BSI Standards Publication Photovoltaic devices Part 1 0 Methods of l inearity measurement BS EN 60904 1 0 201 0 National foreword This British Standard is the UK implementation of EN 60904 1 0 201 0 I[.]
Trang 1BSI Standar ds Public ation
Pho tovo ltaic devic es
Part 10: Methods of l nearity meas urement
Trang 2Nat io al fore word
T is Brit ish St an ard is t he U imple me nt at ion of EN 60 04 -10:2 10 It is
ide nt ic l t o IEC 60 04-10:2 0 It supe rse de s BS EN 60 04 -10:19 8 which is
wit hdrawn
T e UK part ic ipat ion in it s pre parat ion was e nt rust e d t o Te ch ic l C ommit t e e
GE /8 , P hot ovolt aic E e rg S st e ms
A ls of organiz t ions re pre se nt e d on t his commit t e e c n be o t aine d on
re que st t o it s se cre t ary
T is publc at ion doe s not purp r t o inclu e al t he ne c e ssary provisions of a
c ont ra t Use rs are re sp nsible for it s core c t ap lc at ion
© BSI 2 10
ISBN 9 8 0 5 0 64 38 4
ICS 2 160
C omplance wit h a Brit ish St andard can ot co fe r immu it y f om
le gal obl gat ions
This B t ish St an ard was p blshe d u de r t he aut ho t y of t he St an ards
P lc y an St rat e gy C ommit t e e o 30 Ap l 2010
Ame ndme nt s is ue d since pu lcat ion
Amd No Dat e Te xt afe ct e d
Trang 3EUROPEA N STANDA RD
EN 60904- 10
NORME EUROPÉENNE
EUR OPÄISCHE NOR M
Marc h 2010
Euro e n Committee forElec trot ec hnical Stan ardiz ation
Comité Euro é n deNormalsat ion Elec trotec niq e
Euro äis hesKomitee für Elek trot ec hnisc he Normu g
Ce ntra l Secreta ria t:Ave nu Marnix 17, B - 100 0 Bru se ls
© 2 10 CENELEC - All rig ts of e ploit at io in a y form a d b a y me n re erv ed wo dwid for CENELECmemb rs
En ls version
Phot ov olt aic dev ices
-Part 10: Met hods of l nearity measurement
(IEC 60904-10:2009)
Disposit ifs ph t ov olt ạques
-Part ie 10: Mét ho esde mesure
de la lnéarit é
(CEI 609 4-10:2 09)
Photov olt aisc e Einric ht ungen
-Tei 10: Mes v erahren für die Linearit ät
(IEC 60904-10:2009)
This Euro e n Stan ard was a pro e b CENELEC o 2 10-0 -01 CENELEC memb rs are b u d t o comply
wit h the CEN/CENELEC Intern l Reg latio s which s p late t he con itio s for givin this Euro e n Stan ard
the st atus of a n tio al stan ard wit ho t a y alteratio
Up-to-d t e lsts a d biblo ra hic al refere ces conc ernin suc h n tio al stan ards ma b o tain d o
a plc atio t o the Ce t ral Secretariat or to a y CENELEC memb r
This Euro e n Stan ard e ists in t hre oficial versio s (En lsh, Fre ch, Germa ) A v rsio in a y ot her
la g a e ma e b tra slatio u d r the resp nsibi t y of a CENELEC memb r into its own la g a e a d n tifie
to the Ce tral Secret ariat h s th same status as th oficial v rsio s
CENELEC memb rs are t he n tio al electrot ec hnic al committ ees of Austria, Belgium, Bulg ria, Cro tia, Cy rus,
the Cz ech Rep blc , De mark, Estonia, Finla d, Fra ce, Germa y, Gre c e, Hu g ry, Ic la d, Irela d, Italy,
L tvia, Lithu nia, L ux mb urg, Malta, the Net herla ds, Norwa , Pola d, Port ug l, Roma ia, Slo akia, Slovenia,
Sp in, Swe e , Swit z erla d a d the Unit ed Kin d m
Trang 4EN 6 9 4-10:2 10 - 2
-Foreword
The t ex t of doc ment 8 /58 /FDIS, fut ure edit ion 2 of IEC 6 9 4-10, pre ared by IEC TC8 , Solar
photovoltaic energ s stems, was s bmit t ed t o t he IEC-CENELEC p ralel vote an w as a prov ed by
CENELEC asEN 6 9 4-10 on 2 10-0 -01
This Euro e n St an ard s p rsedesEN 6 9 4-10:19 8
