Iec 60512 29 100 2015

Balan ed intercon ect an as ociated con ectin hardware u ed to con ect the test eq ipment an the con ector u der test s al me t the req irements given in 4.8.. 5.3 Return los , Te t 2 b

Connectors for elect ronic equipment – Test s and measurement s –

Part 29-100: Signal int egrity t est s up t o 500 MHz on M12 style connect ors –

Test s 29a t o 29g

Connect eurs pour équipement s élect roniques – Essais et mesures –

Part ie 29- 100: Essais d'int égrit é des signaux jusqu'à 500 MHz sur les

connect eurs de ty e M12 – Essais 29a à 29g

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Connect ors for elect ronic equipment – Test s and measurement s –

Part 29-100: Signal int egrity t est s up t o 500 MHz on M12 style connect ors –

Test s 29a t o 29g

Connect eurs pour équipement s élect roniques – Essais et me ures –

Part ie 29- 100: Essais d'int égrit é des signaux jusqu'à 500 MHz sur les

connect eurs de type M12 – Essais 29a à 29g

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FOREWORD 6

1 Sco e an o ject 8

2 Normative ref eren es 8

3 Terms, def i ition an a breviation 9

3.1 Terms an def i ition 9

3.2 Ab reviation 9

4 Overal test ar an ement 10 4.1 Test in trumentation 10 4.2 Co xial ca les an intercon ect for network analy ers 1

4.3 Me s rement precaution 1

4.4 Ref eren e comp nents f or cal bration 13 4.4.1 Ref eren e lo d for cal bration 13 4.5 Termination lo d for termination of con u tor p irs 14 4.5.1 Dif ferential mode 14 4.5.2 Balu termination 14 4.5.3 Termination typ s 15 4.6 Termination of s re n 15 4.7 Test sp cimen an referen e planes 15 4.7.1 General 1

5 4.7.2 Intercon ection b twe n device u der test (DUT) an the cal bration plane 15 4.8 Termination of b lu 17 4.8.1 General req irements 17 4.8.2 Centre ta con ected to grou d 17 4.8.3 Centre ta o en 1

8 4.9 Seq en e f or cal bration an me s rement 18 5 Con ector me s rement up to 10 MHz an 5 0 MHz 2

5.1 General 2

5 2 In ertion los , Test 2 a 2

5.2.1 Object 2

5.2.2 Con ector with male or female contacts for in ertion los 2

5.2.3 Test method 2

5.2.4 Test set-up 2

5.2.5 Proced re 2

5.2.6 Test re ort 2

5.2.7 Ac urac 2

5.4.2 Con ector with male or female contacts f or NEXT 2

5.4.3 Test method 2

5.4.4 Test set-up 2

5.4.5 Proced re 2

5.4.6 Test re ort 2

5.4.7 Ac urac 2

5.5 F r en cros talk (FEXT), Test 2 d 2

5.5.1 Object 2

5.5.2 Con ector with male or female contacts f or FEXT 2

5.5.3 Test method 2

5.5.4 Test set-up 2

5.5.5 Proced re 2

5.5.6 Test re ort 3

5.5.7 Ac urac 3

5.6 Tran f er imp dan e (ZT), Test 2 e 3

5.7 Tran verse con ersion los (TCL), Test 2 f 3

5.7.1 Object 3

5.7.2 Con ector with male or female contacts f or TCL 3

5.7.3 Test method 3

5.7.4 Test set-up 3

5.7.5 Proced re 31

5.7.6 Test re ort 3

5.7.7 Ac urac 3

5.8 Tran verse con ersion tran fer los (TCTL), Test 2 g 3

5.8.1 Object 3

5.8.2 Con ector with male or female contacts f or TCTL 3

5.8.3 Test method 3

5.8.4 Test set-up 3

5.8.5 Proced re 3

5.8.6 Test re ort 3

5.8.7 Ac urac 3

5.9 Coupl n at en ation 3

6 Con tru tion an q alfication of direct fixtures (DFP an DFJ) 3

6.1 General 3

6.2 Direct fixtures for DUT testin 3

6.2.1 Req irements for direct fixture up to 10 MHz 3

6.2.2 Req irements for direct fixture up to 5 0 MHz 3

An ex A (normative) Imp dan e control ed me s rement fixture 3

A.1 General 3

A.2 L ad 4

A.3 Ad itional comp nents for con ection to a network analy er 4

A.4 Direct fixture 4

A.5 Con ectin hardware me s rement 1 con g ration 4

A.6 DUT con ection u in he der PCB as embles 4

An ex B (informative) Ref eren e source 4

B.1 Test f i ture comp nents 4

An ex C (inf ormative) Related con ectors 4

An ex D (inf ormative) Interf ace to test fixtures 5

Biblogra h 5

Fig re 1 – Me s rement strategies 10 Fig re 2 – 18 ° h brid u ed as a b lu 1

Fig re 3 – Me s rement config ration f or test b lu q al f i ation 13 Fig re 4 – Cal bration of referen e lo d 14 Fig re 5 – Resistor termination network 14 Fig re 6 – Definition of referen e planes 15 Fig re 7 – Balan ed at en ator for b lu centre ta grou ded 17 Fig re 8 – Balan ed at en ator for b lu centre ta o en 18 Fig re 9 – Op n cal bration 18 Fig re 10 – Short cal bration 19 Fig re 1 – L ad cal bration 19 Fig re 12 – Thru cal bration 2

