Journal of Magnetism and Magnetic Materials 298 2006 43–47Coexistence of positive and negative exchange bias in CrMn/Co bilayers Nguyen Nguyen Phuoca,b, , Nguyen Phu Thuya,c, Nguyen Anh
Trang 1Journal of Magnetism and Magnetic Materials 298 (2006) 43–47
Coexistence of positive and negative exchange bias in
CrMn/Co bilayers Nguyen Nguyen Phuoca,b, , Nguyen Phu Thuya,c, Nguyen Anh Tuana,
Le Thanh Hunga, Nguyen Trung Thanha, Nguyen Thanh Nama
a
International Training Institute for Materials Science, Hanoi University of Technology, Hanoi, Vietnam
b Information Storage Materials Laboratory, Toyota Technological Institute, Nagoya, Japan
c College of Technology, Vietnam National University, Hanoi, Vietnam Received 7 January 2005; received in revised form 19 February 2005
Available online 24 March 2005
Abstract
Exchange-biased CrMn/Co bilayers with various thicknesses of Co sputtered onto Si(1 0 0) substrates by the RF sputtering system have been studied Double-shifted loops have been observed with the thickness of Co layer in a narrow range and become single-shifted loops after some cycles of measurement Those results are interpreted as the association of positive and negative exchange bias
r2005 Elsevier B.V All rights reserved
PACS: 75.70.Cn; 75.70.i; 75.25.+z; 75.30.Gw
Keywords: Exchange bias; Magnetic thin film; Double-shifted loop; Training effect
1 Introduction
Discovered in 1956 [1], the phenomenon of
exchange bias between an antiferromagnet (AF)
and ferromagnet (FM) is of great interest due to its
widespread application in spin valves and
mag-netic tunnel junctions Nevertheless, its physical origin remains unanswered[2]
Usually, exchange bias is described as an additional unidirectional anisotropy induced by the AF into the FM via exchange coupling at the interface, producing a single magnetic hysteresis loop shifted along the magnetic field axis after field cooling procedure through the Ne´el point of the
AF The magnitude of this shift is named exchange bias field (HE) and in almost all cases, the magnetic hysteresis loop is shifted in the negative field if one defines the direction of the cooling field (HFC) as
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doi:10.1016/j.jmmm.2005.03.006
Corresponding author Information Storage Materials
Laboratory, Toyota Technological Institute, 2-12-1 Hisakata,
Tempaku, Nagoya 468-8511, Japan Tel.: +81 52 809 1872; fax:
+81 52 809 1874.
E-mail address: nnguyenphuoc@yahoo.com (N.N Phuoc).
Trang 2the positive direction This case is referred to as
negative exchange bias The phenomenon of
positive exchange bias was first observed in 1996
by Nogue´s et al.[3]when studying the systems of
Fe/FeF2 and Fe/MnF2 They found that the sign
of exchange bias field changes from negative to
positive as the cooling field increases Very
recently, Roshchin et al [4] have found that the
state of coexistence of positive and negative
exchange bias can be achieved by cooling the
sample of FeF2/Co in a properly chosen constant
applied magnetic field This state manifests itself as
a double hysteresis loop
In this paper, we report the observation of the double-shifted loop in CrMn/Co bilayers with a proper thickness of Co layer A training-like effect has been observed in the sample exhibiting the double-shifted hysteresis loops, which becomes a single-shifted hysteresis loop after some cycles of measurement The results are interpreted as the association of positive and negative exchange bias,
in which the portion of positive exchange bias
-0.0010
-0.0005
0.0000
0.0005
0.0010
tCo = 36 nm
-0.00030
-0.00015
0.00000
0.00015
0.00030
tCo = 18 nm
-0.00150
-0.00075
0.00000
0.00075
0.00150
tCo = 54 nm
-0.002 -0.001 0.000 0.001 0.002
tCo = 72 nm
-200 0 200 400 -0.0030
-0.0015 0.0000 0.0015 0.0030
tCo = 108 nm
H (Oe)
-0.002 -0.001 0.000 0.001 0.002
tCo = 90 nm
-400
H (Oe) -400
-1000
H (Oe)
H (Oe) -1000
-2000
H (Oe)
-400
H (Oe) -1000 -2000
Fig 1 Hysteresis loops of the CrMn(12 nm)/Co (x nm) samples measured at 123 K The thickness of Co layer is indicated in the figure.
Trang 3gradually reduces with the cycle of measurement
causing the observed training-like effect
2 Experiment
The samples used in this work with the structure
of Si(1 0 0)/CrMn (12 nm)/Co (x nm) were
depos-ited at room temperature by the RF sputtering
The CrMn layer was sputtered from a composite target constituting of Cr target with Mn chips placed on it The base pressure was about
106mbar whereas the Ar pressure during deposi-tion was 103mbar The deposition was carried out without applying a magnetic field The composition of the CrMn films, identified by energy dispersive X-ray spectroscopy (EDS), is
Cr45Mn55 The samples were then annealed in high
T = 173 K
T = 173 K
-0.00030
-0.00015
0.00000
0.00015
0.00030
T = 223 K
-0.00030
-0.00015
0.00000
0.00015
0.00030
-0.00030
-0.00015
0.00000
0.00015
0.00030
H (Oe)
-0.002 -0.001 0.000 0.001 0.002
T = 223 K
-0.002 -0.001 0.000 0.001 0.002
-0.002 -0.001 0.000 0.001 0.002
200
H (Oe)
-400 -200 0 200 400
H (Oe)
-400 -200 0 200 400
H (Oe)
-2000
-1000 0 1000 2000
H (Oe) -2000
H (Oe) -2000
Fig 2 Hysteresis loops of the CrMn(12 nm)/ Co(18 nm) (left panel) and CrMn(12 nm)/ Co(90 nm) (right panel) bilayers at various temperatures.