The main t ec nical c an es w it h regard to t he EN 6 9 4-10:19 8 are as folows:
– Ad ed clau e for two-lamp met hod for
s
lne rity
– Chan ed stan ard deviation as a met ric for lne rity t o p rcent dev iat ion fom lne rity Thiswas done
b cau e a non-lne r dev ice can have a low st an ard deviation an p rcent deviat ion is t he
q ant itat iv e n mb r t hat mat t ers for t he p ramet er of int eres
– R emov ed clau eon sp ct r al resp n iv ity nonlne r ityb cau e it isnot u ed by an PV
t est in / calbr at ion group F r t est in re lPV dev icesit isdific lt t o make t his eror sig ificant in the
sp ct ral mismat ch corect ion fact or w hie st il p s in Isclne rity Me s rin t he resp n iv ity ov er the
ent ire resp n e ran e me n t hat he dev ice w il pro a ly fai t he t emp rat ure lne rity ne r t he b n
ed e
– Ad ed a clau e t o alow s ort circ it lne r ityw ith t emp rat ure or t otal iradian et o b determined
fom a solut e sp ct ral resp n iv ity me s rement s This dat a is routinely re orted in PT primar y
referen e cel calbration cert ificat es
– Ad ed re ort clau e in complan e w it h ISO/IEC 17 2 req ir ement s
– Oft en t he t emp rat ure co ficient of s ort circ it c rent is ver y smal so me s rement erors can
res lt in p rcent deviation out side t he ac e ted ran e Therefore, t he folowin t ex t w as ad ed to
7.3c): “If t he t emp rat ure co ficient of s ort circ it c r ent isles t han 0,1 %/ K , t hen t he device can
b con idered lne rwit h resp ct t o this p ramet er.”
At t ent ion is drawn t o t he p s ibi ty t hat some of t he element s of t his doc ment may b t he s bject of
p t ent rig t s CEN an CENELEC s al not b held resp n ible for ident ifyin an or al s c p t ent
rig t s
The folowin dat es w ere fix ed:
– lat est date by whic the ENhast o b implement ed
at nat ional level bypublcat ion of an identical
nat ional st an ard or by en orsement
(do ) 2 10-12-01
– lat estdate bywhic the national st an ar ds conflct in
w it h t he EN hav e to b wit hdrawn
(dow) 2 13-0 -01
An e ZA has b en ad ed by CENELEC
_ _
Endorsement notice
The t ex t of t he Int ernat ional St an ard IEC 6 9 4-10:2 0 w as a proved by CENELEC as a Euro e n
St an ard w ithout an modificat ion
In t he oficial v ersion, for Biblogra h , t he folowin not es hav e to b ad ed for t he st an ard in icat ed:
IEC 6 9 4-7 NOT Harmo iz d a EN 6 9 4-7
IEC 618 9 NOT Harmo iz d a EN 618 9
Trang 5- 3 - EN 6 9 4-10:2 10
Annex ZA
(normat iv e)
Normat ive reference t o int ernat ional publ cat ions
wit h t heir cor esponding European publ cat ions
The folow in referen ed doc ment s are in isp n a le for t he a plcat ion of t his doc men F r dat ed
referen es, only t he edit ion cit ed a ples For u dated referen es, t he lat est edition of t he referen ed
doc ment in lu in an amen ment s) a ples
NOT Wh n a int ern t io al p blc tio h s b e mo ifie b c ommo mo ific t io s, n ic t ed b (mo ), th relev ant EN/ HD
a ple
IEC 6 8 1 - Photovoltaicdev ices - Proced res for
t emp rat ure an iradian e corect ion t o
me s red I-V c aract eristic
-IEC 6 9 4-1 - Photovoltaicdev ices
-Part 1: Me s rement of phot ovolt aic c rent
-v olt age c aracterist ic
EN 6 9 4-1
-IEC 6 9 4-3 - Photovoltaicdev ices
-Part 3: Me s rement prin iples for t erest rial
photovoltaic (PV ) solar dev ices w it h referen e
sp ct ral iradian e dat a
EN 6 9 4-3
-IEC 6 9 4-8 - Photovoltaicdev ices
