As in 4.6 5 As in 4.6.5
Capacitance │∆C/C│ ≤3 % of the value measured in 4.6.2 4.13 Component solvent resistance c,e As in 4.13
Table 3 – Test schedule for qualification approval (2 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
Solderability
General
See IEC 60384-1:2008, 4.15 with the following details:
Final inspections and requirements
Visual examination As in 4.7.3 As in 4.7.3
4.14 Solvent resistance of the marking c, e As in 4.14
4.5 Substrate bending test See IEC 60384-1:2008,
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤10 % of the value measured in 4.5.2
As in 4.2.2 See detail specification
Capacitance As in 4.3.2.2 │∆C/C│ ≤2 % of the value measured in 4.3.2
Tangent of loss angle As in 4.3.3.2 See detail specification
Insulation resistance As in 4.3.4.2 See detail specification
Table 3 – Test schedule for qualification approval (3 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements Number of specimens ( n ) and number of permissible non- conforming items ( c )
Rapid change of temperature
Initial inspections
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 See detail specification
Tangent of loss angle As in 4.3.3.2 See detail specification
Temperature: upper category temperature Duration: 16 h 4.9.4 Damp heat, cyclic,
Test Db, first cycle As in 4.9.4
Table 3 – Test schedule for qualification approval (4 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible conforming non- items ( c )
Visual examination As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤3 % of the value measured in 4.9.2 Tangent of loss angle: at 10 kHz for C N ≤ 1 àF As in 4.3.3.4 Increase of tan δ :
≤0,008 for Grade 2 compared to values measured in 4.9.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,003 for Grade 1
≤0,005 for Grade 2 compared to values measured in 4.9.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4.3
4.10 Damp heat, steady state As in 4.10.3
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % compared to values measured in 4.10.2
Table 3 – Test schedule for qualification approval (5 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
Tangent of loss angle at 1 kHz D As in 4.3.3.2 Increase of tan δ :
≤0,005 compared to values measured in 4.10.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % for Grade 1
≤8 % for Grade 2 compared to values measured in 4.11.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 compared to values measured in 4.11.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.11.2
Insulation resistance As in 4.3.4.2 ≥50 %of values in 4.3.4.3
4.12 Charge and discharge As in 4.12.3
Table 3 – Test schedule for qualification approval (6 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
≤5 % for Grade 2 compared to values measured in 4.12.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 at 1 kHz for C N > 1àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.12.2
Insulation resistance must meet or exceed 50% of the values specified in Clause 4.3.4 The subclause numbers for test and performance requirements are referenced in Clause 4 In the context of this table, "D" denotes destructive testing while "ND" indicates non-destructive testing This test can be performed on surface mount capacitors that are mounted on a substrate It is essential for the detail specification to specify the substrate material used for the individual groups 3.1 to 3.4 when different materials are employed.
These tests shall be carried out on a lot-by-lot basis
A manufacturer can consolidate current production into inspection lots, ensuring that each lot comprises structurally similar capacitors Additionally, the tested sample must accurately represent the values and dimensions found within the inspection lot.
– in relation to their number;
Samples must contain a minimum of five units of any single value If a sample has fewer than five units of any one value, the manufacturer and the certification body (CB) must mutually agree on the sampling basis.
These tests shall be carried out on a periodic basis
Samples must accurately represent the current production for the specified periods and should be categorized into small, medium, and large sizes To ensure comprehensive approval coverage, one voltage must be tested from each size group In future periods, additional sizes and/or voltage ratings will be tested to encompass the entire range of production.
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification
When according to the procedures of IEC 60384-1:2008, Q.10 re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and Group B inspection
The assessment level EZ is stated in Table 4 and Table 5
Table 4 – Lot-by-lot inspection
The B2 S-3 inspection level specifies that the sample size (n) and the permissible number of non-conforming items (c) are critical parameters Detailed descriptions of the inspection subgroup can be found in Clause 2 of the blank detail specification Inspections must be conducted following the removal of any non-conforming items.
100 % testing during the manufacturing process The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2:2007, Annex A
Whether the lot was accepted or not, all samples for sampling inspection shall be inspected in order to monitor outgoing quality level by non-conforming items per million (×10 -6 )
If any non-conforming items are found in a sample, the entire lot will be rejected, but all non-conforming items will still be included in the calculation of quality level values.