Trang 4vacuum oven (105mbar) at the temperature of
300 1C for 1 h They were subsequently cooled in
the magnetic field of 5 kOe to room temperature
Magnetic properties of the annealed bilayers were
characterized by vibrating sample magnetometer
(VSM) in the temperature range from 123 K to
room temperature
3 Results and discussion
The hysteresis loops of the annealed CrMn
(12 nm)/Co (x nm) (x ¼ 18; 36, 54, 72, 90, 108 nm)
bilayers, measured at 123 K were shown inFig 1
We have observed a very large exchange bias
(HE600 Oe) It is noted that all the
magnetiza-tion curves in Fig 1 show double-loops and this
effect is especially clear in the sample with tCo¼72
and 90 nm Moreover, there is a strong correlation
between the appearance of exchange bias and
double-shifted loops as shown inFig 2 On the left
panel of Fig 2 are the hysteresis loops of the
annealed CrMn (12 nm)/Co (18 nm) bilayer
mea-sured at different temperatures while on the right
are those of the CrMn (12 nm)/Co (90 nm) bilayer
measured at the same corresponding temperatures
It is worth noting that the width of the kink in the
curve with double-shifted loops decreases as the
temperature increases in the same manner with the
diminution of exchange bias and at the
tempera-ture of 223 K, both double-shifted loops and
exchange bias disappear This suggests that the
double-shifted loop may result from exchange
bias
Fig 3 shows a representative of magnetic
hysteresis loops of CrMn (12 nm)/Co (90 nm) film
after some cycles of measurement It is remarkable
that the right-hand loop becomes smaller and the
left-hand loop becomes bigger with increasing n
After nine cycles of hysteresis measurements, the
right-hand loop disappears, making a
single-shifted loop in the magnetization curve This effect
seems to be similar to the training effect often
observed in exchange bias system, in which
exchange bias field decreases with the number of
measurement [5] However, in our case, only the
shape of the magnetization curve is changed with
the cycle of measurement while the value of
-0.002 -0.001 0.000 0.001 0.002
H (Oe)
n = 1
n = 5
n = 9
Fig 3 Representative of hysteresis loops of CrMn(12 nm)/Co (90 nm) film M–H loops for the cycles 1, 5, and 9 are shown.
AF FM Negative exchange bias Positive exchange bias
AF domain wall (c)
AF FM
Negative exchange bias
(a)
HFC
(b) AF FM
Positive exchange bias
Fig 4 Schematic diagram of the spin configurations of FM/
AF bilayers in three cases of H FC : (a) Small H FC making negative exchange bias, (b) Large H FC making positive exchange bias, (c) Intermediate H FC making a double-shifted loop.
Trang 5exchange bias field is nearly constant Moreover,
after 9 cycles of measurement, further
measure-ment was carried out but the shift of the single
loop was not changed any more This feature
indicates that the physical origin of this
training-like effect is possibly different from that of the
normal training effect
The manifestation of double-shifted loop is
presumably attributed to the overlap of positive
and negative exchange bias Positive exchange bias
is believed to be due to the fact that the interfacial
interaction is antiferromagnetic and the origin of
such antiferromagnetic coupling as proposed has
been system specific [6] For small HFC, the
magnetic hysteresis loop exhibits negative
ex-change bias with the AF spins at the interface
aligned in the negative direction as inFig 4(a) If
HFC is large enough to align the AF surface
magnetization along HFC as shown in Fig 4(b),
thus overcoming the interface AF–FM interface
magnetic interaction, the magnetization curve will
exhibit a positive shift For intermediate HFC, the
AF moments at the interface are partially aligned
with the cooling field as sketched in Fig 4(c)
causing the formation of two AF domains, one
makes negative exchange bias and the other makes
positive exchange bias The magnetization curve
thus consists of two hysteresis loops, one shifted to
negative and the other to positive, making a
double-shifted loop The height of the positive
loop depends on the portion of the AF moments
aligned with the cooling field The fact that the
right-hand loop, corresponding to positive
ex-change bias becomes smaller with the cycle of
measurement suggests that this state is metastable
The height of the positive loop decreases with the
number of measurements as shown in Fig 3,
implies that the area of the AF domain causing
positive exchange bias diminishes correspondingly
The training-like effect can therefore be described
as the movement of the AF domain wall toward
the positive-exchange-biased domain making this
domain shrink and finally be suppressed It is well-known that the positive exchange bias is in a high-energy state so it is less stable than the negative exchange bias, which may explain why the training effect seems to affect only the right-hand side subloop
4 Conclusion
In summary, we have fabricated CrMn/Co bilayers with varied thickness of the Co layer and have observed the double-shifted loop in CrMn/Co bilayers with the thickness of Co layer
in a narrow range This double-shift loop is assumed to be due to the coexistence of positive and negative exchange bias This assumption is consistent with a training-like effect observed for the first time in the sample exhibiting a double-shifted loop
Acknowledgements
This work is supported by the State Programs
on Fundamental Research of Vietnam under the Grant No 811604
References
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[3] J Nogue´s, D Lederman, T.J Moran, I.K Schuller, Phys Rev Lett 76 (1996) 4624.
[4] I.V Roshchin, O Petracic, R Morales, Z.P Li, X Batlle, I.K Schuller, Los Alamos National Laboratory, Preprint Archive, Condensed Matter (2004), 1–14, arXiv:cond-mat/
0411014 ( http://xxx.lanl.gov/pdf/cond-mat/0411014 ) [5] K Zhang, T Zhao, H Fujuwara, J Appl Phys 89 (2001) 6910.
[6] X Ke, M.S Rzchowski, L.J Belenky, C.B Eom, Appl Phys Lett 84 (2004) 5458.