Fig re 13 – Me s rement of RL an NEXT on the DUT 21

Fig re 14 – Me s rement of IL an FEXT on the DUT 2

Fig re 15 – Me s rin set-up 2

Fig re 16 – Return los me s rement 2

Fig re 17 – NEXT me s rement 2

Fig re 18 – FEXT me s rement f or diff erential an common mode termination 2

Fig re 19 – TCL me s rement 31

Fig re 2 – Co xial le d aten ation cal bration 31

Fig re 21 – Bac to b c b lu in ertion los me s rement 3

Fig re 2 – Config ration f or b lu common mode in ertion los cal bration 3

Fig re 2 – Sc ematic f or b lu common mode in ertion los cal bration 3

Fig re 2 – TCTL me s rement 3

Fig re 2 – Referen e planes 3

Fig re 2 – Direct fixture M12, d-code matin f ace 3

Fig re 2 – Direct fixture M12, d-code 3

Fig re 2 – Direct fixture M12, x-code matin f ace 3

Fig re 2 – Direct fixture M12, x-code 3

Fig re A.1 – Test he d as embly M12, d-code with b lu s atac ed 3

Fig re A.2 – Test he d as embly M12, x-code with b lu s atac ed 4

Fig re A.3 – Test he d as embly M12 mated with the lo d M12 41

Fig re A.13 – Exploded as embly of the direct f i ture (DFJ) 4

Fig re A.14 – Example of a con ectin hardware me s rement config ration 4

Fig re D.1 – Test b lu interf ace p tern 5

Fig re D.2 – Example pin an soc et dimen ion 51

Ta le 1 – Test b lu p r orman e c aracteristic up to 5 0 MHz 12 Ta le 2 – Test b lu p r orman e c aracteristic up to 10 MHz 12 Ta le 3 – Intercon ection return los 16 Ta le 4 – Un ertainty b n of return los me s rement at feq en ies b low 10 MHz 2

Ta le 5 – Un ertainty b n of return los me s rement at feq en ies a ove 10 MHz 2

Ta le 6 – Direct f i ture M12, p rf orman e up to 10 MHz 3

Ta le 7 – Direct f i ture M12, p rf orman e up to 5 0 MHz 3

Ta le A.1 – L ad M12, p rorman e up to 5 0 MHz 4

Ta le A.2 – L ad M12, p rorman e up to 10 MHz 4

Ta le C.1 – Related con ectors 4

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International Stan ard IEC 6 512-2 -10 has b en pre ared by s bcommit e 4 B: Electrical

con ectors, of IEC tec nical commit e 4 : Electrical con ectors an mec anical stru tures

This publ cation has b en draf ted in ac ordan e with the ISO/IEC Directives, Part 2.

A lst of al p rts in the IEC 6 512 series, publs ed u der the general title Co n ctors for

ele tro ic e uipme t – Tests a d me sureme ts, can b f ou d on the IEC we site

The commit e has decided that the contents of this publ cation wi remain u c an ed u ti

the sta i ty date in icated on the IEC we site u der "ht p:/we store.iec.c " in the data

related to the sp cif i publ cation At this date, the publ cation wi b

• reconfirmed,

• with rawn,

• re laced by a revised edition, or

IMPORTANT – The 'colour inside' logo on the cov r pa e of this publ c tion in ic te

that it contains colours whic are considere to be us f ul f or the cor e t

understa din of its conte ts Us rs s ould th refore print this doc me t using a

colour printer

This p rt of IEC 6 512 sp cifies the test method for tran mis ion p rorman e for M12-style

con ectors up to 5 0 MHz It is also s ita le for testin lower feq en y con ectors if they

me t the req irements of the detai specification an of this stan ard

NOT 1 Al fig re s ow e uipme t f or c n e tors a c rdin to IEC610 6-2- 0 a a e ample

The test method provided herein are:

– in ertion los , test 2 a;

– return los , test 2 b;

– ne r en cros talk (NEXT) test 2 c;

– f ar en cros talk (FEXT), test 2 d;

– tran verse con ersion los (TCL), test 2 f ;

– tran verse con ersion tran f er los (TCTL), test 2 g

For the tran fer imp dan e (ZT) test, se IEC 6 512-2 -10 , test 2 e

For the coupl n aten ation se ISO/IEC 1 8 1

Al test method a ply for two an four p ir con ectors

NOT 2 Al fig re s ow s h me f or f our p ir c bln a d are als s ita le f or two p ir c bln

The f ol owin doc ments, in whole or in p rt, are normatively ref eren ed in this doc ment an

are in isp n a le f or its a pl cation For dated ref eren es, only the edition cited a ples For

u dated referen es, the latest edition of the referen ed doc ment (in lu in an

amen ments) a pl es

IEC 6 0 0 (al p rts): Int ern t io al Ele trote h ic l Vo a ul ary (avai a le at

IEC 610 6-2-101, Co n ctors for el ectro ic e uipme t – P rod uct re uireme ts – Part 2-101:

Circ l ar c n e t ors – Deta sp cific tion for M12 c n e tors wit h screw-lo king

IEC 610 6-2-10 , Co n ctors for ele tro ic e uipme t – P rod uct re uireme ts – Part 2-10 :

Circ lar c n e t ors – Detail sp cific tio for c n e tors with M 12 x 1 screw-l ock ing, for d at a

tra smis ion fe u n ies u t o 50 MHz

IEC 61 6 -16, Rad io-fe u n y c n e tors – Part 16: Se tion l sp cific t ion – RF c ax ial

c n e tors with inn r d iameter of o ter c ndu t or 7 mm (0,27 6 in) with screw c u l ing –

Ch ra teristics imp d an e 50 o ms (7 5 o ms) (typ N )