The outgoing quality level of non-conforming items per million (× 10^-6) is calculated by aggregating inspection data as outlined in IEC 61193-2:2007, section 6.2 The sample size for testing must be determined accordingly.
C3.4 6 9 0 a p = periodicity in months n = sample size c = permissible number of non-conforming items b The content of the inspection subgroup is described in Clause 2 of the blank detail specification
This Clause supplements the information given in IEC 60384-1:2008, Clause 4
4.2 Visual examination and check of dimensions
See IEC 60384-1:2008, 4.4 with the following details:
4.2.2 Visual examination and check of dimensions
Visual examination shall be carried out with suitable equipment with approximately 10× magnification and lighting appropriate to the specimen under test and the quality level required
The operator should have available facilities for incident or transmitted illumination as well as an appropriate measuring facility
The capacitors shall be examined to verify that the materials, design, construction, physical dimensions and workmanship are in accordance with the applicable requirements given in the detail specification
See IEC 60384-1:2008, 4.6 with the following details:
The product of R 1 and the nominal capacitance of the capacitor under test (C X ) shall be smaller than or equal to 1 s and greater than 0,01 s
R 1 includes the internal resistance of the power supply
R 2 shall limit the discharge current to a value equal to or less than 1 A
The voltages specified in Table 6 must be applied to the terminals at measuring points 1a) as outlined in IEC 60384-1:2008, Table 3 This application should last for 1 minute during qualification approval testing and for 1 second during lot-by-lot quality conformance testing.
There shall be no breakdown or flashover during the test
NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed
See IEC 60384-1:2008, 4.7 with the following details:
The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz For nominal capacitance values >10 àF, 50 Hz to 120 Hz may be used
The peak voltage applied at 1,000 Hz must not exceed 3% of the rated voltage, while at frequencies between 50 Hz and 120 Hz, it should not surpass 20% of the rated voltage, with a maximum limit of 100 V (70 V r.m.s.).
The capacitance shall be within the specified tolerance
4.3.3 Tangent of loss angle (tan δ )
See IEC 60384-1:2008, 4.8 with the following details:
4.3.3.2 Measuring conditions for measurements at 1 000 Hz
The test conditions are as follows:
– Peak voltage: ≤3 % of the rated voltage;
4.3.3.3 Requirement for measurements at 1 000 Hz
Tan δ shall not exceed the applicable values shown in Table 7
Nominal capacitance Tan δ (absolute value) àF Grade 1 capacitors Grade 2 capacitors
4.3.3.4 Measuring conditions for measurements at 10 kHz
For capacitors with C N ≤ 1 àF, tan δ shall be in addition measured when required in Table 2 for certain tests
See IEC 60384-1:2008, 4.5 with the following details:
Prior to the test, capacitors shall be carefully cleaned to remove any contamination Care shall be taken to maintain cleanliness in the test chambers and during post test measurements
Before taking measurements, ensure that the capacitors are completely discharged The resistance of the discharge circuit multiplied by the nominal capacitance of the capacitor being tested must be at least 0.01 seconds, or any other value specified in the detailed specifications.
The measuring voltage shall be in accordance with IEC 60384-1:2008, 4.5.2 The measuring points shall be in accordance with IEC 60384-1:2008, Table 3
The voltage shall be applied immediately at the correct value through the internal resistance of the voltage source
The product of the internal resistance and the nominal capacitance of the capacitor shall be smaller than 1 s or any other value prescribed in the detail specification
The insulation resistance shall meet the requirements of Table 8
Table 8 – Requirements regarding insulation resistance
Minimal RC product ( R = insulation resistance between the terminations) ( C = nominal capacitance C N ) s
Minimum insulation resistance between the terminations
When testing at temperatures different from 20 °C, results must be adjusted to 20 °C using the relevant correction factor If there is uncertainty, the measurement taken at 20 °C is the final reference The correction factors listed in Table 9 serve as average values for metallized polyethylene-terephthalate film capacitors.