-Part 8: Me s rement of sp ct ral resp n e
of a photovoltaic (PV ) device
EN 6 9 4-8
-IEC 6 9 4-9 - Photovoltaicdev ices
-Part 9: Solar simulat or p rorman e
req irement s
EN 6 9 4-9
-IEC 61215 - Cr ystal ne si con t erest rial photovoltaic (PV )
mod les - Desig q alficat ion an typ
a proval
EN 61215
-IEC 616 6 - Thin-im t erest rial photovolt aic (PV )
mod les - Desig q alficat ion an typ
a proval
EN 616 6
-ISO/IEC 17 2 - General req irement s for t he comp t en e of
t est in an calbrat ion la or at ories
EN ISO/IEC 17 2
Trang 6-– 2 – 6 9 4-10 IEC:2 0
CONTENTS
1 Sco e an o ject 5
2 Normative ref eren es 5
3 Ap aratu 6
4 Sample selection 6
5 Proced re for c r ent an voltage l ne rity test 6
5.1 Proced re in natural s nlg t .6
5.2 Proced re with a solar simulator 8
5.3 Proced re f or s ort-circ it l ne rity fom a solute sp ctral resp n ivity 9
6 Proced re for s ort-circ it c r ent l ne rity f om two-lamp method 9
6.1 Bac grou d .9
6.2 Ap aratu - Lig t sources A an B 9
6.3 General proced re 9
7 Line rity calc lation 10 7.1 Slo e l ne rity determination 10 7.2 Determination of the s ort circ it c r ent l ne rity u in the two lamp method 1
7.3 Line rity req irements 1
8 Re ort .1
Biblogra h 13
Trang 76 9 4-10 IEC:2 0 – 5 –
PHOTOVOLTAIC DEVICES –
Part 10: Methods of l nearity measurement
1 Scope a d object
This p rt of IEC 6 9 4 des rib s proced res u ed to determine the degre of lne rity of an
photovoltaic device p rameter with resp ct to a test p rameter It is primariy inten ed for u e
by calbration la oratories, mod le man facturers an s stem desig ers
Photovoltaic (PV) mod le an s stem p rf orman e evaluation , an p r orman e tran lation
f rom one set of temp rature an ir adian e con ition to another f req ently rely on the u e of
lne r eq ation (se IEC 6 8 1 an IEC 618 9) This stan ard lay down the l ne rity
req irements an test method to en ure that these lne r eq ation wi give satisfactory
res lts In irectly, these req irements dictate the ran e of the temp rature an ir adian e
varia les over whic the eq ation can b u ed
The method of me s rement des rib d in this stan ard a ply to al PV devices an are
inten ed to b car ied out on a sample or on a comp ra le device ofidentical tec nolog They
s ould b p r ormed prior to al me s rement an cor ection proced res that req ire a l ne r
device The methodolog u ed in this stan ard is simiar to that sp cified in IEC 6 8 1 in whic
a l ne r (straig t-l ne) fu ction is f ited to a set of data p ints u in a le st-s uares fit
calc lation routine The variation of the data f rom this fu ction is also calc lated, an the
def i ition of lne rity is expres ed as an al owa le variation p rcentage
A device is con idered lne r when it me ts the req irements of 7.3
General proced res for determinin the degre of l ne rity for these an an other p r orman e
p rameter are des rib d in Clau es 5 an 6
2 Normativ ref ere ces
The f olowin referen ed doc ments are in isp n a le for the a plcation of this doc ment For
dated referen es, only the edition cited a pl es For u dated ref eren es, the latest edition of
the ref eren ed doc ment (in lu in an amen ments) a ples
IEC 6 8 1, P hoto oltaic de ic s – P ro edures for temp rature a d iradia c c re tio s to
me sured I -V c ara teristics
IEC 6 9 4-1, P hoto oltaic de ic s – P art 1: Me sureme t of p oto oltaic c re tv lta e
c ara teristics