ISO/IEC 1 8 1, Informat ion t ec n log – Ge eric c bl ing for c stomer premises

EN 5 2 9-1-14, Commu ic tion c bl es – Sp cific t ion for test methods – Part 1-14: Ele tric l

test met hods − Co pling at te u t io or scre nin at te u tio of c n e t ing h rdware

ITU-T Recommen ation G.1 7, Tra smis io asp cts ofu b lan e a o t e rt h

ITU-T Recommen ation O.9, Measuring ara g me ts to as es t he de re of u b lan e

FEXT F r en cros talk

IDC In ulation displacement con ection

IEC International Electrotec nical Commis ion

TCTL Tran verse con ersion tran fer los

4.1 Te t in trume tation

Al test in trumentation s al b q al fied over the f req en y ran e of 1 MHz to the maximum

sp cified f req en y f om the DUT

These test proced res req ire the u e of a vector network analy er The analy er s ould

have the ca a i ty of ful 2-p rt cal bration The analy er s al cover the f req en y ran e of

1 MHz to the maximum sp cified f eq en y f rom the DUT at le st

When u ed, at le st two test b lu s are req ired in order to p rorm me s rements with

b lan ed s mmetrical sig als The req irements for the b lun are given in 4.3

Optional y, multi-p rt network analy ers f or b lu -les test set-up may b u ed

Ref eren e lo d are ne ded for the cal bration of the set-up Req irements f or the referen e

lo d are given in 4.5.1

Termination lo d are ne ded for termination of p irs, u ed an u u ed, whic are not

terminated by the test b lu s Req irements f or the termination lo d are given in 4.6

An a sorbin clamp an fer ite a sorb rs are ne ded for the coupln at en ation

me s rements The req irements for these items are given in EN 5 2 9-1-14

The test proced res alow an in e en ent test of the male an f emale p rt of the con ector

Both are des rib d in Clau e 5 Fig re 1 s ows the fe sible me s rement strategies for the

q al fication of a DUT

Cla se 5:

4.2 Coa ial c ble a d interconne t f or network a aly ers

L n th of co xial ca les u ed to con ect the network analy er to the b lu s s al b as

s ort as p s ible (It is recommen ed that they do not ex e d 6 0 mm e c ) The b lu s

s al b electrical y b n ed to a common grou d plane For cros talk me s rements, a test

f i ture may b u ed, in order to red ce resid al cros talk (se An ex A) Balan ed

intercon ect an as ociated con ectin hardware u ed to con ect the test eq ipment an the

con ector u der test s al me t the req irements given in 4.8

4.3 Me s reme t pre a tions

To en ure a hig degre of rel a i ty for tran mis ion me s rements, the f ol owin

precaution are req ired

a) Con istent an sta le b lu an resistor lo d s al b u ed for e c p ir throu hout the

test seq en e

b) Ca le an ada ter dis ontin ities, as introd ced by ph sical flexin , s arp b n s an

restraints s al b avoided b f ore, d rin an af ter the tests

c) Con istent test methodology an termination (b lu s or resistors) s al b u ed at al

stages of tran mis ion p rf orman e q alfication The relative sp cin of con u tors in

the p irs s al b preserved throu hout the tests to the gre test extent p s ible

d) The b lan e of the ca les is maintained to the gre test extent p s ible by con istent

con u tor len th an p ir twistin to the p int of lo d

e) The sen itivity to set-up variation for these me s rements at hig f eq en ies deman s

atention to detai s for b th the me s rement eq ipment an the proced res

Balu req irements

The b lun may b b lu tran formers or 18 ° h brid with at en ators to improve matc in if

ne ded (se Fig re 2)

Figure 2 – 18 ° hybrid us d a a balun

The sp cification for the b lu s ap ly f or the whole f req en y ran e f or whic they are u ed

Balu s s al b RFI s ielded an s al comply with the sp cif i ation l sted in Ta le 1 an

Table 1 – Te t balu performa c c ara teristic up to 5 0 MHz

Me s re p r ITU-T Re omme d tio G.1 7 with th n twork a aly er c lbrate u in a 5 Ω lo d

Table 2 – Te t balu perf orma c c ara teristic up to 10 MHz

Return lo s, c mmo mo e with c mmo mo e termin tio

Me s re b c n e tin th b la c d o tp t termin ls to eth r a d me s rin th return lo s Th n min l

primary imp d n e s al termin te th primary in ut termin l Se als Fig re 3, p rt Commo Mo e Return

L s

Figure 3 – Me s reme t conf igurations f or te t balun q al fic tion

4.4 Refere c compon nts f or c l bration

4.4.1 Refere c loa s for c l bration

To p rorm a one or two-p rt cal bration of the test eq ipment, a s ort circ it, an o en circ it

an a referen e lo d are req ired These devices s al b u ed to o tain a calbration

The ref eren e lo d s al b cal brated again t a cal bration referen e, whic s al b a 5 Ω

lo d, trace ble to an international referen e stan ard Two 10 Ω referen e lo d in p ral el

s al b calbrated again t the cal bration referen e The ref eren e lo d f or cal bration s al

b placed in an N-typ con ector ac ordin to IEC 61 6 -16, me nt f or p nel mou tin ,

whic is mac ined f lat on the b c side (se Fig re 4) The lo d s al b fixed to the f lat side

of the con ector, distributed evenly arou d the centre con u tor A network analy er s al b

cal brated, 1-p rt f ul cal bration, with the calbration referen e There fter, the return los of