Table 9 – Correction factor dependent on temperature
Capacitance shall be measured according to 4.3.2
The capacitance shall be measured in the board bending position
The capacitance value and visual examination: They shall meet the requirements shown in Table 3
See IEC 60384-1:2008, 4.14 with the following details:
The capacitance shall be measured according to 4.3.2
Test conditions are as follows:
– Method: Method 1 or 2, unless otherwise specified in detail specification;
– Duration: 5 s ± 0,5 s or 10 s ± 1 s, unless otherwise specified in detail specification
If Method 1 is applied, immersion and withdrawal speed shall be 25 mm/s ± 2,5 mm/s
The recovery period shall be 24 h ± 2 h
After recovery the capacitors shall be visually examined and measured and shall meet the following requirements:
Under normal lighting and approximately 10× magnification, there shall be no signs of damage such as cracks
The capacitance shall be measured according to 4.3.2 and shall meet the requirements given in Table 3
See IEC 60384-1:2008, 4.15 with the following details:
The test conditions shall be specified in the detail specification Preconditioning or ageing, is not required, unless otherwise specified in the detail specification
The capacitor shall then be visually examined under normal lighting and approximately 10× magnification There shall be no signs of damage
Soldered areas must feature a smooth, bright coating, with only minimal scattered imperfections like pinholes or unwetted regions It is essential that these imperfections are not clustered in a single location.
See IEC 60384-1:2008, 4.16 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3.
Final inspections and requirements
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 See detail specification
Tangent of loss angle As in 4.3.3.2 See detail specification
Climatic sequence
Initial inspections
Damp heat, cyclic, test Db, first cycle
Test Db, first cycle As in 4.9.4
Cold
Damp heat, cyclic, test Db, remaining cycles
Recovery
Table 3 – Test schedule for qualification approval (4 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible conforming non- items ( c )
Final inspections and requirements
Visual examination As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤3 % of the value measured in 4.9.2 Tangent of loss angle: at 10 kHz for C N ≤ 1 àF As in 4.3.3.4 Increase of tan δ :
≤0,008 for Grade 2 compared to values measured in 4.9.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,003 for Grade 1
≤0,005 for Grade 2 compared to values measured in 4.9.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4.3
Damp heat, steady state
Initial inspections
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % compared to values measured in 4.10.2
Table 3 – Test schedule for qualification approval (5 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
Tangent of loss angle at 1 kHz D As in 4.3.3.2 Increase of tan δ :
≤0,005 compared to values measured in 4.10.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % for Grade 1
≤8 % for Grade 2 compared to values measured in 4.11.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 compared to values measured in 4.11.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.11.2
Insulation resistance As in 4.3.4.2 ≥50 %of values in 4.3.4.3
4.12 Charge and discharge As in 4.12.3
Table 3 – Test schedule for qualification approval (6 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
≤5 % for Grade 2 compared to values measured in 4.12.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 at 1 kHz for C N > 1àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.12.2
Insulation resistance must be at least 50% of the values specified in Clause 4.3.4 The subclause numbers refer to the test and performance requirements outlined in Clause 4 In the context of this table, "D" denotes destructive testing, while "ND" indicates non-destructive testing This test can be performed on surface mount capacitors that are mounted on a substrate It is essential for the detail specification to specify the substrate material used for the individual groups 3.1 to 3.4 when different materials are employed.
These tests shall be carried out on a lot-by-lot basis
A manufacturer can combine current production into inspection lots, ensuring that each lot consists of structurally similar capacitors Additionally, the tested sample must accurately represent the values and dimensions found within the inspection lot.
– in relation to their number;
Samples must contain a minimum of five units of any single value If a sample has fewer than five units of any one value, the manufacturer and the certification body (CB) must agree on the sampling basis.
These tests shall be carried out on a periodic basis
Samples must accurately represent the current production for the specified periods and should be categorized into small, medium, and large sizes To ensure comprehensive approval coverage, one voltage must be tested from each size group In future periods, additional sizes and/or voltage ratings will be tested to encompass the entire range of production.
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification
When according to the procedures of IEC 60384-1:2008, Q.10 re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and Group B inspection
The assessment level EZ is stated in Table 4 and Table 5
Table 4 – Lot-by-lot inspection
The B2 S-3 c 0 a IL inspection level specifies the sample size (n) and the permissible number of non-conforming items (c) The details of the inspection subgroup are outlined in Clause 2 of the blank detail specification Inspections will be conducted following the removal of any non-conforming items.