IEC 6 9 4-3, P hotov ltaic de ic s – P art 3: Me sureme t prin iples forterestrial p oto oltaic
(P V) solar de ic s with refere c sp ctral iradia c data
IEC 6 9 4-8, P hoto oltaic de ic s – P art 8: Me sureme t of sp ctral resp nse of a
p oto oltaic (P V) de ic
IEC 6 9 4-9, P hoto oltaic de ic s – P art 9: Solar simulator p rorma c re uireme ts
IEC 61215, Crystal n si c n terestrial p oto oltaic (P V) modules – Desig q alfic tio a d
Trang 8– 6 – 6 9 4-10 IEC:2 0
IEC 616 6, Thin-fim ter estrial p oto oltaic (P V) modules – Desig q alfic tio a d ty e
a pro al
ISO/IEC 17 2 , Ge eral re uireme ts for th c mp ten e of testin a d c lbratio
la oratories
3 Apparatus
a) Eq ipment neces ary to me s re an I-V c rve (se IEC 6 9 4-1)
b) An eq ipment neces ary to c an e the ir adian e over the ran e of interest without
af fectin the relative sp ctral ir adian e distribution an the sp tial u if ormity, s c as
mes f ilters or neutral den ity f ilters
NOT Th e uipme t a d pro e ure u e to c a g th ira ia c are to b v rifie with a ra iometer Th
c a g in relativ s e tral ira ia c distrib tio s o ld n t re ult in more th n 0,5 % c a g in th s
ort-circ it c re t of th d vic (s e IEC 6 9 4-7 a d IEC 6 9 4-8) Me h fiters are b le e to b th b st
meth d f or larg s ra e
c) An eq ipment neces ary to c an e the temp rature of the test sp cimen overthe ran e of
interest
d) A me n for control n the temp rature of the test sp cimen an referen e device, or a
remova le s ade
e) Eq ipment for me s rin the sp ctral resp n e of the test sp cimen (or a re resentative
sample eq ivalent to the test sp cimen) in ac ordan e with IEC 6 9 4-8 to a re e ta i ty
of± 2 % of the re din
NOT IEC 6 9 4-7 pro id smeth d f or th c mp tatio of s e tral mismatc eror intro u e in th te tin
of p oto oltaic d vic s, a d IEC 6 9 4-8 pro id s g id n e f or s e tral me s reme t
4 Sample selection
This proced re s al b a pled to a ful -sized test sp cimen if p s ible If this is not p s ible, a
smal sample eq ivalent in con tru tion an materials s ould b u ed
5 Proc dure f or cur ent and voltage l nearity test
There are thre ac e ta le proced res for p rormin the lne rity test of s ort-circ it c r ent
with resp ct to temp rature an ir adian e There are two ac e ta le proced res for
p r ormin the lne rity test of o en-circ it voltage with resp ct to temp rature an ir adian e
5.1 Proc d re in natural s nl ght
5.1.1 Me s rement in natural s nl g t s al only b made when:
– The total ir adian e is at le st as hig as the up er l mit of the ran e of interest
– The ir adian e variation cau ed by s ort-term os i ation (clou s, haze, or smoke) is
les than ± 2 % of the total ir adian e as me s red by the referen e device
– The win sp ed is les than 2 m⋅s
1
5.1.2 Mou t the referen e device co-planar with the testsp cimen so that b th are normal to
the direct solar b am within ± 1 Con ect to the neces ary in trumentation
NOT Th me s reme ts d s rib d in th f olowin s b la s s s o ld b ma e a e p ditio sly a p s ible
within a f ew h urs o th s me d y to minimiz th eff ect of c a g s in th s e tral c n itio s If n t, s e tral
c r e tio s ma b re uire
5.1.3 If the test sp cimen an ref eren e device are eq ip ed with temp rature controls, set
the controls at the desired level If temp rature controls are not u ed, s ade the test sp cimen
Trang 96 9 4-10 IEC:2 0 – 7 –
ref eren e device s ould also sta i ze within ± 1 °C of its eq i brium temp rature b fore