Balu p rt d s riptio

A

B

C D

Calbratio pla e

5

52

Commo -mo e reje tio

5

55

A

B

C D

5

IE C

10

at f req en ies up to 10 MHz an > 0 dB at f eq en ies a ove 10 MHz an up to the lmit

f or whic the me s rements are to b car ied out

Figure 4 – Cal bration of refere c loa s

4.5 Termination loa s f or termination of conductor pairs

4.5.1 Dif fere tial mode

Diff erential mode plu common mode (DMCM) termination , as s own in Fig re 5 on the lef t,

s al b u ed on al active p irs u der test, ex e t when me s rin return los , where DM

only resistor termination are recommen ed DMCM resistor termination s al b u ed on al

inactive p irs an on the o p site en s of active p irs for NEXT los an FEXT los testin

Inactive p irs f or return los testin may b terminated with DM or DMCM resistor

termination , or left u -terminated Balu termination may b u ed on the far en of al

inactive p irs provided that their DM an common mode return los p rf orman e

c aracteristic me t the minimum p rf orman e of the sp cif ied resistor network

Figure 5 – Re istor termin tion network

Smal ge metry c ip resistors s al be u ed for the con tru tion of resistor termination The

Dif f ere tial mo e plu

c mmo mo e re istor termin tio

Diff ere tial mo e o ly

re istor termin tio

4.5.3 Termination type

The p rf orman e of imp dan e matc in resistor termination network s al b verif ied by

me s rin the return los of the termination at the cal bration plane For this me s rement, a

one p rt calbration is req ired u in a trace ble ref eren e lo d as des ribed in 4.4.1

The DM return los of the lo d termination s al ex e d 2 -2 log (f /5 0) Calc lation that

res lt in return los l mit values gre ter than 4 dB s al revert to a req irement of 4 dB

minimum The common mode return los s al ex e d 15 dB The resid al NEXT los

b twe n an two imp dan e termination network s al ex e d the req irements of formula

(1) Calc lation that res lt in resid al NEXT los lmit values gre ter than 8 dB s al revert

If the con ector u der test is s re ned, s re ned me s rement ca les s al b a pl ed

The s re n or s re n of these ca les s al b fixed to the grou d plane as close as p s ible

to the me s rement b lu s

The test sp cimen is a mated p ir of relevant con ectors The con ector ref eren e plane for

the test sp cimen is the p int at whic the ca le s e th enters the con ector ( he b c en of

the con ector) or the p int at whic the internal ge metry of the ca le is no lon er

maintained, whic ever is farther f rom the con ector (se Fig re 6) Also con ectors with PCB

-mou tin are a pl ca le This definition a ples to b th en s of the test sp cimen The

con ector s al b terminated in ac ordan e with the man facturer’s in tru tion an s al b

comp tible with the me s rement test set up an fixtures

Fig re 6 – Definition of refere c pla e

4.7.2 Interconne tions betwe n de ic under te t (DUT) a d the c l bration pla e

Twisted-p ir intercon ect, printed circ its or other intercon ection are u ed b twe n the

con ector referen e plane of the DUT an the cal bration plane It is neces ary to control the

c aracteristic of these intercon ection to the b st extent p s ible as they are b yon the

cal bration plane These intercon ection s ould b as s ort as practical an their common

mode an DM imp dan es s al b managed to minimize their eff ects on me s rement Refer

to An ex A f or ad itional information a out test f i tures whic may b u ed to f aci tate

imp dan e management The return los p rf orman e of the intercon ection s al me t the

req irements of Ta le 3 The in ertion los p rf orman e of the intercon ection is as umed to

b les than 0,1 dB over the f req en y ran e fom 1 MHz to 10 MHz (Category 5) an 1 MHz

It is recommen ed that al DUTs, in lu in TFJs an TFPs, have soc ets with 2,5 mm sp cin

a pl ed to the en s of their intercon ects to faci tate a con istent interf acin with the b lu s

4.7.2.2 Impe a c matc ing interconn ct

When u ed, twisted-p ir intercon ect s al have 10 Ω nominal dif ferential c aracteristic

imp dan e The twisted-p irs s ould not ex ibit ga s b twe n the con u tors in ulation

Intercon ect s al b q al f ied for diff erential mode return los There are two diff erent

method to o tain intercon ect: they may b o tained as in ivid al twisted-p irs, or they may

b p rt of a ca le If common mode termination are req ired, the intercon ect s al b

placed in an imp dan e managin s stem, as des rib d in An ex A The maximum len th of

the twisted-p ir le d at e c en of the DUT s al b 51 mm

4.7.2.2.2 In ivid al twiste -pair interconn ct

Twisted-p ir intercon ect may b o tained f om dis rete twisted-p ir stoc or removed f rom

s e thed ca le Prior to atac ment to the DUT, the return los of e c p ir s al b tested

For this test, 10 mm len th of twisted-p ir s al b u ed The intercon ect s al b

terminated acros e c p ir with a precision 0,1 % (0 0 size or simi ar) c ip resistor or

simi ar c ip resistor as des rib d in 4.5.1 The resistor s al b atac ed directly to the

con u tors of the p ir in s c a way as to minimize the disturb n e of the p ir Potential

disturb n es in lu e ga s b twe n the con u tor in ulation in the p ir, meltin in ulation,

an ex es solder When tested, the test le d s al b atac ed to the b lu or diff erential

mode test p rt u in the same fixtures as when testin the DUT The twisted-p ir le d are

then trimmed for atac ment to the device an the test f i tures Se An ex A f or an

a pro riate test f i ture It is recommen ed to u e the same lo d f or b th cal bration an

termination of the test le d d rin me s rement

4.7.2.2.3 Interconn ct a part of c ble

Intercon ect may also b o tained f rom a section of twisted-p ir ca le where the f our twisted

-p ir intercon ect are maintained in the ca le s e th This method wi most often b u ed with

