We have demonstrated that the presence of a thin Pt underlayer can enhance the perpendicular coercivity of ultrathin TbFeCofilms with thickness down to 1 nm while preserving their low sat
Trang 1Original article
Enhanced perpendicular coercivity of ultrathin perpendicularly
a thin Pt underlayer
Bang Doa,b,*, Hiroyuki Awanoa
a Toyota Technological Institute, Nagoya 468-8511, Japan
b Institute of Materials Science, VAST, 18 Hoang Quoc Viet, Cau Giay, Hanoi, Viet Nam
a r t i c l e i n f o
Article history:
Received 14 March 2016
Accepted 23 March 2016
Available online 11 April 2016
Keywords:
Perpendicular coercivity
TbeFeeCo
Perpendicular magnetic anisotropy
a b s t r a c t
We have studied the effect of an additional thin Pt underlayer on the magnetic properties of ultrathin perpendicularly magnetized TbFeCofilms grown on silicon substrates We have demonstrated that the presence of a thin Pt underlayer can enhance the perpendicular coercivity of ultrathin TbFeCofilms with thickness down to 1 nm while preserving their low saturation magnetization This can be attributed to the hybridization of Pt and Co orbitals, which induces the strong interfacial perpendicular anisotropy of Co/Pt and/or CoFe/Pt These characteristics are potentially useful to reduce the critical current density induced magnetization switching and enhance the thermal stability of a magnetic tunnel junction and the current-induced domain wall motion in a nanowire made out of the ultrathin TbFeCo magnetic layer
© 2016 Vietnam National University, Hanoi Publishing services by Elsevier B.V This is an open access
article under the CC BY license (http://creativecommons.org/licenses/by/4.0/)
1 Introduction
Perpendicular magnetic anisotropy materials have been studied
for spintronics applications due to their excellent thermal stability
and low critical current density of spin-torque-induced
magneti-zation switching [1e5] An effective way to reduce the critical
current density is reducing thickness of the magnetic layer while
maintaining its desirable perpendicular anisotropy for thermal
stability [6] For practical applications, further reduction to the
critical current density must be reached, representing an important
but difficult task Amorphous TbFeCo alloys, which have low
satu-ration magnetization and large perpendicular anisotropy[7,8], are
expected to fulfill the aforementioned requirements[9e11] It has
been reported that the perpendicular anisotropy can still be
real-ized in TbFeCo films with thickness of just a few nanometers
[10,11] In order to reducefilm thickness while preserving a large
perpendicular coercivity of the TbFeCofilm, underlayers, such as Ti,
SiN [12], Al [12,13], and Ag [14] have been added onto Si/SiO2
substrates In particular, Lee et al.[12]have shown that the
pres-ence of Al and Ti underlayers can enhance the perpendicular
coercivity of ultrathin TbFeCofilms with thickness down to 3 nm
This enhancement of the perpendicular coercivity is attributed to the formation of a Ti, Al island-like surface which effectively pre-vents oxidation of Tb atoms It has been otherwise shown that the amount of Tb is reduced in TbFeCo alloy, leading to the formation of in-plane anisotropy of the FeCo phase while reducing the perpen-dicular anisotropy of the ultrathin TbFeCofilm[15]
According to the recent studies, the hybridization of Pt and Co orbitals can induce the interfacial perpendicular anisotropy of Co/Pt [16] and CoFe/Pt [17] multilayers, where the thickness of the magnetic layers is less than 1 nm The enhanced interfacial anisotropy is attributed to the strong spineorbit coupling and the least reactive metal of Pt These studies have motivated us to perform a systematic investigation into the effect of an additional Pt underlayer on the magnetic properties of TbFeCofilms grown on silicon substrates In this study, we demonstrate the enhancement
of perpendicular coercivity in Pt/TbFeCo bilayerfilms with thick-ness down to 1 nm while preserving their low saturation magnetization
2 Experimental The Tb26Fe66.8Co7.2 films were directly grown on naturally oxidized Si(100) substrates without and with Pt underlayers by using RF/DC magnetron sputtering During the deposition, highly purified Ar gas was kept at a fixed pressure of 1 mTorr The layer
* Corresponding author Toyota Technological Institute, Nagoya 468-8511, Japan.