100 % testing during the manufacturing process The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2:2007, Annex A
Whether the lot was accepted or not, all samples for sampling inspection shall be inspected in order to monitor outgoing quality level by non-conforming items per million (×10 -6 )
If any non-conforming items are found in a sample, the entire lot will be rejected, but all non-conforming items will still be included in the calculation of quality level values.
The outgoing quality level of non-conforming items per million (× 10^-6) is calculated by aggregating inspection data as outlined in IEC 61193-2:2007, section 6.2 The sample size for testing must be determined accordingly.
C3.4 6 9 0 a p = periodicity in months n = sample size c = permissible number of non-conforming items b The content of the inspection subgroup is described in Clause 2 of the blank detail specification
This Clause supplements the information given in IEC 60384-1:2008, Clause 4
4.2 Visual examination and check of dimensions
See IEC 60384-1:2008, 4.4 with the following details:
4.2.2 Visual examination and check of dimensions
Visual examination shall be carried out with suitable equipment with approximately 10× magnification and lighting appropriate to the specimen under test and the quality level required
The operator should have available facilities for incident or transmitted illumination as well as an appropriate measuring facility
The capacitors shall be examined to verify that the materials, design, construction, physical dimensions and workmanship are in accordance with the applicable requirements given in the detail specification
See IEC 60384-1:2008, 4.6 with the following details:
The product of R 1 and the nominal capacitance of the capacitor under test (C X ) shall be smaller than or equal to 1 s and greater than 0,01 s
R 1 includes the internal resistance of the power supply
R 2 shall limit the discharge current to a value equal to or less than 1 A
The voltages specified in Table 6 must be applied to the terminals at measuring points 1a) as outlined in IEC 60384-1:2008, Table 3 This application should last for 1 minute during qualification approval testing and for 1 second during lot-by-lot quality conformance testing.
There shall be no breakdown or flashover during the test
NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed
See IEC 60384-1:2008, 4.7 with the following details:
The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz For nominal capacitance values >10 àF, 50 Hz to 120 Hz may be used
The peak voltage applied at 1,000 Hz must not exceed 3% of the rated voltage, while at frequencies between 50 Hz and 120 Hz, it should not surpass 20% of the rated voltage, with a maximum limit of 100 V (70 V r.m.s.).
The capacitance shall be within the specified tolerance
4.3.3 Tangent of loss angle (tan δ )
See IEC 60384-1:2008, 4.8 with the following details:
4.3.3.2 Measuring conditions for measurements at 1 000 Hz
The test conditions are as follows:
– Peak voltage: ≤3 % of the rated voltage;
4.3.3.3 Requirement for measurements at 1 000 Hz
Tan δ shall not exceed the applicable values shown in Table 7
Nominal capacitance Tan δ (absolute value) àF Grade 1 capacitors Grade 2 capacitors
4.3.3.4 Measuring conditions for measurements at 10 kHz
For capacitors with C N ≤ 1 àF, tan δ shall be in addition measured when required in Table 2 for certain tests
See IEC 60384-1:2008, 4.5 with the following details:
Prior to the test, capacitors shall be carefully cleaned to remove any contamination Care shall be taken to maintain cleanliness in the test chambers and during post test measurements
Before taking measurements, ensure that the capacitors are completely discharged The resistance of the discharge circuit multiplied by the nominal capacitance of the capacitor being tested must be at least 0.01 seconds, or any other value specified in the detailed specifications.
The measuring voltage shall be in accordance with IEC 60384-1:2008, 4.5.2 The measuring points shall be in accordance with IEC 60384-1:2008, Table 3
The voltage shall be applied immediately at the correct value through the internal resistance of the voltage source
The product of the internal resistance and the nominal capacitance of the capacitor shall be smaller than 1 s or any other value prescribed in the detail specification
The insulation resistance shall meet the requirements of Table 8
Table 8 – Requirements regarding insulation resistance
Minimal RC product ( R = insulation resistance between the terminations) ( C = nominal capacitance C N ) s
Minimum insulation resistance between the terminations
When testing at temperatures different from 20 °C, results must be adjusted to 20 °C using the relevant correction factor If there is uncertainty, the measurement taken at 20 °C is considered definitive The correction factors listed in Table 9 serve as average values for metallized polyethylene-terephthalate film capacitors.