TFPs, c t fom the en s of as embled cord , but can also b u ed with con ector with female

contacts Prior to at ac ment to the DUT, the return los of the ca le p irs (within the ca le)

s al b tested For this test, a 10 mm len th of ca le s al b selected Eac twisted-p ir of

the ca le en s al b DM terminated acros e c p ir with precision 0,1 % (0 0 size or

simi ar) diff erential mode c ip resistors as des rib d in 4.6 The ca le s al then b

terminated to the DUT p r man facturer’s in tru tion an trimmed for at ac ment to the

me s rement s stem When this method is u ed with TFPs c t fom as embled cord , it s al

b s f ficient if the cord ca le was q al fied for return los to 10 MHz at Category 5 an

5 0 MHz at Category 6 , or if the as embled cord was q alf ied f or return los to 10 MHz or

5 0 MHz

4.7.2.3 Interconne tion return los re uireme ts

The intercon ection s al me t the req irements in Ta le 3 relative to the cal bration resistor

4.8 Termination of balu

4.8.1 Ge eral re uireme ts

If the avai a le b lu do s not provide a common-mode termination (centre ta is either

con ected to grou d or o en), a b lan ed resistor aten ator s al b a pl ed in order to

provide the req ired return los The at en ator s al b implemented at a smal printed circ it

b ard mou ted with SMD resistors There are two cases: one for the centre ta con ected to

grou d an one f or the centre ta o en

4.8.2 Ce tre tap con e te to ground

A diagram of the aten ator is s own in Fig re 7 The nominal at en ation is 10 dB an the

calc lated common-mode imp dan e is 2 Ω

NOT Re istor v lu s are n min l Th n are t sta d rd v lu s ma b c o e

Figure 7 – Bala c d at e uator f or balu c ntre tap grounde

4.8.3 Ce tre tap ope

A diagram of the aten ator is s own in Fig re 8 The nominal at en ation is 5 dB an the

calc lated common-mode imp dan e is 4 Ω

NOT Re istor v lu s are n min l Th n are t sta d rd v lu s ma b c o e

Figure 8 – Bala c d at e uator f or balu c ntre tap ope

4.9 Se ue c for c l bration a d me s reme t

The fol owin seq en e s al b u ed to p rf orm a cor ect cal bration of the test eq ipment

an me s rement of the DUT

NOT Fig re 9 to 14 s ow gre s h matic whic is simiar to th f rame in Fig re A.3

a) Op n cal bration on the referen e plane with a 2 ort network analy er as s own in

b) Short cal bration on the ref eren e plane with a 2 p rt network analy er as s own in

Figure 10 – Short c l bration

c) L ad calbration on the ref eren e plane with a 2 p rt network analy er as s own in

d) Thru cal bration on the referen e plane with a 2 p rt network analy er as s own in

f ) Me s rement of IL an FEXT on the DUT as s own in Fig re 14.

5.2.2 Conne tor with male or f emale conta ts f or ins rtion los

The in ertion los s al b me s red in at le st one direction

5.2.3 Te t method

In ertion los (IL) is evaluated by me s rin the s aterin p rameters, S

21, of al the

con u tor p irs

5.2.4 Te t s t up

The test set-up con ists of a network analy er an two b lu s as defined in 4.3 It is not

neces ary to terminate the u u ed p irs

5.2.5 Proc d re

5.2.5.1 Cal bration

A ful 2-p rt cal bration s al b p rf ormed at the cal bration planes

5.2.5.2 Me s reme t

The test sp cimen s al b terminated with me s rement ca les at b th en s as s own in

Fig re 15 The len th of me s rement ca les s al b eq al to the len th of the referen e

ca les u ed for ref lection cal bration The me s rement ca les s al b the ca le typ s for

whic the con ector is inten ed An S

21

me s rement s al b p rormed Common mode

termination is req ired on the p ir u der test at le st one en

Fig re 15 – Me s rin s t up

Con ectors with female or male contacts s al b me s red with at le st one con ector with

male or f emale contacts in at le st one direction For improved ac urac , the in ertion los of

the intercon ection at e c en of the mated con ection may b s btracted f rom the

5.2.6 Te t report

The me s red res lts s al b re orted in gra hical or ta le format with the sp cif i ation

l mits s own on the gra h or in the ta le at the same f req en ies as sp cified in the relevant

detai sp cif i ation Res lts for al p irs s al b re orted It s al b expl citly noted if the

me s red res lts ex eed the test l mits

5.2.7 Ac ura y

The ac urac s al b within ± ,0 dB

5.3 Return los , Te t 2 b

5.3.1 Obje t

The o ject of this test is to me s re the return los (RL) of the DUT with male or f emale

contacts mated with the direct fixture of a pro riate gen er Se Fig re 16

5.3.2 Conne tor with male or f emale conta ts f or return los

Con ectin hardware s al b tested in at le st one direction for return los u in at le st one

con ector with male or female contacts This con ector with male or female contacts s al

satisfy the req irements of 6.2

con u tor p irs

NOT As a c n e tor is a low-lo s d vic , th return lo s of th two sid s is n arly e u l

5.3.4 Te t s t up

The test set-up is as des rib d in Clau e 4 Diff erential mode only termination resistors are

recommen ed an s al satisfy the req irements of 4.5.3 When p s ible, it is recommen ed

to u e the same resistor termination as were u ed f or in trument cal bration as the f ar en

termination Intercon ect (if u ed) s al b pre ared an control ed p r 4.7.2 an s al

satisfy the req irements of 4.5.3

NOT Th ln termin tio re istor n twork mark d with a a teris ( ) ma als in lu e o ly-diff ere tial-mo e

or b lu -u e termin tio

Figure 16 – Return los me s reme t

5.3.5 Proc d re

5.3.5.1 Cal bration

A ful one p rt, o en, s ort, an lo d, cal bration, s al b p rormed at the ref eren e plane,

as a minimum A ful two p rt cal bration is also ac e ta le The cal bration lo d s al me t