E-mail address: dobang@toyota-ti.ac.jp (B Do).
Peer review under responsibility of Vietnam National University, Hanoi.
Contents lists available atScienceDirect Journal of Science: Advanced Materials and Devices
j o u r n a l h o m e p a g e : w w w e l s e v i e r c o m / l o c a t e / j s a m d
http://dx.doi.org/10.1016/j.jsamd.2016.03.001
2468-2179/© 2016 Vietnam National University, Hanoi Publishing services by Elsevier B.V This is an open access article under the CC BY license ( http://creativecommons.
Trang 2thicknesses of the TbFeCo and Pt underlayer were varied in the
ranges of tTbFeCo¼ 0.5e27 nm and tPt¼ 0.5e2 nm, respectively A
2 nm-thick Ptfilm was subsequently capped on the TbFeCo layer to
prevent oxidization The magnetic properties of the films were
investigated using a magneto-optical Kerr effect (MOKE) and an
alternating gradient force magnetometer (AGFM) in out-of-plane
fields of up to ±15 kOe The surface topologies of the oxidized Si
substrate and the 2 nm-thick underlayer were observed by atomic
force microscopy (AFM)
3 Results and discussion
Fig 1(a,b) shows the MOKE hysteresis loops of the TbFeCofilms
with different thicknesses without and with the 2 nm-thick Pt
underlayer It can be seen inFig 1(a) that while the TbFeCofilms
with thickness down to 3 nm, grown directly on the oxidized Si
substrates possess well-defined square hysteresis loops, the
thinnerfilms show a dominant in-plane loop of the CoFe phase,
which has been suggested to be formed due to reduction of Tb
content in the alloy[11] To prevent oxidization of Tb, a 2-nm-thick
Pt underlayer wasfirst grown on the oxidized Si substrate.Fig 1(b)
shows the MOKE hysteresis loops of TbFeCofilms grown on the Pt
underlayers As one can see clearly in thisfigure, the presence of the
Pt underlayer enables the well-defined square loops in the TbFeCo
films with thickness reduced to 1.5 nm In this case, the Pt under-layer is much more efficient in preventing the oxidation of Tb than the Al and Ti underlayers as reported in Ref.[12] It has been re-ported[12,13]that the island-like surfaces caused by the Al or Ti underlayer can increase number of pinning sites that restrict mo-tion of domain walls and hence increase the perpendicular coer-civity The same mechanism is expected to be responsible for the case of our Pt/TbFeCofilms
Fig 2shows the AFM images of the naturally oxidized Si sub-strate, without and with the 2-nm-thick Pt underlayer The mean surface roughnesses are determined to be 0.156 and 0.301 nm for the oxidized Si and Pt, respectively Similar to the Al and Ti underlayers[12,13], the large and high island-like structure of the
Pt surface is expected to reduce contact areas between the TbFeCo layer and the oxidized Si substrate, resulting in the observed magnetic properties of the TbFeCofilm We also grown 2-nm-thick TbFeCo layers on much thinner Pt underlayers and measured their MOKE hysteresis loops (data not shown) and found that the Pt underlayer of 0.5 nm thickness can also improve the perpendicular coercivity of the 2-nm-thick TbFeCo layer
InFig 3, one can see that the perpendicular coercivities of the TbFeCofilms grown on the Pt underlayers are larger than those grown directly on the oxidized Si substrate The enhancement of perpendicular coercivity was kept for all thefilm thicknesses of
Fig 1 Magneto-optical Kerr effect hysteresis loops for TbFeCo films grown on the oxidized Si(100) substrate (a) without and (b) with the 2-nm-thick Pt underlayer.