proce din
5.1.4 Remove the s ade (if u ed) an immediately take simultane u re din s of the test
p rameter X
i
, the test sp cimen device p rameter Y
i
an the temp rature an s ort-circ it
c r ent of the referen e device
5.1.5 The ir adian e G
o
s al b calc lated f om the me s red s ort circ it c r ent (I
s ) of
the PV referen e device, an its calbration value at Stan ard Test Con ition , STC (I
rc ) A
cor ection s ould b a pl ed to ac ou t f or the temp rature of the ref eren e device T
m
u in
the c r ent-temp rature co f ficient of the referen e device α
rc
0 0 1
m rc
rc s
o
−
−
×
×
I I
5.1.6 If the test p rameter b in varied is the ir adian e, red ce the ir adian e on the test
sp cimen to a k own f raction k
i without aff ectin the sp tial u if ormity or the sp ctral
ir adian e distribution There are variou method by whic to ac ompls this:
a) Usin cal brated, u iform den ity mes f ilters If this method is selected, the ref eren e
device s ould remain u covered by the f ilter d rin the o eration to ena le the in ident
ir adian e to b me s red In this case, k
i
is the fi ter calbration p rameter (f action of l g t
tran mit ed)
b) Usin u cal brated, u iform den ity mes f ilters If this method is selected, the ref eren e
device s ould also b covered by the fi ter d rin the test In this case, k
i
s the ratio of the
ref eren e device s ort-circ it c r ent (I
s ) to its cal bration value (I
rc )
NOT 1 Th ma imum f ilter me h o e in dime sio s o ld b le s th n 1 % of th minimum ln ar
dime sio of th refere c d vic a d th te t s e ime , or a v ria le eror ma o c r d e to p sitio in
c) By control n the an le of in iden e If this method is selected, the ref eren e device s ould
have the same ref lective pro erties as the test sp cimen, an s ould b mou ted co-planar
with the test sp cimen within ± 1 In this case, k
i
is the ratio of the referen e device s
ort-circ it c r ent (I
s ) to its cal bration value (I
rc )
NOT 2 For c ls with thic metal z tio , th rotatio a is s o ld b p ralel to th dire tio ofth metalz d
ln s in ord r to minimiz or elmin te s a owin
5.1.7 Calc late the ir adian e level on the test sp cimen G
i
as f olows:
G
i
= k
i
×G
o
where G
o
is determined by the method des rib d in 5.1.5
5.1.8 If the test p rameter b in varied is the temp rature, adju t the temp rature by me n
of a controler or alternately exp sin an s adin the test sp cimen as req ired to ac ieve
an maintain the desired temp rature Alternately, the test sp cimen may b al owed to
warm-up natural ywith the data recordin proced re of 5.1.4 p rf ormed p riodical y d rin the
warm-up
5.1.9 En ure that the test sp cimen an referen e device temp ratures are sta i zed an
remain con tant within ± 1 °C an that the ir adian e as me s red by the ref eren e device
remain con tant within ± 2 % d rin the data recordin p riod
5.1.10 Re e t ste s 5.1.4 throu h 5.1.9 The value of the test p rameter selected s al b
s c that the ran e of interest is sp n ed in at le st four a proximately eq al in rements A
Trang 10– 8 – 6 9 4-10 IEC:2 0
5.2 Proc d re with a solar simulator
NOT Emis io lamp s c a x n n s o ld b e alu te b fore u e As th b n g p ofth te t d vic v rie
d e to temp rature c a g s, it c n p s thro g v rio s emis io ln s in th lamp s e trum a d giv ris to s ifts
in p rorma c Ba e o th ln arity of s e tral re p n e a d th lamp s e trum th ma nitu e ofthisef fe tc n