Pas -f ai q al f i ation is determined by comp rin the res lts to the cor esp n in con ectin

hardware req irements plu 6 dB These hig er l mits for the comp nents are neces ary to

en ure the l mits for the cor esp n in con ectin hardware con iderin al worst-case

s enarios

5.3.6 Te t report

The me s red res lts s al b re orted in gra hical or ta le format with the sp cif i ation

l mits s own on the gra h or in the ta le at the same f req en ies as sp cif ied in the relevant

detai sp cif i ation Res lts f or al p irs s al b re orted It s al b expl citly noted if the

me s red res lts ex eed the test l mits

5.3.7 Ac ura y

The return los of the lo d f or cal bration is verified to b gre ter than 4 dB up to 10 MHz

an gre ter than 4 dB at hig er f req en ies The u certainty of the con ection b twe n the

con ector u der test an the b lu s is exp cted to deteriorate the return los of the set-up

(ef fectively the directional brid e implemented by the test set-up) by 6 dB The ac urac of

the return los me s rements is then eq ivalent to me s rements p rormed by a directional

brid e with a directivity of 4 dB an 3 dB The ac urac (u certainty b n ) is given in

com

Table 4 – Unc rtainty ba d of return los me s reme t at fre ue cie below 10 MHz

The o ject of this test proced re is to me s re the mag itu e of the electric an mag etic

coupl n b twe n disturb r an disturb d p irs of a mated con ector p ir

5.4.2 Conne tor with male or f emale contacts f or NEXT

Con ectin hardware s al b tested in b th direction f or NEXT los u in at le st one

con ector with male or female contacts This con ector with male or female contacts s al

satisfy the req irements of Clau e 6

5.4.3 Te t method

NEXT is evaluated by me s rin the s aterin p rameters, S

21, of the p s ible con u tor

p ir combination at e c en of the mated con ector, whi e the other en s of the p irs are

terminated

5.4.4 Te t s t up

The test set-up con ists of two b lu s an a network analy er An i u tration of the set-up,

whic also s ows the termination prin iples, is s own in Figure 17

Fig re 17 – NEXT me s reme t

5.4.5 Proc d re

5.4.5.1 Cal bration

A ful 2-p rt cal bration s al b p rormed at the cal bration planes

5.4.5.2 Establ s me t of nois f loor

The noise flo r of the set-up s al b me s red The level of the noise f lo r is determined by

white noise, whic may b red ced by in re sin the test p wer an by red cin the

b n width of the network analy er, an by resid al cros talk b twe n the test b lu s The

noise flo r s al b me s red by terminatin the b lu s with resistors an p rf ormin an S

21

me s rement The noise f lo r s al b 2 dB lower than an sp cified l mit f or the cros talk If

the me s red value is closer to the noise flo r than 2 dB, this s al b re orted

For hig cros talk values, it may b neces ary to s re n the terminatin resistors

5.4.5.3 Me s reme t

Con ect the disturbin p ir of the con ector u der test (DUT) to the sig al source an the

disturb d p ir to the receiver p rt The DUT s al b tested with dif ferential an common

mode termination The me s rements have to b p rormed fom b th en s of the mated

con ector The me s rements f rom the con ector with male or female contacts en s al b

u ed in the calc lation in 5.4.5.4, f or f ul q alfication in the forward an reverse direction

Test al p s ible p ir combination an record the res lts

There are 6 diff erent combination of NEXT in a 4-p ir con ector f om e c side, whic gives

a total of 12 me s rements for eac kin of termination method Becau e of reciprocity, only

6 u iq e non- eciprocal combination f rom e c side ne d to b tested

IE C

DUT 5

Co n ctor with male or f emale c nta ts Co n ctor with female or male c nta ts

5.4.5.4 Conne ting hardware NEXT los me s reme t

a) Me s re the mag itu e of the NEXT los vector f or the con ector with the direct f i ture

(DFP or DFJ) of the a pro riate gen er in forward an reverse direction

b) Pas -ai q alfication is determined by comp rin the res lts to the cor esp n in

con ectin hardware req irements plu 6 dB These hig er l mits for the comp nents are

neces ary to en ure the l mits f or the cor esp n in con ectin hardware con iderin al

worst-case s enarios

5.4.6 Te t report

The res lts me s red s al b re orted in gra hical or ta le format with the sp cif i ation

l mits s own on the gra h or in the ta le at the same f req en ies as sp cified in the relevant

detai sp cification Res lts f or al p irs s al b re orted It s al b expl citly noted if the

me s red res lts ex e d the test l mits

The o ject of this test proced re is to me s re the mag itu e of the electric an mag etic

coupl n b twe n disturb r an disturb d p irs of mated con ectors

5.5.2 Conne tor with male or f emale conta ts f or FEXT

Con ectin hardware FEXT los is determined by me s rement of con ectin hardware u in

at le st one direct fixture (DFP or DFJ) q alfied p r Clau e 6 Me s re con ectin hardware

FEXT los with intercon ects pre ared an control ed p r 4.7

5.5.3 Te t method

Far en cros talk is evaluated by me s rin the s at erin p rameters, S

21, of the p s ible

con u tor p ir combination at one en of the mated con ector, to the other en

5.5.4 Te t s t up

The test set-up con ists of two b lu s an a network analy er as defined in Clau e 4 An

i u tration of the set-up, whic also s ows the termination prin iples, is s own in Fig re 18