Trang 32e27 nm, except for the 12-nm-thick film This enhancement can
be attributed to the hybridization of Pt and Co orbitals, which
in-duces the strong interfacial perpendicular anisotropy of Co/Pt[16]
and CoFe/Pt[17]multilayers, where the thickness of the magnetic
layers is less than 1 nm In particular, Fang et al.[17]suggested that
the nanoscaled interface structure of a metal layer and an TbFeCo
layer will decrease the exchange interaction between the Tb atom
and the Fe/Co atom locally since the non-magnetic metal is
inser-ted The magnetic pinning sites will be introduced at these weak
exchange interaction locations, giving rise to the enhanced
perpendicular coercivity Gadetsky et al [18] reported that the
TbFeCofilm exhibited a good perpendicular anisotropy when the
Tb content varied between 15 and 38 at.% The authors also showed
that with increasing Tb content, the coercivity first increased,
reached a maximum at 23 at.% Tbe which is a compensation
composition, and then decreased for higher Tb contents For our
samples, we used an alloy target of 26 at.% Tb We observed a
remarkable change in the polarity of Kerr rotation angle for both
the TbFeCofilms grown on the oxidized Si substrate without and
with the Pt underlayer, when the thickness of the film was
increased from 7 to 9 nm This switched polarity is attributed to the
change of film magnetization configuration from the CoeFe
transitional-metal (TM)-rich to Tb-rare-earth (RE)-rich
composi-tion It can be seen that the enhancement of corecivity is larger for
the TbFeCofilms with thicknesses less than 8 nm This provides
solid evidence for the usefulness of the Pt underlayer in preventing
oxidization of Tb from residual oxygen on the bare oxidized Si
substrate It is worth mentioning here that the increase of
perpendicular anisotropy can be an effective way to increase the
thermal stability and reduce the intrinsic critical current density for
magnetization switching with decrease in the saturation
magne-tization of the magnetic layer in a magnetic tunnel junction
Fig 4shows the thickness dependence of saturation
magneti-zation (Ms) for both TbFeCofilms grown without and with the
2-nm-thick Pt underlayer It can be seen that Msstrongly depends
on thickness for the films grown without the 2-nm-thick Pt
underlayer The Mswas largest for the thinnestfilm, which had the
smallest Tb content due to oxidization as noted above As compared
to the case of thefilm grown without the Pt underlayer, Msof the
TbFeCofilm grown with the Pt underlayer (~95 emu/c.c.) was found
to be almost unchanged with respect to variation infilm thickness,
because the presence of the Pt underlayer prevents oxidization of
Tb These results are in good agreement with those reported in Refs
[15]and[18] In those studies, the Mswas reported to decrease with the increase of Tb content for the TM-rich composition An important consequence that emerges from our study is that we demonstrate the addition of a thin Pt underlayer can effectively enhance the perpendicular coercivity of ultrathin TbFeCo films while preserving their low saturation magnetization These char-acteristics are desirable for reducing the critical current density induced switching magnetization and domain wall motion, as well
as for enhancing the thermal stability of the TbFeCo magnetic layer
4 Conclusions
In summary, we studied the effect of adding a Pt underlayer on the magnetic properties of ultrathin TbFeCo films The Pt under-layer was formed as an island-like structure, which created mag-netic pinning sites The presence of the Pt underlayer effectively enhanced the perpendicular coercivity of ultrathin TbFeCo films with thicknesses down to 1 nm while preserving their low satu-ration magnetization The improved characteristics have potential
to reduce the critical current density induced switching magneti-zation and enhance the thermal stability of the TbFeCo magnetic layer in a magnetic tunnel junction and the current-induced domain wall motion in a nanowire made out of the TbFeCo thin film
Acknowledgments This work wasfinancially supported by the Ministry of Educa-tion, Culture, Sports, Science and Technology, Japane KAKENHI No
26630137 (2014-2016)
References [1] S Ikeda, K Miura, H Yamamoto, K Mizunuma, H.D Gan, M Endo, S Kanai,
J Hayakawa, F Matsukuna, H Ohno, A perpendicular-anisotropy CoFeB-MgO magnetic tunnel junction, Nat Mater 9 (2010) 721e724
[2] P Weinberger, Ultrafast switching of a spin valve with perpendicular anisotropy, Phys Rev B 81 (2010) 104417
[3] S Emori, U Bauer, S.-M Ahn, E Martinez, G.S.D Beach, Current-driven dy-namics of chiral ferromagnetic domain walls, Nat Mater 12 (2013) 611e616 [4] I.M Miron, T Moore, H Szambolics, L.D Buda-Prejbeanu, S Auffret,
B Rodmacq, S Pizzini, J Vogel, M Bonfim, A Schuhl, G Gaudin, Fast current-induced domain-wall motion controlled by the Rashba effect, Nat Mater 10 (2011) 419e423
[5] T Komine, K Takahashi, A Ooba, R Sugita, Reduction of intrinsic critical current density for current-induced domain wall motion by using a ferromagnetic
nano-Fig 3 The thickness dependence of perpendicular coercivity for TbFeCo films grown
on the oxidized Si(100) substrate without (circles) and with (squares) the 2-nm-thick
Pt underlayer The lines are shown as a guide to the eyes.