b c lc late b p rormin a mismatc c re tio a a f un tio of temp rature
5.2.1 Mou t the test sp cimen an the ref eren e device co-planar in the test plane of the
simulator so that b th are normal to the center l ne of the b am within ± 2° Con ect to the
neces ary in trumentation
5.2.2 If the test sp cimen an ref eren e device are eq ip ed with temp rature controls, set
the controls at the desired level If temp rature controls are not u ed, alow the test sp cimen
an ref eren e device to sta i ze within ± 1 °C of the ro m air temp rature
5.2.3 Set the ir adian e at the test plane to the up er l mit of the ran e of interest u in the
referen e device me s red c r ent (I
s ), an its cal bration value at STC (I
rc )
5.2.4 Con u t the test an take simultane u re din s of the test p rameter X
i , the test
sp cimen device p rameter Y
i
an the temp rature an s ort-circ it c r ent of the ref eren e
device
5.2.5 The ir adian e G
o
s al b calc lated f rom the me s red s ort circ it c r ent (I
s ) of
the PV ref eren e device, an its calbration value at STC (I
rc ) A cor ection s ould b a pled
to ac ou t for the temp rature of the referen e device T
m , u in the c r ent-temp rature
co f ficient of the ref eren e device α
rc
0 0 1
m rc
rc s
o
−
−
×
×
I I
5.2.6 If the test p rameter b in varied is the ir adian e, red ce the ir adian e on the test
sp cimen to a k own f raction k
i without aff ectin the sp tial u if ormity or the sp ctral
ir adian e distribution The variou method by whic to ac ompls this are:
a) by in re sin the distan e b twe n the test plane an the lamp With the ref eren e device
maintained in the same plane as the test sp cimen, k
i
s the ratio of the referen e device
s ort-circ it c r ent (I
s ) to its cal bration value (I
rc );
b) by the u e of an o tical len In this case, k
i
is the ratio of the ref eren e device s ort-circ it
c r ent (I
s
) to its cal bration value (I
rc ) Care s ould b exercised to en ure that the len
do s not sig if i antly c an e the relative sp ctral ir adian e in the wavelen th ran e in
whic the test an ref eren e sp cimen are resp n ive;
c) by control n the an le of in iden e If this method is selected, the distan e b twe n the
lamp source an the sp cimen s al b large to l mit the ir adian e c an e acros the ti ted
s r ace to 0,5 % or les Also, if this method is selected, the radiant b am s al b
col mated, the referen e device s ould have the same ref lective pro erties as the test
sp cimen, an s ould b mou ted co-planar with the test sp cimen In this case, k
i
is the
ratio of the ref eren e device s ort-circ it c r ent (I
s ) to its cal bration value (I
rc );
d) cal brated, u iform den ity mes fiters If this method is selected, the ref eren e device
s ould remain u covered by the f ilter d rin the o eration to ena le the in ident ir adian e
to b me s red In this case, k
i
is the f ilter cal bration p rameter (f action of l g t
tran mit ed);
e) u calbrated, u if orm den ity mes fiters If this method is selected, the referen e device
s ould also b covered by the f ilter d rin the test In this case, k
i
is the ratio of the
referen e device s ort-circ it c r ent (I
s ) to its cal bration value (I
rc )
NOT Th ma imum f ilter me h o e in dime sio s o ld b le s th n 1 %ofth minimum ln ar dime sio
of th ref ere c d vic a d th te t s e ime , or a v ria le eror ma o c r d e to p sitio in