Table 9 – Correction factor dependent on temperature
Capacitance shall be measured according to 4.3.2
The capacitance shall be measured in the board bending position
The capacitance value and visual examination: They shall meet the requirements shown in Table 3
See IEC 60384-1:2008, 4.14 with the following details:
The capacitance shall be measured according to 4.3.2
Test conditions are as follows:
– Method: Method 1 or 2, unless otherwise specified in detail specification;
– Duration: 5 s ± 0,5 s or 10 s ± 1 s, unless otherwise specified in detail specification
If Method 1 is applied, immersion and withdrawal speed shall be 25 mm/s ± 2,5 mm/s
The recovery period shall be 24 h ± 2 h
After recovery the capacitors shall be visually examined and measured and shall meet the following requirements:
Under normal lighting and approximately 10× magnification, there shall be no signs of damage such as cracks
The capacitance shall be measured according to 4.3.2 and shall meet the requirements given in Table 3
See IEC 60384-1:2008, 4.15 with the following details:
The test conditions shall be specified in the detail specification Preconditioning or ageing, is not required, unless otherwise specified in the detail specification
The capacitor shall then be visually examined under normal lighting and approximately 10× magnification There shall be no signs of damage
Soldered areas must feature a smooth, bright coating, with only minimal scattered imperfections like pinholes or unwetted regions It is essential that these imperfections are not clustered in a single location.
See IEC 60384-1:2008, 4.16 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3
The test conditions are as follows:
The capacitors shall be tested for 5 cycles
The duration of exposure at each temperature limit shall be 30 min
The capacitors shall be visually examined and shall meet the requirements given in Table 3
See IEC 60384-1:2008, 4.21 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3
4.9.4 Damp heat, cyclic, test Db, first cycle
4.9.6 Damp heat, cyclic, test Db, remaining cycles
See IEC 60384-1:2008, 4.21.6 with the following detail:
Within 15 min after removal from the damp heat test, the rated voltage shall be applied for
1 min at measuring point 1a) using the test circuit conditions as given in 4.3.1
The recovery period shall be 1 h to 2 h, unless otherwise specified in the detail specification
After recovery, the surface mount capacitors shall be visually examined and measured and meet the requirements given in Table 3
See IEC 60384-1:2008, 4.22 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3.
Recovery
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % compared to values measured in 4.10.2
Table 3 – Test schedule for qualification approval (5 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
Tangent of loss angle at 1 kHz D As in 4.3.3.2 Increase of tan δ :
≤0,005 compared to values measured in 4.10.2
Insulation resistance As in 4.3.4.2 ≥50 % of values in 4.3.4
As in 4.2.2 No visible damage
Capacitance As in 4.3.2.2 │∆C/C│ ≤5 % for Grade 1
≤8 % for Grade 2 compared to values measured in 4.11.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 compared to values measured in 4.11.2 at 1 kHz for C N > 1 àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.11.2
Insulation resistance As in 4.3.4.2 ≥50 %of values in 4.3.4.3
4.12 Charge and discharge As in 4.12.3
Table 3 – Test schedule for qualification approval (6 of 6)
Subclause number and test a , inspection items D or
Conditions of test a and measurements
Number of specimens ( n ) and number of permissible non- conforming items ( c )
≤5 % for Grade 2 compared to values measured in 4.12.2 Tangent of loss angle: at 10 kHz for C N ≤ 1àF
As in 4.3.3.4 Increase of tan δ :
≤0,005 for Grade 2 at 1 kHz for C N > 1àF As in 4.3.3.2 ≤0,002 for Grade 1
≤0,003 for Grade 2 compared to values measured in 4.12.2
Insulation resistance must meet or exceed 50% of the values specified in Clause 4.3.4 The subclause numbers for test and performance requirements are referenced in Clause 4 In the context of this table, "D" denotes destructive testing, while "ND" indicates non-destructive testing This test can be performed on surface mount capacitors that are mounted on a substrate When different substrate materials are utilized for the individual groups 3.1 to 3.4, the detail specification should clearly indicate the substrate material used for each group, if necessary.