Figure 18 – FEXT me s reme t for dif fere tial a d common mode terminations

Con ect the disturbin p ir of the DUT to the sig al source an the disturb d p ir to the

receiver p rt Test al p s ible p ir combination

1

an record the res lts

5.5.5.4 Conne ting hardware FEXT los me s reme t

a) Me s re the mag itu e of the FEXT los vector for the con ector with male or female

contacts mated to the direct fixture (DFP or DFJ) in the forward direction (lau c sig al

into the direct f i ture)

b) Pas -ai q alfication is determined by comp rin the res lts to the cor esp n in

con ectin hardware req irements plu 6 dB These higher lmits f or the comp nents are

neces ary to en ure the l mits for the cor esp n in con ectin hardware con iderin al

worst-case s enarios

5.5.5.5 Determining pa s a d fai

The resp n e with the DUT s al me t the req irements of the detai sp cification for al p ir

combination These hig er lmits f or the comp nents are neces ary to en ure the l mits for

the cor esp n in con ectin hardware con iderin al worst-case s enarios

5

5

5222

Co n ctor with male or f emale c nta ts Co n ctor with f emale or male c nta ts

5

5.5.6 Te t report

The me s red res lts s al b re orted in gra hical or ta le format with the sp cif i ation

l mits s own on the gra h or in the ta le at the same feq en ies as sp cified in the relevant

detai sp cif i ation Res lts f or al p ir combination s al b re orted It s al b explcitly

noted if the me s red res lts ex e d the test l mits

The o ject of this test is to me s re the mode con ersion (diff erential to common mode) of a

sig al in the con u tor p irs of the DUT This is also caled u b lan e at en ation or

Tran verse con ersion los , TCL

5.7.2 Conne tor with male or f emale conta ts for TCL

Con ectin hardware TCL los is determined by me s rement of con ectin hardware u in

a DFJ or DFP q alfied p r 6.2 Me s re con ectin hardware TCL los with intercon ects

pre ared and controled p r 4.7

5.7.3 Te t method

The b lan e is evaluated by me s rin the common-mode p rt of a diff erential-mode sig al,

whic is lau c ed in one of the con u tor p irs of the DUT

5.7.4 Te t s t up

The test set-up con ists of a network analy er an a b lun with a diff erential-an common-

mode test p rt An i u tration of the set-up, whic also s ows the termination prin iples, is

s own in Fig re 19 The DUT p ir u der test s ould b con ected to the dif ferential mode

b lu output terminals Al u u ed near en p irs s ould b terminated as s own in Fig re 5

Al f ar en p irs s ould b terminated as s own in Fig re 5 The ne r en an f ar en

terminatin resistor network s ould b b n ed an con ected to the me s rement grou d

plane The DUT s ould b p sitioned 5 mm f rom the grou d plane on the ne r en The

ne r en intercon ects con ectin the DUT to the b lu an termination s ould b no lon er

than 51 mm an they s ould b oriented orthogonal to e c other to minimize coupl n

Fig re 19 – TCL me s reme t

5.7.5 Proc d re

5.7.5.1 Cal bration

TCL cal bration is p r ormed in thre ste s

ST P 1: The co xial intercon ect atac ed to the network analy er are cal brated out by

p rormin s ort, o en, lo d, an throu h me s rements at the p int of termination to the

b lu An example of the test le d throu h con ection is s own in Fig re 2

Figure 2 – Coa ial le d at e u tion c l bration

ST P 2: The aten ation of the diff erential sig als of the test b lu is me s red by

con ectin two identical b lu s b c -to-b c with minimal le d len th an example of whic is

s own in Fig re 21

Notice that the b lu s are p sitioned so as to maintain p larity an they are b n ed (firmly

atac ed, e.g clamp d) to a grou d plane The me s red in ertion los is divided by 2 to

a proximate the in ertion los of one b lu for a diff erential sig al

Co n ctor with male or f emale c nta ts Co n ctor with female or male c nta ts

5

52

5

IE C

The calc lated in ertion los is recorded as IL

b lDM

Figure 21 – Ba k to ba k balun ins rtion los me s reme t

STEP 3: The at en ation of the common mode sig als of the test b lu is me s red by

con ectin the b lan ed p rt an grou d ref eren e terminals of two b lu s together, an the

network analy er p rts to the common mode soc ets, as s own in Fig re 2 an 2

A s ort len th of b re wire may b u ed to con ect e c of the in ivid al b lu terminals It is

imp rtant to also con ect the grou d referen es The b lu s s al b firmly clamp d to the

grou d plane Also, the outer s ield of the co xial test le d s al b pro erly b n ed to the

grou d plane as s own in Fig re 19 Divide by 2 to o tain the common mode in ertion los of

one b lu The res ltin in ertion los is recorded as IL

b lCM

IE C

Figure 2 – Sc ematic for balun common mode ins rtion los c l bration

Ad itional y, a cor ection term f or the imp dan e ratio of the b lu tran former con ertin

f rom 5 Ω on the network analy er to 10 Ω on the DUT is ne ded

5.7.5.2 Nois floor

The noise flo r of the set-up s al b me s red The level of the noise flo r is determined by

white noise, whic may b red ced by in re sin the test p wer an by red cin the

b n width of the network analy er, an by the lon itu inal b lan e (se Ta le 1) of the test

b lu The noise f lo r, a

n is ,m

s al b me s red by terminatin the diff erential output of the

b lu with a 10 Ω resistor an p r orm a S

21

me s rement b twe n the diff erential-mode

an the common-mode test p rt of the b lu a

me s rement b twe n the dif ferential-mode an

the commonmode test p rt of the b lu The b lan e, TCL, is calc lated as:

The me s red res lts s al b re orted in gra hical or ta le format with the sp cification

l mits s own on the gra h or in the ta le at the same f req en ies as sp cified in the relevant

detai sp cification Res lts for al p irs s al b re orted It s al b expl citly noted if the

me s red res lts ex e d the test l mits

IEC NWA

5.7.7 Ac ura y

The ac urac s al b b t er than ±1 dB at the sp cif i ation l mit

5.8 Tra s ers conv rsion tra sf er los (TCTL), Te t 2 g

5.8.1 Obje t

The o ject of this test is to me s re the mode con ersion (diff erential to common mode) of a

sig al in the con u tor p irs of the DUT This is also caled u b lan e at en ation or

Tran verse con ersion tran fer los , TCTL

5.8.2 Conne tor with male or f emale conta ts f or TCTL

Con ectin hardware TCTL los is determined by me s rement of con ectin hardware u in

a TFP q al fied p r 6.2 Me s re con ectin hardware TCTL los with intercon ects

pre ared an controled p r 4.7

5.8.3 Te t method

The b lan e is evaluated by me s rin the common-mode p rt of a dif ferential-mode sig al,

whic is lau c ed in one of the con u tor p irs of the DUT

5.8.4 Te t s t up

The test set-up con ists of a network analy er an a b lu with a dif ferential-an common-

mode test p rt An i u tration of the set-up, whic also s ows the termination prin iples, is

s own in Clau e 4 Al u u ed p irs on b th en s of the con ectin hardware s al b

terminated with 5 Ω common an 10 Ω diff erential resistor termination as s own in

Fig re 2 There s al b a common grou d at e c en The grou d of the two en s of the

con ectin hardware u der test s al b con ected sec rely to the same grou d plane

5

5

52

5

52

5.8.5 Proc d re

5.8.5.1 Cal bration

The cal bration of the test hardware for TCTL me s rements s al f ol ow the proced re

outlned in 5.7.5.1 for b th b lu s b in u ed in the me s rement an b th the common an

dif ferential mode cal bration values s ould b recorded for b th b lu s, a total of f our

cal bration values The calbration values s ould b recorded as

Con ect the me s red p ir of the DUT to the dif ferential output of the test b lu Terminate

the DUT ac ordin to 5.8.4 Perf orm a S

21

me s rement b twe n the diff erential-mode an

the common-mode test p rt of the b lu The b lan e, TCTL, is calc lated as

The me s red res lts s al b re orted in gra hical or ta le format with the sp cification

l mits s own on the gra h or in the ta le at the same f req en ies as sp cified in the relevant

detai sp cification Res lts for al p irs s al b re orted It s al b expl citly noted if the

me s red res lts ex e d the test l mits

Coupl n at en ation s al b p r ormed ac ordin to ISO/IEC 1 8 1 Am2 for l mitin values

an test method , over the feq en y ran e of 10 MHz to 5 0 MHz

6 Construction and qual f ication of direct f ixtures (DFP a d DFJ)

For the q al fication of M12-Con ectors it is neces ary to u e s ita le direct f i tures

This clau e des rib s the con tru tion, q alfication, an req irements of direct fixtures f or

verifyin con ectin hardware p r orman e

For the purp ses of this Stan ard, a direct f i ture con ists of an as embly that me ts the

dimen ional req irements of a M12-con ector with male or f emale contacts

Direct f i tures s al b q al fied f or al req irements of 5.4 (NEXT los ), 5.5 (FEXT los ), 5.2

6.2.1 Re uireme ts for dire t f ixture up to 10 MHz

A direct fixture up to 10 MHz is u ed d rin DUT NEXT an FEXT me s rements an may

also b u ed for DUT return los me s rements The p r orman e of the direct f i ture is

ac ordin Ta le 6 Se An ex A for an example an source of a direct fixture This f i ture

s al conf orm to the dimen ional req irements of IEC 610 6-2-101 an to the tran mis ion

req irements of Clau e 5 Fig re 2 an Fig re 2 s ow an example for the con ector

ac ordin to IEC 610 6-2-101, M12, d-code The resp ctive direct fixture (DFJ or DFP) is

comp tible with con ectors with male contacts or female contacts as def i ed by IEC 610

6-2-101 Test f i tures des rib d in An ex A are desig ed to provide s ita le inter ace an

termination

IE C

Fig re 2 – Dire t f ixture M12, d-code matin f ac

6.2.2 Re uireme ts for dire t f ixture up to 5 0 MHz

A direct fixture up to 5 0 MHz is u ed d rin DUT NEXT an FEXT me s rements an may

also b u ed f or DUT return los me s rements The p r orman e of the direct fixture is

ac ordin Ta le 7 Se An ex A f or an example an source of a direct f i ture This f i ture

s al conf orm to the dimen ional req irements of IEC 610 6-2-10 an to the tran mis ion

requirements of Clau e 5 Fig re 2 an Fig re 2 s ow an example f or the con ector

ac ordin to IEC 610 6-2-10 , M12, x-code The resp ctive direct f i ture (DFJ or DFP) is

comp tible with con ectors with male contacts or f emale contacts as defined by IEC 610

6-2-10 Test f i tures des rib d in An ex A are desig ed to provide s ita le inter ace an

termination

IEC

IE C

Figure 2 – Dire t f ixture M12, x-cod mating fa e

Figure 2 – Dire t f ixture M12, x-code

Table 7 – Dire t f ixture M12, perf orma c up to 5 0 MHz

Dire t f i ture M12, x-co e

perf ormanc parameter