Fig 4 The thickness dependence of perpendicular saturation magnetization for TbFeCo films grown on the oxidized Si(100) substrate without (circles) and with (squares) the 2-nm-thick Pt underlayer.
Trang 4[6] M Nakayama, T Kai, N Shinomura, M Amano, E Kitagawa, T Nagase,
M Yoshikawa, T Kishi, S Ikegawa, H Yoda, Spin transfer switching in TbFeCo/
CoFeB/MgO/CoFeB/TbCoFe magnetic tunnel junctions with perpendicular
magnetic anisotropy, J Appl Phys 103 (2008) 07A710
[7] M Takahashi, T Niihara, N Ohta, Study on recorded domain characteristics of
magneto-optical TbFeCo disks, J Appl Phys 64 (1988) 262
[8] H Saga, H Nemoto, H Sukeda, M Takahashi, New recording method
combining thermo-magnetic writing and flux detection, Jpn J Appl Phys 38
(1999) 1839e1840
[9] Do Bang, H Awano, Current-induced domain wall motion in perpendicular
magnetized Tb-FeCo wire with different interface structures, Appl Phys Exp.
5 (2012) 125201
[10] Do Bang, H Awano, Revesal of domain wall motion in perpendicular
magnetized TbFeCo-based wires: size dependence, Jpn J Appl Phys 52
(2013) 123001e123005
[11] Do Bang, H Awano, Reversal of domain wall motion in perpendicular
magnetized Tb-Fe-Co nanowires, IEEE Trans Magn 49 (2013) 4390e4393
[12] C.-M Lee, L.-X Ye, J.-M Lee, T.-H Hsieh, J.-W Syu, W.-J Chen, C.-Y Huang,
T.-H Wu, Magnetic properties of ultrathin TbFeCo magnetic films with
perpendicular magnetized anisotropy, IEEE Trans Magn 45 (2009) 4023e4026
[13] S Miyanishi, K Kojima, J Sato, K Takayama, H Fuji, A Takahashi, K Ohta, High-density laser-assisted magnetic recording on TbFeCo media with an Al underlayer, J Appl Phys 93 (2003) 7801
[14] Y.H Fang, P.C Kuo, C.Y Chou, S.C Chen, N.W Cheng, P.L Lin, Magnetic properties of TbFeCo film with Ag under-layer, J Magn Magn Mater 310 (2007) e930ee932
[15] M.T Rahman, X Liu, A Morisako, TiN underlayer and overlayer for TbFeCo perpendicular magnetic recording, J Magn Magn Mater 303 (2006) e133ee136
[16] S Bandiera, R.C Rousa, B Rodmacq, B Dieny, Enhancement of perpendicular magnetic anisotropy through reduction of Co-Pt interdiffusion in (Co/Pt) multilayers, Appl Phys Lett 100 (2012) 142410
[17] Y Zhu, J.W Cai, Ultrahigh sensitive Hall effect in magnetic multilayers, Appl Phys Lett 990 (2007) 012104
[18] S.N Gadetsky, A.V Stupnov, M.V Zumkin, E.N Nikolaev, Domain wall dy-namics in TbFeCo thin films, IEEE Trans Magn 28 (1992) 2928e2930