These tests shall be carried out on a lot-by-lot basis
A manufacturer can consolidate current production into inspection lots, ensuring that each lot comprises structurally similar capacitors Additionally, the tested sample must accurately represent the values and dimensions found within the inspection lot.
– in relation to their number;
If a sample contains fewer than five of any single value, the manufacturer and the certification body (CB) must mutually agree on the sampling basis.
These tests shall be carried out on a periodic basis
Samples must accurately represent the current production for the specified periods and should be categorized into small, medium, and large sizes To ensure comprehensive approval coverage, one voltage must be tested from each size group In future periods, additional sizes and/or voltage ratings will be tested to encompass the entire range of production.
The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given in the blank detail specification
When according to the procedures of IEC 60384-1:2008, Q.10 re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and Group B inspection
The assessment level EZ is stated in Table 4 and Table 5
Table 4 – Lot-by-lot inspection
The B2 S-3 inspection level specifies the sample size (n) and the permissible number of non-conforming items (c) Details regarding the inspection subgroup can be found in Clause 2 of the blank detail specification Inspections must be conducted following the removal of any non-conforming items.
100 % testing during the manufacturing process The sampling level shall be established by the manufacturer, preferably according to IEC 61193-2:2007, Annex A
Whether the lot was accepted or not, all samples for sampling inspection shall be inspected in order to monitor outgoing quality level by non-conforming items per million (×10 -6 )
If any non-conforming items are found in a sample, the entire lot will be rejected; however, all non-conforming items will still be included in the calculation of quality level values.
The outgoing quality level of non-conforming items per million (× 10^-6) is calculated by aggregating inspection data as outlined in IEC 61193-2:2007, section 6.2 The sample size for testing must be determined accordingly.
C3.4 6 9 0 a p = periodicity in months n = sample size c = permissible number of non-conforming items b The content of the inspection subgroup is described in Clause 2 of the blank detail specification
This Clause supplements the information given in IEC 60384-1:2008, Clause 4
4.2 Visual examination and check of dimensions
See IEC 60384-1:2008, 4.4 with the following details:
4.2.2 Visual examination and check of dimensions
Visual examination shall be carried out with suitable equipment with approximately 10× magnification and lighting appropriate to the specimen under test and the quality level required
The operator should have available facilities for incident or transmitted illumination as well as an appropriate measuring facility
The capacitors shall be examined to verify that the materials, design, construction, physical dimensions and workmanship are in accordance with the applicable requirements given in the detail specification
See IEC 60384-1:2008, 4.6 with the following details:
The product of R 1 and the nominal capacitance of the capacitor under test (C X ) shall be smaller than or equal to 1 s and greater than 0,01 s
R 1 includes the internal resistance of the power supply
R 2 shall limit the discharge current to a value equal to or less than 1 A
The voltages specified in Table 6 must be applied to the terminals at measuring points 1a) as outlined in IEC 60384-1:2008, Table 3 This application should last for 1 minute during qualification approval testing and for 1 second during lot-by-lot quality conformance testing.
There shall be no breakdown or flashover during the test
NOTE The occurrence of self-healing breakdowns during the application of the test voltages is allowed
See IEC 60384-1:2008, 4.7 with the following details:
The capacitance shall be measured at, or corrected to, a frequency of 1 000 Hz For nominal capacitance values >10 àF, 50 Hz to 120 Hz may be used
The peak voltage applied at 1,000 Hz must not exceed 3% of the rated voltage, while at frequencies between 50 Hz and 120 Hz, it should not exceed 20% of the rated voltage, capped at a maximum of 100 V (70 V r.m.s.).
The capacitance shall be within the specified tolerance
4.3.3 Tangent of loss angle (tan δ )
See IEC 60384-1:2008, 4.8 with the following details:
4.3.3.2 Measuring conditions for measurements at 1 000 Hz
The test conditions are as follows:
– Peak voltage: ≤3 % of the rated voltage;
4.3.3.3 Requirement for measurements at 1 000 Hz
Tan δ shall not exceed the applicable values shown in Table 7
Nominal capacitance Tan δ (absolute value) àF Grade 1 capacitors Grade 2 capacitors
4.3.3.4 Measuring conditions for measurements at 10 kHz
For capacitors with C N ≤ 1 àF, tan δ shall be in addition measured when required in Table 2 for certain tests
See IEC 60384-1:2008, 4.5 with the following details:
Prior to the test, capacitors shall be carefully cleaned to remove any contamination Care shall be taken to maintain cleanliness in the test chambers and during post test measurements
Before taking measurements, ensure that the capacitors are completely discharged The resistance of the discharge circuit multiplied by the nominal capacitance of the capacitor being tested must be greater than or equal to 0.01 seconds, or any other value specified in the detailed specifications.
The measuring voltage shall be in accordance with IEC 60384-1:2008, 4.5.2 The measuring points shall be in accordance with IEC 60384-1:2008, Table 3
The voltage shall be applied immediately at the correct value through the internal resistance of the voltage source
The product of the internal resistance and the nominal capacitance of the capacitor shall be smaller than 1 s or any other value prescribed in the detail specification
The insulation resistance shall meet the requirements of Table 8
Table 8 – Requirements regarding insulation resistance
Minimal RC product ( R = insulation resistance between the terminations) ( C = nominal capacitance C N ) s
Minimum insulation resistance between the terminations
When testing at temperatures different from 20 °C, results must be adjusted to 20 °C using the relevant correction factor If there is uncertainty, the measurement taken at 20 °C is considered definitive The correction factors listed in Table 9 serve as average values for metallized polyethylene-terephthalate film capacitors.
Table 9 – Correction factor dependent on temperature
Capacitance shall be measured according to 4.3.2
The capacitance shall be measured in the board bending position
The capacitance value and visual examination: They shall meet the requirements shown in Table 3
See IEC 60384-1:2008, 4.14 with the following details:
The capacitance shall be measured according to 4.3.2
Test conditions are as follows:
– Method: Method 1 or 2, unless otherwise specified in detail specification;
– Duration: 5 s ± 0,5 s or 10 s ± 1 s, unless otherwise specified in detail specification
If Method 1 is applied, immersion and withdrawal speed shall be 25 mm/s ± 2,5 mm/s
The recovery period shall be 24 h ± 2 h
After recovery the capacitors shall be visually examined and measured and shall meet the following requirements:
Under normal lighting and approximately 10× magnification, there shall be no signs of damage such as cracks
The capacitance shall be measured according to 4.3.2 and shall meet the requirements given in Table 3
See IEC 60384-1:2008, 4.15 with the following details:
The test conditions shall be specified in the detail specification Preconditioning or ageing, is not required, unless otherwise specified in the detail specification
The capacitor shall then be visually examined under normal lighting and approximately 10× magnification There shall be no signs of damage
Soldered areas must feature a smooth, bright coating, with only minimal scattered imperfections like pinholes or unwetted regions It is essential that these imperfections are not clustered in a single location.
See IEC 60384-1:2008, 4.16 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3
The test conditions are as follows:
The capacitors shall be tested for 5 cycles
The duration of exposure at each temperature limit shall be 30 min
The capacitors shall be visually examined and shall meet the requirements given in Table 3
See IEC 60384-1:2008, 4.21 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3
4.9.4 Damp heat, cyclic, test Db, first cycle
4.9.6 Damp heat, cyclic, test Db, remaining cycles
See IEC 60384-1:2008, 4.21.6 with the following detail:
Within 15 min after removal from the damp heat test, the rated voltage shall be applied for
1 min at measuring point 1a) using the test circuit conditions as given in 4.3.1
The recovery period shall be 1 h to 2 h, unless otherwise specified in the detail specification
After recovery, the surface mount capacitors shall be visually examined and measured and meet the requirements given in Table 3
See IEC 60384-1:2008, 4.22 with the following details:
The capacitors shall be mounted according to 4.1
The capacitance shall be measured according to 4.3.2
The tangent of loss angle shall be measured according to 4.3.3
Test conditions are as follows:
– Applied voltage: No voltage shall be applied;
The recovery period shall be 1 h to 2 h.